Aging test fixture for sound processor

Abstract

The utility model provides an aging test fixture for a sound processor. The aging test fixture comprises a receiving antenna, a tuning capacitor module, a control module, a signal amplification module and an indication module, wherein the receiving antenna receives a sound radio frequency signal from the sound processor; the control module is used for adjusting the size of a tuning capacitor in the tuning capacitor module according to the frequency of the sound radio frequency signal; the tuning capacitor module outputs a tuning capacitor matched with the frequency of the sound radio frequency signal; the signal amplification module is used for amplifying the received sound radio frequency signal, and the indication module is used for indicating the amplified sound radio frequency signal. According to the invention, no chip needs to be implanted, the burn-in test effect of the sound processor can be improved only through the tuning capacitor and other auxiliary circuits, and the test is simple and effective.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of intelligent driving, in particular to the technical field of automobile domain controller, and specifically relates to an aging test fixture for a sound processor. BACKGROUND

[0002] An artificial cochlea is the only effective method and device for recovering hearing of patients with severe or extremely severe sensorineural hearing loss. The working process of the artificial cochlea is as follows: sound is first collected by a microphone and converted into an electrical signal, then subjected to special digital processing, encoded according to a certain strategy, transmitted to the body through a transmitting coil on the ear, and after the receiving coil of the implanted body senses the signal, the signal is decoded by a decoding chip to make the implanted body's stimulating electrode generate an electric current to stimulate the auditory nerve to produce hearing.

[0003] Different models of sound processors have different transmitting frequencies, and the sound processor needs to be matched with the implanted body to work, which causes the problem of incompatibility and high cost of the aging fixture. CONTENT OF THE UTILITY MODEL

[0004] In view of the above-mentioned shortcomings of the prior art, the purpose of the present utility model is to provide an aging test fixture for a sound processor, which can improve the aging test effect of the sound processor.

[0005] The present application provides an aging test fixture for a sound processor, which comprises a receiving antenna, a tuning capacitor module, a control module, a signal amplification module and an indication module. The receiving antenna receives a sound radio frequency signal from the sound processor. The control module is used to adjust the size of the tuning capacitor in the tuning capacitor module according to the frequency of the sound radio frequency signal. The tuning capacitor module outputs a tuning capacitor matched with the frequency of the sound radio frequency signal. The signal amplification module is used to amplify the received sound radio frequency signal, and the indication module is used to indicate the amplified sound radio frequency signal.

[0006] In a possible implementation, the tuning capacitor module comprises a plurality of groups of tuning units, each group of tuning units comprising a tuning capacitor and a control switch for controlling whether the tuning capacitor is connected to the receiving antenna.

[0007] In a possible implementation, the receiving antenna comprises a first connection end and a second connection end. The first connection end is connected to a first end of the control switch, and the second connection end is connected to a first end of the tuning capacitor. The control switch controls the connection or disconnection between a second end of the control switch and a second end of the tuning capacitor.

[0008] In a possible implementation, the receiving antenna comprises a receiving coil; the receiving coil is formed with the first connection end and the second connection end.

[0009] In a possible implementation, the control module comprises a control chip connected with the control switch, and the control chip generates a switch control signal for controlling the control switch based on the frequency of the received sound radio frequency signal.

[0010] In a possible implementation, the second end of the tuning capacitor is grounded.

[0011] In a possible implementation, the signal amplification module comprises an operational amplifier and a gain resistor module connected with the operational amplifier.

[0012] In a possible implementation, the gain resistor module comprises a first resistor and a second resistor connected in series; wherein the negative input end of the operational amplifier is connected between the first resistor and the second resistor, the positive input end of the operational amplifier is grounded, and the output end of the operational amplifier is connected with the indication module.

[0013] In a possible implementation, a current limiting resistor is connected between the operational amplifier and the indication module.

[0014] In a possible implementation, the indication module comprises an LED indicator.

[0015] As described above, the present application does not need to implant a chip, but only through the tuning capacitor and other auxiliary circuits can improve the burn-in test effect of the sound processor, and make the test simple and effective. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the embodiments of the present application. It should be understood that the following drawings only show some embodiments of the present application, and therefore should not be regarded as a limitation on the scope, and for those skilled in the art, other related drawings can also be obtained without creative labor on the basis of these drawings.

