Oscilloscope meter pen test fixing tool

Abstract

The utility model provides an oscilloscope meter pen test fixing tool, which comprises a base, a first test line, a second test line and a fixing assembly, and is characterized in that the fixing assembly is electrically connected with the first test line and the second test line respectively and comprises a first support and a second support which are arranged at an interval; the first support is used for fixing a grounding probe of an oscilloscope and is electrically connected with the grounding probe, and the second support is used for fixing a signal probe of the oscilloscope and is electrically connected with the signal probe. During testing, a to-be-tested circuit board can be placed on the base, a signal probe and a grounding probe of the oscilloscope are fixed on the fixing assembly, the grounding probe of the oscilloscope probe is electrically connected with the first testing line, the signal probe is electrically connected with the second testing line, manual operation is not needed, a testing point does not need to be additionally designed on the to-be-tested circuit board, and the testing efficiency is improved. The reliability of connection between the signal probe and the grounding probe and the to-be-tested circuit board during testing is improved, additional design of the to-be-tested circuit board is not needed, and miniaturization of the to-be-tested circuit board is facilitated.

Description

Technical Field

[0001] This utility model relates to the field of automated testing technology, and in particular to a fixture for testing oscilloscope probes. Background Technology

[0002] This section provides only background information relevant to this disclosure and is not necessarily prior art.

[0003] As the requirements for automated product performance testing become increasingly stringent, the reliability of oscilloscope connections is becoming more and more prominent. Frequent occurrences of product malfunctions or repeated testing due to unreliable connections cause significant disruptions to product testing.

[0004] Currently, there are two main ways to connect oscilloscope probes during testing. One method involves manually pressing the probes onto the test point for data acquisition, but this is a manual operation and cannot maintain reliability over extended periods. The other method involves pre-installing test vias in the product design, inserting the oscilloscope probes into these vias for secure testing. However, this method is limited by product design, hinders versatility, and as product sizes decrease, it becomes increasingly difficult to retain via test points. Utility Model Content

[0005] The purpose of this invention is to at least solve the problem of poor reliability of the connection between the oscilloscope probes and the device under test during testing. This objective is achieved through the following technical solution:

[0006] This utility model proposes a fixture for fixing the test leads of an oscilloscope, comprising:

[0007] The base is used to place the circuit board under test;

[0008] The first test lead is disposed on the base and is used to electrically connect to the ground wire of the circuit board under test;

[0009] The second test lead is disposed on the base and is used to electrically connect to the positive terminal of the circuit board under test;

[0010] A fixing component is disposed on the base. The fixing component includes a first bracket and a second bracket disposed at intervals. The first bracket is electrically connected to the first test lead, and the second bracket is electrically connected to the second test lead. The first bracket is used to fix the ground probe of the oscilloscope and is electrically connected to the ground probe. The second bracket is used to fix the signal probe of the oscilloscope and is electrically connected to the signal probe.

[0011] The oscilloscope probe testing fixture proposed in this utility model has a base for placing the circuit board under test (PCB). During testing, the PCB can be placed on the base, the first test lead is electrically connected to the ground wire of the PCB, and the second test lead is electrically connected to the positive terminal of the PCB. The oscilloscope's signal probe and ground probe are fixed on the fixing component. At this time, the ground probe of the oscilloscope probe is electrically connected to the first test lead, and the signal probe is electrically connected to the second test lead, thereby achieving an electrical connection with the PCB. During testing, the signal probe and ground probe are fixed by the fixing component, eliminating the need for manual operation and additional test points on the PCB. This improves the reliability of the connection between the oscilloscope's signal probe and ground probe and the PCB during testing, and the elimination of the need for additional design of the PCB facilitates the miniaturization of the PCB.

[0012] In addition, the oscilloscope probe testing fixture of this utility model may also have the following additional technical features:

[0013] In some embodiments of this invention, the first bracket has a mounting hole for inserting the signal probe.

[0014] In some embodiments of this utility model, the first bracket includes a first support portion and a clamping portion. The first support portion is electrically connected to the first test line and is used for clamping the grounding probe. The clamping portion is connected to the first support portion in an openable and closable manner. A portion of the outer surface of the clamping portion facing the first support portion is recessed to form a portion of the mounting hole, and another portion of the outer surface of the first support portion facing the clamping portion is recessed to form another portion of the mounting hole.

