Testing device of solar cell

By designing a moving mechanism for the support components and probe array, efficient double-sided testing of solar cells was achieved, solving the problem that existing devices could only test one side, thus improving testing efficiency and ease of operation.

CN223639238UActive Publication Date: 2025-12-05DELAIKE (LANGFANG) TECH CO LTD
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Patent Information

Application Number
CN202422881977.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-11-25
Publication Date
2025-12-05
Estimated Expiration
2034-11-25

AI Technical Summary

Technical Problem

Existing solar cell testing equipment can only perform single-sided testing and cannot test both sides of the solar cell simultaneously, resulting in longer testing time and more complicated operation.

Method used

A solar cell testing device was designed, including two support members and two probe rows. The second probe row can be moved relative to the first probe row by a driving mechanism, so that both sides of the solar cell can be tested at the same time, avoiding the need for flipping.

Benefits of technology

This technology enables efficient testing of both sides of solar cells, shortens testing time, improves operational efficiency, and meets the testing requirements of various laboratory indicators.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of testing devices for solar cells, and provides a testing device for solar cells, which comprises two supporting pieces and a testing device, the first probe row is located between the two supporting pieces and connected with the supporting pieces, and the first probe row is provided with a plurality of first probes used for being aligned with grid lines on one face of the solar cell piece; and the second probe row is located above the first probe row and connected with the supporting piece, the second probe row can move relative to the first probe row, and the second probe row is provided with a plurality of second probes used for being aligned with the grid lines on the other face of the solar cell piece. According to the technical scheme, the two faces of the solar cell can be tested at the same time, the test result can be obtained without turning over the solar cell, and therefore the double-face test time is shortened, and the operation efficiency is improved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing device of solar cell, in particular to a testing device of solar cell. BACKGROUND

[0002] As some small solar cell, single-sided solar cell test has reached a good effect, in order to better evaluate the test solar cell, sometimes need to test the two sides of the solar cell. At present, most of the testing device can be single-sided test, if double-sided test, need to turn over a solar cell test, thereby prolonging the test time and operation process. CONTENT

[0003] The technical problem to be solved by the present application is to provide a testing device of solar cell, which can test the two sides of the solar cell at the same time, without turning over the solar cell to get the test result, thereby shortening the time of double-sided test and improving the operation efficiency.

[0004] To solve the above technical problems, the present application adopts the following technical solutions:

[0005] The present application provides a testing device of solar cell, comprising: two support members; a first probe array located between the two support members and connected with the support members, the first probe array is provided with a plurality of first probes for aligning with the grid lines of one side of the solar cell; a second probe array located above the first probe array and connected with the support members, the second probe array can move relative to the first probe array, the second probe array is provided with a plurality of second probes for aligning with the grid lines of the other side of the solar cell.

[0006] As an embodiment, the support member is provided with a first sliding groove, and the two ends of the second probe array are respectively provided with a first sliding block, the first sliding block can slide along the first sliding groove.

[0007] As an embodiment, the testing device further comprises a driving mechanism connected with the first sliding block, which can drive the second probe array to slide along the first sliding groove.

[0008] As an implementation form, the driving mechanism comprises a driving part, a plurality of first connecting members and a plurality of first connecting rods, two sides of the driving part are respectively provided with first rotation points, the driving part can rotate relative to the support part with the first rotation points as the rotation axes; the plurality of first connecting members and the plurality of first connecting rods are respectively located at two ends of the second probe row, the first connecting members are connected with the first sliders, two sides of the driving part are further respectively provided with second rotation points, one end of the first connecting rods is respectively rotationally connected with the second rotation points, and the other end is rotationally connected with the first connecting members, the second rotation points are located between the first rotation points and driving ends of the driving part.

[0009] As an implementation form, the support part is provided with a first through region extending in the height direction; the first connecting members protrude from the first through region and are rotationally connected with the first connecting rods.

[0010] As an implementation form, the driving part comprises two first connecting arms and a second connecting arm, two ends of the second connecting arm are respectively connected with the two first connecting arms, the two first connecting arms are respectively located at two ends of the second probe row, the first connecting arms are provided with the first rotation points and the second rotation points, and at least one first connecting arm is further provided with a positioning pin; the support part on the same side of the positioning pin is further provided with a fixing block, and the positioning pin can be inserted into different positions of the fixing block.

