Test device for component carrier

Abstract

The embodiment of the utility model provides test equipment (200) for a component bearing piece. The test equipment (200) comprises a plurality of test boards (300) and a plurality of auxiliary boards (100) for testing, wherein the plurality of test boards (300) and the plurality of auxiliary boards (100) for testing are arranged in a superposed manner; wherein the auxiliary board (100) for testing is configured in such a manner that the auxiliary board (100) for testing does not form a part of a test path during the test of the component bearing member by the test device (200); and wherein the auxiliary board (100) for testing and the test board (300) have the same weight and size.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of testing of semiconductor devices, and in particular to a test apparatus for a component carrier. BACKGROUND

[0002] This section provides background information to the present application which is not necessarily prior art.

[0003] In the background of increasing product functionality of component carriers, such as printed circuit boards, equipped with one or more electronic components and the ever-increasing miniaturization of such electronic components and the ever-increasing number of electronic components to be mounted on the component carriers, ever more powerful array-like components or packages with several electronic components are being employed. Such array-like components or packages have a plurality of contacts or connections between which the spacing is becoming ever smaller. Such component carriers should have good electrical properties in order to be able to operate even under adverse conditions.

[0004] During the manufacture and / or use of a component carrier, it is necessary to test the electrical properties of the component carrier. It is desirable that a test apparatus for a component carrier is able to perform the test of the electrical properties of the component carrier electrically reliably and cost-effectively. SUMMARY

[0005] This section provides a general summary of the present application and not a comprehensive disclosure of all of the possible aspects or features of the present application.

[0006] The present application exemplary embodiments provide a test apparatus for a component carrier, the test apparatus comprising: a plurality of test boards and a plurality of test auxiliary boards, the plurality of test boards and the plurality of test auxiliary boards being arranged in a stacked form; wherein the test auxiliary boards are configured to not form part of a test path during testing of the component carrier by the test apparatus; and wherein the test auxiliary boards and the test boards have the same weight and size.

[0007] In the context of the present application, the term "test aid board" can particularly denote a device or structure that can be used to enhance and support the testing process of a component carrier. The test aid board can provide stability and accuracy to the testing environment by facilitating stable contact (e.g., relative position remains unchanged or substantially unchanged) between the test board (particularly, electrical contacts on the test board for contacting the component carrier under test, such as test probes) and the component carrier under test (particularly, electrically conductive structures on the surface of the component carrier, such as metal pads, traces) during the testing process. In other words, the test aid board does not really participate in the testing of the electrical performance of the component carrier. The test aid board does not form part of the testing circuit, such that the electrical current flowing through the test board and the component carrier does not flow through the test aid board. The test aid board "indirectly" enhances the accuracy and reliability of the testing by assisting the test board that really performs the testing to accurately align with the object under test and / or other related components (e.g., equipment frame, etc.).

[0008] In the context of the present application, the term "test board" can particularly denote a device or structure that is specifically designed for evaluating the electrical performance of a component carrier, such as a printed circuit board. The test board is typically equipped with interface components, such as test probes, to enable contact testing of the electrical circuit on the component carrier. For example, the test probes can physically interface with the contacts on the component carrier, such as a printed circuit board, to enable signal transmission and data acquisition in an automated manner, thereby enabling fast and accurate detection of, for example, pass, open, short circuit conditions and other electrical characteristics of the circuit. Such test boards can be applied in production lines and quality control environments to ensure that the products meet the design specifications.

[0009] In the context of the present application, the term "component carrier" can particularly denote any support structure that can accommodate one or more components thereon and / or therein to provide mechanical support and / or electrical connection and / or optical connection and / or thermal connection. In other words, the component carrier can be configured as a mechanical carrier and / or an electronic carrier for the components.

[0010] Exemplary embodiments provide a testing apparatus for a component carrier. The testing apparatus comprises a plurality of test boards and a plurality of test aid boards. The test aid boards are preferably of the same weight and size as the test boards. The plurality of test boards and the plurality of test aid boards are arranged in a stacked form in the testing apparatus, particularly within a receiving space of the testing apparatus, such as a test cavity or a test chamber. The test aid boards do not form part of the testing circuit during testing, but are used to physically facilitate accurate alignment of the test boards relative to surrounding apparatus components, such as an equipment frame, and the object under test.

[0011] By arranging the plurality of test boards and the plurality of test auxiliary boards in the receiving space of the test apparatus in a manner of being stacked on each other, and by making any of the plurality of test auxiliary boards not form a part of the test path, the stable positioning of the test boards in the receiving space and the prevention of the relative displacement between the electrical interfaces on the test boards, such as test probes, and the electrical interfaces on the component carriers to be tested during the test can be facilitated by means of the plurality of test auxiliary boards. This is beneficial for obtaining accurate test data to reduce measurement errors due to the instability or positional deviation of the test boards, and is also beneficial for shortening the debugging time of the test apparatus before the test. In addition, the test auxiliary boards having the same weight and size as the test boards can prevent the test apparatus from toppling over.

[0012] Furthermore, in the related art, the test boards are required to be filled in the test cavity of the test apparatus. The test is required to be performed by contacting the surface to be tested, particularly the main surface, of the component carrier with one side of the plurality of stacked test boards containing the electrical contacts, and thus the number of test boards required usually depends on the size of the component carrier. During the actual test, due to the relatively small size of the component carrier, only a part of the test boards in the test cavity can be in electrical contact with the component carrier to be tested to perform the electrical test. The remaining test boards, although not in electrical contact with the object to be tested, can be damaged when a short circuit or high voltage occurs in the test circuit. This is obviously not cost-effective. The application of the test auxiliary boards in the non-test area of the test apparatus that is not in electrical contact with the object to be tested can not cause damage to the test auxiliary boards even if a short circuit or high voltage occurs in the test circuit, which can significantly reduce the cost of the test.

