LED driver simulation aging device adopting diode simulation load

Abstract

The utility model provides an LED driver simulation aging device adopting a diode simulation load. The LED driver simulation aging device comprises an LED driver, a load bus, a program control multipath load switch, a simulation load module, a sensor assembly and an MCU microcomputer control processor. The LED driver serves as a power supply device and is provided with an output end, and the output end of the LED driver is connected with the load bus; the load bus is connected with the output end of the LED driver and is connected with the simulation load module; the simulation load module adopts crystal diodes connected in series as a simulation load to form a diode simulation aging load module, and the diode simulation aging load module is connected with the load bus; the program-controlled multi-path load switch is arranged on a load bus, is connected with the MCU microcomputer control processor through a communication bus, and is used for switching different simulation load channels; the sensor assembly is located in the simulation load module. According to the utility model, the electrical characteristics of a real LED can be simulated more accurately, so that the accuracy and reliability of the aging test of the LED driving product are improved.

Description

Technical Field

[0001] This utility model relates to the field of LED driver aging test, specifically to an LED driver aging simulation device using a diode simulated load. Background Technology

[0002] As a core component of LED lighting systems, LED drivers play a crucial role in providing a stable power supply for LED lamps. During the production process, aging tests are conducted on each LED driver to screen out defective products that fail early, a necessary step to ensure product quality. Commonly used aging equipment employs transistor-based electronic variable impedance devices (commonly known as electronic loads) to simulate the electrical characteristics of LED lamps. Electronic loads typically offer operating modes such as constant current (CC), constant voltage (CV), and LED mode (Light Emitting Diode), and utilize transistors to achieve variable impedance functionality.

[0003] However, the current-voltage characteristics of transistors differ from those of real LEDs, which means that the electronic load cannot fully simulate the actual working state of LEDs. This affects the accuracy of aging tests and may result in some early-failure defective products not being screened out, thus affecting the final quality and reliability of the product. Utility Model Content

[0004] To address the above problems, the purpose of this invention is to propose an LED driver aging simulation device that uses a diode-simulated load. This device can more accurately simulate the electrical characteristics of a real LED, thereby improving the accuracy and reliability of aging tests for LED driver products.

[0005] To achieve the above objectives, this utility model provides an LED driver simulation aging device using a diode-simulated load, comprising the following components:

[0006] LED driver: As a power supply device, it has an output terminal, which is connected to the load bus.

[0007] Load bus: Connected to the output of the LED driver and to the simulated load module;

[0008] Programmable multi-channel load switch: Installed on the load bus and connected to the MCU microcomputer control processor via the communication bus, used to switch different simulated load channels;

[0009] Simulated load module: A diode simulation aging load module is constructed by using crystal diodes connected in series as simulated loads and connected to the load bus;

[0010] Sensor components: Located in the simulated load module, including current sensors, voltage sensors and temperature sensors, the sensor components are connected to the MCU microcomputer control processor through the monitoring unit;

[0011] MCU microcomputer control processor: It is also connected to the LED driver, responsible for detecting and sampling the voltage and current of the load bus, performing human-machine dialogue and aging mode settings and data statistics, and connecting to the programmable multi-channel load switch through the communication bus to perform real-time control of the programmable multi-channel load switch.

[0012] As a further embodiment of this utility model, the simulated load module is a series module of multiple crystal diodes, with each simulated load module consisting of multiple crystal diodes connected in series.

[0013] As a further embodiment of this invention, the simulated load module is composed of six 3A diodes connected in series. The combined voltage of the simulated load module is 0.7V*6=4V, and the current is 2A, making the electrical characteristics of the simulated load module closer to the voltage-current characteristic environment of a real LED.

[0014] As a further embodiment of this invention, the current sensor, voltage sensor and temperature sensor of the sensor assembly monitor the current, voltage and temperature parameters of the simulated load in real time, and transmit the monitoring data to the MCU microcomputer control processor through the monitoring unit.

[0015] As a further embodiment of this utility model, the programmable multiplexer is connected to the MCU microcomputer control processor via an RS232 or IEEE488GPIB communication bus.

[0016] As a further embodiment of this invention, the simulation load module further includes:

[0017] Operating mode switcher: The operating mode switcher is connected to the MCU microcomputer control processor and is used to switch different operating modes of the simulation load module in the simulation aging test. The operating modes of the simulation load module include constant current (CC) mode, constant voltage (CV) mode and LED mode, which ensures that the simulation aging test is carried out under different power supply operating conditions.

