MCU test fixture

Abstract

The utility model belongs to the technical field of test jigs, and particularly relates to an MCU test jig which comprises a base, an operation display panel is assembled at the front end of the base, a supporting frame is installed at the top end of the base, a measuring mechanism is installed at the front end of the supporting frame, and a guide column is installed between the supporting frame and the measuring mechanism. The top end of the base is provided with a working table, the surface of the top of the working table is provided with a placing groove, a measuring piece is placed in the placing groove, the top end of the base is provided with a sleeve, and the top end of the sleeve is connected with a connecting column. It is ensured that the measuring mechanism has enough time to retract, collision risks are reduced, and measuring pieces are protected. Meanwhile, the vacuum adsorption plate is tightly matched with the rotary lifting air cylinder, the measuring piece is stably jacked up, the material taking efficiency is improved, the position of the measuring piece is adjusted through the rotation function, and inconvenience and the error rate caused by wrong placement are reduced.

Description

Technical Field

[0001] This utility model belongs to the field of test fixture technology, specifically relating to an MCU test fixture. Background Technology

[0002] An MCU test fixture is a tool or device specifically used to test the performance and quality of MCU (microcontroller) chips. The "MCU test fixture" disclosed in application number "CN202020241835.7" is also an increasingly mature technology. In this MCU test fixture, the entire product moves slightly downward with pressure due to the setting of a first spring. The first spring protects the pressing force of the pressing device from causing damage to the product and keeps the entire work process highly efficient. Due to the upward elasticity of the spring, the product can also be fully in the measurement, ensuring that the measurement work is carried out normally and protecting the product from damage.

[0003] However, within the range where the spring provides upward force, the worktable remains in contact with the measuring mechanism. But when the measuring mechanism retracts, the strong upward force of the spring abruptly pushes the worktable upwards. This rapid movement can easily cause a violent collision between the measuring component on the worktable and the measuring mechanism, greatly increasing the risk of damage to the measuring component. Utility Model Content

[0004] The purpose of this invention is to provide an MCU testing fixture that addresses the problem in the prior art where, within the range where the spring provides upward force, the worktable remains in contact with the measuring mechanism. However, when the measuring mechanism retracts, the strong upward force of the spring abruptly pushes the worktable upward, a rapid movement that can easily cause a violent collision between the measuring component on the worktable and the measuring mechanism, thus greatly increasing the risk of damage to the measuring component.

[0005] To achieve the above objectives, this utility model provides the following technical solution: an MCU test fixture, including a base, an operation display panel mounted on the front end of the base, a support frame mounted on the top end of the base, a measuring mechanism mounted on the front end of the support frame, a guide column mounted between the support frame and the measuring mechanism, a worktable provided on the top end of the base, a placement groove formed on the top surface of the worktable, a measuring component placed inside the placement groove, a sleeve mounted on the top end of the base, and a connecting column connected to the top end of the sleeve.

[0006] As a preferred embodiment of the MCU test fixture of this utility model, the top end of the connecting column is connected to the bottom end of the workbench, and a limiting groove is formed on the outer side wall of the connecting column.

[0007] As a preferred embodiment of the MCU test fixture of this utility model, a first spring is longitudinally mounted inside the sleeve. The bottom end of the first spring is connected to the bottom end of the inner cavity of the sleeve, and the top end of the first spring is connected to the bottom end of the connecting post. The connecting post and the sleeve form an elastic telescopic connection through the first spring.

[0008] As a preferred embodiment of the MCU test fixture of this utility model, the sleeve is also equipped with a second spring in a transverse direction, and one end of the second spring is connected to a limit block.

[0009] As a preferred embodiment of the MCU testing fixture of this utility model, the cross-section of the limiting block is T-shaped, and the end of the limiting block is arc-shaped and adapted to the limiting groove.

[0010] As a preferred embodiment of the MCU testing fixture of this utility model, the limiting block is elastically telescopically connected to the sleeve through a second spring.

[0011] As a preferred embodiment of the MCU test fixture of this utility model, a rotary lifting cylinder is installed at the bottom of the workbench, and a vacuum adsorption plate is connected to the telescopic end of the rotary lifting cylinder. The vacuum adsorption plate is located in the opening at the bottom of the placement groove, and the top of the vacuum adsorption plate is on the same straight line as the top of the placement groove.