[0017] Figure 1 The principle structure schematic diagram of the burn-in test fixture for the sound processor of the present application is shown.

[0018] Figure 2 The principle structure schematic diagram of the tuning capacitor module in the burn-in test fixture for the sound processor of the present application is shown.

[0019] Figure 3The diagram shown is a schematic of the circuit structure of the tuning capacitor module and the receiving antenna in the aging test fixture for the sound processor of this application.

[0020] Figure 4 The diagram shown is a schematic of the circuit structure of the signal amplification module and the indicator module in the aging test fixture for the sound processor of this application.

[0021] Figure 5 The diagram shows the overall structure of the connection between the aging test fixture for the sound processor and the sound processor in this application.

[0022] Component designation explanation

[0023] 100 Aging Test Fixtures for Sound Processors

[0024] 110 Receiving Antenna

[0025] 120 Tuning Capacitor Module

[0026] 130 Signal Amplification Module

[0027] 140 Indicator Module

[0028] 150 control module

[0029] 200 sound processors Detailed Implementation

[0030] The following specific examples illustrate the implementation methods of this application. Those skilled in the art can easily understand other advantages and effects of this application from the information disclosed herein. This application can also be implemented or its modules applied through other different specific embodiments. Various details in this application can also be modified or changed according to different viewpoints and application modules without departing from the spirit of this application. It should be noted that, unless otherwise specified, the embodiments and features in the embodiments of this application can be combined with each other.

[0031] The following is based on Figures 1 to 5 For reference, embodiments of this application are described in detail to enable those skilled in the art to readily implement the application. This application may be embodied in many different forms and is not limited to the embodiments described herein.

[0032] In the description of the application, the expressions "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" are used to indicate that the particular feature, structure, material, or characteristic following the term is included in at least one embodiment or example of the application. The appearances of the expressions "in one embodiment" or "in some embodiments" in various places in the specification are not necessarily all referring to the same embodiment or example, and the appearances might be situational as appropriate. Furthermore, the particular features, structures, materials, or characteristics can be combined in any suitable manner in one or more embodiments or examples. Moreover, the different embodiments or examples presented herein are combinable where not mutually inconsistent or exclusive, and combinations of different embodiments or examples are within the scope of the application.

[0033] In addition, the terms "first", "second", etc. are used merely as labels, and are not intended to signify or imply relative importance or a number of indications of the technical features indicated. Thus, features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the application, the meaning of "a group" is two or more, unless specifically limited otherwise.

[0034] Although the terms first, second, etc. are used in the application to indicate various structural features in some examples, these structural features should not be limited by these terms. These terms are only used to distinguish one structural feature from another. Furthermore, as used in the present embodiments, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises", "comprising", "includes" and / or "including" mean that the described structural features are included, but do not exclude the presence or addition of one or more other structural features. The terms "or" and "and / or" used herein are to be interpreted as inclusive, or meaning either or any combination. Thus, "A, B or C" or "A, B and / or C" means "any of the following: A; B; C; A and B; A and C; B and C; A, B and C". This definition applies only when a combination of structures is not inherently mutually exclusive.

[0035] In order to clearly illustrate the application, structures irrelevant to the description are omitted, and the same or similar structural elements throughout the specification are given the same reference numerals.

[0036] In the description of the specific embodiments throughout the specification, when it is said that a structure is "connected" to another structure, it not only includes the case of "direct connection", but also includes the case of "indirect connection" in which other structural elements are placed therebetween. In addition, when it is said that a structure "includes" a certain constituent element, unless specifically stated to the contrary, other constituent elements are not excluded, but it means that other constituent elements can also be included.

[0037] The specific terminology used herein has been chosen by the inventors for reasons of readability and inclusivity, and is not intended to limit the scope of the application. In this specification, the use of "may" shall not be interpreted as being synonymous with "might have" or "could have," and the use of "will" shall not be interpreted as being synonymous with "is going to" or "is going to have." The use of "including" has the same meaning as "comprising" or "containing" as a shorthand for "including but not limited to," and each occurrence of "including" is always meant to be non-limiting.

