Probe grinding and fixing equipment

Abstract

The utility model provides probe polishing and fixing equipment, which relates to the field of probe processing and comprises a circular plate, three driving frames are connected to the peripheral side of the circular plate, first threaded columns are arranged in the driving frames and are distributed around the central axis of the circular plate in a circumferential array manner, and the central axes of the first threaded columns are vertically intersected with the central axis of the circular plate; the first threaded columns rotate around the center shafts of the first threaded columns and are matched with matching blocks. The three clamping columns are all located outside the front face of the circular plate, the clamping columns are parallel to the center axis of the circular plate, and the clamping columns are connected to the matching blocks in a one-to-one correspondence mode; and a supporting rod is arranged on the supporting piece and connected with the circular plate. According to the utility model, the probe can be stably fixed, a plurality of fixing assemblies can be adjusted at a time, and the practicability is high.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of probe processing, in particular to a probe fixing device. BACKGROUND

[0002] The probe is a sensor component for detecting and measuring specific physical, chemical or biological parameters, mainly responsible for converting the measured parameters into electrical signals or other measurable signals; when the probe is processed, the probe needs to be polished to a specified shape so that the sensing elements and other working components can work normally and the probe can be easily installed on the device for detection and measurement. Before the probe is polished, it needs to be fixed first. Since the probe is small in size, the general fixing mechanism is prone to unstable fixation after fixing the probe, which affects the accuracy of the probe polishing. Secondly, the fixation of the probe generally requires multiple fixing components, which is troublesome to adjust multiple fixing components. CONTENT OF THE UTILITY MODEL

[0003] In order to solve the above-mentioned defects of the related prior art, the present application provides a probe polishing and fixing device which can stably fix the probe and can adjust multiple fixing components at one time, and has strong practicality.

[0004] In order to achieve the above-mentioned purpose, the present application adopts the following technology:

[0005] A probe polishing and fixing device, comprising:

[0006] A circular plate, three drive frames are connected to the periphery of the circular plate, a first threaded column is arranged in each drive frame, the first threaded columns are arranged in a circumferential array around the central axis of the circular plate, the central axes are perpendicular to the central axis of the circular plate, and the first threaded columns are rotatably arranged around the central axes thereof and are each provided with a matching block;

[0007] Three clamping columns are arranged outside the front surface of the circular plate, the clamping columns are arranged parallel to the central axis of the circular plate, and the clamping columns are connected to the matching blocks one by one;

[0008] A support member is provided with a support rod, and the support rod is connected to the circular plate.

[0009] Further, one end of each first threaded column away from the circular plate extends out of the drive frame and is coaxially connected with a worm gear, each drive frame is connected with two mounting plates, a worm is rotatably connected between the mounting plates, and the worm cooperates with the worm gear.

[0010] Further, the drive plates are arranged at intervals on the back surface of the circular plate and the intervals are adjustable, six connecting strips are connected to the periphery of the drive plates, the connecting strips are each connected with a rack, the racks are arranged parallel to the central axis of the circular plate, the two ends of the worm extend out of the mounting plates and are coaxially connected with a gear, and the gears are one by one correspondingly matched with the racks.

[0011] Further, the second threaded column is coaxially connected to the back of the circular plate, the second threaded column is connected to the support, the driving plate is vertically penetrated by a threaded hole, and the driving plate is matched with the second threaded column through the threaded hole.

[0012] The probe polishing and fixing device has the advantages that:

[0013] 1. The first threaded column and the matching block are matched to drive the clamping column to clamp the probe, and the driving of the first threaded column on the matching block is unidirectional, so that the clamping column can stably fix the probe.

[0014] 2. The driving plate can drive multiple clamping columns to move at one time, and the operation is more convenient when clamping the probe. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 is a perspective view of the probe polishing and fixing device of the embodiment of the application.

[0016] Figure 2 is an exploded structural view of the probe polishing and fixing device of the embodiment of the application from another perspective.

[0017] Marked in the figure: 1-circular plate, 11-driving frame, 12-first threaded column, 13-matching block, 14-worm gear, 15-mounting plate, 16-worm, 17-gear, 2-clamping column, 3-support, 31-supporting rod, 32-second threaded column, 33-rotary air cylinder, 4-driving plate, 41-connection strip, 42-rack. DETAILED DESCRIPTION

[0018] To make the purpose, technical scheme and advantages of the embodiments of the application clearer, the embodiments of the application will be described in detail below with reference to the drawings, but the embodiments described in the application are only part of the embodiments of the application, not all the embodiments.

[0019] As shown in the drawings, Figure 1 The embodiment provides a probe polishing and fixing device, which comprises a circular plate 1, a clamping column 2 and a support 3.

[0020] Specifically, as shown in the drawings, Figure 2 The circular plate 1 is connected with three driving frames 11 on the periphery, the driving frames 11 are each provided with a first threaded column 12, the first threaded columns 12 are circumferentially arrayed around the central axis of the circular plate 1, the central axes are all perpendicular to the central axis of the circular plate 1, the first threaded columns 12 are all rotationally arranged around the central axes thereof and are all matched with matching blocks 13, and the first threaded columns 12 are used to drive the matching blocks 13 to move.

