Photovoltaic cell testing device

Abstract

The utility model relates to the field of solar cell detection, and discloses a photovoltaic cell testing device, which comprises a conductive part, a fixing piece and a fixing part. The conductive part comprises a plurality of test N pole row units and test P pole row units which are alternately distributed and arranged. Each of the test N pole row unit and the test P pole row unit comprises a groove plate, a conductive bead, a conductive sheet and a buffer pad. The conductive beads are arranged in the groove plate, and the top ends of the conductive beads are exposed out of the upper surface of the groove plate. The conducting strip is arranged below the conducting bead, and the buffer pad is arranged between the conducting strip and the fixing part and used for limiting vertical movement of the conducting bead. The conducting strip of the test N-pole row unit is communicated with an external N-pole power supply, and the conducting strip of the test P-pole row unit is communicated with an external P-pole power supply. According to the utility model, the contact mode of the conductive bead and the grid line of the battery piece is adopted to replace the probe contact mode in the prior art. The maintenance frequency of the testing device can be reduced, the maintenance convenience is improved, the shading area is reduced, and the reliability of testing quality is ensured.

Description

TECHNICAL FIELD

[0001] The utility model relates to the field of solar cell detection, especially a photovoltaic cell piece's testing arrangement. BACKGROUND

[0002] With the high -speed development of photovoltaic, the type of photovoltaic cell piece carries out innovation breakthrough constantly, and the production capacity improves rapidly, and the quality test of photovoltaic cell piece has brought huge challenge. At present, the test of photovoltaic industry to photovoltaic cell piece mainly has: EL test technology (electroluminescence), IV test technology (current-voltage characteristic test) etc. EL test technology is used to detect the internal defect of photovoltaic cell piece, such as hidden crack, broken grid etc. that is, through the electrification of grid line, the principle of crystalline silicon electroluminescence is utilized, the photovoltaic cell piece is made to emit light, and the quality problem of photovoltaic cell piece is analyzed and judged by adopting CCD camera image capture;IV test technology, through the test of current and voltage under different temperature and irradiance conditions, IV curve is drawn to analyze and evaluate the conversion efficiency and performance of photovoltaic cell piece.

[0003] In the prior art, the probe connected with the lead wire is usually installed on the probe row, and the probe is used to contact the grid line. This method has the following disadvantages: 1. With the increase of the grid line density of the photovoltaic cell piece, especially in the photovoltaic cell piece without main grid technology, the gap between the grid lines is small, i.e. 1mm. If the probe test technology is used, a probe with a diameter of 0.4mm or less needs to be selected. The probe is expensive. 2. In the photovoltaic cell piece without main grid technology, there are more than four thousand test points. At this time, the number of probes on the probe plate is large, the density is high, and the maintenance is difficult. 3. The service life of the probe is short, the replacement frequency is high, and the replacement is difficult. 4. A large number of dense probes and lead wires will form a large area of shading area, which will have a great impact on image acquisition or illumination, and will affect the test data.

[0004] With the upgrading of photovoltaic cell pieces, including the emergence of photovoltaic cell pieces without main grid, the traditional probe row test is not suitable for this test because of the large number of test points of photovoltaic cell pieces and the small center distance between the grid lines. UTILITY MODEL CONTENT

[0005] The utility model aims at providing a photovoltaic cell piece testing device, which fundamentally solves the problem of traditional probe testing, solves the problem of shading during traditional probe and lead wire testing, solves the problem of frequent probe replacement and maintenance, optimizes the device replacement, and reduces the manufacturing cost of the testing device.

