Test group of electronic device and contact element thereof

Abstract

The utility model provides a test group of electronic device and contact piece thereof, the test group of electronic device includes a shell and at least one contact piece, it includes a shell and at least one contact piece, two parallel surfaces of the shell define at least one slot substantially equidistantly arranged at intervals, each contact piece is provided with a body and a clamping section integrally connected with the body, an arc edge is formed between the arc protruding end of the body of each contact piece and the outer side edge of the horizontal section of the clamping section, and a long arc groove is formed between the body of each contact piece and the inner side edge of the horizontal section of the clamping section. Therefore, the contact element can obtain the required elastic force by utilizing the metal ductility of the contact element, so that the electrical characteristics of the contact element can be maintained, and the effective bandwidth can be improved, so that the test requirement of the electronic device to be tested can be met.

Description

Technical Field

[0001] This utility model relates to the field of testing technology for electronic devices, and in particular to a test assembly for an electronic device and its contacts, which enables the contacts to utilize their own metallic ductility to ensure the integrity of the test contact, improve inductance, and provide effective test bandwidth to meet the testing requirements of the electronic device under test. Background Technology

[0002] With the advancement of semiconductor technology, in order to ensure that electronic devices (integrated circuit components) have the highest possible quality when sold to customers, the requirements for the precision of testing equipment have increased significantly. In high-frequency testing, the test signal can be effectively transmitted through the contacts of the test assembly of the electronic device. Therefore, when the contacts have many contact points, discontinuities are easily generated, resulting in impedance discontinuities, causing test signal reflection loss and distortion. Moreover, too many contact points will also make the response speed of the contacts slower, affecting the accuracy of the test.

[0003] Due to technological advancements, existing electronic device test suites have evolved in size, shape, and electronic characteristics to adapt to the architecture of the substrate and the electronic device under test. For example... Figure 1 As shown, the existing electronic device test assembly 10 includes a housing 11 and a plurality of contacts 15 disposed on the housing 11. The housing 11 has opposing parallel surfaces, one side of which is relatively close to an electronic device under test 30 having a plurality of pins 31, while the other side is adjacent to a load plate 20 having a plurality of pins 21. The housing 11 has at least one slot 12, each slot 12 extending from the two opposing parallel surfaces through the housing 11. Each of the contacts 15 can be housed within the housing 11. In the slot 12, each of the contact members 15 has a first electrical contact 151 and a second electrical contact 152 that selectively engage with the corresponding pin 31 of the electronic device under test 30 and the corresponding lead 21 of the circuit board 20. Each of the contact members 15 is positioned in the housing 11 by a first elastic member 16 and a second elastic member 17, so that the first and second electrical contacts 151 and 152 of each of the contact members 15 are pushed toward the electronic device under test 30 and the circuit board 20 during the test and remain in contact.

[0004] Since the first and second electrical contacts 151 and 152 of each contact 15 need to maintain contact with the pins 31 of the electronic device under test 30 and the leads 21 of the circuit board 20 through a wiping action generated by their elastic deformation, it is generally believed that such a wiping action can help form a good transmission path through each contact 15, so that both ends have a good connection. However, according to long-term testing experiments, the aforementioned wiping action may not necessarily achieve reliable contact, and may even damage the contact surfaces of the first and second electrical contacts 151 and 152 of the contact 15, thus shortening the service life of the test group 10 and its contact 15.

[0005] Meanwhile, the contacts 15 of the existing test group 10 all require elastic members 16 and 17 for fixation and elasticity to maintain contact with the electronic device under test 30 and the circuit board 20. However, this design of contact 15 requiring elastic members for fixation and orientation is not practical. Due to the lack of a temporary fixation design, the contact 15 can easily fall off after being inserted into the slot 12 of the housing 11, causing inconvenience in assembly. Furthermore, it is known that the elastic members 16 and 17 must be considered in terms of their lifespan, as they may age due to external factors, thus affecting the elastic coefficient. Moreover, replacing a single contact 15 requires removing the entire elastic member, which is not only extremely complicated and inconvenient, but also easily affects other undamaged contacts 15, thereby affecting the original contact 15's performance characteristics.

