Test equipment

Abstract

The utility model discloses a test device, and relates to the technical field of chip testing, the test device comprises a test main body, the test main body comprises a test board used for bearing a to-be-tested body, and the test main body is provided with an opening for the test board to pass in and out corresponding to the test board; the loading and unloading buffer device comprises a loading and unloading device for temporarily storing the test board and a buffer table for temporarily storing the to-be-tested body, the loading and unloading device is connected to the test main body and right faces the opening, and the buffer table is located on at least one side of the loading and unloading device; and the loading and unloading device comprises a bracket for temporarily storing the test plate and a lifting part for driving the bracket to move along the height direction of the opening. According to the test equipment provided by the invention, the labor intensity of operators can be reduced, and the tested chip can be conveniently replaced.

Description

Technical Field

[0001] This application relates to the field of chip testing technology, and more specifically, to a testing device. Background Technology

[0002] Semiconductor chips are an indispensable part of modern electronic technology, playing a crucial role in various electronic devices. However, during long-term use, semiconductor chips are affected by various factors, such as temperature, humidity, and voltage, leading to a decline in their aging performance. To ensure the reliability and stability of semiconductor chips in actual use, aging tests are necessary. Aging test equipment is used to test the aging performance of semiconductor chips. Its main function is to simulate the actual working environment of semiconductor chips under specific temperature and humidity conditions, accelerating their aging process to detect the chip's reliability and lifespan.

[0003] The application process of existing aging test equipment is as follows: the chips to be tested are connected one by one to a test board, then the test board is placed inside the aging test equipment and connected to the detection board inside the aging test equipment. The detection board powers on each chip through the test board to test the chip's aging performance. In the existing technology, the loading and unloading of the test board and its connection to the detection board are all done manually. Due to the large weight of the test board and its considerable height located at the top of the aging test equipment, the labor intensity of the operators is increased, and replacing chips after the test board has completed testing is inconvenient. Utility Model Content

[0004] The purpose of this application is to provide a testing device that can reduce the labor intensity of operators and facilitate the replacement of chips that have completed testing.

[0005] One embodiment of this application provides a testing device, including a testing body, the testing body including a test plate for carrying a test object, the testing body having an opening for the test plate to pass through; a loading and unloading buffer device, including a loading and unloading device for temporarily storing the test plate and a buffer platform for temporarily storing the test object, the loading and unloading device being connected to the testing body and facing the opening, the buffer platform being located on at least one side of the loading and unloading device; the loading and unloading device including a bracket for temporarily storing the test plate and a lifting component for driving the bracket to move along the height direction of the opening.

[0006] As one feasible approach, the loading and unloading device includes a base; the lifting component includes two guide rails mounted on the base and a driver mounted on the base; the bracket includes two support rods respectively disposed on the two guide rails, forming an operating platform for supporting the test plate between the two support rods, a slide rail extending perpendicular to the opening direction is formed on the support rod, and a guide block is provided on the side of the support rod near the opening for guiding the test plate to slide along the slide rail into the test body, or to slide from the test body into the operating platform.

[0007] As one feasible approach, the loading and unloading device also includes a top plate, on which a position detector is installed. The position detector is connected to a controller. The position detector is used to detect the position of the bracket, and the controller obtains the position of the bracket based on the position detector and controls the position of the bracket.

[0008] As one feasible approach, the loading and unloading device can be detachably connected to the side wall of the opening.

[0009] As an feasible approach, the loading and unloading device is equipped with a connecting plate and a machine base connecting block on the side closest to the test body. The connecting plate is provided with a connecting through hole, and the machine base connecting block is provided with a waist-shaped hole.

[0010] As an feasible approach, the bottom of the loading and unloading device is equipped with casters.

[0011] As an feasible approach, the test body is also equipped with an automatic door that slides on it, and a detection component is also provided on the test body corresponding to the opening. The detection component is used to detect the position of the loading and unloading device near the opening.

[0012] As an feasible approach, the loading and unloading device also includes a side plate mounted on the base, which is arranged to correspond to the guide rail and avoid the bracket, and has weight reduction holes.

[0013] As an feasible approach, cam guides are provided at both ends of the support rod, and anti-tilting bolts are provided between the two cam guides. The end of the test plate moves along the slide between the cam guides and the anti-tilting bolts.

