Test tool for simulating internal compartment of switch equipment

Abstract

The utility model relates to the technical field of 40.5 kV switch equipment tests, in particular to a test tool for simulating an internal compartment of switch equipment, which comprises a bus structure. The insulating assembly is used for fixedly installing the bus; the frame assembly can automatically adjust the distance from the bus to the top plate when the frame assembly is in lap joint with the bottom plate; the distances from the bus to the top plate, the left wall and the right wall in the tool can be adjusted, so that the insulation performance of buses of different specifications and matched fasteners under different insulation distances can be verified; and the buses of different specifications can be replaced only by dismounting the connecting bolts of the insulation structure, so that the operation is very convenient, and the efficiency of insulation tests of different schemes is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of 40.5kV switchgear testing, and particularly relates to a test tool for simulating an internal compartment of a switchgear. BACKGROUND

[0002] As an essential part of domestic and foreign power grids, the insulation performance of 40.5kV switchgears is related to whether the entire power distribution network can work normally and stably. Therefore, it is particularly crucial to ensure the insulation performance of the equipment under the design scheme of different specifications of busbars and fasteners.

[0003] The 40.5kV switchgear has a large size, many components and a relatively complex structure. When a certain component is disassembled and assembled, many components with structural cooperation are usually disassembled and assembled, which is time-consuming and laborious. However, when the insulation performance of the product is tested, usually multiple schemes are compared, so the whole cabinet test will consume a lot of time and sometimes cannot meet the demand of the related research time node. SUMMARY

[0004] In view of the above problems of the existing test tool for simulating the internal compartment of the switchgear, the present application is proposed.

[0005] Therefore, the present application aims to provide a test tool for simulating the internal compartment of the switchgear.

[0006] To solve the above technical problems, the present application provides the following technical scheme: a busbar structure; an insulation assembly for fixedly mounting the busbar; and a frame assembly, so as to realize self-adjustment of the distance from the busbar to the top plate when the frame assembly is lapped with the bottom plate.

[0007] As a preferred scheme of the test tool for simulating the internal compartment of the switchgear, the busbar structure includes a first busbar, a second busbar arranged on one side of the first busbar, a first connecting hole arranged at one end of the first busbar, a second connecting hole arranged at one end of the second busbar, and a fastener arranged between the first connecting hole and the second connecting hole.

[0008] As a preferred scheme of the test tool for simulating the internal compartment of the switchgear, the specification of the first busbar adopts a 60x12 full round edge, and the specification of the second busbar adopts an 80x10 full round edge.

[0009] As a preferred scheme of the test tool for simulating the internal compartment of the switchgear, the first busbar is provided with a first wiring hole, the second busbar is provided with a second wiring hole, one end of the first busbar is provided with a first mounting hole, and the other end of the second busbar is provided with a second mounting hole.

[0010] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the insulating component comprises an insulator, an insulator support arranged below the insulator, and a circular mounting hole arranged above the insulator support.

[0011] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the frame assembly comprises a bottom plate, and a top plate arranged above the bottom plate.

[0012] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the bottom plate is provided with scale lines, the scale lines are provided with 10 lines, every 5 lines are a group, left and right symmetrical, the distance between the nearest scale line and the side plate is 260 mm, and the remaining 4 lines are increased by 20 mm.

[0013] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the left and right side walls of the top plate are respectively provided with a group of top plate connecting holes, each group of connecting holes is divided into 3 columns, and each column is provided with 9 13x17 waist round holes with a spacing of 30 mm.

[0014] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the top plate and the bottom plate are both formed by folding three bends of an aluminum-zinc plated sheet AZ150.

[0015] As a preferred solution of the test tool for the internal compartment of the analog switchgear device, wherein: the fasteners can be selected in different specifications to verify the insulation performance under different insulation distances.

[0016] The beneficial effects of the present application are: the distances from the busbar in the tool to the top plate and the left and right walls can be adjusted, so that the insulation performance of different specifications of busbars and fasteners under different insulation distances can be verified; and replacing different specifications of busbars only requires removing the connecting bolts with the insulation structure, which is very convenient to operate, and improves the efficiency of performing different scheme insulation tests. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor. Among them:

[0018] Figure 1 is a structural schematic diagram of the analog 40.5kV switchgear compartment test tool of the present application;

[0019] Figure 2 is a structural schematic diagram of the frame structure of the aluminized zinc sheet of the present application;

[0020] Figure 3 is a structural schematic diagram of the bottom plate in the frame of the aluminized zinc sheet of the present application;

[0021] Figure 4 is a structural schematic diagram of the top plate in the frame of the aluminized zinc sheet of the present application;

[0022] Figure 5 is a structural schematic diagram of the busbar structure of the present application;

[0023] Figure 6 is a structural schematic diagram of the insulation structure of the present application;

[0024] Figure 7 is a structural schematic diagram of the insulator support in the insulation structure of the present application. DETAILED DESCRIPTION

[0025] In order to make the above objectives, features and advantages of the present application more apparent and comprehensible, the specific embodiments of the present application will be described in detail below with reference to the accompanying drawings.

