Variable-temperature clamp of polymer dielectric film withstand voltage tester
By designing a variable-temperature fixture for a polymer dielectric membrane withstand voltage tester, the problems of limited temperature testing range and poor operational consistency in existing technologies have been solved, achieving precise temperature control and efficient test results while reducing costs.
Patent Information
- Application Number
- CN202423194005.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2034-12-24
AI Technical Summary
Existing withstand voltage test fixtures cannot test the breakdown field strength of polymer dielectric films at different temperatures, resulting in limited testing range, low efficiency, insufficient environmental simulation, poor operational consistency, and high cost.
A variable-temperature fixture for a polymer dielectric film withstand voltage tester was designed, equipped with a heating unit and a temperature sensing and control unit to achieve precise temperature control, and to ensure the consistency of electrode placement through precise holes on the insulating cover.
It expands the temperature testing range, improves the accuracy and consistency of test results, reduces costs, and increases testing efficiency.
Smart Images

Figure CN223742532U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of polymer dielectric film testing for thin film capacitors, specifically to a variable temperature fixture for a polymer dielectric film withstand voltage tester. Background Technology
[0002] Thin-film capacitors play a crucial role in flexible DC transmission systems, rail transportation, wind power generation, photovoltaics, and new energy vehicles due to their excellent self-healing properties and high power density. With the rapid development of the power electronics industry, the operating environment of capacitors has become increasingly harsh, especially high-temperature environments, which places higher demands on capacitor performance. As the core material of thin-film capacitors, the high-temperature performance of the polymer dielectric film directly affects the overall performance of the capacitor. Under high-temperature conditions, the breakdown field strength of the polymer dielectric film changes, requiring capacitors to undergo performance testing over a wider temperature range.
[0003] Existing withstand voltage test fixtures are acrylic frame structures without heating or monitoring units, and can only test the breakdown field strength at room temperature, failing to meet testing requirements at different temperatures. Film capacitor life tests are typically conducted at 85°C, which is insufficient for more severe operating conditions. This limitation prevents a comprehensive evaluation of capacitor performance under extreme temperatures. Traditional life testing methods adjust the aging factor by applying temperature and voltage to test the lifespan of film capacitors.
[0004] Currently, these methods typically require pre-made capacitors, leading to high costs, low efficiency, and significant losses during testing. Environmental factors such as temperature, humidity, and chemical environments significantly affect the performance of thin-film capacitors. Existing testing methods cannot effectively simulate these environmental conditions, thus affecting the accuracy and reliability of test results. In testing practice, the same dielectric film being tested by different people results in large errors. The problem lies in the fact that different people may tilt the test electrodes at different angles when placing them on the film. Since the thickness of the sample being tested is only on the micrometer level, even slight bumps can cause significant errors in the test results and cause considerable damage to the polymer dielectric film. Summary of the Invention
[0005] To address the limitations of existing technologies, such as limited temperature testing range, low testing efficiency, insufficient environmental simulation, inconsistent operation, and inaccurate temperature control, this invention provides a variable-temperature fixture for a polymer dielectric membrane withstand voltage tester. This fixture tests the breakdown field strength at different temperatures, improving testing efficiency and reducing cost.
[0006] The technical solution is as follows: A variable temperature clamp for a polymer dielectric membrane withstand voltage tester, comprising an insulating shell, wherein the shell is provided with an insulating cover, characterized in that a heating unit and a temperature sensing and control unit are provided inside the shell and are electrically connected to each other; the insulating shell is provided with a vent valve; and the insulating cover has precise holes;
[0007] The heating unit is mounted on four identical metal heating plates;
[0008] The temperature sensing and control unit is linked with the heating unit to precisely control the temperature during the testing process.
[0009] The electrode plate disposed on the outer shell is of metal structure and serves as one electrode of the polymer dielectric film withstand voltage tester.
[0010] The insulating cover has a folding hole.
