SIP protection group test bed

Abstract

The utility model provides an SIP protection group test bench. The SIP protection group test bench comprises an upper computer, a controller and a PXI cabinet. The upper computer is connected with the controller through a network cable; the PXI case comprises a plurality of input and output cards; one end of each input / output card is connected with the controller through a PXI bus for data transmission; and the other ends of the input and output clamping pieces are gathered into a 55-pin test interface which is used for being connected with a tested object through a cable so as to test the tested object according to a preset test process to obtain a test result. According to the scheme, the mode that the upper computer is combined with the lower computer is adopted, the man-machine interaction requirement is met, the problem of out-of-tolerance in the prior art is solved through the multiple input and output clamping pieces contained in the lower computer, and smooth operation of the channel test is fully guaranteed.

Description

Technical Field

[0001] This utility model relates to the field of computer communication and signal processing analysis technology, specifically to a SIP protection group test bench. Background Technology

[0002] The SIP (Process Instrumentation System) protection group test bench, also known as the T1 test bench, is a portable testing device. It is a non-safety grade device and is normally inactive, stored separately from the protection and measurement cabinet in the electrical room where the KRG cabinet is located. When conducting SIP channel tests using the physical ramp test method, the T1 test bench first energizes the CC and XX relays to trigger the SIP channel to the test state. Then, a ramp signal representing the transient state is injected into the channel port, and the status of XU is monitored. When XU activates, the injected voltage value is recorded and compared with the test criteria to determine whether the channel function is normal.

[0003] In the current technology, there is a severe shortage of spare parts for the Daya Bay T1 test bench. The spare parts warehouse has no replacement parts available, and the spare parts have been discontinued. As the test bench equipment ages and is prone to out-of-tolerance issues, and as industrial equipment becomes increasingly integrated and intelligent, traditional SIP protection group test benches can no longer fully guarantee the smooth operation of channel tests. On the other hand, traditional SIP protection group test benches cannot meet the needs of human-machine interaction. Utility Model Content

[0004] In view of this, this utility model provides a SIP protection group test bench to meet the needs of human-computer interaction and solve the out-of-tolerance problem in the prior art, so as to fully ensure the smooth operation of the channel test.

[0005] To achieve the above objectives, the present invention provides the following technical solutions:

[0006] This utility model embodiment discloses a SIP protection group test bench, which includes: a host computer, a controller and a PXI chassis;

[0007] The host computer and the controller are connected via a network cable;

[0008] The PXI chassis includes multiple input / output cards;

[0009] One end of each of the input / output cards is connected to the controller via a PXI bus for data transmission.

[0010] The other end of each of the input / output cards converges into a 55-pin test interface, which is used to connect to the object under test via a cable to conduct tests on the object under test according to a preset test procedure and obtain test results.

[0011] Preferably, the input / output card includes:

[0012] The system includes a first analog voltage acquisition card, a second analog voltage acquisition card, an analog voltage output card, a digital voltage signal acquisition card, a digital voltage signal output card, a backup voltage acquisition card, and an RTD simulation board.

[0013] Preferably, the RTD simulation board includes: a first high-precision programmable resistor module and a second high-precision programmable resistor module.

[0014] Preferably, the SIP protection group test bench further includes: a test chamber;

[0015] The test box is equipped with a self-test module and an annual inspection module;

[0016] The self-test module is equipped with a self-test interface for connecting to the 55-pin test interface, performing a self-test according to a preset self-test procedure, and obtaining the self-test result.

[0017] The annual inspection module is equipped with an annual inspection interface for connecting to the 55-pin test interface, performing the annual inspection according to the preset annual inspection process, and obtaining the annual inspection result.

[0018] Preferably, the SIP protection group test bench further includes: a power supply drawer; the power supply drawer includes: a main switch, a first switch, a second switch, a third switch, a fourth switch, and an AC / DC converter;

[0019] One end of the main switch is connected to a 220V power supply, and the other end is connected to one end of the first switch, the second switch, the third switch, and the fourth switch, respectively.

[0020] The other end of the first switch is connected to the host computer;

[0021] The other end of the second switch is connected to the controller;

[0022] The other end of the third switch is connected to one end of the AC / DC converter, and the other end of the AC / DC converter is connected to the test box;

[0023] The other end of the fourth switch serves as a backup power interface.

