Rubber hose high and low temperature tester with thermal insulation structure

By introducing an insulation structure into the rubber hose high and low temperature tester, including insulation cotton, aluminum foil, insulation glass and semiconductor cooling chip, a closed insulation system is formed, which solves the problems of increased equipment size and heat dissipation, and realizes convenient and efficient high and low temperature testing.

CN223623964UActive Publication Date: 2025-12-02SUZHOU HUAREN TECH CO LTD
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Patent Information

Application Number
CN202422850593.2
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-22
Publication Date
2025-12-02
Estimated Expiration
2034-11-22

AI Technical Summary

Technical Problem

Existing high and low temperature testers separate high and low temperature settings, which increases the size of the equipment. The rubber hoses need to be swapped after testing, and heat or cold air can easily dissipate, causing the overall equipment to lose temperature.

Method used

It adopts an insulation structure design, including insulation cotton, aluminum foil, insulation glass and semiconductor cooling chip, combined with heating plate and fan to form a closed insulation system to achieve centralized insulation of heat and cold air.

Benefits of technology

It solves the problems of increased equipment size and heat dissipation, and realizes the convenience and heat preservation effect of high and low temperature testing of rubber hoses, avoiding the dissipation of heat or cold air after testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a rubber hose high and low temperature tester with a thermal insulation structure, which comprises a tester structure, the upper side and the lower side of the tester structure are respectively and fixedly provided with a high and low temperature testing structure, the tester structure comprises a tester body serving as a body, and the inner side of the tester body is filled with thermal insulation cotton. The tester comprises a tester body, heat preservation cotton is laid on the tester body, aluminum foil paper is laid on one side of the heat preservation cotton, grips are fixedly installed on the two sides of the tester body, through holes are formed in the upper portion and the lower portion of the tester body in a penetrating mode, a placing frame for placing and detecting a rubber hose is fixedly installed in the tester body, and a tester body door with heat preservation glass is rotatably installed in front of the tester body through a hinge. The tester body door and the tester body are connected in a clamped mode through a clamping piece, the high and low temperature testing structure comprises a connecting frame with the interior of a hollow structure, the connecting frame wraps the through hole and is fixedly connected with the through hole, and the rubber hose high and low temperature tester with the heat preservation structure plays a role in placement and detection of a detection sample through the arrangement of the placement frame.
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Description

Technical Field

[0001] This utility model relates to the field of rubber hose technology, specifically a high and low temperature tester for rubber hoses with a heat insulation structure. Background Technology

[0002] Rubber hoses are made of multiple layers of rubber combined with metals and non-metals through a special process. Due to the physical and chemical properties of the inner rubber layer, the effects of the transported medium on the pipeline, such as friction, impact, and corrosion, are reduced. Moreover, rubber hoses are flexible, so they are widely used in special working conditions of mineral processing and transportation. After production, rubber hoses need to undergo high and low temperature tests. A search revealed that the existing publicly available technology, with publication number CN208174799U, discloses a high and low temperature tester, comprising a low-temperature test chamber and a high-temperature test chamber. The low-temperature test chamber and the high-temperature test chamber have the same structure. The right side wall of the low-temperature test chamber is connected to the high-temperature test chamber via a connecting plate, and the left side wall of the low-temperature test chamber is connected to a control console. The upper surface of the low-temperature test chamber is provided with a first placement slot, and the left and right side walls of the first placement slot are each provided with a first support claw, the number of which is four. By placing a mobile phone into different test chambers, the mobile phone can be heated or cooled. The control button can control the operation of different heating plates or semiconductor cooling chips, achieving the effect of heating or cooling the entire or partial aspects of the mobile phone. The power of the heating plate or semiconductor cooling chip can be controlled by the voltage control knob, allowing the tested mobile phone to be placed at different temperatures. By observing the operation of the mobile phone at different temperatures, the testing purpose is achieved.

[0003] In summary: The high and low temperature testers in the above cases separate high and low temperatures. This separation not only increases the overall size of the equipment but also requires the rubber hoses to be moved to the corresponding interchangeable testing areas after testing in the high or low temperature zones. Furthermore, the high and low temperature testers in the above solutions are prone to heat loss after the rubber hoses are tested at high or low temperatures, leading to potential internal temperature loss within the testers. Utility Model Content

[0004] The purpose of this utility model is to address the shortcomings of the existing technology by providing a high and low temperature tester for rubber hoses with a heat-insulating structure. This solves the problem mentioned in the background art where the high and low temperature testers in the above-mentioned cases separate high and low temperatures. This separation not only increases the overall size of the device but also requires the rubber hose to be moved to a corresponding interchangeable testing area after testing in the high or low temperature region. Furthermore, in the above-mentioned high and low temperature testers, cold air or heat is easily dissipated after testing the rubber hose at high or low temperatures, leading to easy temperature loss inside the overall high and low temperature tester.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a high and low temperature tester for a rubber hose with a heat insulation structure, comprising a tester structure, wherein high and low temperature measuring structures are fixedly installed on the upper and lower sides of the tester structure respectively;

[0006] The tester structure includes a tester body as the main body, and the inside of the tester body is filled with heat insulation cotton, while aluminum foil is laid on one side of the heat insulation cotton.

