Capacitor temperature coefficient test conversion device
By designing a capacitor temperature coefficient testing conversion device, batch testing of multiple capacitors under varying temperature conditions was realized, solving the problem that existing equipment could only test individually, improving testing efficiency and accuracy, and applicable to a temperature range of -70℃ to 300℃.
Patent Information
- Application Number
- CN202520343431.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-28
- Publication Date
- 2026-02-06
- Estimated Expiration
- 2035-02-28
AI Technical Summary
Existing capacitor temperature characteristic testing equipment can only test individually at room temperature, and cannot conduct batch testing under varying temperature conditions. Furthermore, the measurement range is limited, resulting in low testing efficiency and low accuracy.
A capacitor temperature coefficient testing conversion device was designed, including a station selection module, an internal conversion module, a test signal connection port, and a capacitor under test connection port. The capacitor under test is placed in a temperature test chamber through wires, and multiple capacitors are tested in batches using a conversion switch and a station selection module. Open circuit calibration and short circuit calibration are combined to eliminate the influence of distributed parameters.
It enables the acquisition of temperature characteristic data of batch capacitors in the range of -70℃ to 300℃, improves testing efficiency and accuracy, and can stably acquire temperature characteristic data of capacitors under varying temperature conditions.
Smart Images
Figure CN223883693U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of capacitor performance test, in particular to a capacitor temperature coefficient test conversion device. BACKGROUND
[0002] In the field of capacitor performance detection, the temperature characteristic of the capacitor is one of the important indicators of the performance of the capacitor. The temperature characteristic of the capacitor is an important parameter for evaluating the characteristics of the capacitor. The temperature characteristic of the capacitor refers to the change of the capacitance of the capacitor at different temperatures. Under ideal conditions, the capacitance of the capacitor should not be affected by temperature. However, in actual application, due to the thermal expansion and contraction of the internal materials of the capacitor, the change of the dielectric characteristics and the change of the environmental conditions, the capacitance will change with the increase or decrease of the temperature. Therefore, when using the capacitor, the temperature characteristic of the capacitor should be considered to ensure that the capacitor can still maintain stable capacitance characteristics under variable temperature conditions.
[0003] The test of the temperature characteristic of the capacitor mainly depends on professional measuring instruments to ensure the accuracy of the measurement data. During the measurement, the capacitor should be placed in a variable temperature device to simulate the constant temperature and variable temperature process, and the test value of the test capacitor should be recorded continuously during the process to calculate the change of the capacitance of the capacitor with respect to the temperature characteristic, so as to draw the C(capacitance)-T(temperature) characteristic curve of the capacitor.
[0004] In the field of capacitor performance detection, domestic and foreign test equipment includes capacitor testers (such as AH 2550A, Agilent E4981A, TH2838, etc.) and precision LCR meters (such as Agilent E4980A, TH2830, etc.). Whether it is a capacitor tester or a precision LCR meter, it can only test the capacitor one by one at room temperature. SUMMARY
[0005] In order to solve the problems of small measurement temperature range and only single capacitor test in the existing capacitor temperature characteristic test technology, the present application provides a capacitor temperature coefficient test conversion device, which can place the to-be-tested capacitor in a positive and negative temperature environment and accurately test the capacitance of the capacitor in batches.
[0006] In order to achieve the above-mentioned purpose, the present application provides the following technical solutions:
[0007] A capacitor temperature coefficient test conversion device, the conversion device comprises a station selection module, an internal conversion module, a test signal connection port and a to-be-tested capacitor connection port.
[0008] The to-be-tested capacitor connection port is used to connect a plurality of to-be-tested capacitors, and is connected with the corresponding conversion switch in the internal conversion module through a wire.
[0009] The test signal connection port is used for connecting an external test instrument, transmitting a test signal input by the external test instrument to the to-be-tested capacitor connection port through the internal conversion module, and outputting a to-be-tested value of the to-be-tested capacitor to the external test instrument;
[0010] The station selection module includes a plurality of station selection switches, each of which is used for controlling the on-off of each conversion switch, so that the external test instrument switches to test different to-be-tested capacitors;
[0011] The wire includes a high-temperature wire and a metal braid, and is used for placing the connected to-be-tested capacitor connection port in a temperature test box, and the temperature test box is used for adjusting the environmental temperature of the to-be-tested capacitor.
