Positioning mechanism for chip testing device

Abstract

The utility model relates to the technical field of chip testing devices, in particular to a positioning mechanism for a chip testing device, which comprises a testing seat, a groove is arranged on the surface of the testing seat, a chip is arranged in the groove, a clamping rod mounting groove is arranged on the inner wall of a groove body of the groove, one end of a clamping rod is movably inserted in the clamping rod mounting groove, and the other end of the clamping rod is provided with a clamping groove. A clamping plate is fixed at the other end of the clamping rod; the chip clamping device has the beneficial effects that the clamping force of the two groups of clamping plates on a chip can directly position the chip in the direction towards the clamping plates, meanwhile, the chip is subjected to the friction force of the clamping plate gaskets on the grooves due to the clamping force, and the friction force plays a role in preventing the chip from horizontally and vertically moving, so that the chip is completely positioned; the size of the groove formed in the surface of the test seat is large, so that various chips with sizes smaller than those of the groove can be positioned, the test device can meet the requirements of the chips with various sizes and specifications, and the application range of the device is expanded.

Description

Technical Field

[0001] This utility model relates to the field of chip testing device technology, specifically a positioning mechanism for a chip testing device. Background Technology

[0002] A chip testing device is a device that can accurately measure and evaluate the electrical characteristics, functions, and reliability of semiconductor chips.

[0003] In the prior art, patent application number CN202222493833.9 discloses a chip scratch-free side testing device, including a test base and a top cover, which are hinged together. It also includes a floating platform, positioned above the test base and connected to the side testing base via a spring. The floating platform has a groove for placing the chip, and a positioning mechanism connected to the floating platform. The positioning mechanism and the sidewall of the groove clamp and fix the chip. By clamping and fixing the chip through the positioning mechanism and the sidewall of the groove, horizontal displacement of the chip during testing is prevented, thus avoiding scratches on the chip surface. In this device, the chip is simply placed in the groove, and then positioned by the positioning mechanism. Compared to traditional methods that require manual positioning of the chip before testing to ensure it is in the correct testing position, this device is simple to operate, has a refined structure, and improves the yield rate of tested chips.

[0004] However, the positioning mechanism of the existing chip scratch-free testing device means that the device can only test chips of one size, which greatly limits the application range of the device. Utility Model Content

[0005] The purpose of this invention is to provide a positioning mechanism for a chip testing device to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, the present invention provides the following technical solution: a positioning mechanism for a chip testing device, comprising: a test base, a groove formed on the surface of the test base, a chip disposed in the groove, a clamping rod mounting groove formed on the inner wall of the groove, one end of a clamping rod being movably inserted into the clamping rod mounting groove, and a clamping plate being fixed to the other end of the clamping rod.

[0007] Preferably, the clamping plates are provided in two sets, which are symmetrically distributed about the chip, and the groove size is larger than the chip groove size.

[0008] Preferably, the clamping rod has a circular rod structure, the clamping rod mounting groove has a circular groove structure, one end of the clamping rod extending into the clamping rod mounting groove is fixed with a clamping spring, and the other end of the clamping spring is fixed to the inner wall of the clamping rod mounting groove.

[0009] Preferably, the test base has a pull rod hole on its surface. The pull rod hole is a circular hole with a diameter smaller than that of the clamping rod mounting groove. The pull rod hole communicates with the clamping rod mounting groove. A pull rod is movably inserted into the pull rod hole. The pull rod is a circular rod with one end extending into the clamping rod mounting groove and fixed to the surface of the clamping rod. The other end of the pull rod extends out of the pull rod hole from the surface of the test base and is provided with a pull ring.

[0010] Preferably, the clamping plate has a rectangular plate structure, and clamping plate pads are fixed at the ends of the two sets of clamping plates that are close to each other.

[0011] Preferably, a groove bottom gasket is fixed on the inner wall of the bottom end of the groove.

[0012] Compared with the prior art, the beneficial effects of this utility model are:

[0013] The positioning mechanism for a chip testing device proposed in this utility model first moves two sets of clamping rods deeper into the mounting slots of the two sets of clamping rods. Then, the chip is placed into the groove opened on the surface of the test base. Afterward, the two sets of clamping rods slowly extend out of the mounting slots until the two sets of clamping plates clamp the chip in the middle. The clamping force of the two sets of clamping plates on the chip can directly position the chip in the direction of the clamping plates. At the same time, the chip is subjected to the frictional force of the clamping plate pads against the groove due to the clamping force. This frictional force prevents the chip from moving horizontally or vertically, thus achieving complete positioning of the chip. The groove opened on the surface of the test base is relatively large, so it can position chips of various sizes smaller than the groove, making the testing device compatible with chips of various sizes and expanding the application range of the device. Attached Figure Description

[0014] Figure 1 This is a schematic diagram of the structure of this utility model;

[0015] Figure 2 This is a schematic cross-sectional view of the present invention.