[0011] As an implementation form, the first probe row can move relative to the support part, the support part is further provided with a second through region extending in the height direction, the driving mechanism further comprises a plurality of second connecting members and a plurality of second connecting rods, and two sides of the driving part are respectively provided with third rotation points; the plurality of second connecting members and the plurality of second connecting rods are respectively located at two ends of the second probe row, the second connecting members are connected with the second probe row, one end of the second connecting rods is respectively rotationally connected with the third rotation points, and the other end is rotationally connected with the second connecting members, and the third rotation points are located at opposite ends of the first rotation points.

[0012] As an implementation form, the first probe row comprises a support plate, two ends of the support plate are respectively connected with the support part, two sliding grooves are provided along the width direction of the support plate, the first probe row further comprises a plurality of sliding blocks and a plurality of groups of support blocks, the sliding blocks are connected with the support blocks, the sliding blocks can slide or be fixed in the sliding grooves; the same group comprises two support blocks located in different sliding grooves, two support blocks in the same group are connected with a support arm, and a plurality of holes for the first probes to pass through are provided on the support arm.

[0013] As an implementation form, the extension direction of the support block of the first probe row is opposite to the extension direction of the support block of the second probe row.

[0014] As an implementation form, the first connecting rod and the second connecting rod are in a telescopic structure.

[0015] The technical scheme of the present application has the following beneficial effects:

[0016] The testing device comprises two support members respectively located at two ends of the first probe row and the second probe row, and supporting the first probe row and the second probe row. The first probe row is provided with a plurality of first probes for aligning with the grid lines on one surface of the solar cell. The light intensity and the spectral matching degree of the one surface of the solar cell can be tested by aligning the first probes with the grid lines. The second probe row is located above the first probe row and can move relative to the first probe row. The second probe row is moved upward to leave a space for placing the solar cell. The solar cell is placed on the first probes so that the first probes are aligned with the grid lines. Then, the second probe row is moved downward so that the second probes are also aligned with the grid lines. Thus, the testing device can test two surfaces of the solar cell at the same time, and the testing efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly illustrate the technical scheme of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can also be obtained without creative labor on the basis of these drawings.

[0018] Figure 1 The structural schematic diagram of the testing device for the solar cell provided by the embodiments of the present application is shown in the figure.

[0019] Figure 2 The structural schematic diagram of the testing device for the solar cell provided by the embodiments of the present application is shown in the figure.

[0020] Figure 3 The structural schematic diagram of the testing device for the solar cell provided by the embodiments of the present application is shown in the figure.

[0021] Figure 4 The structural schematic diagram of the testing device for the solar cell provided by the embodiments of the present application is shown in the figure.

[0022] Icon: 1-support; 11-first slide; 12-first slider; 13-second slide; 14-second slider; 15-first through area; 2-first probe row; 21-support plate; 22-sliding groove; 23-sliding block; 24-support block; 25-support arm; 3-driving mechanism; 31-driving part; 311-first connecting arm; 32-first connecting piece; 33-first connecting rod; 34-second connecting piece; 35-second connecting rod; 4-positioning pin; 5-fixed block; 51-insertion hole; 6-connection block; 7-connection plate; 8-second probe row. DETAILED DESCRIPTION

[0023] The technical solutions in the embodiments of the present application will be described below with reference to the accompanying drawings in the embodiments of the present application.

[0024] It should be noted that: similar reference numbers and letters represent similar items in the following drawings, therefore, once an item is defined in one drawing, it does not need to be further defined and explained in subsequent drawings. Meanwhile, in the description of the present application, the terms "first", "second", etc. are only used for distinguishing description, and cannot be understood as indicating or implying relative importance.