[0014] As one feasible approach, the buffer platform includes two units located on either side of the loading and unloading device, used for loading and unloading respectively. Each buffer platform is equipped with an ion fan for removing static electricity.

[0015] The beneficial effects of the embodiments of this application include:

[0016] The testing equipment provided in this application includes a testing body, which includes a test board for carrying a test object. The testing body has an opening corresponding to the test board for the test board to enter and exit. After the test board enters the testing body through the opening, the test object is connected to the testing body for testing. A loading / unloading buffer device includes a loading / unloading device for temporarily storing the test board and a buffer platform for temporarily storing the test object. The loading / unloading device is connected to the testing body and is positioned directly opposite the opening. The buffer platform is located on at least one side of the loading / unloading device. The loading / unloading device includes a bracket for temporarily storing the test board and a lifting component that drives the bracket to move along the height direction of the opening. Specifically, the lifting component moves the bracket to a preset height, the operator places the test board on the bracket, and the lifting component then moves the bracket to the height of a certain testing position and transfers the test board to the testing position, i.e., transferring the test board into the testing body within the same height. In this testing equipment, the test board is moved vertically by the lifting component, thus reducing the operator's workload and facilitating the replacement of the tested chip. Attached Figure Description

[0017] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a schematic diagram of the structure of a testing device provided in an embodiment of this application;

[0019] Figure 2 A schematic diagram of the structure of a test subject provided in an embodiment of this application;

[0020] Figure 3 This is a schematic diagram of the structure of a loading and unloading buffer device provided in an embodiment of this application;

[0021] Figure 4 This is a schematic diagram of the structure of a support rod provided in an embodiment of this application.

[0022] Icons: 100-Testing equipment; 110-Testing body; 111-Automatic door; 112-Detection component; 120-Loading and unloading buffer device; 121-Loading and unloading device; 122-Buffer platform; 123-Bracket; 124-Side plate; 125-Weight reduction hole; 126-Ion fan; 131-Base; 132-Guide rail; 134-Top plate; 135-Connecting plate; 136-Machinery connecting block; 137-Connecting through hole; 138-Oval hole; 139-Cast; 140-Bracket rod; 141-Guide block; 142-Cam guide; 143-Anti-warping bolt. Detailed Implementation

[0023] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0024] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0025] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0026] In the description of this application, it should be noted that the terms "center", "vertical", "horizontal", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, or the orientation or positional relationship commonly used when the product of this application is in use. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0027] This application embodiment provides a testing device 100, such as... Figure 1 , Figure 2 and Figure 3 As shown, the device includes a test body 110, which includes a test plate for carrying a test object. The test body 110 has an opening for the test plate to pass through. The device includes a loading and unloading buffer device 120, which includes a loading and unloading device 121 for temporarily storing the test plate and a buffer platform 122 for temporarily storing the test object. The loading and unloading device 121 is connected to the test body 110 and is positioned directly opposite the opening. The buffer platform 122 is located on at least one side of the loading and unloading device 121. The loading and unloading device 121 includes a bracket 123 for temporarily storing the test plate and a lifting component for driving the bracket 123 to move along the height direction of the opening.

[0028] This application provides a testing device 100 for testing a chip under test. Specifically, the chip under test is connected to a test board, and the test board enters the testing body 110 for testing via a loading / unloading device 121. More specifically, the testing device 100 of this application includes a testing body 110 and a loading / unloading buffer device 120, wherein the loading / unloading buffer device 120 includes a buffer platform 122 and a loading / unloading device 121. At the buffer platform 122, the chip under test is connected to the test board, and the test board with the chip under test connected is placed on the bracket 123 of the loading / unloading device 121. According to the test position that the test board needs to be installed in, the vertical position of the bracket 123 is adjusted by a lifting component so that the bracket 123 is flush with one of the test positions. In this way, the test board located on the bracket 123 can be easily transferred into the testing body 110. Similarly, after the test is completed, the test board is pulled out onto the bracket 123, and then the lifting component moves the bracket 123 to a preset height, at which point the test board is removed from the bracket 123. In the above process, the vertical movement of the test board is accomplished by the bracket 123, thereby reducing the labor intensity of the operator.