[0007] The test instrument is fixedly equipped with handles on both sides, and through holes are opened at the top and bottom of the test instrument. At the same time, a placement rack for placing and testing rubber hoses is fixedly installed inside the test instrument.

[0008] By adopting the above technical solution, the placement rack is used to place and test the samples.

[0009] Preferably, the front of the test instrument body is equipped with a door with heat-insulating glass, which is rotatably mounted on the front via a hinge, and the door is engaged with the test instrument body via a locking mechanism.

[0010] By adopting the above technical solution, the insulated glass facilitates external observation.

[0011] Preferably, the high and low temperature measuring structure includes a connecting frame with a hollow internal structure, and the connecting frame is fixedly connected to the through hole. At the same time, a grid frame is fixedly installed inside the connecting frame, and a semiconductor cooling chip is fixedly installed on the grid frame, with the two ends of the semiconductor cooling chip respectively located inside and outside the connecting frame.

[0012] By adopting the above technical solution, the semiconductor cooling chip is set up to achieve rapid operation in series.

[0013] Preferably, a heating plate is fixedly installed inside the other connecting frame via a connecting bracket, and a fan is fixedly installed at the bottom of the other connecting frame, while another fan is fixedly installed at the top of the connecting frame.

[0014] By adopting the above technical solution, the installed fans can be used to transport cold and hot air.

[0015] Preferably, there is one set of connecting frames, and the connecting frames adopt an "inner circle and outer square" structure.

[0016] By adopting the above technical solution, the connecting frame can be used to fix the installation on the inner and outer sides.

[0017] Preferably, 24 semiconductor cooling chips are provided, and the semiconductor cooling chips are laid at equal intervals and fixed on the grid frame.

[0018] By adopting the above technical solution, the grid frame is used to achieve fixed installation.

[0019] Compared with the prior art, the beneficial effects of this utility model are: the high and low temperature tester for rubber hoses with heat insulation structure,

[0020] (1) This case solves the problem of differentiating between high and low temperature in the high and low temperature tester in the above case by setting the tester structure. Differentiating between high and low temperature not only increases the overall size of the equipment, but also causes the rubber hose to be taken to the corresponding interchangeable test area for testing after testing in the high or low temperature area. When the rubber hose needs to be tested for high and low temperature, the operator can turn the rotary button on the tester body to control the operation of the semiconductor cooling chip or heating plate. When the semiconductor cooling chip or heating plate is in operation, heat or cold air is delivered to the inside of the tester body to test the rubber hose for high and low temperature.

[0021] (2) By using the insulation cotton, aluminum foil and insulation glass in the structure of the tester, the problem of cold air or heat easily dissipating after the high and low temperature tester of the above solution is solved, which leads to the easy loss of temperature inside the high and low temperature tester. When the rubber hose is in the process of high and low temperature testing, the insulation cotton, aluminum foil and insulation glass are used to block the heat or cold air from spreading outward, so that the heat or cold air is concentrated inside the tester to keep the rubber hose warm during testing. Attached Figure Description

[0022] Figure 1 This is a frontal cross-sectional view of the present invention.

[0023] Figure 2 This is a schematic diagram of the structure of the test instrument body, handle, mounting frame, instrument door, and insulated glass of this utility model;

[0024] Figure 3 This is a schematic diagram of the structure of the testing instrument body, insulation cotton, and aluminum foil of this utility model;

[0025] Figure 4 This is a schematic diagram of a portion of the structure of the testing instrument body and the through hole of this utility model;

[0026] Figure 5 This is a schematic diagram of the connecting frame and fan structure of this utility model;

[0027] Figure 6 This is a schematic diagram of the grid frame and semiconductor cooling chip structure of this utility model;

[0028] Figure 7 This is a schematic diagram of the connecting frame and heating plate structure of this utility model.

[0029] In the diagram: 1. Tester structure; 101. Tester body; 102. Insulation cotton; 103. Aluminum foil; 104. Handle; 105. Through hole; 106. Placement rack; 107. Tester door; 108. Insulated glass; 2. High and low temperature test structure; 201. Connecting frame; 202. Grille frame; 203. Semiconductor cooling chip; 204. Connecting frame; 205. Heating plate; 206. Fan. Detailed Implementation

[0030] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0031] Please see Figure 1-7 This utility model provides a technical solution: a high and low temperature tester for a rubber hose with a heat-insulating structure, such as... Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, the device includes a testing instrument structure 1, which comprises a testing instrument body 101 as the main body. The inner side of the testing instrument body 101 is filled with insulation cotton 102, and aluminum foil 103 is laid on one side of the insulation cotton 102. Handles 104 are fixedly installed on both sides of the testing instrument body 101, and through holes 105 are opened at the top and bottom of the testing instrument body 101. A placement rack 106 for placing and testing rubber hoses is fixedly installed inside the testing instrument body 101. A door 107 with heat-insulating glass 108 is hinged and rotated at the front of the testing instrument body 101. The door 107 is connected to the testing instrument body 101 by a locking component. The overall structure and shape are designed like a microwave oven. The microwave oven structure formed by the above components facilitates the locking and closing of the door 107 and the opening and closing of the testing instrument body 101 for sample placement and testing.