[0006] In other words, minimizing wear and deterioration between the test contacts of the electronic device and the pins 31 of the electronic device under test 30 and the circuit board 20 has become an important issue for the industry.

[0007] In view of the aforementioned shortcomings and needs, the creator believed that further improvements were necessary. Therefore, based on years of experience in related technologies and product design and manufacturing, the creator researched and created solutions to address the above-mentioned deficiencies. Through continuous research and trial production, the creator successfully developed a test kit for electronic devices and its contacts, thereby solving the inconvenience and trouble caused by the aforementioned problems with the contacts of existing electronic device test kits. Utility Model Content

[0008] Therefore, the main objective of this invention is to provide a test assembly for an electronic device and its contacts, which can utilize the metal ductility of the contacts themselves to obtain the elastic force that replaces the existing elastic components, while retaining the characteristics that the test carrier itself can provide.

[0009] Furthermore, another major objective of this utility model is to provide a test assembly for an electronic device and its contacts, which can fix the contacts without the need for elastic components, so as to facilitate the replacement of a single contact without affecting other undamaged contacts.

[0010] Furthermore, another major objective of this invention is to provide a test assembly and its contacts for an electronic device, which can scrape off oxides generated on the surface of the contacts due to prolonged placement during testing, thereby achieving a self-cleaning function and improving the conductivity of the test assembly system for the electronic device.

[0011] Based on this, the present invention mainly achieves the aforementioned objectives and effects through the following technical means: the present invention provides a test set for an electronic device, used to effectively transmit test electrical signals between an electronic device under test having a plurality of pins and a load board having a relative plurality of pins, characterized in that the test set comprises:

[0012] A housing having a first surface and a second surface that are relatively parallel, a plurality of slots are provided at equal intervals between the first surface and the second surface of the housing, a limiting channel is formed on one side of each slot, and each limiting channel includes a horizontal section communicating with the slot and a vertical section different from the side of the slot, wherein the horizontal section and the vertical section are communicating, and the horizontal section has a notch relative to the second surface of the housing.

[0013] A plurality of contacts, each having a body capable of being accommodated in a corresponding slot in the housing, the body having a locking section capable of being accommodated in the limiting channel, the height of the locking section being less than the limiting channel, the locking section comprising a horizontal section and a vertical section, the bottom surface of the horizontal section of the locking section forming a contact surface protruding from the second surface of the housing for contacting the lead of the load plate, each body having an arcuate protrusion protruding from the first surface of the housing for rolling contact with the pin of the electronic device under test, and each body forming an arcuate edge between the arcuate protrusion and the outer edge of the horizontal section of the locking section, and forming a long arcuate groove extending along the arcuate edge between the inner edges of each body.

[0014] The test group of the electronic device, wherein: the top edge of the body of the contact is formed with a groove, and the groove is located between the deepest inner edge of the long arc groove and the opening of the long arc groove.

[0015] The test group of the electronic device, wherein: the limiting channel of the housing forms a stop oblique recess on the outer side of the included angle between the vertical segment and the horizontal segment, and the locking segment of each contact forms a stop oblique protrusion on the outer side of the included angle between the vertical segment and the horizontal segment, and the stop oblique protrusion of the contact can be engaged in the stop oblique recess of the limiting channel.

[0016] The test group of the electronic device, wherein: the angle between the inner edge of the stop recess and the vertical section of the limiting channel is 22 degrees to 42 degrees, and the outer edge of the stop convex portion can correspondingly abut against the inner edge of the stop recess.

[0017] The test group of the electronic device, wherein: the angle between the inner edge of the stop recess and the vertical section of the limiting channel is 32±2 degrees, and the outer edge of the stop convex part can correspondingly abut against the inner edge of the stop recess.

