Double-pulse test tool and device

Abstract

The utility model belongs to the technical field of double-pulse testing, and particularly discloses a double-pulse testing tool and device.The double-pulse testing tool comprises a testing frame, and the upper end of the testing frame is provided with a supporting structure used for installing a unit busbar; the test frame is internally provided with a driving part which is used for driving the IGBT installation plate to be adjusted below the unit busbar in a lifting manner so as to enable the IGBT in the IGBT installation plate to be coupled with or separated from the unit busbar on the supporting structure. A dismounting port used for dismounting an IGBT is formed in the side of the test frame. When the test tool is used for a double-pulse test, the unit busbar does not need to be dismounted, and the dismounting workload is small when the IGBT is replaced.

Description

Technical Field

[0001] This application belongs to the field of dual-pulse testing technology, and more specifically, relates to a dual-pulse testing fixture and apparatus. Background Technology

[0002] The double-pulse test method is a mainstream testing method commonly used for the performance evaluation of IGBTs (Insulated Gate Bipolar Transistors). It is mainly used to measure the electrical characteristics of IGBTs during the switching process to evaluate indicators such as switching losses, conduction performance, and recovery characteristics.

[0003] In related technologies, double-pulse testing often requires assembling a double-pulse test system with a specific circuit configuration, including unit busbars, capacitors, and probes, to accurately test IGBTs. Typically, the unit busbar 2 and some related components in the double-pulse test system are combined with the IGBT mounting plate 3 that houses the IGBTs. Figure 1 The diagram shows a stacked power unit module. However, since the IGBT to be tested is located in the middle layer of this stacked structure, when it is necessary to replace the IGBT and test the next batch of IGBTs, in order to ensure that the newly installed IGBT can be correctly connected to the system, it is often necessary to remove the unit busbar and auxiliary configuration devices covering the IGBT being tested to make room for the IGBT removal and installation. The total workload of the removal and installation of these devices is large, time-consuming, and labor-intensive. Utility Model Content

[0004] In response to the deficiencies or improvement needs of existing technologies, this application provides a dual-pulse testing fixture and apparatus, which aims to improve the problem of the large amount of disassembly and assembly work required for replacing IGBTs in existing dual-pulse testing.

[0005] This application provides a dual-pulse test fixture, specifically including a test frame, wherein:

[0006] The upper end of the test frame is provided with a support structure for installing the unit busbar;

[0007] The test frame is equipped with a drive component for adjusting the height of the IGBT mounting plate below the unit busbar, so that the IGBTs in the IGBT mounting plate can be coupled or separated from the unit busbar on the support structure.

[0008] The test frame has a disassembly port on its side, through which the IGBT mounting plate can be inserted into and removed from the drive end of the driver component.

[0009] Compared with existing technologies, the above-described technical solution conceived in this application provides a tooling that can serve as the installation foundation for a dual-pulse testing system, assisting testing personnel in IGBT testing and reducing the difficulty and workload of their work. After components such as unit busbars of the dual-pulse testing system are installed in this testing tooling, the IGBT mounting plate can be moved up and down via a drive mechanism, allowing for precise adjustment of the assembly state between the IGBT and the unit busbar. Compared to traditional manual docking methods, the docking accuracy of this solution is significantly improved. Furthermore, when replacing an IGBT, after adjusting the lifting height of the drive mechanism, the IGBT mounting plate with the IGBT can be disassembled and reassembled along the disassembly / reassembly port, eliminating the need to disassemble and reassemble large, heavy components like unit busbars to free up operating space, thus significantly reducing the workload required for IGBT replacement.

[0010] As a further preferred embodiment, the support structure is connected to a support base, and the inner side of the support base protrudes to form a support portion for supporting the unit busbar, the support portion being positioned between the unit busbar and the IGBT mounting plate.

[0011] As a further preferred embodiment, the support portion is connected to a positioning structure for positioning the busbar of the positioning unit.

[0012] As a further preferred embodiment, the support portion is connected to a guide structure for guiding the IGBT mounting plate.

[0013] As a further preferred embodiment, the driving component is a height-adjustable lifting platform.

[0014] As a further preferred embodiment, the lower end of the test frame has a device mounting platform, which is located inside the test frame.

[0015] As a further preferred embodiment, the mounting surface of the device mounting stage is provided with a plurality of elongated slots for mounting and guiding the device.

[0016] As a further preferred embodiment, the test frame has mounting plates on its sides for mounting devices.