[0021] Specifically, asFigure 1 and Figure 2 As shown in

[0022] Specifically, as shown in Figure 1 The support 3 is provided with a support rod 31 connected with the circular plate 1, the support 3 is used for mounting the device to a working surface, and the support rod 31 is used for supporting the circular plate 1.

[0023] In work, the probe is coaxially extended into the clamping columns 2 between the circular plate 1, and the one end of the probe is in contact with the front surface of the circular plate 1. The first threaded column 12 drives the movement of the matching block 13, and then drives the movement of the clamping column 2, so that the clamping column 2 is in contact with the first threaded column 12. The unidirectional driving of the first threaded column 12 to the matching block 13 is completed.

[0024] Preferably, as shown in Figure 1 and Figure 2 The end of the first threaded column 12 away from the circular plate 1 is extended out of the driving frame 11 and coaxially connected with a worm wheel 14. The driving frame 11 is connected with two mounting plates 15, and the mounting plates 15 are rotatably connected with a worm 16. The worm 16 is matched with the worm wheel 14. The rotation of the worm 16 drives the rotation of the worm wheel 14. The rotation of the first threaded column 12 can be driven by the worm wheel 14. Due to the unidirectional driving of the worm 16 to the worm wheel 14, the clamping of the probe by the clamping column 2 is further stabilized.

[0025] Preferably, as shown in Figure 1 and Figure 2 The driving plate 4 is arranged on the back surface of the circular plate 1 with adjustable spacing, and the driving plate 4 is connected with six connecting strips 41 on the side. The connecting strips 41 are connected with a rack 42, and the rack 42 is arranged parallel to the central axis of the circular plate 1. The two ends of the worm 16 are extended out of the mounting plate 15 and coaxially connected with a gear 17. The gear 17 is matched with the rack 42 one by one. Moving the driving plate 4 can drive the rack 42 to move through the connecting strip 41. The worm 16 can be further driven to rotate through the cooperation of the rack 42 and the gear 17. This design can drive three clamping columns 2 to move the same distance at one time by moving the driving plate 4. Specifically, the spacing between the central axis of different clamping columns 2 and the central axis of the circular plate 1 should be equal.

[0026] Preferably, as shown in Figure 1As shown, the back of the circular plate 1 is coaxially connected with a second threaded column 32, the second threaded column 32 is rotatably connected to the support 3, the driving plate 4 is vertically penetrated with a threaded hole, the driving plate 4 is matched with the second threaded column 32 through the threaded hole, the support 3 is provided with a rotary air cylinder 33, the driving shaft of the rotary air cylinder 33 is coaxially connected with the second threaded column 32, the rotary air cylinder 33 is used for driving the second threaded column 32 to rotate, and then driving the driving plate 4 to move.

[0027] The above merely illustrates the preferred embodiments of the present application, and is not used to limit the present application, and obviously, those skilled in the art can make various modifications and variations to the present application without departing from the spirit and scope of the present application.

Claims

1. A probe grinding and fixing device, characterized in that, include: A circular plate (1) is connected to three drive frames (11) on its periphery. Each drive frame (11) is provided with a first threaded post (12). The first threaded posts (12) are arranged in a circular array around the central axis of the circular plate (1). Their central axes are perpendicular to the central axis of the circular plate (1). Each first threaded post (12) is rotated around its own central axis and is fitted with a mating block (13). There are three clamping posts (2), all located outside the front of the circular plate (1). The clamping posts (2) are set parallel to the central axis of the circular plate (1), and the clamping posts (2) are connected to the mating blocks (13) one by one. Support member (3), on which support rod (31) is provided, and support rod (31) is connected to circular plate (1).

2. The probe grinding and fixing device according to claim 1, characterized in that, The first threaded column (12) extends out of the drive frame (11) at the end away from the circular plate (1) and is coaxially connected to the worm gear (14). The drive frame (11) is connected to two mounting plates (15). The mounting plates (15) are rotatably connected to the worm (16), and the worm (16) cooperates with the worm gear (14).

3. The probe grinding and fixing device according to claim 2, characterized in that, The circular plate (1) has drive plates (4) spaced apart on the back with adjustable spacing. The drive plates (4) are connected to six connecting strips (41) around their periphery. Each connecting strip (41) is connected to a rack (42). The rack (42) is set parallel to the central axis of the circular plate (1). Both ends of the worm (16) extend out of the mounting plate (15) and are coaxially connected to gears (17). The gears (17) are matched with the racks (42) one by one.

4. The probe grinding and fixing device according to claim 3, characterized in that, The back of the circular plate (1) is coaxially rotatably connected to a second threaded post (32), which is rotatably connected to a support member (3). The drive plate (4) has a threaded hole vertically penetrating its surface. The drive plate (4) is fitted to the second threaded post (32) through the threaded hole. The support member (3) is provided with a rotating cylinder (33), and the drive shaft of the rotating cylinder (33) is coaxially connected to the second threaded post (32).

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