[0012] According to a specific embodiment, the test signal connection port in the above conversion device is a BNC four-terminal output, including a high-end test signal connection port and a low-end test signal connection port.
[0013] According to a specific embodiment, the to-be-tested capacitor connection port in the above conversion device further includes an open circuit module and a short circuit module, and the conversion switch is connected to the open circuit module to form an open circuit state, and is connected to the short circuit module to form a short circuit state.
[0014] According to a specific embodiment, the conversion device in the above conversion device further includes a test selection module, and the test selection module includes a test switch, an open circuit calibration switch and a short circuit calibration switch; the test switch is used for controlling the on-off of the station selection module, the open circuit calibration switch is used for controlling the on-off of the conversion switch connected to the open circuit module, and the short circuit calibration switch is used for controlling the on-off of the conversion switch connected to the short circuit module.
[0015] According to a specific embodiment, each conversion switch in the above conversion device is arranged in a metal box.
[0016] According to a specific embodiment, the capacity range of the to-be-tested capacitor in the above conversion device is greater than or equal to 1 pF.
[0017] According to a specific embodiment, the environmental temperature in the above conversion device is -70℃ to 300℃.
[0018] Compared with the prior art, the application has the following beneficial effects:
[0019] The capacitor temperature coefficient test conversion device provided by the application can realize batch testing of multiple capacitors to be tested, greatly improving the testing efficiency, by connecting a plurality of conversion switches with the capacitor connection ports to be tested and then switching control by the station selection module; meanwhile, the effective temperature characteristic data of the multiple capacitors to be tested can be obtained in batches by placing the capacitors to be tested in a temperature test box through the setting of the capacitor connection ports to be tested and the wires; meanwhile, the influence of the distributed parameters can be eliminated and the testing precision can be improved by open circuit calibration and short circuit calibration of the testing system through the open circuit calibration switch and the short circuit calibration switch. BRIEF DESCRIPTION OF DRAWINGS
[0020] Figure 1 A structural schematic diagram of a capacitor temperature coefficient test conversion device provided by an embodiment of the application is shown in the figure.
[0021] Figure 2 A structural schematic diagram of another capacitor temperature coefficient test conversion device provided by an embodiment of the application is shown in the figure.
[0022] Figure 3 A structural schematic diagram of a 4TP measurement capacitor test conversion device provided by an embodiment of the application is shown in the figure.
[0023] Figure 4 A structural schematic diagram of another 4TP measurement capacitor test conversion device provided by an embodiment of the application is shown in the figure. DETAILED DESCRIPTION
[0024] The application will be further described in detail below in combination with test examples and specific embodiments. However, it should not be understood that the scope of the above-mentioned subject matter of the application is limited to the following examples only, and any technology realized based on the content of the application belongs to the scope of the application.
[0025] The terms "first", "second", etc. in the description of the embodiments of the application and the claims and the drawings are only used for the purpose of distinguishing the description, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying sequence. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, inclusion of a series of steps or units. The method, system, product or device is not necessarily limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.
[0026] In addition, in the description of the embodiments of the application, "several", "multiple", "several" represent at least 2. It can be 2, 3, 4, 5, 6, 7, 8, 9, etc. in any case, and even more than 9 cases.
[0027] Furthermore, in the description of the technical solutions of the present application, unless otherwise explicitly specified / limited / limited, the terms "set", "install", "connect", "connect", "set", "lay", "arrange" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrally connected, such as welding, riveting, bolting, screwing and other commonly used connection means in the art. The connection can be mechanical connection, electrical connection or communication connection; it can be directly connected or indirectly connected through an intermediate medium, and it can be the communication between two elements.
[0028] Specifically, refer to Figure 1 which shows a structure schematic diagram of a capacitor temperature coefficient test conversion device provided by the embodiment of the present application, the conversion device comprises a station selection module, an internal conversion module, a test signal connection port and a to-be-tested capacitor connection port.
