Test device and test system
By independently installing the motherboard and setting up connectors with multiple interface types in the test device, the problem of poor compatibility of traditional test devices is solved, and efficient and stable testing of multiple types of storage devices is achieved.
Patent Information
- Application Number
- CN202423318108.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2026-01-09
- Estimated Expiration
- 2034-12-31
AI Technical Summary
Traditional testing equipment is limited by the number and type of motherboard interfaces, which means it can only test specific types of solid-state drives, resulting in poor compatibility and low testing efficiency.
Design a testing device that independently mounts the motherboard inside a housing, with connectors mounted on the housing. This device supports multiple interface types and enables direct and stable connection of different types of storage devices through adapter cables and limiting covers, thereby enhancing heat dissipation.
It enables compatibility testing of different types of storage devices, improves testing efficiency and stability, reduces the complexity of manual operation, and meets the requirements of high-performance testing.
Smart Images
Figure CN223784895U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the field of chips, in particular to a testing device and a testing system. BACKGROUND
[0002] Traditional testing of storage devices, such as solid state disks, requires direct connection of the to-be-tested solid state disk to the mainboard of the testing device.
[0003] However, due to the limited number of interfaces on the mainboard of the testing device for testing, and the fixed type of the interfaces, only a specific type of to-be-tested solid state disk can be selected for connection and testing according to the type of the interfaces on the mainboard and the number of the interfaces. If other types of solid state disks are to be tested, other types of mainboards must be replaced in the testing device for testing, which has poor compatibility and low testing efficiency.
[0004] Therefore, how to use one testing device to test different types of to-be-tested storage devices and improve testing efficiency has become a problem to be solved in the field. CONTENT OF THE INVENTION
[0005] The purpose of the present application is to provide a testing device and a testing system, which can use one testing device to test different types of to-be-tested storage devices and improve testing efficiency.
[0006] The testing device disclosed in the embodiments of the present application comprises a shell, a mainboard and a plurality of connectors. The shell comprises a first shell and a second shell, the second shell is arranged close to the side wall of the first shell. The mainboard is arranged in the first shell, the plurality of connectors are arranged on the second shell, and the plurality of connectors are connected to the mainboard. The interfaces of the plurality of connectors comprise at least two different types of interfaces.
[0007] Optionally, the top surface of the first shell has a preset height relative to the top surface of the second shell, and the height of the first shell is greater than the height of the electrical elements on the mainboard.
[0008] Optionally, the plurality of connectors are arranged on the top surface of the second shell.
[0009] Optionally, the plurality of connectors comprise 2.5-inch connectors, M.2 connectors and USB connectors.
[0010] Optionally, the first shell is provided with a through slot on the side wall close to the top surface of the second shell, and the plurality of M.2 connectors are arranged close to the position of the through slot. The testing device further comprises an adapter cable, one end of the adapter cable is connected to the mainboard, and the other end of the adapter cable passes through the through slot and is connected to the M.2 connector.
[0011] Optionally, a plurality of heat dissipation holes are arranged on the side wall of the first shell in a spaced manner, and the plurality of heat dissipation holes extend along the diagonal direction of the side wall of the first shell.
[0012] Optionally, the test device further comprises a limiting cover plate, which is used to simultaneously press the to-be-tested M.2 storage device connected with the plurality of M.2 connectors.
[0013] Optionally, the limiting cover plate comprises a cover plate, a first supporting part and a second supporting part, the cover plate is in a strip shape, the first supporting part and the second supporting part are respectively located at two ends of the cover plate, and the first supporting part and the second supporting part are respectively connected with the top surface of the second shell and support the cover plate to a preset height.
[0014] Optionally, the first supporting part is provided with a first protrusion on the side away from the cover plate, the second supporting part is provided with a second protrusion on the side away from the cover plate, the top surface of the second shell is provided with a first mounting hole and a second mounting hole corresponding to the positions of the first protrusion and the second protrusion respectively, and the first protrusion and the second protrusion are respectively embedded in the first mounting hole and the second mounting hole.
[0015] The embodiment of the present application further discloses a test system comprising an upper computer, and the test system further comprises the test device.