[0006] To achieve the above-mentioned purpose, the utility model adopts the following technical solutions:

[0007] The utility model discloses a photovoltaic cell's testing arrangement, it includes: conducting part, fixing piece and fixed part, the conducting part includes a plurality of phase alternately distributed and arrange test N pole row unit and test P pole row unit, test N pole row unit and test P pole row unit all include groove board, conducting bead, conducting sheet and buffer pad, the groove board is fixed on the fixed part through fixing piece, and conducting bead sets up in the groove board, and the top of conducting bead exposes the upper surface of groove board, and conducting sheet sets up below conducting bead, and buffer pad sets up between conducting sheet and fixed part, is used for limiting the up-and-down movement of conducting bead, the conducting sheet of test N pole row unit is connected with external N pole power supply, and the conducting sheet of test P pole row unit is connected with external P pole power supply.

[0008] Further, the conducting bead is a copper bead.

[0009] Further, the conducting sheet is a copper foil sheet.

[0010] Further, the fixing piece is a bolt.

[0011] Further, the buffer pad is a rubber pad.

[0012] Further, the groove board is provided with a horizontal through groove for placing the conducting bead, the conducting sheet and the buffer pad, one side of the horizontal through groove is provided with a horizontal pressing piece for limiting the horizontal movement of the conducting bead, and the horizontal pressing piece comprises an elastic plate and a pressing plate that are close to each other.

[0013] Further, the groove board is provided with a plurality of placement through holes for placing the conducting bead, the conducting sheet and the buffer pad.

[0014] Further, the fixed part is a transparent fixed plate or a plurality of vertical mounting plates, the vertical mounting plates are connected with an upper top type transmission mechanism outside, and the transparent fixed plate is connected with a lower pressing type transmission mechanism outside.

[0015] Further, the transparent fixed plate is a glass plate.

[0016] Further, a gasket is further arranged between the buffer pad and the fixed part.

[0017] The utility model has the advantages that:

[0018] The utility model adopts the mode that the conducting bead contacts with the grid line of the cell, replaces the probe contact mode of the prior art. The conducting bead structure is stable, the cost is low, the maintenance frequency of the testing arrangement can be reduced, and the maintenance convenience is improved. According to the spacing between the grid lines, the conducting bead with the corresponding diameter is selected to cooperate, and the operation is more convenient. Meanwhile, the conducting bead can make the structure more simple, can reduce the light shielding area, and ensure the reliability of the testing quality. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical scheme of the embodiments of the present application, the drawings used in the embodiments will be briefly introduced as follows. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be considered as limiting the scope. Other related drawings can also be obtained by those skilled in the art without creative labor on the premise of not paying creative labor.

[0020] Figure 1 is a structural schematic diagram of embodiment one.

[0021] Figure 2 is a structural schematic diagram of N-pole row unit or test P-pole row unit in embodiment one.

[0022] Figure 3 is a sectional schematic diagram of N-pole row unit or test P-pole row unit in embodiment one.

[0023] Figure 4 is a structural schematic diagram of embodiment two.

[0024] Figure 5 is a structural schematic diagram of embodiment three.

[0025] Main component symbol explanation:

[0026] 1, test N-pole row unit, 2, P-pole row unit, 3, groove plate, 4, conductive bead, 5, conductive sheet, 6, buffer pad, 7, fixing piece, 8, pressing piece, 9, mounting plate, 10, glass plate, 11, pressing plate, 12, gasket. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the technical scheme in the embodiments of the present application will be described clearly and completely in conjunction with the drawings of the specification. Obviously, the described embodiments are some embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of the present application.

[0028] In the present application, the orientation words such as "up, down, left, right" are generally understood in conjunction with the orientation shown in the drawings and actual application, unless otherwise stated.

[0029] In addition, the terms "first", "second" are only for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features limited by "first", "second" can explicitly or implicitly include one or more features. In the description of the present application, the meaning of "multiple" is two or more than two, unless otherwise specifically limited.

[0030] In the present application, unless otherwise explicitly specified and limited, the first feature is "on" or "under" the second feature, which can be direct contact between the first and second features, or indirect contact through an intermediate medium. Moreover, the first feature can be directly above or obliquely above the second feature, or only indicate that the first feature is higher than the second feature in horizontal height. The first feature can be directly below or obliquely below the second feature, or only indicate that the first feature is lower than the second feature in horizontal height.

