Chip test seat convenient to disassemble
By designing an easily removable chip test socket, the problems of poor adaptability and high maintenance costs in existing chip test sockets are solved, enabling flexible configuration and efficient cleaning, improving testing speed and reducing maintenance costs.
Patent Information
- Application Number
- CN202422994697.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-05
- Publication Date
- 2025-12-16
- Estimated Expiration
- 2034-12-05
AI Technical Summary
In the existing technology, the integrated design of the chip test socket is difficult to adapt to the testing needs of different chips, and when a component is damaged, the entire test socket needs to be replaced, resulting in high maintenance costs.
A chip test socket that is easy to disassemble is designed. Through the detachable component structure, such as limiting bars, connecting rods and gear meshing, the test socket can be flexibly assembled and disassembled to adapt to the testing needs of different chips. When damaged, only the damaged component needs to be replaced instead of the entire test socket.
It enables flexible configuration of the test socket to meet diverse testing needs, improves testing speed and efficiency, and ensures cleanliness through easy disassembly design, reducing maintenance costs.
Smart Images
Figure CN223679211U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip test technical field, especially a chip test seat convenient to dismount. BACKGROUND
[0002] Chip test seat is the special test equipment for testing semiconductor chip (such as integrated circuit, microprocessor etc.), and the design of these test seats allows engineers to carry out various electrical performance tests on chips to ensure that they meet design specifications and quality standards, and the test seat usually contains multiple contact points for establishing electrical connection with the pins or pads of the chip, according to different test requirements, the test seat may need to customize specific design to meet specific test standards or chip types, and the chip test seat is an indispensable tool in the quality control and product development of semiconductor industry, at present, the chip test seat of integrated design is difficult to adapt to the test requirements of different chips, and the test seat of integrated design is usually designed for specific types of chips, if other types, sizes or pin layout of chips need to be tested, it may not be directly used, and once a component of the test seat is damaged, the whole test seat often needs to be replaced, which improves the maintenance cost. SUMMARY
[0003] (I) technical problem solved
[0004] In view of the defects of the prior art, the utility model provides a chip test seat convenient to dismount, solves the problems that the chip test seat of integrated design is difficult to adapt to the test requirements of different chips, and once a component of the test seat is damaged, the whole test seat often needs to be replaced, which improves the maintenance cost.
[0005] (II) technical scheme
[0006] In order to achieve the above object, the utility model discloses a chip test seat convenient to dismount, which comprises a base, a main plate, a test seat and a fixing frame, two pairs of pressing blocks are arranged in the fixing frame, fixing plates are fixedly connected to the left and right sides of the fixing frame through screws, two limiting strips are movably connected in two clamping grooves two in the inner wall of the base, the test seat is movably connected with the base, and the base is fixedly connected with the main plate.
[0007] As a preferred technical scheme of the utility model, two said limiting strips upper surfaces are fixedly connected with push blocks, the test seat upper surface is fixedly connected with two connecting strips, two said connecting strips are respectively movably connected with two limiting strips.
[0008] As a preferred technical scheme of the utility model, each said circular groove is fixedly connected with a set of limiting blocks, each set of said limiting blocks is movably connected with each set of limiting columns.
[0009] As a preferred technical scheme of the utility model, each said connecting rod middle end is fixedly connected with gear two, each said clamping groove one is rotatably connected with gear one.
[0010] As a preferred technical scheme of the utility model, each said gear one is engaged with each gear two, each set of said limiting column is movably sleeved with the hole of the fixed frame lower end and is fixedly connected with a clamping block in the hole.
[0011] (Three) beneficial effects
[0012] 1, the overall assembly type design can adjust the adaptive structure by disassembling and reassembling the test seat according to the size, pin number and layout characteristics of different chips, when different types of tests are carried out, the disassembled and assembled test seat can be flexibly configured and different test modules can be added, the overall batch import test module can realize automatic test, greatly improving the test speed and efficiency.
[0013] 2, the hole is fixed with a clamping block and a limiting column for limiting, after disconnecting with the hole, the pressing block can be disassembled, the overall disassembled design can take down the pressing block for deep cleaning during the chip testing process, which can clean some hard-to-reach parts, ensure the cleanliness of the fixing clamp, and avoid the influence of impurities on chip testing. DRAWINGS
[0014] The above description is only a summary of the technical scheme of the utility model, in order to more clearly understand the technical means of the utility model, and the contents of the specification can be implemented, the following preferred embodiments of the utility model are described in detail with reference to the drawings.
