Full-band multi-probe near-field test system

Abstract

The utility model provides a full-band multi-probe near-field test system. The full-band multi-probe near-field test system comprises a test darkroom, and a low-frequency sampling system, a high-frequency sampling system, a millimeter wave sampling system and a to-be-tested object movement system which are all arranged in the test darkroom, the low-frequency sampling system and the high-frequency sampling system are semi-annular, and are vertically arranged in a concentric and orthogonal manner with the same inner diameter; the to-be-tested object movement system is used for installing the to-be-tested antenna and can drive the to-be-tested antenna to move spatially at the circle center of the semi-ring; the low-frequency sampling system, the high-frequency sampling system and the millimeter wave sampling system are all used for sampling signals of an antenna to be tested. The low-frequency sampling system, the high-frequency sampling system and the millimeter wave sampling system are integrated in the testing darkroom, the low-frequency sampling system and the high-frequency sampling system are concentrically arranged, the to-be-tested object movement system controls the to-be-tested antenna to move in the circle center space and shares the same to-be-tested object movement system, 5G / 6G full-band testing is met, and cost is reduced.

Description

Technical Field

[0001] This utility model relates to the field of communication equipment testing technology, and more specifically, to a full-band multi-probe near-field testing system. Background Technology

[0002] With the development of communication technology, communication equipment has become increasingly complex, and correspondingly, the testing requirements for communication equipment have become more stringent. As a result, testing systems such as compact field and multi-probe spherical near-field testing systems have emerged to test complex communication equipment. Among them, the multi-probe spherical near-field testing system has become the industry benchmark due to its high testing accuracy and wide testing range. It generally consists of a sampling system, an analysis system, and a test object motion system. The test object motion system is used to install the antenna under test and drive its spatial movement. The sampling system samples the electromagnetic waves radiated by the antenna under test, and finally, the analysis system calculates and obtains various electrical parameters of the antenna under test.

[0003] However, most multi-probe spherical near-field testing systems used for testing 5G / 6G communication equipment on the market are used for testing single frequency bands in low frequency (0.35~6GHz), high frequency (6~40GHz) and millimeter wave (40~110GHz) bands, which cannot meet the needs of testing the entire 5G / 6G frequency band (0.35GHz~110GHz). Utility Model Content

[0004] The purpose of this invention is to provide a full-band multi-probe near-field testing system that can meet the testing needs of the entire 5G / 6G frequency band.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] This invention provides a full-band multi-probe near-field testing system, including a test anechoic chamber and a low-frequency sampling system, a high-frequency sampling system, a millimeter-wave sampling system, and a test object motion system, all housed within the test anechoic chamber. The low-frequency and high-frequency sampling systems are both semi-circular, and are vertically arranged concentrically with equal and orthogonal inner diameters. The test object motion system is used to mount the antenna under test and can drive the antenna to move spatially around the center of the semi-circle. The low-frequency, high-frequency, and millimeter-wave sampling systems are all used to sample the signal from the antenna under test for subsequent system analysis to obtain the antenna's performance parameters.

[0007] In one embodiment, both the low-frequency sampling system and the high-frequency sampling system are provided with multiple dual-polarized sampling antennas, each of which is uniformly distributed along the circumference and faces the center of the circle.

[0008] In one embodiment, both the low-frequency sampling system and the high-frequency sampling system are equipped with radio frequency switches. The radio frequency switches are equipped with multiple output ports, and the multiple output ports are configured to correspond one-to-one with each dual-polarized sampling antenna.

[0009] In one embodiment, the top ends of the low-frequency sampling system and the high-frequency sampling system are connected.

[0010] In one implementation, the tops of the two sampling systems are nested together.

[0011] In one embodiment, the near-field testing system is further provided with two support structures, which support the low-frequency sampling system and the high-frequency sampling system from the side of each sampling system opposite to the sampling antenna.

[0012] In one embodiment, the support structure is made of a non-metallic material and has a perforated design.

[0013] In one embodiment, the millimeter-wave sampling system includes a base, a multi-axis robotic arm supported on the base, and a mounting flange disposed at the end of the multi-axis robotic arm for mounting a millimeter-wave probe.

[0014] In one embodiment, the millimeter-wave sampling system is located on the side of the object-to-measure motion system away from the high-frequency sampling system, and the line connecting the millimeter-wave sampling system and the object-to-measure motion system is perpendicular to the line connecting the low-frequency sampling system and the object-to-measure motion system.