[0029] When placing the test board onto or removing the test board from the bracket 123, the height of the bracket 123 should be the same as the height of the buffer platform 122, and the same as the most comfortable operating height for the operator.

[0030] In another embodiment, the buffer platform 122 can also hold the test object to be tested and the carrier that carries the test object after the test is completed. After the test object on the test board completes the test, the test board is adjusted to a suitable position by the loading and unloading device 121, and the operator replaces the test object on the test board that has completed the test. That is, the test object on the test board that has completed the test is placed on the carrier, and then the test object on the buffer platform is loaded onto the test board.

[0031] Understandably, multiple test positions are arranged vertically within the test body 110 to allow for the simultaneous testing of multiple test plates. The bracket 123, driven by the lifting assembly, is positioned at the same horizontal level as one of the test positions.

[0032] The test equipment 100 of this application embodiment is completed by the vertical movement and lifting of the test board, which can reduce the labor intensity of the operator and facilitate the replacement of the chip after testing.

[0033] Optionally, the loading and unloading device 121 includes a base 131; the lifting component includes two guide rails 132 mounted on the base 131 and a driver mounted on the base 131; the bracket 123 includes two support rods 140 respectively disposed on the two guide rails 132, and an operating platform for supporting the test plate is formed between the two support rods 140. A slide rail extending perpendicular to the opening direction is formed on the support rod 140, and a guide block 141 is provided on the side of the support rod 140 near the opening for guiding the test plate to slide along the slide rail into the test body 110, or to slide from the test body 110 into the operating platform.

[0034] The bracket 123 includes two support rods 140, with sliding grooves extending perpendicular to the opening direction on the two support rods 140. The two ends of the test plate are respectively set on the slide rails of the two support rods 140. Thus, before the test, the test plate is placed on the bracket 123, and the bracket 123 moves to a certain test position height under the action of the lifting component. At this time, the test plate on the bracket 123 slides along the slide rail to the test position inside the test body 110. Similarly, after the test is completed, one end of the test plate first enters the slide rail, and then slides out of the test body 110 using the slide rail. When the slide rail is formed on the support rod 140, the horizontal movement of the test plate is achieved by the slide rail. Due to the sliding action of the slide rail, the labor intensity of the operator can be further reduced.

[0035] Since there is a certain gap between the loading / unloading device 121 and the test body 110, the bracket 123 is a certain distance from the detection position inside the test body 110. In order to improve the smooth sliding of the test plate to the test position of the test body 110, this embodiment of the application provides a guide block 141 on the side of the support rod 140 near the opening, which can ensure the stability of the test plate when entering and leaving the test position and avoid the end falling off at the opening.

[0036] In one possible implementation of the embodiments of this application, such as Figure 2 As shown, the loading and unloading device 121 also includes a top plate 134 connecting the two side plates 124. A position detector is provided on the top plate 134. The position detector is connected to a controller. The position detector is used to detect the position of the bracket 123. The controller obtains the position of the bracket 123 based on the position detector and controls the position of the bracket 123.

[0037] To ensure precise alignment between the test board and the test position, this embodiment of the application provides a position detector on the top plate 134. The position detector detects the position of the bracket 123 in the vertical direction, ensuring that the test board on the bracket 123 is aligned with a certain test position. The position detector enables precise positioning of the bracket 123, thereby ensuring precise alignment between the test board and the test position, allowing the test board to slide smoothly onto the test position for testing.

[0038] Optional, such as Figure 1 and Figure 3 As shown, the loading and unloading device 121 is detachably connected to the side wall of the opening.

[0039] In order to improve the applicability of the loading and unloading device 121 and make it adaptable to various test subjects 110, the embodiments of this application detachably connect the loading and unloading device 121 to the side wall of the opening. When the loading and unloading device 121 is applied to one of the test subjects 110, the loading and unloading device 121 is fixed to it and disassembled after the test is completed, and then applied to other test subjects 110.

[0040] In one possible implementation of the embodiments of this application, such as Figure 3 As shown, the loading and unloading device 121 is provided with a connecting plate 135 and a machine base connecting block 136 on the side near the test body 110. The connecting plate 135 is provided with a connecting through hole 137, and the machine base connecting block 136 is provided with a waist-shaped hole 138.

