Defect detection device
By using a composite light source and a light-diffusing plate in the defect detection device, the problems of jitter and slippage caused by the excessive space occupied by the light source are solved, the detection accuracy and image clarity are improved, and a more stable imaging effect is achieved.
Patent Information
- Application Number
- CN202520214460.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-11
- Publication Date
- 2025-12-02
- Estimated Expiration
- 2035-02-11
AI Technical Summary
In existing defect detection devices, the light source occupies too much space, which increases the spacing of the transmission structure, causing the object under test to shake and slip, thus affecting the detection accuracy and precision.
A composite light source is used, which encapsulates the first and second light sources in the same housing, reducing the space occupied by the light sources, shortening the spacing between the conductive structures, increasing the support for the object under test, using a light-diffusing plate to expand the light spot, increasing the illumination area, and obtaining a clear image through the control unit.
It improves the detection accuracy and image clarity of the defect detection device, reduces the jitter and offset of the test object on the transmission structure, and enhances the imaging effect of the imaging unit.
Smart Images
Figure CN223624136U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of optical inspection technology, and in particular to a defect detection device. Background Technology
[0002] Common defects are inevitably generated during the production of photovoltaic glass substrates, such as bubbles, open bubbles, stones, unevenness, and roll marks. Further scratches on the top and bottom surfaces can occur during downstream production. To ensure the safety and performance requirements of photovoltaic glass, defect detection is necessary before shipment to prevent greater losses. However, the diversity of defects and the uniform light distribution and refraction characteristics of the top and bottom surfaces of photovoltaic glass pose a significant challenge for lighting applications.
[0003] Because there are too many lighting sources in the defect detection process, the gap between the rubber rollers used to place the lighting sources is inevitably widened, which causes the glass to shake and slip noticeably when it passes through the gap between the rubber rollers during the inspection. Utility Model Content
[0004] This utility model provides a defect detection device that reduces jitter and offset when the structure to be detected moves on the conductive structure, and makes the image of the structure to be detected captured by the imaging unit clearer, thereby improving the detection accuracy of the defect detection device.
[0005] To achieve this objective, the present invention adopts the following technical solution:
[0006] This utility model provides a defect detection device, including a first conductive structure, a second conductive structure, an imaging unit, a control unit, and a composite light source. The first conductive structure, the second conductive structure, and the composite light source are located on the same side of the structure to be detected, and the composite light source is located between the first conductive structure and the second conductive structure.
[0007] The composite light source includes a first light source, a second light source, and a housing;
[0008] The first light source is used to emit a first beam of light, which illuminates the structure to be detected and is received by the imaging unit after being transmitted or reflected by the structure to be detected.
[0009] The second light source is used to emit a second beam, which illuminates the structure to be detected and is received by the imaging unit after being transmitted or reflected by the structure to be detected.
[0010] The first beam and the second beam propagate in different directions;
[0011] The housing is used to encapsulate the first light source and the second light source;
[0012] The imaging unit is used to perform imaging based on a first beam and / or a second beam;
[0013] The control unit is electrically connected to the imaging unit and is used to acquire the image formed by the imaging unit and determine the defect type of the structure to be detected based on the image.
[0014] Optionally, the composite light source also includes a light-diffusing plate located in the propagation path of the first beam and the second beam, for scattering the first beam and the second beam.
[0015] Optionally, the housing includes a protective cover plate disposed in the optical path of the first beam and the second beam to protect the first light source and the second light source.
[0016] Optionally, the composite light source also includes a third light source, which is disposed inside the housing;
[0017] The third light source is used to emit a third beam. The third beam illuminates the structure to be detected and is received by the imaging unit after being transmitted or reflected by the structure to be detected. The propagation direction of the third beam is different from the propagation direction of the first beam and the propagation direction of the second beam.
[0018] The imaging unit is also used for imaging based on a third beam.
[0019] Optionally, the second and third light sources are located on opposite sides of the first light source.
[0020] Optionally, the composite light source further includes a first focusing module and a second focusing module;
[0021] The first focusing module is used to focus the first beam, and the second focusing module is used to focus the second beam.
[0022] Optionally, the first focusing module includes a focusing rod or a Fresnel lens; the second focusing module includes a focusing rod or a Fresnel lens.
