Shielding film bending performance testing device

Abstract

The utility model relates to the technical field of bending performance testing, in particular to a shielding film bending performance testing device. The shielding film bending performance testing device specifically comprises a signal receiving mechanism, a shielding film, a vector network instrument and a bending mechanism, the shielding film is attached to the surface of the flexible board, the signal receiving mechanism is attached to the surface, away from the flexible board, of the shielding film, the vector network instrument is connected with the signal receiving mechanism, the bending mechanism is used for bending the flexible board and the shielding film, the signal receiving mechanism is used for receiving signals generated when the shielding film is bent, damaged and leaked, and the vector network instrument displays changes of S parameters after receiving the signals. The device has the advantage of accurately judging the shielding effectiveness of the shielding film material.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of bending performance test, especially relates to a shielding film bending performance testing device. BACKGROUND

[0002] At present, in order to avoid mutual interference between electromagnetic waves, a layer of shielding film is usually attached on the soft board type product to achieve shielding effect during the use of most electronic products, and the product is influenced by bending during use, so that the bending performance of the shielding film material has certain requirements, and the material test of the shielding film is still considered by the resistivity change of shielding at present, since the shielding film itself is a metal layer structure and is mostly discontinuous structure, if the crack of metal layer appears during bending, the overall resistance change of shielding film is not obvious due to the existence of conductive adhesive, unless the overall fracture appears during the bending process of shielding film, but at this time, the bending number of the bending performance of the material and the actual product failure is quite different, and is not accurate, so the bending property of the material cannot be determined in time and accurately.

[0003] Therefore, the shielding film bending performance testing device is provided to overcome the defects of the prior art. UTILITY MODEL CONTENT

[0004] In order to overcome the defects of the prior art, the utility model provides a shielding film bending performance testing device, which aims to solve the problem of being unable to determine the shielding performance of the material in time and accurately.

[0005] In order to achieve the above purpose, the utility model adopts the following technical scheme:

[0006] A shielding film bending performance testing device, comprising: a signal receiving mechanism, a shielding film, a vector network analyzer and a bending mechanism.

[0007] The shielding film is attached to the surface of the soft board, the signal receiving mechanism is attached to the surface of the shielding film away from the soft board, the vector network analyzer is connected with the signal receiving mechanism, the bending mechanism is used for bending the soft board and the shielding film, the signal receiving mechanism is used for receiving the signal leaked by the shielding film damaged by bending, and the vector network analyzer displays the change of S parameter after receiving the signal.

[0008] As a further improvement of the technical scheme of the utility model, the signal receiving mechanism comprises a signal line, a first solder pad, a second solder pad and a dielectric layer, the signal line is connected with the first solder pad and the second solder pad, the signal line, the first solder pad and the second solder pad are all located above the dielectric layer, the first solder pad and the second solder pad are respectively located at both ends of the dielectric layer, and the dielectric layer is attached to the surface of the shielding film.

[0009] As a further improvement of the technical scheme of the utility model, the signal receiving mechanism further comprises an upper grounding layer and a lower grounding layer, the first solder pad and the second solder pad are fixedly connected with the upper grounding layer, and the upper grounding layer and the lower grounding layer are arranged above the dielectric layer.

[0010] As a further improvement of the technical scheme of the utility model, the dielectric layer is provided with a plurality of through holes at two ends, and the through holes are connected with the upper grounding layer and the lower grounding layer.

[0011] As a further improvement of the technical scheme of the utility model, the lower grounding layer is arranged between the dielectric layer and the shielding film.

[0012] As a further improvement of the technical scheme of the utility model, the shielding film serves as a reference ground.

[0013] As a further improvement of the technical scheme of the utility model, the S parameter comprises an S12 reverse transmission coefficient, an S21 forward transmission coefficient, an S11 input reflection coefficient and an S22 output reflection coefficient.

