Vertical downward illumination type spectrograph light path structure and vertical downward illumination type spectrograph
By optimizing the optical path structure of the vertical down-illuminated spectrometer and increasing the X-ray irradiation energy intensity, the problem of insufficient accuracy in small sample analysis has been solved, enabling high-precision detection of tiny samples and applications in multiple fields.
Patent Information
- Application Number
- CN202520375506.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-05
- Publication Date
- 2026-02-03
- Estimated Expiration
- 2035-03-05
AI Technical Summary
Existing X-ray fluorescence spectrometers lack sufficient accuracy for small sample analysis and testing, and the downward-illuminated vertical optical path structure is not accurate enough for alloy analysis and environmental protection applications.
Design an optical path structure for a vertical down-illuminated spectrometer, including an optical path support, a light tube, a collimation component, and a detector. Optimize the optical path structure to improve the energy intensity of X-rays irradiating the sample, and combine it with a high-definition camera to observe minute samples.
It improves the accuracy of analysis and detection, and is especially suitable for testing small samples, ensuring the accuracy of alloy analysis and RoHS analysis of heavy metal hazardous elements, while having a simple structure and low cost.
Smart Images
Figure CN223870571U_ABST
Abstract
Description
Technical Field
[0001] This utility model belongs to the field of spectrometer technology, specifically relating to an optical path structure and a vertically downlit spectrometer. Background Technology
[0002] X-ray fluorescence spectrometry (XRF) is a high-precision analytical instrument that performs qualitative and quantitative analysis by detecting the energy intensity of the characteristic elemental spectra on the surface of a sample excited by primary X-rays. It features rapid and non-destructive testing and can be widely used in traditional manufacturing, medical devices, chemical smelting, mining, environmental and food safety fields.
[0003] Most X-ray fluorescence spectrometers on the market today either employ a traditional optical path structure that utilizes the reflection of X-rays from the sample being irradiated (tilted type) or a downward-illuminated vertical optical path structure designed for specific industry applications. These two optical path designs limit the application areas of XRF instruments.
[0004] XRF instruments with traditional optical path structures lack sufficient accuracy for analyzing and testing small samples; while XRF instruments with downward illumination vertical optical path structures perform well for testing small samples, their analytical accuracy is insufficient for alloy analysis or environmental applications such as RoHS compliance.
[0005] With the continuous development of social science and technology, the market demands for analytical instruments are also increasing. Not only are the analytical instruments required to be inexpensive, but they must also be able to perform a variety of analytical applications and achieve multi-functionality.
[0006] The information disclosed in this background section is intended only to enhance the understanding of the overall background of this utility model and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Utility Model Content
[0007] The purpose of this invention is to provide an optical path structure and a vertical down-illuminated spectrometer, which can effectively increase the energy intensity of the characteristic spectrum of the X-ray irradiation on the sample being tested, thereby improving the accuracy of analysis and detection, and is particularly suitable for testing small samples.
[0008] To achieve the above objectives, the technical solution provided by a specific embodiment of this utility model is as follows:
[0009] An optical path structure for a vertical down-illuminated spectrometer includes:
[0010] An optical path support, the optical path support having at least a base plate and a first side plate extending from the base plate to one side, the base plate having a first surface and a second surface disposed opposite to each other;
[0011] A light tube is disposed on the first surface of the base plate and is used to emit X-rays toward the second surface of the base plate;
[0012] A collimation assembly, disposed on the second surface of the base plate, is used to receive X-rays from the optical tube and adjust the size of the X-ray spot; and
[0013] A detector, mounted on the first side plate, is used to detect the fluorescence produced by the sample being irradiated by X-rays emitted from the light tube.
[0014] In one or more embodiments of this utility model, a first through hole is provided on the base plate of the optical path support, and the optical tube has a light-emitting surface, which is disposed corresponding to the first through hole.
[0015] In one or more embodiments of this utility model, a second through hole is provided on the first side plate, and the detector is fixed on the first side plate and partially passes through the second through hole.
[0016] In one or more embodiments of the present invention, the optical path support further has a second side plate, which is disposed opposite to the first side plate.
[0017] In one or more embodiments of the present invention, the optical path structure of the vertical down-illuminated spectrometer further includes a light source, which is disposed on the first side plate and the second side plate.
