Clamp for IC frame test

Abstract

The utility model discloses a clamp for IC frame test, which belongs to the technical field of integrated circuit test equipment and comprises a test board and an IC frame body, a first moving plate, a second moving plate and a third moving plate are slidably mounted at the top of the test board, two groups of supports are fixedly mounted at the top of the test board, a first motor is fixedly mounted on one side of one group of supports, and a second motor is fixedly mounted on the other side of the other group of supports. A rotating shaft is fixedly installed at the output end of the first motor and rotationally installed in the two sets of supports, a worm is fixedly installed on the outer side of the rotating shaft, a rotating rod is rotationally installed at the top of the testing table, a worm gear is fixedly installed on the outer side of the rotating rod, and a cam is fixedly installed at the top of the rotating rod. The clamping force and the position accuracy are guaranteed, through the self-locking performance of transmission of the worm gear and the worm, the transmission stability and reliability can be guaranteed while power is transmitted, the situation of slipping or accidental loosening is avoided, and the safety and stability of the clamp in the working process are guaranteed.

Description

Technical Field

[0001] This utility model relates to the field of integrated circuit testing equipment technology, and in particular to a fixture for IC frame testing. Background Technology

[0002] In the field of integrated circuit manufacturing, the IC frame is a key component that carries the chip, and its quality directly affects the performance and reliability of the IC product. Throughout the entire IC production process, the quality inspection of the IC frame is crucial, and test fixtures, as indispensable tools in the inspection process, significantly impact the accuracy and efficiency of the inspection results.

[0003] With the rapid development of the IC industry, the size and shape of IC frames are becoming increasingly diverse. Existing IC frame test fixtures have poor versatility, requiring frequent fixture changes for different IC frame specifications, which increases production and time costs. Furthermore, they are easily affected by external factors, causing changes in clamping force and thus affecting test data. Therefore, we propose an IC frame test fixture to solve this problem. Utility Model Content

[0004] The purpose of this invention is to provide a fixture for IC frame testing to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, the present invention adopts the following technical solution:

[0006] An IC frame testing fixture includes: a test platform and an IC frame body. A first movable plate, a second movable plate, and a third movable plate are slidably mounted on the top of the test platform. Two sets of supports are fixedly mounted on the top of the test platform. A motor is fixedly mounted on one side of one set of supports. A rotating shaft is fixedly mounted on the output end of the motor. The rotating shaft is rotatably mounted inside the two sets of supports. A worm gear is fixedly mounted on the outer side of the rotating shaft. A rotating rod is rotatably mounted on the top of the test platform. A worm wheel is fixedly mounted on the outer side of the rotating rod. A cam is fixedly mounted on the top of the rotating rod. Fixed rods are fixedly mounted on both sides of the first and third movable plates. Return springs are sleeved on the outer sides of both sets of fixed rods. A fixture is fixedly mounted on the side adjacent to the first and second movable plates. The two sides of the IC frame body abut against the corresponding sides of the fixtures. Four sets of lifting rods are fixedly mounted on the bottom of the test platform. A fixed plate is fixedly mounted on the bottom of the four sets of lifting rods. Four sets of support legs are fixedly mounted on the bottom of the fixed plate.

[0007] Preferably, two sets of brackets are fixedly installed on the top of the fixed plate, and a bidirectional lead screw is rotatably installed inside the two sets of brackets. Two sets of movable seats are threaded to the outside of the bidirectional lead screw. The two sets of movable seats are slidably installed on the top of the fixed plate, and a support rod is hinged between the bottom of the test platform and the two sets of movable seats.

[0008] Preferably, the top of the test platform is provided with a sliding groove 1 and a sliding groove 2. The moving plate 1 and the moving plate 2 are slidably installed in the sliding groove 2, and the moving plate 3 is slidably installed in the sliding groove 1. The two ends of the two sets of reset springs are respectively fixedly installed on one side of the moving plate 1 and one side of the moving plate 2. The two sides of the moving plate 2 are slidably installed on the outside of the corresponding fixed rod.