[0015] Figure 1 It is the overall structure diagram of the utility model;
[0016] Figure 2 It is the fixed frame structure diagram in the utility model;
[0017] Figure 3 It is the pressing block structure diagram in the utility model;
[0018] Figure 4 It is the test seat structure diagram in the utility model.
[0019] Legend: 1, base; 2, main board; 3, fixed frame; 4, pressing block; 5, fixed plate; 6, test seat; 7, slot one; 8, gear one; 9, gear two; 10, connecting rod; 11, limiting column; 12, circular groove; 13, limiting block; 14, connecting strip; 15, push block; 16, spring; 17, limiting strip; 18, slot two; 19, fixed column. DETAILED DESCRIPTION
[0020] The embodiment of the application provides a chip test seat convenient to disassemble, effectively solves the problem that the integrated design of the chip test seat is difficult to adapt to the test requirements of different chips, the integrated design of the test seat is usually designed for a specific type of chip, if other types, sizes or pin layouts of chips need to be tested, the test seat can not be directly used, and once a component of the test seat is damaged, the entire test seat often needs to be replaced, thereby improving the maintenance cost.
[0021] EMBODIMENT
[0022] As shown in Figure 1 , Figure 2 , Figure 3 and Figure 4 , the general idea of the embodiment of the application is as follows:
[0023] In view of the problems in the prior art, the utility model provides a kind of chip test seat convenient to disassemble, including base 1, main board 2, test seat 6 and fixed frame 3, two pairs of pressing block 4 are provided in fixed frame 3, and fixed plate 5 is fixedly connected on the left and right sides of fixed frame 3 by screw, two fixed plates 5 are movably connected with base 1, two slot two 18 are formed in the inner wall of base 1, and limiting strip 17 is movably connected in two slot two 18, test seat 6 is movably connected with base 1, and base 1 is fixedly connected with main board 2, the opposite surface of each pressing block 4 is provided with circular groove 12 and slot one 7, a group of fixed column 19 is fixedly connected in each circular groove 12, connecting rod 10 is rotatably connected in each group of fixed column 19, limiting column 11 is threadedly connected on the left and right ends of each connecting rod 10, two springs 16 are fixedly connected on the opposite surface of two limiting strips 17, and two pairs of springs 16 are fixedly connected with two slot two 18, when disassembling is needed, the screw provided on fixed plate 5 is opened and removed, the fixed frame 3 is moved upward to take out, and in the process of taking out, two pairs of pressing block 4 provided thereon are moved together, the opposite two push blocks 15 are driven to move the limiting strip 17 fixedly connected therewith, and two pairs of springs 16 are compressed, so that the two limiting strips 17 are separated from the clamping of two connecting strips 14 fixedly connected with test seat 6, the limiting is opened, and test seat 6 can be disassembled.
[0024] The upper surface of each limiting strip 17 is fixedly connected with a push block 15, the upper surface of the test seat 6 is fixedly connected with two connecting strips 14, the two connecting strips 14 are movably connected with the two limiting strips 17 respectively, each circular groove 12 is fixedly connected with a set of limiting blocks 13, each set of limiting blocks 13 is movably connected with each set of limiting columns 11 respectively, the overall assembly type design can adjust the adaptive structure by disassembling and reassembling the test seat 6 according to the size, pin number and layout characteristics of different chips, when different types of tests are carried out, the disassembled and assembled test seat 6 can be flexibly configured and different test modules can be added to meet diversified test requirements, the overall test module can be imported in batches to realize automatic test, and the test speed and efficiency are greatly improved.
[0025] The middle end of each connecting rod 10 is fixedly connected with a gear two 9, each clamping groove one 7 is rotatably connected with a gear one 8, each gear one 8 is meshed with each gear two 9 respectively, each set of limiting columns 11 is movably sleeved with the hole opened in the lower end of the fixed frame 3 and the clamping block is fixedly connected in the hole, the gear one 8 is driven to rotate together with the gear two 9 meshed with it by rotating the gear one 8, the connecting rod 10 fixedly connected with the gear two 9 is driven to rotate together with the gear two 9 in the rotating process, the two limiting columns 11 sleeved on the connecting rod 10 relatively move under the action of threads in the rotating process, at this time, the two limiting columns 11 will be separated from the sleeving of the hole opened in the fixed frame 3, the clamping block fixed in the hole is limited with the limiting column 11, after being separated from the connection of the hole, the pressing block 4 can be disassembled, the overall design convenient to disassemble can take down the pressing block 4 for deep cleaning in the chip testing process, some parts difficult to reach can be cleaned, the cleanliness of the fixed clamp is ensured, thereby avoiding the influence of impurities on chip testing.