[0029] The to-be-tested capacitor connection port is used to connect a plurality of to-be-tested capacitors, and is connected with a corresponding conversion switch in the internal conversion module through a wire;
[0030] The test signal connection port is used to connect an external test instrument, and transmits the test signal input by the external test instrument to the to-be-tested capacitor connection port through the internal conversion module, and then outputs the to-be-tested value of the to-be-tested capacitor to the external test instrument;
[0031] The station selection module comprises a plurality of station selection switches, each station selection switch is used to control the on-off of each conversion switch, so that the external test instrument switches to test different to-be-tested capacitors;
[0032] The wire comprises a high-temperature wire and a metal braid, which is used to place the connected to-be-tested capacitor connection port in a temperature test box, and the temperature test box is used to adjust the environmental temperature of the to-be-tested capacitor.
[0033] Specifically, the capacitor temperature coefficient test conversion device provided by the present application can realize batch testing of a plurality of to-be-tested capacitors by connecting a plurality of conversion switches with the to-be-tested capacitor connection port and then switching and controlling by the station selection module, which greatly improves the test efficiency. At the same time, by setting the capacitor placement device and the wire, the to-be-tested capacitor can be placed in the temperature test box, and the effective temperature characteristic data of a plurality of to-be-tested capacitors can be obtained.
[0034] The capacitor test conversion device provided by the present application will be further described in combination with specific embodiments.
[0035] With a common chip capacitor as an example, the chip capacitor is placed in the to-be-tested capacitor connection port, and two poles of each chip capacitor are connected to internal conversion modules in the capacitor test conversion device through wires. Among them, the two poles of the chip capacitor are connected to the conversion start of the internal conversion module through wires respectively. Among them, the conversion switch is arranged corresponding to the test signal connection port. For example, in the embodiment, the test signal connection port is a BNC four-terminal output, including a high-end test signal connection port and a low-end test signal connection port, and the conversion switch is arranged with two respectively, corresponding to the high-end test signal connection port and the low-end test signal connection port respectively. Correspondingly, one pole of the chip capacitor is connected to the high-end test signal connection port through one conversion switch, and the other pole is connected to the low-end test signal connection port through one conversion switch. Each wire is connected correspondingly. It can be understood that if N chip capacitors need to be tested, 2N wires are needed for connection, and the number of the conversion switch is also 2N.
[0036] Correspondingly, each conversion switch is controlled by a station selection switch, and the number is also the number of the chip capacitor. It can be understood that if the to-be-tested capacitor connection port and the internal conversion module are sequentially connected, and the station selection switch in the station selection module is sequentially connected with the conversion switch in the internal conversion module, the sequence of the station selection switch is the sequence of the chip capacitor. That is, when the to-be-tested value of the i-th chip capacitor needs to be tested, only the i-th station selection switch needs to be controlled to be turned on.
[0037] In the embodiment, the station selection module is a station conversion switch with a rotation angle of 360 degrees; the return zero point time is reduced, and the test efficiency is improved.
[0038] Further, in order to eliminate the influence of the distributed parameters between the to-be-tested capacitor connection port and the external test instrument, and realize accurate test, the application embodiment further provides a capacitor temperature coefficient test conversion device, wherein the to-be-tested capacitor connection port further includes an open circuit module and a short circuit module, the conversion switch connects the open circuit module to be in an open circuit state, and the conversion switch connects the short circuit module to be in a short circuit state. The connection mode of the open circuit module and the short circuit module with the chip capacitor is the same, which connects the high-end test signal connection port, the low-end test signal connection port and the internal conversion module. Further, the application embodiment further provides a test selection module, which includes a test switch, an open circuit calibration switch and a short circuit calibration switch, as shown in Figure 2The test switch is used to control the on-off of the station selection module. Only when the test switch is turned on, the station selection switch can be turned on to control the switching of the internal conversion module. Correspondingly, the open circuit calibration switch is used to control the on-off of the switching switch connected to the open circuit module, and the short circuit calibration switch is used to control the on-off of the switching switch connected to the short circuit module.
[0039] The above arrangement can effectively link the capacitor test conversion device, and can perform "open circuit calibration" and "short circuit calibration" on the entire test system.