[0009] Preferably, the adjacent sides of the second and third movable plates abut against the outer side of the cam, and the worm gear and the worm are engaged.

[0010] Preferably, the top of the fixed plate is provided with a guide groove, and the two sets of movable seats are slidably installed in the guide groove.

[0011] Preferably, one side of one of the brackets is fixedly mounted with a second motor, and one end of the bidirectional lead screw is fixedly mounted on the output end of the second motor.

[0012] In this utility model, an IC frame testing fixture is provided. A motor drives a bidirectional lead screw. Through the cooperation between two sets of moving seats, the bidirectional lead screw, and the guide groove, the two sets of moving seats move relative to each other in the guide groove. When the two sets of moving seats slide towards each other, the support rod hinged between the bottom of the test platform and the moving seats will cause the test platform to move up and down under the restriction of the lifting rod, thereby realizing the adjustment of the height of the test platform. By setting four sets of support legs to evenly distribute the weight of the test platform and the items on it, the position of the moving seats can be accurately controlled, and the height of the test platform can be precisely adjusted to adapt to IC frames of different sizes and testing requirements.

[0013] This utility model has a reasonable structural design. A motor drives a rotating shaft and worm gear to rotate, with the worm wheel meshing with the worm. This meshes with the worm gear, which in turn drives the rotating rod and cam to rotate. The cam then drives a second movable plate, constrained by a second sliding groove, to move relative to a third movable plate, constrained by a first sliding groove. Fixed rods drive the first movable plate to move relative to the second movable plate. Guided by two sets of fixed rods, the second movable plate moves, and a return spring contracts. Two sets of clamps between the first and second movable plates quickly clamp the IC frame body. When the motor reverses, the cam rotates in the opposite direction. Under the elastic action of the return spring, the first and second movable plates return to their original positions. The first movable plate then drives the two sets of fixed rods to reset the third movable plate, thus releasing the clamp on the IC frame body.

[0014] It achieves precise clamping of IC frame bodies of different sizes, ensuring the accuracy of clamping force and position. Through the self-locking property of worm gear and worm drive, it can ensure the stability and reliability of transmission while transmitting power, avoiding slippage or accidental loosening, and ensuring the safety and stability of the fixture during operation. Attached Figure Description

[0015] Figure 1 This is a three-dimensional structural diagram of a fixture for testing an IC frame proposed in this utility model;

[0016] Figure 2 This is a cross-sectional view of a fixture for testing an IC frame proposed in this utility model.

[0017] Figure 3 for Figure 2 A magnified view of part A in the middle.

[0018] In the diagram: 1. Test bench; 2. IC frame body; 3. Moving plate one; 4. Moving plate two; 5. Moving plate three; 6. Fixed rod; 7. Fixture; 8. Slide groove one; 9. Slide groove two; 10. Support; 11. Motor one; 12. Rotating shaft; 13. Worm gear; 14. Worm wheel; 15. Cam; 16. Lifting rod; 17. Fixed plate; 18. Guide groove; 19. Moving seat; 20. Support rod; 21. Bracket; 22. Two-way lead screw; 23. Motor two; 24. Support leg; 25. Rotating rod; 26. Return spring. Detailed Implementation

[0019] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present utility model. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments.

[0020] Reference Figure 1-3An IC frame testing fixture includes: a test platform 1 and an IC frame body 2. A first movable plate 3, a second movable plate 4, and a third movable plate 5 are slidably mounted on the top of the test platform 1. Two sets of supports 10 are fixedly mounted on the top of the test platform 1. A first motor 11 is fixedly mounted on one side of one set of supports 10. A rotating shaft 12 is fixedly mounted on the output end of the first motor 11. The rotating shaft 12 is rotatably mounted inside the two sets of supports 10. A worm gear 13 is fixedly mounted on the outer side of the rotating shaft 12. A rotating rod 25 is rotatably mounted on the top of the test platform 1. The outer side of the rotating rod 25 is fixed... A worm gear 14 is installed, a cam 15 is fixedly installed on the top of the rotating rod 25, and fixing rods 6 are fixedly installed on both sides of the first moving plate 3 and the third moving plate 5. A return spring 26 is sleeved on the outer side of both sets of fixing rods 6. A clamp 7 is fixedly installed on the side adjacent to the first moving plate 3 and the second moving plate 4. The two sides of the IC frame body 2 abut against the side of the corresponding clamp 7. Four sets of lifting rods 16 are fixedly installed at the bottom of the test bench 1. A fixing plate 17 is fixedly installed at the bottom of the four sets of lifting rods 16. Four sets of support legs 24 are fixedly installed at the bottom of the fixing plate 17.

