Automatic test system of radar signal processor
By designing an automatic testing system for radar signal processors, and utilizing computer networks to control signal generation and measurement, the system solves the problems of complex testing and low automation in existing technologies, and achieves efficient and accurate automated testing.
Patent Information
- Application Number
- CN202422815759.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-19
- Publication Date
- 2025-12-12
- Estimated Expiration
- 2034-11-19
AI Technical Summary
The existing radar signal processing subsystem testing process is complex, has a low degree of automation, is time-consuming, and is prone to human error.
An automated testing system for radar signal processors was designed, comprising a housing, a computer, general-purpose instruments, a 128-channel programmable switch and adapters. The system achieves automated testing through network connection and utilizes the computer to control signal generation and measurement.
It significantly reduced manual testing time, improved the accuracy and consistency of test results, reduced the consumption of human and material resources, and optimized resource utilization.
Smart Images
Figure CN223664770U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The embodiment of the present disclosure relates to the technical field of radar signal processing, in particular to an automatic test system of a radar signal processing machine. BACKGROUND
[0002] The signal and information processing subsystem is an important component of a radar, which completes ADC sampling, DDC, monopulse angle measurement, target classification and identification processing, etc. The signal processing also needs to have functions such as clutter environment perception, interference source direction finding, sidelobe cancellation, and anti-main lobe interference. However, the existing radar signal processing subsystem test and debugging process is complex, the required software is not unified, the types of development tooling are numerous, and the test mode is mostly based on manual testing. The test data is recorded manually through the instrument manual test, the degree of automation is low, the test time is long, human errors are prone to occur, and the human and material resources are seriously wasted. CONTENT OF THE UTILITY MODEL
[0003] In order to avoid the shortcomings of the prior art, the utility model provides an automatic test system of a radar signal processing machine, which solves the technical problems that the prior art tests the radar signal manually, resulting in a long test process period and low test result accuracy.
[0004] According to the embodiment of the present disclosure, an automatic test system of a radar signal processing machine is provided, which comprises a shell, a computer, a general instrument, a 128-channel program-controlled switch and an adapter are arranged in the shell; wherein the computer is interactively connected with the general instrument, the adapter and the 128-channel program-controlled switch; the general instrument is electrically connected with the adapter and the 128-channel program-controlled switch; and the adapter is electrically connected with the 128-channel program-controlled switch.
[0005] Optionally, the adapter comprises a DBF board adapter and an AD board adapter, the DBF board adapter is electrically connected with the 128-channel program-controlled switch, and the AD board adapter is electrically connected with the general instrument.
[0006] Optionally, the general instrument comprises a program-controlled power supply, a signal generator and an oscilloscope, all of which are interactively connected with the computer, the program-controlled power supply is electrically connected with the DBF board adapter, the signal generator is electrically connected with the AD board adapter, and the oscilloscope is electrically connected with the 128-channel program-controlled switch.
[0007] Optionally, the size of the shell is 600mm*650mm*1485mm.
[0008] Optionally, the computer is an upper computer.
[0009] Optionally, the power supply specification of the automatic test system of the radar signal processing machine is 220V, 50Hz.
[0010] The technical scheme provided by the embodiment of the present disclosure can include the following beneficial effects:
[0011] In the embodiment of the present disclosure, the radar signal processor automatic test system can greatly reduce the time and manpower required for manual testing, and the test script written once can be repeatedly executed, thereby shortening the test cycle. Through automatic testing, errors caused by manual operation can be eliminated, ensuring the consistency and reliability of the test results. In particular, when multiple tests are performed, resources can be better utilized, making the use of resources more valuable. By assigning automated tasks to computers, accuracy and test personnel efficiency can be improved. BRIEF DESCRIPTION OF DRAWINGS
[0012] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and serve to explain the principles of the present disclosure. It is readily apparent to one of ordinary skill in the art that the accompanying drawings in the following description merely represent some embodiments of the present disclosure and that additional drawings can be obtained by one of ordinary skill in the art without creative work.
[0013] Figure 1 A schematic diagram of a radar signal processor automatic test system in an exemplary embodiment of the present disclosure is shown.
[0014] Figure 2 A physical schematic diagram of a radar signal processor automatic test system in an exemplary embodiment of the present disclosure is shown. DETAILED DESCRIPTION
[0015] Example implementations will now be described more fully with reference to the accompanying drawings. Example implementations may, however, be implemented in many different forms and should not be construed as limited to the examples set forth herein; rather, these implementations are provided so that this disclosure will be thorough and complete, and will fully convey the gist of the example implementations to those skilled in the art. Features described in the description, examples, or claims can be combined in any suitable manner in one or more implementations.
[0016] In addition, the accompanying drawings are only schematic and are not necessarily drawn to scale. Identical or similar components show in the figures are denoted using the same reference numerals, and thus repeated description thereon will be omitted. Some of the blocks in the drawings can be functional blocks, and thus can not necessarily correspond to physical or logical entities.
[0017] In the present example implementation, a radar signal processor automatic test system is first provided. Referring to Figure 1As shown in the radar signal processor automatic test system shown in the figure, the radar signal processor automatic test system can include: a shell, a computer, a general instrument, a 128 channel program-controlled switch and an adapter are arranged in the shell; wherein the computer is respectively connected with the general instrument, the adapter and the 128 channel program-controlled switch; the general instrument is respectively connected with the adapter and the 128 channel program-controlled switch; the adapter is connected with the 128 channel program-controlled switch.
