Temperature characteristic testing device of quartz crystal oscillator

Abstract

The utility model relates to the technical field of temperature characteristic testing equipment, in particular to a temperature characteristic testing device of a quartz crystal oscillator, which comprises a base, a plurality of material loading trays, a tray rack, a motor, a sealing cover, a plurality of testing heads, a display, a computer and a host control machine, the bottom of the disc rack is connected with an output shaft of the motor, the plurality of material loading discs are sequentially placed on the disc rack from top to bottom, the plurality of material loading discs are provided with a plurality of test positions, the sealing cover is detachably connected to the base, the material loading discs and the disc rack are located in the sealing cover, and the plurality of test heads are vertically installed on the side edge of the sealing cover. According to the technical scheme, the plurality of material carrying discs and the testing heads corresponding to the material carrying discs are arranged, and each layer of material carrying disc and the testing head can correspond to products of different specifications and sizes, so that simultaneous detection of the products of multiple specifications is realized; the problem that existing temperature measuring equipment can only test products of one specification each time is solved.

Description

Technical Field

[0001] This utility model relates to the technical field of temperature characteristic testing equipment, specifically a temperature characteristic testing device for a quartz crystal oscillator. Background Technology

[0002] The high-frequency stability of quartz crystal resonators is crucial, and many factors influence this stability, with temperature variations having a particularly significant impact. This is because the thermal gradient caused by temperature changes generates stress on the quartz chip, which in turn affects the frequency of the quartz crystal. Therefore, temperature measurement equipment is used in the research, development, and manufacturing processes of quartz resonators to test and inspect the products, obtain product parameters, and select those that meet the requirements.

[0003] Most existing temperature measurement equipment is platform-type refrigeration temperature measurement equipment and compressor refrigeration temperature measurement equipment. This type of temperature measurement equipment has a large overall testing capacity, but the equipment structure and mechanical components are complex, which is not conducive to daily equipment maintenance, upkeep and cleaning. In addition, it can only test one specification of product at a time, and the test head needs to be replaced for different specifications of products. Utility Model Content

[0004] The present invention aims to provide a temperature characteristic testing device for quartz crystal oscillators to solve the problem that existing temperature measuring equipment can only test one specification of product at a time.

[0005] To achieve the above objectives, the basic solution of this utility model is as follows: A temperature characteristic testing device for a quartz crystal oscillator includes a base, several material trays, a tray frame, a motor, a sealing cover, several test heads, a display, a computer, and a host controller. The tray frame is rotatably connected to the base, the motor is installed inside the base, and the bottom of the tray frame is connected to the output shaft of the motor. Several material trays are placed sequentially from top to bottom on the tray frame, and each of the material trays has several test positions. The sealing cover is detachably connected to the base, and both the material trays and the tray frame are located inside the sealing cover. Several test heads are vertically installed on the side of the sealing cover, and the height positions of the test heads correspond to the height positions of the material trays. The display is installed on the base, and the computer and host controller are both installed inside the base. The test heads, display, and host controller are all connected to the computer via signals.

[0006] Furthermore, each of the material carriers includes a test tray, two fixed trays and several fixing components. The test tray has several test positions on both ends. The two fixed trays have several pressure blocks with the same number of test positions. The two fixed trays are respectively installed on the upper and lower ends of the test tray through the fixing components, and the pressure blocks on the fixed trays correspond one-to-one with the test positions on the test trays.

[0007] Furthermore, the fixing component is a cantilever pin, and both the test plate and the fixing plate are provided with several corresponding fixing holes.

[0008] The beneficial effects of this solution are: (1) This solution is equipped with several material trays and test heads corresponding to the material trays. Each layer of material trays and test heads can correspond to products of different specifications and sizes, so as to realize the simultaneous detection of products of multiple specifications.

[0009] (2) In this solution, the material tray, sealing cover and other components are all detachable, which makes it easy to place the product to be tested, and also makes it easy to maintain, care and clean.

[0010] (3) The sealing cover can achieve sealing and heat preservation, ensuring that the product under test can reach the specified temperature quickly and accurately, while avoiding environmental pollution of the product. Attached Figure Description

[0011] Figure 1 This is an exploded view of an embodiment of the present utility model;

[0012] Figure 2 This is an exploded view of the material tray in an embodiment of this utility model. Detailed Implementation

[0013] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0014] The reference numerals in the accompanying drawings include: base 1, material tray 2, sealing cover 3, test head 4, display 5, computer 6, main control unit 7, test plate 8, fixed plate 9, cantilever pin 10, test position 11, and pressure block 12.