[0015] In some embodiments of this utility model, along the radial direction of the mounting hole, one end of the clamping part is rotatably connected to the first support part, and the other end of the clamping part can be connected to or separated from the first support part by the rotation of the clamping part.

[0016] In some embodiments of this utility model, the second bracket has a contact hole coaxially disposed with the mounting hole, the contact hole being used for inserting the signal probe, and the wall of the contact hole being electrically connected to the signal probe.

[0017] In some embodiments of this utility model, the first test line and the second test line are in a straight line structure, and the first test line and the second test line are arranged parallel to each other.

[0018] In some embodiments of this utility model, the base is provided with a plurality of placement positions for placing the circuit board under test. The plurality of placement positions are arranged between the first test line and the second test line and are spaced apart along the extension direction of the first test line.

[0019] In some embodiments of this utility model, the outer surface of the base is partially recessed to form a first groove and a second groove. A portion of the first test line is embedded in the first groove and extends along the first groove. A portion of the second test line is embedded in the second groove and extends along the second groove.

[0020] In some embodiments of this utility model, the oscilloscope probe test fixture further includes a third test lead and a fourth test lead. One end of the third test lead is electrically connected to the first test lead, and the other end of the third test lead is used for electrical connection to the ground wire of other circuit boards under test. The third test lead is bendable or movable relative to the base. One end of the fourth test lead is electrically connected to the second test lead, and the other end of the fourth test lead is used for electrical connection to the ground wire of other circuit boards under test. The fourth test lead is bendable or movable relative to the base.

[0021] In some embodiments of this utility model, the base has a flat plate structure. Attached Figure Description

[0022] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of the invention. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:

[0023] Figure 1 The diagram schematically illustrates a first-view structural schematic of an oscilloscope probe test fixture according to an embodiment of the present invention.

[0024] Figure 2 The diagram schematically illustrates a second-view structural schematic of an oscilloscope probe test fixture according to an embodiment of the present invention.

[0025] Figure 3 A schematic diagram of the structure of an oscilloscope probe test fixture (with a third test lead and a fourth test lead) according to an embodiment of the present invention is shown.

[0026] The attached figures are labeled as follows:

[0027] 10. Base; 101. First groove; 102. Second groove; 11. First test line; 12. Second test line; 13. Third test line; 14. Fourth test line;

[0028] 20. Fixing component; 21. First bracket; 211. First support part; 212. Clamping part; 213. Mounting hole; 22. Second bracket; 221. Contact hole;

[0029] 30. Circuit board to be tested. Detailed Implementation

[0030] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0031] It should be understood that the terminology used herein is for the purpose of describing particular exemplary embodiments only and is not intended to be limiting. Unless the context clearly indicates otherwise, the singular forms “a,” “an,” and “described” as used herein may also include the plural forms. The terms “comprising,” “including,” “containing,” and “having” are inclusive and therefore indicate the presence of the stated features, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, elements, components, and / or combinations thereof. The method steps, processes, and operations described herein are not construed as requiring them to be performed in a particular order described or illustrated unless the order of performance is explicitly indicated. It should also be understood that additional or alternative steps may be used.

[0032] Although terms such as first, second, third, etc., may be used in this document to describe multiple elements, components, regions, layers, and / or segments, these elements, components, regions, layers, and / or segments should not be limited by these terms. These terms may be used only to distinguish one element, component, region, layer, or segment from another. Unless the context clearly indicates otherwise, terms such as "first," "second," and other numerical terms used herein do not imply order or sequence. Therefore, the first element, component, region, layer, or segment discussed below may be referred to as the second element, component, region, layer, or segment without departing from the teachings of the exemplary embodiments.