[0021] In this embodiment, two sets of brackets 21 are fixedly installed on the top of the fixed plate 17. Two bidirectional lead screws 22 are rotatably installed inside the two sets of brackets 21. Two sets of movable seats 19 are threadedly connected to the outside of the bidirectional lead screws 22. The two sets of movable seats 19 are slidably installed on the top of the fixed plate 17. Support rods 20 are hinged between the bottom of the test platform 1 and the two sets of movable seats 19 to adapt to different test scenarios and the needs of operators.

[0022] In this embodiment, the top of the test platform 1 is provided with a first slide groove 8 and a second slide groove 9. The first movable plate 3 and the second movable plate 4 are slidably installed in the second slide groove 9, and the third movable plate 5 is slidably installed in the first slide groove 8. The two ends of the two sets of return springs 26 are respectively fixedly installed on one side of the first movable plate 3 and one side of the second movable plate 4. The two sides of the second movable plate 4 are slidably installed on the outside of the corresponding fixed rods 6 to avoid displacement or shaking, thereby improving the accuracy and reliability of the test.

[0023] In this embodiment, the adjacent sides of the second movable plate 4 and the third movable plate 5 abut against the outer side of the cam 15, and the worm gear 14 and the worm 13 mesh with each other to ensure that the clamping and releasing action of the fixture 7 on the IC frame body 2 has high repeatability and accuracy, and is not affected by external forces.

[0024] In this embodiment, a guide groove 18 is provided on the top of the fixed plate 17, and two sets of movable seats 19 are slidably installed in the guide groove 18 to avoid deviation or shaking, thereby ensuring the stability of the test platform 1 during the lifting process.

[0025] In this embodiment, a motor 23 is fixedly installed on one side of one of the brackets 21, and one end of the bidirectional lead screw 22 is fixedly installed on the output end of the motor 23. This allows for accurate control of the position of the moving seat 19, thereby precisely adjusting the height of the test platform 1 to accommodate IC frames of different sizes and testing requirements.

[0026] In this embodiment, during use, the IC frame body 2 is placed on the test bench 1 and between the two sets of fixtures 7. Then, the motor 11 is started, driving the rotating shaft 12 and worm gear 13 to rotate. The worm wheel 14 meshes with the worm gear 13, thereby driving the rotating rod 25 to rotate. The rotating rod 25 drives the cam 15 to rotate. The outer side of the cam 15 abuts against the moving plate 24, which moves relative to the moving plate 35 under the constraint of the sliding groove 29 and the sliding plate 35 under the constraint of the sliding groove 18. This movement is then driven by the fixed rod 6. 3. The moving plate 2 moves relative to the moving plate 4. The moving plate 2 moves under the guidance of the two sets of fixed rods 6. The return spring 26 retracts. The two sets of clamps 7 between the moving plate 3 and the moving plate 2 quickly clamp the IC frame body 2. When the motor 11 reverses, the cam 15 rotates in the opposite direction. Under the elastic action of the return spring 26, the moving plate 3 and the moving plate 2 return to their original positions. The moving plate 3 drives the two sets of fixed rods 6 to reset the moving plate 3 5, thereby releasing the clamping of the IC frame body 2.