[0023] Optionally, the control unit is electrically connected to the first light source and the second light source, respectively;
[0024] The control unit is used to control the lighting mode of the first and second light sources;
[0025] The lighting methods include lighting the first light source and the second light source simultaneously, and lighting the first light source and the second light source alternately.
[0026] Optionally, the defect detection device further includes a third conductive structure, which is located on the side of the second conductive structure away from the first conductive structure;
[0027] The distance between the first and second conductive structures is L1, and the distance between the second and third conductive structures is L2.
[0028] Wherein, |L1-L2| / L1≤20%.
[0029] Optionally, the first light source includes multiple light-emitting diodes, and the second light source includes multiple light-emitting diodes.
[0030] The defect detection device provided in this embodiment of the present invention achieves the function of replacing two light sources with a composite light source by encapsulating the first light source and the second light source in the same housing. Compared with the light sources in the prior art, the composite light source occupies less space, thereby shortening the gap between the first and second conductive structures and making the conductive structures more densely arranged. Therefore, the structure to be detected can obtain more support, resulting in less jitter and offset when the structure to be detected moves on the conductive structure. This makes the image of the structure to be detected captured by the imaging unit clearer and improves the detection accuracy of the defect detection device.
[0031] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this utility model, nor is it intended to limit the scope of this utility model. Other features of this utility model will become readily apparent from the following description. Attached Figure Description
[0032] To more clearly illustrate the technical solutions in the embodiments of this utility model, the drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0033] Figure 1 This is a schematic diagram of the structure of the first defect detection device provided in this embodiment of the present invention;
[0034] Figure 2 This is a schematic diagram of the structure of the second defect detection device provided in this embodiment of the present invention;
[0035] Figure 3 This is a schematic diagram of the structure of the third defect detection device provided in this embodiment of the present invention;
[0036] Figure 4 This is a schematic diagram of the structure of the fourth defect detection device provided in this embodiment of the present invention;
[0037] Figure 5 This is a schematic diagram of the structure of the fifth defect detection device provided in this embodiment of the present invention;
[0038] Figure 6 This is a schematic diagram of the sixth defect detection device provided in this embodiment of the present invention;
[0039] Figure 7 This is a schematic diagram of the structure of the seventh defect detection device provided in this embodiment of the utility model;
[0040] In the picture:
[0041] 101. First conductive structure; 102. Second conductive structure; 103. Third conductive structure; 200. Imaging unit; 300. Composite light source; 301. First light source; 302. Second light source; 303. Outer shell; 304. Light-diffusing plate; 305. Protective cover plate; 306. Third light source; 307. First focusing module; 308. Second focusing module; 400. Structure to be tested. Detailed Implementation
[0042] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.
[0043] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.
[0044] Existing defect detection devices typically include multiple light sources, which are generally positioned between conductive structures. Because multiple light sources occupy excessive space, the gaps between the conductive structures are inevitably widened. When the conductive structure transmits the object under test, the excessively large gap reduces the support received by the object. When the ends of the object pass through excessively large gaps, the unsupported portion of the object becomes too long, causing the object's center of gravity to shift, leading to shaking or slippage. This results in blurred or distorted images captured by the camera, reducing the accuracy and precision of defect detection.
[0045] To address the aforementioned problems, this utility model provides a defect detection device. Figure 1 This is a schematic diagram of the structure of the first defect detection device provided in this embodiment of the present invention, with reference to... Figure 1 The defect detection device includes a first conductive structure 101, a second conductive structure 102, an imaging unit 200, a control unit (not shown in the figure), and a composite light source 300. The first conductive structure 101, the second conductive structure 102, and the composite light source 300 are located on the same side of the structure to be detected 400, and the composite light source 300 is located between the first conductive structure 101 and the second conductive structure 102. The composite light source 300 includes a first light source 301, a second light source 302, and a housing 303. The first light source 301 is used to emit a first light beam S1, which illuminates the structure to be detected 400 and is transmitted through the structure to be detected 400. The first light beam S1 and the second light beam S2 are received by the imaging unit 200 after being reflected or transmitted through the structure 400. The second light source 302 is used to emit a second light beam S2, which illuminates the structure 400 to be inspected and is received by the imaging unit 200 after being transmitted or reflected by the structure 400. The propagation directions of the first light beam S1 and the second light beam S2 are different. The housing 303 is used to encapsulate the first light source 301 and the second light source 302. The imaging unit 200 is used to perform imaging based on the first light beam S1 and / or the second light beam S2. The control unit is electrically connected to the imaging unit 200 and is used to acquire the image formed by the imaging unit 200 and determine the defect type of the structure 400 to be inspected based on the image.