[0038] Although not differently defined, technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. Unless specifically defined herein, all terms used herein are to be given their broadest conceivable meaning, consistent with the context, and are not to be limited to ideal or overly formal definitions unless clearly so indicated by the context.

[0039] An artificial cochlea system is composed of an external sound processor, an implant with electrodes, and other parts. Among them, the role of the external sound processor is to convert the received sound signal into a certain coded form of electrical signal, and then send it to the electrode system in the implant through the transmission device. This process replaces the damaged hair cell function of the inner ear, so that sound can directly stimulate the auditory nerve fiber to excite, thereby restoring or rebuilding the hearing function of the deaf.

[0040] Burn-in testing is a test method to ensure the reliability of electronic devices in long-term use. Burn-in testing of the radio frequency signal output by the sound processor is a complex and delicate process, which aims to ensure the stability and reliability of the sound processor in long-term operation.

[0041] Due to the phenomenon that different models of sound processors have different transmission frequencies, and the sound processor needs to match the implant to work, it causes many burn-in test fixtures to be incompatible and high in cost.

[0042] The present application provides a burn-in test fixture for a sound processor for improving the burn-in test effect of the sound processor.

[0043] The following will combine Figures 1 to 5 The principle and implementation of a burn-in test fixture for a sound processor of the embodiment will be described in detail, so that those skilled in the art can understand the burn-in test fixture for a sound processor of the embodiment without creative labor.

[0044] The present application provides a burn-in test fixture for a sound processor, Figure 1 The principle structure schematic diagram of the burn-in test fixture for a sound processor 100 of the present application is shown as Figure 1As shown, in the embodiment, the burn-in test fixture 100 for the sound processor includes a receiving antenna 110, a tuning capacitor module 120, a control module 150, a signal amplification module 130, and an indication module 140. The receiving antenna 110 receives a sound radio frequency signal from the sound processor 200. The control module 150 is configured to adjust the size of the tuning capacitor in the tuning capacitor module 120 according to the frequency of the sound radio frequency signal. The tuning capacitor module 120 outputs a tuning capacitor matching the frequency of the sound radio frequency signal. The signal amplification module 130 is configured to amplify the received sound radio frequency signal. The indication module 140 is configured to indicate the amplified sound radio frequency signal.

[0045] In the embodiment, the burn-in test fixture 100 for the sound processor matches the impedance between the sound processor 200 and the burn-in fixture to the optimal state by changing the tuning capacitor, so as to simulate the actual use state and realize the burn-in test of the sound processor 200.

[0046] Figure 2 The principle structure of the tuning capacitor module 120 in the burn-in test fixture 100 for the sound processor of the present application is shown. As shown in the figure, Figure 2 In one possible implementation of the embodiment, the tuning capacitor module 120 includes a plurality of groups of tuning units, each group of tuning units including a tuning capacitor and a control switch for controlling whether the tuning capacitor is connected to the receiving antenna 110.

[0047] In one specific implementation of the embodiment, the receiving antenna 110 includes a first connection end and a second connection end. The first connection end is connected to the first end of the control switch. The second connection end is connected to the first end of the tuning capacitor. The second end of the tuning capacitor is grounded. The control switch controls the connection or disconnection between the second end of the control switch and the second end of the tuning capacitor.

[0048] Figure 3 The circuit structure of the tuning capacitor module 120 and the receiving antenna 110 in the burn-in test fixture 100 for the sound processor of the present application is shown. As shown in the figure, Figure 3 As shown, the tuning capacitor module 120 includes, for example, four groups of tuning units: tuning capacitor C1 and control switch S1, tuning capacitor C2 and control switch S2, tuning capacitor C3 and control switch S3, and tuning capacitor C4 and control switch S4. Control switch S1 controls tuning capacitor C1 to be connected to the receiving antenna 110. Control switch S2 controls tuning capacitor C2 to be connected to the receiving antenna 110. Control switch S3 controls tuning capacitor C3 to be connected to the receiving antenna 110. Control switch S4 controls tuning capacitor C4 to be connected to the receiving antenna 110.