[0018] In one or more embodiments of the present invention, the light source is configured such that the light emitted is directed toward the center of the X-ray emitted by the light tube and is obliquely focused and irradiated in a direction away from the light tube.
[0019] In one or more embodiments of the present invention, the second side plate is provided with first mounting portions on both sides adjacent to the bottom plate extending toward the first side plate, and each first mounting portion is provided with a light source;
[0020] On the first side plate, on both sides adjacent to the bottom plate, a second mounting portion is provided extending toward the second side plate, and each of the second mounting portions is provided with a light source.
[0021] In one or more embodiments of this utility model, the optical path support is configured as a U-shaped or U-shaped structure, and the first side plate and the second side plate have the same extension angle and extension length relative to the base plate.
[0022] In one or more embodiments of the present invention, the collimation assembly includes: a collimator, a guide rail, and a driving structure. The collimator is disposed on the guide rail and connected to the driving structure, and moves along the guide rail under the action of the driving structure. A filter is disposed on the collimator.
[0023] In one or more embodiments of this utility model, the optical path structure of the vertical down-illuminated spectrometer further includes a heat dissipation component, which includes a heat sink and a cooling fan. The heat sink is in direct contact with the optical tube, and the cooling fan is in direct contact with the heat sink.
[0024] A vertical down-illuminated spectrometer is provided with the aforementioned optical path structure for a vertical down-illuminated spectrometer.
[0025] Compared with the prior art, the optical path structure and vertical down-illuminated spectrometer of this invention can effectively improve the energy intensity of the characteristic spectrum of the X-ray irradiation on the sample being tested, thereby improving the accuracy of analysis and detection. It is particularly suitable for testing tiny samples, with a minimum sample diameter as low as 1 mm.
[0026] The optical path structure and the vertical down-illuminated spectrometer of this invention not only solve the problem of the optical path being far from the sample due to the size of the camera in traditional optical path structures, but also facilitate the observation of small samples by combining a high-definition camera, effectively ensuring the analytical accuracy of testing small samples, while also ensuring the accuracy of sample analysis in traditional industries (including alloy analysis, electroplating analysis, RoHS and other heavy metal harmful element analysis, etc.).
[0027] The optical path structure and the vertical down-illuminated spectrometer of this invention are simple in structure and have low manufacturing cost, which can effectively enhance the product's market competitiveness. Attached Figure Description
[0028] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0029] Figure 1 This is a schematic diagram of the optical path structure of a vertical down-illuminated spectrometer in one embodiment of the present invention;
[0030] Figure 2 This is a schematic diagram of the optical path support for a vertical down-illuminated spectrometer optical path structure in one embodiment of the present invention;
[0031] Figure 3This is a schematic diagram of the optical tube and heat dissipation components of a vertical downlight spectrometer in one embodiment of the present invention.
[0032] Figure 4 This is a schematic diagram of the collimation component of the optical path structure of a vertical down-illuminated spectrometer in one embodiment of the present invention;
[0033] Figure 5 This is a schematic diagram of the detector in the optical path structure of a vertical down-illuminated spectrometer according to one embodiment of the present invention. Detailed Implementation
[0034] To enable those skilled in the art to better understand the technical solutions of this utility model, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, and not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of this utility model.
[0035] As mentioned in the background section, most X-ray fluorescence spectrometers on the market are either not accurate enough for the analysis and testing of small samples, or not accurate enough for applications such as alloy analysis or environmental protection industries such as RoHS.
[0036] Based on this, the present invention provides an optical path structure and a vertical down-illuminated spectrometer. Through the design of the optical path structure, the energy intensity of the characteristic spectrum of the X-ray irradiation on the sample under test can be effectively improved, thereby improving the accuracy of analysis and detection, and is particularly suitable for testing small samples.
[0037] like Figure 1 As shown, the optical path structure of a vertically down-illuminated spectrometer in one embodiment of this utility model includes an optical path support 10, an optical tube 20, a collimation assembly 30, and a detector 40. The optical tube 20, collimation assembly 30, and detector 40 are all mounted on the optical path support 10. The optical tube 20 and collimation assembly 30 are positioned on opposite sides of the optical path support 10, and the X-rays emitted by the optical tube 20 can pass perpendicularly through the collimation assembly 30.
