Combined array probe for detecting inside hexagonal bolt

Abstract

The combined array probe comprises a probe body, the probe body comprises a probe seat, an annular probe and a surface type probe, an accommodating cavity is formed in the probe seat, a first positioning sleeve which is through up and down is arranged in the center of the accommodating cavity, and a second positioning sleeve which is through up and down is arranged in the accommodating cavity. The annular probe is installed in the containing cavity and located between the inner wall of the containing cavity and the outer wall of the first positioning sleeve. The lower end face of the annular probe is flush with the lower end face of the probe base and can make contact with the annular plane of the hexagon socket screw. The lower end face of the first positioning sleeve is provided with a second positioning sleeve matched with the inner hexagonal groove of the inner hexagonal bolt in size, the second positioning sleeve is vertically through and communicated with the first positioning sleeve, the surface type probe is installed in the second positioning sleeve, and the lower end face of the surface type probe is flush with the lower end face of the second positioning sleeve. The combined array probe for detecting the inner hexagonal bolt can detect an annular plane and an inner hexagonal groove at the same time, and the detection efficiency is greatly improved.

Description

Technical Field

[0001] This utility model relates to a combined array probe, and more particularly to a combined array probe for detecting internal hexagonal bolts. Background Technology

[0002] Typically, the head of a hex socket head cap screw has an annular plane and a hexagonal groove on its upper end face, with the groove centered on the annular end face. Before using a hex socket head cap screw, it needs to be inspected for defects using an ultrasonic probe. During inspection, a coupling agent (a medium, specifically water, machine oil, or a special coupling agent) is evenly applied to the upper end face of the hex socket head cap screw. The ultrasonic probe is then placed on the upper end face of the screw, and ultrasonic waves are emitted through the coupling agent. The ultrasonic waves are reflected when they encounter a flat or defective area on the upper end face of the screw. The reflected waves are sent to a receiver. The receiver compares the arrival time of the reflected wave from a flat area with the arrival time of the reflected wave from a defective area to determine the location of the defect on the upper end face of the screw and outputs the result.

[0003] During the above testing process, because the ultrasonic beam emitted by the ultrasonic probe is singular and has a small coverage area, there is a large blind spot in the testing of hexagon socket head cap screws, especially in the hexagon socket groove (i.e., hexagon countersunk hole) of the screw. The actual condition of the hexagon socket head cap screw cannot be fully detected. Utility Model Content

[0004] The problem to be solved by this utility model is to provide a combined array probe for detecting hexagonal socket head cap screws. This combined array probe for detecting hexagonal socket head cap screws can simultaneously detect the annular plane and the hexagonal socket groove, which greatly improves the detection efficiency.

[0005] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is as follows:

[0006] A combined array probe for detecting hexagon socket head cap screws includes a probe body, characterized in that: the probe body includes a probe base, an annular probe, and a surface probe; the probe base has a receiving cavity, and a first positioning sleeve extending vertically through the center of the receiving cavity; the annular probe is installed in the receiving cavity and is located between the inner wall of the receiving cavity and the outer wall of the first positioning sleeve; the lower end face of the annular probe is flush with the lower end face of the probe base and can contact the annular plane of the hexagon socket head cap screw; the lower end face of the first positioning sleeve has a second positioning sleeve that matches the size of the hexagonal groove of the hexagon socket head cap screw; the second positioning sleeve extends vertically through the first positioning sleeve and communicates with the first positioning sleeve; the surface probe is installed in the second positioning sleeve, and the lower end face of the surface probe is flush with the lower end face of the second positioning sleeve.

[0007] During testing, the second positioning sleeve below the probe body is placed into the hexagonal recess of the socket head cap screw, so that the face probe in the second positioning sleeve contacts the bottom of the hexagonal recess, and then the annular probe contacts the annular plane of the socket head cap screw. This allows the face probe to test the bottom of the hexagonal recess of the socket head cap screw, and the annular probe to test the annular plane of the socket head cap screw.