[0015] In one embodiment, the near-field testing system further includes a temperature control subsystem, which is equipped with a temperature clamp covering the outer periphery of the antenna under test.

[0016] The beneficial effects of the technical solution provided by this utility model are as follows: The near-field testing system of this utility model integrates a low-frequency sampling system, a high-frequency sampling system and a millimeter-wave sampling system into a test anechoic chamber. The low-frequency sampling system and the high-frequency sampling system are set concentrically, and the test object motion system controls the test antenna to move in space at the center of the circle. They share the same set of test object motion system, meet the testing requirements of the 5G / 6G full frequency band, and reduce costs. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this utility model, the accompanying drawings used in the description of the embodiments of this utility model will be briefly introduced below.

[0018] Figure 1 This is a schematic diagram of the structure of a full-band multi-probe near-field testing system provided in one embodiment of the present invention;

[0019] Figure 2 for Figure 1 Enlarged view of part A in the middle. Detailed Implementation

[0020] Embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. While some embodiments of the present invention are shown in the drawings, it should be understood that the present invention can be implemented in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided to provide a more thorough and complete understanding of the present invention. It should be understood that the accompanying drawings and embodiments of the present invention are for illustrative purposes only and are not intended to limit the scope of protection of the present invention.

[0021] It should be understood that the steps described in the method embodiments of this utility model may be performed in different orders and / or in parallel. Furthermore, the method embodiments may include additional steps and / or omit the steps shown. The scope of this utility model is not limited in this respect.

[0022] The term "comprising" and its variations as used herein are open-ended, meaning "including but not limited to". The term "connection" can refer to a direct connection or an indirect connection via intermediate components (elements). The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Definitions of other terms will be given in the following description.

[0023] See Figure 1 and Figure 2 This utility model relates to a full-band multi-probe near-field testing system (hereinafter referred to as "near-field testing system"), which is used to test communication equipment in the 5G / 6G band, such as 5G antennas, and to obtain the electrical performance of the antenna under test.

[0024] The near-field testing system includes a test darkroom 100 and a low-frequency sampling system 200, a high-frequency sampling system 300, a millimeter-wave sampling system 400, a test object motion system 500, a temperature control subsystem 600, and a radio frequency transceiver system 700, all of which are set in the test darkroom 100.

[0025] The anechoic chamber 100 is used to provide an interference-free testing environment. Its length, width, and height are 15m, 15m, and 13m, respectively. The inner wall of the anechoic chamber 100 is provided with wave-absorbing material to avoid the adverse effects of metal materials on the test results and improve the accuracy of the test results.

[0026] The terms "low frequency" and "high frequency" are relative concepts, referring to the lower frequency band and the higher frequency band within the 5G band, respectively. The low-frequency sampling system operates in the range of 0.35–6 GHz and is used to sample antenna signals within this frequency range. The high-frequency sampling system operates in the range of 6–40 GHz and is used to sample antenna signals within this frequency range. The millimeter-wave sampling system operates in the range of 40–110 GHz and is used to sample antenna signals within this frequency range.

[0027] Both the low-frequency sampling system 200 and the high-frequency sampling system 300 are semi-ring structures 20, and they are erected and orthogonally arranged with the same center (i.e., concentric) and the same diameter. Each of the low-frequency sampling system 200 and the high-frequency sampling system 300 has multiple dual-polarized sampling antennas 10 evenly distributed along the circumference, with the radiating surface of each dual-polarized sampling antenna facing the center.

[0028] In one embodiment, both the low-frequency sampling system 200 and the high-frequency sampling system 300 are provided with a switch matrix composed of radio frequency switches (not shown, the same below). Each radio frequency switch is provided with multiple output ports, and the multiple output ports are connected to each dual-polarized sampling antenna in a one-to-one correspondence, so that each sampling antenna can be switched by the radio frequency switch to sample the antenna under test.

[0029] In one embodiment, the semi-ring structure 20 includes a base 21 located on the outer side and multiple antenna groups 22 evenly distributed on the inner side along the circumferential direction. Each antenna group 22 is provided with six dual-polarized sampling antennas 10. By grouping the dual-polarized sampling antennas, it is convenient to network the sampling antennas to optimize the electrical performance of the sampling system, and it is also convenient to assemble the low-frequency sampling system and the high-frequency sampling system.

