Integrated circuit chip test interface board
By designing test interface boards suitable for integrated circuit chips of different models and sizes, the problems of signal transmission being susceptible to interference and interface mismatch were solved, achieving high-precision and high-reliability testing, and reducing testing costs and equipment replacement frequency.
Patent Information
- Application Number
- CN202423119270.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-17
- Publication Date
- 2025-12-26
- Estimated Expiration
- 2034-12-17
AI Technical Summary
Existing test interface boards are susceptible to external electromagnetic interference during signal transmission, leading to signal distortion, attenuation, or loss. This results in poor connection reliability, affecting the accuracy of test results. Furthermore, different chip models require different interfaces, and frequent replacement of connection lines is time-consuming and laborious, increasing test risks and costs.
An integrated circuit chip test interface board was designed, which includes a movable and fixed component, multiple sets of general interface modules and test devices, such as power switches, digital tubes, buzzers, etc. It can adapt to the testing of chips of different models and sizes, improve stability and accuracy, and reduce the frequency of equipment replacement.
It improves the stability and accuracy of testing, reduces the investment and maintenance costs of testing equipment, enhances the versatility and flexibility of the testing system, and ensures the reliability of test data and the product yield rate.
Smart Images
Figure CN223727868U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the related technical field of integrated circuit test especially relates to an integrated circuit chip test interface board. BACKGROUND
[0002] In today's era of rapid development of science and technology, the application of integrated circuit chip is extremely wide, in the research and development, production process of integrated circuit chip, need to carry out a lot of test work to the chip, to ensure that the performance, function of chip meets the design requirement, the chip test of integrated circuit needs to cooperate with interface end and slot end relay needle plate and capacitor, resistance etc.
[0003] But the existing test interface board due to its structure design is not reasonable, in the signal transmission process is susceptible to external electromagnetic interference, lead to signal distortion, attenuation even loss, thereby make the test result appear deviation, can not truly reflect the performance condition of chip, the connection reliability between chip and test interface board is deep, the bad connection causes the contact resistance to increase, signal transmission interruption, not only influence the normal test, still can cause the damage to chip, further improve the test risk and cost, and different models of chip need different test interface, frequently change the connection line of test equipment not only time -consuming and labor -intensive, and easily lead to test error even chip damage because of unstable connection, difficult to meet the demand of high accuracy, high reliability test. UTILITY MODEL CONTENTS
[0004] The utility model discloses a kind of integrated circuit chip test interface boards, to solve the problem that the existing test interface board is presented in above background technology due to its structure design is not reasonable, in the signal transmission process is susceptible to external electromagnetic interference, lead to signal distortion, attenuation even loss, thereby make the test result appear deviation, can not truly reflect the performance condition of chip, the connection reliability between chip and test interface board is deep, the bad connection causes the contact resistance to increase, signal transmission interruption, not only influence the normal test, still can cause the damage to chip, further improve the test risk and cost, and different models of chip need different test interface, frequently change the connection line of test equipment not only time -consuming and labor -intensive, and easily lead to test error even chip damage because of unstable connection, difficult to meet the demand of high accuracy, high reliability test.
[0005] In order to achieve the above object, the utility model provides the following technical scheme: an integrated circuit chip test interface board, including the rest platform, the bottom fixed mounting of rest platform has the support frame, the outside of rest platform is equipped with the inner groove, the bottom fixed mounting of rest platform has the adsorption disc, the top fixed mounting of rest platform internally has the fan, the top fixed mounting of rest platform has the power switch, the top fixed mounting of rest platform has the nixie tube, the top fixed mounting of rest platform has the buzzer, the top fixed mounting of rest platform has the capacitor, the top fixed mounting of rest platform has the circuit board, the top fixed mounting of rest platform has the mobile fixed component, the top of rest platform is provided with test interface board body, the top fixed mounting of test interface board body has JTAG interface, the top fixed mounting of test interface board body has AS interface, the top fixed mounting of test interface board body has power interface, the top fixed mounting of test interface board body has extension interface, the top fixed mounting of test interface board body has secondary extension interface, the top fixed mounting of rest platform has the limit block.
[0006] Preferably, the adsorption disc is provided with four same adsorption discs, the four adsorption discs are symmetrically distributed about the vertical center line of the rest platform, and the bottoms of the four adsorption discs are located on the same horizontal center line as the bottom of the support frame.
[0007] Preferably, the fan is provided with four same fans, the four fans are symmetrically distributed about the vertical center line of the rest platform, and the four fans are located in the inner groove.