[0017] As a further preferred embodiment, the bottom of the test frame is equipped with casters.

[0018] The second aspect of this application provides a dual-pulse testing device using the following technical solution:

[0019] A dual-pulse testing apparatus includes any of the dual-pulse testing fixtures described in the first aspect, and a dual-pulse testing system installed in the dual-pulse testing fixture for testing IGBTs.

[0020] In summary, compared with the prior art, the technical solutions conceived in this application have the following main technical advantages:

[0021] 1. With the assistance of this tooling, the IGBT mounting plate can be moved up and down by the drive component, which can accurately adjust the assembly state of the IGBT and the unit busbar, thus greatly improving the docking accuracy. When replacing the IGBT, the IGBT mounting plate with the IGBT below the unit busbar can be removed along the disassembly port, eliminating the need to disassemble and reassemble large and heavy components such as the unit busbar above the IGBT mounting plate, thus greatly reducing the amount of disassembly and reassembly work required for replacing the IGBT. Attached Figure Description

[0022] Figure 1 This is a schematic diagram of the structure of the existing power unit module mentioned in the background section of this application;

[0023] Figure 2 This is a schematic diagram of the overall structure of a dual-pulse testing fixture provided in an embodiment of this application;

[0024] Figure 3 yes Figure 2 Enlarged view of point A in the middle;

[0025] Figure 4 This is a schematic diagram of the overall structure of a dual-pulse testing device provided in an embodiment of this application;

[0026] Figure 5 This is a front view of a dual-pulse testing device provided in an embodiment of this application;

[0027] Figure 6 This is a structural schematic diagram from another perspective of a dual-pulse testing device provided in an embodiment of this application.

[0028] In all the accompanying drawings, the same reference numerals are used to denote the same elements or structures, wherein:

[0029] 1. Test frame; 1-1. Support structure; 1-2. Device mounting platform; 1-3. Long slot; 1-4. Mounting plate; 2. Unit busbar; 3. IGBT mounting plate; 4. Drive component; 5. Support base; 5-1. Support part; 5-2. Positioning post; 5-3. Guide post; 6. Casters; 7. Capacitor; 8. Fuse; 10. Disassembly / removal port. Detailed Implementation

[0030] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0031] The following is in conjunction with the appendix Figures 2-6 This application will be described in further detail.

[0032] This application discloses a dual-pulse testing fixture. (Refer to...) Figures 2-6 The dual-pulse test fixture includes a test frame 1, wherein the upper end of the test frame 1 is provided with a support structure 1-1 for mounting the unit busbar 2; the test frame 1 is provided with a drive component 4 for driving the IGBT mounting plate 3 to rise and fall below the unit busbar 2, so that the IGBT in the IGBT mounting plate 3 is coupled or separated from the unit busbar 2 on the support structure 1-1; a disassembly port 10 is formed on the side of the test frame 1, through which the IGBT mounting plate 3 can be inserted into the drive end of the drive component 4, and the IGBT mounting plate 3 can be removed from the drive end of the drive component 4 through the disassembly port 10.

[0033] With this design, this fixture can serve as the installation base for a dual-pulse testing system, assisting testers in performing IGBT testing and reducing the difficulty and workload of their work. After components such as the unit busbar 2 of the dual-pulse testing system are installed in this testing fixture, the IGBT mounting plate 3 is moved up and down by the drive component 4, which can precisely adjust the assembly state of the IGBT and the unit busbar 2. Compared with the traditional manual docking solution, the docking accuracy can be greatly improved with the assistance of this fixture. When replacing IGBTs, it is no longer necessary to disassemble and reassemble large and heavy components such as the unit busbar 2, greatly reducing the amount of disassembly and assembly work required for IGBT replacement.

[0034] Furthermore, such as Figures 2-4 As shown, to achieve stable installation of the unit busbar 2, two support structures 1-1 are spaced apart at the upper end of the test frame 1. Multiple detachable support seats 5 are connected side-by-side on the support structure 1-1. The inner side of each support seat 5 has a protruding support part 5-1, which is detachably connected to the unit busbar 2. After the unit busbar 2 and IGBT mounting plate 3 are installed in this fixture, the support part 5-1 is positioned between the unit busbar 2 and the IGBT mounting plate 3.

[0035] Under this design, due to the presence of the support structure 1-1 and the support base 5, the unit busbar 2 can be stably mounted on the IGBT mounting plate 3 as a whole, and the test frame 1 has sufficient space for personnel to disassemble, install, raise and lower the IGBT, which facilitates personnel to carry out testing work.

