Special-shaped elastic sheet and chip testing device
By using irregularly shaped springs in the chip testing device, the problem of low testing accuracy in traditional chip testing devices is solved, achieving uniform pressure distribution and stable connection, thus improving testing accuracy.
Patent Information
- Application Number
- CN202520236062.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-13
- Publication Date
- 2025-12-30
- Estimated Expiration
- 2035-02-13
AI Technical Summary
Traditional chip testing equipment suffers from low testing accuracy when contacting the chip under test, which may lead to unstable contact or damage to the chip due to excessive pressure.
An irregularly shaped spring is used, including the spring body and the first elastic component. The design of the elastic component ensures uniform pressure distribution and stable contact, thus avoiding chip damage.
It improves the testing accuracy of chip testing equipment, prevents chip surface scratches and pin bending, and ensures the reliability and stability of electrical connections.
Smart Images
Figure CN223742553U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to the technical fields, especially a kind of special-shaped elastic sheet and chip testing device. BACKGROUND
[0002] Chip testing device includes test table and electric tester, wherein test table is used to place chip to be tested, and electric tester needs to contact the chip to be tested to carry out test work to the chip to be tested.But, in traditional chip testing device, there is low test accuracy. SUMMARY
[0003] The main purpose of the utility model is to provide a kind of special-shaped elastic sheet and chip testing device, to improve the test accuracy of chip testing device.
[0004] Therefore, the special-shaped elastic sheet provided by the utility model is used for chip testing device, the chip testing device includes test table and electric tester, and the test table is used to place chip to be tested;The special-shaped elastic sheet includes:
[0005] Elastic sheet main body, the elastic sheet main body has installation part, and the elastic sheet main body is installed in the electric tester by the installation part;
[0006] The elastic sheet main body has oppositely arranged first side and second side, the first side of the elastic sheet main body is arranged towards the test table, and the second side of the elastic sheet main body is arranged away from the test table;
[0007] First elastic component, the first elastic component is arranged on the first side of the elastic sheet main body, and the electric tester exerts pressure on the chip to be tested to fix the chip to be tested by the first elastic component.
[0008] In an embodiment, the installation part includes at least first mounting hole and second mounting hole, and the first mounting hole and the second mounting hole are arranged at two ends of the elastic sheet main body respectively, and the elastic sheet main body is installed in the electric tester by the first mounting hole and the second mounting hole.
[0009] In an embodiment, the first elastic component includes at least two elastic units, and the elastic unit has abutting end and connecting end;
[0010] The abutting end is used to contact the chip to be tested when the electric tester is close to the test table;
[0011] The connecting end is used to connect the elastic sheet main body, and / or the connecting end is integrally arranged with the elastic sheet main body.
[0012] In an embodiment, the elastic unit includes:
[0013] A lateral connecting piece having oppositely arranged first and second ends, the first end of the lateral connecting piece being used for the connecting end, the lateral connecting piece being arranged to extend towards the length direction of the elastic sheet body, and the lateral connecting piece being arranged to be spaced apart from the elastic sheet body and form a movable space between the lateral connecting piece and the elastic sheet body;
[0014] A wave elastic piece having oppositely arranged first and second ends, the first end of the wave elastic piece being connected to the second end of the lateral connecting piece, and the second end of the wave elastic piece being used for the abutting end;
[0015] When the pressure applied by the elastic unit to the chip to be tested changes, the lateral connecting piece stores and releases potential energy by moving in the movable space, and the wave elastic piece stores and releases potential energy by moving along the length direction.
[0016] In an embodiment, the first ends of two lateral connecting pieces of the elastic unit are used for the connecting end, and the first ends of the two lateral connecting pieces are respectively connected to the two ends of the elastic sheet body.
[0017] The second ends of the two lateral connecting pieces are arranged to extend towards each other and are spaced apart from each other by a first distance.
[0018] In an embodiment, the special-shaped elastic sheet further comprises an abutting piece arranged at the second ends of the two wave elastic pieces, and the first elastic assembly is in contact with the chip to be tested through the abutting piece.