[0013] In the following, further exemplary embodiments of the test apparatus for component carriers will be explained.

[0014] In some optional embodiments, the stack formed by the plurality of test boards and the plurality of test auxiliary boards comprises: a first stack portion formed by at least one test auxiliary board; a second stack portion formed by at least one test auxiliary board; and an intermediate stack portion located between the first stack portion and the second stack portion, the intermediate stack portion being formed by a plurality of test boards.

[0015] In some embodiments, the intervening stack portion formed by the plurality of test plates can be disposed substantially centrally in the accommodation space of the testing apparatus, i.e. the plurality of test plates can substantially occupy the middle portion of the accommodation space. Accordingly, the first stack portion formed by the one or more test auxiliary plates and the second stack portion formed by the one or more test auxiliary plates can be respectively disposed in the accommodation space and distributed on both sides of the plurality of test plates in the stacking direction of the plurality of test plates. In such an arrangement, test auxiliary plates and test plates of the same weight and size can help prevent the testing apparatus from tipping over.

[0016] However, it can be appreciated that in other embodiments, the stack portion formed by the plurality of test plates can also be disposed adjacent to one end side of the apparatus frame, such that there is only a margin space for the insertion of the one or more test auxiliary plates in one side of the plurality of test plates in the accommodation space, such as the testing chamber. Accordingly, the stack portion formed by the one or more test auxiliary plates can be disposed in the accommodation space and distributed on only one side of the plurality of test plates in the stacking direction of the plurality of test plates.

[0017] In some optional embodiments, the number of test auxiliary plates included in the first stack portion is the same as the number of test auxiliary plates included in the second stack portion. Such a structure is beneficial to the overall stability of the testing apparatus. In particular, the number of test auxiliary plates located on one side of the intervening stack portion is the same as the number of test auxiliary plates located on the other side of the intervening stack portion, which is beneficial to the testing apparatus to maintain balance when in use, reducing the possibility of being subjected to vibration or tilting, thereby improving the accuracy of testing.

[0018] In some optional embodiments, the difference between the number of test auxiliary plates included in the first stack portion and the number of test auxiliary plates included in the second stack portion is preferably 1. However, it can be appreciated that in some application scenarios, the difference in the number of plates between the first stack portion and the second stack portion can also be greater than 1.

[0019] In some optional embodiments, the test auxiliary plate includes at least one opening and / or at least one recess extending through the test auxiliary plate in the thickness direction of the test auxiliary plate, such that the test auxiliary plate has the same weight as the test plate. By providing openings and / or recesses on the test auxiliary plate to make its weight the same as the test plate, it helps to maintain the overall balance of the apparatus during use, and to avoid possible vibration or tilting as much as possible.

[0020] In some alternative embodiments, the test plate comprises a plurality of first electrically conductive contact portions at least partially covering a top side of the test plate, the plurality of first electrically conductive contact portions being configured to electrically contact the component carrier to be tested. By providing a plurality of electrically conductive contact portions at the top side of the test plate, it is facilitated to quickly and efficiently establish an electrical connection with the component carrier to be tested, thereby improving the efficiency of the testing.

[0021] In some alternative embodiments, the test plate comprises a plurality of second electrically conductive contact portions partially covering a bottom side of the test plate, the plurality of second electrically conductive contact portions being configured to electrically contact corresponding electrically conductive interfaces in the equipment frame.

[0022] In some alternative embodiments, the test auxiliary plate comprises a first sealing member at least partially covering a top side of an upper body portion of the test auxiliary plate, the first sealing member being configured to not contact the component carrier to be tested.

[0023] In some examples, the test auxiliary plate can comprise at least one upper body portion, and a first sealing member. The upper body portion can be used to primarily fill the remaining space in the accommodation space except for the space occupied by the intervening stacked portions formed by the plurality of test plates. The first sealing member can further fill, in particular in a sealed manner, the clearance space between the upper body portion and the surrounding equipment frame.

[0024] In the context of the present application, the term "upper body portion" can in particular denote a physical member in the test auxiliary plate used to primarily fill the remaining space in the accommodation space (e.g. test cavity) of the test equipment except for the space occupied by the plurality of test plates. The structure, material, etc. of the upper body portion is not particularly limited as long as it is capable of physically facilitating the stability of the contact between the test plate and the object to be tested and the equipment frame by significantly filling the remaining space.

[0025] In the context of the present application, "filling the clearance space between the upper body portion and the surrounding equipment frame in a sealed manner" can in particular denote that, in use, the first sealing member can sealingly fill the clearance space between the upper body portion and the surrounding equipment frame (e.g. the equipment frame including the top portion and / or the equipment frame on the side) at least over the lateral extent (or lengthwise extent) of the upper body portion, such that the first sealing member is capable of exerting a force on the adjacent plurality of test plates in a direction perpendicular to the lengthwise direction of the upper body portion (or described as in the stacking direction of the plurality of test plates) to cause the plurality of test plates to be as closely contacted as possible.

[0026] In some optional embodiments, a plurality of holes are provided in the first sealing member and extend through the first sealing member in the vertical direction, and a plurality of threaded grooves are provided at the top of the upper body portion and correspond in position to the plurality of holes, and the first sealing member is configured to be fastened at the top side of the upper body portion by a screwing member passing through the holes and being screwed into the corresponding threaded grooves. The fastening configuration between the first sealing member and the upper body portion formed by the screwing member passing through the holes and being screwed into the corresponding threaded grooves facilitates a stable connection therebetween, which in turn facilitates the test auxiliary plate to facilitate the accurate positioning of the test plate, thereby improving the mechanical stability and electrical reliability of the test equipment.