[0033] For ease of description, spatial relative terms may be used in the text to describe the relationship of one element or feature relative to another element or feature, as shown in the figure. These relative terms include, for example, "inside," "outside," "middle," "outer," "below," "below," "above," "over," etc. Such spatial relative terms are intended to include different orientations of the device in use or operation, other than those depicted in the figure. For example, if the device in the figure is flipped, an element described as "below other elements or features" or "below other elements or features" would subsequently be oriented as "above other elements or features" or "above other elements or features." Therefore, the example term "below" can include both upper and lower orientations. The device may be otherwise oriented (rotated 90 degrees or in other directions), and the spatial relative descriptors used in the text will be interpreted accordingly.

[0034] like Figures 1 to 3 As shown, this utility model proposes a fixture for fixing test leads of an oscilloscope, comprising:

[0035] Base 10, used to place the circuit board 30 under test;

[0036] The first test line 11 is set on the base 10 and is used to electrically connect to the ground wire of the circuit board 30 under test;

[0037] The second test line 12 is disposed on the base 10 and is used for electrical connection with the positive terminal of the circuit board 30 under test;

[0038] The fixing component 20 is disposed on the base 10. The fixing component 20 includes a first bracket 21 and a second bracket 22 disposed at intervals. The first bracket 21 is electrically connected to the first test line 11, and the second bracket 22 is electrically connected to the second test line 12. The first bracket 21 is used to fix the grounding probe of the oscilloscope and is electrically connected to the grounding probe. The second bracket 22 is used to fix the signal probe of the oscilloscope and is electrically connected to the signal probe.

[0039] Understandable,

[0040] The oscilloscope probe testing fixture proposed in this utility model has at least one placement position for placing the circuit board under test (PCB) 30. During testing, the PCB 30 can be placed in the placement position, the first test lead 11 is electrically connected to the ground wire of the PCB 30, and the second test lead 12 is electrically connected to the positive terminal of the PCB 30. The oscilloscope's signal probe and ground probe are fixed on the fixing component 20. At this time, the ground probe of the oscilloscope probe is electrically connected to the first test lead 11, and the signal probe is electrically connected to the second test lead 12, thereby realizing the electrical connection with the PCB 30. During testing, the signal probe and ground probe are fixed by the fixing component 20, eliminating the need for manual operation and additional test points on the PCB 30. This improves the reliability of the connection between the oscilloscope's signal probe and ground probe and the PCB 30 during testing, and eliminates the need for additional design of the PCB 30, which is beneficial for the miniaturization of the PCB 30.

[0041] In some embodiments of the present invention, the first bracket 21 has a mounting hole 213 for inserting a signal probe.

[0042] It is understandable that the first bracket 21 can be a plate structure with a certain thickness. The first bracket 21 has mounting holes 213 parallel to the base 10. The signal probe can be inserted into the mounting holes 213 for fixation. Fixing the signal probe through the first bracket 21 reduces the drawback of needing to manually operate the signal probe during testing.

[0043] In some embodiments of this utility model, the first bracket 21 includes a first support portion 211 and a clamping portion 212. The first support portion 211 is electrically connected to the first test line 11. The first support portion 211 is used for clamping the grounding probe. The clamping portion 212 is connected to the first support portion 211 in an openable manner. A portion of the outer surface of the clamping portion 212 facing the first support portion 211 is recessed to form a partial mounting hole 213. Another portion of the outer surface of the first support portion 211 facing the clamping portion 212 is recessed to form a partial mounting hole 213.

[0044] It is understood that the first support part 211 can be a plate structure with a certain thickness. A C-shaped groove is formed on one side of the first support part 211, and a C-shaped groove is also formed on one side of the clamping part 212. The clamping part 212 can be a C-shaped structure with a C-shaped groove. The clamping part 212 can be rotatably connected to the first support part 211 to achieve an openable and closable effect. Alternatively, the clamping part 212 and the first support part 211 can be fixed with bolts or connected with snaps to achieve a detachable and openable effect. The C-shaped groove of the clamping part 212 and the C-shaped groove of the first support part 211 are connected to form a complete mounting hole 213 for fixing the signal probe.

[0045] In some embodiments of this utility model, along the radial direction of the mounting hole 213, one end of the clamping part 212 is rotatably connected to the first support part 211, and the other end of the clamping part 212 can be connected to or separated from the first support part 211 under the rotation of the clamping part 212.