[0016] The present application improves the test device, the electronic devices and connection wires on the mainboard in the test device are better protected in the first shell by independently installing the mainboard in the first shell, so that the performance of the mainboard is prevented from being reduced due to the invasion of dust and water vapor from the outside; and a plurality of connectors are arranged on the second shell, so that the signals of the mainboard can be separated by the plurality of connectors after the plurality of connectors are connected with the mainboard, so that the to-be-tested storage device does not need to be directly inserted on the mainboard, and the interface types of the plurality of connectors are different, so that different types of to-be-tested storage devices can be directly inserted on the connectors for testing, which is simple and convenient, improves the test compatibility of the test device, and simultaneously, the test efficiency is improved by testing different types of to-be-tested storage devices without replacing the mainboard. BRIEF DESCRIPTION OF DRAWINGS
[0017] The accompanying drawings included are intended to provide a further understanding of the embodiments of the present application, and constitute a part of the specification, serve to explain the principles of the present application, and together with the text description, explain the principles of the present application. Obviously, the accompanying drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor. In the drawings:
[0018] Figure 1 a schematic diagram of a first embodiment of a test device of the present application;
[0019] Figure 2 a schematic diagram of a second embodiment of a test device of the present application;
[0020] Figure 3 a schematic diagram of a third embodiment of a test device of the present application;
[0021] Figure 4 a schematic diagram of a limiting cover plate in the third embodiment of the test device of the present application;
[0022] Figure 5 a schematic diagram of an embodiment of a test system of the present application.
[0023] Wherein, 10, test system; 100, test device; 110, shell; 120, first shell; 121, through slot; 122, heat dissipation hole; 130, second shell; 131, first mounting hole; 132, second mounting hole; 140, mainboard; 150, connector; 151, 2.5 inch connector; 152, M.2 connector; 153, USB connector; 160, limiting cover plate; 161, cover plate; 162, first support part; 163, first protrusion; 164, second support part; 165, second protrusion; 170, adapter wire; 200, upper computer. DETAILED DESCRIPTION
[0024] The present application will be described in detail below with reference to the accompanying drawings and optional embodiments. It should be noted that the following described embodiments or technical features can be combined in any way to form new embodiments without conflict.
[0025] Figure 1 a schematic diagram of a first embodiment of a test device of the present application, as Figure 1 shown, the embodiment of the present application discloses a test device 100, comprising a shell 110, a mainboard 140, a plurality of connectors 150; the shell 110 comprises a first shell 120 and a second shell 130, the second shell 130 is arranged close to the side wall of the first shell 120; the mainboard 140 is arranged in the first shell 120, the plurality of connectors 150 are arranged on the second shell 130, and the plurality of connectors 150 are connected with the mainboard 140, the interfaces of the plurality of connectors 150 comprise at least two different interface types.
[0026] The application improves the test device 100, by independently installing the mainboard 140 in the test device 100 in the first shell 120, so that the electronic devices and connection wires on the mainboard 140 can be better protected in the first shell 120, preventing the performance of the mainboard 140 from being reduced due to external dust and water vapor intrusion; and the plurality of connectors 150 are arranged on the second shell 130, so that after the plurality of connectors 150 are connected with the mainboard 140, the plurality of connectors 150 can separate the signals of the mainboard 140, so that the to-be-tested storage device does not need to be directly plugged on the mainboard 140, and the interface types of the plurality of connectors 150 are different, so that different types of to-be-tested storage devices can be directly plugged on the connectors 150 for testing, which is simple and convenient, improves the test compatibility of the test device 100, and at the same time, the test efficiency is improved by using one test device 100 to test different types of to-be-tested storage devices without replacing the mainboard 140.
[0027] In the application, the top surface of the first shell 120 has a preset height relative to the top surface of the second shell 130, and the height of the first shell 120 is greater than the height of the electrical elements on the mainboard 140. Since the height of the first shell 120 is greater than the height of the electrical elements on the mainboard 140, the first shell 120 can form a clearance for the electrical elements on the mainboard 140, so that the first shell 120 is not easy to touch the electrical elements on the mainboard 140 and cause damage to the electrical elements, which is beneficial to prolong the service life of the mainboard 140 and ensure the stability of the test device 100.
[0028] In addition, in the application, the plurality of connectors 150 are arranged on the top surface of the second shell 130. In this way, the plurality of connectors 150 can be directed towards the front of the tester, and the tester can more easily perform plugging actions on different types of to-be-tested storage devices according to the positions of the plurality of connectors 150, thereby facilitating the tester to connect different types of to-be-tested storage devices with the test device 100, and improving the test efficiency.