[0008] Preferably, the mobile fixed component comprises a fixed seat, a through hole, a mounting groove, a sliding rail, a sliding plate, a sliding groove and a mobile handle, the top of the rest platform is fixedly provided with the fixed seat, the outer side of the fixed seat is provided with the through hole, the outer side of the fixed seat is provided with the mounting groove, the bottom of the fixed seat is fixedly provided with the sliding rail, the top of the sliding rail is slidably connected with the sliding plate, the bottom of the sliding plate is provided with the sliding groove, the outer side of the sliding plate is fixedly provided with the mobile handle, the size of the through hole is greater than the diameter of the mobile handle, the sliding plate is located in the mounting groove, and the sliding rail is matched with the sliding groove.
[0009] Preferably, the sliding rail and the sliding groove are provided with multiple groups of same structures, the multiple groups of the sliding rail and the sliding groove are one-to-one corresponding, and the multiple groups of the sliding rail are equidistantly distributed on the bottom of the fixed seat.
[0010] Preferably, the mobile fixed component is provided with two groups of same structures, the two groups of the mobile fixed component are symmetrically distributed about the vertical center line of the test interface board body, and the sliding plate is in contact with the test interface board body.
[0011] Preferably, the limit block is located between the two groups of the mobile fixed component, and the limit block is in contact with the test interface board body.
[0012] Compared with the prior art, the integrated circuit chip test interface board has the advantages that: the mobile fixing assembly is arranged, the test interface board body can be clamped and fixed through the two groups of sliding plates, is suitable for test interface board bodies with different sizes, has high diversity, and the integrated circuit chip does not shake during testing, the stability of testing is improved, the accuracy of the test structure is ensured, the safety and reliability of the test system are improved, the production stagnation risk caused by test equipment failure is reduced, meanwhile, the test interface board body is designed with multiple universal interface connection modules, can adapt to integrated circuit chips with different models and different packaging forms, does not need to frequently replace test boards, can meet diversified chip testing requirements, effectively reduces the investment and maintenance cost of test equipment, improves the universality and flexibility of the test system, and multiple test devices such as a power switch, a buzzer and a digital tube are arranged, integrated circuit chips can be tested quickly and conveniently, the accuracy and reliability of test data are ensured, meanwhile, the product yield and quality stability are improved, and the practicability is high. BRIEF DESCRIPTION OF DRAWINGS
[0013] Figure 1 It is a three-dimensional structure schematic view of the utility model;
[0014] Figure 2 It is a side view structure schematic view of the utility model;
[0015] Figure 3 It is a placing table horizontal section view structure schematic view of the utility model;
[0016] Figure 4 It is a test interface board body split structure schematic view of the utility model;
[0017] Figure 5 It is a mobile fixing assembly split structure schematic view of the utility model.
[0018] In the drawing: 1, placing table; 2, support frame; 3, inner groove; 4, adsorption disc; 5, fan; 6, power switch; 7, digital tube; 8, buzzer; 9, capacitor; 10, circuit board; 11, mobile fixing assembly; 1101, fixed seat; 1102, through hole; 1103, installation groove; 1104, sliding rail; 1105, sliding plate; 1106, sliding slot; 1107, mobile handle; 12, test interface board body; 13, JTAG interface; 14, AS interface; 15, power interface; 16, expansion interface; 17, secondary expansion interface; 18, limiting block. DETAILED DESCRIPTION
[0019] Clearly, the described embodiments are merely a part of the embodiments of the present application, but not all the embodiments. Based on the embodiments of the present application, all the other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the present application.
[0020] Please refer to Figures 1-5 The utility model provides a kind of technical scheme: a kind of integrated circuit chip test interface board, including placing table 1, the bottom of placing table 1 is fixedly installed with support frame 2, the outside of placing table 1 is equipped with inner groove 3, the bottom of placing table 1 is fixedly installed with adsorption disc 4, the top inside placing table 1 is fixedly installed with fan 5, the top of placing table 1 is fixedly installed with power switch 6, the top of placing table 1 is fixedly installed with nixie tube 7, the top of placing table 1 is fixedly installed with buzzer 8, the top of placing table 1 is fixedly installed with capacitor 9, the top of placing table 1 is fixedly installed with circuit board 10, the top of placing table 1 is fixedly installed with mobile fixed component 11, the top of placing table 1 is equipped with test interface board body 12, the top of test interface board body 12 is fixedly installed with JTAG interface 13, the top of test interface board body 12 is fixedly installed with AS interface 14, the top of test interface board body 12 is fixedly installed with power interface 15, the top of test interface board body 12 is fixedly installed with extension interface 16, the top of test interface board body 12 is fixedly installed with secondary extension interface 17, the top of placing table 1 is fixedly installed with limit block 18.
