Testing device and system for sensor core

Abstract

The embodiment of the utility model discloses a testing device and system for a sensor core. The testing device for the sensor core can comprise an analog-to-digital conversion module, a controller and a power supply module. Wherein the analog-to-digital conversion module is connected to the sensor core body and is used for converting an analog signal in the sensor core body in a testing process into a digital signal; the controller is connected to the analog-to-digital conversion module and is used for receiving the digital signal and generating test data of the sensor core according to the digital signal; and the power supply module is connected to the analog-to-digital conversion module, the controller and the sensor core body and is used for supplying power to the testing device of the sensor core body.

Description

Technical Field

[0001] This disclosure relates to the field of core testing technology, and more particularly to a testing device and system for sensor cores. Background Technology

[0002] Sensors are essential components for achieving automatic control and testing, especially resistive pressure sensors, which are widely used in industrial production, aerospace measurement, and other fields. Resistive pressure sensors utilize integrated ceramic thick-film piezoresistive technology, employing a Wheatstone bridge structure, silicon piezoresistive technology, and proportional output. They offer advantages such as corrosion resistance, ease of integration, high reliability, good stability, and low cost.

[0003] As a crucial carrier for capturing raw pressure information, the reliability of the resistive pressure sensor core is of paramount importance. Since the production and functional verification of the core need to be carried out in a sealed environment, we need to perform functional tests on the core itself in order to eliminate the adverse effects of environmental factors and the quality problems of the bridge printing during the core production process.

[0004] However, the current equipment for testing the functionality of the chip is relatively complex and not very accurate; some even still rely on manual testing with digital multimeters. Utility Model Content

[0005] In view of this, the present disclosure aims to provide a testing apparatus and system for sensor cores, which can solve the technical problem of low accuracy in functional testing of sensor cores.

[0006] The technical solution of this disclosure embodiment is implemented as follows:

[0007] In a first aspect, embodiments of this disclosure provide a testing apparatus for a sensor core, comprising:

[0008] An analog-to-digital converter module, connected to the sensor core, is used to convert analog signals during the testing process in the sensor core into digital signals;

[0009] A controller, connected to the analog-to-digital converter module, is used to receive the digital signal and generate test data of the sensor core based on the digital signal.

[0010] A power supply module is connected to the analog-to-digital converter module and the controller, and is used to provide voltage to the analog-to-digital converter module and the controller.

[0011] In some examples, the power supply module includes:

[0012] power supply;

[0013] A power conversion module is used to convert the voltage provided by the power supply into a voltage that is compatible with both the analog-to-digital conversion module and the power supply module.

[0014] In some examples, the power conversion module includes:

[0015] A transformer circuit is connected to the power supply;

[0016] A first voltage tracker is connected between the transformer module and the control module;

[0017] A second voltage tracker is connected between the transformer module and the first node, wherein the first node is simultaneously connected to the sensor core and the analog-to-digital converter module.

[0018] In some examples, the power conversion module further includes:

[0019] A voltage reference circuit is connected between the transformer circuit and the second node, wherein the second node is connected to both the first voltage tracker and the second voltage tracker.

[0020] In some examples, the testing apparatus further includes:

[0021] A communication module, connected to the controller and the first voltage tracker, is used to send the test data.

[0022] In some examples, the communication module includes:

[0023] A CAN transceiver is connected to the controller and the first voltage tracker;

[0024] A CAN matching circuit is connected to the CAN transceiver.

[0025] In some examples, the device further includes:

[0026] An external interface, connected to the communication module, is used to send the test data through the external interface.

[0027] In some examples, the testing apparatus further includes:

[0028] A temperature sensor, connected to the controller and the power supply circuit, is used to detect temperature information within the testing device.

[0029] In some examples, the testing apparatus further includes:

[0030] An alarm device, connected to the controller, is used to detect test data on the controller.

[0031] Secondly, embodiments of this disclosure provide a testing system for sensor cores, including:

[0032] The test apparatus for the sensor core as described in the first aspect;

[0033] An external device, a testing device connected to the sensor core.

