Spectrometer
By using a combination of light-absorbing elements and filters in the spectrometer, the measurement accuracy problem caused by stray light in the spectrometer was solved, achieving higher measurement accuracy and signal-to-noise ratio.
Patent Information
- Application Number
- CN202423156102.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-20
- Publication Date
- 2026-02-10
- Estimated Expiration
- 2034-12-20
AI Technical Summary
In existing spectrometers, non-collimated large-angle light from the light source is prone to becoming stray light, reducing measurement accuracy.
By combining light-absorbing elements and filters, the light-absorbing elements absorb non-collimated large-angle light and stray light, while the filters filter out unnecessary light beams, thereby improving the signal-to-noise ratio and measurement accuracy of the spectrometer.
By setting up light-absorbing components and filters, stray light can be effectively removed, improving the measurement accuracy of the spectrometer, preventing sample heating or quality changes, and enhancing the signal-to-noise ratio.
Smart Images
Figure CN223897310U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to a spectrometer. Background Technology
[0002] A spectroscope is a scientific instrument that uses optical principles to observe the composition of substances. It can be composed of elements such as a light source and a diffraction grating. The wavelength range covered by the light source is usually much larger than the wavelength range to be measured. In addition, the light from the light source often includes non-collimated, large-angle rays. These large-angle rays are prone to becoming stray light during transmission, reducing the accuracy of the measurement.
[0003] The "Background Art" paragraph is only used to help understand the content of this utility model. Therefore, the content disclosed in the "Background Art" paragraph may include some known technologies that are not known to those skilled in the art. The content disclosed in the "Background Art" paragraph does not mean that the content or the problems to be solved by one or more embodiments of this utility model were known or recognized by those skilled in the art prior to this application. Utility Model Content
[0004] This invention provides a spectrometer with high measurement accuracy.
[0005] Other objects and advantages of this utility model can be further understood from the technical features disclosed herein.
[0006] To achieve one or more of the above-mentioned objectives or other objectives, the spectrometer according to an embodiment of the present invention includes a light source, a first light-absorbing element, a first filter, and a sensor. The light source is configured to provide illumination light. The first filter has a filtering band, allowing light beams with wavelengths falling within the filtering band to pass through it. The first light-absorbing element has an opening, and the first filter is disposed on the first light-absorbing element. Illumination light is sequentially transmitted to the opening of the first light-absorbing element and the first filter before exiting the spectrometer. The sensor is used to sense a light to be measured, which is related to the illumination light, wherein the first light-absorbing element and the first filter are disposed in the transmission paths of the illumination light and the light to be measured.
[0007] Based on the above, the spectrometer provided by the present invention has at least one of the following advantages: (1) the first light-absorbing element is disposed between the light source and the sample to be measured, and the first light-absorbing element absorbs stray light in the illumination light and stray light in the light to be measured, thereby improving the measurement accuracy; (2) the first filter is disposed between the first light-absorbing element and the sample to be measured, and the first filter filters out part of the illumination light that is not used to measure the sample to be measured, thereby reducing the unnecessary part of the illumination light beam irradiating the sample to be measured, avoiding unnecessary heating or quality change of the sample, and improving the measurement accuracy.
[0008] To make the above-mentioned features and advantages of this utility model more apparent and understandable, specific embodiments are described below, and detailed descriptions are provided in conjunction with the accompanying drawings. Attached Figure Description
[0009] Figure 1 A schematic diagram of a spectrometer according to an embodiment of the present invention is shown.
[0010] Figure 2 A schematic diagram of a spectrometer according to another embodiment of the present invention is shown.
[0011] Figure 3 A partial structural schematic diagram of a spectrometer according to another embodiment of the present invention is shown.