[0024] Preferably, the SIP protection group test bench further includes: an aluminum alloy cabinet, a partition, drawer slides, a bracket, a lower chassis, and a junction box;

[0025] The junction box is equipped with the 55-pin test interface;

[0026] The partition is installed inside the aluminum alloy cabinet, dividing the interior of the aluminum alloy cabinet into an upper space and a lower space;

[0027] The junction box is installed in the lower space;

[0028] The upper space is provided with the lower chassis fixed to the upper surface of the partition, and the lower chassis is provided with the controller and the PXI chassis;

[0029] The test box is fixed to the side of the aluminum alloy cabinet and is located directly above the lower chassis.

[0030] The upper space is provided with the drawer rails, the power drawer is connected to the drawer rails, and the bracket is provided directly above the power drawer for placing the host computer.

[0031] Preferably, the SIP protection group test bench further includes: a printer;

[0032] The printer is located on the upper surface of the partition and directly below the power drawer. The printer is used to print the test results, the annual inspection results, and the self-inspection results.

[0033] Preferably, the SIP protection group test bench further includes: a fan;

[0034] The fan is installed on the side wall of the upper space and is used to dissipate heat from the upper space.

[0035] Preferably, the SIP protection group test bench further includes: multiple omnidirectional double-brake casters;

[0036] Each of the aforementioned universal double-brake casters is fixedly installed at the bottom of the aluminum alloy cabinet.

[0037] Preferably, the controller is an NI PXIe-1084.

[0038] A SIP protection group test bench provided by the above-described embodiment of the present invention includes: a host computer, a controller, and a PXI chassis; the host computer and the controller are connected via a network cable; the PXI chassis includes multiple input / output cards; one end of each input / output card is connected to the controller via a PXI bus for data transmission; the other end of each input / output card forms a 55-pin test interface for connecting to the object under test via a cable to perform tests on the object under test according to a preset test procedure and obtain test results. In this solution, a host computer combined with a slave computer is used to meet human-computer interaction requirements, and the multiple input / output cards included in the slave computer solve the out-of-tolerance problem in the prior art, fully ensuring the smooth operation of the channel test. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0040] Figure 1 This is a general architecture diagram of a SIP protection group test bench disclosed in an embodiment of the present utility model;

[0041] Figure 2 This is an overall view of a SIP protection group test bench disclosed in an embodiment of the present utility model;

[0042] Figure 3 These are the right and front views of a SIP protection group test bench disclosed in an embodiment of this utility model;

[0043] Figure 4 These are the left and rear views of a SIP protection group test bench disclosed in an embodiment of this utility model;

[0044] Figure 5 This is a top view of a SIP protection group test bench disclosed in an embodiment of the present utility model;

[0045] Figure 6 This is an internal circuit diagram of a power supply drawer disclosed in an embodiment of the present utility model. Detailed Implementation

[0046] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0047] In this application, the terms "comprising," "including," or any other variations thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0048] As the background technology indicates, there is a severe shortage of spare parts for the Daya Bay T1 test bench in the existing technology. The spare parts warehouse has no replacement parts available, and the spare parts have been discontinued. With the aging of test bench equipment, which is prone to out-of-tolerance problems, and the continuous improvement of the integration and intelligence of industrial equipment, traditional SIP protection group test benches can no longer fully guarantee the smooth operation of channel tests. On the other hand, traditional SIP protection group test benches cannot meet the needs of human-machine interaction.

[0049] Therefore, this utility model embodiment discloses a SIP protection group test bench. In this solution, a host computer combined with a slave computer is used to meet the human-computer interaction requirements. The multiple input / output cards included in the slave computer are used to solve the out-of-tolerance problem in the prior art and fully ensure the smooth operation of the channel test.

[0050] like Figure 1 The diagram shown is an overall architecture diagram of a SIP protection group test bench disclosed in an embodiment of this utility model. The SIP protection group test bench includes: a host computer, a controller, and a PXI chassis.

[0051] The host computer and the controller are connected via a network cable;

[0052] The PXI chassis includes multiple input / output cards; one end of each input / output card is connected to the controller via a PXI bus for data transmission; the other end of each input / output card is connected to a 55-pin test interface for connecting to the object under test via a cable to perform tests on the object under test according to a preset test procedure and obtain test results.