[0040] It should be noted that the capacitor test conversion device provided by the present application is used to detect the temperature coefficient of the capacitance or the insulation resistance value of the capacitor under specified temperature conditions. It is an intermediate conversion device and does not have a test function itself. When used, it needs to be matched with appropriate external test instruments and temperature test boxes. The external test instruments include a capacitor tester and an insulation resistance tester, as well as other instruments capable of testing the capacitance of the capacitor. Specifically, the temperature test box provides an environment temperature of -70℃ to 300℃. In addition, in order for the present application to be implemented, the capacitor test conversion device provided by the present application further includes a device power supply port for providing working voltage to the device, and the device power supply port is used to connect an external power supply to provide working voltage for each module of the device. This is a conventional arrangement and will not be described here.
[0041] Specifically, for the placed chip capacitor to be tested, the entire test capacitor connection port needs to be placed in the temperature test box when testing, and then connected to the internal conversion module through a wire. It can be understood that only a part of the wire is in the temperature test box, and the other part is connected to the internal conversion module outside the temperature test box. The wire uses high-temperature wire, mainly for signal transmission in positive and negative temperature environments. In addition, in order to shield and protect, the wire also includes a metal braid, which is mainly used to shield the two ends of the wire connection to reduce test interference. In one possible implementation, the wire can be connected to the internal conversion module by selecting an aviation plug for further shielding connection.
[0042] It can be understood that in order to meet the measurement in positive and negative temperature environments, the test capacitor connection port can be made of metal materials with good temperature conductivity, such as PEI and PPS materials, as the main body of the test capacitor connection port.
[0043] The external testing instrument outputs a test signal to the capacitor test conversion device, specifically, the test signal includes outputting a high test current and a high test resistance through the high-end test signal connection port, and outputting a low test current and a low test resistance through the low-end test signal connection port. It can be understood that, based on the interface principle of the high-end test signal connection port and the low-end test signal connection port in the capacitor test conversion device provided in the present application, a 4TP measurement method is adopted, which belongs to the most commonly used measurement technology of an automatic balancing bridge capacitance meter, mainly including connecting the two poles of the capacitor to be tested with different high and low test signals, so as to obtain the capacitance value. It can be understood that the conversion switch in the internal conversion module corresponds to the conduction connection of the high-end test signal connection port, that is, if the high-end test signal connection port has only one test signal, the conversion switch is provided with only one switch; if the high-end test signal connection port simultaneously outputs two signals, the conversion switch is correspondingly provided with two switches in parallel, and so on. Further, the low-end test signal connection port and the conversion switch are provided in the same way as the high-end test signal connection port and the conversion switch, which will not be described here.
[0044] Meanwhile, when the high-end test signal connection port and the low-end test signal connection port are connected with the external testing instrument, a shielded wire containing a metal braid is also needed to be used to eliminate the influence of parameter distribution. Further, in a possible implementation manner, each conversion switch is arranged in a metal box, which is separated and installed to play a shielding role.
[0045] Further, please refer to Figure 3 which shows a structure schematic diagram of the 4TP measurement capacitor test conversion device provided in the embodiment of the present application. It should be noted that the capacitor test conversion device provided in the present application can perform batch capacitance test and insulation resistance test on capacitors with a capacitance range of 1 pF or more.
[0046] The test selection module is used to adjust the capacitor test mode, including an open circuit calibration mode, a short circuit calibration mode and a normal test mode; through the test selection module, the test device can be calibrated in "open circuit" and "short circuit", which can effectively eliminate the influence of the distributed parameters between the fixture and the testing instrument;
[0047] The work station selection module is used to select a specific capacitor to be tested during capacitor test, and the work station selection module is a work station conversion switch with a rotation angle of 360 degrees; the return to zero point time is reduced, and the test efficiency is improved.
[0048] The internal conversion module is used for conversion of the circuit in the capacitor test conversion device, so as to cooperate with the adjustment functions of the test selection module and the work station selection module.
[0049] The test signal connection port is used for connecting an LCR capacitance tester, and is a four-terminal BNC output.
[0050] The capacitor to be tested connection port is used for connecting a capacitor to be tested.