[0012] Explanation of reference numerals in the attached figures:
[0013] 1: Spectrometer
[0014] 101: Light Source
[0015] 102: Filter assembly
[0016] 103: Raster
[0017] 104: Sensor
[0018] 105: Light-collecting lens
[0019] 106: Slit
[0020] 107: Collimating Lens
[0021] 110, 112: Focusing lens group
[0022] 111: Digital Micromirror Device
[0023] 202, 108: Filters
[0024] 202A, 202B: Anti-reflective coating
[0025] 203, 109: Light-absorbing components
[0026] 203H: Opening
[0027] IL: Illuminating light
[0028] LL: Light to be tested
[0029] SA: sample. Detailed Implementation
[0030] The foregoing description and other technical contents, features, and effects of this utility model will be clearly presented in the following detailed description of one of the preferred embodiments with reference to the accompanying drawings. The directional terms mentioned in the following embodiments, such as up, down, left, right, front, or back, are only for reference to the directions in the accompanying drawings. Therefore, the directional terms used are for illustrative purposes and not for limiting the scope of this utility model.
[0031] Figure 1 A schematic diagram of a spectrometer according to an embodiment of the present invention is shown. Figure 2 A partial structural schematic diagram of a spectrometer according to another embodiment of the present invention is shown.
[0032] Reference Figure 1 The spectrometer 1 is suitable for measuring the spectral data of sample SA. The spectrometer 1 includes a light source 101, a filter assembly 102, and a sensor 104.
[0033] The light source 101, such as a light bulb (e.g., a tungsten filament bulb or a halogen bulb), a laser, or a light-emitting diode, is used to provide illumination light IL. The light source 101 and the sample SA are located on opposite sides of the filter assembly 102. When at least a portion of the illumination light IL passes through the filter assembly 102 and illuminates the sample SA, the light diffusely reflected from the sample SA forms the test light LL. The test light LL is transmitted to the sensor 104 after passing through the filter assembly 102. The sensor 104 is used to sense the test light LL. The test light LL is related to the illumination light IL; for example, the illumination light IL illuminates the sample SA and forms the test light LL. Specifically, after the illumination light IL illuminates the sample SA, the sample SA reflects a portion of the wavelength of the illumination light IL that has passed through the filter assembly 102 (another portion of the wavelength of the illumination light IL is absorbed by the sample SA, for example), thus forming the test light LL. The test light LL formed by different samples SA is different. The sensor 104 is used to receive the test light LL and sense the light intensity of different wavelengths of the test light LL, i.e., the spectral data of the test light LL. After acquiring spectral data, spectrometer 1 can transfer the spectral data to analysis software to analyze sample SA. The analysis software may be installed on a computer or mobile device, but this invention is not limited to this. For example, in one embodiment, such as... Figure 2 As shown, the spectrometer 1 may also include a digital micromirror device 111 and a grating 103. The light to be measured LL is split by the grating 103 and then transmitted to the digital micromirror device 111, and then transmitted by the digital micromirror device 111 to the sensor 104, thereby obtaining the spectrum of the light to be measured LL.
[0034] Furthermore, to improve the light collection efficiency of spectrometer 1, multiple optical elements can be configured along the path of the light to be measured LL, such as... Figure 2In this embodiment, a light-collecting lens 105, a slit 106, and a collimating lens 107 are sequentially arranged along the path of the light to be tested LL. Accordingly, the light to be tested LL diffusely reflected from the sample SA is collected by the light-collecting lens 105 and passes through the slit 106. After being collimated by the collimating lens 107, it is incident on the grating 103, thereby improving the beam splitting accuracy of the grating 103.
[0035] Please refer to this again. Figure 1 The filtering assembly 102 includes a filter (first filter) 202 and a light-absorbing element (first light-absorbing element) 203. The light-absorbing element 203 is disposed (e.g., attached) on one side (first side) of the filter 202, and the sample SA can be placed directly or indirectly on the other side (second side) of the filter 202 opposite to that side. Illumination light IL is incident obliquely on the sample SA. In the path of illumination light IL, the light-absorbing element 203, the filter 202, and the sample SA are arranged sequentially.
[0036] It should be noted that since the illumination light IL from the light source 101 typically includes non-collimated large-angle rays, these large-angle rays are prone to becoming stray light during transmission and cannot be effectively utilized or controlled. Therefore, the light-absorbing element 203 of the filter assembly 102 can be used to absorb non-collimated large-angle rays and these stray rays, thereby improving the signal-to-noise ratio (SNR) of the spectrometer 1.