[0046] It is understood that the clamping part 212 can be a C-shaped structure, and one end of the clamping part 212 is rotatably connected to the first support part 211 by a hinge, so that the clamping part 212 can rotate around the hinge position as an axis. The other end of the clamping part 212 can connect to or divert traffic from the first support part 211 during rotation. The movable end of the clamping part 212 and the first support part 211 can be provided with mutually cooperating snaps, so that the clamping part 212 can be fastened and fixed to the first support part 211, improving reliability. By setting the clamping part 212, the signal probe can be installed into the mounting hole 213 when the clamping part 212 is open, and is tightly connected to the first bracket 21 when the clamping part 212 is fastened, improving the reliability of the connection between the signal probe and the first bracket 21.

[0047] In some embodiments of this utility model, the second bracket 22 has a contact hole 221 coaxially arranged with the mounting hole 213. The contact hole 221 is used for inserting a signal probe, and the hole wall of the contact hole 221 is electrically connected to the signal probe.

[0048] It is understood that the second bracket 22 can be a plate structure with a certain thickness. The second bracket 22 forms contact holes 221 parallel to the base 10. The signal probe can be inserted into the mounting hole 213 and the contact hole 221 in sequence. The contact point at the front end of the signal probe contacts the hole wall of the contact hole 221 to achieve electrical connection, thereby realizing the electrical connection between the signal probe and the second test lead 12. The second bracket 22 and the first bracket 21 fix the signal probe at the same time, reducing the disadvantage of needing to manually operate the signal probe during testing.

[0049] In some embodiments of this utility model, the first test line 11 and the second test line 12 are in a straight line structure, and the first test line 11 and the second test line 12 are arranged in parallel.

[0050] It is understandable that the first test line 11 and the second test line 12 can be straight lines and set in parallel, which makes installation more convenient and the cost lower. In addition, with the multiple placement positions between the first test line 11 and the second test line 12, multiple circuit boards 30 under test can be tested simultaneously, improving the testing efficiency.

[0051] In some embodiments of this utility model, the base 10 is provided with a plurality of placement positions for placing the circuit board 30 to be tested. The plurality of placement positions are arranged between the first test line 11 and the second test line 12 and are spaced apart along the extension direction of the first test line 11.

[0052] It is understandable that multiple placement positions can be set between the first test line 11 and the second test line 12. The placement positions can be positions with grooves or positions with fixing structures, such as positions with clips, so that the connection of the circuit board under test 30 after being placed in the placement position is more reliable. By setting multiple placement positions, the oscilloscope probe test fixture can test multiple circuit boards under test 30 at the same time, thereby improving the efficiency of the test.

[0053] In some embodiments of this utility model, the outer surface of the base 10 is partially recessed to form a first groove 101 and a second groove 102. A portion of the first test line 11 is embedded in the first groove 101 and extends along the first groove 101. A portion of the second test line 12 is embedded in the second groove 102 and extends along the second groove 102.

[0054] It is understood that the outer surface of the base 10 can be machined to form a first groove 101 and a second groove 102. The first groove 101 is used to embed and install the first test line 11, and the second groove 102 is used to embed and install the second test line 12. The first groove 101 and the second groove 102 can also be filled with colloid to make the connection between the first test line 11 and the second test line 12 and the base 10 more reliable.

[0055] In some embodiments of this utility model, the oscilloscope probe test fixture further includes a third test lead 13 and a fourth test lead 14. One end of the third test lead 13 is electrically connected to the first test lead 11, and the other end of the third test lead 13 is used for electrical connection to the ground wire of other circuit boards under test. The third test lead 13 can be bent or moved relative to the base 10. One end of the fourth test lead 14 is electrically connected to the second test lead 12, and the other end of the fourth test lead 14 is used for electrical connection to the ground wire of other circuit boards under test. The fourth test lead 14 can be bent or moved relative to the base.

[0056] It is understandable that by setting up movable third test leads 13 and fourth test leads 14, the adaptability of the oscilloscope probe test fixture is improved. When the circuit board under test 30 is inconvenient or its size is not suitable for placement on the base 10, it can be electrically connected to the circuit board under test 30 through the third test leads 13 and fourth test leads 14. The third test leads 13 and fourth test leads 14 can be bent or moved to adjust the spacing between them to accommodate circuit boards under test 30 of different specifications, thereby improving the adaptability of the oscilloscope probe test fixture.