[0034] This disclosure provides a testing device and system for a sensor core. The analog-to-digital converter (ADC) module accurately converts the weak analog signals generated by the sensor core during testing into digital signals, reducing signal distortion and errors during conversion. This provides a high-quality data foundation for the controller, resulting in more accurate sensor core test data that more realistically reflects the actual performance and state of the sensor core. The close connection and efficient collaboration between the controller and the ADC module enable faster reception and processing of digital signals. The controller can quickly analyze and calculate the large amount of received digital signals to generate sensor core test data, shortening the testing cycle, improving testing efficiency, and accelerating the research and development and production process of the sensor core. The power supply module is specifically designed for the ADC module and controller, providing a stable and accurate voltage. A stable voltage supply ensures the normal operation of the ADC module and controller during testing, avoiding test interruptions or data errors caused by voltage fluctuations, ensuring the reliability of test results, and extending the service life of the testing device. This testing device integrates the ADC module, controller, and power supply module, forming a complete testing system. Compared to traditional discrete testing equipment, this integrated design simplifies the testing process, reduces human intervention and the complexity of equipment connections during testing, and lowers the difficulty of testing operations, allowing testers to focus more on the analysis of test data and the performance evaluation of the sensor core. Attached Figure Description

[0035] Figure 1 This is a structural block diagram of a sensor core testing device provided in an embodiment of the present disclosure.

[0036] Figure 2 This is a structural block diagram of a test device for a sensor core after the power supply module has been deployed, as provided in an embodiment of this disclosure.

[0037] Figure 3 This is a structural block diagram of a test device for a power conversion module after the sensor core is unfolded, as provided in an embodiment of this disclosure.

[0038] Figure 4 A structural block diagram of a test device for the sensor core after the power conversion module is unfolded, as provided in an embodiment of this disclosure.

[0039] Figure 5This is a structural block diagram of a test device for a sensor core with a communication module added, provided in an embodiment of this disclosure.

[0040] Figure 6 This is a structural block diagram of another test device for a sensor core with a communication module added, provided in an embodiment of this disclosure.

[0041] Figure 7 This is a structural block diagram of a testing device for a sensor core after incorporating a temperature sensor, provided in an embodiment of this disclosure.

[0042] Figure 8 This is a structural block diagram of a test device for a sensor core with an external interface added, provided in an embodiment of this disclosure.

[0043] The accompanying drawings have illustrated specific embodiments of this disclosure, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concepts of this disclosure to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0044] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, they are provided so that this disclosure will be more comprehensive and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0045] Furthermore, the accompanying drawings are merely illustrative of this disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and therefore repeated descriptions of them will be omitted. Some block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically independent entities. These functional entities may be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller 130 devices.

[0046] This disclosure first provides a testing device for a sensor core 110, referring to... Figure 1The device may include an analog-to-digital converter (ADC) module 120, a controller 130, and a power supply module 140. The ADC module 120 is connected to the sensor core 110 and converts analog signals generated during testing in the sensor core 110 into digital signals. The controller 130 is connected to the ADC module 120 and receives the digital signals to generate test data for the sensor core 110. The power supply module 140 is connected to the ADC module 120, the controller 130, and the sensor core 110 and supplies power to the testing device for the sensor core 110.

[0047] In some examples, the analog-to-digital conversion module 120 (ADC) is one of the key components in the sensor core 110 test apparatus, used to convert the analog signals generated by the sensor core 110 during the test into digital signals so that the subsequent controller 130 can process and analyze them.

[0048] When the sensor core 110 is in operation, it generates various analog signals, such as voltage and current. These signals are continuously changing analog quantities. The analog-to-digital converter module 120 is used to convert these analog signals into discrete digital signals, enabling the controller 130 to recognize and process these signals.

[0049] The analog-to-digital converter (ADC) module 120 is responsible for acquiring real-time signal data from the sensor core 110, providing accurate input data to the controller 130. Through high-frequency data acquisition, it can capture subtle changes in the sensor core 110 under different operating conditions, thereby generating comprehensive test data. Before signal conversion, the ADC module 120 typically performs certain conditioning on the analog signal, such as amplification and filtering. Amplification can amplify the weak signal generated by the sensor core 110 to a voltage range suitable for the ADC module to process; filtering can remove noise components from the signal, improving its purity and accuracy.