[0021] Further, four adsorption discs 4 are symmetrically distributed about the vertical center line of the placing table 1, and the bottoms of the four adsorption discs 4 are located on the same horizontal center line as the bottom of the support frame 2. By arranging multiple groups of adsorption discs 4, the placing table 1 can be fixed at the desired testing position, and the position can be adjusted at any time, which has strong applicability.
[0022] Further, four fans 5 are symmetrically distributed about the vertical center line of the placing table 1, and the four fans 5 are located in the inner groove 3. By arranging the fans 5, the test interface board body 12 being tested can be cooled, preventing inaccurate test results due to excessive temperature.
[0023] Further, the mobile fixing assembly 11 comprises a fixing seat 1101, a through hole 1102, a mounting groove 1103, a sliding rail 1104, a sliding plate 1105, a sliding groove 1106 and a mobile handle 1107, the top of the placement table 1 is fixedly installed with the fixing seat 1101, the outer side of the fixing seat 1101 is provided with the through hole 1102, the outer side of the fixing seat 1101 is provided with the mounting groove 1103, the bottom of the fixing seat 1101 is fixedly installed with the sliding rail 1104, the top of the sliding rail 1104 is slidably connected with the sliding plate 1105, the bottom of the sliding plate 1105 is provided with the sliding groove 1106, and the outer side of the sliding plate 1105 is fixedly installed with the mobile handle 1107; the size of the through hole 1102 is greater than the diameter of the mobile handle 1107, the sliding plate 1105 is located in the mounting groove 1103, the sliding rail 1104 is matched with the sliding groove 1106, the mobile fixing assembly 11 is provided, the test interface board body 12 can be clamped and fixed by the two sliding plates 1105, is suitable for test interface board bodies 12 of different sizes, has high diversity, and the integrated circuit chip will not shake during testing, the stability of testing is improved, the accuracy of the test result is ensured, and the safety and reliability of the test system are improved.
[0024] Further, the sliding rail 1104 and the sliding groove 1106 are provided with the same plurality of groups, the plurality of groups of the sliding rail 1104 and the sliding groove 1106 are in one-to-one correspondence, and the plurality of groups of the sliding rail 1104 are equidistantly distributed on the bottom of the fixing seat 1101; the plurality of groups of the sliding rail 1104 and the sliding groove 1106 are provided, the sliding plate 1105 slides on the sliding rail 1104 more stably, and the design of the plurality of groups of the sliding rail 1104 makes the stress of each sliding rail 1104 more uniform, which helps to prolong the service life of the sliding rail 1104.
[0025] Further, the mobile fixing assembly 11 is provided with the same two groups, and the two groups of mobile fixing assemblies 11 are symmetrically distributed about the vertical center line of the test interface board body 12; the sliding plate 1105 is in contact with the test interface board body 12; the two groups of mobile fixing assemblies 11 are provided, the test interface board body 12 can be clamped and fixed by the two sliding plates 1105, is suitable for test interface board bodies 12 of different sizes, has high diversity, and the integrated circuit chip will not shake during testing, the stability of testing is improved, the accuracy of the test structure is ensured, and the safety and reliability of the test system are improved.
[0026] Further, the limiting block 18 is located between the two groups of mobile fixing assemblies 11, and the limiting block 18 is in contact with the test interface board body 12; the limiting block 18 is provided, the test interface board body 12 can be placed on the placement table 1 better, and the test interface board body 12 can be limited.
[0027] Working principle: in use, the worker first observes the environment around the placement table 1 and the test interface board body 12 and the state of himself, if the problem is found in time to adjust and solve, after the inspection is completed, the worker fixes the placement table 1 at the place where it needs to be tested through the adsorption disc 4 at the bottom of the placement table 1, at this time the worker starts four groups of fans 5 with independent power supply, in order to cool down in the process of testing the integrated circuit chip, prevent the test result from being inaccurate due to high temperature, at this time the worker places the test interface board body 12 to be tested on the top of the placement table 1, through the limiting of the limiting block 18, the test interface board body 12 is placed tightly on the side of the limiting block 18, at this time the worker moves the sliding plate 1105 on the movable handle 1107 on the slide rail 1104 in the fixed seat 1101 by pulling two groups of movable handles 1107, so that the sliding plate 1105 on the movable handle 1107 is tightly attached to the test interface board body 12, and the test interface board body 12 is clamped and fixed, at this time the worker adapts to integrated circuit chips of different models and different packaging forms through various interfaces on the top of the test interface board body 12, JTAG interface 13, AS interface 14, power interface 15, expansion interface 16 and secondary expansion interface 17, without frequent replacement of test boards, the diversified chip testing requirements can be met, the investment and maintenance cost of the test equipment is effectively reduced, and the universality and flexibility of the test system are improved, at this time the worker turns on the power switch 6 to test the test interface board body 12, at this time the digital tube 7, the buzzer 8, the capacitor 9 and the circuit board 10 will work, at this time the test is completed, the worker turns off the power switch 6, at this time the worker only needs to repeat the above process to test all the test interface board bodies 12 that need to be tested, after all the tests are completed, the worker checks whether all the parts are good, if a part is damaged, the worker can replace the separately damaged part, which is simple and convenient to operate and has high practicality.
