Connecting device, semiconductor testing machine case, testing host and semiconductor testing machine

Abstract

The utility model relates to the technical field of semiconductor testing machines, in particular to a connecting device, a semiconductor testing machine case, a testing host and a semiconductor testing machine. The connecting device can comprise a first connecting structure and a second connecting structure; the first connecting structure comprises a fixing plate, a first containing channel and a second containing channel are formed in the fixing plate, and a bearing assembly is formed between the first containing channel and the second containing channel. The second connecting structure comprises a supporting assembly and a limiting assembly which are connected, and the supporting assembly comprises a first supporting part and a second supporting part; when the first supporting part is located in the first containing channel and the second supporting part is located in the second containing channel, the limiting assembly is connected with the bearing assembly. In the application process, the first connecting structure can be used for being connected with the to-be-connected surface of one object, the second connecting structure can be used for being connected with the to-be-connected surface of the other object, and therefore the connecting stability of the two objects can be improved through the first connecting structure and the second connecting structure.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of semiconductor test machines, and in particular to a connecting device, a semiconductor test machine case, a test host and a semiconductor test machine. BACKGROUND

[0002] A semiconductor test machine is a device for measuring and verifying the performance of semiconductor devices, such as measuring electrical parameters such as current, voltage, frequency response, verifying whether a semiconductor chip can correctly perform a predetermined function according to design specifications, evaluating the performance stability of a semiconductor chip under long-term work or extreme environmental conditions, and the like, to ensure the quality and reliability of the final product in the manufacturing process of semiconductor devices.

[0003] A test host in a box structure is usually required to be installed in a semiconductor test machine. During the installation process, the test host needs to be manually lifted so that the mounting holes on the test host and the mounting holes on the semiconductor test machine case are aligned, and then the test host can be fixed by bolts. This installation method is relatively labor-intensive, and since the host has a certain weight, the process of lifting the host and aligning the mounting holes is relatively difficult, resulting in a relatively large installation difficulty. SUMMARY

[0004] To solve the problem of difficult installation of the test host, the embodiments of the present application provide a connecting device, a semiconductor test machine case, a test host and a semiconductor test machine.

[0005] In a first aspect, the embodiments of the present application provide a connecting device, comprising a first connecting structure and a second connecting structure; the first connecting structure comprises a fixed plate, the fixed plate is provided with a first accommodating channel and a second accommodating channel, and a load-bearing assembly is formed between the first accommodating channel and the second accommodating channel; the second connecting structure comprises a support assembly and a limiting assembly connected thereto, the support assembly comprises a first support part and a second support part; when the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the limiting assembly is connected with the load-bearing assembly.

[0006] In some optional implementation ways of the first aspect, the width of the first accommodating channel is greater than the width of the first support part; and the width of the second accommodating channel is greater than the width of the second support part.

[0007] In some optional implementation ways of the first aspect, the limiting assembly comprises a first limiting assembly and a second limiting assembly, an end of the first limiting assembly is connected with the first support part, an end of the second limiting assembly is connected with the second support part, and the first limiting assembly and the second limiting assembly are arranged in a spaced manner to form a sliding groove.

[0008] In some optional implementation forms of the first aspect, the first limiting component includes a first limiting part and a second limiting part, and the second limiting component includes a third limiting part and a fourth limiting part; the load-bearing component includes an end load-bearing part and a middle load-bearing part; when the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the first limiting part and the third limiting part are both connected with the end load-bearing part, and the second limiting part and the fourth limiting part are both connected with the middle load-bearing part.

[0009] In some optional implementation forms of the first aspect, the load-bearing component further includes a first positioning part and a second positioning part, and the end load-bearing part, the first positioning part, the middle load-bearing part and the second positioning part are sequentially connected; a width of a part of the first accommodating channel connected with the first positioning part is greater than a width of the first limiting part, and a width of a part of the second accommodating channel connected with the first positioning part is greater than a width of the third limiting part; a width of a part of the first accommodating channel connected with the second positioning part is greater than a width of the second limiting part, and a width of a part of the second accommodating channel connected with the second positioning part is greater than a width of the fourth limiting part.