[0029] In the application, the plurality of connectors 150 include a 2.5-inch connector 151, an M.2 connector 152, and a USB connector 153. In this way, the test device 100 can meet the requirements of testing various types of storage devices such as 2.5-inch SSDs, M.2 PCIe SSDs, and PSSDs, and at the same time, according to the specifications of the connectors 150 and the performance of the mainboard 140, the maximum supported read and write speed requirements are 7400MB / s and 6500MB / s, which improves the test performance of the test device 100 and improves the test capacity.
[0030] The number of various types of connectors 150 can be designed according to actual test requirements, for example, four USB connectors 153, four 2.5-inch connectors 151, and six M.2 connectors 152 can be set to meet the test requirements of the test device 100 on different types and different numbers of storage devices to be tested.
[0031] Further, the first shell 120 is provided with a through slot 121 on the side wall close to the top surface of the second shell 130, and the plurality of M.2 connectors 152 are arranged close to the position of the through slot 121. The test device 100 further comprises an adapter wire 170, one end of which is connected with the mainboard 140, and the other end thereof passes through the through slot 121 and is connected with the M.2 connector 152. By providing the through slot 121 on the side wall of the first shell 120, the adapter wire 170 can directly pass through the through slot 121 and be connected with the M.2 connector 152, avoiding the complicated internal wiring in the first shell 120 after the mainboard 140 is installed, and making the installation of the mainboard 140 and the M.2 connector 152 more convenient and fast.
[0032] In addition, since the M.2 storage device, such as the M.2 solid state disk, has a high requirement for heat dissipation, and the heat dissipation will affect the performance of the M.2 solid state disk, therefore, by providing the through slot 121 on the side wall of the first shell 120, and the through slot 121 corresponding to the position of the M.2 connector 152, the through slot 121 provides an additional ventilation path for the M.2 connector 152 and the storage device to be tested connected with the M.2 connector 152, which is conducive to air circulation, thereby assisting heat dissipation, reducing the working temperature of the M.2 connector 152 and the mainboard 140, and is conducive to improving the accuracy of the test.
[0033] When the mainboard 140 generates a large amount of heat during continuous testing, the heat accumulation may affect the test performance of the mainboard 140, thereby causing inaccurate test of the storage device to be tested. Based on this problem, the test device 100 is improved, and the specific improvements are as follows:
[0034] Figure 2 The second embodiment of the test device of the present application is shown in FIG. 2, wherein the side wall of the first shell 120 is provided with a plurality of heat dissipation holes 122 arranged at intervals, and the plurality of heat dissipation holes 122 extend along the diagonal direction of the side wall of the first shell 120. Figure 2
[0035] Since the mainboard 140 is installed in the first shell 120, the heat generated by the mainboard 140 is mainly concentrated in the first shell 120, therefore, the present embodiment is provided with the heat dissipation holes 122 on the side wall of the first shell 120, and the heat dissipation holes 122 are arranged along the diagonal lines, so that the heat can be dissipated through multiple paths formed by the heat dissipation holes 122, instead of being concentrated in a certain direction, which helps to more evenly disperse the heat and improve the overall heat dissipation efficiency.
[0036] And the heat dissipation holes 122 arranged along the diagonal lines of the side wall of the first shell 120 can better guide the internal hot air to be discharged outward, forming an effective air flow channel, which can increase the path length of air flow, thereby increasing the heat dissipation area, reducing the residence time of hot air in the shell 110, and further improving the heat dissipation effect.
[0037] Further, since the M.2 storage devices to be tested, such as M.2 solid state disks, are generally long and thin, when the connecting end of the M.2 solid state disk is inserted into the M.2 connector 152, the other end will easily warp. Based on this problem, the present application also improves the test device 100 as follows:
[0038] Figure 3 a schematic view of a third embodiment of the test device of the present application, Figure 4 a schematic view of a limiting cover plate in the third embodiment of the test device of the present application, as shown in Figure 3 and Figure 4 The test device 100 further comprises a limiting cover plate 160, which is used to simultaneously press the M.2 storage devices to be tested connected to the plurality of M.2 connectors 152.