[0015] Example

[0016] The basics are as follows: Figure 1 As shown: A temperature characteristic testing device for a quartz crystal oscillator includes a base 1, four material trays 2, a tray frame, a motor, a sealing cover 3, eight test heads 4, a display 5, a computer 6, and a host control unit 7. The tray frame is rotatably connected to the base 1, the motor is installed inside the base 1, and the bottom of the tray frame is connected to the output shaft of the motor. The four material trays 2 are placed on the tray frame from top to bottom. Figure 2As shown, each loading tray 2 includes a test tray 8, two fixed trays 9, and four cantilever pins 10. The test tray 8 has 164 test positions 11 on both ends. Different specifications of test positions 11 can be set on each test tray 8 to hold products of different specifications. Each of the two fixed trays 9 has 164 pressure blocks 12, and the pressure blocks 12 on the fixed trays 9 correspond one-to-one with the test positions 11 on the test tray 8. Both the test tray 8 and the fixed trays 9 have four corresponding fixing holes. The two fixed trays 9 are connected by four cantilever pins 10. The test heads 4 are installed on the upper and lower ends of the test tray 8. The sealing cover 3 is detachably connected to the base 1, and the material tray 2 and the tray frame are both located inside the sealing cover 3. The eight test heads 4 are vertically installed on the side of the sealing cover 3, and the height of the eight test heads 4 corresponds to the test positions 11 on the two ends of the four material trays 2. The display 5 is installed on the base 1. The computer 6 and the host control unit 7 are both installed inside the base 1. The test heads 4, the display 5, and the host control unit 7 are all connected to the computer 6. The computer 6 is connected to a 250B-1 Network Analyzer and a temperature control system to quickly test the temperature characteristics of quartz products under different temperature gradients.

[0017] The specific implementation process is as follows: The products to be tested are placed into the test position 11 in sequence and fixed with the fixing plate 9. They are placed on the plate frame and the plate frame and the material tray 2 are rotated by the motor. The sealing cover is then closed, and the test head 4 tests the products in sequence.

[0018] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0019] The above descriptions are merely embodiments of this utility model. Commonly known structures and characteristics are not described in detail here. Those skilled in the art are aware of all common technical knowledge in the field prior to the application date or priority date, are knowledgeable of all existing technologies in that field, and possess the ability to apply conventional experimental methods prior to that date. Therefore, those skilled in the art can, based on the guidance provided in this application, improve and implement this solution in conjunction with their own capabilities. Typical known structures or methods should not be obstacles for those skilled in the art to implement this application. It should be noted that those skilled in the art can make several modifications and improvements without departing from the structure of this utility model. These modifications and improvements should also be considered within the scope of protection of this utility model, and will not affect the effectiveness of the implementation of this utility model or the practicality of the patent. The scope of protection claimed in this application should be determined by the content of its claims, and the specific embodiments described in the specification can be used to interpret the content of the claims.

Claims

1. A device for testing the temperature characteristics of a quartz crystal oscillator, characterized in that: The utility model relates to a test head device for semiconductor wafer, including base, a plurality of load trays, tray frame, motor, sealing cover, a plurality of test heads, display, computer and host computer control machine, the tray frame rotation is connected on the base, the motor is installed in the base, the tray frame bottom is connected with the output shaft of motor, a plurality of load trays are placed in order from top to bottom on the tray frame, a plurality of load trays all are equipped with a plurality of test sites, the sealing cover is detachably connected on the base, and the load tray and tray frame all are located in the sealing cover, a plurality of test heads are vertically installed in the sealing cover side, and a plurality of test heads correspond with a plurality of load trays height position respectively, the display is installed on the base, the computer and host computer control machine are all installed in the base, a plurality of test heads, display and host computer control machine all are connected with the computer signal.

2. The temperature characteristic testing device for a quartz crystal oscillator according to claim 1, characterized by: Each load tray includes a test disc, two fixed discs and a plurality of fixing members, the test disc is provided with a plurality of test sites on both end faces, both fixed discs are provided with a plurality of pressing blocks same in number with the test sites, both fixed discs are installed on the upper and lower end faces of the test disc by the fixing members, and the pressing blocks on the fixed discs correspond one by one with the test sites on the test disc.

3. The temperature characteristic testing device for a quartz crystal oscillator according to claim 2, characterized by: The fixing member is a cantilever pin, and the test disc and the fixed disc are provided with a plurality of corresponding fixing holes.

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