[0037] The light-absorbing element 203 has an opening 203H, which may overlap with, for example, the geometric center of the filter 202, but is not limited thereto. A collimated portion of the illumination light IL passes through the opening 203H of the light-absorbing element 203, and at least a portion of the collimated illumination light IL subsequently passes through the filter 202. In other words, after passing through the opening 203H of the light-absorbing element 203, the illumination light IL passes through the filter 202 and exits the spectrometer 1. The illumination light IL exiting the spectrometer 1 is diffusely reflected by the sample SA, forming the test light LL.
[0038] It should be noted that the illumination light IL is transmitted to the spectrometer 1 after passing through the filter 202. Therefore, the filter 202 and the light-absorbing element 203 can replace the traditional dustproof glass and also have the effect of filtering light.
[0039] In some embodiments, the absorbance of the light-absorbing element 203 is configured to be greater than or equal to 2, where absorbance refers to the logarithm (base 10) of the ratio of the light intensity before passing through the light-absorbing element 203 to the light intensity after passing through the light-absorbing element 203 (i.e., the reciprocal of the transmittance of the light-absorbing element 203). In other words, the transmittance of the light-absorbing element 203 is less than or equal to 0.01, indicating excellent light absorption. In some embodiments, the width of the opening 203H falls within the range of 5 mm to 30 mm to optimize the light absorption effect of the light-absorbing element 203 and avoid excessive non-collimated large-angle light and stray light incident on the filter 202 and the sample SA.
[0040] The illumination light IL is obliquely incident on the filter 202. The angle between the main beam of the illumination light IL incident on the filter 202 and the normal of the filter 202 can be between 30 degrees and 80 degrees. The filter 202 has a filtering band. Beams with wavelengths outside the filtering band are filtered out, while beams with wavelengths within the filtering band can pass through the filter 202. In other words, the portion of the illumination light IL from the light source 101 that is not used to measure the sample is filtered out by the filter 202. Therefore, the sample SA is prevented from being over-irradiated, which could cause unnecessary heating or qualitative changes in the sample SA, leading to spectral shift. In one embodiment, the filtering band of the filter 202 can correspond to the material characteristics of the sample SA. For example, when the sample SA has a significant absorption effect on light beams with wavelengths greater than or equal to 1350 nm and less than or equal to 1450 nm, the filtering band of the filter 202 can be designed to be greater than or equal to 1300 nm and less than or equal to 1500 nm (the wavelength range of the illumination light IL is, for example, greater than or equal to the wavelength range of the filter band and covers the filter band; the wavelength range of the illumination light IL is, for example, greater than or equal to 1000 nm and less than or equal to 1750 nm). In this way, the filter 202 can filter out light beams outside the filtering band and prevent the sample SA from being over-irradiated.
[0041] Figure 3 This diagram shows a partial structural schematic of a spectrometer according to another embodiment of the present invention. Please refer to [the diagram first]. Figure 3 In some embodiments, to reduce the probability of the illumination light IL being reflected by the surface of the filter 202 and to improve the transmittance of the filter 202, an anti-reflection film 202A may be disposed on the filter 202. Similarly, to reduce the probability of the test light LL being reflected by the surface of the filter 202 and to improve the transmittance of the filter 202, an anti-reflection film 202B may be disposed on the filter 202.
[0042] Re-reference Figure 2The optical axis of the light-collecting lens 105 passes through the opening 203H of the light-absorbing element 203; for example, the optical axis of the light-collecting lens 105 is coaxial with the opening 203H of the light-absorbing element 203. In one embodiment, the optical axis of the light-collecting lens 105 overlaps with the optical axis of the collimating lens 107, but this is not a limitation. Therefore, the test light LL diffusely reflected from the sample SA will sequentially pass through the filter 202 and through the opening 203H of the light-absorbing element 203. Furthermore, in Figure 2 In the embodiment, the light to be measured LL passes through the opening 203H of the light-absorbing member 203, is collected by the light-collecting lens 105, passes through the slit 106, and penetrates the collimating lens 107 to form collimated light.