[0008] In a preferred embodiment, the annular probe comprises multiple fan-shaped array elements arranged in a circular array along the circumference of the first positioning sleeve, each fan-shaped array element having an arc-shaped inner side; the surface probe comprises multiple rectangular array elements arranged in a matrix of rows and columns. The annular probe with multiple fan-shaped array elements arranged in a circular array along the circumference provides more uniform ultrasonic beam coverage and eliminates blind spots in the annular plane detection; the arc-shaped inner sides of the fan-shaped array elements adapt to the outer wall contour of the first positioning sleeve, and the array elements are seamlessly connected, avoiding ultrasonic beam superposition interference and improving the positioning accuracy of annular plane defects. The matrix arrangement of multiple rectangular array elements enables grid-like detection of the bottom of the internal hexagonal groove, with the ultrasonic beam uniformly covering the groove bottom and corner areas, accurately identifying minute cracks in the groove bottom.

[0009] In a further optimized embodiment, both the fan-shaped and rectangular array elements are stacked from top to bottom, forming a layered structure consisting of a backing material layer, a negative electrode layer, a wafer layer, a positive electrode layer, and a matching layer. This stacked structure is compact, with each layer firmly bonded, wear-resistant, and impact-resistant. The matching layer optimizes ultrasonic impedance matching, reducing ultrasonic reflection loss between the probe and the bolt, allowing more energy to enter the bolt. The wafer layer efficiently converts electrical signals into ultrasonic waves, resulting in a fast response speed. The backing material layer absorbs clutter signals from the back of the wafer layer, avoiding secondary reflection interference and providing strong anti-interference capabilities. The positive and negative electrode layers provide stable signal transmission without attenuation or distortion, ensuring the receiver accurately captures defect reflection waves.

[0010] In a further preferred embodiment, positive electrode layers of each of the aforementioned sector-shaped and rectangular array elements are welded with positive cables, and negative electrode layers of each of the sector-shaped and rectangular array elements are welded with negative cables. The positive and negative cables of each sector-shaped array element are located within the accommodating cavity, while the positive and negative cables of each rectangular array element are sequentially located from bottom to top within the second positioning sleeve and the first positioning sleeve. The upper ends of each positive cable protrude above the probe holder and converge into a single positive cable, and the upper ends of each negative cable protrude above the probe holder and converge into a single negative cable. By converging the positive and negative cables of each array element into a single positive and negative cable, the number of cables is reduced (from dozens to just two), avoiding tangling and wear caused by messy cables, while also reducing electromagnetic interference and improving signal transmission stability. Furthermore, the two main cables are centrally connected to the receiver, eliminating the need for the receiver to individually connect to each array element cable, thus shortening installation time.

[0011] In a further preferred embodiment, the upper surface of the probe holder is provided with a cable sheath, within which both the positive and negative main cables are housed. The cable sheath effectively encloses the positive and negative main cables, preventing them from being pulled, squeezed, or contaminated with oil or dust, and preventing signal interruption or short circuits caused by cable damage.

[0012] In a preferred embodiment, the upper end face of the second positioning sleeve is bonded to the lower end face of the first positioning sleeve using an adhesive. This adhesive bonding allows for a seamless fit between the second and first positioning sleeves, eliminating assembly gaps caused by mechanical connections (such as threads or snap-fits).

[0013] Compared with the prior art, this utility model has the following advantages:

[0014] This invention features a ring probe that precisely covers the annular plane of the hexagon socket head cap screw, while a face probe, adapted to the size of the hexagon socket groove via a second positioning sleeve, directly conforms to the bottom of the groove for detection. Together, they cover the entire critical area of ​​both the annular plane and the hexagon socket groove on the upper surface of the screw, solving the problems of limited coverage and large blind spots in grooves inherent in existing single probes, thus improving defect detection rates. This combined array probe integrates two detection functions, allowing simultaneous detection of both the annular plane and the hexagon socket groove without requiring probe replacement, significantly enhancing detection efficiency. Attached Figure Description

[0015] Figure 1 This is a structural schematic diagram of an embodiment of the present utility model;

[0016] Figure 2 yes Figure 1 A schematic diagram of the structure of the probe body for detecting internal hexagonal bolts;

[0017] Figure 3 yes Figure 1 A bottom view of the probe body;

[0018] Figure 4 yes Figure 3 Cross-sectional view of AA. Detailed Implementation

[0019] The present invention will now be described in detail with reference to the accompanying drawings and specific embodiments.