[0019] In an embodiment, the side of the abutting piece away from the first elastic assembly is further arranged to be spaced apart by a plurality of sawtooth-shaped contact portions.
[0020] In an embodiment, the special-shaped elastic sheet further comprises a second elastic assembly arranged at the side of the elastic sheet body away from the first elastic assembly.
[0021] The utility model further provides a chip testing device, the chip testing device includes:
[0022] A test table for placing a chip to be tested;
[0023] An electrical tester;
[0024] The special-shaped elastic sheet as described in any one of the above is arranged at the electrical tester.
[0025] In an embodiment, the chip testing device comprises a plurality of special-shaped elastic sheets, and the plurality of special-shaped elastic sheets are arranged to be stacked at the electrical tester.
[0026] The special-shaped spring piece aims to improve the test accuracy of the chip testing device, and the special-shaped spring piece comprises a spring piece main body and a first elastic component. BRIEF DESCRIPTION OF DRAWINGS
[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor on the basis of the drawings shown.
[0028] Figure 1 The structure schematic diagram of the first embodiment of the special-shaped spring piece provided by the present application is shown in the figure.
[0029] Figure 2 The structure schematic diagram of the second embodiment of the special-shaped spring piece provided by the present application is shown in the figure.
[0030] Figure 3 The structure schematic diagram of the third embodiment of the special-shaped spring piece provided by the present application is shown in the figure.
[0031] EXPLANATION OF DRAWINGS:
[0032] 10, special-shaped spring piece; 100, spring piece main body; 110, mounting portion; 111, first mounting hole; 112, second mounting hole; 200, first elastic component; 210, elastic unit; 211, abutting end; 212, contact end; 213, transverse connecting piece; 214, wave elastic piece; 300, abutting piece; 400, second elastic component; 410, elastic arm.
[0033] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments and the drawings. DETAILED DESCRIPTION
[0034] The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some embodiments of the present application, not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
[0035] It should be noted that if the embodiment of the utility model has directionality indication (such as up, down, left, right, front, back, etc.), the directionality indication is only used to explain the relative position relationship, movement condition, etc. between components in a certain posture, if the certain posture changes, then the directionality indication also changes accordingly.
[0036] In addition, if the embodiment of the utility model has the description of "first", "second" and the like, the description of "first", "second" and the like is only for the purpose of description, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of indicated technical features. Therefore, the features limited by "first", "second" can be explicitly or implicitly included at least one feature. In addition, "and / or" or "and / or" appears throughout the text, which means including three parallel schemes, for example, "A and / or B" includes A scheme, or B scheme, or A and B scheme. In addition, the technical solutions of each embodiment can be combined with each other, but it must be based on the realization of ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, also not within the protection scope required by the utility model.
[0037] The chip testing device comprises a testing table and an electrical tester, the testing table is used for placing the chip to be tested and ensuring stable fixation, so as to carry out accurate testing, and the electrical tester needs to establish reliable electrical connection with the chip to be tested, so as to complete various testing work of the chip performance. However, in the traditional chip testing device, there are some design limitations, which lead to the difficulty in achieving the best level of testing accuracy.
[0038] Specifically, in the process of realizing contact with the chip to be tested, the existing chip testing device is difficult to grasp the degree of contact, which may appear two situations, one is too short contact, which may lead to inaccurate test results or poor repeatability due to unstable or insufficient contact, the other is too long contact, if too much pressure is applied to ensure good contact, the chip surface or pin may be damaged, affecting the integrity and functionality of the chip. Therefore, in the traditional chip testing device, there is a situation of low testing accuracy.
[0039] In order to solve the above problems, the utility model provides a special-shaped elastic sheet for the electrical tester to contact with the chip to be tested.
[0040] As Figure 1As shown, the special-shaped spring 10 comprises a spring body 100 and a first elastic assembly 200. The spring body 100 has a mounting portion 110, and the spring body 100 is mounted on the electrical tester through the mounting portion 110. The spring body 100 has a first side and a second side arranged oppositely, the first side of the spring body 100 faces the test table, and the second side of the spring body 100 faces away from the test table. The first elastic assembly 200 is arranged on the first side of the spring body 100, and the electrical tester applies pressure to the chip to be tested through the first elastic assembly 200 to fix the chip to be tested.