[0027] In some optional embodiments, a plurality of elongated holes are provided in the first sealing member and extend through the first sealing member in the vertical direction, thereby allowing the position of the first sealing member relative to the upper body portion to be adjusted accordingly according to the state of the test plate.

[0028] The elongated holes allow the first sealing member to move or adjust within a certain range relative to the upper body portion. This adjustability enables the first sealing member to be positioned flexibly during installation and debugging to adapt to different test plate states or sizes. In particular, after being used for a long time, when the test plate (particularly, the side of the test plate containing the electrical contact portions for contacting the component carrier to be tested) deforms slightly, the relative position of the first sealing member and the test plate (particularly, the side of the test plate containing the electrical contact portions for contacting the component carrier to be tested) can be adjusted to apply a force to the adjacent test plate in the stacking direction of the test plates to make the test plates as close as possible. In addition, during equipment operation, the elongated holes also allow the member to absorb or alleviate deformation stress caused by thermal expansion and contraction or mechanical stress to some extent.

[0029] In some optional embodiments, the plurality of holes are evenly distributed along the length of the first sealing member. The evenly distributed holes provide uniform fixing points for the first sealing member, so that the fixing force of the first sealing member is more balanced in the entire length direction. The even distribution of holes can also minimize local deformation or stress concentration caused by thermal expansion and contraction or mechanical stress.

[0030] In some optional embodiments, the test auxiliary plate and / or the test plate include first and second fixing members provided on opposite sides of the plate in the vertical direction to fix the corresponding test auxiliary plate and / or test plate to the equipment frame. By providing the fixing members on opposite sides of the plate in the vertical direction, the plate can be stably connected to the equipment frame.

[0031] In some alternative embodiments, the test auxiliary board and / or the test board are provided with at least one first fixing member at the opposite first and second corner portions on the upper side, respectively, to fix the respective test auxiliary board and / or test board to the equipment frame from the upper side.

[0032] In some alternative embodiments, the first fixing members provided at the first corner portions of the test auxiliary boards and / or the first corner portions of the test boards are uniformly connected to the first side portion of the equipment frame, and the first fixing members provided at the second corner portions of the test auxiliary boards and / or the second corner portions of the test boards are uniformly connected to the second side portion of the equipment frame.

[0033] In some alternative embodiments, the test auxiliary board comprises a second sealing member covering at least partially the bottom side of the lower body portion of the test auxiliary board, the second sealing member being configured to seal the space between the lower body portion and the bottom equipment frame.

[0034] In the context of the present application, "sealing the space between the lower body portion and the bottom equipment frame" can particularly mean that the second sealing member fills the clearance space between the lower body portion and the bottom equipment frame in a sealed manner. In some implementations, this can be manifested as that, in use (or in other words, when the test auxiliary board is applied in the test equipment), the second sealing member can sealably fill the clearance space between the lower body portion and the bottom equipment frame over the lateral extension (or length extension) of the lower body portion.

[0035] The lower body portion can extend to the bottom of the accommodation space in use to closely match the bottom equipment frame. This allows additional support and stability to be provided in three-dimensional space, preventing the test auxiliary board from moving due to vibration or other forces during testing.

[0036] The second sealing member can further provide additional support and fixing effect. By providing the second sealing member, structural movement due to other physical factors can be reduced, thereby promoting the stability of the test auxiliary board relative to the equipment frame. The sealed filling configuration can also absorb part of the vibration and impact, enhancing the anti-vibration and anti-impact performance of the entire test system, to reduce interference caused by possible vibration or impact when performing sensitive tests.

[0037] In some alternative embodiments, the second sealing member is provided with a second connecting member that matches the first connecting member on the device frame of the bottom portion, to mechanically fix the test auxiliary board from the lower side to the device frame of the bottom portion. The second connecting member can for example comprise a pin provided at the bottom of the second sealing member. Correspondingly, the first connecting member can be a positioning hole for the pin to be inserted.

[0038] By providing the second sealing member with a second connecting member that matches the first connecting member on the device frame, the lower body portion and thus the test auxiliary board are stably connected to the bottom portion of the device frame. This connection enhances the overall stability of the system, avoiding displacement or vibration that can occur during testing. The matching connecting members also make the installation and removal process simpler and faster.

[0039] In some alternative embodiments, the stack of a plurality of the test boards and a plurality of the test auxiliary boards is configured to completely fill the accommodation space for the boards in the test device. It can be understood that "completely fill" can particularly mean that there is no significant amount of remaining space in the accommodation space, without implying that there is no gap between the boards. The completely fill configuration can prevent the boards from wobbling or displacing within the accommodation space, enhancing the mechanical stability of the structure and helping to improve the reliability of the test.

[0040] In some alternative embodiments, the test board is configured with a test circuit for the test component carrier.

[0041] In some alternative embodiments, the first sealing member and / or the second sealing member is configured as an electrically insulating sealing member.

[0042] Advantageously, both the first sealing member and the second sealing member are made of an electrically insulating material. The electrically insulating sealing member can prevent undesired electrical contact between the test auxiliary board located in the non-test area and the test board and / or the object to be tested.

[0043] In embodiments, the electrically insulating sealing member can comprise at least one of the following: resin (e.g. reinforced or non-reinforced resin, such as epoxy resin or bismaleimide-triazine resin), cyanate ester resin, polyphenylene derivative, glass, prepreg material, polyimide, polyamide, liquid crystal polymer, epoxy resin-based build-up film, polytetrafluoroethylene, ceramic, and metal oxide. Reinforcing structures made of glass (multi-layer glass), such as meshes, fibers, or spheres, can be used, for example.