[0036] Furthermore, since the support portion 5-1 of the support base 5 is located between the unit busbar 2 and the IGBT mounting plate 3, the support portion 5-1 can serve as a limiting structure for the IGBT mounting plate 3, limiting the maximum height of the IGBT mounting plate 3 and preventing the IGBT from being damaged by collision with the unit busbar 2.

[0037] It should be noted that in this embodiment, the support structure 1-1 is part of the test frame 1 and is generally composed of square rods and column-like components. In other embodiments, the support structure 1-1 may also adopt a gantry, column, or other structure, which is fixed above the test frame 1 and serves as the installation foundation for the unit busbar 2.

[0038] Furthermore, to improve the installation accuracy of the unit busbar 2, the support part 5-1 is connected to a positioning structure for positioning the unit busbar 2.

[0039] In some embodiments, such as Figure 3 As shown, the positioning structure includes a positioning post 5-2 connected to the top of the support 5-1, with the positioning post 5-2 vertically upward. Correspondingly, the surface of the unit busbar 2 is provided with positioning holes adapted to the positioning post 5-2.

[0040] In other embodiments, the positioning structure can also be a positioning plate or the like. When there are no positioning holes on the surface of the unit busbar 2, the side of the unit busbar 2 can be positioned by a positioning plate to achieve the positioning purpose.

[0041] Furthermore, to improve the stability of the lifting and adjusting of the IGBT mounting plate 3, the support part 5-1 is connected to a guide structure for guiding the IGBT mounting plate 3.

[0042] In some embodiments, such as Figure 3 As shown, the guide structure includes a guide post 5-3 connected to the bottom of the support 5-1. The guide post 5-3 is set vertically downwards, and the surface of the IGBT mounting plate 3 is provided with guide holes adapted to the guide post 5-3.

[0043] In other embodiments, the guiding structure can be a guide plate or a slide rail slider. When using a guide plate, if the surface of the IGBT mounting plate 3 does not have guide holes, the guiding function can be achieved by using a guide plate to guide the side of the IGBT mounting plate 3.

[0044] Furthermore, the driver component 4 and the IGBT mounting plate 3 are connected in a detachable manner. For example... Figure 2 As shown, in some embodiments, the drive element 4 is a height-adjustable lifting platform (e.g., a manually or electrically operated lifting platform), which has a support surface (i.e., the drive end) with bolt holes. Figure 2 As shown, a horizontal support plate is provided in the test frame 1, and a manual lifting platform is installed on the support plate. In other embodiments, the drive element 4 can also be an electrically or hydraulically driven linear drive element 4, such as an electric push rod.

[0045] Furthermore, such as Figure 2As shown, in some embodiments, the lower end of the test frame 1 has a device mounting platform 1-2, which is horizontally positioned inside the frame of the test frame 1, allowing personnel to mount devices onto the device mounting platform 1-2 along the openings in the frame of the test frame 1. The device mounting platform 1-2 is particularly suitable for mounting devices such as capacitors 7.

[0046] Preferably, the mounting surface of the device mounting stage 1-2 is provided with several elongated slots 1-3 for mounting and guiding devices. By installing a slider or other guide structure adapted to the guide slots 1-3 at the bottom of the device such as the capacitor 7, or by having the device itself with protrusions, flanges, or other structures that can serve as guide structures, the mounting stability of the device is improved in cooperation with the elongated slots 1-3.

[0047] Furthermore, such as Figure 2 As shown, in some embodiments, the sides of the test frame 1 are detachably connected to multiple mounting plates 1-4 for mounting devices. These mounting plates 1-4 are particularly suitable for mounting other types of busbars, fuses 8, and other devices.

[0048] Furthermore, such as Figure 2 As shown, in some embodiments, the bottom of the test frame 1 is equipped with casters 6 to enable the fixture to move. Preferably, the casters 6 are equipped with brakes.

[0049] Furthermore, in some embodiments, the test frame 1 is welded from 60×60mm square steel, and the test frame 1 has multiple bolt holes for installation and fixing. Various types of mounting plates, support bases 5 and other components are insulating parts, and are preferably made of epoxy board. Each component is preferably detachably connected by bolts or screws, and pads can be set between each component as needed.