[0025] As shown in the drawings, Figure 1 The testing device for solar cell provided by the embodiments of the present application includes two support pieces 1, which are respectively located at two ends of the first probe row 2 and the second probe row 8, and play a supporting role for the first probe row 2 and the second probe row 8. The first probe row 2 is provided with a plurality of first probes for aligning with the grid lines of one surface of the solar cell. By aligning the first probes with the grid lines, the light intensity and the spectral matching degree of one surface of the solar cell can be tested. The second probe row 8 is located above the first probe row 2 and can move relative to the first probe row 2. The second probe row 8 is moved upward to leave a space for placing the solar cell. The solar cell is placed on the first probe, so that the first probe is aligned with the grid lines. Then, the second probe row 8 is moved downward, so that the second probe is also aligned with the grid lines. Thus, the testing device can test two surfaces of the solar cell at the same time, improve the testing efficiency and operation efficiency, and make the testing data of the solar cell meet the designed spectral value, so as to meet the testing function of various indicators in the laboratory.

[0026] Optionally, the testing device further includes a support base, which is connected with the two support pieces 1 respectively, so as to improve the stability of the testing device.

[0027] Optionally, the testing device of the embodiments of the present application has a maximum cell detection size of 230cmx230cm, and is generally suitable for laboratory testing.

[0028] Optionally, the testing device of the embodiment of the present application can also test the single-sided solar cell.

[0029] As shown in Figure 1 , 2 and 4, as an implementation form, the support 1 is provided with a first sliding track 11, and the two ends of the second probe row 8 are respectively provided with a first sliding block 12, and the first sliding block 12 can slide along the first sliding track 11, so that the second probe row 8 can slide up and down relative to the first probe row 2.

[0030] As shown in Figure 2 and 3 , optionally, the same support 1 is provided with two first sliding tracks 11, and each first sliding track 11 is provided with a first sliding block 12, and the two first sliding blocks 12 on the same side are connected through a connecting plate 7, and the two ends of the support plate 21 are respectively connected with the connecting plate 7, so as to realize the connection of the first probe row 2 and the second probe row 8 with the support 1.

[0031] Optionally, the second probe row 8 can be moved by an electric mode, that is, a linear motor can be fixed above the first sliding block 12, and the first sliding block 12 is driven to move relative to the first sliding track 11 through the linear motor; of course, the second probe row 8 can also be driven by a manual mode, that is, by applying force to the connecting plate 7, the second probe row 8 can be moved up and down.

[0032] As shown in Figure 1 , as an implementation form, the testing device further comprises a driving mechanism 3, the driving mechanism 3 is connected with the first sliding block 12 and can drive the second probe row 8 to slide along the first sliding track 11, so as to generate a space between the first probe row 2 and the second probe row 8, and the solar cell is easy to be placed; in addition, when the test is finished, the second probe row 8 is lifted, and the solar cell can also be conveniently taken.

[0033] Optionally, the driving mechanism 3 can include a linear motor and the like, and can drive the first sliding block 12 to move along the first sliding track 11, so as to drive the second probe row 8 to move. Of course, the driving mechanism 3 can also include other connecting structures, and the second probe row 8 can be driven to move by a manual mode.

[0034] As shown in Figure 1As shown, optionally, two second sliding tracks 13 can also be arranged on the same support member 1, and two second sliding blocks 14 are arranged at the two ends of the first probe row 2 respectively, the second sliding blocks 14 can slide along the second sliding tracks 13, so that the first probe row 2 can slide relative to the support member 1, thereby the height can be adjusted, and the solar cell can be conveniently carried to the first probe row 2. However, during actual test, after the height of the first probe row 2 is set, it needs to be fixed. In order to avoid the sliding of the first probe row 2, the second sliding blocks 14 can be fixedly connected with the second sliding tracks 13 through the pins.

[0035] Of course, in some cases, the second sliding tracks 13 can not be arranged, but the length of the first sliding track 11 is extended, so that the first sliding blocks 12 and the second sliding blocks 14 are all arranged on the first sliding track 11, and the second sliding blocks 14 can be fixed at a certain position of the first sliding track 11 through the pins or bolts.