[0031] The endpoints of the ranges and any values disclosed herein are not limited to the precise values recited as the exact dimensions are not to be understood as being crucial to the application. Any numerical value, however, can be expressed as a range compatible with this application. For values having only one significant digit, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same significant digit. For values having two significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same two significant digits. For values having three significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same three significant digits. For values having four significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same four significant digits. For values having five significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same five significant digits. For values having six significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same six significant digits. For values having seven significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same seven significant digits. For values having eight significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same eight significant digits. For values having nine significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same nine significant digits. For values having ten significant digits, this can be expressed as "from X to Y", wherein X and Y are consecutive integers having the same ten significant digits. The terms "optional" and "optionally" mean that the subsequently described event or circumstance can or can not occur or exist (or can or can not be present).

[0032] As shown in Figures 1 to 3 The utility model discloses a photovoltaic cell testing device, it includes: conducting part, fixed part 7 and fixed part.

[0033] Among them, conducting part includes a plurality of phase alternation distribution arrangement test N pole row unit 1 and test P pole row unit 2. Test N pole row unit 1 and test P pole row unit 2 all include groove board 3, conducting bead 4, conducting sheet 5 and buffer pad 6. Groove board 3 is fixed on fixed part through fixed part 7, conducting bead 4 is arranged in groove board 3, and the top end of conducting bead 4 exposes the upper surface of groove board 3, is used for with the grid line electric connection of cell piece. Conducting sheet 5 is arranged below conducting bead 4, and the conducting sheet 5 of test N pole row unit 1 is communicated with the N pole power supply of outside, and the conducting sheet 5 of test P pole row unit 2 is communicated with the P pole power supply of outside, is used for connecting conducting bead 4 with external power supply. Buffer pad 6 is arranged between conducting sheet 5 and fixed part, is used for limiting conducting bead 4 to move up and down.

[0034] The utility model discloses a conducting bead 4 and the grid line contact mode of cell piece, replaces the probe contact mode of prior art. Conducting bead 4 stable structure, cost is low, can reduce the maintenance frequency of testing device and improve maintenance convenience. According to the spacing between the grid line, the corresponding diameter of conducting bead 4 is selected to cooperate, and the operation is more convenient. Meanwhile using conducting bead 4 can make the structure more simple, can reduce the area of light shielding and guarantee the reliability of test quality.

[0035] When fixed, the fixing member 7 fixes the groove plate 3 on the fixing part through the groove plate 3 and the conductive sheet 5, and the lead wire is connected to the fixing member 7 for conduction. The diameter of the conductive bead 4 is consistent with the grid line spacing of the battery sheet. In the embodiment, the conductive bead 4 is a copper bead, the conductive sheet 5 is a copper foil sheet, the fixing member 7 is a bolt, and the buffer pad 6 is a rubber pad.

[0036] In the embodiment, the groove plate 3 is provided with a transverse through groove for placing the conductive bead 4, the conductive sheet 5 and the buffer pad 6, and one side of the transverse through groove is provided with a transverse pressing member 8 for limiting the transverse movement of the conductive bead 4. The transverse pressing member 8 includes an elastic plate and a pressing plate which are tightly attached to each other.

[0037] The fixing part of the embodiment is a vertical mounting plate 9, one groove plate 3 corresponds to one vertical mounting plate 9, and a plurality of mounting plates 9 are fixed to each other. The bottom of the mounting plate 9 is fixed below the external transmission mechanism.

[0038] In order to adjust the elasticity of the buffer pad 6, a layer of gasket 12 is further arranged between the buffer pad 6 and the mounting seat.

[0039] The embodiment is suitable for the case where the battery grid lines are relatively dense.