[0057] In some embodiments of this utility model, the first test line 11 and the second test line 12 are both printed conductors.

[0058] It is understood that two parallel printed wires can be provided on the surface of the base 10, and the circuit board under test 30 can be placed between the two printed wires and electrically connected to the positive terminal and ground wire of the circuit board under test 30, such as the positive terminal and ground wire of the filter circuit, so as to realize the electrical connection between the oscilloscope probes fixed to the fixing component 20 and the circuit board under test 30.

[0059] In some embodiments of this utility model, the base 10 has a flat plate structure.

[0060] It is understandable that the base 10 can be a flat plate structure, such as a flat plate structure made of insulating material, to facilitate placement and setup of the first test line 11, the second test line 12, and the fixing component 20.

[0061] The above description is merely a preferred embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this utility model should be included within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A fixture for fixing test leads of an oscilloscope, characterized in that, include: The base is used to place the circuit board under test; The first test lead is disposed on the base and is used to electrically connect to the ground wire of the circuit board under test; The second test lead is disposed on the base and is used to electrically connect to the positive terminal of the circuit board under test; A fixing component is disposed on the base. The fixing component includes a first bracket and a second bracket disposed at intervals. The first bracket is electrically connected to the first test lead, and the second bracket is electrically connected to the second test lead. The first bracket is used to fix the ground probe of the oscilloscope and is electrically connected to the ground probe. The second bracket is used to fix the signal probe of the oscilloscope and is electrically connected to the signal probe.

2. The oscilloscope probe testing fixture according to claim 1, characterized in that, The first bracket has mounting holes for inserting the signal probe.

3. The oscilloscope probe testing fixture according to claim 2, characterized in that, The first bracket includes a first support portion and a clamping portion. The first support portion is electrically connected to the first test line and is used to clamp the grounding probe. The clamping portion is connected to the first support portion in an openable and closable manner. A portion of the outer surface of the clamping portion facing the first support portion is recessed to form a portion of the mounting hole, and another portion of the outer surface of the first support portion facing the clamping portion is recessed to form another portion of the mounting hole.

4. The oscilloscope probe testing fixture according to claim 3, characterized in that, Along the radial direction of the mounting hole, one end of the clamping part is rotatably connected to the first support part, and the other end of the clamping part can be connected to or separated from the first support part by the rotation of the clamping part.

5. The oscilloscope probe testing fixture according to claim 4, characterized in that, The second bracket has a contact hole coaxially arranged with the mounting hole, the contact hole being used for insertion of the signal probe, and the wall of the contact hole being electrically connected to the signal probe.

6. The oscilloscope probe testing fixture according to claim 1, characterized in that, The first test line and the second test line are in a straight line structure, and the first test line and the second test line are arranged parallel to each other.

7. The oscilloscope probe testing fixture according to claim 6, characterized in that, The base is provided with multiple placement positions for placing the circuit board under test. The multiple placement positions are arranged between the first test line and the second test line and are spaced apart along the extension direction of the first test line.

8. The oscilloscope probe testing fixture according to claim 7, characterized in that, The outer surface of the base is partially recessed to form a first groove and a second groove. A portion of the first test line is embedded in the first groove and extends along the first groove. A portion of the second test line is embedded in the second groove and extends along the second groove.

9. The oscilloscope probe testing fixture according to any one of claims 1 to 8, characterized in that, The oscilloscope probe test fixture also includes a third test lead and a fourth test lead. One end of the third test lead is electrically connected to the first test lead, and the other end of the third test lead is used for electrical connection to the ground of other circuit boards under test. The third test lead can be bent or moved relative to the base. One end of the fourth test lead is electrically connected to the second test lead, and the other end of the fourth test lead is used for electrical connection to the ground of other circuit boards under test. The fourth test lead can be bent or moved relative to the base.

10. The oscilloscope probe testing fixture according to any one of claims 1 to 8, characterized in that, The base has a flat plate structure.

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