[0044] In an embodiment, the test equipment applying the test aid plate provided by the exemplary embodiments of the present application can be used in particular for testing a component carrier shaped as a plate. A plate-shaped component carrier facilitates a compact design and still provides a large basis for mounting components thereon.

[0045] In an embodiment, the test equipment applying the test aid plate provided by the exemplary embodiments of the present application can be used in particular for testing a component carrier configured as one of a printed circuit board, a substrate, in particular an IC substrate, and an interposer, or a preform thereof.

[0046] In the context of the present application, the term "printed circuit board" (PCB) can in particular denote a plate-shaped component carrier formed by laminating a plurality of electrically conductive layer structures with a plurality of insulating layer structures, for example by applying pressure and / or providing thermal energy. The various electrically conductive layer structures can be connected to each other in a desired manner by forming holes through the laminate, for example by laser drilling or mechanical drilling, and by partially or completely filling the holes with an electrically conductive material, in particular copper, thereby forming vias such as through-hole connections. In addition to one or more components that can be embedded in the printed circuit board, a printed circuit board is typically configured to accommodate one or more components on one or both opposite surfaces of the plate-shaped printed circuit board. They can be connected to the respective main surface by soldering. The dielectric part of a PCB can consist of a resin with reinforcing fibers, such as glass fibers.

[0047] In the context of the present application, the term "substrate" can in particular denote a small component carrier. A substrate can be a relatively small component carrier in relation to a PCB, on which one or more components can be mounted and which can act as a connection medium between one or more chips and another PCB. For example, a substrate can have essentially the same size as a component, in particular an electronic component, to be mounted thereon, for example in the case of a chip-scale package (CSP). More particularly, a substrate can be understood as a carrier for electrical connections or electrical networks and as a component carrier comparable to a printed circuit board (PCB), but with a comparably high density of laterally and / or vertically arranged connections. Lateral connections are, for example, electrically conductive paths, while vertical connections can be, for example, vias. These lateral and / or vertical connections are arranged within the substrate and can be used to provide electrical, thermal and / or mechanical connections of a housed component or a non-housed component, such as a bare die, of an IC chip, in particular, with a printed circuit board or an intermediate printed circuit board. Accordingly, the term "substrate" also includes "IC substrate". The dielectric part of a substrate can consist of a resin with reinforcing particles, such as reinforcing balls, in particular glass balls.

[0048] The substrate or interposer can comprise or consist of layers of at least one of the following: glass; silicon and / or a photosensitive or dry-etchable organic material, such as an epoxy-based build-up material (e.g. an epoxy-based build-up film); or a polymeric compound (which can or can not include light- and / or heat-sensitive molecules).

[0049] The above-defined aspects and further aspects of the present application will become apparent from examples of embodiments to be described hereinafter and will be elucidated from and be partly drawn from the examples of embodiments. BRIEF DESCRIPTION OF DRAWINGS

[0050] The features and advantages of the embodiments of the present application will become more apparent from the following detailed description of example embodiments with reference to the drawings on which:

[0051] Figure 1 A structural diagram of a test apparatus of a component carrier according to an example embodiment of the present application is provided, in which a test board and a test auxiliary board are loaded in the test apparatus.

[0052] Figure 2 A structural diagram of a test board in a test apparatus according to an example embodiment of the present application is provided.

[0053] Figure 3 A structural diagram of a test auxiliary board in a test apparatus according to an example embodiment of the present application is provided.

[0054] Figure 4 A sectional view of a first sealing member included in a test auxiliary board in a test apparatus according to an example embodiment of the present application is provided, in which a plurality of elongated holes provided at a top side of the first sealing member are shown. DETAILED DESCRIPTION

[0055] The present application will be described in detail with reference to example embodiments thereof as illustrated in the accompanying drawings, in which like reference numerals can refer to like elements throughout. It should be noted that the following detailed description is only for the purpose of illustration and is not intended to limit the present application as the technical scope of the present application is defined by the appended claims.

[0056] It should also be noted that all the features relating to the practical specific embodiments have not been described and shown in the specification and drawings for the sake of clarity, and in order to avoid obscuring the technical solution of the present application, only the arrangements closely related to the technical content of the present application are described and shown in the specification and drawings, and other details which are not closely related to the technical content of the present application and are known to those skilled in the art are omitted.

[0057] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the various embodiments of this application will be described in detail below with reference to the accompanying drawings. However, those skilled in the art will understand that many technical details have been presented in the various embodiments of this application to facilitate the reader's better understanding of this application. However, the technical solutions claimed in this application can be implemented even without these technical details and with various changes and modifications based on the following embodiments. The division of the various embodiments below is for the convenience of description and should not constitute any limitation on the specific implementation of this application. The various embodiments can be combined with and referenced by each other without contradiction.

[0058] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence, nor should they be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. It should be understood that such terms can be used interchangeably where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0059] In this application, terms such as "upper," "lower," "outer," and "inner" used to describe orientation are for descriptive purposes only and should not be considered limiting. Furthermore, although this application has been described with reference to exemplary embodiments, it should be understood that this application is not limited to the specific embodiments described and shown herein. Various modifications to the exemplary embodiments can be made by those skilled in the art without departing from the scope defined by the claims of this application.

[0060] Reference Figures 1 to 4 . Figure 1 A structural schematic diagram of a test device 200 for a component carrier according to an exemplary embodiment of this application is provided. Figure 2 A schematic diagram of the structure of the test board 300 in the test apparatus 200 according to an exemplary embodiment of this application is provided. Figure 3 A schematic diagram of the structure of the test auxiliary board 100 in the test device 200 according to an exemplary embodiment of this application is provided. Figure 4A cross-sectional view of the first sealing member 104 included in the test aid board 100 in the test apparatus 200 according to the exemplary embodiment of the present application is provided, in which a plurality of elongated holes provided at the top side of the first sealing member 104 are shown.