[0040] Manufacturing process:

[0041] According to the grid line spacing, the conductive beads 4 of the same diameter are selected, a certain number of conductive beads 4 are loaded into the transverse through groove in the groove plate 3, the top end of the conductive bead 4 is exposed above the upper surface of the groove plate 3, and is used for electrical connection with the grid lines of the battery sheet. Then a layer of conductive sheet 5 is pressed on the conductive bead 4, and the buffer pad 6 is pressed on the conductive sheet 5, and a layer of gasket 12 is further added on the buffer pad 6 for adjusting the elasticity of the buffer pad 6. Then, the pressing plate and the elastic plate are respectively loaded into one side of the transverse through groove to press the conductive bead 4. Finally, the mounting plate 9 is connected to the two ends of the groove plate 3 through the fixing member 7, and the fixing member 7 is in contact with the conductive sheet 5. The fixing member 7 is connected to the external power supply through the lead wire, so as to lead the power supply to the conductive bead 4 through the conductive sheet 5, and conduct to the grid lines of the battery plate.

[0042] Detection process:

[0043] Taking the EL test of the photovoltaic battery sheet as an example, the mounting plates 9 of the test P pole row and the test N pole row are connected to the transmission mechanism, the transmission mechanism drives the test P pole row and the test N pole row to push upward, the conductive bead 4 contacts the grid lines on the photovoltaic battery sheet, and the photovoltaic battery sheet is pressed, the lead wire is in contact with the fixing member 7 for power conduction, the photovoltaic battery sheet is electroluminescent, and finally the CCD camera captures the image and performs quality analysis.

[0044] Embodiment two:

[0045] As Figure 4As shown, several groove plates 3 in the embodiment are fixed on the glass plate 10 by the fixing member 7. In use, the glass plate 10 faces upward, and the conductive beads 4 face downward. The upper end of the glass plate 10 is fixed above the external transmission mechanism.

[0046] Other technical features are consistent with Embodiment 1.

[0047] The embodiment is applicable to the case where the transmission mechanism cooperating with the measuring device is in a downward pressing mode.

[0048] Detection procedure:

[0049] Taking the EL test of a photovoltaic cell as an example, the glass plate 10 is connected with the transmission mechanism, the transmission mechanism drives the glass plate 10 to press downward, so that the conductive beads 4 contact the grid lines on the photovoltaic cell and press the photovoltaic cell tightly, the conductive beads 4 are in contact with the fixing member 7 through the wires to be electrified, the photovoltaic cell emits light, the light emitting pattern can be transmitted through the glass plate 10, and the CCD camera captures the image and performs quality analysis.

[0050] The mounting plate 9 of the test P-pole row and the test N-pole row is connected with the transmission mechanism, the transmission mechanism drives the test P-pole row and the test N-pole row to push upward, the conductive beads 4 contact the grid lines on the photovoltaic cell and press the photovoltaic cell tightly, the conductive beads 4 are in contact with the fixing member 7 through the wires to be electrified, the photovoltaic cell emits light, and finally the CCD camera captures the image and performs quality analysis.

[0051] Embodiment 3:

[0052] As shown, the fixing part in the embodiment includes an insulating pressing plate 11 and several mounting plates 9. Figure 5

[0053] The groove plate 3 in the embodiment is provided with several placement through holes for placing the conductive beads 4, the conductive sheets 5 and the buffer pads 6. The spacing of the placement through holes is adapted to the grid lines of the cell plate.

[0054] Each placement hole is provided with a conductive bead 4, each row of conductive beads 4 is provided with a conductive sheet 5 below for electrically connecting the whole row of conductive beads 4, and a buffer pad 6 is placed below the conductive sheet 5. The fixing member 7 passes through the groove plate 3 and the conductive sheet 5 to fix the conductive beads 4 on the pressing plate 11, and the several mounting plates 9 are connected with the pressing plate 11 at the upper end and connected with the transmission mechanism at the lower end.

[0055] Other technical features are consistent with Embodiment 1.

[0056] The embodiment is applicable to the case where the spacing distance between the grid lines of the cell plate is relatively large.