[0049] In the embodiment, the number of tuning capacitors connected with the receiving antenna 110 is controlled by the switch, the size of the tuning capacitors in the tuning capacitor module 120 is adjusted, and the transmitting frequency of the sound processor 200 is matched by adjusting the size of the tuning capacitors. Therefore, in the burn-in test fixture 100 for the sound processor in the embodiment, no chip needs to be implanted, and the burn-in test effect of the sound processor 200 can be improved by the tuning capacitors and other auxiliary circuits, and the test is simple and effective.

[0050] In a possible implementation of the embodiment, the receiving antenna 110 includes a receiving coil, and the receiving coil is formed with the first connection end and the second connection end.

[0051] The receiving antenna 110 is a device for capturing electromagnetic wave signals from space and converting them into electrical signals, and one of the core components is a receiving coil. The receiving coil can be wound parallel to the soft magnetic layer and embedded in one surface of the soft magnetic layer to improve the receiving efficiency of the wireless power receiving device. In addition, the receiving coil can also be arranged in the shell of the antenna and connected with the tuning capacitor module 120 to switch different frequencies through the tuning capacitor module 120 to realize multi-frequency reception.

[0052] In addition, in other embodiments, the receiving antenna 110 can include auxiliary circuits, such as oscillators, reflectors, directors, feed networks, and matching networks. The oscillator is the basic unit of the receiving antenna 110, which can be in the form of a dipole or a monopole. The oscillator generates an induced electromotive force and current by inducing the electric field component in the electromagnetic wave, thereby guiding the electromagnetic wave from the antenna to the receiving system. In some antennas, such as Yagi-Uda antennas, reflectors are used to enhance the signal receiving ability in a specific direction. They are usually located at the back of the antenna and improve the gain by reflecting electromagnetic waves. The director is opposite to the reflector and is located at the front of the antenna, which is used to further improve the directivity and gain of the antenna. The feed network is responsible for transmitting the received radio frequency signals to the subsequent processing unit (such as the tuning capacitor module 120 in the embodiment), and the feed network can include microstrip lines, coaxial cables, or other forms of transmission lines. The matching network ensures the impedance matching between the antenna and the feed network to reduce signal reflection and maximize energy transmission efficiency.

[0053] In a possible implementation of the embodiment, the control module 150 includes a control chip connected with the control switch, and the control chip generates a switch control signal for controlling the control switch based on the frequency of the received sound radio frequency signal. The control chip has a corresponding relationship between the tuning capacitors and the frequencies built-in, for example, by using the tuning capacitor calculation formula:

[0054] f = 1 / [2π√(LC)]

[0055] f is frequency, C is tuning capacitor, L is inductance, wherein L is a preset fixed value. The tuning capacitor required for the corresponding frequency is calculated by the above formula. The control chip generates a switch control signal for controlling the control switch according to the required tuning capacitor, so as to control the corresponding control switch to turn on the corresponding tuning capacitor or disconnect the corresponding tuning capacitor.

[0056] In addition, in other embodiments, a corresponding relationship table of tuning capacitor and frequency can also be preset, and the size of the tuning capacitor corresponding to the antenna frequency is determined through the corresponding relationship table, and the corresponding switch control signal is generated.

[0057] In a possible implementation of the embodiment, the signal amplification module 130 includes an operational amplifier and a gain resistor module connected to the operational amplifier.

[0058] Figure 4 The circuit structure schematic diagram of the signal amplification module 130 and the indication module 140 in the burn-in test fixture 100 for the sound processor of the present application is shown. Figure 4 As shown, in a possible implementation of the embodiment, the gain resistor module includes a first resistor R1 and a first resistor R2 connected in series; wherein the negative input end of the operational amplifier is connected between the first resistor R1 and the first resistor R2, the positive input end of the operational amplifier is grounded, and the output end of the operational amplifier is connected to the first resistor R2 and the indication module 140.

[0059] The calculation amplification gain is through the amplification multiple K = R1 / R2 of the operational amplifier.

[0060] In a possible implementation of the embodiment, a current limiting resistor R3 is connected between the operational amplifier and the indication module 140.