[0036] As shown, Figure 1 As an embodiment, the driving mechanism 3 includes a driving part 31, a plurality of first connecting members 32 and a plurality of first connecting rods 33. The driving part 31 is provided with first rotation points at two sides thereof, and can rotate relative to the support member 1 with the first rotation points as the rotation shafts. The plurality of first connecting members 32 and the plurality of first connecting rods 33 are respectively arranged at the two ends of the second probe row 8. The first connecting members 32 are connected with the first sliding blocks 12. The driving part 31 is further provided with second rotation points at the two sides thereof. One end of the first connecting rods 33 is rotatably connected with the second rotation points, and the other end is rotatably connected with the first connecting members 32. The second rotation points are located between the first rotation points and the driving end of the driving part 31, so that the driving part 31 forms a lever structure. When the second probe row 8 needs to move towards the first probe row 2, the driving end is pressed, the first connecting rods 33 drive the first connecting members 32 to move downwards, and the downward force of the first connecting members 32 drives the two first sliding blocks 12 to slide downwards along the first sliding track 11, so that the second probe row 8 moves towards the first probe row 2, and the first probe and the second probe respectively contact the grid lines to test the solar cell.

[0037] Optionally, the driving end of the driving part 31 is the end operated by the user, and is also the end connected with the first connecting arm 311 and the second connecting arm, that is, the user can press the second connecting arm to drive the whole driving part 31 to move.

[0038] As shown, Figure 1 and 2As shown, optionally, the support piece 1 is fixed with a connecting block 6 on one side, and the first connecting arm 311 is partially arranged through the connecting block 6, and then the connecting block 6 can be fixed on one side of the support piece 1 through the connecting shaft or the like, and the position where the connecting shaft passes through is the position of the first rotation point; similarly, one end of the first connecting rod 33 can also pass through the through part, and the connecting shaft passes through the second rotation point and the first connecting rod 33, so that the driving part 31 can rotate relative to the support piece 1 around the first rotation point, and the first connecting rod 33 and the driving part 31 are also rotationally connected, so as to facilitate pressing or lifting the driving part 31.

[0039] Optionally, the first rotation point and the second rotation point can be configured as a through hole of the first connecting rod 33, and the positions where the connecting shaft or the like passes through are the first rotation point and the second rotation point, so that the first rotation point and the second rotation point of the embodiment of the application can be adjusted, so that the driving part 31 can adjust the positions of the first rotation point and the second rotation point according to the positions of the first probe row 2 and the second probe row 8.

[0040] As shown in Figure 2 and 3 Optionally, the first connecting piece 32 is in a block structure and can be connected with the connecting plate 7, so as to provide a supporting force.

[0041] Optionally, the first connecting rod 33 and the first connecting piece 32 can also be connected through the connecting shaft or the like.

[0042] As shown in Figure 3 Optionally, both ends of the first probe row 2 are connected with the two support pieces 1 through the two connecting plates 7 respectively.

[0043] As shown in Figure 1 As an embodiment, the support piece 1 is provided with a first through region 15 extending in the height direction; the first connecting piece 32 protrudes from the first through region 15 and is rotationally connected with the first connecting rod 33, which can facilitate the connection between the first connecting rod 33 and the first connecting piece 32; in addition, the first through region 15 also provides a moving space for the first connecting piece 32, and the driving force of the first connecting rod 33 can also be transmitted to the second probe row 8 through the first connecting piece 32.

[0044] As shown in Figure 2As shown, as an embodiment, the driving part 31 comprises two first connecting arms 311 and a second connecting arm, two ends of the second connecting arm are connected with the two first connecting arms 311 respectively, that is, the driving part 31 is in a non-closed frame structure, which is convenient for the user to operate; the two first connecting arms 311 are respectively located at two ends of the second probe row 8, the first connecting arm 311 is provided with a first rotation point and a second rotation point, and at least one first connecting arm 311 is further provided with a positioning pin 4; the support 1 on the same side of the positioning pin 4 is further provided with a fixed block 5, and the positioning pin 4 can be inserted into different positions of the fixed block 5. Since the embodiment of the present application is driven to move up and down by manual operation, the positioning pin 4 is inserted into the fixed block 5 when the second probe row 8 moves to the set position, so as to avoid the movement of the second probe row 8.

[0045] Optionally, the fixed block 5 is provided with two different positions for the positioning pin 4 to be inserted, that is, the highest position and the lowest position that the second probe row 8 can move to.