[0020] like Figure 1-4As shown, the combined array probe for detecting hexagonal socket head cap screws in this embodiment includes a probe body 1. The probe body 1 includes a probe base 11, an annular probe 12, and a surface probe 13. The probe base 11 has a receiving cavity 111. The center of the receiving cavity 111 has a first positioning sleeve 14 that extends vertically. The annular probe 12 is installed in the receiving cavity 111 and is located between the inner wall of the receiving cavity 111 and the outer wall of the first positioning sleeve 14. The lower end face of the annular probe 12 is flush with the lower end face of the probe base 11 and can contact the annular plane 21 of the hexagonal socket head cap screw 2. The lower end face of the first positioning sleeve 14 has a second positioning sleeve 15 that matches the size of the hexagonal recess 22 of the hexagonal socket head cap screw 2. The second positioning sleeve 15 extends vertically and communicates with the first positioning sleeve 14. The surface probe 13 is installed in the second positioning sleeve 15, and the lower end face of the surface probe 13 is flush with the lower end face of the second positioning sleeve 15.

[0021] During testing, the second positioning sleeve 15 below the probe body 1 is placed into the hexagonal recess 22 of the socket head cap screw 2, so that the face probe 13 in the second positioning sleeve 15 contacts the bottom of the hexagonal recess 22, and then the annular probe 12 contacts the annular plane 21 of the socket head cap screw 2, so that the face probe 13 detects the bottom of the hexagonal recess 22 of the socket head cap screw 2, and the annular probe 12 detects the annular plane 21 of the socket head cap screw 2.

[0022] The annular probe 12 includes multiple fan-shaped array elements 121 arranged in a circular array along the circumference of the first positioning sleeve 14, each fan-shaped array element 121 having an inner arc-shaped edge 122; the surface probe 13 includes multiple rectangular array elements 131 arranged in a matrix of rows and columns. The annular probe 12 with multiple fan-shaped array elements 121 arranged in a circular array along the circumference provides more uniform ultrasonic beam coverage and eliminates blind spots in the annular plane 21. The arc-shaped edges 122 on the inner sides of the fan-shaped array elements 121 adapt to the outer wall contour of the first positioning sleeve 14, and the array elements are seamlessly connected, avoiding ultrasonic beam superposition interference and improving the positioning accuracy of defects in the annular plane 21. The matrix arrangement of multiple rectangular array elements 131 enables grid-like detection of the bottom of the hexagonal groove 22, with the ultrasonic beam uniformly covering the bottom and corner areas, accurately identifying minute cracks in the bottom of the groove.

[0023] Both the fan-shaped array element 121 and the rectangular array element 131 are stacked structures formed by sequentially stacking a backing layer 10, a negative electrode layer 20, a wafer layer 30, a positive electrode layer 40, and a matching layer 50 from top to bottom. This stacked structure is compact, with each layer firmly bonded, wear-resistant, and impact-resistant. The matching layer 50 optimizes ultrasonic impedance matching, reduces ultrasonic reflection loss between the probe and the bolt, and allows more energy to enter the bolt. The wafer layer 30 can efficiently convert between electrical signals and ultrasonic waves, with a fast response speed. The backing layer 10 absorbs clutter signals from the back of the wafer layer 30, avoiding secondary reflection interference and providing strong anti-interference capabilities. The positive electrode layer 40 and the negative electrode layer 20 provide stable signal transmission without attenuation or distortion, ensuring that the receiver accurately captures defect reflection waves.

[0024] Each of the aforementioned sector-shaped array elements 121 and rectangular array elements 131 has a positive electrode layer 40 welded with a positive cable 3, and each of the aforementioned sector-shaped array elements 121 and rectangular array elements 131 has a negative electrode layer 20 welded with a negative cable 4. The positive and negative cables 3 and 4 of each sector-shaped array element 121 are located within the receiving cavity 111, and the positive and negative cables 3 and 4 of each rectangular array element 131 are sequentially located from bottom to top within the second positioning sleeve 15 and the first positioning sleeve 14. The upper ends of each positive cable 3 protrude above the probe holder 11 and converge into a single positive cable 5, and the upper ends of each negative cable 4 protrude above the probe holder 11 and converge into a single negative cable 6. By converging the positive and negative cables 3 and 4 of each array element into the single positive cable 5 and the single negative cable 6, the number of cables is reduced (from dozens to two), avoiding tangling and wear caused by messy cables, while also reducing electromagnetic interference and improving signal transmission stability. Furthermore, the two main cables are connected to the receiver, eliminating the need for the receiver to connect to individual array element cables one by one, thus shortening the installation time.