[0026] In the following description, a large number of specific details are set forth in order to provide a thorough understanding of the present application, but the present application can also be implemented in other manners different from those described herein, and those skilled in the art can make similar generalizations without departing from the concept of the present application, so the present application is not limited to the specific embodiments disclosed below.

[0027] Secondly, the "one embodiment" or "embodiment" referred to herein means that the specific features, structures or characteristics can be included in at least one implementation of the present application. "In one embodiment" appearing in different places in the specification does not mean the same embodiment, nor is it an embodiment that is independent or alternative to other embodiments.

[0028] Thirdly, the present application is described in detail in combination with the schematic diagrams, and in the detailed description of the embodiments of the present application, the cross-sectional view of the device structure is partially enlarged without the general proportion for the convenience of description, and the schematic diagram is only an example, which should not limit the scope of protection of the present application herein. In addition, the three-dimensional spatial dimensions of length, width and depth should be included in actual manufacturing.

[0029] Embodiment 1

[0030] Reference Figures 1-3 provides a test tool for simulating the internal compartment of a switching device, which comprises a busbar structure 100; an insulation assembly 200 for fixedly mounting the busbar; and a frame assembly 300, so as to realize self-adjustment of the distance from the busbar to the top plate 302 when the frame assembly 300 is lapped with the bottom plate 301.

[0031] Specifically, the busbar structure 100 includes a first busbar 101, a second busbar 102 arranged on one side of the first busbar 101, a first connecting hole 103 arranged at one end of the first busbar 101, a second connecting hole 104 arranged at one end of the second busbar 102, and a fastener 105 arranged between the first connecting hole 103 and the second connecting hole 104.

[0032] Further, the busbar structure 100 is formed by the first busbar 101 and the second busbar 102 through the first busbar 101 connecting hole 301b and the second busbar 102 connecting hole 301b using the fastener 105, the busbar 1 specification is 60x12 full round edge, the busbar 2 specification is 80x10 full round edge, both are 40.5kV switch device commonly used size, both busbars are provided with φ20 round hole, one first connecting hole 101a and one second connecting hole 102a for connecting high-voltage line, φ14 round hole, one first mounting hole 101b and one second mounting hole 102b for connecting insulation structure, φ14 round hole, four first connecting holes 101a and four second connecting holes 102a for mutual connection, the fastener 105 can be selected in different specifications to verify the insulation performance under different insulation distances.

[0033] The frame assembly includes a bottom plate 301 and a top plate 302 arranged above the bottom plate 301, the left side wall and the right side wall of the top plate 302 are respectively provided with a group of top plate connecting holes 302a, each group of top plate connecting holes 302a is divided into three columns, each column has nine 13x17 waist round holes with an interval of 30mm, so as to realize self-adjustment of the distance from the busbar to the top plate 302 when the bottom plate 301 is overlapped with the top plate 302; the left side wall and the right side wall of the bottom plate 301 are respectively provided with φ13 bottom plate connecting holes 301b for connecting with the top plate 302, and the top plate 302 and the bottom plate 301 are both formed by folding three bends of aluminized zinc plate AZ150.

[0034] Embodiment 2

[0035] Reference Figures 1-5 The difference between this embodiment and the first embodiment is that the bottom of the bottom plate 301 is provided with a scale line 301a, the scale line 301a is provided with 10 lines, every 5 lines is a group, left-right symmetrical, the distance from the nearest scale line 301a to the side plate is 260mm, the remaining 4 lines are increased with an interval of 20mm, the distance from the busbar to the left and right side plates can be adjusted by moving the insulation structure to make the edge of the support 202 align with the scale line 301a, and the left and right side plates are respectively provided with three φ14 holes for fixing the top plate 302.

[0036] The remaining structures are the same as those of the first embodiment.

[0037] Embodiment 3

[0038] Reference Figures 1-7The difference between this embodiment and the above embodiments is that the insulating component comprises an insulator 201, an insulator support 202 arranged below the insulator 201, and a circular mounting hole 203 arranged above the insulator support 202.

[0039] The insulating structure is formed by bolting the insulator 201 and the insulator support 202, the insulator 201 is made of epoxy resin, the insulator support 202 is made of aluminum-zinc plated sheet, the lower part of the insulator 201 is bolted to the upper part of the support 202, the upper part is provided with a hole for fixing and mounting the busbar, the lower part of the insulator support 202 is arranged on the frame bottom plate 301 and can be freely moved, the insulator support 202 is formed by folding 8 times from 2 aluminum-zinc plated sheets AZ150, the top is provided with a φ20 circular hole, and an M16 stud is used to connect the insulator 201.