[0026] Working principle:
[0027] When disassembly is needed, the screw provided on the fixing plate 5 is opened and removed, the fixed frame 3 is moved upward to take out after the limiting is opened, the two pairs of pressing blocks 4 provided thereon are moved together in the process of taking out, the two pushing blocks 15 are pushed in opposite directions to drive the limiting strips 17 fixed thereto to move together, the two pairs of springs 16 are compressed, at this time, the two limiting strips 17 will be separated from the clamping of the two connecting strips 14 fixed on the test seat 6, the limiting is opened, and the test seat 6 can be disassembled. The overall assembly type design can adjust the adaptive structure by disassembling and reassembling the test seat 6 according to the size, pin number and layout characteristics of different chips. When different types of tests are performed, the disassembled test seat 6 can be flexibly configured and different test modules can be added to meet diversified testing needs. The overall test module can be imported in batches to realize automatic testing, greatly improving the testing speed and efficiency. By rotating the gear one 8, the gear two 9 engaged with the gear one 8 is rotated together. The connecting rod 10 fixed with the gear two 9 is rotated in the rotating process. The two limiting columns 11 sleeved on the connecting rod 10 are relatively moved under the action of the screw thread. At this time, the two limiting columns 11 will be separated from the sleeving of the hole provided on the fixed frame 3. The clamping block fixed in the hole limits the limiting column 11. After the connection with the hole is separated, the pressing block 4 can be disassembled. The overall design of easy disassembly can take down the pressing block 4 for deep cleaning during the chip testing process. Some parts that are difficult to reach can be cleaned to ensure the cleanliness of the fixed clamp, thereby avoiding the influence of impurities on chip testing.
[0028] Finally, it should be noted that: obviously, the above embodiments are only examples for clearly illustrating the utility model, and are not limited to the implementation mode. For ordinary skilled persons in the art, other different forms of changes or variations can be made on the basis of the above description. Here, it is not necessary and impossible to enumerate all the implementation modes. The obvious changes or variations derived therefrom are still within the protection scope of the utility model.
Claims
1. A chip test seat convenient to disassemble, comprising a base (1), a main plate (2), a test seat (6) and a fixing frame (3), characterized in that, Two pairs of pressing blocks (4) are arranged in the fixing frame (3), and fixing plates (5) are fixedly connected to the left and right sides of the fixing frame (3) through screws, the two fixing plates (5) are movably connected with the base (1), two clamping grooves two (18) are arranged in the inner wall of the base (1), and a limiting strip (17) is movably connected in each clamping groove two (18); The test seat (6) is movably connected with the base (1), the base (1) is fixedly connected with the main plate (2), a circular groove (12) is arranged in the opposite surface of each pressing block (4), and a clamping groove one (7) is arranged in the upper surface of each pressing block (4), a group of fixing columns (19) are fixedly connected in each circular groove (12), a connecting rod (10) is rotatably connected in each group of fixing columns (19), and a limiting column (11) is threadedly connected to the left and right ends of each connecting rod (10).
2. The easily detachable chip test socket of claim 1, wherein: The opposite surfaces of the two limiting strips (17) are fixedly connected with two springs (16); The two pairs of springs (16) are fixedly connected with the two clamping grooves two (18) respectively.
3. The easily detachable chip test socket of claim 1, wherein: The upper surfaces of the two limiting strips (17) are fixedly connected with a push block (15), and the upper surface of the test seat (6) is fixedly connected with two connecting strips (14); The two connecting strips (14) are movably connected with the two limiting strips (17) respectively.
4. The easily detachable chip test socket of claim 1, wherein: A group of limiting blocks (13) are fixedly connected in each circular groove (12). Each group of limiting blocks (13) is movably connected with each group of limiting columns (11).
5. The easily disassembled chip test socket of claim 1, wherein: A gear two (9) is fixedly connected to the middle end of each connecting rod (10).
6. The easily disassembled chip test socket of claim 5, wherein: A gear one (8) is rotatably connected in each clamping groove one (7).
7. A chip test socket for facilitating disassembly as recited in claim 6, wherein: Each gear one (8) is meshed with each gear two (9).
8. The easily disassembled chip test socket of claim 7, wherein: Each group of limiting columns (11) is movably sleeved with the hole arranged in the lower end of the fixing frame (3), and a clamping block is fixedly connected in the hole.