[0018] Specifically, the physical schematic diagram of the radar signal processor automatic test system is as shown in the figure Figure 2 As shown in the figure, the radar signal processor automatic test system: total length x width x height: 600mm x 650mm x 1485mm, the shell material is aluminum alloy coated on the inner and outer surfaces, the equipment bottom is provided with pulleys, which is convenient for moving. The radar signal processor automatic test system structure contains five drawer modules, which are respectively integrated with display, switch matrix, mouse keyboard, DC power module and storage module, each module has fault separation and self-checking function, and has strong maintainability.
[0019] As shown in the figure Figure 1 The computer in the radar signal processor automatic test system is respectively connected with the general instrument, the adapter and the 128 channel program-controlled switch through network, the general instrument is respectively connected with the adapter and the 128 channel program-controlled switch, the adapter is connected with the 128 channel program-controlled switch, when the radar signal processor automatic test system tests the radar signal processor, the radar signal processor includes: one DBF board and four AD boards, one DBF board is connected with four AD boards, DBF board adapter is respectively connected with DBF board, AD board adapter is respectively connected with AD board, and AD board only receives the sine wave of the signal generator.
[0020] In the following, the above radar signal processor automatic test system in the example embodiment will be described in more detail. Figure 1
[0021] In one embodiment, the adapter includes: DBF board adapter and AD board adapter, the DBF board adapter is connected with the 128 channel program-controlled switch, and the AD board adapter is connected with the general instrument.
[0022] Specifically, the adapter includes: DBF board adapter and AD board adapter, as shown in the figure Figure 1 The DBF board adapter is respectively connected with the DBF board, the DBF board adapter is connected with the 128 channel program-controlled switch, and the AD board adapter is respectively connected with the AD board and the signal generator.
[0023] In one embodiment, the general-purpose instrument includes a programmable power supply, a signal generator, and an oscilloscope. The programmable power supply, signal generator, and oscilloscope are all interconnected with a computer. The programmable power supply is electrically connected to a DBF board adapter, the signal generator is electrically connected to an AD board adapter, and the oscilloscope is electrically connected to a 128-channel programmable switch.
[0024] Specifically, such as Figure 1 As shown, the programmable power supply, signal generator, and oscilloscope are all interconnected with the computer. The signal generator outputs a sine wave to the AD board through the AD board adapter, the programmable power supply supplies DC power to the DBF board through the DBF board adapter, and the 128-channel programmable switch sends timing signals to the oscilloscope.
[0025] In one embodiment, the dimensions of the housing are 600mm × 650mm × 1485mm.
[0026] Specifically, such as Figure 2 As shown, the housing of the radar signal processor automatic test system is 600mm×650mm×1485mm.
[0027] In one embodiment, the computer is a host computer.
[0028] In one embodiment, the power supply specification of the automatic test system for radar signal processors is 220V, 50Hz.
[0029] In this embodiment, when the radar signal processor automatic test system tests the radar signal processor, the computer controls a programmable power supply via a network to generate three types of DC power, which are indirectly supplied to the DBF board via the DBF board adapter. The computer controls a signal generator via the network to generate a sine wave signal, which is indirectly supplied to the AD board via the AD board adapter. The computer indirectly controls the operating mode and parameters of the DBF board via the network and the DBF adapter. The DBF board reports specific information to the computer via the network. The computer controls a 128-channel programmable switch via the network to select one of the multiple timing signals output by the DBF board and send it to an oscilloscope. The computer controls the oscilloscope via the network to measure the timing signal and obtain its characteristic values. The DBF board provides power and a clock to the AD board, and the AD board reports the result of analog-to-digital conversion of the input analog signal (sine wave) to the DBF board.
[0030] It should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc., in the above description indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing the embodiments of this disclosure and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of this disclosure.
[0031] In the embodiments of this disclosure, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.
[0032] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this disclosure. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.
[0033] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the utility models disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the appended claims.
Claims
1. An automatic testing system for radar signal processors, characterized in that, The system includes: a housing, within which are housed a computer, general-purpose instruments, a 128-channel programmable switch, and adapters; wherein, The computer interconnects with general-purpose instruments, adapters, and a 128-channel programmable switch. The general-purpose instrument is electrically connected to the adapter and the 128-channel programmable switch, respectively. The adapter is electrically connected to a 128-channel programmable switch.
2. The automatic testing system for radar signal processors according to claim 1, characterized in that, The adapter includes a DBF board adapter and an AD board adapter. The DBF board adapter is electrically connected to a 128-channel programmable switch, and the AD board adapter is electrically connected to a general-purpose instrument.
3. The automatic testing system for radar signal processors according to claim 2, characterized in that, The general-purpose instrument includes a programmable power supply, a signal generator, and an oscilloscope. The programmable power supply, signal generator, and oscilloscope are all interconnected with a computer. The programmable power supply is electrically connected to the DBF board adapter, the signal generator is electrically connected to the AD board adapter, and the oscilloscope is electrically connected to a 128-channel programmable switch.
4. The automatic testing system for radar signal processors according to claim 1, characterized in that, The dimensions of the housing are 600mm × 650mm × 1485mm.
5. The automatic testing system for radar signal processors according to claim 1, characterized in that, The computer is a host computer.
6. The automatic testing system for radar signal processors according to claim 1, characterized in that, The system is powered by 220V, 50Hz.