[0041] To improve the stability of the connection between the loading / unloading device 121 and the test body 110, a connecting plate 135 and a machine base connecting block 136 are provided on the side of the loading / unloading device 121 near the test body 110. The connecting plate 135 is provided with a connecting through hole 137, and the machine base connecting block 136 is provided with a waist-shaped hole 138. The connecting parts pass through the connecting through hole 137 and the waist-shaped hole 138 respectively and connect to the side wall of the opening, thereby realizing the connection between the loading / unloading device 121 and the test body 110.

[0042] In addition, to further improve the connection stability between the loading / unloading device 121 and the test body 110, the connecting plate 135 and the connecting block can be set at the upper and lower ends of the loading / unloading device 121, such as... Figure 3 As shown.

[0043] Optional, such as Figure 1 and Figure 3 As shown, the bottom of the loading and unloading device 121 is equipped with casters 139.

[0044] The loading and unloading device 121 can be adapted to various test subjects 110. In order to facilitate the movement of the loading and unloading device 121 between various test subjects 110, the embodiments of this application provide casters 139 at the bottom of the loading and unloading device 121. The application of casters 139 makes the loading and unloading device 121 similar to a trolley, which is convenient to move.

[0045] In one possible implementation of the embodiments of this application, such as Figure 2 As shown, an automatic door 111 is also slidably installed on the test body 110, and a detection component 112 is also installed on the test body 110 corresponding to the opening. The detection component 112 is used to detect the position of the loading and unloading device 121 near the opening.

[0046] To further improve the installation accuracy of the test body 110 and the loading / unloading device 121, this embodiment of the application further provides a detection component 112 at the corresponding opening on the test body 110. The detection component 112 is used to detect the position near the loading / unloading device 121. Specifically, when the loading / unloading device 121 is located at the opening, the detection component 112 detects the loading / unloading device 121, thus determining that the loading / unloading device 121 is installed correctly; otherwise, it is considered that the loading / unloading device 121 is not installed correctly. In this way, when the loading / unloading device 121 shifts during the test, the detection component 112 can provide timely feedback.

[0047] Optionally, the loading and unloading device 121 also includes a side plate 124 mounted on the base 131. The side plate 124 is set to correspond to the guide rail 132 and avoids the bracket 123. The side plate 124 is provided with a weight reduction hole 125.

[0048] The loading / unloading device 121 includes side plates 124, which are arranged opposite to the guide rails 132, with the top ends of the side plates 124 connected to the top plate 134 and the bottom ends of the side plates 124 connected to the base 131, thereby improving the stability of the loading / unloading device 121. In addition, to reduce the weight of the loading / unloading device 121, multiple weight-reducing holes 125 are provided on the side plates 124 to facilitate the movement of the loading / unloading device 121.

[0049] In one possible implementation of the embodiments of this application, such as Figure 4 As shown, cam guides 142 are respectively provided at both ends of the support rod 140, and anti-tilting bolts 143 are provided between the two cam guides 142. The end of the test plate moves along the slide between the cam guides 142 and the anti-tilting bolts 143.

[0050] Along the direction of the test plate's entry and exit, the axis of the cam guide 142 near the test body 110 is lower than the surface of the guide rail 132 that supports the test plate. The cam guide 142 near the test body 110 rotates on the guide rod, thereby facilitating the entry and exit of the test plate.

[0051] The rotation axis of the cam guide 142, which is away from the test body 110, is higher than the surface of the guide rail 132 that carries the test plate, in order to prevent the test plate from falling off the end of the guide rail 132 away from the test body 110.

[0052] Since the test board has a certain weight, in this embodiment of the application, cam guides 142 are respectively provided at both ends of the support rod 140, which can make the test board slide smoothly on the slide, avoid jamming due to its own excessive weight, and prevent the test board from falling off the end of the guide rail 132 away from the test body 110.

[0053] An anti-tilting bolt 143 is also provided between the two cam guides 142. When the test plate slides in the slide, the lower surface of the test plate is restricted by the cam guides 142, and the upper surface of the test plate is restricted by the anti-tilting bolt 143, thereby enabling the test plate to slide smoothly in the slide. In addition, when one end of the test plate has entered the test body 110, and there is a certain distance between the bracket 123 and the detection position in the test body 110, causing the test plate to tip over and fall, the anti-tilting bolt 143 of this embodiment restricts its upper surface, thereby preventing the test plate from tipping over and falling due to the docking distance process when entering the test body 110.