[0046] refer to Figure 1 When the first light beam S1 or the second light beam S2 illuminates a defect on the structure 400 to be inspected, the first light beam S1 or the second light beam S2 will be scattered, thereby causing a change in the light intensity of the first light beam S1 or the second light beam S2 received by the imaging unit 200. The control unit can determine the type of defect in the structure 400 based on the image information carried by the first light beam S1 or the second light beam S2 received by the imaging unit 200. By encapsulating the first light source 301 and the second light source 302 in the same housing 303 to form a composite light source 300, the space occupied by the first light source 301 and the second light source 302 can be effectively reduced. Compared to existing technologies, the composite light source 300 provided in this embodiment of the present invention occupies less space. Since the composite light source 300 is disposed between the first conductive structure 101 and the second conductive structure 102, the distance between the first conductive structure 101 and the second conductive structure 102 can be shortened, thereby providing support for the structure to be detected 400 with a smaller gap. This allows the structure to be detected 400 to move more smoothly on the first conductive structure 101 and the second conductive structure 102, resulting in clearer images of the structure to be detected 400 captured by the imaging unit 200.
[0047] Figure 2 This is a schematic diagram of the structure of the second defect detection device provided in this embodiment of the present invention. Figure 1This demonstrates the position of the imaging unit 200 when detecting a light-transmitting structure 400. In this case, the imaging unit 200 and the composite light source 300 are located on different sides of the structure 400. If an opaque structure 400, such as a steel plate, is to be detected, the imaging unit 200 and the composite light source 300 should be located on the same side of the structure 400. In this case, the position of the imaging unit 200 should be as follows: Figure 2 As shown.
[0048] The defect detection device provided in this embodiment of the present invention achieves the function of replacing two light sources with a composite light source by encapsulating the first light source and the second light source in the same housing. Compared with the light sources in the prior art, the composite light source occupies less space, thereby shortening the gap between the first and second conductive structures and making the conductive structures more densely arranged. Therefore, the structure to be detected can obtain more support, resulting in less jitter and offset when the structure to be detected moves on the conductive structure. This makes the image of the structure to be detected captured by the imaging unit clearer and improves the detection accuracy of the defect detection device.
[0049] Based on the above embodiments, the first light source 301 includes multiple light-emitting diodes (LEDs), and the second light source 302 includes multiple LEDs. LEDs are relatively small, and using LEDs as light-emitting devices allows the first light source 301 and the second light source 302 to occupy less space.
[0050] Figure 3 This is a schematic diagram of the structure of the third defect detection device provided in this embodiment of the present invention, for reference. Figure 3 The composite light source 300 also includes a light-diffusing plate 304, which is located on the propagation path of the first beam S1 and the second beam S2 and is used to scatter the first beam S1 and the second beam S2.
[0051] refer to Figure 3The homogenizing plate 304 can expand the light spots of the first beam S1 and the second beam S2. During the detection process, the imaging unit cannot directly capture a complete image of the structure under test 400. Therefore, the imaging unit 200 must coordinate with the moving speed of the structure under test 400 and capture images of the structure under test 400 at regular intervals. Finally, the images obtained by stitching together the images can form a complete image of the structure under test 400. However, if the light spots of the first beam S1 and the second beam S2 illuminating the structure under test 400 are too small, and the illuminated portion of the structure under test 400 is too small at the same time, there will be unilluminated dark spots between each illuminated area in the image captured by the imaging unit 200. This will lead to a decrease in the detection capability of the defect detection device. Therefore, it is necessary to use the homogenizing plate 304 to expand the light spots of the first beam S1 and the second beam S2, thereby expanding the illuminated area of the structure under test 400, so that the structure under test 400 is fully illuminated in the final image of the complete structure under test 400. The homogenizing plate 304 needs to be set according to actual needs. If both the first beam S1 and the second beam S2 need to expand the light spot, then the first beam S1 and the second beam S2 can share the homogenizing plate 304. Multiple homogenizing plates 304 will occupy too much space, resulting in an excessively large volume of the composite light source 300. Sharing the same homogenizing plate 304 for the first beam S1 and the second beam S2 can significantly reduce the volume of the composite light source 300, thereby ensuring that the first conductive structure 101 and the second conductive structure 102 are not too far apart due to the excessive size of the composite light source 300. This ensures that the first conductive structure 101 and the second conductive structure 102 can provide sufficient support for the structure under test 400, ensuring the stability of the structure under test 400 during movement.