[0010] In some optional implementation forms of the first aspect, the first limiting component includes a first limiting plate and a second limiting plate, and the first limiting plate and the second limiting plate are arranged in parallel and at intervals to form a through limiting slot; when the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the load-bearing component is located in the limiting slot.

[0011] In some optional implementation forms of the first aspect, a side of the fixed plate away from the first accommodating channel is a first fixed part, a side of the fixed plate away from the second accommodating channel is a second fixed part, and a region corresponding to the second positioning part on the first fixed part and / or the second fixed part is provided with a positioning hole.

[0012] In the second aspect, the embodiments of the present application provide a semiconductor test machine case, which is a hollow cavity structure, and an inner cavity upper surface of the semiconductor test machine case is provided with the first connecting structure as described above.

[0013] In the third aspect, the embodiments of the present application provide a test host, which is a box structure, and an outer wall upper surface of the test host is provided with the second connecting structure as described above.

[0014] In the fourth aspect, the embodiments of the present application provide a semiconductor test machine, which includes a semiconductor test machine case and a test host, an inner cavity upper surface of the semiconductor test machine case is provided with the first connecting structure as described above, and an outer wall upper surface of the test host is provided with the second connecting structure as described above.

[0015] It can be understood that the specific implementation forms and beneficial effects of the second aspect to the fourth aspect described above can be referred to the related description of the first aspect, and will not be described here again.​ BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 According to some embodiments of the present application, a structural diagram of a first connecting device is shown;

[0017] Figure 2 According to some embodiments of the present application, a connecting diagram of a first connecting structure and a second connecting structure is shown;

[0018] Figure 3 According to some embodiments of the present application, a width diagram of a first accommodating channel is shown;

[0019] Figure 4 According to some embodiments of the present application, a width diagram of a first supporting part is shown;

[0020] Figure 5 According to some embodiments of the present application, a structural diagram of a limiting assembly is shown;

[0021] Figure 6 According to some embodiments of the present application, a diagram of a first limiting assembly is shown;

[0022] Figure 7 According to some embodiments of the present application, a diagram of a bearing assembly is shown;

[0023] Figure 8 According to some embodiments of the present application, a connecting diagram of a second connecting structure and a first connecting structure is shown;

[0024] Figure 9 According to some embodiments of the present application, a width diagram of a partial channel connected with a first positioning part is shown;

[0025] Figure 10 According to some embodiments of the present application, a connecting flow diagram of a first connecting structure and a second connecting structure is shown;

[0026] Figure 11 According to some embodiments of the present application, a structural diagram of a second connecting device is shown;

[0027] Figure 12 According to some embodiments of the present application, a structural diagram of a third connecting device is shown;

[0028] Figure 13 According to some embodiments of the present application, a structural diagram of a fourth connecting device is shown;

[0029] Figure 14 According to some embodiments of the present application, a diagram of a first semiconductor test machine case is shown;

[0030] Figure 15 According to some embodiments of this application, a schematic diagram of a second type of semiconductor testing machine chassis is shown.

[0031] Figure 16 A schematic diagram of a third type of semiconductor testing machine chassis is shown according to some embodiments of this application.

[0032] Figure 17 A schematic diagram of a test host is shown according to some embodiments of this application;

[0033] Figure 18 According to some embodiments of this application, a schematic diagram of a semiconductor testing machine is shown. Detailed Implementation

[0034] The illustrative embodiments of this application include, but are not limited to, a connection device, a semiconductor tester chassis, a test host, and a semiconductor tester.

[0035] It is understood that the connection device mentioned in the embodiments of this application can be used to connect one object to another. For example, fixing the test host inside the semiconductor test machine chassis, fixing power strips, cameras, etc. to a wall, fixing flower pots, cameras, etc. to a flat bracket, etc. The embodiments of this application do not limit the specific application scenario of the connection device. The connection device mentioned in the embodiments of this application will be described below with reference to a specific scenario of fixing the test host inside the semiconductor test machine chassis.

[0036] It is understandable that common types of semiconductor test equipment include digital test equipment, analog test equipment, mixed-signal test equipment, and memory test equipment. Among them, digital test equipment can be used to test digital circuits, analog test equipment can be used to test the characteristics of analog circuits, mixed-signal test equipment can be used to test mixed-signal integrated circuits (ICs), and memory test equipment can be used to test memory chips such as DRAM and NAND Flash.