[0061] A receiving space 204, such as a test cavity or a test chamber, formed by the apparatus frame 202 can be provided in the test apparatus 200. A plurality of test boards 300 for testing of component carriers and a plurality of test aid boards 100 can be received in the receiving space 204. As shown, the plurality of test boards 300 and the plurality of test aid boards 100 are arranged in a stacked form in the receiving space 204. Each test board 300 and each test aid board 100 can be connected to the surrounding apparatus frame 202 by a respective fixing member, respectively. Figure 1

[0062] The test aid board 100 preferably has the same or substantially the same weight and size as the test board 300. The test aid board 100 preferably has the same or substantially the same shape as the test board 300.

[0063] During testing of component carriers by the test apparatus 200, the test aid board 100 does not form part of the test path. This makes the current flowing through the test board 300 and the tested component carrier not flow through the test aid board 100. The test aid board 100 improves the mechanical robustness and the electrical stability of the test apparatus 200 by physically facilitating stable mechanical / electrical contact between the test board 300 and the apparatus frame 202 and the tested component carrier.

[0064] By arranging the plurality of test boards 300 and the plurality of test aid boards 100 in the receiving space 204 of the test apparatus 200 in a stacked form with each other and making any of the plurality of test aid boards 100 not form part of the test path, the stable positioning of the test boards 300 in the receiving space 204 and thereby the prevention of relative displacement between electrical interfaces, such as test probes, on the test boards 300 and electrical interfaces on the component carriers to be tested during testing can be facilitated by means of the plurality of test aid boards 100. This is beneficial for obtaining accurate test data to reduce measurement errors due to instability or positional offset of the test boards 300 and also for shortening the debugging time of the test apparatus 200 before testing.

[0065] ​Furthermore, in the related art, the test cavities of the test device 200 need to be filled with test boards 300. In the actual testing process, depending on the size of the component carriers to be tested, only a part of all test boards 300 in the test cavities will be in electrical contact with the component carriers to be tested to perform electrical tests. The rest of the test boards 300, although not in electrical contact with the objects to be tested, can be damaged when a short circuit or high voltage occurs in the test circuit. This is obviously not cost-effective. The application of the test auxiliary boards 100 in the non-test area of the test device 200 that is not in electrical contact with the objects to be tested will not cause damage to the test auxiliary boards 100 even if a short circuit or high voltage occurs in the test circuit, which can significantly reduce the cost of testing.

[0066] The stack formed by the plurality of test boards 300 and the plurality of test auxiliary boards 100 can include a first stack portion 130, a second stack portion 132, and an intermediate stack portion 134 located between the first stack portion 130 and the second stack portion 132. The first stack portion 130 can be formed by at least one test auxiliary board 100. The second stack portion 132 can be formed by at least one test auxiliary board 100. The sum of the number of test auxiliary boards 100 contained in the first stack portion 130 and the second stack portion 132 can be all the test auxiliary boards included in the test device 200. The intermediate stack portion 134 can be stacked by a plurality of test boards 300, in particular, the intermediate stack portion 134 can be formed by all the test boards 300 of the test device.

[0067] In Figure 1 In the embodiment shown, the first stack portion 130, the second stack portion 132, and the intermediate stack portion 134 fill the accommodation space 204 of the test device 200. The intermediate stack portion 134 is substantially centrally arranged in the accommodation space 204. The first stack portion 130 formed by five test auxiliary boards 100 and the second stack portion 132 formed by four test auxiliary boards 100 are respectively arranged in the accommodation space and distributed on both sides of the intermediate stack portion 134 stacked by a plurality of test boards 300 in the stacking direction of the plurality of test boards 300.

[0068] It can be understood that, in some embodiments, the number of test auxiliary boards 100 contained in the first stack portion 130 can be the same as the number of test auxiliary boards 100 contained in the second stack portion 132. It can also be understood that, in some embodiments, the difference between the number of test auxiliary boards 100 contained in the first stack portion 130 and the number of test auxiliary boards 100 contained in the second stack portion 132 can be greater than 1. This depends on the number of test boards 300 and test auxiliary boards 100 that can be placed in the accommodation space 204, as well as the number of test boards 300 to be used in the actual testing process, the placement position, etc.

[0069] As shown in Figure 2 and Figure 3 , the test auxiliary board 100 and / or the test board 300 can include a first fixing member 120 and a second fixing member disposed on opposite sides of the board in the vertical direction to fix the respective test auxiliary board 100 and / or test board 300 to the equipment frame 202. In some embodiments, the second fixing member can be acted by the second sealing member 108 disposed with a pin inserted into the bottom of the equipment frame. In other embodiments, the second fixing member can also be acted by another component (not shown).

[0070] The test auxiliary board 100 and the test board 300 can be provided with one first fixing member 120 at the opposite first corner and second corner located on the upper side, respectively, to fix the respective test auxiliary board 100 and test board 300 to the equipment frame 202 from the upper side.

[0071] In some embodiments, the plurality of first fixing members 120 disposed at the first corner of the plurality of test auxiliary boards 100 and / or the first corner of the plurality of test boards 300 can be consistently connected to the first side (left side in Figure 1 some embodiments) of the equipment frame 202. In some embodiments, the plurality of first fixing members 120 disposed at the second corner of the plurality of test auxiliary boards 100 and / or the second corner of the plurality of test boards 300 can be consistently connected to the second side (right side in Figure 1 some embodiments) of the equipment frame 202.