[0027] The starter motor 23 drives the bidirectional lead screw 22, which is threaded to the outside of the bidirectional lead screw 22 through two sets of movable seats 19 and guided by the guide groove 18. Thus, the two sets of movable seats 19 move relative to each other in the guide groove 18. When the two sets of movable seats 19 slide towards each other, the support rod 20 hinged between the bottom of the test platform 1 and the movable seat 19 will cause the test platform 1 to move up and down under the restriction of the lifting rod 16, thereby realizing the adjustment of the height of the test platform 1. The weight of the test platform 1 and the items on it is evenly distributed by setting four sets of support legs 24.

[0028] The above provides a detailed description of an IC frame testing fixture provided by this utility model. Specific embodiments have been used to illustrate the principles and implementation methods of this utility model. The descriptions of these embodiments are only intended to aid in understanding the method and core ideas of this utility model. It should be noted that those skilled in the art can make various improvements and modifications to this utility model without departing from its principles, and these improvements and modifications also fall within the protection scope of the claims of this utility model.

Claims

1. A fixture for testing IC frames, characterized in that, include: The test bench (1) and IC frame body (2) are provided. The top of the test bench (1) is slidably mounted with a first movable plate (3), a second movable plate (4), and a third movable plate (5). The top of the test bench (1) is fixedly mounted with two sets of supports (10). One set of supports (10) is fixedly mounted with a motor (11) on one side. A rotating shaft (12) is fixedly mounted on the output end of the motor (11). The rotating shaft (12) is rotatably mounted inside the two sets of supports (10). A worm gear (13) is fixedly mounted on the outside of the rotating shaft (12). A rotating rod (25) is rotatably mounted on the top of the test bench (1). A worm wheel (14) is fixedly mounted on the outside of the rotating rod (25). The top of the rotating rod (25) is fixedly installed with a cam (15). Both sides of the first moving plate (3) and the third moving plate (5) are fixedly installed with fixing rods (6). The outer sides of the two sets of fixing rods (6) are fitted with return springs (26). The sides of the first moving plate (3) and the second moving plate (4) are fixedly installed with clamps (7). The sides of the IC frame body (2) abut against the sides of the corresponding clamps (7). The bottom of the test bench (1) is fixedly installed with four sets of lifting rods (16). The bottom of the four sets of lifting rods (16) is fixedly installed with a fixing plate (17). The bottom of the fixing plate (17) is fixedly installed with four sets of support legs (24).

2. The IC frame testing fixture according to claim 1, characterized in that, Two sets of brackets (21) are fixedly installed on the top of the fixed plate (17). Two sets of double-acting screws (22) are rotatably installed inside the two sets of brackets (21). Two sets of movable seats (19) are threadedly connected to the outside of the double-acting screws (22). The two sets of movable seats (19) are slidably installed on the top of the fixed plate (17). Support rods (20) are hinged between the bottom of the test bench (1) and the two sets of movable seats (19).

3. The IC frame testing fixture according to claim 1, characterized in that, The test bench (1) has a sliding groove 1 (8) and a sliding groove 2 (9) on its top. The moving plate 1 (3) and the moving plate 2 (4) are slidably installed in the sliding groove 2 (9). The moving plate 3 (5) is slidably installed in the sliding groove 1 (8). The two ends of the two sets of reset springs (26) are respectively fixedly installed on one side of the moving plate 1 (3) and one side of the moving plate 2 (4). The two sides of the moving plate 2 (4) are slidably installed on the outside of the corresponding fixed rod (6).

4. The IC frame testing fixture according to claim 1, characterized in that, The two movable plates (4) and the three movable plates (5) are adjacent to each other on the outside of the cam (15), and the worm gear (14) and the worm (13) are engaged.

5. The IC frame testing fixture according to claim 2, characterized in that, The top of the fixed plate (17) is provided with a guide groove (18), and the two sets of movable seats (19) are slidably installed in the guide groove (18).

6. The IC frame testing fixture according to claim 2, characterized in that, One side of one of the brackets (21) is fixedly installed with motor 2 (23), and one end of the bidirectional lead screw (22) is fixedly installed on the output end of motor 2 (23).

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