[0037] To address the difficulty in installing test hosts, embodiments of this application provide a connection device. The connection device mentioned in these embodiments is described below.

[0038] like Figure 1 The diagram shows a schematic representation of the first type of connecting device.

[0039] Specifically, such as Figure 1 As shown, the connecting device 000 may include a first connecting structure 100 and a second connecting structure 200.

[0040] The first connecting structure 100 may include a fixing plate 110, on which a first receiving channel 120 and a second receiving channel 130 may be provided, and a load-bearing component 140 is formed between the first receiving channel 120 and the second receiving channel 130.

[0041] The second connection structure 200 may include a connecting support component 210 and a limiting component 220. The support component 210 may include a first support portion 211 and a second support portion 212.

[0042] Furthermore, the first connecting structure 100 may also include a first mounting portion 150 and a second mounting portion 160. The first mounting portion 150 and the second mounting portion 160 can be connected to two opposite sides of the fixing plate 110. When the first connecting structure 100 is placed horizontally, the plane of the fixing plate 110 is lower than the plane of the first mounting plate 150, and the planes of the first mounting portion 150 and the second mounting portion 160 can be parallel; that is, the fixing plate 110 in the first connecting structure 100 has a certain depth relative to the mounting portion.

[0043] The second connecting structure 200 may further include a third mounting portion 230 and a fourth mounting portion 240. The third mounting portion is connected to the first support portion 211, and the fourth mounting portion 240 is connected to the second support portion 212. Furthermore, when the second connecting structure 200 is placed horizontally, the plane containing the third mounting portion 230 is lower than the plane containing the limiting component 220, and the plane containing the fourth mounting portion 240 is also lower than the plane containing the limiting component 220; that is, the limiting component 220 in the second connecting structure 200 has a certain height relative to the mounting portion.

[0044] like Figure 2 As shown, in the first support portion 211 ( Figure 2 (Not shown in the diagram) is located within the first receiving channel 120, and the second support portion 212 ( Figure 2 When the (not shown in the diagram) is located in the second receiving channel, the limiting component 220 is connected to the load-bearing component 140.

[0045] It is understandable that, in order to ensure that the first receiving channel 120 can accommodate the first support portion 211, the width of the first receiving channel 120 can be greater than the width of the first support portion 211. The width of the first receiving channel 120 can refer to, for example... Figure 3 The width w1 of the first accommodating channel 120 shown. In some alternative implementations, the shape of the first support portion 211 can be a cuboid, thus the width of the first support portion 211 can refer to the radial width of the cuboid, for example... Figure 4The width w2 of the radial direction a is shown. In other optional implementations, the shape of the first support part 211 can be a curved surface, and thus the width of the first support part 211 can refer to the thickness of the curved surface.

[0046] Similarly, in order to ensure that the second accommodation channel 130 can accommodate the second support part 212, the width of the second accommodation channel 130 can be greater than the width of the second support part 212. In some optional implementations, the shape of the second support part 212 can be a cuboid, and thus the width of the second support part 212 can refer to the width of the radial direction of the cuboid. In other optional implementations, the shape of the second support part 212 can be a curved surface, and thus the width of the second support part 212 can refer to the thickness of the curved surface. Specifically, the width of the second accommodation channel 130 can refer to Figure 3 , and the width of the second support part 212 can refer to Figure 4 To avoid repetition, details are not described here.

[0047] In order to ensure that the phase assembly 220 can be connected with the load-bearing assembly 140, the corresponding depth of the fixed plate 110 is greater than the corresponding height of the limiting assembly 220.

[0048] It can be understood that, as Figure 1 shown, the first accommodation channel 120 and the second accommodation channel 130 are symmetrically provided on the fixed plate 110 in the same shape, which is one of the opening modes of the first accommodation channel 120 and the second accommodation channel 130 listed in the embodiments of the present application. In actual application process, the first accommodation channel 120 and the second accommodation channel 130 can also adopt other opening modes, for example, the first accommodation channel 120 and the second accommodation channel 130 are symmetrically provided on the fixed plate 110 in different shapes, the first accommodation channel 120 and the second accommodation channel 130 are asymmetrically provided on the fixed plate 110 in the same shape, and the embodiments of the present application are not limited specifically.