[0057] Detection procedure:

[0058] ​Taking photovoltaic cell EL testing as an example: the mounting plate 9 is connected to the transmission mechanism, and the transmission mechanism drives the mounting plate 9 to push upward, so that the conductive bead 4 contacts the grid lines on the photovoltaic cell and presses the photovoltaic cell. The photovoltaic cell is energized through the wire and the fixing part 7, and the photovoltaic cell emits light. The luminous pattern can be seen through the glass plate 10 and captured by the CCD camera for quality analysis.

[0059] In summary, this invention uses a conductive bead-to-grid contact method for the solar cell, replacing the probe contact method of existing technologies. The conductive bead structure is stable, has low manufacturing cost, and reduces the frequency of maintenance of the testing device while improving maintenance convenience. Selecting a conductive bead of appropriate diameter based on the spacing between the grid lines further simplifies operation. Furthermore, using conductive beads allows for a simpler structure, reducing the light-shielding area and ensuring reliable test quality.

[0060] The preferred embodiments of this utility model have been described in detail above; however, this utility model is not limited thereto. Within the scope of the technical concept of this utility model, various simple modifications can be made to the technical solution of this utility model, including combining the various technical features in any other suitable manner. These simple modifications and combinations should also be considered as the content disclosed by this utility model and are all within the protection scope of this utility model.

Claims

1. A testing device for photovoltaic cells, characterized in that, The utility model relates to a test device for testing the conductivity of battery, which comprises: a conductive part, a fixing part (7) and a fixed part; the conductive part comprises a plurality of test N-pole row units (1) and test P-pole row units (2) arranged alternately; the test N-pole row units (1) and test P-pole row units (2) each comprise a groove plate (3), a conductive bead (4), a conductive sheet (5) and a buffer pad (6); the groove plate (3) is fixed on the fixed part by the fixing part (7); the conductive bead (4) is arranged in the groove plate (3), and the top end of the conductive bead (4) is exposed on the upper surface of the groove plate (3); the conductive sheet (5) is arranged below the conductive bead (4), and the buffer pad (6) is arranged between the conductive sheet (5) and the fixed part to limit the up-and-down movement of the conductive bead (4); the conductive sheet (5) of the test N-pole row unit (1) is in communication with an external N-pole power supply, and the conductive sheet (5) of the test P-pole row unit (2) is in communication with an external P-pole power supply.

2. The photovoltaic cell testing apparatus of claim 1, wherein: The conductive bead (4) is a copper bead.

3. The photovoltaic cell testing apparatus of claim 2, wherein: The conductive sheet (5) is a copper foil sheet.

4. The photovoltaic cell testing apparatus of claim 1, wherein: The fixing part (7) is a bolt.

5. The photovoltaic cell testing apparatus of claim 1, wherein: The buffer pad (6) is a rubber pad.

6. The photovoltaic cell testing apparatus of claim 1, wherein: The groove plate (3) is provided with a horizontal through groove for placing the conductive bead (4), conductive sheet (5) and buffer pad (6); one side of the horizontal through groove is provided with a horizontal pressing part (8) for limiting the horizontal movement of the conductive bead (4); the horizontal pressing part (8) comprises an elastic plate and a pressing plate which are tightly attached to each other.

7. The apparatus of claim 1, wherein: The groove plate (3) is provided with a plurality of placement through holes for placing the conductive bead (4), conductive sheet (5) and buffer pad (6).

8. The apparatus of claim 1, wherein: The fixed part is a transparent fixed plate or a plurality of vertical mounting plates (9); the vertical mounting plates (9) are connected with an external top driving mechanism, and the transparent fixed plate is connected with an external pressing driving mechanism.

9. The photovoltaic cell testing apparatus of claim 8, wherein: The transparent fixed plate is a glass plate (10).

10. The test apparatus for photovoltaic cells according to any one of claims 1 to 9, characterized in that: A gasket (12) is further arranged between the buffer pad (6) and the fixed part.

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