[0043] Furthermore, such as Figure 2 As shown, to improve the measurement accuracy of the spectrometer 1, a filter (second filter) 108 and a light absorber (second light absorber) 109 are sequentially arranged along the path of the light to be measured LL. This allows for filtering of the light to be measured LL and removal of stray light. It should be noted that the filter 202 and the light absorber 203 are located between the light source 101 and the sample to be measured, for example, along the optical paths of the illumination light IL and the light to be measured LL. Conversely, the filter 108 and the light absorber 109 are located between the slit 106 and the grating 103; for example, the filter 108 and the light absorber 109 are only located along the optical path of the light to be measured LL, but not along the path of the illumination light IL.
[0044] The light to be measured, LL, passes through the absorber 109 and then enters the grating 103. After being split by the grating 103, it passes through the focusing lens group 110 and enters the digital micromirror device 111. The digital micromirror device 111 is used as a wavelength selector to select the portion of the light to be measured LL that has a specific wavelength. The selected portion of the light to be measured LL passes through the focusing lens group 112 and then enters the sensor 104 to generate a spectral line of that specific wavelength.
[0045] In summary, the spectrometer of the present invention has at least one of the following advantages: (1) The light-absorbing element 203 is arranged on the path from the light source 101 to the sample to be measured, and the light-absorbing element 203 absorbs the stray light in the illumination light IL and the stray light in the test light LL, thereby improving the measurement accuracy; (2) The filter 202 is arranged between the light-absorbing element 203 and the sample SA to be measured, and the filter 202 filters out the part of the illumination light IL that is not used to measure the sample to be measured, thereby reducing the unnecessary part of the illumination light beam irradiating the sample to be measured, avoiding unnecessary heating or quality change of the sample SA, and improving the measurement accuracy.
[0046] The above description is merely a preferred embodiment of this utility model and should not be construed as limiting the scope of this utility model. Any simple equivalent changes and modifications made in accordance with the claims and content of this utility model shall still fall within the scope of this utility model patent. Furthermore, no embodiment or claim of this utility model needs to achieve all the objectives, advantages, or features disclosed in this utility model. In addition, the abstract and title (utility model name) are only used to assist in patent document retrieval and are not intended to limit the scope of this utility model application. Furthermore, the terms "first," "second," etc., mentioned in this specification or claims are only used to name elements or distinguish different embodiments or scopes, and are not used to limit the upper or lower limit of the number of elements.
Claims
1. A spectrometer, characterized in that, The spectrometer includes a light source, a first light-absorbing element, a first filter, and a sensor, wherein: The light source is configured to provide illumination light; The first filter has a filtering band, and a light beam whose wavelength falls within the filtering band can penetrate the first filter; The first light-absorbing element has an opening, and the first filter is disposed on the first light-absorbing element. After the illumination light is sequentially transmitted to the opening of the first light-absorbing element and the first filter, at least a portion of the illumination light is transmitted out of the spectrometer; and The sensor is used to sense the light to be measured, which is related to the illumination light, wherein the first filter and the first light-absorbing element are disposed on the transmission path of the illumination light and the light to be measured.
2. The spectrometer according to claim 1, characterized in that, The spectrometer also includes a second filter and a second light-absorbing element, which are disposed in the path of the light to be measured.
3. The spectrometer according to claim 1, characterized in that, An anti-reflective film is also disposed on the first side and the second side of the first filter.
4. The spectrometer according to claim 1, characterized in that, The width of the opening falls within the range of 5 mm to 30 mm.
5. The spectrometer according to claim 1, characterized in that, The absorbance of the first light-absorbing element is greater than or equal to 2.
6. The spectrometer according to claim 1, characterized in that, The illumination light and the normal of the first filter form an angle, the angle being in the range of 30 degrees to 80 degrees.
7. The spectrometer according to claim 1, characterized in that, The opening of the first light-absorbing element overlaps with the geometric center of the first filter.
8. The spectrometer according to claim 1, characterized in that, The spectrometer also includes a light-collecting lens, the optical axis of which passes through the opening of the first light-absorbing element.
9. The spectrometer according to claim 1, characterized in that, The first light-absorbing element is disposed on the first side of the first filter, and the sample is placed directly on the second side of the first filter, with the first side and the second side opposite to each other.