[0049] In some optional implementations, as Figure 5 shown, the limiting assembly 220 can include a first limiting assembly 221 and a second limiting assembly 222. The end of the first limiting assembly 221 can be connected with the first support part 211. The end of the second limiting assembly 222 can be connected with the second support part 212. And the first limiting assembly 221 and the second limiting assembly 222 are spaced apart to form a sliding groove 250.

[0050] And, as Figure 6 shown, the first limiting assembly 221 (not shown in Figure 6 ) can include a first limiting part 2211, a first connecting part 2212, and a second limiting part 2213. The second limiting assembly 222 (not shown in Figure 6The third limiting portion 2221, the second connecting portion 2222, and the fourth limiting portion 2223 can be included in the third support assembly 220 (not shown).

[0051] As shown in FIG. 1, the load-bearing assembly 140 can include an end load-bearing portion 1401, a first positioning portion 1402, a middle load-bearing portion 1403, and a second positioning portion 1404 connected in sequence. Figure 7

[0052] As shown in FIG. 1, the first support assembly 210 (not shown in FIG. 1) can be located in the first accommodating channel 120 (not shown in FIG. 1), and the second support assembly 220 (not shown in FIG. 1) can be located in the second accommodating channel 130 (not shown in FIG. 1). Figure 8 Figure 8 Figure 8 Figure 8 Figure 8 As shown in FIG. 1, when the first support assembly 210 (not shown in FIG. 1) is located in the first accommodating channel 120 (not shown in FIG. 1), and the second support assembly 220 (not shown in FIG. 1) is located in the second accommodating channel 130 (not shown in FIG. 1), the first limiting portion 2211 and the third limiting portion 2221 can be connected with the end load-bearing portion 1401, and the second limiting portion 2212 and the fourth limiting portion 2222 can be connected with the middle load-bearing portion 1403.

[0053] In order to ensure that the first limiting portion 2211 and the third limiting portion 2221 can be connected with the end load-bearing portion 1401, and the second limiting portion 2212 and the fourth limiting portion 2222 can be connected with the middle load-bearing portion 1403,

[0054] The width of the portion of the first accommodating channel 120 connected with the first positioning portion 1402 can be greater than the width of the first limiting portion 2211. The width of the portion of the second accommodating channel 130 connected with the first positioning portion 1402 can be greater than the width of the third limiting portion 2221. The width of the portion of the first accommodating channel 120 connected with the first positioning portion 1402 can be the width w3 shown in FIG. 1, and the width of the portion of the second accommodating channel 130 connected with the first positioning portion 1402 can be the width w4 shown in FIG. 1. Figure 9

[0055] The width of the portion of the first accommodating channel 120 connected with the second positioning portion 1404 can be greater than the width of the second limiting portion 2213. The width of the portion of the second accommodating channel 130 connected with the second positioning portion 1404 can be greater than the width of the fourth limiting portion 2223. The width of the portion of the first accommodating channel 120 connected with the second positioning portion 1404 can be the width w5 shown in FIG. 1, and the width of the portion of the second accommodating channel 130 connected with the second positioning portion 1404 can be the width w6 shown in FIG. 1. Figure 9

[0056] ​​​​​​​And, the length of the first limiting component 211 is greater than the first total length L1 and less than the second total length L2, and similarly, the length of the second limiting component 212 is greater than the first total length L1 and less than the second total length L2. Wherein, the first total length L1 can include the length of the end bearing part 1401, the first positioning part 1402 and the middle bearing part 1403, and the second total length L2 can include the length of the end bearing part 1401, the first positioning part 1402, the middle bearing part 1403 and the second positioning part 1404.

[0057] It can be understood that the first limiting part 2211, the second limiting part 2213, the third limiting part 2221 and the fourth limiting part 2223 can be the same shape, for example Figure 6 The right-angled trapezoid shown is one way listed in the embodiments of the present application. In actual application, at least two of the first limiting part 2211, the second limiting part 2213, the third limiting part 2221 and the fourth limiting part 2223 can have different shapes, for example, the first limiting part 2211 and the third limiting part 2221 are right-angled trapezoids, and the second limiting part 2213 and the fourth limiting part 2223 are rectangles, and the embodiments of the present application are not limited specifically.