[0030] Correspondingly, an RF switch is a single-pole six-throw switch with six output ports, which are connected one-to-one with the dual-polarized antennas in an antenna group.

[0031] The near-field testing system also includes two support structures 30, which support the sampling system from the side of the low-frequency sampling system 200 or the high-frequency sampling system 300 facing away from the radiating surface of the dual-polarized sampling antenna 10. In one embodiment, the support structures are made of non-metallic material and are perforated to avoid interference from metallic materials on the test results.

[0032] Furthermore, the top ends of the low-frequency sampling system 200 and the high-frequency sampling system 300 are nested together, with the two sampling systems supporting each other, improving the stability of the sampling system installation structure and facilitating the positioning and installation of the sampling systems, thus ensuring the accuracy of the test results. In other embodiments, the top ends of the low-frequency and high-frequency sampling systems can be connected by L-shaped connectors (e.g., corner brackets).

[0033] The motion system of the object under test includes a base and a multi-axis industrial robot mounted on the base. The antenna under test is mounted on the end of the multi-axis industrial robot and can be driven to move in space at the center of the semi-ring.

[0034] In one embodiment, the millimeter-wave sampling system 400 includes a base, a multi-axis robotic arm 40 supported above the base, and a mounting flange disposed at the end of the multi-axis robotic arm for mounting a millimeter-wave probe.

[0035] In one embodiment, the millimeter-wave sampling system 400 is located on the side of the motion system 500 of the object under test away from the high-frequency sampling system 300, and the line connecting the millimeter-wave sampling system and the motion system of the object under test is perpendicular to the line connecting the low-frequency sampling system and the motion system of the object under test.

[0036] Therefore, the low-frequency sampling system 200, the high-frequency sampling system 300, and the millimeter-wave sampling system 400 are integrated into a single test anechoic chamber 100. The low-frequency and high-frequency sampling systems are concentrically set, and the device-under-test (DUT) motion system controls the DUT antenna to move in space at the center of the circle, sharing the same DUT motion system. This meets the testing requirements for communication equipment used in applications such as 5G / 6G full-band mobile communication, phased array radar, and satellite communication / satellite navigation, while also reducing costs.

[0037] The near-field testing system also includes a temperature control subsystem 600, which has error compensation capabilities for environmental effects (high and low temperatures, eccentricity, coupling). The temperature control subsystem 600 is equipped with a temperature fixture covering the outer periphery of the antenna under test, creating a variable temperature environment and providing precise control and a wide-temperature, low-loss fixture to provide a low-error testing environment.

[0038] It should be understood that the near-field testing system also includes a radio frequency transceiver system 700, which is electrically connected to each sampling system and the motion system of the object under test, and is responsible for broadband distributed modular signal generation and multi-channel signal reception.

[0039] The steps for the performance testing of the antenna under test using the testing system of this utility model are as follows:

[0040] 1. Calibrate the testing system;

[0041] 2. Accurately position the object under test (such as the antenna under test) to the test area (such as the center of the circle) using the object under test motion system;

[0042] 3. The radio frequency transceiver system transmits the emitted electromagnetic signals to the object under test via radio frequency cables;

[0043] 4. A spherical near-field high- and low-frequency sampling system or a millimeter-wave sampling system will scan the electromagnetic field signal emitted by the object under test;

[0044] 5. The collected signal is then fed back to the radio frequency receiving system;

[0045] 6. Finally, the actual performance of the DUT is calculated using software, thus completing the performance test of the test object.

[0046] The above description is merely a preferred embodiment of this utility model and an explanation of the technical principles employed. Those skilled in the art should understand that the scope of this utility model is not limited to the specific combination of the above-described technical features, but also includes other technical solutions formed by arbitrary combinations of the above-described technical features or their equivalents without departing from the inventive concept. For example, technical solutions formed by substituting the above-described features with (but not limited to) technical features of the utility model in this utility model that have similar functions.

[0047] Although the subject matter has been described using language specific to structural features and / or methodological logic, it should be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or actions described above. Rather, the specific features and actions described above are merely illustrative examples of implementing the claims.