[0054] Optional, such as Figure 1 As shown, the buffer platform 122 includes two units located on both sides of the loading and unloading device 121, which are used for loading and unloading respectively. Each of the two buffer platforms 122 is equipped with an ion fan 126 for removing static electricity.

[0055] This embodiment of the application provides two buffer platforms 122, located on either side of the loading / unloading device 121. One of the buffer platforms 122 is used for loading, and the other for unloading. This allows loading and unloading to be located in different areas, facilitating differentiation and preventing confusion between untested and tested chips. Furthermore, to facilitate loading and unloading by operators, the platform height of the buffer platform 122 should be suitable for the operator's working height.

[0056] Those skilled in the art should know that when the test object is a chip, the chip is relatively sensitive to static electricity. When the static electricity on the chip is large, it will damage the internal components of the chip. In this embodiment, ion fans 126 are provided on both buffer stages 122. The ion fans 126 move towards the test board and the test object to remove static electricity on the test board and the test object, thereby avoiding the influence of static electricity on the test object.

[0057] In addition, to avoid static electricity in the loading and unloading device 121, an ion fan 126 can be installed at the side plate 124 of the loading and unloading device 121, such as... Figure 1 As shown.

[0058] The above description is merely a preferred embodiment of this application and is not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A testing device, characterized in that, The test body includes a test plate for carrying a test object loaded on it, and the test body has an opening for the test plate to pass through. The loading and unloading buffer device includes a loading and unloading device for temporarily storing test boards and a buffer platform for temporarily storing test objects. The loading and unloading device is connected to the test body and is positioned directly opposite the opening. The buffer platform is located on at least one side of the loading and unloading device. The loading and unloading device includes a bracket for temporarily storing test boards and a lifting component for driving the bracket to move along the opening height direction.

2. The testing equipment according to claim 1, characterized in that, The loading and unloading device includes a base; the lifting component includes two guide rails mounted on the base and a driver mounted on the base; the bracket includes two support rods respectively disposed on the two guide rails, forming an operating platform for supporting the test plate between the two support rods, a slide rail extending perpendicular to the opening direction is formed on the support rod, and a guide block is provided on the side of the support rod near the opening for guiding the test plate to slide along the slide rail into the test body, or to slide from the test body into the operating platform.

3. The testing equipment according to claim 2, characterized in that, The loading and unloading device also includes a top plate, on which a position detector is provided. The position detector is connected to a controller. The position detector is used to detect the position of the bracket. The controller obtains the position of the bracket based on the position detector and controls the position of the bracket.

4. The testing equipment according to claim 1, characterized in that, The loading and unloading device is detachably connected to the side wall of the opening.

5. The testing equipment according to claim 4, characterized in that, The loading and unloading device is provided with a connecting plate and a machine base connecting block on the side near the test body. The connecting plate is provided with a connecting through hole, and the machine base connecting block is provided with a waist-shaped hole.

6. The testing equipment according to claim 4, characterized in that, The bottom of the loading and unloading device is equipped with casters.

7. The testing equipment according to claim 4, characterized in that, The test body is also equipped with an automatic door that slides on it, and a detection component is also provided on the test body corresponding to the opening. The detection component is used to detect the position of the loading and unloading device near the opening.

8. The testing equipment according to claim 2, characterized in that, The loading and unloading device also includes a side plate installed on the base. The side plate is arranged corresponding to the guide rail and avoids the bracket. Weight reduction holes are provided on the side plate.

9. The testing equipment according to claim 8, characterized in that, The two ends of the support rod are respectively provided with cam guides, and anti-tilting bolts are provided between the two cam guides. The end of the test plate moves along the slide between the cam guides and the anti-tilting bolts.

10. The testing equipment according to claim 1, characterized in that, The buffer platform includes two units located on both sides of the loading and unloading device, which are used for loading and unloading respectively. Each of the two buffer platforms is equipped with an ion fan for removing static electricity.

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