[0053] PXI (PCI eXtensions for Instrumentation) is a modular platform for testing and measurement.

[0054] In this embodiment of the utility model, a Windows host computer + RT slave computer approach is adopted. The host computer is a high-performance DELL Precision3571 laptop computer, and the slave computer adopts a PXI chassis + controller approach. The controller model is NI PXIe-1084.

[0055] This means that the control system of the SIP protection group test bench consists of two parts: a host computer and a slave computer. The host computer is a Windows-based computer responsible for providing the user interface, data processing, and advanced control logic. The slave computer (RT, i.e., real-time system) is responsible for real-time control and direct interaction with hardware devices, and typically runs a real-time operating system.

[0056] The input / output cards include: a first analog voltage acquisition card, a second analog voltage acquisition card, an analog voltage output card, a digital voltage signal acquisition card, a digital voltage signal output card, a spare voltage acquisition card, and an RTD simulation board.

[0057] The RTD simulation board includes: a first high-precision programmable resistor module and a second high-precision programmable resistor module.

[0058] The input / output card selection scheme specifies that the following board parameters meet the test requirements and are mature products with high stability and reliability.

[0059] 1. The AI ​​signal type is 0-10V, with 13 channels. The AI ​​board consists of the first analog voltage acquisition card and the second analog voltage acquisition card. Two NI PXIe-4300 isolated input boards are selected. This acquisition card supports isolation function, with isolation between channels and between channels and ground. No external circuitry is required, and the structure is simple.

[0060] It should be noted that the NI PXIe-4300 isolation input board has 8 channels, so 13 measurement channels require two NI PXIe-4300 isolation input boards.

[0061] 2. The AO signal types are -10V to 10V and 4 to 20mA. The number of channels is 4 voltage type and 4 current type. The test bench AO board is an analog voltage output card. Select the NI PXIe-4322 isolation output board (1 piece). The voltage / current output of each channel is configurable and channel selection is not performed.

[0062] 3. There are 3 types of DI signals, totaling 20: contact-type digital input (10 channels, with a query voltage of 18V~32VDC for field contacts); 24VDC voltage-type digital input (9 channels, with a voltage range of 0~12V for logic 0 and 18~32V for logic 1); and 48VDC voltage-type digital input (1 channel, with a voltage range of 0~12V for logic 0 and 18~55V for logic 1). The test bench DI board, i.e., the digital voltage signal acquisition card, uses the NI PXI-6529 digital I / O input board (1 piece).

[0063] 4. The DO signal type is contact-type switch output, with 4 channels. The DO board of the test bench is a digital voltage signal output card, and the NI PXI-2569 relay module (1 piece) is selected.

[0064] 5. The NI PXI-6289 was selected as the backup voltage acquisition card. In addition to the 16 voltage acquisition channels, there are 8 additional channels for acquiring AO output voltage feedback. This results in a total of 24 voltage acquisition channels. It includes one CTR counter port and four PFI pulse trigger ports.

[0065] 6. The test bench injects the RTD signal into the channel to be tested through the RTD board, namely the first high-precision programmable resistor module and the second high-precision programmable resistor module. Pickering PXI 40-261-001 high-precision programmable resistor module (2 pieces) is selected.

[0066] Understandably, since the two RTD resistors are divided into hot and cold terminals, two high-precision programmable resistor modules are required.

[0067] It should be noted that existing RTD boards use relay switches to switch precision resistors. This embodiment of the invention uses the Pickering PXI high-precision programmable resistor module 40-261-001 for precision resistor switching. The Pickering PXI high-precision programmable resistor module 40-261-001 provides a more accurate, stable, and flexible solution suitable for applications requiring high precision and high reliability. This addresses the problem that traditional SIP protection group test benches can no longer adequately guarantee the smooth operation of channel tests due to the increasing integration and intelligence of industrial equipment.

[0068] In this embodiment of the invention, while implementing a human-machine interface, it also realizes analog signal acquisition, analog signal output, digital signal output, digital signal input, and high-precision RTD simulation. It configures test procedures and related test parameters, generates test records, etc. The controller and input / output cards use a bus for data transmission. The card interfaces are aggregated into a 55-pin test interface, which connects to the object under test via a pre-fabricated cable. Following the predetermined test procedure, it realizes the functions of simulating the injection of field signals, acquiring test data, and providing test results based on relevant test algorithms.