[0011] The beneficial effects of this utility model are as follows:
[0012] By incorporating heating and temperature sensing units, testing environments under varying temperature conditions can be simulated, thereby expanding the temperature testing range and ensuring capacitor performance testing across a wider temperature spectrum. Precise temperature control and monitoring ensure the accuracy of testing conditions, thus improving the reliability of test results. Intermittent heating tests from low to high temperatures are permitted, allowing for timely detection and correction of missed tests, avoiding repeated testing, and improving experimental efficiency.
[0013] The electrode plate located on the outer casing serves as one electrode in the polymer dielectric film withstand voltage tester, allowing direct testing of the polymer dielectric film without the need for a pre-made capacitor, thus reducing costs and improving testing efficiency. Simultaneously, intermittent heating testing and rapid oil replacement save insulating oil cooling time, further enhancing testing efficiency.
[0014] The precise hole design on the insulating cover limits the angle at which the electrodes are placed on the sample under test, reducing operator variability and further improving the consistency and accuracy of test results. Attached Figure Description
[0015] Figure 1 This is a schematic diagram of the overall design of this utility model.
[0016] Figure 2 This is a schematic diagram of the internal structure of this utility model.
[0017] Figure 3 This is the front view of the present utility model.
[0018] Figure 4 This is a top view of the present invention.
[0019] Figure 5This is a control block diagram of the heating unit and temperature sensor of this utility model. Detailed Implementation
[0020] like Figure 1 and Figure 2 As shown, a variable-temperature fixture for a polymer dielectric membrane withstand voltage tester includes an insulating shell 1 forming the main body of the fixture. The interior of the shell is perforated and polished to create a space 2 for a temperature sensor. An insulating oil drain switch 3 is mounted on the insulating shell 1 to drain insulating oil during or after the test. A heating unit 4, typically four identical metal heating plates, is installed inside the insulating shell 1 and is linked to a temperature sensor 2 via a controller to heat the internal insulating oil, achieving precise control of the test environment temperature. An insulating epoxy board cover 5 covers the opening of the insulating shell 1 and features 25 precisely arranged holes to ensure accurate insertion of the test electrodes, guaranteeing test consistency and repeatability.
[0021] Its working principle is as follows: First, insulating oil is injected into the insulating shell 1, and the sample to be tested is placed in the insulating oil. The insulating oil is heated by the heating unit 4. When the temperature sensor 2 detects that the temperature has reached the pre-test temperature, the heating unit 4 stops heating. After reaching the required temperature, the sample is subjected to a withstand voltage test through the holes in the epoxy board 5 of the insulating cover, and the breakdown field strength data at different temperatures are recorded. This variable temperature fixture can be used to perform withstand voltage tests on polymer dielectric films at different temperatures.
[0022] Normal testing involves intermittent heating from low to high temperatures to determine the test results. If any missed tests are found, the high-temperature insulating oil can be drained by opening the insulating oil drain switch, and new insulating oil at room temperature can be injected to re-heat and test. This saves time during the insulating oil cooling process.
[0023] This invention relates to a variable-temperature fixture for a polymer dielectric membrane withstand voltage tester. This fixture allows for testing the breakdown field strength at different temperatures, and pre-drilled holes ensure consistent operation.
Claims
1. A temperature-variable clamp for a polymer dielectric film pressure resistance tester, comprising an insulating housing, the housing being provided with an insulating cover, characterized in that, The shell is provided with a heating unit and a temperature sensing unit, and the two units are electrically connected; the insulating shell is provided with a relief valve; the insulating cover is provided with a precise hole.
2. The temperature-variable clamp for a polymer dielectric film voltage withstanding tester according to claim 1, wherein: The heating unit is arranged on four identical metal heating plates.
3. The temperature-variable clamp for a polymer dielectric film voltage withstanding tester according to claim 1, wherein: The temperature sensing unit is linked with the heating unit to accurately control the temperature in the test process.
4. The temperature-variable clamp for a polymer dielectric film voltage withstanding tester according to claim 1, wherein: The electrode plate arranged on the shell is a metal structure, which serves as an electrode of the polymer dielectric film voltage withstand tester.
5. The temperature-variable clamp for a polymer dielectric film voltage withstanding tester according to claim 1, wherein: The insulating cover is provided with a folding hole.