[0051] The capacitor test conversion device provided by the embodiment of the application is provided with a test selection module, and can perform "open circuit calibration" and "short circuit calibration" during testing, so that the influence of the distributed parameters of the testing instrument can be effectively eliminated, and the testing precision is significantly improved. The capacitor test conversion device has the advantages of simple structure, high testing precision and wide application range, and is suitable for large-scale popularization and application.
[0052] Further, based on the above technical solution, the test selection module includes simple settings and input and output functions. In another possible implementation manner, the test selection module can be matched with an input device and a processor, the input device is used to acquire an execution instruction, and the processor is used to execute a corresponding instruction, including open circuit calibration, short circuit calibration and testing. Further, the test is used to control the station selection switch, and the selection of each capacitor to be tested can also be realized by the central processor. Specifically, refer to Figure 4 which shows a structure schematic diagram of another 4TP measurement capacitor test conversion device provided by the embodiment of the application. Exemplarily, the processor can be a central processing unit (CPU) or a microcontroller (MCU).
[0053] The processor can further include a hardware chip. The hardware chip can be an application-specific integrated circuit (ASIC), a programmable logic device (PLD) or a combination thereof. The PLD can be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL) or any combination thereof.
[0054] The processor can further include a memory for storing the execution instructions, programs of the central processor, etc. The memory can include a volatile memory such as a random-access memory (RAM), and can also include a non-volatile memory such as a flash memory, a hard disk drive (HDD), or a solid-state drive (SSD), and can also include a combination of the above-mentioned memories.
[0055] The processor can be an integrated circuit chip with a processing capability of signals. The processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.
[0056] It should be understood that the apparatus disclosed in the embodiments of the present application can be implemented in other ways. For example, the division of the modules is only a logical function division, and in actual implementation, another division manner can be used, for example, a plurality of modules or components can be combined or integrated into another apparatus, or some features can be ignored or not executed. In addition, the communication connection between the units can be through some interfaces, servers or indirect coupling or communication connection, and can be electrical or other forms.
[0057] Any embodiment or design scheme described in the embodiments of the present application as "exemplary" or "for example" should not be interpreted as more preferred or more advantageous than other embodiments or design schemes. Rather, the words "exemplary" or "for example" are intended to present the relevant concept in a specific manner for ease of understanding.
[0058] The above only describes the preferred embodiments of the present application and is not intended to limit the present application. Any modification, equivalent replacement and improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims
1. A capacitor temperature coefficient test conversion device, characterized by, The conversion device comprises a station selection module, an internal conversion module, a test signal connection port and a capacitor under test connection port. The capacitor under test connection port is used to connect a plurality of capacitors under test and is connected to the corresponding conversion switch in the internal conversion module through a wire. The test signal connection port is used to connect an external test instrument and transmit the test signal input by the external test instrument to the capacitor under test connection port through the internal conversion module, and then output the test value of the capacitor under test to the external test instrument. The station selection module comprises a plurality of station selection switches, each of which is used to control the on-off of each conversion switch, so that the external test instrument switches to test different capacitors under test.
2. The capacitance temperature coefficient test conversion device according to claim 1, wherein The wire comprises a high-temperature wire and a metal braid, which is used to place the connected capacitor under test connection port in a temperature test box, and the temperature test box is used to adjust the environmental temperature of the capacitor under test.
3. The capacitance temperature coefficient test conversion device according to claim 1, wherein The test signal connection port is a BNC four-terminal output, comprising a high-end test signal connection port and a low-end test signal connection port.
4. The capacitance temperature coefficient test conversion device according to claim 3, wherein The capacitor under test connection port further comprises an open circuit module and a short circuit module, and the conversion switch connected to the open circuit module is in an open circuit state, and the conversion switch connected to the short circuit module is in a short circuit state.
5. The capacitance temperature coefficient test conversion device according to claim 1, wherein The conversion device further comprises a test selection module, which comprises a test switch, an open circuit calibration switch and a short circuit calibration switch.
6. The capacitance temperature coefficient test conversion device according to claim 1, wherein Each conversion switch is arranged in a metal box.
7. The capacitance temperature coefficient test conversion device according to claim 1, wherein The capacity of the capacitor under test is greater than or equal to 1 pF. The environmental temperature is -70℃ to 300℃.