[0061] In a possible implementation of the embodiment, the indication module 140 includes an LED indicator, which is a light emitting diode D1. As shown, after the operational amplifier amplifies the electrical signal, the LED indicator is lit to indicate that the burn-in test fixture 100 for the sound processor has completed a burn-in test on the sound processor 200. That is, the operational amplifier amplifies the coupled electrical signal and lights up the light emitting diode D1.

[0062] Figure 5 The connection overall structure schematic diagram of the burn-in test fixture 100 for the sound processor of the present application and the sound processor 200 is shown. Figure 5As shown, in the embodiment, the sound processor 200 includes a sound processing unit, a transmitting coil, a transmitting antenna, and the like.

[0063] The sound processor 200 transmits the radio frequency signal of the sound with the preset frequency output by the sound processing unit through the transmitting coil and the transmitting antenna. The burn-in test fixture 100 of the sound processor is used to realize the compatibility of the sound processor 200 with different transmitting frequencies by changing the tuning capacitance. The receiving antenna 110 converts the received energy into an electric signal, and changes the tuning capacitance to match the impedance between the sound processor 200 and the burn-in fixture to the best state, so as to simulate the actual use state. After the electric signal is amplified by the operational amplifier, the LED indicator light is lit.

[0064] In summary, the present application does not need to implant a chip, but only needs to improve the burn-in test effect of the sound processor 200 by the tuning capacitance and other auxiliary circuits, and makes the test simple and effective.

[0065] The above embodiment only illustrates the principle and effect of the present application, and is not used to limit the present application. Any person skilled in the art can modify or change the above embodiment without departing from the spirit and scope of the present application. Therefore, all equivalent modifications or changes completed by those skilled in the art without departing from the spirit and technical thought of the present application should be covered by the claims of the present application.

Claims

1. A burn-in test fixture for a sound processor, the burn-in test fixture comprising: The application relates to a signal receiving device. The signal receiving device comprises a receiving antenna, a tuning capacitor module, a control module, a signal amplification module and an indicating module. The receiving antenna receives a sound radio frequency signal from a sound processor. The control module is used for adjusting the size of a tuning capacitor in the tuning capacitor module according to the frequency of the sound radio frequency signal. The tuning capacitor module outputs a tuning capacitor matching the frequency of the sound radio frequency signal. The signal amplification module is used for amplifying the received sound radio frequency signal, and the indicating module is used for indicating the amplified sound radio frequency signal.

2. The burn-in test fixture for a sound processor of claim 1, wherein, The tuning capacitor module comprises a plurality of groups of tuning units, each group of tuning units comprising a tuning capacitor and a control switch used for controlling whether the tuning capacitor is in conduction with the receiving antenna.

3. The burn-in test fixture for a sound processor of claim 2, wherein, The receiving antenna comprises a first connecting end and a second connecting end, the first connecting end is connected with a first end of the control switch, the second connecting end is connected with a first end of the tuning capacitor, and the control switch controls the connection or disconnection between a second end of the control switch and a second end of the tuning capacitor.

4. The burn-in test fixture for a sound processor of claim 3, wherein, The receiving antenna comprises a receiving coil, and the receiving coil is formed with the first connecting end and the second connecting end.

5. The burn-in test fixture for a sound processor of claim 2 or 3, wherein, The control module comprises a control chip, the control chip is connected with the control switch, and a switch control signal for controlling the control switch is generated based on the frequency of the received sound radio frequency signal.

6. The burn-in test fixture for a sound processor of claim 3, wherein, The second end of the tuning capacitor is grounded.

7. The burn-in test fixture for a sound processor of claim 1, wherein, The signal amplification module comprises an operational amplifier and a gain resistance module connected with the operational amplifier.

8. The burn-in test fixture for a sound processor of claim 7, wherein, The gain resistance module comprises a first resistance and a second resistance connected in series, a negative input end of the operational amplifier is connected between the first resistance and the second resistance, a positive input end of the operational amplifier is grounded, and an output end of the operational amplifier is connected with the second resistance and the indicating module.

9. The burn-in test fixture for a sound processor of claim 8, wherein, A current limiting resistance is connected between the operational amplifier and the indicating module.

10. The burn-in test fixture for a sound processor of claim 1 or 9, wherein, The indicating module comprises an LED indicating lamp.

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