[0040] The rest of the structure is the same as that of Embodiment 2.

[0041] Importantly, it should be noted that the constructions and arrangements of the present application shown in the various exemplary embodiments are illustrative only. Although several embodiments have been described in detail herein, many modifications are possible to one skilled in the art, in light of the above teachings (e.g., variations of sizes, dimensions, structures, shapes and proportions of the various elements, values of parameters, mounting arrangements, use of materials, colors, orientations, etc.). For example, the elements shown as integrally formed can be constructed of multiple parts or elements, the position of elements can be reversed or otherwise varied, and the nature or number of discrete elements or positions can be altered or varied. Accordingly, all such modifications are intended to be included within the scope of the present application. The order or sequence of any process or method steps can be varied or re-sequenced without departing from the generality of the application. Any "open / closed" claims are intended to encompass any structure that performs the function described in the claim, and not only structural equivalents but also equivalent structures. Other substitutions, modifications, changes, and omissions can be made in the design, operating conditions, and arrangement of the exemplary embodiments without departing from the scope of the present application. Accordingly, the present application is not limited to particular embodiments, but extends to various modifications that nevertheless fall within the scope of the appended claims.

[0042] Furthermore, in order to provide a concise description of exemplary embodiments, all features of an actual implementation can not be described (i.e., those unrelated to the presently contemplated best mode of carrying out the application, or those unrelated to enabling the application).

[0043] It is to be understood that the development of the particular implementations described herein was motivated by the desire to solve real-world problems, and as such the claimed implementations can be susceptible to further implementation while still falling under the scope of the claims. No aspect of this description or claims should be interpreted as a limitation on the further implementations that can be provided while still falling within the scope of the claims. Thus, one skilled in the art could start with these implementations, and with knowledge of the teachings of the present disclosure, use the disclosure to best suit a particular application and use different

[0044] It should be noted that the above examples are only used to illustrate the technical solutions of the present application but not limit the present application. Although the present application is described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present application can be modified or equivalently replaced, without departing from the spirit and scope of the technical solutions of the present application, and all should be included in the scope of the claims of the present application.

Claims

1. A test fixture for simulating an internal compartment of a switch device, characterized by: Comprising a busbar structure (100); an insulating assembly (200) for fixedly mounting the busbar; a frame assembly (300) to achieve self-adjustment of the distance from the bottom plate (301) to the top plate (302) when lapping.

2. The test tool for the internal compartment of the analog switch device according to claim 1, characterized in that: the busbar structure (100) comprises a first busbar (101), a second busbar (102) arranged on one side of the first busbar (101), a first connecting hole (103) arranged at one end of the first busbar (101), a second connecting hole (104) arranged at one end of the second busbar (102), and a fastener (105) arranged between the first connecting hole (103) and the second connecting hole (104).

3. The test tool for the internal compartment of the analog switch device according to claim 2, characterized in that: the first busbar (101) adopts a full round edge of 60×12 specifications, and the second busbar (102) adopts a full round edge of 80×10 specifications.

4. The test tool for the internal compartment of the analog switch device according to claim 3, characterized in that: the first busbar (101) is provided with a first wiring hole (101a), the second busbar (102) is provided with a second wiring hole (102a), one end of the first busbar (101) is provided with a first mounting hole (101b), and the other end of the second busbar (102) is provided with a second mounting hole (102b).

5. The test fixture for the internal compartment of an analog switch device of claim 4, wherein: the insulating assembly (200) comprises an insulator (201), an insulator support (202) arranged below the insulator (201), and a circular mounting hole (203) arranged above the insulator support (202).

6. The test fixture for the internal compartment of an analog switch device of claim 5, wherein: the frame assembly (300) comprises a bottom plate (301) and a top plate (302) arranged above the bottom plate (301).

7. The test fixture for the internal compartment of an analog switch device of claim 6, wherein: the bottom plate (301) is provided with a scale line (301a) at the bottom, the scale line (301a) is provided with 10 lines, every 5 lines form a group, left and right symmetrical, the distance from the nearest scale line (301a) to the side plate is 260mm, the remaining 4 lines increase by 20mm, the left and right side walls of the bottom plate (301) are respectively provided with φ13 bottom plate connecting holes (301b) for connecting with the top plate (302).

8. The test fixture for the internal compartment of an analog switch device of claim 7, wherein: the left and right side walls of the top plate (302) are respectively provided with a group of top plate connecting holes (302a), each group of the top plate connecting holes (302a) is divided into 3 columns, each column has 9 13×17 waist round holes with an interval of 30mm.

9. The test fixture for simulating switchgear internal compartments of claim 8, wherein: the top plate (302) and the bottom plate (301) are both formed by folding three bends of aluminum-zinc plated sheet AZ150.

10. The test fixture for simulating the internal compartment of a switch device of claim 9, wherein: the fastener (105) can be selected in different specifications to verify the insulation performance under different insulation distances.

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