[0012] Compared with the prior art, the beneficial effects of this utility model are:

[0013] This invention effectively slows down the rebound speed of the connecting column under the action of the first spring through the synergistic effect of the second spring and the limiting block, providing sufficient time for the timely retraction of the measuring mechanism. It also significantly reduces the risk of collision between the worktable and the measuring mechanism when the worktable rises via the connecting column, preventing damage to the measuring components inside the worktable. Subsequently, the close cooperation between the vacuum adsorption plate and the rotary lifting cylinder not only successfully and smoothly lifts the measuring component from the placement slot, greatly facilitating its rapid removal and improving material handling efficiency, but also allows for easy adjustment of the measuring component's left and right position through its rotation function. This significantly reduces inconvenience and error rates caused by incorrect placement during the measurement process. Attached Figure Description

[0014] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0015] Figure 1 This is a schematic diagram of the main structure of this utility model;

[0016] Figure 2 This is a top view of the main structure of this utility model;

[0017] Figure 3 This is a schematic diagram of the cross-sectional structure of the sleeve and connecting column of this utility model;

[0018] Figure 4 This is a schematic diagram of the cross-sectional structure of the workbench of this utility model.

[0019] In the diagram: 1. Base; 2. Operation display panel; 3. Support frame; 4. Measuring mechanism; 5. Guide column; 6. Worktable; 7. Measuring piece; 8. Sleeve; 9. Connecting column; 10. First spring; 11. Limiting groove; 12. Second spring; 13. Limiting block; 14. Placement groove; 15. Vacuum adsorption plate; 16. Rotary lifting cylinder. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Example 1

[0022] Please see Figure 1-4 The present invention provides the following technical solution: an MCU test fixture, including a base 1, an operation display panel 2 assembled at the front end of the base 1, a support frame 3 installed at the top end of the base 1, a measuring mechanism 4 installed at the front end of the support frame 3, a guide column 5 installed between the support frame 3 and the measuring mechanism 4, a worktable 6 provided at the top end of the base 1, a placement groove 14 opened on the top surface of the worktable 6, a measuring component 7 placed inside the placement groove 14, a sleeve 8 installed at the top end of the base 1, and a connecting column 9 connected to the top end of the sleeve 8.

[0023] In a preferred embodiment: the top end of the connecting column 9 is connected to the bottom end of the worktable 6, and a limiting groove 11 is formed on the outer side wall of the connecting column 9.

[0024] In a preferred embodiment: a first spring 10 is longitudinally mounted inside the sleeve 8. The bottom end of the first spring 10 is connected to the bottom end of the inner cavity of the sleeve 8, and the top end of the first spring 10 is connected to the bottom end of the connecting post 9. The connecting post 9 and the sleeve 8 are elastically telescopically connected through the first spring 10.

[0025] In a preferred embodiment: the sleeve 8 is also equipped with a second spring 12 in a transverse direction, and one end of the second spring 12 is connected to a limit block 13.

[0026] In a preferred embodiment, the limiting block 13 has a T-shaped cross-section, and the end of the limiting block 13 is arc-shaped and adapted to the limiting groove 11.

[0027] In a preferred embodiment, the limiting block 13 is elastically telescopically connected to the sleeve 8 via the second spring 12.

[0028] In this embodiment, the synergistic effect of the second spring 12 and the limiting block 13 effectively slows down the rebound speed of the connecting column 9 under the action of the first spring 10, providing sufficient time for the measuring mechanism 4 to retract in time. It also significantly reduces the risk of the worktable 6 colliding with the measuring mechanism 4 when it rises via the connecting column 9, thus avoiding damage to the measuring component 7 inside the worktable 6.

[0029] Specifically, during the operation of the MCU test fixture, the measuring piece 7 must first be properly placed in the placement slot 14 on top of the worktable 6. Then, the operator activates the measuring mechanism 4 to lower it. If the lowering force of the measuring mechanism 4 is too great, it will moderately compress the worktable 6, causing the connecting column 9 to descend within the sleeve 8 and compress the first spring 10, thus contracting. This mechanism effectively buffers the excessive lowering force and prevents potential damage to the measuring piece 7. As the connecting column 9 descends, the position of the limiting slot 11 changes, allowing the limiting block 13, originally placed within it, to move out smoothly, ensuring that the limiting block 13 does not obstruct the descent of the connecting column 9. After the measurement is completed, the operator manipulates the measuring mechanism 4 to rise and retract. At the moment of retraction, the first spring 10 rebounds due to the release of compression, causing the connecting column 9 to rise. During this rising process, the limiting slot 11 continuously contacts and separates from the limiting block 13, generating a certain amount of resistance. This design cleverly avoids the risk of accidental collision between the worktable 6 and the measuring mechanism 4.