[0046] As shown in Figure 2 Optionally, the fixed block 5 is in an arc structure and is fixed on one side of the support 1, the fixed block 5 is respectively provided with an insertion hole 51 at two extreme positions, the positioning pin 4 can be respectively inserted into different insertion holes 51, and the insertion holes 51 at the two extreme positions are respectively the highest position that the second probe row 8 can be lifted to and the lowest position that the second probe row 8 can move to the first probe row 2, that is, when the second probe row 8 is lifted again, the positioning pin 4 can be inserted into the insertion hole 51 at the highest position, which is convenient for the solar cell to be put in; when the solar cell needs to be tested, the positioning pin 4 is pulled out of the insertion hole 51, the second connecting arm is pressed to move the second probe row 8 downward, the probe is aligned with and contacts the grid line of the solar cell, and then the positioning pin 4 is inserted into the insertion hole 51 at the lowest position, so as to fix the relative position of the second probe row 8 and prevent the second probe row 8 from continuing to drop and scratching the solar cell.

[0047] Optionally, the fixed block 5 is provided with a plurality of arc grooves, a plurality of bolts pass through the arc grooves and are connected with the support 1, since the first probe row 2 can also move relative to the second probe row 8, when the first probe row 2 moves, the lowest position that the second probe row 8 can drop to will also change, therefore, the position of the fixed block 5 also needs to be adjusted, and the purpose of setting the arc grooves is to facilitate the adjustment of the position of the fixed block 5, that is, the bolts do not need to be completely disassembled, but are slightly loosened, and then the fixed block 5 is moved, and the moving range of the fixed block 5 is the length of the arc groove.

[0048] As shown in Figure 1 and 2As shown, as an embodiment, the first probe row 2 can be moved relative to the support 1, so that the height of the first probe row 2 can be adjusted, facilitating the carrying of the solar cell. The support 1 is also provided with a second through region extending in the height direction, and the driving mechanism 3 further includes a plurality of second connecting pieces 34 and a plurality of second connecting rods 35, and the two sides of the driving part 31 are respectively provided with third rotation points; the plurality of second connecting pieces 34 and the plurality of second connecting rods 35 are respectively located at the two ends of the second probe row 8, the second connecting piece 34 is connected with the second probe row 8, one end of the second connecting rod 35 is rotatably connected with the third rotation point, and the other end is rotatably connected with the second connecting piece 34, and the third rotation point is located at the opposite end of the first rotation point. On the one hand, by supporting one end of the first connecting arm 311 through the second support rod, the structure is smooth when pressing or lifting the driving part 31; on the other hand, since the height of the first probe row 2 can be adjusted, when the height of the first probe row 2 is adjusted, the lowest position to which the second probe row 8 can be lowered also changes, so the position of the fixed block 5 on the support 1 also needs to be adjusted. When the height position of the first probe row 2 changes, the second connecting piece 34 drives the second connecting rod 35 to move, and the second connecting rod 35 drives the first connecting arm 311 to move, and the first connecting arm 311 is rotatably connected with the connecting block 6 and the first connecting rod 33 respectively. Therefore, when the height of the first probe row 2 is adjusted, the second connecting rod 35 drives the first connecting arm 311 to move during the adjustment process, and then the driving part 31 is pressed to determine the lowest position to which the second probe row 8 can be lowered. At this time, the position to which the positioning pin 4 on the driving part 31 is aligned is also the position to which the fixed block 5 needs to be moved, facilitating accurate determination of the moving position of the fixed block 5.

[0049] As shown in Figure 2 and 3 shown, optionally, the second connecting piece 34 is connected with the connecting plate 7, and the connecting plate 7 is connected with the two second sliding blocks 14.

[0050] As shown in Figure 2 shown, optionally, one end of the second connecting rod 35 can also pass through the through portion of the first connecting arm 311, and the connecting shaft passes through the third rotation point and the second connecting rod 35, so as to realize the rotatable connection between the driving part 31 and the second connecting rod 35. The third rotation point can be configured as a through hole of the first connecting rod 33, and the position through which the connecting shaft and the like pass is the third rotation point. Thus, the third rotation point of the embodiment of the present application is adjustable, so that the driving part 31 can adjust the position of the third rotation point according to the positions of the first probe row 2 and the second probe row 8.