[0050] The controller 130 receives digital signals output from the analog-to-digital converter module 120 and generates test data for the sensor core 110 based on these signals. The controller 130 receives digital signals from the analog-to-digital converter module 120, which contain various performance parameters of the sensor core 110 during the testing process. The controller 130 processes these digital signals, including data storage, calculation, and analysis, to extract useful information.

[0051] The controller 130 can generate test data for the sensor core 110 based on the processed digital signal. The test data can be the output voltage and current values ​​of the sensor core 110, or other calculated performance indicators such as sensitivity, linearity, and stability. The controller 130 analyzes this data to determine whether the performance of the sensor core 110 meets the expected requirements.

[0052] The controller 130 can also control and manage the operation of the testing device, including controlling the sampling frequency of the analog-to-digital conversion module 120 and the voltage output of the power supply module 140, to ensure the smooth progress of the testing process. Furthermore, the controller 130 can adjust and optimize the testing device based on the test results, improving the accuracy and efficiency of the test.

[0053] Optionally, the controller 130 may be an MCU controller 130 or other controller 130 that can guarantee the above functions. In this example embodiment, no specific limitation is made.

[0054] The power supply module 140 provides a stable and accurate voltage to the analog-to-digital converter module 120 and the controller 130. The main function of the power supply module 140 is to convert the voltage from the power supply 141 into a voltage suitable for use by the analog-to-digital converter module 120 and the controller 130. It ensures that the test equipment can obtain a continuous and stable voltage supply during operation, thus guaranteeing the smooth progress of the test.

[0055] During testing, the power supply module 140 effectively suppresses voltage fluctuations and noise interference, providing a stable voltage output. Voltage instability can lead to errors in signal conversion and data processing, affecting the accuracy of test results.

[0056] In addition to providing voltage, the power supply module 140 also needs to provide sufficient current according to the current requirements of the analog-to-digital converter module 120 and the controller 130. It can dynamically adjust the current output according to the load changes to ensure that the current requirements of each module are met under different operating conditions.

[0057] The testing apparatus for the sensor core 110 in this embodiment includes an analog-to-digital converter (ADC) 120 that accurately converts the weak analog signals generated by the sensor core 110 during testing into digital signals. This reduces signal distortion and errors during conversion, providing a high-quality data foundation for the controller 130. Consequently, the generated test data for the sensor core 110 is more accurate and more realistically reflects its actual performance and status. The close connection and efficient collaboration between the controller 130 and the ADC 120 enable faster reception and processing of digital signals. The controller 130 can quickly analyze and calculate the large amount of received digital signals to generate test data for the sensor core 110, shortening the testing cycle, improving testing efficiency, and accelerating the research and development and production process of the sensor core 110. The power supply module 140 is specifically designed for the ADC 120 and the controller 130, providing a stable and accurate voltage. A stable voltage supply ensures the normal operation of the analog-to-digital converter module 120 and the controller 130 during the test, avoiding test interruptions or data errors caused by voltage fluctuations, ensuring the reliability of test results, and extending the service life of the test device. This test device integrates the analog-to-digital converter module 120, the controller 130, and the power supply module 140, forming a complete test system. Compared to traditional discrete test equipment, this integrated design simplifies the test process, reduces human intervention and the complexity of equipment connections, and lowers the difficulty of test operations, allowing testers to focus more on the analysis of test data and the performance evaluation of the sensor core 110.

[0058] In some examples, refer to Figure 2 As shown, the power supply module 140 may include a power supply 141 and a power conversion module 142. The power supply 141 may include, for example, mains power or a battery. The power conversion module 142 is used to convert the power supply 141 into the voltage that is adapted to the analog-to-digital converter module 120 and the power supply module 140.