[0069] In one embodiment, the SIP protection group test bench further includes a self-testing device, i.e., a test box.

[0070] The self-testing annual inspection device includes: a self-testing network (i.e., a self-testing module) and an annual inspection network (i.e., an annual inspection module).

[0071] The self-test module is equipped with a self-test interface for connecting to a 55-pin test interface. It performs a self-test according to a preset self-test procedure and obtains the self-test results.

[0072] It should be noted that the self-test module transmits the AOT (Analog Voltage Output) and AOI (Analog Current Output, converted to voltage by a high-precision resistor) signals to the analog signal acquisition AI via an aviation connector. The self-test program outputs the AOT and AOI signals and acquires them through the AI, comparing the output signals with the acquired signals to determine if the system is functioning correctly, thus achieving self-testing of the analog signal channels. Similarly, the self-testing of the RTD precision resistor involves connecting the RTD precision resistor in series with the AOI and acquiring it through the AI. For digital signal self-testing, the self-test module uses 24VDC as the signal source. The DO signal output from the NI PXI-2569 relay module is transmitted to the digital signal acquisition DI signal via an aviation connector. The self-test program outputs the digital signal and acquires it, comparing the output signals with the acquired signals to determine if the system is functioning correctly, thus achieving digital signal self-testing.

[0073] The annual inspection module is equipped with an annual inspection interface, which is used to connect to the 55-pin test interface to perform the annual inspection according to the preset annual inspection process and obtain the annual inspection results.

[0074] It should be noted that the test bench needs to be calibrated after a period of operation (e.g., one year). Calibration can be completed simply by connecting one end of the 55-core cable to the annual inspection interface at the rear of the test bench and the other end to the 55-pin test interface, with the assistance of some external equipment.

[0075] Specifically, for the digital input / output (DI / O) function provided by the T1 test bench, buttons and indicator lights are provided on the annual inspection module, with 24VDC as the signal source. The buttons provide the digital input function for detecting the T1 test device's digital input; the indicator lights illuminate when the T1 test device issues a digital output to confirm whether the output is normal. For analog input detection (AI), an external signal source (e.g., a Fluke meter) is needed to apply an appropriate voltage to the terminals, and then the voltage is read directly on the monitoring platform for verification. Analog output detection (AO) also requires the cooperation of external instruments. The test bench issues a signal output command, and the output voltage can be measured at the corresponding terminals of the verification module using a voltage detector (e.g., a Fluke meter) to complete the verification. For the analog resistance of the RTD temperature detector signal, after the monitoring platform outputs a specific resistance, the resistance value between the corresponding terminals can be measured directly using a resistance measuring device to complete the detection.

[0076] Based on the overall architecture of the SIP protection group test bench disclosed in the above-described embodiment of the present invention, this solution adopts a combination of host computer and slave computer to meet the human-computer interaction requirements. By utilizing the multiple input / output cards included in the slave computer, the out-of-tolerance problem in the prior art is solved, and the smooth operation of the channel test is fully guaranteed.

[0077] Based on the overall architecture of the SIP protection group test bench disclosed in the above embodiments of this utility model, as follows: Figure 2 The image shown is an overall view of a SIP protection group test bench disclosed in an embodiment of this utility model. The SIP protection group test bench includes: a host computer 1, a lower-level computer chassis 2, a test box 3, a power supply drawer 4, drawer rails 5, a fan 6, a partition 7, a junction box 8, an aluminum alloy cabinet 9, a printer 10, a bracket 11, and multiple omnidirectional double-brake casters 12. The various components of the SIP protection group test bench adopt a modular layout, as detailed below:

[0078] The partition 7 is installed inside the aluminum alloy cabinet 9, dividing the interior of the aluminum alloy cabinet 9 into an upper space and a lower space.

[0079] It is understandable that the existing test benches are too heavy. The aluminum alloy cabinet 9 is made of aluminum alloy profiles to reduce weight and facilitate transfer between storage points and test cabinets.

[0080] The lower space contains a junction box 8, which is fixed to the base plate of the aluminum alloy cabinet 9.