[0041] In the embodiment, the spring body 100 has a mounting portion 110, and the spring body 100 can be stably mounted on the electrical tester through the mounting portion 110. The spring body 100 is designed to have a first side and a second side arranged oppositely, wherein the first side faces the test table, and the second side faces away from the test table.
[0042] Optionally, the mounting portion 110 can be a screw fixing structure, a buckle type connector, or a fixed rod fixing structure. It can be understood that the structure of the mounting portion 110 is not limited here, and can be determined according to the actual application scenario.
[0043] Optionally, the spring body 100 can be a single-layer structure or a composite structure, and the spring body 100 can be made of a metal conductive material. It can be understood that the structure and specific material of the spring body 100 are not limited here, and can be determined according to the actual application scenario.
[0044] Optionally, the shape of the spring body 100 can be one of a circle, an ellipse, a square, a triangle, etc. It can be understood that the shape of the spring body 100 is not limited here, and can be determined according to the actual application scenario.
[0045] In the embodiment, the first elastic assembly 200 is located on the first side of the spring body 100, i.e., the side facing the test table. When the electrical tester is in operation, the first elastic assembly 200 applies appropriate pressure to the chip to be tested placed on the test table. It can be understood that the first elastic assembly 200 can adjust the pressure applied to the chip to be tested as needed. The first elastic assembly 200 can buffer and distribute the pressure from the spring body 100 through its elasticity and deformation ability, thereby avoiding damage to the chip due to excessive pressure. Therefore, the first elastic assembly 200 can effectively prevent problems such as scratching of the chip surface and bending of the pins caused by improper contact without loss of electrical performance.
[0046] Optionally, materials with good elasticity and conductivity, such as phosphor bronze and beryllium copper, are usually selected.
[0047] In an embodiment, as shown in Figure 1 The mounting portion 110 includes at least two mounting holes, including a first mounting hole 111 and a second mounting hole 112, located at both ends of the spring body 100. The dual-hole design ensures that the spring body 100 can be firmly fixed on the tester, thereby ensuring stable contact between the spring and the chip under test during testing. By passing screws, pins or other appropriate fasteners through these mounting holes and cooperating with the corresponding structures on the tester, precise positioning and firm installation of the spring body 100 can be achieved. In this way, not only mechanical stability is provided, but also the position of the spring can be adjusted as needed to accommodate different sizes or types of chips.
[0048] It can be understood that the mounting portion 110 of the spring body 100 includes at least two mounting holes, including a first mounting hole 111 and a second mounting hole 112, located at both ends of the spring body 100. The dual-hole design ensures that the spring body 100 can be firmly fixed on the tester, thereby ensuring stable contact between the spring and the chip under test during testing. By passing screws, pins or other appropriate fasteners through these mounting holes and cooperating with the corresponding structures on the tester, precise positioning and firm installation of the spring body 100 can be achieved. In this way, not only mechanical stability is provided, but also the position of the spring can be adjusted as needed to accommodate different sizes or types of chips.
[0049] In addition, the two-end mounting method helps to distribute the force applied to the spring body 100, preventing deformation or damage due to excessive force on a single point. This further enhances the reliability and durability of the entire system. At the same time, this design also brings convenience for subsequent maintenance and replacement of the spring, as the spring body 100 can be easily removed or reinstalled by simply loosening the fasteners.
[0050] In an embodiment, as shown in Figure 1 The first elastic assembly 200 includes at least two elastic units 210, each having a contact end 211 and a connection end. The contact end 211 is used to contact the chip under test when the tester approaches the test bench, and the connection end is used to connect the spring body 100. It can be understood that the first elastic assembly 200 includes at least two elastic units 210, and the multi-unit structure allows each elastic unit 210 to independently respond to minor irregularities or differences on the surface of the chip under test, thereby ensuring more uniform pressure distribution and better contact quality.