[0039] When the plurality of M.2 storage devices to be tested are connected to the plurality of M.2 connectors 152, the limiting cover plate 160 is used to simultaneously press the M.2 storage devices to be tested away from the M.2 connectors 152, and the limiting cover plate 160 can uniformly apply pressure to ensure that each M.2 storage device is in close contact with the corresponding connector 150, thereby avoiding data transmission errors or test failures caused by looseness or poor contact.
[0040] The limiting cover plate 160 can simultaneously press the plurality of M.2 storage devices, realizing parallel testing of multiple devices of the same protocol, greatly improving the test efficiency and throughput. In addition, the limiting cover plate 160 only needs to be operated once to fix the plurality of storage devices, reducing the time for repeated plugging and adjusting, and reducing the complexity and error of manual operation.
[0041] Specifically, the limiting cover plate 160 includes a cover plate 161, a first supporting part 162 and a second supporting part 164, the cover plate 161 is in a strip shape; the first supporting part 162 and the second supporting part 164 are respectively located at two ends of the cover plate 161; the first supporting part 162 and the second supporting part 164 are respectively connected with the top surface of the second shell 130 and support the cover plate 161 to a preset height.
[0042] When the plurality of M.2 storage devices to be tested are connected with the plurality of M.2 connectors 152, the limiting cover plate 160 is installed from above the plurality of M.2 storage devices, wherein the cover plate 161 spans the plurality of M.2 storage devices and abuts against the plurality of M.2 storage devices, and the first supporting part 162 and the second supporting part 164 are respectively connected with the top surface of the second shell 130, so that the limiting cover plate 160 is fixed as a whole on the top surface of the second shell 130, and the cover plate 161 abuts against the M.2 storage devices to be tested; through the supporting action of the first supporting part 162 and the second supporting part 164, the cover plate 161 can exert uniform pressure within the entire length range, ensuring that the contact conditions between all the M.2 storage devices to be tested and the connector 150 are consistent; and the strip-shaped cover plate 161 can disperse the pressure and prevent the M.2 storage devices from being damaged due to excessive local pressure.
[0043] The first supporting part 162 and the second supporting part 164 are respectively located at two ends of the cover plate 161 and are firmly connected with the top surface of the second shell 130, forming a stable supporting structure to prevent the cover plate 161 from tilting or shifting during the test, and can limit the plurality of M.2 storage devices to prevent the M.2 storage devices from falling off or loosening with the M.2 connector 152, thereby improving the stability of the test.
[0044] Specifically, the first supporting part 162 is provided with a first protrusion 163 on the side away from the cover plate 161, the second supporting part 164 is provided with a second protrusion 165 on the side away from the cover plate 161, the top surface of the second shell 130 is provided with a first mounting hole 131 and a second mounting hole 132 corresponding to the positions of the first protrusion 163 and the second protrusion 165, and the first protrusion 163 and the second protrusion 165 are respectively embedded in the first mounting hole 131 and the second mounting hole 132.
[0045] When the M.2 storage devices to be tested are connected with the M.2 connector 152, the limiting cover plate 160 is installed from above the M.2 storage devices, and the first supporting part 162 and the second supporting part 164 are respectively embedded in the first mounting hole 131 and the second mounting hole 132 through the first protrusion 163 and the second protrusion 165, and the first mounting hole 131 and the second mounting hole 132 limit and fix the first protrusion 163 and the second protrusion 165, preventing the limiting cover plate 160 from loosening or shifting and improving the stability of the test.
[0046] The limiting cover plate 160 in the embodiment can be connected with the second shell 130 in a plug-in manner, or can be connected with the second shell 130 in a screwing manner. The application does not limit the specific connection manner, and only takes the limiting cover plate 160 connected with the second shell 130 in a plug-in manner as an example for illustration.
[0047] Figure 5 An embodiment of the test system of the application is shown in the schematic view as Figure 5 The embodiment of the application further discloses a test system 10, which comprises a host computer 200. The test system 10 further comprises the test device 100 described above. The test device 100 is connected with the host computer 200. The test device 100 transmits test signals to the host computer 200 by testing the to-be-tested storage device. After receiving the test signals, the host computer 200 processes and analyzes the test signals, and obtains test results. The test personnel can accurately obtain the read-write performance data of the to-be-tested storage device by obtaining the test conclusion through the host computer 200. The host computer 200 can be a computer or the like.