[0018] The test group of the electronic device, wherein: the top of the latching section of the body of the contact member has a stop portion protruding from one side of the stop oblique protrusion.

[0019] A contact element is used in a test assembly of an electronic device to effectively transmit test electrical signals between an electronic device under test and a load board; characterized in that:

[0020] The contact has a body with a locking section, which includes a horizontal section and a vertical section. The bottom surface of the horizontal section of the locking section has a contact surface that contacts the load plate. Each body has an arcuate protrusion that makes rolling contact with the device under test. Each body has an arcuate edge between the arcuate protrusion and the outer edge of the horizontal section of the locking section. An arcuate groove extending along the arcuate edge is formed between the inner edges of each body.

[0021] The contact element, wherein: a groove is formed on the top edge of the body, and the groove is located between the deepest inner edge of the long arc groove and the opening of the long arc groove.

[0022] The contact element, wherein: the locking section of the body forms a stop oblique protrusion on the outer side of the included angle between the vertical section and the horizontal section.

[0023] The contact element wherein the angle between the outer edge of the stop protrusion and the vertical segment is 22 to 42 degrees.

[0024] The contact element, wherein the angle between the outer edge of the stop protrusion and the vertical segment is 32±2 degrees.

[0025] The contact member wherein: a stop portion protruding from one side of the stop oblique protrusion is formed at the top of the locking section of the body.

[0026] Therefore, through the aforementioned technical means, the test assembly of the electronic device of this utility model can further prevent the contact from translating relative to the load plate lead, keeping it tightly against the limiting channel without arbitrary wear. Ultimately, it can be fixed without the need for elastic components, and it can easily replace a single contact without affecting other undamaged contacts. Furthermore, the contact can utilize its own metallic ductility to obtain the elasticity provided by existing elastic components, retaining the characteristics provided by the test carrier itself, thereby effectively improving its practicality, further increasing its added value, and improving its economic benefits.

[0027] To enable a further understanding of the structure, features and other objectives of this utility model, the following are preferred embodiments of this utility model, which are described in detail below with reference to the accompanying drawings, so that those skilled in the art can implement them. Attached Figure Description

[0028] Figure 1 This is a cross-sectional schematic diagram of a test group of existing electronic devices.

[0029] Figure 2 This is a cross-sectional schematic diagram of the test group of the electronic device of this utility model.

[0030] Figure 3 This is a schematic diagram of the appearance of the contact components in the test group of the electronic device of this utility model, to illustrate its configuration.

[0031] Figure 4 This is a schematic diagram showing the contact element of this utility model before its operation in a test group of an electronic device.

[0032] Figure 5 This is a schematic diagram showing the action of the contact element of this utility model when applied to a test group of an electronic device.

[0033] Explanation of reference numerals in the attached drawings: 10-Test group of electronic device; 11-Housing; 12-Contact; 151-First electrical contact; 152-Second electrical contact; 16-First elastic member; 17-Second elastic member; 20-Load plate; 21-Pin; 30-Electronic device under test; 31-Pin; 50-Test group; 51-Housing; 511-First surface; 512-Second surface; 52-Slot; 55-Limiting channel; 551-Horizontal section; 552-Vertical section; 553-Stop oblique recess; 60-Contact; 61-Body; 62-Arched convex end; 63-Arched edge; 64-Long arc groove; 65-Clamping section; 651-Horizontal section; 652-Vertical section; 653-Stop oblique convex part; 66-Contact surface; 68-Stop part; 69-Groove. Detailed Implementation

[0034] This utility model provides a test assembly and its contacts for an electronic device. In the specific embodiments and components of this utility model illustrated in the accompanying drawings, all references to front and back, left and right, top and bottom, upper and lower, and horizontal and vertical are for convenience of description only and are not intended to limit this utility model or restrict its components to any position or spatial orientation. The dimensions specified in the drawings and specification should be varied according to the design and requirements of this utility model without departing from the scope of the claims.