[0051] Optionally, the connecting shaft passes through the third rotation point and the second connecting rod 35, so that the second connecting rod 35 and the driving part 31 are also rotationally connected, thereby facilitating pressing or lifting the driving part 31, and the second connecting rod 35 and the second connecting part 34 can also be connected by an axle or the like.

[0052] Optionally, the first connecting part 32 can be provided with a cavity facing downward, into which the first connecting rod 33 is inserted and rotationally connected; similarly, the second connecting part 34 can be provided with a cavity facing upward, into which the second connecting rod 35 is inserted and rotationally connected.

[0053] As shown in Figures 2 to 4 Fig. 1, as an embodiment, the first probe row 2 comprises a support plate 21, both ends of the support plate 21 are connected with the support 1, two sliding grooves 22 are arranged along the width direction of the support plate 21, the first probe row 2 further comprises a plurality of sliding blocks 23 and a plurality of groups of support blocks 24, the sliding blocks 23 are connected with the support blocks 24, the sliding blocks 23 can slide or be fixed in the sliding grooves 22, which facilitates adjusting the number of the support blocks 24 and also facilitates installation and dismounting of the support blocks 24; the same group comprises two support blocks 24 located in different sliding grooves 22, the two support blocks 24 in the same group are connected with a support arm 25, the support arm 25 is provided with a plurality of holes through which the first probes pass, which on the one hand can adjust the distance between the two adjacent support blocks 24 in the same sliding groove 22, and on the other hand also facilitates installation and dismounting of the support blocks 24.

[0054] As shown in Figure 3 Fig. 2, optionally, the sliding blocks 23 are located in the sliding grooves 22, and the support blocks 24 are located above the sliding grooves 22, the height distance of the sliding grooves 22 is greater than the height distance of the sliding blocks 23, so that the sliding blocks 23 can slide, and the bolts can pass through the support blocks 24 and the sliding blocks 23 in turn, and the pressing force between the sliding blocks 23 and the upper wall of the sliding grooves 22 gradually increases in the process of being screwed, thereby playing a fixing role; when the position needs to be adjusted, the bolts can be loosened.

[0055] Optionally, the holes arranged on the support arm 25 are arranged along the vertical direction.

[0056] Optionally, the width direction of the support plate 21 is also perpendicular to the extension direction of the support arm 25.

[0057] Optionally, the first probes and the second probes can be detachably connected with the support arm 25, or can be non-detachably connected.

[0058] Optionally, the two support blocks 24 in the same group are located on the same horizontal line.

[0059] Optionally, two data lines are welded at one end of each support arm 25, and the data detected by the first probe and the second probe can be transmitted to the display through the data lines.

[0060] As shown in the drawings, as an embodiment, the extension direction of the support block 24 of the first probe row 2 is opposite to the extension direction of the support block 24 of the second probe row 8, so that the distance between the first probe and the second probe on the first probe row 2 and the second probe row 8 can be shortened, and the solar cell can be tested conveniently. Figure 3

[0061] Optionally, the support block 24 of the first probe row 2 extends upward, and the support block 24 of the second probe row 8 extends downward.

[0062] Optionally, the structure of the first probe row 2 is the same as that of the second probe row 8, except that the installation direction of the support block 24 is different, so that the processing and production are facilitated, and the solar cell can be tested conveniently.

[0063] As an embodiment, the first connecting rod 33 and the second connecting rod 35 are telescopic structures, so that when the driving part 31 is pressed or lifted, the whole driving mechanism 3 can be operated conveniently, and the first connecting piece 32 can also move along a straight line; in addition, when the second probe row 8 is pressed or lifted, the telescopic function of the second connecting rod 35 can also make the driving part 31 rotate conveniently, so that the driving part 31 can be pressed or lifted conveniently.

[0064] The above only describes the embodiments of the present application and is not used to limit the protection scope of the present application. For those skilled in the art, the present application can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. within the technical scope and principles disclosed in the present application should be included in the protection scope of the present application.

[0065] The above only describes the embodiments of the present application and is not used to limit the protection scope of the present application. For those skilled in the art, the present application can have various changes and modifications. Any modification, equivalent replacement, improvement, etc. within the technical scope and principles disclosed in the present application should be included in the protection scope of the present application.