Claims

1. A full-band multi-probe near-field testing system, characterized in that, It includes a test anechoic chamber, a low-frequency sampling system, a high-frequency sampling system, a millimeter-wave sampling system, a test object motion system, a temperature control subsystem, and a radio frequency transceiver system; Both the low-frequency sampling system and the high-frequency sampling system are semi-circular, and the low-frequency sampling system and the high-frequency sampling system are vertically arranged in a concentric, equal-diameter and orthogonal manner. Both the low-frequency sampling system and the high-frequency sampling system are equipped with multiple dual-polarized sampling antennas, each of which is uniformly distributed along the circumference and its radiating surface faces the center of the circle. The low-frequency sampling system and the high-frequency sampling system are connected at their top ends or nested within each other. The near-field testing system also includes two support structures, which support the low-frequency sampling system and the high-frequency sampling system from the side of each sampling system facing away from the sampling antenna; the support structures are made of non-metallic materials and have a hollow design; the inner wall of the test anechoic chamber is lined with wave-absorbing material; The motion system of the object under test includes a base and a multi-axis industrial robot mounted on the base; the end effector of the multi-axis industrial robot is used to install the antenna under test and can drive the antenna under test to move in space at the center of the semi-ring. The low-frequency sampling system, high-frequency sampling system, and millimeter-wave sampling system are all used to sample the signals from the antenna under test for subsequent system analysis to obtain the performance parameters of the antenna under test. The low-frequency sampling system operates in the range of 0.35–6 GHz and is used to sample antenna signals within the operating frequency band of the specified range. The high-frequency sampling system operates in the range of 6–40 GHz and is used to sample antenna signals within the operating frequency band of the specified range. The millimeter-wave sampling system operates in the range of 40–110 GHz and is used to sample antenna signals within the operating frequency band of the specified range. Furthermore, the low-frequency sampling system, high-frequency sampling system, and millimeter-wave sampling system are all integrated within the same anechoic chamber. The millimeter-wave sampling system includes a base, a multi-axis robotic arm supported on the base, and a mounting flange at the end of the multi-axis robotic arm. The mounting flange is used to mount a millimeter-wave probe. The millimeter-wave sampling system is located on the side of the motion system of the object under test away from the high-frequency sampling system, and the line connecting the millimeter-wave sampling system and the motion system of the object under test is perpendicular to the line connecting the low-frequency sampling system and the motion system of the object under test. The near-field testing system also includes a temperature control subsystem, which includes a temperature clamp covering the outer periphery of the antenna under test. The radio frequency transceiver system is electrically connected to each sampling system and the motion system of the object under test, and is responsible for broadband distributed modular signal generation and multi-channel signal reception.

2. The full-band multi-probe near-field testing system according to claim 1, characterized in that, The internal dimensions of the test darkroom are 15m × 15m × 13m.

3. The full-band multi-probe near-field testing system according to claim 1, characterized in that, Both the low-frequency sampling system and the high-frequency sampling system are equipped with radio frequency switches. Each radio frequency switch has multiple output ports, and each of the multiple output ports is configured to correspond one-to-one with each dual-polarized sampling antenna.

4. The full-band multi-probe near-field testing system according to claim 1, characterized in that, The full-band multi-probe near-field testing system is used to test communication equipment in the 5G or 6G bands.

5. The full-band multi-probe near-field testing system according to claim 4, characterized in that, The full-band multi-probe near-field testing system is used to test 5G antennas and obtain the electrical performance of the antenna under test.

6. The full-band multi-probe near-field testing system according to claim 3, characterized in that, Both the semi-circular low-frequency sampling system and the high-frequency sampling system include a semi-circular base on the outer side and multiple antenna groups evenly distributed on the inner side along the circumference.

7. The full-band multi-probe near-field testing system according to claim 6, characterized in that, Each antenna group is equipped with six dual-polarized sampling antennas. By grouping the dual-polarized sampling antennas, it is convenient to network the sampling antennas to optimize the electrical performance of the sampling system, and also to facilitate the assembly of low-frequency and high-frequency sampling systems. Correspondingly, an RF switch is a single-pole six-throw switch with six output ports, which are connected one-to-one with the dual-polarized antennas in an antenna group.

8. The full-band multi-probe near-field testing system according to claim 6, characterized in that, The two ends of the semi-circular low-frequency sampling system and the high-frequency sampling system are respectively the top end and the bottom end. The two top ends of the semi-circular low-frequency sampling system and the high-frequency sampling system are orthogonally connected, and the two bottom ends are close to the ground of the test darkroom and point towards the base of the test object movement system.

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