[0059] Optional, refer to Figure 3The power conversion module 142 may include a transformer circuit 1421, a first voltage tracker 1422, and a second voltage tracker 1423. The transformer circuit 1421 is the front-end circuit of the power conversion module 142 and is directly connected to the power supply 141. Its function is to initially convert the voltage of the power supply 141 to suit the operating voltage range of the subsequent voltage tracker. For example, if the power supply 141 is 220V AC, the transformer circuit 1421 can convert it to a lower DC voltage, such as 10V or 5V, to provide a suitable input voltage for subsequent voltage tracking. This will not be elaborated further in this example embodiment. The transformer circuit 1421 may include components such as a transformer, a rectifier bridge, and a filter capacitor. The transformer converts the AC voltage to a lower AC voltage, the rectifier bridge converts the AC voltage to a pulsating DC voltage, and the filter capacitor smooths the pulsating DC voltage, resulting in a more stable DC voltage output. This process provides the base voltage for subsequent voltage tracking.

[0060] For example, the transformer module can be an LDO step-down converter circuit, which can step down the external input voltage and convert it into the output voltage VCC10V of the first stage.

[0061] The first voltage tracker 1422 is connected between the output of the transformer circuit 1421 and the controller 130. It is used to further stabilize and accurately convert the voltage output by the transformer circuit 1421 into the voltage required by the controller 130. Since the controller 130 has high requirements for voltage stability and accuracy, the first voltage tracker 1422 can provide a high-precision, low-noise voltage output, ensuring the normal operation of the controller 130 and the accuracy of data processing.

[0062] The second voltage tracker 1423 is connected between the output of the transformer circuit 1421 and the first node P1. The first node P1 is simultaneously connected to the sensor core 110 and the analog-to-digital converter module 120. The second voltage tracker 1423 provides a stable and accurate voltage to the sensor core 110 and the analog-to-digital converter module 120. Since the sensor core 110 and the analog-to-digital converter module 120 require high-precision voltage during testing to ensure accurate signal acquisition and conversion, the second voltage tracker 1423 can meet their stringent voltage requirements.

[0063] A voltage tracker is a circuit that outputs a voltage proportional to the input voltage. It may include components such as operational amplifiers and feedback resistors. Through a feedback control mechanism, it monitors the output voltage in real time and adjusts circuit parameters according to changes in the input voltage to maintain a stable and accurate output voltage. For example, when the input voltage changes slightly, the voltage tracker can quickly adjust to keep the output voltage constant, thus achieving precise voltage tracking.

[0064] The power conversion module 142, through the coordinated operation of the transformer circuit 1421 and two voltage trackers, achieves precise voltage supply to different modules. The transformer circuit 1421 provides the base voltage, the first voltage tracker 1422 provides a stable voltage to the controller 130, and the second voltage tracker 1423 provides precise voltage to the sensor core 110 and the analog-to-digital converter module 120. This design ensures that the voltage requirements of the entire testing device are met under different operating conditions, improving the accuracy and reliability of the test.

[0065] In some examples, refer to Figure 4 The power conversion module 142 may further include a voltage reference circuit 1424, which is connected between the transformer circuit 1421 and the second node P2. The second node P2 is connected to both the first voltage tracker 1422 and the second voltage tracker 1423. This provides a high-precision, low-noise, and stable voltage reference for the first and second voltage trackers 1422 and 1423. The second node P2 is the output node of the voltage reference circuit 1424, and it is also connected to both the first and second voltage trackers 1422 and 1423. The voltage at this node is the reference voltage generated by the voltage reference circuit 1424, which serves as the input voltage for the voltage trackers and determines their output voltage level.

[0066] The VCC10V obtained above can be used as the input voltage of the voltage reference circuit 1424, and the voltage reference circuit 1424 converts the VCC10V voltage into the output voltage VCC5V_REF. The voltage accuracy is 0.1%, and the voltage reference circuit 1424 has the characteristics of low noise and low temperature drift, which increases the reliability and stability of the input voltage.

[0067] The output voltage VCC5V_REF of the voltage reference circuit 1424 serves as the input voltage for the first voltage tracker 1422 and the second voltage tracker 1423. The first voltage tracker 1422 outputs VCC5V_REF as VCC5V, and the second voltage tracker 1423 outputs VCC5V_ADC. The accuracy of the output VCC5V and VCC5V_ADC voltages varies within a 4mV range to meet the voltage accuracy requirements of other module circuits. The specific error range can be customized according to user needs, which will not be elaborated here.