[0035] like Figure 2As shown, one side surface of the test group 50 of the electronic device of this utility model is for a device under test 30 with a plurality of pins 31 to be relatively close to it, while the other side surface is for a load plate 20 with a plurality of pins 21 to be attached. The test group 50 includes a housing 51 and a plurality of contacts 60 disposed in the housing 51, so that each contact 60 can selectively contact the pins 31 and the corresponding pins 21 of the device under test 30, so as to effectively transmit test electrical signals in the case of high frequency testing.

[0036] The structure of the housing 51 is as follows: Figure 2 As shown, it is made of insulating material, and the housing 51 has a generally planar and parallel first surface 511 and a second surface 512. The housing 51 defines a plurality of slots 52 that are generally equidistant. Each slot 52 can be used to selectively receive a corresponding contact 60. A connecting limiting channel 55 is formed on one side of each slot 52. The limiting channel 55 includes a horizontal section 551 connected to the slot 52 and a vertical section 552 connected to the horizontal section 551. The horizontal section 551 has a notch that penetrates the second surface 512 and corresponds to the load plate 20. The limiting channel 55 forms a stop oblique recess 553 at the angle between the vertical section 552 and the horizontal section 551. The angle between the inner edge of the stop oblique recess 553 and the vertical section 552 is 22 degrees to 42 degrees, with an optimal angle of 32 ± 2 degrees, for the placement and limiting of each contact 60.

[0037] For details regarding the composition of the aforementioned contact element 60, please refer to [link / reference needed]. Figure 2 , Figure 3As shown, each contact 60 has a thin, generally flat surface. Each contact 60 has a body 61 and a locking segment 65 integrally connected to the body 61. The body 61 and the locking segment 65 of the contact 60 can be accommodated in the opposing slots 52 and limiting channels 55 in the housing 51. The height of the locking segment 65 is less than that of the limiting channel 55. The locking segment 65 has a horizontal segment 651 and a vertical segment 652, and the horizontal segment 651 and the vertical segment 652 correspond to the horizontal segment 551 and the vertical segment 652 of the limiting channel 55 of the housing 51. The locking segment 65 has a horizontal segment 651 and a vertical segment 652. An outwardly inclined stop protrusion 653 is formed on the outer side of the included angle adjacent to 51, and the stop protrusion 653 can be correspondingly engaged in the stop recess 553 of the aforementioned limiting channel 55. The included angle between the stop protrusion 653 and the vertical section 652 is 22 degrees to 42 degrees, with an optimal included angle of 32 ± 2 degrees. Furthermore, a contact surface 66 protruding from the second surface 512 of the housing 51 is formed on the bottom surface of the horizontal section 651 of the locking section 65. The contact surface 66 can contact the lead wire 21 of the load plate 20. A stop portion 68 protruding from the stop protrusion 653 is formed at the top of the locking section 65, so that the locking section of the contact member 60... The vertical segment 652 can effectively abut against the opposite surface of the limiting channel 55 of the housing 51, and generates a restoring elastic force when deformed under pressure. The body 61, at one end different from the locking segment 65, has an arc-shaped protrusion 62 that protrudes from the first surface 511 of the housing 51, allowing selective pressure contact with the pin 31 of the electronic device under test 30. The top of the arc-shaped protrusion 62, where it contacts the pin 31, forms a rounded edge, allowing the arc-shaped protrusion 62 to scrape off the plating layer on the pin 31 of the electronic device under test 30 when rolled under pressure, thereby improving electrical conductivity. The body 61 of the contact 60 extends from the arc-shaped protrusion 62 to the outer edge of the horizontal segment 651 of the locking segment 65. An arc edge 63 is formed between the two sides of the body 61, so that the bottom surface of the body 61 is unsupported and can generate an elastic effect relative to the locking section 65, and improve the electrical conductivity and reduce unnecessary electrical loss. In addition, a long arc groove 64 extending along the arc edge 63 is formed between the inner edges of the body 61 to reduce the width of the body 61. A groove 69 is formed on the top edge of the body 61, and the groove 69 is located between the deepest inner edge of the long arc groove 64 and the opening of the long arc groove 64, so as to ensure the elastic force of the body 61, so that it has better recovery force and maintains the contact 60 in contact with the electronic device under test 30 and the load plate 20.