[0066] ​It is to be noted that, as used in this specification and the appended claims, the singular forms "a," "an," and "the" include plural referents unless the context clearly dictates otherwise. Thus, for example, reference to "a component" can include a combination of two or more components. Additionally, the terms "comprise," "comprises," and "comprising," or any variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements is not necessarily limited to those elements, but can include other elements not expressly listed or inherent to such process, method, article, or apparatus. Furthermore, unless otherwise indicated herein, the terms "first," "second," "third," etc., are used herein merely as labels, and are not intended to impose ordinal import.

Claims

1. A testing device for solar cell pieces, characterized by, The utility model relates to a test device for solar cell, comprising: two supports; a first probe row between the two supports and connected with the supports, the first probe row is provided with a plurality of first probes for aligning with the grid lines on one side of the solar cell; a second probe row above the first probe row and connected with the supports, the second probe row is movable relative to the first probe row, the second probe row is provided with a plurality of second probes for aligning with the grid lines on the other side of the solar cell.

2. The solar cell testing apparatus according to claim 1, wherein The supports are provided with a first slide, and the two ends of the second probe row are respectively provided with a first sliding block, the first sliding block is slidable along the first slide.

3. The solar cell testing apparatus according to claim 2, wherein The test device further comprises a driving mechanism connected with the first sliding block and capable of driving the second probe row to slide along the first slide.

4. The solar cell testing apparatus according to claim 3, wherein The driving mechanism comprises a driving part, a plurality of first connecting members and a plurality of first connecting rods, the driving part is provided with a first rotation point on each side, and the driving part is rotatable relative to the supports with the first rotation point as the axis; the plurality of first connecting members and the plurality of first connecting rods are respectively located at the two ends of the second probe row, the first connecting members are connected with the first sliding blocks, the driving part is further provided with a second rotation point on each side, one end of the first connecting rods is rotatably connected with the second rotation points, and the other end is rotatably connected with the first connecting members, and the second rotation points are located between the first rotation points and the driving ends of the driving part.

5. The solar cell testing apparatus according to claim 4, wherein The supports are provided with a first through region extending in the height direction; The first connecting members protrude from the first through region and are rotatably connected with the first connecting rods.

6. The solar cell testing apparatus according to claim 4 or 5, wherein The driving part comprises two first connecting arms and a second connecting arm, the two ends of the second connecting arm are connected with the two first connecting arms, the two first connecting arms are respectively located at the two ends of the second probe row, the first connecting arms are provided with the first rotation points and the second rotation points, and at least one first connecting arm is further provided with a positioning pin; The supports on the same side of the positioning pin are further provided with a fixed block, and the positioning pin can be inserted into different positions of the fixed block.

7. The solar cell testing apparatus according to claim 4 or 5, wherein The first probe row is movable relative to the supports, and the supports are further provided with a second through region extending in the height direction, The driving mechanism further comprises a plurality of second connecting members and a plurality of second connecting rods, and the driving part is provided with a third rotation point on each side; the plurality of second connecting members and the plurality of second connecting rods are respectively located at the two ends of the second probe row, the second connecting members are connected with the second probe row, one end of the second connecting rods is rotatably connected with the third rotation points, and the other end is rotatably connected with the second connecting members, and the third rotation points are located at the opposite ends of the first rotation points.

8. The apparatus for testing solar cells according to any one of claims 1 to 5, wherein The first probe row comprises a support plate, two ends of the support plate are connected with the support members respectively, two sliding grooves are arranged along the width direction of the support plate, the first probe row further comprises a plurality of sliding blocks and a plurality of groups of support blocks, the sliding blocks are connected with the support blocks, and the sliding blocks can slide or be fixed in the sliding grooves; each group comprises two support blocks located in different sliding grooves, two support blocks in the same group are connected with a support arm, and a plurality of holes for the first probes to pass through are arranged on the support arm.

9. The solar cell testing apparatus according to claim 8, wherein The extension direction of the support blocks of the first probe row is opposite to the extension direction of the support blocks of the second probe row.

10. The solar cell testing apparatus according to claim 7, wherein The first connecting rod and the second connecting rod are in a telescopic structure.