[0030] Example 2

[0031] Please see Figure 1-4 A rotary lifting cylinder 16 is installed at the bottom of the workbench 6. The telescopic end of the rotary lifting cylinder 16 is connected to a vacuum adsorption plate 15. The vacuum adsorption plate 15 is located in the opening at the bottom of the placement groove 14, and the top of the vacuum adsorption plate 15 is on the same straight line as the top of the placement groove 14.

[0032] In this embodiment, as described in Embodiment 1, after the measuring piece 7 is securely placed in the placement slot 14 at the top of the worktable 6, the vacuum adsorption plate 15 immediately and firmly fixes it in the slot, effectively preventing the measuring piece 7 from being dislodged from the placement slot 14 due to vibration when the worktable 6 rises. This vibration could originally have originated from the continuous contact and separation between the limiting slot 11 and the limiting block 13, but this is effectively controlled in this design. Next, after the measuring worktable 6 completes its rebound, the telescopic end of the XYZ-123 rotary lifting cylinder 16 extends, smoothly pushing the measuring piece 7 out of the placement slot 14. At this point, the measuring worktable 6 releases its adsorption of the measuring piece 7. This process greatly facilitates the rapid removal of the measuring piece 7 and significantly improves material handling efficiency. Furthermore, the XYZ-123 rotary lifting cylinder 16 also has a rotation function, which can easily adjust the left and right position of the measuring piece 7, thereby effectively reducing the inconvenience and error rate caused by incorrect placement during the measurement process.

[0033] In summary, as described in Embodiments 1 and 2, this utility model utilizes the second spring 12 and the limiting block 13 in synergy to slow down the rebound speed of the connecting column 9, ensuring that the measuring mechanism 4 has sufficient time to retract, reducing the risk of collision and protecting the measuring component 7. Simultaneously, the vacuum adsorption plate 15 and the rotary lifting cylinder 16 work closely together to smoothly lift the measuring component 7, improving material handling efficiency. Furthermore, the rotation function adjusts the position of the measuring component 7, reducing inconvenience and error rates caused by incorrect placement.

[0034] It should be noted that the test fixture is a mature existing technology. The model of the test fixture is MCU-TEST-001. The MCU-TEST-001 model test fixture is used for MCUs, and MCUs are microcontroller units in existing technology, which is the measuring component 7 mentioned in the text.

[0035] Finally, it should be noted that the above description is merely a preferred embodiment of this utility model and is not intended to limit the utility model. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this utility model should be included within the protection scope of this utility model.

Claims

1. An MCU test fixture, comprising a base (1), characterized in that: The base (1) is equipped with an operation display panel (2) at the front end, a support frame (3) is installed at the top of the base (1), a measuring mechanism (4) is installed at the front end of the support frame (3), and a guide column (5) is installed between the support frame (3) and the measuring mechanism (4). The top of the base (1) is provided with a workbench (6), and the top surface of the workbench (6) is provided with a placement groove (14). A measuring piece (7) is placed inside the placement groove (14). A sleeve (8) is installed on the top of the base (1), and a connecting column (9) is connected to the top of the sleeve (8).

2. The MCU test fixture according to claim 1, characterized in that: The top end of the connecting column (9) is connected to the bottom end of the workbench (6), and a limiting groove (11) is provided on the outer side wall of the connecting column (9).

3. The MCU test fixture according to claim 1, characterized in that: The sleeve (8) is longitudinally fitted with a first spring (10). The bottom end of the first spring (10) is connected to the bottom end of the inner cavity of the sleeve (8). The top end of the first spring (10) is connected to the bottom end of the connecting post (9). The connecting post (9) and the sleeve (8) are connected by the first spring (10) to form an elastic telescopic connection.

4. The MCU test fixture according to claim 1, characterized in that: The sleeve (8) is also equipped with a second spring (12) in a transverse direction inside, and one end of the second spring (12) is connected to a limit block (13).

5. The MCU test fixture according to claim 4, characterized in that: The limiting block (13) has a T-shaped cross section, and the end of the limiting block (13) is arc-shaped and adapted to the limiting groove (11).

6. The MCU test fixture according to claim 4, characterized in that: The limiting block (13) is elastically telescopically connected to the sleeve (8) through the second spring (12).

7. The MCU test fixture according to claim 1, characterized in that: A rotary lifting cylinder (16) is installed at the bottom of the workbench (6). The telescopic end of the rotary lifting cylinder (16) is connected to a vacuum adsorption plate (15). The vacuum adsorption plate (15) is located in the opening at the bottom of the placement groove (14), and the top of the vacuum adsorption plate (15) is on the same straight line as the top of the placement groove (14).

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