[0032] like Figure 5 , Figure 6 and Figure 7As shown, high and low temperature measuring structures 2 are fixedly installed on the upper and lower sides of the tester structure 1. Each high and low temperature measuring structure 2 includes a connecting frame 201 with a hollow interior. One set of connecting frames 201 is provided, and the connecting frames 201 adopt an "inner circle, outer square" structure. The arrangement of two sets of these components not only demonstrates the practicality of the component installation but also its enveloping effect. Furthermore, the arrangement of two sets of these components simultaneously demonstrates the symmetry of the component installation and the inner side's ability to fix the components. The "inner circle, outer square" structure of the connecting frames 201 effectively encloses and fixes the through hole 105, and the connecting frames 201 enclose and fix the through hole 105, while also connecting... A grid frame 202 is fixedly installed inside the frame 201. A thermoelectric cooler 203 is fixedly installed on the grid frame 202. There are 24 thermoelectric coolers 203, which are evenly spaced and fixed on the grid frame 202. The arrangement of 24 of these components not only demonstrates the equidistant distribution of the components but also their series connection. Furthermore, the arrangement of 24 components also demonstrates the practicality and rapid cooling of the components. The evenly spaced arrangement of the thermoelectric coolers 203 on the grid frame 202 also enhances the aesthetics of the components. The two ends of each thermoelectric cooler 203 are located inside and outside the connecting frame 201, respectively.

[0033] Furthermore, in the above scheme, a heating plate 205 is fixedly installed inside another connecting frame 201 via a connecting bracket 204, and a fan 206 is fixedly installed at the bottom of the other connecting frame 201, while another fan 206 is fixedly installed above the connecting frame 201.

[0034] In the above scheme, when the rubber hose needs to be tested for high and low temperatures, the operator manually opens the instrument door 107, places the rubber hose to be tested on the placement rack 106, closes the instrument door 107, and turns the rotary button on the test instrument 101 to control the semiconductor cooling chip 203 or heating plate 205 and fan 206 to perform the high and low temperature test on the rubber hose.

[0035] The terms “center,” “longitudinal,” “lateral,” “front,” “rear,” “left,” “right,” “vertical,” “horizontal,” “top,” “bottom,” “inner,” and “outer,” etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are merely simplified descriptions for the convenience of describing this utility model and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limiting the scope of protection of this utility model.

[0036] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A high and low temperature tester for rubber hoses with a heat-insulating structure, comprising a tester structure (1), characterized in that: The test instrument structure (1) has high and low temperature measuring structures (2) fixedly installed on its upper and lower sides respectively; The tester structure (1) includes a tester body (101) as the main body, and the inner side of the tester body (101) is filled with thermal insulation cotton (102), while aluminum foil paper (103) is laid on one side of the thermal insulation cotton (102). The test instrument body (101) is fixedly equipped with handles (104) on both sides, and the test instrument body (101) is provided with through holes (105) at the top and bottom. At the same time, a placement rack (106) for placing and testing rubber hoses is fixedly installed inside the test instrument body (101).

2. The high and low temperature tester for a rubber hose with a heat-insulating structure according to claim 1, characterized in that: The instrument body (101) has a door (107) with heat-insulating glass (108) mounted on the front of it via a hinge, and the instrument body door (107) and the instrument body (101) are connected by a locking component.

3. The high and low temperature tester for a rubber hose with a heat-insulating structure according to claim 1, characterized in that: The high and low temperature measuring structure (2) includes a connecting frame (201) with a hollow internal structure, and the connecting frame (201) is fixedly connected to the through hole (105). At the same time, a grid frame (202) is fixedly installed inside the connecting frame (201), and a semiconductor cooling chip (203) is fixedly installed on the grid frame (202). The two ends of the semiconductor cooling chip (203) are respectively located inside and outside the connecting frame (201).

4. The high and low temperature tester for a rubber hose with a heat-insulating structure according to claim 3, characterized in that: A heating plate (205) is fixedly installed inside the other connecting frame (201) via a connecting bracket (204), and a fan (206) is fixedly installed at the bottom of the other connecting frame (201), while another fan (206) is fixedly installed above the connecting frame (201).

5. A high and low temperature tester for a rubber hose with a heat-insulating structure according to claim 3, characterized in that: One set of connecting frames (201) is provided, and the connecting frames (201) adopt an "inner circle and outer square" structure.

6. The high and low temperature tester for a rubber hose with a heat-insulating structure according to claim 3, characterized in that: The semiconductor cooling chip (203) is provided in 24 pieces, and the semiconductor cooling chip (203) is laid and fixed on the grid frame (202) at equal intervals.