Amorphous wire sensor frequency response characteristic testing device

Abstract

The utility model discloses an amorphous wire sensor frequency response characteristic testing device, and the device comprises a signal generation module which is used for generating and outputting a sinusoidal voltage signal; the voltage-current conversion module is used for converting the sinusoidal voltage signal input by the signal generator into a sinusoidal current signal and outputting current; the Helmholtz coil is used for generating a magnetic field according to the current; the amorphous wire sensor is placed in the middle of the Helmholtz coil and used for responding to a magnetic field output signal generated by the Helmholtz coil; the oscilloscope is connected with the sampling resistor connected in series with the Helmholtz coil and is used for detecting the current passing through the Helmholtz coil and the magnetic field generated by the Helmholtz coil; and the sensor is connected with the amorphous wire sensor and is used for measuring the magnitude of an output signal of the amorphous wire sensor. According to the scheme, the Helmholtz coil is controlled to generate the magnetic field with the frequency required by the test, the oscilloscope is used for measuring the magnitude of the output signal of the amorphous wire sensor responding to the magnetic field, and the frequency response characteristic test is completed.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of performance test of amorphous wire sensor, and particularly relates to an amorphous wire sensor frequency response characteristic test device. BACKGROUND

[0002] In 1992, Mohri.K, a Japanese scholar, first discovered that a sensor made of amorphous wire as a sensitive material has the characteristics of high sensitivity, fast response speed, high linearity and good temperature stability by using the inner circle wet spinning method in Co-based alloy. The characteristics of the sensitive material of the sensor are 1-2 orders of magnitude higher than those of the traditional GMR sensor. Therefore, amorphous wire has obtained wide attention and research in the field of magnetic sensor application due to its unique giant magnetoimpedance effect.

[0003] The characteristics of the magnetic sensitive sensor composed of amorphous wire mainly include 1, range, 2, resolution, 3, sensitivity, 4, linearity, 5, response time, 6, frequency, 7, repeatability, 8, hysterisis, 9, zero drift, 10, temperature drift, 11, time drift, 12, noise. The frequency response characteristic reflects the response speed of the sensor. It is an important technical index of the sensor.

[0004] At present, there is still a lack of instrument and equipment for testing the frequency response characteristic of amorphous wire. Therefore, it is of great significance to develop a method and device capable of quickly and accurately measuring the frequency response characteristic of amorphous wire sensor. CONTENT OF THE INVENTION

[0005] The purpose of the present application is to provide an amorphous wire sensor frequency response characteristic test device, which can quickly and accurately test the frequency response characteristic of the amorphous wire sensor.

[0006] To achieve the above purpose, the present application provides the following solutions.

[0007] In a first aspect, the present application provides an amorphous wire sensor frequency response characteristic test device, which comprises:

[0008] A signal generation module for generating and outputting a sinusoidal voltage signal;

[0009] A voltage-current conversion module for converting the sinusoidal voltage signal input by the signal generator into a sinusoidal current signal and outputting a current;

[0010] A Helmholtz coil for generating a magnetic field according to the current;

[0011] an amorphous wire sensor, placed in the middle of the Helmholtz coil, for outputting a signal in response to the magnetic field generated by the Helmholtz coil;

[0012] an oscilloscope, connected to a sampling resistor in series with the Helmholtz coil, for detecting the current through the Helmholtz coil and the magnitude of the magnetic field generated by the Helmholtz coil, and connected to the amorphous wire sensor, for measuring the magnitude of the output signal of the amorphous wire sensor.

[0013] Optionally, the testing device comprises a signal amplitude adjusting module arranged between the signal generating module and the voltage-current converting module, for adjusting the signal amplitude of the sinusoidal voltage signal.

[0014] Optionally, the axial direction of the amorphous wire sensor is the same as the axial direction of the Helmholtz coil.

[0015] Optionally, when the oscilloscope measures the output signal of the amorphous wire sensor, the frequency of the sinusoidal voltage signal generated by the signal generating module is adjusted to control the Helmholtz coil to generate a magnetic field with a corresponding frequency, so that the amorphous wire sensor outputs a signal in response to the magnetic field with the frequency.