[0052] Figure 4 This is a schematic diagram of the structure of the fourth defect detection device provided in this embodiment of the present invention, for reference. Figure 4 The outer casing 303 includes a protective cover plate 305, which is disposed in the optical path of the first beam S1 and the second beam S2 to protect the first light source 301 and the second light source 302. The protective cover plate 305 is a light-transmitting structure, allowing the first beam S1 and the second beam S2 to propagate through it. Simultaneously, the protective cover plate 305 protects the first light source 301 and the second light source 302 from interference by foreign objects. Optionally, the structure of the outer casing 303, excluding the protective cover plate 305, is treated with an anti-reflection coating to prevent reflection of the first beam S1 and the second beam S2 within the outer casing 303, ensuring that the first beam S1 and the second beam S2 do not interfere with each other.
[0053] Figure 5 This is a structural schematic diagram of the fifth defect detection device provided in this embodiment of the present invention, for reference. Figure 5The composite light source 300 also includes a third light source 306, which is disposed inside the housing 303. The third light source 306 is used to emit a third beam S3, which illuminates the structure to be tested 400 and is received by the imaging unit 200 after being transmitted or reflected by the structure to be tested 400. The propagation direction of the third beam S3 is different from the propagation direction of the first beam S1 and the propagation direction of the second beam S2. The imaging unit 200 is also used to perform imaging based on the third beam S3.
[0054] refer to Figure 5 The third beam S3 provides illumination beams with different directions. Some defects will only scatter or reflect beams in a certain direction. Adding the third beam S3 can increase the probability of detecting inconspicuous defects and improve the detection capability of the defect detection device.
[0055] refer to Figure 5 Optionally, the second light source 302 and the third light source 306 are located on opposite sides of the first light source 301. The location of the second light source 302 and the third light source 306 on opposite sides of the first light source 301 allows the propagation directions of the second beam S2 and the third beam S3 to be different, resulting in different detected defects. By alternately illuminating the second light source 302 and the third light source 306, different defects can be detected separately.
[0056] Figure 6 This is a structural schematic diagram of the sixth defect detection device provided in this embodiment of the present invention, for reference. Figure 6 The composite light source 300 also includes a first focusing module 307 and a second focusing module 308; the first focusing module 307 is used to focus the first beam S1, and the second focusing module 308 is used to focus the second beam S2. The first focusing module 307 and the second focusing module 308 can make the beam energy output by the composite light source 300 more concentrated, and make the energy utilization rate of the composite light source 300 higher.
[0057] Optionally, the first focusing module 307 includes a focusing rod or a Fresnel lens; the second focusing module 308 includes a focusing rod or a Fresnel lens. Both the focusing rod and the Fresnel lens can achieve focusing, and can be selected according to the requirements of the composite light source.
[0058] Optionally, the control unit is electrically connected to the first light source 301 and the second light source 302 respectively; the control unit is used to control the lighting mode of the first light source 301 and the second light source 302; the lighting mode includes the simultaneous lighting of the first light source 301 and the second light source 302 and the alternating lighting of the first light source 301 and the second light source 302.
[0059] During the inspection process, simultaneous illumination of the first light source 301 and the second light source 302 provides stronger illumination, making it easier for the defect detection device to detect dirt defects. However, simultaneous illumination of the first light source 301 and the second light source 302 can cause the imaging unit 200 to receive excessive light intensity, resulting in overexposure of the image acquired by the imaging unit 200, making it impossible to display inconspicuous defects such as bubbles and scratches in the image. If the first light source 301 and the second light source 302 are illuminated alternately, the imaging unit 200 receives less light, the contrast of the image captured by the imaging unit 200 is improved, and the defect detection device can detect some inconspicuous defects separately. The control unit can determine the type and location of defects in the structure to be inspected based on the images captured by the imaging unit 200.
[0060] Figure 7 This is a structural schematic diagram of the seventh defect detection device provided in this embodiment of the present invention, for reference. Figure 7 The defect detection device also includes a third conductive structure 103, which is located on the side of the second conductive structure 102 away from the first conductive structure 101; the distance between the first conductive structure 101 and the second conductive structure 102 is L1, and the distance between the second conductive structure 102 and the third conductive structure 103 is L2; wherein, |L1-L2| / L1≤20%.