[0048] However, because the number of interfaces used for testing on the mainboard 140 in the test device 100 is limited, and the interface types are fixed, only a specific type of to-be-tested solid state disk can be selected according to the interface types and the number of interfaces on the mainboard 140 to be connected and tested, and the compatibility is poor, and the test efficiency is low.
[0049] Based on the above problems, the test device 100 in the test system 10 is improved. The mainboard 140 in the test device 100 is independently installed in the first shell 120, so that the electronic devices and connection wires on the mainboard 140 can be better protected in the first shell 120, to prevent the performance of the mainboard 140 from being reduced due to the invasion of dust and water vapor from the outside. A plurality of connectors 150 are arranged on the second shell 130. After the plurality of connectors 150 are connected with the mainboard 140, the plurality of connectors 150 can separate the signals of the mainboard 140. In this way, the to-be-tested storage device does not need to be directly plugged on the mainboard 140. In addition, the interface types of the plurality of connectors 150 are different. In this way, different types of to-be-tested storage devices can be directly plugged on the connectors 150 for testing, which is simple and convenient, improves the test compatibility of the test device 100, and at the same time, the test efficiency of the test system 10 is further improved.
[0050] It should be noted that the inventive concept of the present application can form a very large number of embodiments, but the length of the application file is limited and cannot list them one by one, so the above described embodiments or technical features can be combined to form new embodiments without conflict, and the combination of each embodiment or technical feature will enhance the original technical effect.
[0051] The above is a further detailed description of the present application in combination with specific optional embodiments, and cannot be considered as limiting the specific implementation of the present application to these descriptions. For ordinary skilled persons in the art to which the present application belongs, without departing from the concept of the present application, a number of simple deductions or substitutions can be made, which should be considered as belonging to the protection scope of the present application.
Claims
1. A testing device, characterized in that, The device includes a housing, a motherboard, and multiple connectors. The housing includes a first housing and a second housing, with the second housing disposed near the side wall of the first housing. The motherboard is disposed within the first housing, and the multiple connectors are disposed on the second housing and connected to the motherboard. The interfaces of the multiple connectors include at least two different interface types.
2. The testing apparatus as described in claim 1, characterized in that, The top surface of the first housing has a predetermined height relative to the top surface of the second housing, and the height of the first housing is greater than the height of the electrical components on the motherboard.
3. The testing apparatus as described in claim 2, characterized in that, Multiple connectors are disposed on the top surface of the second housing.
4. The testing apparatus as described in claim 3, characterized in that, The connectors include 2.5-inch connectors, M.2 connectors, and USB connectors.
5. The testing apparatus as described in claim 4, characterized in that, A through slot is provided on the side wall of the first housing near the top surface of the second housing, and multiple M.2 connectors are arranged near the through slot; the test device also includes an adapter cable, one end of which is connected to the motherboard, and the other end passes through the through slot and is connected to the M.2 connector.
6. The testing apparatus as described in claim 1, characterized in that, The first housing has a plurality of heat dissipation holes spaced apart on its sidewall, and the plurality of heat dissipation holes extend along the diagonal direction of the sidewall of the first housing.
7. The testing apparatus as described in claim 5, characterized in that, The testing device also includes a limiting cover plate, which is used to simultaneously press the M.2 storage device under test connected to multiple M.2 connectors.
8. The testing apparatus as described in claim 7, characterized in that, The limiting cover plate includes a cover plate, a first support portion and a second support portion. The cover plate is elongated. The first support portion and the second support portion are located at both ends of the cover plate. The first support portion and the second support portion are connected to the top surface of the second housing and support the cover plate at a preset height.
9. The testing apparatus as described in claim 8, characterized in that, The first support portion has a first protrusion on the side away from the cover plate, and the second support portion has a second protrusion on the side away from the cover plate. The top surface of the second housing is provided with a first mounting hole and a second mounting hole corresponding to the positions of the first protrusion and the second protrusion, respectively, and the first protrusion and the second protrusion are respectively embedded in the first mounting hole and the second mounting hole.
10. A testing system, comprising a host computer, characterized in that, The testing system further includes a testing device as described in any one of claims 1 to 9, wherein the host computer is connected to the testing device.