[0038] This allows for the assembly of a test group and its contacts that form a simple and highly inductive electronic device.

[0039] Through the aforementioned structural design, this utility model, in practical application, is as follows: Figure 3 , Figure 4As shown, a series of opposing contacts 60 are installed in the slots 52 of the housing 51 of the test group 50, and the top surface of the arc-shaped protrusion 62 of the body 61 of each contact 60 and the contact surface 66 of the locking section 65 protrude from the first and second surfaces 511 and 512 of the housing 51, so that the contact surface 66 of the locking section 65 of the contact 60 can be electrically connected to the lead 21 of the bottom load plate 20, and when the electronic device under test 30 moves close to the housing 51 of the test group 50, each pin 31 of the electronic device under test 30 accurately contacts the arc-shaped protrusion 62 of the corresponding contact 60 in the test group 50 to form an electrical connection. Since each contact 60 is installed in the limiting channel 55 of each slot 52 of the housing 51 by means of the locking section 65, and each contact 60 forms a fulcrum by means of the contact surface 66 of the locking section 65 that contacts the lead 21 of the load plate 20, the body 61 of each contact 60 can rotate downward by means of the elastic deformation generated by the long arc groove 64 and the groove 69, which effectively improves the contact between the arc protrusion end 62 and the contact surface 66 of the contact 60 and the pin 31 of the electronic device under test 30 and the lead 21 of the load plate 20, thus providing a good electrical connection.

[0040] Meanwhile, after the test of the electronic device under test 30 is completed and removed, the body 61 of each contact 60 in the housing 51 of the test group 50 can utilize its own metal ductility, as well as the design of the arc edge 63 and long arc groove 64 of the body 61, to form a restoring preload relative to the locking section 65, thereby obtaining the elastic force provided by the existing elastic component and retaining the characteristics that the test group 50 itself can provide.

[0041] As can be seen from the foregoing description, when the test group 50 of this utility model utilizes each of the contact members 60 disposed in the slot 52 of the housing 51, each of the contact members 60 can be locked in place within the limiting channel 55 of the slot 52 by the locking section 65. Through the combination of the stop oblique protrusion 653 of the locking section 65 and the stop oblique recess 553 of the limiting channel 55, and the limiting effect of the stop portion 68 at the top of the locking section 65, each of the contact members 60 can be prevented from sliding along the load plate 20, so that it remains tightly against the vertical section 552 of the limiting channel 55, and thus does not cause any wear on the lead wire 21 of the load plate 20.

[0042] Meanwhile, the contact action between the arc-shaped protrusion 62 of the contact body 61 and the pin 31 of the electronic device under test 30 is a rolling action. Therefore, during testing, the contact is not at the same point on the pin 31, but rather by scraping. The arc-shaped protrusion 62 scrapes away the plating or oxides on the surface of the pin 31 caused by long-term placement, thereby achieving a self-cleaning function and improving the conductivity of the electronic device test system. Therefore, this invention can ultimately be fixed without the need for elastic components, facilitating the replacement of a single contact 60 without affecting other undamaged contact 60s. Furthermore, the contact 60 can utilize its own metallic ductility to obtain the elasticity provided by existing elastic components, while retaining the characteristics provided by the test carrier itself, thus effectively improving its practicality.