[0058] It can be understood that in some optional implementations, the first limiting part 2211 and the third limiting part 2221 can be limiting plates, and the second limiting part 2212 and the fourth limiting part 2222 can also be limiting plates.

[0059] The following will be described in combination with Figures 1 to 9 The process of connecting two objects using the first connecting structure 100 and the second connecting structure 200 will be introduced.

[0060] As Figure 10 shown, the first mounting part 150 and the second mounting part 160 can be connected with the to-be-connected surface of one object to be connected, and the third mounting part 230 and the fourth mounting part 240 are both connected with the to-be-connected surface of another object to be connected. It can be understood that in order to ensure the stability of the connection of the two objects, when the third mounting part 230 and the fourth mounting part 240 are connected with the to-be-connected surface of another object to be connected, the width w7 between the first limiting part 2211 and the third limiting part 2221 needs to be set to be less than the width w8 of the end bearing part 1401 and greater than the width w9 of the first positioning part 1402. And the width w10 between the second limiting part 2212 and the fourth limiting part 2222 needs to be set to be less than the width w11 of the middle bearing part 1403 and greater than the width w12 of the second positioning part 1404.

[0061] Thus, when connecting the two objects, the first limiting part 2211 and the third limiting part 2221 can be placed in the first positioning part 1402, and the second limiting part 2212 and the fourth limiting part 2222 can be placed in the second positioning part 1404, so that the load-bearing assembly 140 is located in the sliding groove 250. Then, the second connecting structure 200 can be pushed in the direction of the first mounting part 150, so that the first limiting part 2211 and the third limiting part 2221 are connected with the end load-bearing part 1401, and the second limiting part 2212 and the fourth limiting part 2222 are connected with the middle load-bearing part 1403. Thus, the stable connection of the two objects can be achieved.

[0062] As shown in Figure 11 , a structural schematic diagram of a second connecting device is shown. Different from the connecting device shown in Figure 1 , at least one positioning hole is formed on the fixed plate 110. The specific structure of each component in the connecting device can be referred to Figures 1 to 9 . To avoid repetition, details are not repeated here.

[0063] The structure of the connecting device different from the connecting device shown in Figure 1 will be described below. As shown in Figure 11 , the side of the fixed plate 110 away from the first accommodating channel 120 is the first fixed part 170, and the side of the fixed plate 110 away from the second accommodating channel 120 is the second fixed part 180. Among them, a plurality of positioning holes 190 are formed on the second fixed part 180 corresponding to the second positioning part 1404.

[0064] Thus, after the first limiting part 2211 and the third limiting part 2221 are connected with the end load-bearing part 1401, and the second limiting part 2212 and the fourth limiting part 2222 are connected with the middle load-bearing part 1403, the second connecting structure 200 can be further limited by using bolts in the positioning hole 190. Thus, the connection stability of the two objects can be further increased.

[0065] It can be understood that the positioning hole can not only be formed on the region of the second fixed part 180 corresponding to the second positioning part 1404, but also can be formed on the region of the first fixed part 170 corresponding to the second positioning part 1404, and can be formed on the region of the first fixed part 170 corresponding to the second positioning part 1404 and the region of the first fixed part 180 corresponding to the second positioning part 1404. The present application is not specifically limited.

[0066] As shown in Figure 12 , a structural schematic diagram of a third connecting device is shown. Different from the connecting device shown in Figure 1 and Figure 11The connecting device shown differs from the previous one in that the first limiting part 2211 and the third limiting part 2221 are not limiting plates, nor are the second limiting part 2212 and the fourth limiting part 2222. The specific structure of each component in this connecting device can be found in [reference needed]. Figures 1 to 9 To avoid repetition, I will not go into details here.

[0067] The following describes the connection device and Figure 1 and Figure 11 The different structures of the connecting devices shown will be explained. Continuing as... Figure 12 As shown, the first limiting portion 2211 may include a first limiting plate 22111 and a second limiting plate 22112, which are arranged in parallel and spaced apart to form a through limiting groove 22113. The second limiting portion 2221 may include a third limiting plate and a fourth limiting plate, which are also arranged in parallel and spaced apart to form a through limiting groove.