[0038] like Figure 2 As shown, the optical path support 10 is configured as a U-shaped or U-shaped structure. The optical path support 10 has a base plate 11 and a first side plate 12 and a second side plate 13 extending in the same direction from opposite sides of the base plate 11. The first side plate 12 and the second side plate 13 have the same extension angle and extension length relative to the base plate 11. The base plate 11, the first side plate 12 and the second side plate 13 are integrally stamped.
[0039] The base plate 11 has a first surface and a second surface that are disposed opposite to each other. A first through hole 111 is provided in the central region of the base plate 11 for X-rays emitted by the light tube 20 to pass through.
[0040] A second through hole 121 is provided in the middle region of the first side plate 12. The second through hole 121 is used for some components of the detector 20 to pass through.
[0041] First mounting portions 131 are provided on the two sides of the second side plate 13 adjacent to the bottom plate 11, extending towards the first side plate 12. Second mounting portions 122 are provided on the two sides of the first side plate 12 adjacent to the bottom plate 11, extending towards the second side plate 13. Both the first mounting portions 131 and the second mounting portions 122 are used to mount some components.
[0042] like Figure 1 and Figure 3 As shown, the light tube 20 is disposed on the first surface of the base plate 10. The light tube 20 has a light emitting surface 21, which is disposed corresponding to the first through hole 111 of the base plate 10, so that the light tube 20 can emit X-rays toward the second surface of the base plate 10.
[0043] A heat dissipation assembly is also provided on the light tube 20. The heat dissipation assembly includes a heat sink 51 and a cooling fan 52. The heat sink 51 is located on the side of the light tube 20 away from the base plate 10 and is in direct contact with the light tube 20. The cooling fan 52 is located on the heat sink 51 and is in direct contact with the heat sink 51.
[0044] like Figure 1 and Figure 4 As shown, the collimation component 30 is disposed on the second surface of the base plate 10 for receiving X-rays from the light tube 20 and adjusting the size of the X-ray spot.
[0045] For example, the collimation assembly 30 includes a collimator 31, a guide rail 32, and a drive structure 33. The collimator 31 is disposed on the guide rail 32 and connected to the drive structure 33, and moves along the guide rail 31 under the action of the drive structure 33. The guide rail 32 and the drive structure 33 are fixed to the second surface of the base plate 10. The collimator 31 has a light-transmitting hole, and a filter (not shown) corresponding to the light-transmitting hole is disposed on the collimator 31. The position of the filter also corresponds to the first through hole 111 on the base plate 10.
[0046] The X-rays emitted by the light tube 20 pass vertically through the first through hole 111 in the middle of the base plate 11 of the optical path support 10, and then through the collimator 31, modulating the light spot to the size of the corresponding light aperture on the collimator 31.
[0047] like Figure 1 and Figure 5As shown, detector 40 is disposed on the first side plate 12 and is used to detect the fluorescence generated by the X-rays emitted by the light tube irradiating the sample under test. Specifically, detector 40 has a probe 41, which is fixed on the first side plate 12 and partially passes through the second through hole 121. Detector 40 can be a detector of the prior art, which will not be described in detail in this application.
[0048] like Figure 1 As shown, the optical path structure of the vertical down-illuminated spectrometer also includes a light source 60. The light source 60 is disposed on the first side plate 12 and the second side plate 13 for illumination.
[0049] In one embodiment, the light source 60 is fixed to the first mounting portion 131 of the second side plate 13 and the second mounting portion 122 of the first side plate 12. The light source 60 is configured such that the illumination light emitted by it is directed toward the center of the X-rays emitted by the light tube 20 and is obliquely focused in a direction away from the light tube 20, which can avoid direct interference caused by the camera on the collimator 31 (for ease of observation, in the optical path structure of the vertical down-illuminated spectrometer of this invention, the camera is mounted on the collimator 31).
[0050] like Figure 1 As shown, the installation method of the optical path structure of the vertical down-illuminated spectrometer in this embodiment is as follows: First, fix the light source 60 on the second mounting part 122 of the first side plate 12 and the first mounting part 131 of the second side plate 13 of the optical path support 10; then fix the collimation component 30 on the second surface of the base plate 11 of the optical path support 10; then fix the light tube 30 and the heat dissipation component (both of which have been installed) on the first surface of the base plate of the optical path support 10; finally, fix the detector 40 on the first side plate 12 of the optical path support 10.