[0018] As a further embodiment of this invention, the simulation load module further includes:

[0019] Parameter adjustment device: The parameter adjustment device is controlled by an MCU microcomputer control processor and is used to adjust the key parameters of the simulated load module in the simulated aging test. The key parameters of the simulated load module include current and voltage. The parameter adjustment device is controlled by an MCU microcomputer control processor to ensure precise control of the simulated load in order to simulate the current and voltage characteristics of LED products under different working conditions.

[0020] As a further embodiment of this invention, the simulation load module further includes:

[0021] Power interface: The power interface connects to the LED driver product to ensure a good electrical connection, enabling simulated aging tests to be performed in a real working environment.

[0022] As a further embodiment of this invention, the MCU microcomputer control processor includes the following components:

[0023] Mode switching controller: The mode switching controller is connected to the working mode switcher and is responsible for switching the working mode of the simulation load module. The working modes of the simulation load module include constant current (CC) mode, constant voltage (CV) mode and LED mode, so as to simulate the current and voltage characteristics of LED driver products under different working conditions.

[0024] Parameter regulator: Connected to the parameter adjustment device of the simulated load module, it is responsible for adjusting the key parameters in the simulated aging test. Through the parameter regulator, the user or the automation system can make precise parameter adjustments to the simulated load according to actual needs to meet the test requirements of different LED products.

[0025] Timer: The MCU microcomputer control processor contains a timer, which is used to set and monitor the duration of the simulated aging test. The timer ensures that the test is completed within the set time and provides an assessment of the long-term stability of the LED product.

[0026] Communication Interface: The MCU microcomputer control processor is equipped with a communication interface for data interaction with the monitoring unit, user interface or other external systems. The communication interface is also used for real-time transmission of monitoring data, receiving commands and working in conjunction with other systems, making the entire simulation aging system more intelligent and controllable.

[0027] Power Manager: Connected to the power interface of the simulated load module, the power manager in the MCU microcomputer control processor is responsible for managing the power supply of the simulated aging circuit, ensuring that the simulated load and other components receive a stable power supply, so as to guarantee the stability and accuracy of the test.

[0028] Compared with the prior art, the LED driver simulation aging device with diode simulated load proposed in this utility model has the following advantages:

[0029] 1. Accurate Simulation Effect: This utility model's LED driver simulation aging device uses crystal diodes as the simulation load. Multiple crystal diodes are connected in series to form a simulation load module, making the current-voltage characteristics of the simulation load module close to the actual current-voltage characteristics of an LED. Specifically, it uses six 3A diodes connected in series, with a combined voltage of 4V and a current of 2A. This configuration can more accurately simulate the actual working state of an LED, thereby improving the realism and effectiveness of the aging test.

[0030] 2. Multi-mode operation switching: By setting a working mode switcher, the LED driver simulation aging device of this utility model can switch between constant current (CC), constant voltage (CV) and LED mode, so that the simulation aging test can be carried out under different power supply working conditions, ensuring the comprehensiveness and reliability of the test.

[0031] 3. Precise parameter adjustment: The parameter adjustment device in the LED driver simulation aging device of this utility model is controlled by an MCU microcomputer control processor, which can precisely adjust the key parameters (such as current and voltage) in the simulation aging test. Through precise control, it is ensured that the simulation load can accurately simulate the electrical characteristics of different LED products and meet diverse testing needs.

[0032] 4. Real-time Monitoring and Analysis: The MCU microcomputer control processor monitors parameters such as current, voltage, and temperature of the simulated load in real time through the monitoring unit. The sensor components include current sensors, voltage sensors, and temperature sensors, which can monitor key parameters such as current, voltage, and temperature of the simulated load in real time and transmit the monitored data to the MCU microcomputer control processor for analysis and processing. This real-time monitoring and feedback mechanism can promptly detect anomalies, ensuring the safety and stability of the testing process.

[0033] 5. Intelligent Control: The MCU microcomputer control processor is not only responsible for detecting and sampling the voltage and current of the load bus, but also for human-machine interaction, setting aging modes, and statistical analysis of test data. Through intelligent control and data statistics, users can obtain various data in real time during the test process, comprehensively understand the aging performance and quality status of LED driver products, and ultimately generate a detailed aging test report.

[0034] 6. Efficient screening of defective products: Aging tests using diode simulated loads can more accurately screen out defective LED driver products that fail early, reducing the outflow of unqualified products and significantly improving the overall quality and market competitiveness of the products.

[0035] The LED driver simulation aging device of this invention not only demonstrates significant advantages in testing accuracy, reliability, and intelligence, but also improves production efficiency and product quality, providing an efficient and reliable solution for quality control and aging testing of LED driver products.

[0036] These or other aspects of this application will become more apparent from the following description of embodiments. It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only, and are not intended to limit the application. Attached Figure Description

[0037] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other embodiments can be obtained based on these drawings without creative effort.