[0014] Compared with the prior art, the utility model has the advantages that:

[0015] In the shielding film bending performance testing device, the shielding film is attached to the surface of the soft plate, the signal receiving mechanism is attached to the surface of the shielding film away from the soft plate, the vector network analyzer is connected with the signal receiving mechanism, the bending mechanism is used for bending the soft plate and the shielding film, the signal receiving mechanism is used for receiving the signal leaked due to the damage of the shielding film, and the vector network analyzer displays the change of the S parameter after receiving the signal. The change of the S parameter is used for judgment, when the shielding film is cracked in the bending process of the bending mechanism, signal leakage occurs, the signal receiving mechanism receives the signal leaked due to the damage of the shielding film, at this moment, the change of the S parameter is observed through the vector network analyzer, the integrity of the shielding film is judged, and therefore the stability of the shielding effectiveness of the shielding film is judged. The shielding film bending performance testing device has the characteristics that the shielding effectiveness of the shielding film material can be accurately judged. BRIEF DESCRIPTION OF DRAWINGS

[0016] The utility model will be further explained in detail in combination with the drawings and specific embodiments:

[0017] Fig. 1 is the structure diagram of the shielding film bending performance testing device of the utility model;

[0018] Fig. 2 is the perspective structure diagram of the signal receiving mechanism in the shielding film bending performance testing device of the utility model;

[0019] Fig. 3 is the sectional view of the signal receiving mechanism attached to the shielding film in the shielding film bending performance testing device of the utility model.

[0020] In the drawings:

[0021] 1 signal receiving mechanism;11 signal line;12 first solder pad;13 second solder pad;14 dielectric layer;141 via hole;15 upper ground layer;16 lower ground layer;

[0022] 2 shielding film;3 vector network analyzer;4 flexible board. DETAILED DESCRIPTION

[0023] The concept, specific structure and technical effects of the present application will be described clearly and completely in combination with the embodiments and the drawings, so as to fully understand the purpose, scheme and effects of the present application. It should be noted that the embodiments in the present application and the features in the embodiments can be combined with each other without conflict. The same reference signs used in the drawings indicate the same or similar parts.

[0024] It should be noted that, unless otherwise specified, when a certain feature is referred to as being "fixed" or "connected" to another feature, it can be directly fixed or connected to the other feature, or indirectly fixed or connected to the other feature. In addition, the up, down, left, right and other descriptions used in the present application are only relative to the mutual position relationship of the components of the present application in the drawings.

[0025] Referring to Figs. 1-3 A shielding film 2 bending performance test includes a signal receiving mechanism 1, a shielding film 2, a vector network analyzer 3 and a bending mechanism.

[0026] In one embodiment, the shielding film 2 is attached to the surface of the flexible board 4, the signal receiving mechanism 1 is attached to the surface of the shielding film 2 away from the flexible board 4, the vector network analyzer 3 is connected to the signal receiving mechanism 1, the bending mechanism is used to bend the flexible board 4 and the shielding film 2, the signal receiving mechanism 1 is used to receive the signal leaked by the bending damage of the shielding film 2, and the vector network analyzer 3 displays the change of S parameter after receiving the signal. Preferably, when the change rate of S parameter exceeds 10%, the appearance of the sample can be observed to determine whether the shielding film 2 has cracks.

[0027] The shielding film 2 is attached to the surface of the soft board 4, the signal receiving mechanism 1 is attached to the surface of the shielding film 2 away from the soft board 4, the vector network analyzer 3 is connected with the signal receiving mechanism 1, the bending mechanism is used for bending the soft board 4 and the shielding film 2, the signal receiving mechanism 1 is used for receiving the signal leaked due to the bending damage of the shielding film 2, and the vector network analyzer 3 displays the change of the S parameter after receiving the signal. The S parameter change is used for judgment. When the shielding film 2 is cracked during the bending process of the bending mechanism, signal leakage occurs. The signal receiving mechanism 1 receives the signal leaked due to the bending damage of the shielding film 2. At this time, the change of the S parameter is observed through the vector network analyzer 3 to judge the integrity of the shielding film 2, so as to judge the stability of the shielding effectiveness of the shielding film 2. The shielding film 2 bending performance test has the characteristics of accurately judging the shielding effectiveness of the shielding film 2 material.

[0028] In one embodiment, referring to Fig. 2 As shown in the figure, the signal receiving mechanism 1 includes a signal line 11, a first solder pad 12, a second solder pad 13 and a dielectric layer 14. The signal line 11 is connected with the first solder pad 12 and the second solder pad 13. The signal line 11, the first solder pad 12 and the second solder pad 13 are all located above the dielectric layer 14. The first solder pad 12 and the second solder pad 13 are respectively located at both ends of the dielectric layer 14. The dielectric layer 14 is attached to the surface of the shielding film 2.

[0029] In one embodiment, referring to Fig. 2 As shown in the figure, the signal receiving mechanism 1 further includes an upper ground layer 15 and a lower ground layer 16. The first solder pad 12 and the second solder pad 13 are fixedly connected with the upper ground layer 15. The upper ground layer 15 and the lower ground layer 16 support the dielectric layer 14.