[0051] It can be understood that the contact end 211 is the part that directly contacts the chip under test. Optionally, when the tester approaches the test bench, the contact end 211 first contacts the chip surface and deforms appropriately to adapt to the shape of the chip surface under test.
[0052] It can be understood that the connecting end is responsible for connecting the elastic unit 210 with the spring body 100, which can ensure that the elastic unit 210 can be stably fixed on the spring body 100, while allowing a certain range of movement, so that the elastic unit 210 can freely respond to external pressure changes.
[0053] In this embodiment, the first elastic assembly 200 specifically includes two elastic units 210, which respectively apply pressure to the chip from different positions, so that the contact is more uniform, and the risk of poor contact or damage due to uneven force on a single point is reduced.
[0054] Optionally, the connecting end is integrally arranged with the spring body 100, thus reducing the number of separate components and assembly steps, reducing production costs and improving manufacturing efficiency, while also eliminating potential weaknesses caused by different materials or connection points, enhancing the firmness and reliability of the overall structure.
[0055] In an embodiment, as shown in Figure 1 The elastic unit 210 includes a transverse connecting piece 213 and a wave elastic piece 214. The transverse connecting piece 213 has oppositely arranged first and second ends, the first end of the transverse connecting piece 213 is used for the connecting end, the transverse connecting piece 213 is arranged to extend in the length direction of the spring body 100, and the transverse connecting piece 213 is spaced apart from the spring body 100 and forms a movement space therebetween. The wave elastic piece 214 has oppositely arranged first and second ends, the first end of the wave elastic piece 214 is connected to the second end of the transverse connecting piece 213, and the second end of the wave elastic piece 214 is used for the abutting end 211; when the pressure applied by the elastic unit 210 to the chip under test changes, the transverse connecting piece 213 stores and releases potential energy by moving in the movement space, and the wave elastic piece 214 stores and releases potential energy by moving in the length direction.
[0056] It can be understood that the transverse connecting piece 213 has oppositely arranged first and second ends, the first end thereof is connected to the spring body 100 as a connecting end and is arranged to extend in the length direction of the spring body 100. It is worth noting that the transverse connecting piece 213 maintains a certain distance from the spring body 100, forming a movement space that allows the transverse connecting piece 213 to move freely within the movement space when subjected to external pressure, thereby effectively storing and releasing potential energy and ensuring stability and flexibility during contact.
[0057] It can be understood that the wave elastic member 214 is a piece of elastic material with a wave shape, the first end of the wave elastic member 214 is connected to the second end of the transverse connecting member 213, and the second end directly contacts the to-be-tested chip as the abutting end 211. When the electrical tester approaches the test table and exerts pressure on the chip, the wave elastic member 214 will deform along its length direction, and the contact force is adjusted by storing and releasing potential energy.
[0058] The double mechanisms work together to enable the elastic unit 210 to adapt to the changes of different chip surfaces, provide uniform and controllable pressure distribution, and at the same time avoid damage to the chip caused by excessive pressure.
[0059] In an embodiment, as shown in Figure 1 The first ends of the two transverse connecting members 213 are used as the connecting ends, and the first ends of the two transverse connecting members 213 are respectively connected to the two ends of the spring body 100. The second ends of the two transverse connecting members 213 extend in directions towards each other, and the second ends of the two transverse connecting members 213 are spaced apart from each other by a first distance.
[0060] In the embodiment, the transverse connecting members 213 of the two elastic units 210 are specifically a symmetrical and coordinated structure. The first ends of each transverse connecting member 213 serve as the connecting ends and are respectively and firmly connected to the two ends of the spring body 100, ensuring the stable installation of the entire elastic assembly on the electrical tester, so that the elastic unit 210 can maintain an accurate position and posture during the test process. It is worth noting that the second ends of the two transverse connecting members 213 extend in directions towards each other and are spaced apart from each other by a first distance. This layout not only ensures that each elastic unit 210 has sufficient space to independently respond to the changes of the chip surface, but also avoids mutual interference through the spacing between them. When the electrical tester approaches the test table and exerts pressure on the to-be-tested chip, the two transverse connecting members 213 can freely move in their respective active spaces, store and release potential energy, to adapt to the slight irregularities of the chip surface. At the same time, the wave elastic member 214 can deform along its length direction, further optimizing the distribution of the contact force.