[0028] The basic principle, main characteristics and advantages of the utility model are shown and described above. Those skilled in the art should understand that the utility model is not limited to the above embodiments, and the above embodiments and descriptions in the specification are only to illustrate the principle of the utility model, and various changes and improvements can be made to the utility model without departing from the spirit and scope of the utility model, and these changes and improvements all fall within the scope of the utility model claimed.
Claims
1. An integrated circuit chip test interface board comprising a placement table (1), characterized in that: The bottom of the placement table (1) is fixedly installed with a support frame (2), the outer side of the placement table (1) is provided with an inner groove (3), the bottom of the placement table (1) is fixedly installed with an adsorption disc (4), the top of the inside of the placement table (1) is fixedly installed with a fan (5), the top of the placement table (1) is fixedly installed with a power switch (6), the top of the placement table (1) is fixedly installed with a number tube (7), the top of the placement table (1) is fixedly installed with a buzzer (8), the top of the placement table (1) is fixedly installed with a capacitor (9), the top of the placement table (1) is fixedly installed with a circuit board (10), the top of the placement table (1) is fixedly installed with a mobile fixing assembly (11), the top of the placement table (1) is provided with a test interface plate body (12), the top of the test interface plate body (12) is fixedly installed with a JTAG interface (13), the top of the test interface plate body (12) is fixedly installed with an AS interface (14), the top of the test interface plate body (12) is fixedly installed with a power interface (15), the top of the test interface plate body (12) is fixedly installed with an expansion interface (16), the top of the test interface plate body (12) is fixedly installed with a secondary expansion interface (17), and the top of the placement table (1) is fixedly installed with a limiting block (18).
2. An integrated circuit chip test interface board as recited in claim 1, wherein: The adsorption disc (4) is provided with four same adsorption discs (4), the four adsorption discs (4) are symmetrically distributed about the vertical center line of the placement table (1), and the bottoms of the four adsorption discs (4) are located on the same horizontal center line as the bottom of the support frame (2).
3. An integrated circuit chip test interface board as recited in claim 1, wherein: The fan (5) is provided with four same fans (5), the four fans (5) are symmetrically distributed about the vertical center line of the placement table (1), and the four fans (5) are located in the inner groove (3).
4. The integrated circuit chip test interface board of claim 1, wherein: The mobile fixing assembly (11) comprises a fixing seat (1101), a through hole (1102), a mounting groove (1103), a sliding rail (1104), a sliding plate (1105), a sliding groove (1106) and a mobile handle (1107), the top of the placement table (1) is fixedly installed with the fixing seat (1101), the outer side of the fixing seat (1101) is provided with the through hole (1102), the outer side of the fixing seat (1101) is provided with the mounting groove (1103), the bottom of the inside of the fixing seat (1101) is fixedly installed with the sliding rail (1104), the top of the sliding rail (1104) is slidably connected with the sliding plate (1105), the bottom of the sliding plate (1105) is provided with the sliding groove (1106), the outer side of the sliding plate (1105) is fixedly installed with the mobile handle (1107), the size of the through hole (1102) is greater than the diameter of the mobile handle (1107), the sliding plate (1105) is located in the mounting groove (1103), and the sliding rail (1104) is matched with the sliding groove (1106).
5. An integrated circuit chip test interface board as claimed in claim 4, characterized in that: The slide rail (1104) and the slide groove (1106) are provided with the same groups, the groups of the slide rail (1104) and the slide groove (1106) correspond to each other, and the groups of the slide rail (1104) are equidistantly distributed on the bottom of the fixed seat (1101).
6. An integrated circuit chip test interface board as recited in claim 4, further comprising: The mobile fixing assembly (11) is provided with the same two groups, and the two groups of the mobile fixing assembly (11) are symmetrically distributed about the vertical center line of the test interface board body (12), and the sliding plate (1105) is in contact with the test interface board body (12).
7. An integrated circuit chip test interface board as recited in claim 4, further comprising: The limiting block (18) is located between the two groups of mobile fixing assemblies (11), and the limiting block (18) is in contact with the test interface board body (12).