[0038] In the diagram:

[0039] Figure 1 This is a system block diagram of an LED driver simulation aging device using a diode-simulated load, according to an embodiment of the present invention.

[0040] Figure 2 A schematic diagram of the transistor output characteristics used to drive the aging of electronic load products.

[0041] Figure 3 This diagram illustrates the true current-voltage characteristics of an LED light-emitting diode as the electronic load drives the product during aging.

[0042] Figure 4 This is a schematic diagram of the diode current-voltage characteristics in the simulation load module of the LED driver simulation aging device using a diode simulation load, as described in an embodiment of this utility model.

[0043] Figure 5 The LED driver simulation aging device using diode simulation load, as described in this embodiment of the utility model. Figure 1 A schematic diagram of the structure of a diode simulation aging load module. Detailed Implementation

[0044] The present application will now be further described in conjunction with the accompanying drawings and specific embodiments. It should be noted that, without conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0045] To make the objectives, technical solutions, and advantages of this utility model clearer, the embodiments of this utility model are further described in detail below with reference to specific examples and the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative and are not intended to limit this application.

[0046] It should be noted that all uses of the terms "first" and "second" in the embodiments of this utility model are for the purpose of distinguishing two different entities or parameters with the same name. Therefore, "first" and "second" are merely for convenience of expression and should not be construed as limiting the embodiments of this utility model. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion, such as other steps or units inherent in a process, method, apparatus, product, or device that includes a series of steps or units.

[0047] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0048] The flowchart shown in the attached diagram is for illustrative purposes only and does not necessarily include all content and operations / steps, nor does it necessarily have to be performed in the order described. For example, some operations / steps can be broken down, combined, or partially merged, so the actual execution order may change depending on the actual situation.

[0049] The following detailed description of some embodiments of this application is provided in conjunction with the accompanying drawings. Unless otherwise specified, the following embodiments and features can be combined with each other.

[0050] The electronic load offers various aging modes, including CC (Current Control), CV (Votage Control), and LED (Light Emitting Dial), to support product aging. Its variable impedance circuit features constant current CC control, constant voltage CV control, and constant current / constant voltage LED control. Regardless of the mode used, a transistor is employed (see [link to documentation]). Figure 2 As shown, Figure 2 (This is a schematic diagram of the transistor's output characteristics), compared to the actual LED's current-voltage characteristics (see...). Figure 3 As shown, Figure 3 The diagram shows differences between the current-voltage characteristics of an LED and those of a transistor. Furthermore, the discrepancy between the current-voltage characteristics of a transistor and those of an actual LED can negatively impact the accuracy and reliability of aging tests.

[0051] In view of this, the purpose of this utility model is to propose an LED driver simulation aging device that uses a diode simulated load. This device can more accurately simulate the electrical characteristics of real LEDs, thereby improving the accuracy and reliability of aging tests for LED driver products.

[0052] See Figure 1 As shown, an embodiment of this utility model provides an LED driver simulation aging device using diode-simulated loads, including an LED driver, a load bus, a programmable multiplexer, a simulation load module, sensor components, and an MCU microcomputer control processor. The LED driver, as a power supply device, has an output terminal connected to the load bus. The load bus is connected to the LED driver output terminal and also to the simulation load module. The programmable multiplexer is mounted on the load bus and connected to the MCU microcomputer control processor via a communication bus. The simulation load module uses series-connected crystal diodes as the simulation load, forming a diode simulation aging load module, and is connected to the load bus. The sensor components, located within the simulation load module, include a current sensor, a voltage sensor, and a temperature sensor, and are connected to the MCU microcomputer control processor via a monitoring unit. The MCU microcomputer control processor is also connected to the LED driver and to the programmable multiplexer via a communication bus.

[0053] This invention relates to an LED driver simulation aging device employing a diode-simulated load, which uses a crystal diode with the same characteristics as an LED (see [link]). Figure 4 As shown, Figure 4 (A schematic diagram of the diode's volt-ampere characteristics) is used as a simulation load to achieve the simulated aging program of the LED driver. The electrical principle of the diode simulation load is described in [reference needed]. Figure 5 As shown.

[0054] In this embodiment, the simulated load module is a series-connected module of multiple crystal diodes, with each simulated load module consisting of multiple crystal diodes connected in series. For example, see [link to example]. Figure 5 As shown, the simulated load module is composed of six 3A diodes connected in series. The combined voltage of the simulated load module is 0.7V*6=4V, and the current is 2A, making the electrical characteristics of the simulated load module closer to the current-voltage characteristic environment of a real LED.