Claims

1. A test array for an electronic device, used to efficiently transmit test electrical signals between an electronic device under test having a plurality of pins and a load board having a relative plurality of pins, characterized in that, The test group comprises: A shell having a first surface and a second surface in parallel, a plurality of slots are equidistantly arranged between the first surface and the second surface of the shell, each slot is formed with a limiting channel on one side, and each limiting channel comprises a horizontal section communicating with the slot and a vertical section different from the side of the slot, wherein the horizontal section and the vertical section communicate, and the horizontal section has a gap relative to the second surface of the shell; A plurality of contact elements having a body capable of being accommodated in the shell relative to the slot, the body has a clamping section capable of being accommodated in the limiting channel, the height of the clamping section is smaller than that of the limiting channel, and the clamping section comprises a horizontal section and a vertical section, the bottom surface of the horizontal section of the clamping section is formed with a contact surface protruding from the second surface of the shell for contacting the lead of the load board, each body has an arc convex end protruding from the first surface of the shell for rolling contact with the pin of the electronic device to be tested, and each body is formed with an arc edge between the arc convex end and the outer edge of the horizontal section of the clamping section, and each body is formed with a long arc groove between the inner edges along the arc edge.

2. The test group of electronic devices of claim 1, wherein: The top edge of the body of the contact element is formed with a groove, and the groove is located between the inner end edge of the long arc groove and the opening of the long arc groove.

3. The test group of electronic devices of claim 1, wherein: The limiting channel of the shell is formed with a stop inclined concave portion outside the included angle between the vertical section and the horizontal section, and the clamping section of each contact element is formed with a stop inclined convex portion outside the included angle between the vertical section and the horizontal section, and the stop inclined convex portion of the contact element can be embedded in the stop inclined concave portion of the limiting channel.

4. The test group of electronic devices of claim 3, wherein: The included angle between the inner edge inclined surface of the stop inclined concave portion and the vertical section of the limiting channel is 22-42 degrees, and the outer edge inclined surface of the stop inclined convex portion can correspondingly abut against the inner edge inclined surface of the stop inclined concave portion.

5. The test group of electronic devices of claim 3, wherein: The included angle between the inner edge inclined surface of the stop inclined concave portion and the vertical section of the limiting channel is 32±2 degrees, and the outer edge inclined surface of the stop inclined convex portion can correspondingly abut against the inner edge inclined surface of the stop inclined concave portion.

6. A test group of electronic devices as claimed in any one of claims 3 to 5, characterized in that: The top end of the clamping section of the body of the contact element is formed with a stop portion protruding from one side of the stop inclined convex portion.

7. A contact element applied in a test group of an electronic device for effectively transmitting test electrical signals between a to-be-tested electronic device and a load board; characterized in that: The contact element has a body, the body has a clamping section, and the clamping section comprises a horizontal section and a vertical section, the bottom surface of the horizontal section of the clamping section is formed with a contact surface for contacting the load board, each body has an arc convex end for rolling contact with the to-be-tested electronic device, and each body is formed with an arc edge between the arc convex end and the outer edge of the horizontal section of the clamping section, and each body is formed with a long arc groove between the inner edges along the arc edge.

8. The contact of claim 7, wherein: The top edge of the body is formed with a groove, and the groove is located between the inner end edge of the long arc groove and the opening of the long arc groove.

9. The contact of claim 7, wherein: The clamping section of the body is formed with a stop inclined convex portion outside the included angle between the vertical section and the horizontal section.

10. The contact of claim 9, wherein: The included angle between the outer edge inclined surface of the stop inclined convex portion and the vertical section is 22-42 degrees.

11. The contact of claim 9, wherein: The included angle between the outer edge inclined surface of the stop inclined convex portion and the vertical section is 32±2 degrees.

12. The contact according to any one of claims 9 to 11, characterized in that: The top end of the clamping section of the body is formed with a stop portion protruding from one side of the stop inclined convex portion.

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