[0081] The junction box 8 is equipped with a 55-pin test interface formed by the combination of multiple input / output card interfaces, which is used to connect to the object under test via cable.

[0082] The upper space is equipped with a lower chassis 2 fixed to the upper surface of the partition 7. The lower chassis 2 contains a controller and a PXI chassis.

[0083] A test box 3 is fixed to the side of the aluminum alloy cabinet 9 and positioned directly above the lower chassis 2.

[0084] Test box 3 is equipped with a self-test module and an annual inspection module.

[0085] The self-test module is equipped with a self-test interface for connecting to the 55-pin test interface. It performs a self-test according to a preset self-test procedure and obtains the self-test result. The annual inspection module is equipped with an annual inspection interface for connecting to the 55-pin test interface. It performs an annual inspection according to a preset annual inspection procedure and obtains the annual inspection result.

[0086] Preferably, the top of the test chamber 3 is provided with heat dissipation holes.

[0087] like Figure 3 The image shows a right view and a front view of a SIP protection group test bench disclosed in an embodiment of this utility model.

[0088] The test box 3 is fixed to the innermost side of the aluminum alloy cabinet 9 when viewed from the front.

[0089] like Figure 4 The figures shown are a left view and a rear view of a SIP protection group test bench disclosed in an embodiment of this utility model.

[0090] like Figure 5 The image shown is a top view of a SIP protection group test bench disclosed in an embodiment of this utility model.

[0091] Preferably, as shown in the left view, the aluminum alloy cabinet 9 has a depth of 900mm and a height of 700mm. As shown in the top view, the aluminum alloy cabinet 9 has a width of 600mm. This allows for the design of appropriate test bench dimensions based on actual conditions such as the width of the fire door on site, enhancing accessibility and reducing the risk of hand injuries.

[0092] The upper space is equipped with drawer rails 5, the power drawer 4 is connected to the drawer rails 5, and a bracket 11 is set directly above the power drawer 4. The bracket 11 is used to place the host computer 1.

[0093] The power drawer 4 is connected to the drawer slide 5, allowing the power drawer 4 to be pulled out of the aluminum alloy cabinet 9, making it convenient for staff to switch power supplies.

[0094] like Figure 6 The diagram shown is an internal circuit diagram of a power drawer disclosed in an embodiment of this utility model.

[0095] The power drawer 4 includes: a main switch k0, a first switch k1, a second switch k2, a third switch k3, a fourth switch k4, and an AC / DC converter.

[0096] One end of the main switch k0 is connected to a 220V power supply, and the other end is connected to one end of the first switch k1, the second switch k2, the third switch k3, and the fourth switch k4, respectively.

[0097] The other end of the first switch k1 is connected to the host computer 1; the other end of the second switch k2 is connected to the controller in the lower-level computer box; the other end of the third switch k3 is connected to one end of the AC / DC converter, and the other end of the AC / DC converter is connected to the test box 3; the other end of the fourth switch k4 serves as a backup power interface.

[0098] It should be noted that the SIP protection group test bench is powered by the on-site 220VAC supply. Once inside the test bench, it powers the following devices: the laptop (host computer); the RT (slave computer); and a 24V DC power supply processed by the AC / DC module. This DC power supply primarily provides the signal source for the self-test module and annual inspection module in the test box. Backup power supply: can provide power for fan 6 and printer 10.

[0099] The printer 10 is located on the upper surface of the partition and directly below the power supply drawer. The printer 10 is used to print test results, annual inspection results, and self-inspection results.

[0100] Fan 6 is installed on the side wall of the upper space to dissipate heat from the upper space.

[0101] Each universal double-brake caster 12 is fixedly installed at the bottom of the aluminum alloy cabinet 9.

[0102] Preferably, the SIP protection test bench includes four omnidirectional double-brake casters 12, which are respectively located at the four corners of the bottom of the aluminum alloy cabinet 9.

[0103] Based on the above-described SIP protection group test bench disclosed in this utility model embodiment, the overall structure is made of aluminum alloy profiles to reduce weight and facilitate transfer between storage locations and test cabinets. The test bench is equipped with omnidirectional double-brake casters at both the front and rear for easy movement. During or after testing, the casters can be used to brake and secure the entire test bench to prevent collisions with equipment such as cabinets. The external dimensions of the test bench are appropriately reduced according to the actual conditions such as the width of fire doors on site to enhance accessibility and reduce the risk of hand injuries. The modular design of the internal layout of the test bench facilitates maintenance. A fan is added to the test bench to enhance internal ventilation and cooling.