[0072] In some embodiments, as shown in Figure 1 and Figure 2 , the test board 300 can include a plurality of first electrically conductive contact portions 302 covering at least partially the top side of the test board 300. The plurality of first electrically conductive contact portions 302 can be configured to contact with the component carrier to be tested to act as an electrical connection interface of the test circuit on the test board 300 with the component carrier to be tested. In some embodiments, the test board 300 can include a plurality of second electrically conductive contact portions 304 covering partially the bottom side of the test board 300. The plurality of second electrically conductive contact portions 304 can be configured to be in electrical contact with the corresponding electrically conductive interface in the equipment frame 202.

[0073] In some embodiments, as shown in Figure 3As shown, the test auxiliary board 100 can include at least one upper body portion 102. The upper body portion 102 can be configured to primarily fill the remaining space in the accommodation space 204 except for the space occupied by the test board 300. The test auxiliary board 100 can also include a first sealing member 104 at least partially covering the top side of the upper body portion 102 of the test auxiliary board 100. The first sealing member 104 can be configured to seal the remaining gap space between the upper body portion 102 and the surrounding equipment frame 202, such as the top equipment frame and / or the side equipment frame. The first sealing member 104 does not come into contact with the component carrier to be tested during testing. The term "sealing" herein can be understood, for example, as meaning that no more gap space between the upper body portion 102 and the surrounding equipment frame 202 can be filled so that the test auxiliary board 100 can further assist in the precise positioning of the test board 300.

[0074] In the test equipment 200 according to the exemplary embodiment, the test auxiliary board 100 promotes the stable positioning of the test board 300 by effectively filling the remaining space in the accommodation space 204 other than the space occupied by the plurality of test boards 300, and thereby prevents the occurrence of an undesirable relative displacement between the test board 300 and the object to be tested during testing (in particular, such an undesirable relative displacement can cause a relative displacement of the electrical contacts, such as test probes, on the test board 300 and the electrical interfaces on the object to be tested).

[0075] In some embodiments, the test auxiliary board 100 includes at least one opening and / or at least one recess that extends through the test auxiliary board 100 in the thickness direction of the test auxiliary board 100, so that the test auxiliary board 100 has substantially the same weight as the test board 300.

[0076] As an example, the upper body portion 102 can include at least one second recess extending partially in the thickness direction of the upper body portion 102. When there are two or more second recesses, the two or more second recesses can be disposed symmetrically with respect to the vertical center axis of the test aid plate 100, so that the upper body portion 102 has symmetry in structure with respect to the vertical center axis. In some embodiments, the upper body portion 102 can include at least one second opening 114 extending through the upper body portion 102 in the thickness direction of the upper body portion 102. When there are two or more second openings 114, the two or more second openings 114 can be disposed symmetrically with respect to the vertical center axis of the test aid plate 100, so that the upper body portion 102 has symmetry in structure with respect to the vertical center axis. In some embodiments, the upper body portion 102 includes at least one second recess extending partially in the thickness direction of the upper body portion 102, and the upper body portion 102 further includes at least one second opening 114 extending through the upper body portion 102 in the thickness direction of the upper body portion 102. The at least one second recess and the at least one second opening 114 can be disposed symmetrically as a whole with respect to the vertical center axis of the test aid plate 100, so that the upper body portion 102 has symmetry in structure with respect to the vertical center axis. Such symmetry can make the weight distribution of a single test aid plate substantially even in the planar direction thereof.

[0077] The second recess and / or the second opening may, for example, have a square shape with rounded corners. It can be appreciated that, in further embodiments, the second recess and / or the second opening can also have different shapes.

[0078] In some embodiments, the first sealing member 104 can be fixedly connected to the upper body portion 102. In some embodiments, the first sealing member 104 can be detachably connected to the upper body portion 102.

[0079] In some embodiments, the first sealing member 104 of the test aid plate and the electrical contact portion of the test plate are each disposed on the side of the respective plate that faces the component carrier at the time of testing. In some embodiments, the electrically conductive contact portions / first sealing members in the first stacking portion 130, the second stacking portion 132, and the intervening stacking portion 134 collectively fill, in particular completely fill, the upper space of the accommodation space 204 of the test device 200.

[0080] In some embodiments, a plurality of holes 116 can be provided in the first sealing member 104, which extend through the first sealing member 104 in the vertical direction. The plurality of holes 116 can be evenly distributed along the length of the first sealing member 104. However, it is understood that in some applications, uneven distribution of the plurality of holes 116 along the length of the first sealing member 104 is also possible. A plurality of threaded slots corresponding in position to the plurality of holes 116 are provided at the top of the upper body portion 102. The first sealing member 104 can be fastened at the top side of the upper body portion 102 by means of a screwing member such as a screw passing through the holes 116 and being screwed into the corresponding threaded slots.

[0081] The first sealing member 104 can be made of an electrically insulating material. The electrically insulating first sealing member 104 is advantageous in preventing undesired electrical contact between the test auxiliary board 100 located in the non-test area and the test board 300 and / or the object to be tested.

[0082] In some embodiments, the holes 116 can be configured as elongated holes. A plurality of elongated holes can be evenly distributed along the length of the first sealing member 104. The first sealing member 104 can be fastened at the top side of the upper body portion 102 by means of a screwing member passing through the elongated holes and being screwed into the corresponding threaded slots.