[0016] Figure 3 for Figure 2 Enlarged schematic diagram of the structure at point A in the middle.

[0017] In the diagram: 1. Test base; 2. Groove; 3. Clamping rod mounting groove; 4. Clamping rod; 5. Clamping plate; 6. Pull rod hole; 7. Pull rod; 8. Clamping spring; 9. Pull ring; 10. Clamping plate gasket; 11. Groove bottom gasket; 12. Chip. Detailed Implementation

[0018] To make the objectives, technical solutions, and advantages of this utility model clear and complete, the embodiments of this utility model will be further described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only some, not all, embodiments of this utility model, and are merely used to explain the embodiments of this utility model. They are not intended to limit the embodiments of this utility model. All other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.

[0019] Example 1: Please refer to Figures 1 to 3 This utility model provides a technical solution: a positioning mechanism for a chip testing device, comprising: a test base 1, a groove 2 formed on the surface of the test base 1, a chip 12 disposed in the groove 2, a clamping rod mounting groove 3 formed on the inner wall of the groove 2, one end of a clamping rod 4 movably inserted into the clamping rod mounting groove 3, and a clamping plate 5 fixed to the other end of the clamping rod 4, and two sets of clamping plates 5 are provided, the two sets of clamping plates 5 being symmetrically distributed about the chip 12, and the groove size of the groove 2 being larger than the groove size of the chip 12.

[0020] In actual use, the two sets of clamping rods 4 are first moved deeper into the two sets of clamping rod mounting slots 3. Then, the chip 12 is placed into the groove 2 opened on the surface of the test base 1. After that, the two sets of clamping rods 4 are slowly extended from the clamping rod mounting slots 3 until the two sets of clamping plates 5 clamp the chip 12 in the middle. The clamping force of the two sets of clamping plates 5 on the chip 12 can directly position the chip 12 in the direction of the clamping plates 5. At the same time, the chip 12 will also be subjected to the friction force of the clamping plate pads 10 on the groove 2 due to the clamping force. This friction force prevents the chip 12 from moving horizontally and vertically, thus completely positioning the chip 12. The groove 2 opened on the surface of the test base 1 is relatively large, so it can position chips of various sizes smaller than the groove 2, so that the test device can meet the chip of various sizes and specifications, expanding the application range of the device.

[0021] Example 2: Based on Example 1, in order to realize the movement of the clamping rod 4, the clamping rod 4 has a circular rod structure, the clamping rod mounting groove 3 has a circular groove structure, one end of the clamping rod 4 extending into the clamping rod mounting groove 3 is fixed with a clamping spring 8, and the other end of the clamping spring 8 is fixed on the inner wall of the groove of the clamping rod mounting groove 3. A pull rod hole 6 is opened on the surface of the test seat 1. The pull rod hole 6 has a circular hole structure, and the diameter of the pull rod hole 6 is smaller than the diameter of the clamping rod mounting groove 3. The pull rod hole 6 is connected to the clamping rod mounting groove 3, and a pull rod 7 is movably inserted into the pull rod hole 6. The pull rod 7 has a circular rod structure, one end of the pull rod 7 extends into the clamping rod mounting groove 3 and is fixed on the surface of the clamping rod 4, and the other end of the pull rod 7 extends out of the pull rod hole 6 from the surface of the test seat 1 and is provided with a pull ring 9.

[0022] When it is necessary for the clamping rod 4 to move deeper into the clamping rod mounting groove 3, simply insert your finger into the pull ring 9 and pull the pull rod 7 out of the pull rod hole 6. The movement of the pull rod 7 will cause the clamping rod 4 to move in the same direction, thus moving the clamping rod 4 deeper into the clamping rod mounting groove 3. At this time, the clamping spring 8 is compressed. When it is necessary for the clamping rod 4 to extend out of the clamping rod mounting groove 3, simply release the pull rod 7 slowly. The thrust generated by the compressed clamping spring 8 on the clamping rod 4 will cause the clamping rod 4 to move in the direction of extending out of the clamping rod mounting groove 3.

[0023] Example 3: Based on Example 2, in order to avoid scratching the chip 12, the clamping plate 5 is a rectangular plate structure. The two sets of clamping plates 5 are fixed with clamping plate pads 10 at their close ends, and the groove bottom pads 11 are fixed on the inner wall of the groove bottom of the groove 2.