[0030] In one embodiment, a plurality of through holes 141 are arranged at both ends of the dielectric layer 14. The through holes 141 connect the upper ground layer 15 and the lower ground layer 16.

[0031] In one embodiment, the lower ground layer 16 is located between the dielectric layer 14 and the shielding film 2.

[0032] In one embodiment, the shielding film 2 serves as a reference ground.

[0033] In one embodiment, the S parameter includes an S12 reverse transmission coefficient, an S21 forward transmission coefficient, an S11 input reflection coefficient and an S22 output reflection coefficient. The S parameter is a scattering parameter and is an important parameter in microwave transmission. The S12 reverse transmission coefficient is an isolation parameter, the S21 forward transmission coefficient is a gain parameter, the S11 input reflection coefficient is an input return loss, and the S22 output reflection coefficient is an output return loss.

[0034] In one embodiment, referring to Fig. 2As shown, when the signal receiving mechanism 1 is manufactured, a through hole 141 is drilled in the medium layer 14 by mechanical drilling, the diameter of the through hole 141 is 150 um, the through hole 141 is electroplated, the signal line 11, the first solder pad 12, the second solder pad 13 and the medium layer 14 are exposed, developed and etched to form a test pattern, the medium layer 14 is pressed on the surface of the shielding film 2, the shielding film 2 is used as a reference ground, a vector network analyzer 3 is connected, S parameters are tested, and dynamic bending test is simultaneously performed to observe the change of the S parameters in the bending process.

[0035] Other contents of the shielding film bending performance test device are known from the prior art, and will not be described here.

[0036] The above is only a preferred embodiment of the utility model, and does not limit the utility model in any form, so any modification, equivalent change and modification of the above embodiment according to the technical essence of the utility model, without departing from the technical solution of the utility model, still belongs to the scope of the technical solution of the utility model.

[0037] In addition, the terms "first", "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined as "first", "second" can explicitly or implicitly include at least one feature. In the description of the utility model, the meaning of "multiple" is at least two, for example, two, three, etc., unless otherwise specifically limited.

[0038] In the utility model, unless otherwise specifically defined and limited, the terms "installation", "connection", "connection", "fixing" and other terms should be understood broadly, for example, it can be fixed connection, or detachable connection, or integrated; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through intermediate medium, it can be the communication or interaction relationship between two elements, unless otherwise specifically limited. For ordinary skilled in the art, the specific meaning of the above terms in the utility model can be understood according to the specific circumstances.

Claims

1. A device for testing the bending performance of a shielding film, characterized in that, The application relates to a signal receiving mechanism, a shielding film, a vector network analyzer and a bending mechanism. The shielding film is attached to the surface of a flexible board, the signal receiving mechanism is attached to the surface of the shielding film away from the flexible board, the vector network analyzer is connected with the signal receiving mechanism, the bending mechanism is used for bending the flexible board and the shielding film, the signal receiving mechanism is used for receiving signals leaked due to damage of the shielding film, and the vector network analyzer displays the change of S parameters after receiving the signals. The signal receiving mechanism comprises a signal line, a first solder pad, a second solder pad and a medium layer, the signal line is connected with the first solder pad and the second solder pad, the signal line, the first solder pad and the second solder pad are all located above the medium layer, the first solder pad and the second solder pad are respectively located at two ends of the medium layer, and the medium layer is attached to the surface of the shielding film.

2. The device for testing the bending performance of a shielding film according to claim 1, wherein The signal receiving mechanism further comprises an upper grounding layer and a lower grounding layer, the first solder pad and the second solder pad are fixedly connected with the upper grounding layer, and the upper grounding layer and the lower grounding layer support the medium layer.

3. The device of claim 2, wherein the device further comprises a plurality of rollers. A plurality of through holes are arranged at two ends of the medium layer, and the through holes are connected between the upper grounding layer and the lower grounding layer.

4. The device of claim 3, wherein the device further comprises a plurality of rollers. The lower grounding layer is located between the medium layer and the shielding film.

5. The device of claim 3, wherein the device further comprises a plurality of rollers. The shielding film serves as a reference ground.

6. The shielding film bending performance test apparatus according to claim 1, wherein The S parameters comprise S12 reverse transmission coefficients, S21 forward transmission coefficients, S11 input reflection coefficients and S22 output reflection coefficients.

7. The device of claim 3, wherein the device further comprises a plurality of rollers. ​

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