[0083] The design of the elongated holes is particularly advantageous. The elongated holes allow the position of the first sealing member 104 relative to the upper body portion 102 to be adjusted at any time according to the state of the test board 300. It is understood that the elongated holes allow the first sealing member 104 to move or adjust within a certain range relative to the upper body portion 102. This adjustability enables the first sealing member 104 to be positioned flexibly during installation and debugging to adapt to different states of the test board 300. In particular, the first sealing member 104 can be adaptively adjusted to facilitate the flat state of the side of the plurality of test boards 300 provided with the electrical contact portions. For example, a greater force can be applied to the plurality of test boards 300 by positioning the first sealing member 104 closer to the test boards 300 in the stacking direction (as shown, extending perpendicular to the length direction of the first sealing member) so that the plurality of test boards 300 are closer to each other. For example, a smaller force can be applied to the plurality of test boards 300 by positioning the first sealing member 104 farther away from the test boards 300 in the stacking direction so that the plurality of test boards 300 are not so close to each other.

[0084] In addition, during operation of the device, the elongated holes can also allow the member to absorb or alleviate deformation stress to some extent due to thermal expansion and contraction or mechanical stress, etc.

[0085] The different elongated holes can have the same or different lateral extensions (lengths). The different elongated holes can have the same or different vertical extensions (depths). The different threaded slots can have the same or different vertical extensions (depths).

[0086] In some embodiments, at least two first securing members 120 can be provided at two opposite corners of the upper body portion 102 in the length extension direction. The first securing members 120 can be configured to connect the upper body portion 102, and thus the test auxiliary board 100, to the device frame 202 by mating with corresponding structures on the device frame 202, such as a snap-fit connection.

[0087] Reference is also made to Figure 3 The test auxiliary board 100 can also include a lower body portion 106 extending from the bottom of the upper body portion 102. The lower body portion 106 can be configured to extend towards the bottom of the accommodation space 204 when in use to mate the test auxiliary board 100 to the bottom device frame 202. The lower body portion 106 extends from the bottom of the upper body portion 102 and will extend to the bottom of the accommodation space 204 when in use (when the test auxiliary board is fitted into the test device) to mate with the bottom device frame 202. This allows additional mechanical support and stability to be provided in three-dimensional space, preventing the test auxiliary board 100 from moving during testing due to the effects of vibration or other forces.

[0088] The lower body portion 106 can be detachably connected to the upper body portion 102 by one or more screws.

[0089] In some embodiments, the lower body portion 106 can include at least one first recess extending partially in the thickness direction of the lower body portion 106. When there are two or more first recesses, the two or more first recesses can be disposed symmetrically with respect to the vertical center axis of the test auxiliary plate 100, such that the lower body portion 106 has structural symmetry with respect to the vertical center axis. In some embodiments, the lower body portion 106 can include at least one first opening 112 extending through the lower body portion 106 in the thickness direction of the lower body portion 106. When there are two or more first openings 112, the two or more first openings 112 can be disposed symmetrically with respect to the vertical center axis of the test auxiliary plate 100, such that the lower body portion 106 has structural symmetry with respect to the vertical center axis. In some embodiments, the lower body portion 106 includes at least one first recess extending partially in the thickness direction of the lower body portion 106, and the lower body portion 106 includes at least one first opening 112 extending through the lower body portion 106 in the thickness direction of the lower body portion 106. The at least one first recess and the at least one first opening 112 can be disposed symmetrically with respect to the vertical center axis of the test auxiliary plate 100 as a whole, such that the lower body portion 106 has structural symmetry with respect to the vertical center axis. Such symmetry can make the weight distribution of a single test auxiliary plate substantially even in its planar direction.

[0090] The first recess and / or the first opening may, for example, have a square shape with rounded corners. It can be appreciated that, in further embodiments, the first recess and / or the first opening can also have different shapes.

[0091] The size and shape of the first recess and / or the first opening in the lower body portion 106 can be different from the size and shape of the second recess and / or the second opening in the upper body portion 102. For example, in some embodiments, the first recess and / or the first opening in the lower body portion 106 have a relatively large size, while the second recess and / or the second opening in the upper body portion 102 have a relatively small size.

[0092] In some embodiments, the test auxiliary board 100 can further comprise a second sealing member 108. The second sealing member 108 at least partially covers the bottom side of the lower body portion 106 of the test auxiliary board 100. The second sealing member 108 can be configured to seal the remaining gap space between the lower body portion 106 and the device frame 202 of the bottom. The term "sealing" here can be understood, for example, as meaning that there is no more remaining gap space between the lower body portion 106 and the device frame 202 of the bottom that can be filled to enable the test auxiliary board 100 to further assist in the precise positioning of the test board 300. By means of the second sealing member 108, a positional deviation of the test auxiliary board 100 relative to the device frame 202 due to other physical factors can be reduced.

[0093] The second sealing member 108 can be arranged on the side of the lower body portion 106 opposite the upper body portion 102. The second sealing member 108 can be connected to the outer periphery of the lower body portion 106, for example. The second sealing member 108 can further comprise a second connecting member 110 that matches the first connecting member on the device frame 202 of the bottom, so as to connect the lower body portion 106, and thus the test auxiliary board 100, to the device frame 202 of the bottom from the underside. The second connecting member 110 can comprise a pin arranged at the bottom of the second sealing member 108, for example. The first connecting member can be a positioning hole into which the pin is inserted, for example.

[0094] The second sealing member 108 can be made of an electrically insulating material. The electrically insulating second sealing member 108 advantageously prevents undesired electrical contact between the test auxiliary board 100 located in the non-test region and the test board 300 and / or the object to be tested.

[0095] Although the present application has been described with reference to exemplary embodiments, it is to be understood that the application is not limited to the specific embodiments described and illustrated, but that various changes can be made to the exemplary embodiments without departing from the scope of the present application as defined in the claims.

[0096] Features mentioned and / or shown in the above description of exemplary embodiments of the present application can be combined with one or more of the other embodiments in the same or equivalent manner as the combination of features in the other embodiments, either replace corresponding features of other embodiments, or both. These combinations, which have not been mentioned specifically herein, are nonetheless contemplated to be included within the scope of the present application.