[0025] The upper surface of the probe holder 11 is provided with a cable sheath 7, in which both the positive main cable 5 and the negative main cable 6 are contained. The cable sheath 7 can wrap around the positive main cable 5 and the negative main cable 6 to prevent the cables from being pulled, squeezed, or contaminated with oil or dust, and to prevent signal interruption or short circuit caused by cable damage.

[0026] The upper end face of the second positioning sleeve 15 is bonded to the lower end face of the first positioning sleeve 14 with adhesive. The adhesive bonding can achieve a seamless fit between the second positioning sleeve 15 and the first positioning sleeve 14, without any assembly gaps caused by mechanical connections (such as threads or snaps).

[0027] Furthermore, it should be noted that the names of the various parts of the specific embodiments described in this specification may differ. All equivalent or simple variations made to the structure, features, and principles described in this utility model patent concept are included within the protection scope of this utility model patent. Those skilled in the art to which this utility model pertains may make various modifications or additions to the described specific embodiments or use similar methods to replace them, as long as they do not deviate from the structure of this utility model or exceed the scope defined in these claims, they should all fall within the protection scope of this utility model.

Claims

1. A combi-array probe for socket head cap screw inspection comprising a probe body characterised in that: The probe body comprises a probe base, a ring-shaped probe and a surface probe, the probe base is provided with a containing cavity, a first positioning sleeve penetrating up and down is arranged in the center of the containing cavity, the ring-shaped probe is installed in the containing cavity and between the inner wall of the containing cavity and the outer wall of the first positioning sleeve, the lower end surface of the ring-shaped probe is flush with the lower end surface of the probe base and can contact with the annular plane of the hexagonal bolt; the lower end surface of the first positioning sleeve is provided with a second positioning sleeve matched in size with the hexagonal recess of the hexagonal bolt, the second positioning sleeve penetrates up and down and communicates with the first positioning sleeve, the surface probe is installed in the second positioning sleeve, and the lower end surface of the surface probe is flush with the lower end surface of the second positioning sleeve.

2. The combi-array probe for hexagon socket bolt inspection according to claim 1, characterized in that: The ring-shaped probe comprises a plurality of fan-shaped elements arranged in a ring-shaped array along the circumference of the first positioning sleeve, and the inner side of each fan-shaped element is an arc-shaped side; the surface probe comprises a plurality of rectangular elements arranged in a matrix form.

3. The combi-array probe for hex head bolt inspection as claimed in claim 2 wherein: The fan-shaped elements and the rectangular elements are all formed by a back material layer, a negative electrode layer, a wafer layer, a positive electrode layer and a matching layer stacked from top to bottom.

4. The combi-array probe for hexagon socket head cap screw detection as claimed in claim 3 wherein: The positive electrode layer of each fan-shaped element and each rectangular element is welded with a positive cable, the negative electrode layer of each fan-shaped element and each rectangular element is welded with a negative cable, the positive cable and the negative cable of each fan-shaped element are in the containing cavity, the positive cable and the negative cable of each rectangular element are sequentially in the second positioning sleeve and the first positioning sleeve from bottom to top, the upper end of each positive cable is exposed above the probe base and gathered into a positive bus cable, and the upper end of each negative cable is exposed above the probe base and gathered into a negative bus cable.

5. The combi-array probe for hex head bolt inspection as claimed in claim 4 wherein: The upper end surface of the probe base is provided with a wire protection sleeve, and the positive bus cable and the negative bus cable are in the wire protection sleeve.

6. The combi-array probe for hexagon socket head cap screw detection as claimed in claim 1 wherein: The upper end surface of the second positioning sleeve is bonded with the lower end surface of the first positioning sleeve through an adhesive.

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