[0061] refer to Figure 7 Since the composite light source 300 occupies a small space, the difference between the distance L1 between the first conductive structure 101 and the second conductive structure 102 and the distance L2 between the second conductive structure 102 and the third conductive structure 103 is not large. The first conductive structure 101 and the second conductive structure 102 can be well supported based on the structure to be detected 400, thereby making the movement of the structure to be detected on the conductive structure more stable, reducing the jitter and offset of the structure to be detected 400 when it moves on the conductive structure, making the image of the structure to be detected 400 captured by the imaging unit 200 clearer, and improving the detection accuracy of the defect detection device.
[0062] The specific embodiments described above do not constitute a limitation on the scope of protection of this utility model. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this utility model should be included within the scope of protection of this utility model.
Claims
1. A defect detection device, characterized in that, The device includes a first conductive structure (101), a second conductive structure (102), an imaging unit (200), a control unit, and a composite light source (300). The first conductive structure (101), the second conductive structure (102), and the composite light source (300) are located on the same side of the structure to be detected (400), and the composite light source (300) is located between the first conductive structure (101) and the second conductive structure (102). The composite light source (300) includes a first light source (301), a second light source (302), and a housing (303); The first light source (301) is used to emit a first light beam, which illuminates the structure to be detected (400) and is received by the imaging unit (200) after being transmitted or reflected by the structure to be detected (400). The second light source (302) is used to emit a second beam, which illuminates the structure to be tested (400) and is received by the imaging unit (200) after being transmitted or reflected by the structure to be tested (400). The first beam and the second beam have different propagation directions; The outer casing (303) is used to enclose the first light source (301) and the second light source (302); The imaging unit (200) is used to perform imaging based on the first beam and / or the second beam; The control unit is electrically connected to the imaging unit (200) and is used to acquire the image formed by the imaging unit (200) and determine the defect type of the structure to be detected (400) based on the image.
2. The defect detection device according to claim 1, characterized in that, The composite light source (300) further includes a light-diffusing plate (304), which is located on the propagation path of the first beam and the second beam and is used to scatter the first beam and the second beam.
3. The defect detection device according to claim 1, characterized in that, The housing (303) includes a protective cover plate (305), which is disposed in the optical path of the first beam and the second beam to protect the first light source (301) and the second light source (302).
4. The defect detection device according to claim 1, characterized in that, The composite light source (300) further includes a third light source (306), which is disposed inside the housing (303); The third light source (306) is used to emit a third beam, which illuminates the structure to be tested (400) and is received by the imaging unit (200) after being transmitted or reflected by the structure to be tested (400). The propagation direction of the third beam is different from the propagation direction of the first beam and the propagation direction of the second beam. The imaging unit is also used to perform imaging based on the third beam.
5. The defect detection device according to claim 4, characterized in that, The second light source (302) and the third light source (306) are respectively located on opposite sides of the first light source (301).
6. The defect detection device according to claim 1, characterized in that, The composite light source (300) further includes a first focusing module (307) and a second focusing module (308); The first focusing module (307) is used to focus the first beam, and the second focusing module (308) is used to focus the second beam.
7. The defect detection device according to claim 6, characterized in that, The first focusing module (307) includes a focusing rod or a Fresnel lens; the second focusing module (308) includes a focusing rod or a Fresnel lens.
8. The defect detection device according to claim 1, characterized in that, The control unit is electrically connected to the first light source (301) and the second light source (302) respectively; The control unit is used to control the lighting mode of the first light source (301) and the second light source (302); The lighting methods include simultaneously lighting the first light source (301) and the second light source (302), and alternately lighting the first light source (301) and the second light source (302).
9. The defect detection device according to claim 1, characterized in that, It also includes a third conductive structure (103), which is located on the side of the second conductive structure (102) away from the first conductive structure (101); The distance between the first conductive structure (101) and the second conductive structure (102) is L1, and the distance between the second conductive structure (102) and the third conductive structure (103) is L2; Wherein, |L1-L2| / L1≤20%.
10. The defect detection device according to claim 1, characterized in that, The first light source (301) includes a plurality of light-emitting diodes, and the second light source (302) includes a plurality of light-emitting diodes.