Claims

1. A test apparatus (200) for a component carrier, characterized by The test device (200) comprises: a plurality of test boards (300) and a plurality of test auxiliary boards (100), the plurality of test boards (300) and the plurality of test auxiliary boards (100) being arranged in a stacked form; wherein the test auxiliary boards (100) are configured so as not to form part of a test path during testing of the component carrier by the test device (200); and wherein the test auxiliary boards (100) and the test boards (300) have the same weight and size.

2. The test apparatus (200) for a component carrier according to claim 1, characterized in that The stack formed by the plurality of test boards (300) and the plurality of test auxiliary boards (100) comprises a first stack portion (130) formed by at least one test auxiliary board (100), a second stack portion (132) formed by at least one test auxiliary board (100), and an intermediate stack portion (134) between the first stack portion (130) and the second stack portion (132), the intermediate stack portion (134) being formed by a plurality of test boards (300).

3. The test apparatus (200) for a component carrier according to claim 2, characterized in that The first stack portion (130) comprises the same number of test auxiliary boards (100) as the second stack portion (132).

4. The test apparatus (200) for a component carrier according to claim 2, characterized in that The difference between the number of test auxiliary boards (100) comprised by the first stack portion (130) and the number of test auxiliary boards (100) comprised by the second stack portion (132) is 1.

5. The test apparatus (200) for a component carrier according to any one of claims 1 to 4, characterized in that The test auxiliary board (100) comprises at least one opening and / or at least one recess that extends through the test auxiliary board (100) in the thickness direction of the test auxiliary board (100), such that the test auxiliary board (100) has the same weight as the test board (300).

6. The test apparatus (200) for a component carrier of claim 1, characterized in that The test board (300) comprises a plurality of first electrically conductive contacts (302) that at least partially cover the top side of the test board (300), the plurality of first electrically conductive contacts (302) being configured to make electrical contact with a component carrier to be tested.

7. The test apparatus (200) for a component carrier according to claim 1 or 6, characterized in that The test board (300) comprises a plurality of second electrically conductive contacts (304) that partially cover the bottom side of the test board (300), the plurality of second electrically conductive contacts (304) being configured to make electrical contact with corresponding electrically conductive interfaces in a device frame (202).

8. The test apparatus (200) for a component carrier of claim 1, characterized in that The test auxiliary board (100) comprises a first sealing member (104) that at least partially covers the top side of the upper body portion (102) of the test auxiliary board (100), the first sealing member (104) being configured not to make contact with a component carrier to be tested.

9. The test apparatus (200) for a component carrier according to claim 8, characterized in that A plurality of holes (116) are provided in the first sealing member (104) to pass through the first sealing member (104) in the vertical direction, and a plurality of screw grooves corresponding to the plurality of holes (116) are provided at the top of the upper body portion (102), and the first sealing member (104) is configured to be fastened at the top side of the upper body portion (102) by a screw passing through the holes (116) and being screwed into the corresponding screw grooves.

10. The test apparatus (200) for a component carrier according to claim 9, characterized in that A plurality of elongated holes are provided in the first sealing member (104) to pass through the first sealing member (104) in the vertical direction, thereby allowing the position of the first sealing member (104) with respect to the upper body portion (102) to be adjusted in correspondence with the state of the test plate (300).

11. The test apparatus (200) for a component carrier according to claim 9, characterized in that The plurality of holes are uniformly distributed along the length of the first sealing member (104).

12. The test apparatus (200) of components carriers according to claim 1, characterized in that, The test auxiliary plate (100) and / or the test plate (300) include a first fixing member (120) and a second fixing member provided on opposite sides of the plate in the vertical direction to fix the respective test auxiliary plate (100) and / or test plate (300) to the equipment frame (202).

13. The test apparatus (200) of components carriers according to claim 1, characterized in that, The test auxiliary plate (100) and / or the test plate (300) are provided with at least one first fixing member (120) at opposite first and second corners on the upper side, respectively, to fix the respective test auxiliary plate (100) and / or test plate (300) to the equipment frame (202) from the upper side.

14. The test apparatus (200) for a component carrier according to claim 13, characterized in that The plurality of first fixing members (120) provided at the first corners of the plurality of test auxiliary plates (100) and / or the first corners of the plurality of test plates (300) are uniformly connected to the first side of the equipment frame (202), and the plurality of first fixing members (120) provided at the second corners of the plurality of test auxiliary plates (100) and / or the second corners of the plurality of test plates (300) are uniformly connected to the second side of the equipment frame (202).

15. The test apparatus (200) of any one of claims 1 to 4, characterized by The test auxiliary plate (100) includes a second sealing member (108) that at least partially covers the bottom side of the lower body portion (106) of the test auxiliary plate (100), and the second sealing member (108) is configured to seal the space between the lower body portion (106) and the bottom equipment frame (202).

16. The test apparatus (200) for a component carrier according to claim 15, characterized in that A second connecting member (110) is provided on the second sealing member (108) to match the first connecting member on the bottom equipment frame (202) to mechanically fix the test auxiliary plate (100) to the bottom equipment frame (202) from the bottom side.

17. The test apparatus (200) for a component carrier according to claim 16, characterized in that The second connecting member (110) includes a pin provided at the bottom of the second sealing member (108).

18. The test apparatus (200) of components carriers according to claim 1, characterized in that, The plurality of test plates (300) and the stack of the plurality of test auxiliary plates (100) are configured to completely fill the accommodation space (204) for the plates in the test equipment (200).

19. The test apparatus (200) of components carriers according to claim 1, characterized in that, The test board (300) is configured with a test circuit for testing a component carrier. The test board (300) is configured with a test circuit for testing a component carrier.

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