[0050] This application also discloses a dual-pulse testing device, as described in the embodiments below. Figures 4-6 The dual-pulse testing device includes any of the aforementioned dual-pulse testing fixtures, and a dual-pulse testing system installed in the dual-pulse testing fixtures for testing IGBTs. The dual-pulse testing system is prior art, and its connection logic and testing principle will not be elaborated upon here.

[0051] Generally speaking, a dual-pulse test system mainly includes unit busbar 2, capacitor 7, probe, diode, fuse 8, copper busbar, and other types of busbars. Each component is installed in different parts of the dual-pulse test fixture and combined to form a test system.

[0052] For ease of understanding, Figures 4-6A schematic diagram of a dual-pulse testing device is shown. Four capacitors 7 are mounted on the device mounting platform 1-2, and multiple busbars are mounted on the mounting plate 1-4. These busbars are connected by copper busbars, and fuses 8 are installed between them. The remaining diodes and probes are mounted in the test frame 1 via mounting brackets or arrangement plates according to usage and connection requirements. Each device is connected according to testing needs. Generally, eight IGBTs are tested in the same batch, and the eight IGBTs and the IGBT mounting plate 3 form an active test module.

[0053] Throughout the dual-pulse test process, when the IBGT needs to be replaced, there is no need to move the busbar or rearrange the probe. Generally, only necessary components such as the absorption capacitor at the top of unit busbar 2 need to be removed, and the relevant lines need to be disconnected and reconnected to ensure the safety, accuracy and reliability of the test. This saves test operation time, reduces the workload of test personnel, thereby improving efficiency, and also saves the physical strength of test personnel, thus reducing costs.

[0054] It should be noted that in other embodiments, the design of the relevant frame, mounting plate, etc. can be adjusted for different IGBT products. Generally speaking, making the corresponding tooling can reduce testing costs and greatly improve testing efficiency.

[0055] It should be understood that expressions such as "comprising" and "may include" as used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as "comprising" and / or "having" may be interpreted as indicating a specific characteristic, number, operation, constituent element, component, or combination thereof, but should not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0056] It should be understood that the terms “center,” “upper,” “lower,” “front,” “rear,” “left,” “right,” “vertical,” “horizontal,” “inner,” “outer,” “clockwise,” “counterclockwise,” “axial,” “radial,” and “circumferential” indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0057] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, "multiple" means two or more, unless otherwise explicitly specified.

[0058] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0059] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A dual-pulse testing fixture, characterized in that, Includes a testing framework (1), in which: The upper end of the test frame (1) is provided with a support structure (1-1) for installing the unit busbar (2); The test frame (1) is provided with a drive component (4) for driving the IGBT mounting plate (3) to rise and fall below the unit busbar (2) so that the IGBT in the IGBT mounting plate (3) is coupled or separated from the unit busbar (2) on the support structure (1-1); The test frame (1) has a disassembly port (10) on its side, through which the IGBT mounting plate (3) can be inserted into the drive end of the drive unit (4) and removed from the drive end of the drive unit (4).

2. The dual-pulse test fixture as described in claim 1, characterized in that, The support structure (1-1) is connected to a support base (5), and the inner side of the support base (5) protrudes to form a support part (5-1) for supporting the unit busbar (2). The support part (5-1) can be located between the unit busbar (2) and the IGBT mounting plate (3).

3. The dual-pulse test fixture as described in claim 2, characterized in that, The support (5-1) is connected to a positioning structure for positioning the busbar (2) of the positioning unit.

4. The dual-pulse test fixture as described in claim 2, characterized in that, The support (5-1) is connected to a guide structure for guiding the IGBT mounting plate (3).

5. The dual-pulse test fixture as described in claim 1, characterized in that, The drive unit (4) is a liftable platform.

6. The dual-pulse test fixture as described in any one of claims 1-5, characterized in that, The lower end of the test frame (1) has a device mounting platform (1-2), which is located inside the test frame (1).

7. The dual-pulse test fixture as described in claim 6, characterized in that, The mounting surface of the device mounting platform (1-2) is provided with several elongated slots (1-3) for mounting and guiding devices.

8. The dual-pulse test fixture as described in any one of claims 1-5, characterized in that, The test frame (1) has mounting plates (1-4) on its side for mounting devices.

9. The dual-pulse test fixture as described in any one of claims 1-5, characterized in that, The test frame (1) is equipped with casters (6) at its bottom.

10. A dual-pulse testing device, characterized in that: It includes a dual-pulse test fixture as described in any one of claims 1-9, and a dual-pulse test system installed in the dual-pulse test fixture for testing IGBTs.

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