[0068] Thus, when connecting these two objects, the first limiting part 2211 and the third limiting part 2221 can be placed inside the first positioning part 1402, and the second limiting part 2212 and the fourth limiting part 222 can be placed inside the second positioning part 1404, so that the load-bearing component 140 is located inside the sliding groove 250. Next, the load-bearing component 140 can be aligned with the limiting groove 22113, and both the second limiting part 2212 and the fourth limiting part 2222 are connected to the central load-bearing part 1403. This further enables a stable connection between the two objects.

[0069] like Figure 13 The diagram shows a schematic representation of the fourth type of connecting device. Figure 1 and Figure 11 The connecting device shown differs from the previous one in that the first connecting assembly 100 only includes a fixing plate 110, and when the first connecting structure 100 is placed horizontally, the fixing plate 110 can have a structure that is concave in the middle and convex horizontally around the edges. The specific structure of each component in this connecting device can be found in [reference needed]. Figures 1 to 9 To avoid repetition, I will not go into details here.

[0070] It is understood that embodiments of this application also mention a semiconductor testing machine chassis, such as... Figures 14 to 16 As shown, the semiconductor testing machine chassis 300 can be a hollow cavity structure, and the upper surface of the inner cavity of the semiconductor testing machine chassis can be provided with a first connecting structure. The specific structure of the first connecting structure can be found in [reference needed]. Figures 1 to 13 To avoid repetition, I will not go into details here.

[0071] It is understood that embodiments of this application also mention a test host, such as... Figure 17As shown, the test host 400 can be a box structure, and the upper surface of the outer wall of the test host can be provided with a second connecting structure. The specific structure of the second connecting structure can refer to Figures 1 to 13 , and will not be repeated here to avoid repetition.

[0072] It can be understood that the embodiments of the present application also provide a semiconductor test machine, as Figure 18 shown, the semiconductor test machine 500 can include a semiconductor test machine case 300 and a test host 400. And the semiconductor test machine case 300 can be a hollow cavity structure, and the inner cavity upper surface of the semiconductor test machine case 300 can be provided with a first connecting structure. The test host 400 can be a box structure, and the upper surface of the outer wall of the test host 400 can be provided with a second connecting structure. Among them, the specific structure of the first connecting structure and the second connecting structure can refer to Figures 1 to 13 , and will not be repeated here to avoid repetition.

[0073] By using the first connecting structure and the second connecting structure to connect the semiconductor test machine case and the test host, the following technical effects are achieved:

[0074] First, by using the first mounting portion, the second mounting portion, the fixed plate in the first connecting structure, and the third mounting portion, the fourth mounting portion and the limiting assembly in the second connecting structure, the installation steps of the test host can be simplified, without the need for precise alignment of the mounting holes on the test host and the mounting holes on the semiconductor test machine case first, and then fixed by bolts, which can reduce the installation difficulty.

[0075] Second, during the installation of the test host, only the first limiting portion and the second limiting portion are placed in the first accommodating channel, and the third limiting portion and the fourth limiting portion are placed in the second accommodating channel, and the test host is moved towards the first mounting portion to complete the preliminary positioning of the test host, and then further fixed by using bolts in the positioning hole, which not only can further increase the connection stability of the semiconductor test machine case and the test host, but also can reduce the installation time and the physical labor of the installation personnel.

[0076] Third, the limiting assembly and the bearing assembly can ensure the installation stability of the test host in the semiconductor test machine case. And the cooperation of the first limiting portion, the second limiting portion, the third limiting portion and the fourth limiting portion with the bearing assembly can effectively prevent the accidental movement of the test host during installation.

[0077] Fourth, when the test host needs to be maintained or updated, the disassembly process is also simple and fast.

[0078] Fifth, by embedding the test host in the hollow cavity of the semiconductor test machine case, the internal space of the semiconductor test machine case can be fully utilized.

[0079] Sixth, by using the first connecting structure and the second connecting structure, the system can be applied to different sizes and types of test hosts, and the flexibility and compatibility of the system can be improved.

[0080] In the drawings, some structural features can be shown in a particular arrangement and / or order. However, it should be understood that such a particular arrangement and / or order can not be required. Rather, in some embodiments, these features can be arranged in a manner different from that shown in the illustrative drawings. Additionally, inclusion of structural features in a particular figure is not meant to imply that such features are required in all embodiments, and in some embodiments these features can not be included or can be combined with other features.