[0068] Optionally, the second voltage tracker 1423 may also include an enable pin function. This enable pin is connected to the I / O pin of the MCU controller 130 to promptly shut down the enable pin of the second voltage tracker 1423 when a fault such as a short circuit occurs in the sensor core 110 testing device or the sensor core 110 itself. Consequently, the module power supply voltage of VCC5V_ADC will also disappear, thus protecting the sensor core 110 and the circuit module. In other words, when a short circuit fault is detected, the second voltage tracker 1423 is deenabled, causing it to stop supplying power to the sensor core 110 and the analog-to-digital converter module 120, preventing further losses due to the short circuit.

[0069] In some examples, refer to Figure 5 The testing device may also include a communication module 150, wherein the communication module 150 is connected to the controller 130 and the first voltage tracker 1422, and is used to send out the test data generated by the controller 130 so that other devices or systems can receive and use the data.

[0070] The communication module 150 can be a CAN module, see reference. Figure 6 As shown, the CAN module may include a CAN transceiver 151 and a CAN matching circuit 152. The CAN transceiver 151 is the core component of the communication module 150, connected to the controller 130 and the first voltage tracker 1422. The CAN transceiver 151 is responsible for sending and receiving data between the controller 130 and external devices. It converts the digital signals output by the controller 130 into differential signals suitable for transmission on the CAN bus, and can also convert the received differential signals into digital signals for processing by the controller 130.

[0071] The CAN matching circuit 152 is connected to the CAN transceiver 151. Its main function is to provide impedance matching for the CAN bus to reduce signal reflection and interference, and ensure the stability and reliability of data transmission. The CAN matching circuit 152 typically includes components such as terminating resistors, the value of which needs to match the characteristic impedance of the CAN bus.

[0072] After the controller 130 generates test data, it sends the data to the CAN transceiver 151 through its internal interface. The CAN transceiver 151 converts these digital signals into differential signals and then sends them out via the CAN bus. Differential signals have advantages such as strong anti-interference capability and long transmission distance, enabling stable data transmission in complex industrial environments. If the test device needs to receive data or commands from external devices, the CAN transceiver 151 converts the received differential signals back into digital signals and then transmits them to the controller 130 for processing. In this way, the test device can achieve bidirectional communication with external systems, meeting more complex testing and control needs. The CAN matching circuit 152 eliminates signal reflection and reduces signal distortion and noise interference by providing appropriate impedance matching at both ends of the CAN bus. This helps improve the accuracy and stability of data transmission, ensuring that test data can be transmitted completely and accurately to its destination.

[0073] In some examples, refer to Figure 7 The testing device may also include a temperature sensor 160, which is connected to the controller 130 and the power supply circuit 141. The controller 130 is responsible for receiving and processing the signal output by the temperature sensor 160, and performing corresponding control and adjustment based on the temperature information; the power supply circuit 141 provides the required voltage and current to the temperature sensor 160 to ensure its normal operation.

[0074] Temperature sensor 160 is used to detect the internal temperature of the testing device and transmit the detected temperature to controller 130. When the temperature is too high, controller 130 stops the testing device to prevent damage to the testing device.

[0075] In some examples, refer to Figure 8 The testing device also includes an external interface 170, which is connected to the communication module 150 and used to send test data. The external interface 170 is connected to both the communication module 150 and the controller 130. Test data generated by the communication module 150 is transmitted to the external interface 170 via an internal interface, while the controller 130 can also send control commands or receive external commands through the external interface 170. This connection method enables the testing device to exchange data and communicate with the external environment.

[0076] External interface 170 performs corresponding conversions and adaptations on the signals output by communication module 150 and controller 130 according to the communication protocol and interface standard of the external device or system. For example, if the external device uses a USB interface, external interface 170 needs to convert the CAN bus signal or the digital signal of controller 130 into a USB signal; if the external device uses an Ethernet interface, external interface 170 needs to convert the signal into an Ethernet signal. This process includes signal encoding, decoding, and level conversion to ensure that the data can be correctly recognized and received by the external device. The converted and adapted signal is transmitted to the external device or system through the connector of external interface 170. The connector can be various types of interfaces, such as USB, HDMI, RJ45, etc., and the appropriate interface type is selected according to actual needs. During data transmission, external interface 170 also needs to ensure the integrity and accuracy of the data to avoid data loss or damage due to transmission errors or interference.