[0061] In an embodiment, as shown in Figure 3 The special-shaped spring 10 further includes an abutting member 300, the abutting member 300 is arranged at the second ends of the two wave elastic members 214, and the first elastic assembly 200 contacts the to-be-tested chip through the abutting member 300. In the embodiment, the side of the abutting member 300 away from the first elastic assembly 200 is further spaced apart and provided with a plurality of sawtooth-shaped contact portions.
[0062] It can be understood that the abutting piece 300 can be used to balance the special-shaped spring 10, which ensures that the cooperation between the two elastic units 210 is more efficient and stable. Specifically, the two elastic units 210 can be balanced in mechanics when pressure is applied, avoiding the risk of uneven contact or chip damage caused by excessive force on one side. The presence of the abutting piece 300 ensures that each elastic unit 210 can independently and consistently respond to changes in the chip surface while maintaining the symmetry and stability of the overall structure. In addition, the side of the abutting piece 300 opposite the first elastic assembly 200 is spaced apart and provided with a plurality of sawtooth contact portions, and the sawtooth structure increases the contact effect and reduces the contact resistance and prevents sliding or displacement.
[0063] In an embodiment, the special-shaped spring 10 further comprises a second elastic assembly 400 disposed on the side of the spring body 100 opposite the first elastic assembly 200. Optionally, as shown in Figure 1 and Figure 2 , the second elastic assembly 400 can include a plurality of elastic arms 410 that combine to form the second elastic assembly 400. Optionally, the number of second elastic assemblies 400 can be one or more. It can be understood that by arranging the first elastic assembly 200 and the second elastic assembly 400 on both sides of the spring body 100, the rigidity and anti-vibration performance of the overall structure can be significantly enhanced. Especially in the case of high-frequency vibration or external impact, the second elastic assembly 400 can effectively absorb and disperse these energies, reducing the impact on the test process. This not only improves the reliability of the system, but also prolongs the service life of the equipment.
[0064] In an embodiment, as shown in Figure 3 , the spring body 100 is provided with a recess on the side close to the first elastic assembly 400, and the transverse connecting pieces 213 of the two first elastic assemblies 400 are arranged to extend into the recess to enhance the elastic ability and recovery ability after compression.
[0065] The utility model also provides a chip testing device, the chip testing device includes test electricity meter and special-shaped spring 10. It needs to be noted that the specific structure of the special-shaped spring 10 refers to the above-mentioned embodiment, since the present chip testing device adopts all the technical solutions of the above-mentioned embodiments, it at least has all the beneficial effects brought by the technical solutions of the above-mentioned embodiments, which will not be repeated here.
[0066] In the embodiment, the special-shaped spring 10 is used in a chip testing device to ensure high-precision, stable and reliable contact between the electrical tester and the chip to be tested. First, the special-shaped spring 10 is firmly fixed to the electrical tester through the mounting portions 110 at both ends to ensure accurate positioning. Then, the chip to be tested is placed on the test table, and the electrical tester is adjusted so that the first elastic assembly 200 of the special-shaped spring 10 is aligned with the test area of the chip. As the electrical tester gradually approaches, the wave-shaped elastic members 214 and the transverse connecting members 213 in the first elastic assembly 200 begin to deform, and uniform pressure is applied to the chip through the abutting members 300, while the second elastic assembly 400 provides counter support to maintain overall balance. During the test, the special-shaped spring 10 can dynamically adjust the pressure distribution according to the changes in the surface of the chip to ensure stable electrical connection. After the test is completed, the electrical tester is slowly moved away, and the elastic assembly returns to its original state, releasing the stored potential energy. Thus, the chip testing device using the special-shaped spring 10 has the characteristic of high test accuracy.
[0067] In an embodiment, the chip testing device includes a plurality of special-shaped springs 10 stacked on the electrical tester. It can be understood that the stacked special-shaped springs 10 collectively share the pressure from the electrical tester, reducing the load on individual springs and reducing the likelihood of failure due to excessive deformation or fatigue.