[0081] It should be noted that the relational terms herein, such as first and second, and the like, are used solely to distinguish one from another entity or action without necessarily requiring or implying any actual relationship or order between such entities or actions. Moreover, the terms "comprises", "comprising", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but can include other elements not expressly listed or inherent to such process, method, article, or apparatus. An element proceeded by "comprises... a" does not, without more constraints, exclude the existence of additional identical elements in the process, method, article, or apparatus that comprises the element.

[0082] While the application has been illustrated and described in connection with certain embodiments thereof, it will be readily apparent to those of ordinary skill in the art that various changes in form and detail can be made therein without departing from the spirit and scope of the application.

Claims

1. A connection device, characterized in that The first connecting structure and the second connecting structure are included. The first connecting structure includes a fixed plate, a first accommodating channel and a second accommodating channel are formed on the fixed plate, and a load-bearing assembly is formed between the first accommodating channel and the second accommodating channel. The second connecting structure includes a connected support assembly and a limiting assembly, the support assembly includes a first support part and a second support part. When the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the limiting assembly is connected with the load-bearing assembly.

2. The connecting device according to claim 1, wherein The width of the first accommodating channel is greater than the width of the first support part. The width of the second accommodating channel is greater than the width of the second support part.

3. The connection device of claim 1, wherein The limiting assembly includes a first limiting assembly and a second limiting assembly, The end of the first limiting assembly is connected with the first support part, The end of the second limiting assembly is connected with the second support part, The first limiting assembly and the second limiting assembly are spaced apart to form a sliding groove.

4. The connecting device according to claim 3, wherein The first limiting assembly includes a first limiting part and a second limiting part, and the second limiting assembly includes a third limiting part and a fourth limiting part. The load-bearing assembly includes an end load-bearing part and a middle load-bearing part. When the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the first limiting part and the third limiting part are both connected with the end load-bearing part, and the second limiting part and the fourth limiting part are both connected with the middle load-bearing part.

5. The connection device according to claim 4, characterized in that The load-bearing assembly further includes a first positioning part and a second positioning part, and the end load-bearing part, the first positioning part, the middle load-bearing part and the second positioning part are sequentially connected. The width of the part of the first accommodating channel connected with the first positioning part is greater than the width of the first limiting part, and the width of the part of the second accommodating channel connected with the first positioning part is greater than the width of the third limiting part. The width of the part of the first accommodating channel connected with the second positioning part is greater than the width of the second limiting part, and the width of the part of the second accommodating channel connected with the second positioning part is greater than the width of the fourth limiting part. The width of the part of the first accommodating channel connected with the second positioning part is greater than the width of the second limiting part, and the width of the part of the second accommodating channel connected with the second positioning part is greater than the width of the fourth limiting part.

6. The connection device according to claim 5, characterized in that The first limiting assembly includes a first limiting plate and a second limiting plate, The first limiting plate and the second limiting plate are parallel and spaced apart to form a through limiting groove. When the first support part is located in the first accommodating channel and the second support part is located in the second accommodating channel, the load-bearing assembly is located in the limiting groove.

7. The connection device of claim 5, wherein The side of the fixed plate away from the first accommodating channel is a first fixed part, and the side of the fixed plate away from the second accommodating channel is a second fixed part, The area corresponding to the second positioning part on the first fixed part and / or the second fixed part is provided with a positioning hole.

8. A semiconductor test machine chassis, characterized by, The semiconductor test machine case is a hollow cavity structure, The inner cavity upper surface of the semiconductor test machine case is provided with the first connecting structure according to any one of claims 1 to 7.

9. A test host, characterized by The test host is a box structure, The outer wall upper surface of the test host is provided with the second connecting structure according to any one of claims 1 to 7.

10. A semiconductor test machine, characterized by, The semiconductor test machine comprises a semiconductor test machine cabinet and a test host, an inner cavity upper surface of the semiconductor test machine cabinet is provided with the first connecting structure as claimed in any one of claims 1 to 7, and an outer wall upper surface of the test host is provided with the second connecting structure as claimed in any one of claims 1 to 7.

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