[0016] Optionally, the frequency of the magnetic field to which the amorphous wire sensor responds is less than or equal to 100 kHz.

[0017] The present application provides a testing device for testing the frequency response characteristic of an amorphous wire sensor. The device generates a sinusoidal voltage signal through a signal generator module, converts the sinusoidal voltage signal into a sinusoidal current signal through a voltage-current converting module, and outputs the current to control the Helmholtz coil to generate a uniform magnetic field with a required test frequency. The oscilloscope measures the magnitude of the output signal of the amorphous wire sensor in response to the magnetic field generated by the Helmholtz coil, thereby quickly and accurately testing the frequency response characteristic of the amorphous wire sensor. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative effort.

[0019] Figure 1 A testing device for testing the frequency response characteristic of an amorphous wire sensor according to an embodiment of the present application is shown in the structural schematic diagram. DETAILED DESCRIPTION

[0020] With reference to the accompanying drawings and specific embodiments, the above and other objectives, features and advantages of the present application will become more apparent.

[0021] To make the above objectives, features and advantages of the present application more apparent, specific embodiments of the present application will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0022] Reference Figure 1 As shown in the drawings, the present application provides a kind of amorphous wire sensor frequency response characteristic testing device, comprising: signal generation module, voltage-current conversion module, Helmholtz coil and oscilloscope. Wherein, voltage-current conversion module is connected with signal generation module and Helmholtz coil respectively, voltage-current conversion module converts the sinusoidal voltage signal generated by signal generation module into sinusoidal current signal, and outputs current to Helmholtz coil to generate the magnetic field of corresponding frequency, amorphous wire sensor is placed in the middle position of Helmholtz coil, responds the output signal of the magnetic field generated by Helmholtz coil, measures the size of output signal by oscilloscope, completes the fast, accurate test to the frequency response characteristic of amorphous wire sensor.

[0023] In the embodiments of the present application, the frequency response characteristic of amorphous wire sensor is measured by measuring the amplitude of signal output of amorphous wire sensor at different magnetic field frequencies; The upper limit of testable frequency is determined by the inductance of Helmholtz coil and the frequency response of voltage-current conversion module. In the present embodiment, the highest frequency of the present testing device can reach 100KHz.

[0024] In the embodiments of the present application, after signal generation module generates sinusoidal voltage signal and outputs, the signal amplitude of generated sinusoidal signal is adjusted by the signal amplitude adjustment module set, and then output to voltage-current conversion module; Voltage-current conversion module outputs corresponding sinusoidal current to Helmholtz coil according to the adjusted sinusoidal voltage signal, so as to complete the control of the magnetic field generated by Helmholtz coil.

[0025] In the embodiments of the present application, Helmholtz coil is also connected in series with a sampling resistor, and the oscilloscope is connected with the sampling resistor to detect the current through the Helmholtz coil and the magnetic field generated by the Helmholtz coil. In a preferred embodiment, the resistance value of the sampling resistor is 1Ω. In the specific measurement process, the resistance value of the sampling resistor can also be other resistance values according to actual needs, which will not be described here.

[0026] In the embodiments of the present application, when the amorphous wire sensor is placed in the middle of the Helmholtz coil, the axial direction of the amorphous wire sensor is kept the same as the axial direction of the Helmholtz coil.

[0027] In the embodiments of the present application, when the frequency response characteristics of the amorphous wire sensor are tested, the signal generation module, the signal amplitude adjustment module, the voltage-current conversion module, the Helmholtz coil, the sampling resistor, the oscilloscope, and the amorphous wire sensor frequency response characteristic testing tool are connected. The amorphous wire sensor is placed in the center of the Helmholtz coil, while keeping the axial direction of the amorphous wire sensor the same as the axial direction of the Helmholtz coil, and the amorphous wire sensor is connected to the amorphous wire sensor frequency response characteristic testing tool.

[0028] When the frequency response characteristics are tested, the signal generation module is set to the sine mode, the frequency of the sine voltage signal of the signal generation module is adjusted to control the frequency of the magnetic field generated by the Helmholtz coil, the amplitude of the sine voltage signal is adjusted by the signal amplitude adjustment module to control the size of the magnetic field generated by the Helmholtz coil, and the amorphous wire sensor frequency response characteristic testing tool completes the test of the frequency response characteristics of the amorphous wire sensor by measuring the size of the output signal of the amorphous wire sensor. In the embodiments of the present application, the amorphous wire sensor frequency response characteristic testing tool can also be completed by the oscilloscope.