[0024] A groove bottom pad 11 is fixed on the inner wall of the bottom of the groove 2. A clamping plate pad 10 is provided at one end of the two sets of clamping plates 5 that are close to each other. Both the clamping plate pad 10 and the groove bottom pad 11 are made of soft and elastic rubber material. This can prevent the chip 12 from being scratched and also increase the friction of the clamping plate 5 on the chip 12, so that the chip 12 is positioned more firmly.

[0025] In actual use, the two sets of clamping rods 4 are first moved deeper into the two sets of clamping rod mounting slots 3. Then, the chip 12 is placed into the groove 2 opened on the surface of the test base 1. Next, the two sets of clamping rods 4 are slowly extended from the clamping rod mounting slots 3 until the two sets of clamping plates 5 clamp the chip 12 in the middle. The clamping force of the two sets of clamping plates 5 on the chip 12 can directly position the chip 12 towards the clamping plates 5. At the same time, the chip 12 will also be subjected to the frictional force of the clamping plate pads 10 on the groove 2 due to the clamping force. This frictional force prevents the chip 12 from moving horizontally or vertically, thus completely positioning the chip 12. The groove 2 opened on the surface of the test base 1 is relatively large, so it can position chips of various sizes smaller than the groove 2, allowing the testing device to accommodate chips of various sizes and expanding its application range. When it is necessary for the clamping rods 4 to move deeper into the clamping rod mounting slots 3... When moving deeper, simply insert your finger into the pull ring 9 and pull the pull rod 7 out of the pull rod hole 6. The movement of the pull rod 7 will cause the clamping rod 4 to move in the same direction, thus moving the clamping rod 4 deeper into the clamping rod mounting groove 3. At this time, the clamping spring 8 is compressed. When the clamping rod 4 needs to extend out of the clamping rod mounting groove 3, simply release the pull rod 7 slowly. The pushing force generated by the compressed clamping spring 8 on the clamping rod 4 will cause the clamping rod 4 to move in the direction of extending out of the clamping rod mounting groove 3. A groove bottom pad 11 is fixed on the inner wall of the bottom of the groove 2. A clamping plate pad 10 is provided at the end of the two sets of clamping plates 5 that are close to each other. Both the clamping plate pad 10 and the groove bottom pad 11 are made of soft and elastic rubber material. This can prevent the chip 12 from being scratched and can also increase the friction between the clamping plate 5 and the chip 12, so that the chip 12 is positioned more firmly.

[0026] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A positioning mechanism for a chip testing apparatus, comprising: Test base (1), a groove (2) is provided on the surface of the test base (1), and a chip (12) is provided in the groove (2). The characteristic is that a clamping rod mounting groove (3) is provided on the inner wall of the groove (2), one end of a clamping rod (4) is movably inserted into the clamping rod mounting groove (3), and the other end of the clamping rod (4) is fixed with a clamping plate (5).

2. The positioning mechanism for a chip testing device according to claim 1, characterized in that: The clamping plate (5) is provided in two sets, and the two sets of clamping plates (5) are symmetrically distributed about the chip (12). The groove size of the groove (2) is larger than the groove size of the chip (12).

3. The positioning mechanism for a chip testing device according to claim 1, characterized in that: The clamping rod (4) has a circular rod structure, and the clamping rod mounting groove (3) has a circular groove structure. One end of the clamping rod (4) that extends into the clamping rod mounting groove (3) is fixed with a clamping spring (8), and the other end of the clamping spring (8) is fixed on the inner wall of the groove of the clamping rod mounting groove (3).

4. The positioning mechanism for a chip testing device according to claim 1, characterized in that: The test base (1) has a pull rod hole (6) on its surface. The pull rod hole (6) is a round hole with a diameter smaller than that of the clamping rod mounting groove (3). The pull rod hole (6) is connected to the clamping rod mounting groove (3). A pull rod (7) is movably inserted into the pull rod hole (6). The pull rod (7) is a round rod with one end extending into the clamping rod mounting groove (3) and fixed on the surface of the clamping rod (4). The other end of the pull rod (7) extends out of the pull rod hole (6) from the surface of the test base (1) and is provided with a pull ring (9).

5. A positioning mechanism for a chip testing apparatus according to claim 2, characterized in that: The clamping plate (5) has a rectangular plate structure, and clamping plate gaskets (10) are fixed at the ends of the two sets of clamping plates (5) that are close to each other.

6. The positioning mechanism for a chip testing device according to claim 1, characterized in that: A bottom gasket (11) is fixed on the inner wall of the bottom end of the groove (2).

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