[0077] In some examples, refer to Figure 8 The external interface 170 can also be connected between the power supply 141 and the power supply 141 conversion circuit. Simultaneously, the external interface 170 can also be connected to the temperature sensor 160. This means that the internal temperature information of the testing device detected by the temperature sensor 160 can be transmitted to external devices or systems through the external interface 170. At the same time, external devices can also control and adjust the testing device based on the temperature information.

[0078] By connecting the power supply 141, its conversion circuit, and the temperature sensor 160 via external interface 170, the testing device can achieve real-time monitoring and control of the power supply 141 and temperature, improving the system's intelligence and automation level and ensuring the stability and reliability of the testing process. Precise control of the power supply 141 and temperature helps provide a stable testing environment, reducing testing errors caused by power supply fluctuations and temperature changes, improving the accuracy and consistency of test data, and allowing for flexible adjustment of test parameters according to actual needs, thus improving testing efficiency. This multifunctional external interface 170 design enables the testing device to adapt to more complex application scenarios. The unified connection method of external interface 170 facilitates integration of the testing device with other systems, such as the power supply 141 management system and temperature control system, enabling centralized data management and processing; it also facilitates maintenance and upgrades of the testing device, improving system maintainability.

[0079] Optionally, the testing device may also be equipped with an alarm device connected to the controller 130, which is used to issue an alarm signal when the controller 130 detects abnormal test data.

[0080] Furthermore, this disclosure also provides a test system for a sensor core, which may include the aforementioned test system for the sensor core and an external device, wherein the external device is connected to the aforementioned test device for the sensor core, specifically, it can be connected through the aforementioned external interface.

[0081] The specific details of the testing device for the sensor core have been described in detail above, so they will not be repeated here.

[0082] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as the combination of these technical features does not contradict each other, it should be considered within the scope of this specification.

[0083] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the utility model applied herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not claimed herein.

[0084] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A testing device for a sensor core, characterized in that, include: An analog-to-digital converter module, connected to the sensor core, is used to convert analog signals during the testing process in the sensor core into digital signals; A controller, connected to the analog-to-digital converter module, is used to receive the digital signal and generate test data of the sensor core based on the digital signal. A power supply module is connected to the analog-to-digital converter module, the controller, and the sensor core, and is used to power the testing device for the sensor core.

2. The testing device for the sensor core according to claim 1, characterized in that, The power supply module includes: power supply; A power conversion module is used to convert the voltage provided by the power supply into a voltage that is compatible with both the analog-to-digital conversion module and the power supply module.

3. The testing device for the sensor core according to claim 2, characterized in that, The power conversion module includes: A transformer circuit is connected to the power supply; A first voltage tracker is connected between the transformer circuit and the controller; A second voltage tracker is connected between the transformer circuit and the first node, wherein the first node is simultaneously connected to the sensor core and the analog-to-digital converter module.

4. The testing device for the sensor core according to claim 3, characterized in that, The power conversion module further includes: A voltage reference circuit is connected between the transformer circuit and the second node, wherein the second node is connected to both the first voltage tracker and the second voltage tracker.

5. The testing device for the sensor core according to claim 3, characterized in that, The testing apparatus also includes: A communication module, connected to the controller and the first voltage tracker, is used to send the test data.

6. The testing device for the sensor core according to claim 5, characterized in that, The communication module includes: A CAN transceiver is connected to the controller and the first voltage tracker; A CAN matching circuit is connected to the CAN transceiver.

7. The testing device for the sensor core according to claim 5, characterized in that, The testing apparatus also includes: An external interface, connected to the communication module and the controller, is used to send the test data through the external interface.

8. The testing device for the sensor core according to claim 1, characterized in that, The testing apparatus also includes: A temperature sensor, connected to the controller and the power supply circuit, is used to detect temperature information within the testing device.

9. The testing device for the sensor core according to claim 1, characterized in that, The testing apparatus also includes: An alarm device, connected to the controller, is used to issue an alarm signal when the controller detects abnormal test data.

10. A testing system for a sensor core, characterized in that, include: The testing apparatus for the sensor core according to any one of claims 1 to 9; An external device, a testing device connected to the sensor core.

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