[0029] During the measurement process, start from the lowest frequency of the signal generator, gradually increase the frequency at certain frequency intervals (for example, every 10 Hz, 100 Hz, etc., according to the required accuracy and frequency range), and then observe the signal displayed on the oscilloscope. The voltage across the Helmholtz coil in series with the sampling resistor is measured by the oscilloscope, and the current through the coil is calculated according to Ohm's law. Record the current value at each frequency, which represents the driving factor of the change in the excitation magnetic field strength applied to the amorphous wire sensor. The output signal of the amorphous wire sensor is measured using the amorphous wire sensor frequency response characteristic testing tool. At each frequency, the amplitude (peak-to-peak value V pp , effective value V rms , etc.) and phase (the phase difference can be determined by comparing the time delay with the signal displayed on the oscilloscope or using the Lissajous figure function of the oscilloscope) of the output signal are measured. The ratio of the sensor output signal amplitude to the Helmholtz coil current at each frequency is calculated (assuming A(f)=V ppout(f) / I(f), A(f) represents the amplitude frequency response characteristic of the sensor at the frequency. By calculating the A(f) value at different frequencies, the amplitude characteristic curve of the frequency response of the sensor can be drawn. According to the phase difference Δφ(f) between the measured sensor output signal and the Helmholtz coil current, the phase characteristic curve at different frequencies is drawn, which intuitively reflects the phase delay of the sensor to different frequency signals.

[0030] In summary, the amorphous wire sensor frequency response characteristic testing device provided by the present application can quickly and accurately complete the test of the frequency response characteristic.

[0031] The technical features of the above embodiments can be combined in any manner. To make the description concise, not all possible combinations of the technical features in the above embodiments are described, but as long as the combinations of the technical features do not exist contradictions, they should be considered as the scope of the present application.

[0032] The principles and implementation modes of the present application are described by using specific examples, and the above embodiments are only used to help understand the method and its core idea of the present application; meanwhile, for those skilled in the art, according to the idea of the present application, the specific implementation mode and application range can be changed. In summary, the content of the present application should not be understood as a limitation.

Claims

1. An amorphous wire sensor frequency response characteristic testing device, characterized by, The testing device comprises: a signal generating module for generating and outputting a sinusoidal voltage signal; a voltage-to-current conversion module for converting the sinusoidal voltage signal inputted by the signal generator into a sinusoidal current signal and outputting the current; a Helmholtz coil for generating a magnetic field according to the current; an amorphous wire sensor placed at a middle position of the Helmholtz coil for outputting a signal in response to the magnetic field generated by the Helmholtz coil; an oscilloscope connected with a sampling resistor in series with the Helmholtz coil for detecting the current passing through the Helmholtz coil and the size of the magnetic field generated by the Helmholtz coil, and connected with the amorphous wire sensor for measuring the size of the output signal of the amorphous wire sensor.

2. The amorphous wire sensor frequency response characteristic testing device according to claim 1, wherein, The testing device comprises: a signal amplitude adjusting module arranged between the signal generating module and the voltage-to-current conversion module for adjusting the signal amplitude of the sinusoidal voltage signal.

3. The amorphous wire sensor frequency response characteristic testing device according to claim 1, wherein The axial direction of the amorphous wire sensor is the same as the axial direction of the Helmholtz coil.

4. The amorphous wire sensor frequency response characteristic testing device according to claim 1, wherein When the oscilloscope measures the output signal of the amorphous wire sensor, the frequency of the sinusoidal voltage signal generated by the signal generating module is adjusted to control the Helmholtz coil to generate a magnetic field with a corresponding frequency, so that the amorphous wire sensor outputs a signal in response to the magnetic field with the frequency.

5. The testing device for the frequency response characteristic of the amorphous wire sensor according to claim 1, wherein the frequency of the magnetic field to which the amorphous wire sensor responds is less than or equal to 100 KHz.

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