[0068] The above description is only an exemplary embodiment of the present application, and does not limit the patent scope of the present application. Any equivalent structural transformation or direct / indirect application in other related technical fields within the technical concept of the present application is included in the patent protection scope of the present application.
Claims
1. A shaped charge, characterized by, The special-shaped spring sheet is used in a chip testing device, the chip testing device comprises a testing table and an electrical tester, the testing table is used for placing a chip to be tested; the special-shaped spring sheet comprises: a spring sheet body, the spring sheet body has a mounting portion, the spring sheet body is mounted on the electrical tester through the mounting portion; the spring sheet body has a first side and a second side arranged oppositely, the first side of the spring sheet body is arranged towards the testing table, and the second side of the spring sheet body is arranged away from the testing table; a first elastic assembly, the first elastic assembly is arranged on the first side of the spring sheet body, and the electrical tester applies pressure to the chip to be tested through the first elastic assembly to fix the chip to be tested.
2. The irregularly shaped spring blade of claim 1 wherein, the mounting portion comprises at least a first mounting hole and a second mounting hole, the first mounting hole and the second mounting hole are arranged at two ends of the spring sheet body respectively, and the spring sheet body is mounted on the electrical tester through the first mounting hole and the second mounting hole.
3. The profiled bullet of claim 1 wherein, the first elastic assembly comprises at least two elastic units, the elastic unit has a contact end and a connecting end; the contact end is used for contacting the chip to be tested when the electrical tester is close to the testing table; the connecting end is used for connecting the spring sheet body, and / or the connecting end is arranged integrally with the spring sheet body.
4. The profiled bullet of claim 3, wherein the first and second portions are substantially cylindrical. the elastic unit comprises: a transverse connecting piece, the transverse connecting piece has a first end and a second end arranged oppositely, the first end of the transverse connecting piece is used for the connecting end, the transverse connecting piece is arranged extending towards the length direction of the spring sheet body, and the transverse connecting piece is arranged spaced apart from the spring sheet body, and an activity space is formed between the transverse connecting piece and the spring sheet body; a wave elastic piece, the wave elastic piece has a first end and a second end arranged oppositely, the first end of the wave elastic piece is connected with the second end of the transverse connecting piece, and the second end of the wave elastic piece is used for the contact end; when the pressure applied by the elastic unit to the chip to be tested changes, the transverse connecting piece stores and releases potential energy by being active in the activity space, and the wave elastic piece stores and releases potential energy by being active along the length direction.
5. The profiled bullet of claim 4, wherein the first and second portions are substantially cylindrical. the first ends of the transverse connecting pieces of the two elastic units are used for the connecting end, and the first ends of the two transverse connecting pieces are connected with the two ends of the spring sheet body respectively; the second ends of the two transverse connecting pieces are arranged extending towards each other, and the second ends of the two transverse connecting pieces are spaced apart from each other by a first distance.
6. The profiled bullet of claim 4 wherein, the special-shaped spring sheet further comprises a contact piece, the contact piece is arranged at the second ends of the two wave elastic pieces, and the first elastic assembly contacts the chip to be tested through the contact piece.
7. The profiled bullet of claim 4 wherein, a plurality of sawtooth contact portions are further arranged spaced apart on the side of the contact piece away from the first elastic assembly.
8. The shaped charge liner of any of claims 1-7, wherein, the special-shaped spring sheet further comprises a second elastic assembly, and the second elastic assembly is arranged on the side of the spring sheet body away from the first elastic assembly.
9. A chip testing apparatus characterized by comprising: the chip testing device comprises: a testing table, the testing table is used for placing a chip to be tested; an electrical tester; the special-shaped spring sheet according to any one of claims 1-8, and the special-shaped spring sheet is arranged on the electrical tester.
10. The chip testing apparatus according to Claim 9, wherein The chip testing device comprises a plurality of the shaped elastic sheets, and the plurality of the shaped elastic sheets are stacked on the electrical tester.