[0104] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, for system or system embodiments, since they are basically similar to method embodiments, the description is relatively simple, and relevant parts can be referred to the descriptions in the method embodiments. The systems and system embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without creative effort.

[0105] Those skilled in the art will further recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the components and steps of the various examples have been generally described in terms of functionality in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this invention.

[0106] The above description of the disclosed embodiments enables those skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A SIP protection group test bench, characterized in that, The SIP protection group test platform comprises a host computer, a controller and a PXI chassis; The host computer is connected with the controller through a network cable; The PXI chassis comprises a plurality of input and output cards; One end of each of the input and output cards is connected with the controller through a PXI bus for data transmission; The other end of each of the input and output cards is gathered into a 55-pin test interface for being connected with a measured object through a cable to test the measured object according to a preset test procedure to obtain a test result.

2. The SIP protective group test bench according to claim 1, characterized in that The input and output cards comprise: a first analog voltage acquisition card, a second analog voltage acquisition card, an analog voltage output card, a digital voltage signal acquisition card, a digital voltage signal output card, a backup voltage acquisition card and an RTD simulation board card.

3. The SIP protective group test bench according to claim 2, characterized in that The RTD simulation board card comprises a first high-precision programmed resistance module and a second high-precision programmed resistance module.

4. The SIP protective group test bench of claim 1, wherein, The SIP protection group test platform further comprises a test box; The test box is provided with a self-checking module and an annual inspection module; The self-checking module is provided with a self-checking interface for being connected with the 55-pin test interface to perform self-checking according to a preset self-checking procedure to obtain a self-checking result; The annual inspection module is provided with an annual inspection interface for being connected with the 55-pin test interface to perform annual inspection according to a preset annual inspection procedure to obtain an annual inspection result.

5. The SIP protective group test bench according to claim 4, characterized in that The SIP protection group test platform further comprises a power supply drawer; The power supply drawer comprises a main switch, a first switch, a second switch, a third switch, a fourth switch and an AC / DC converter; One end of the main switch is connected with a 220V power supply, and the other end of the main switch is connected with one end of the first switch, the second switch, the third switch and the fourth switch respectively; The other end of the first switch is connected with the host computer; The other end of the second switch is connected with the controller; The other end of the third switch is connected with one end of the AC / DC converter, and the other end of the AC / DC converter is connected with the test box; 6. The SIP protective group test bench according to claim 5, characterized in that The other end of the fourth switch serves as a backup power supply interface. The SIP protection group test platform further comprises an aluminum alloy cabinet, a partition, a drawer guide rail, a support, a lower computer box and a wiring box; The wiring box is provided with the 55-pin test interface; The partition is arranged in the aluminum alloy cabinet to divide the interior of the aluminum alloy cabinet into an upper space and a lower space; The lower space is provided with the wiring box; The upper space is provided with the lower computer box fixed to the upper surface of the partition, and the lower computer box is provided with the controller and the PXI chassis; The test box is arranged directly above the lower computer box and fixed to the side surface of the aluminum alloy cabinet; 7. The SIP protective group test bench according to claim 6, characterized in that The upper space is provided with the drawer guide rail, the power supply drawer is connected with the drawer guide rail, the support is arranged directly above the power supply drawer, and the support is used for placing the host computer. The SIP protection group test platform further comprises a printer; The printer is arranged on the upper surface of the partition and directly below the power supply drawer, and the printer is used for printing the test result, the annual inspection result and the self-checking result.

8. The SIP protective group test bench according to claim 6, characterized in that The SIP protection group test bench further comprises a fan. The fan is arranged on a side wall in the upper space and used for heat dissipation of the upper space.

9. The SIP protective group test bench of claim 6, wherein, The SIP protection group test bench further comprises a plurality of universal double-brake casters. Each universal double-brake caster is fixedly arranged on the bottom of the aluminum alloy cabinet.

10. The SIP protection group test bench according to any one of claims 1 to 9, characterized in that, The model of the controller is NI PXIe-1084.

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