[0051] An embodiment of this utility model also provides a vertically down-illuminated spectrometer employing the optical path structure of the above-described vertically down-illuminated spectrometer.
[0052] Compared with the prior art, the optical path structure and the vertical down-illuminated spectrometer of this invention can effectively improve the energy intensity of the characteristic spectrum of the X-ray irradiation on the sample being tested, thereby improving the accuracy of analysis and detection. It is particularly suitable for testing tiny samples, with a minimum sample diameter as low as 1 mm.
[0053] The optical path structure of the vertical down-illuminated spectrometer and the vertical down-illuminated spectrometer of this invention not only solve the problem that the optical path is far from the sample due to the size of the camera in the traditional optical path structure, but also combine a high-definition camera to facilitate the observation of small samples, effectively ensuring the analytical accuracy of testing small samples, while also ensuring the accuracy of sample analysis in traditional industries (including alloy analysis, electroplating analysis, RoHS and other heavy metal harmful element analysis, etc.).
[0054] The optical path structure and the vertical down-illuminated spectrometer of this invention are simple in structure and have low manufacturing cost, which can effectively enhance the product's market competitiveness.
[0055] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.
[0056] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
Claims
1. An optical path structure for a vertically down-illuminated spectrometer, characterized in that, include: An optical path support, the optical path support having at least a base plate and a first side plate extending from the base plate to one side, the base plate having a first surface and a second surface disposed opposite to each other; A light tube is disposed on the first surface of the base plate and is used to emit X-rays toward the second surface of the base plate; A collimation assembly, disposed on the second surface of the base plate, is used to receive X-rays from the optical tube and adjust the size of the X-ray spot; as well as A detector, mounted on the first side plate, is used to detect the fluorescence produced by the sample being irradiated by X-rays emitted from the light tube.
2. The optical path structure of the vertical down-illuminated spectrometer according to claim 1, characterized in that, The base plate of the optical path support has a first through hole, and the optical tube has a light-emitting surface, which is disposed corresponding to the first through hole; and / or, A second through hole is provided on the first side plate, and the detector is fixed on the first side plate and partially passes through the second through hole.
3. The optical path structure of the vertical down-illuminated spectrometer according to claim 1, characterized in that, The optical path support also has a second side plate, which is disposed opposite to the first side plate.
4. The optical path structure of the vertical down-illuminated spectrometer according to claim 3, characterized in that, It also includes a light source, which is disposed on the first side plate and the second side plate.
5. The optical path structure of the vertical down-illuminated spectrometer according to claim 4, characterized in that, The light source is configured such that the light it emits is directed toward the center of the X-rays emitted by the light tube and is tilted and focused away from the light tube.
6. The optical path structure of the vertical down-illuminated spectrometer according to claim 4, characterized in that, On the second side plate, first mounting portions are provided on both sides adjacent to the bottom plate and extending toward the first side plate, and each first mounting portion is provided with a light source; On the first side plate, on both sides adjacent to the bottom plate, a second mounting portion is provided extending toward the second side plate, and each of the second mounting portions is provided with a light source.
7. The optical path structure of the vertical down-illuminated spectrometer according to claim 3, characterized in that, The optical path support is configured as a U-shaped or U-shaped structure.
8. The optical path structure of the vertical down-illuminated spectrometer according to claim 1, characterized in that, The collimation assembly includes a collimator, a guide rail, and a driving structure. The collimator is disposed on the guide rail and connected to the driving structure, and moves along the guide rail under the action of the driving structure. A filter is disposed on the collimator.
9. The optical path structure of the vertical down-illuminated spectrometer according to claim 1, characterized in that, It also includes a heat dissipation component, which includes a heat sink and a cooling fan. The heat sink is in direct contact with the light tube, and the cooling fan is in direct contact with the heat sink.
10. A vertical down-illuminated spectrometer, characterized in that, The optical path structure of the vertical down-illuminated spectrometer as described in any one of claims 1-9 is provided.