[0055] In this embodiment, the current sensor, voltage sensor, and temperature sensor of the sensor assembly monitor the current, voltage, and temperature parameters of the simulated load in real time, and transmit the monitoring data to the MCU microcomputer control processor through the monitoring unit. The programmable multiplexer is connected to the MCU microcomputer control processor via an RS232 or IEEE488GPIB communication bus.

[0056] In this embodiment, the simulated load module further includes:

[0057] Operating mode switcher: The operating mode switcher is connected to the MCU microcomputer control processor and is used to switch different operating modes of the simulation load module in the simulation aging test. The operating modes of the simulation load module include constant current (CC) mode, constant voltage (CV) mode and LED mode, which ensures that the simulation aging test is carried out under different power supply operating conditions.

[0058] Parameter adjustment device: The parameter adjustment device is controlled by an MCU microcomputer control processor and is used to adjust the key parameters of the simulated load module in the simulated aging test. The key parameters of the simulated load module include current and voltage. The parameter adjustment device is controlled by an MCU microcomputer control processor to ensure precise control of the simulated load in order to simulate the current and voltage characteristics of LED products under different working conditions.

[0059] Power interface: The power interface connects to the LED driver product to ensure a good electrical connection, enabling simulated aging tests to be performed in a real working environment.

[0060] In this embodiment, the MCU microcomputer control processor includes the following components:

[0061] Mode switching controller: The mode switching controller is connected to the working mode switcher and is responsible for switching the working mode of the simulation load module. The working modes of the simulation load module include constant current (CC) mode, constant voltage (CV) mode and LED mode, so as to simulate the current and voltage characteristics of LED driver products under different working conditions.

[0062] Parameter regulator: Connected to the parameter adjustment device of the simulated load module, it is responsible for adjusting the key parameters in the simulated aging test. Through the parameter regulator, the user or the automation system can make precise parameter adjustments to the simulated load according to actual needs to meet the test requirements of different LED products.

[0063] Timer: The MCU microcomputer control processor contains a timer, which is used to set and monitor the duration of the simulated aging test. The timer ensures that the test is completed within the set time and provides an assessment of the long-term stability of the LED product.

[0064] Communication Interface: The MCU microcomputer control processor is equipped with a communication interface for data interaction with the monitoring unit, user interface or other external systems. The communication interface is also used for real-time transmission of monitoring data, receiving commands and working in conjunction with other systems, making the entire simulation aging system more intelligent and controllable.

[0065] Power Manager: Connected to the power interface of the simulated load module, the power manager in the MCU microcomputer control processor is responsible for managing the power supply of the simulated aging circuit, ensuring that the simulated load and other components receive a stable power supply, so as to guarantee the stability and accuracy of the test.

[0066] In the simulated load module of this embodiment, the core component is a crystal diode, which serves as the simulated load to simulate the current-voltage characteristics of an LED. This crystal diode is carefully selected to ensure that its electrical characteristics are similar to those of an actual LED, including the relationship between forward voltage and current. This ensures more accurate simulated aging tests and more realistically simulates the operating state of LED products. The simulated load module is equipped with a working mode switcher for selecting different working modes during the simulated aging test, including constant current (CC) mode, constant voltage (CV) mode, and LED mode. This working mode switcher is controlled by an MCU microprocessor, ensuring that simulated aging tests are performed under different power supply operating conditions. This simulated load module provides an accurate simulated load for LED driver products, making aging tests more accurate and comprehensive. The design and composition of the simulated load module ensure a comprehensive evaluation of the performance of LED products under different operating conditions, thereby improving the reliability and quality level of LED products.

[0067] The LED driver aging simulation device using a diode-simulated load proposed in this utility model has the following advantages:

[0068] 1. Accurate Simulation Effect: This utility model's LED driver simulation aging device uses crystal diodes as the simulation load. Multiple crystal diodes are connected in series to form a simulation load module, making the current-voltage characteristics of the simulation load module close to the actual current-voltage characteristics of an LED. Specifically, it uses six 3A diodes connected in series, with a combined voltage of 4V and a current of 2A. This configuration can more accurately simulate the actual working state of an LED, thereby improving the realism and effectiveness of the aging test.

[0069] 2. Multi-mode operation switching: By setting a working mode switcher, the LED driver simulation aging device of this utility model can switch between constant current (CC), constant voltage (CV) and LED mode, so that the simulation aging test can be carried out under different power supply working conditions, ensuring the comprehensiveness and reliability of the test.

[0070] 3. Precise parameter adjustment: The parameter adjustment device in the LED driver simulation aging device of this utility model is controlled by an MCU microcomputer control processor, which can precisely adjust the key parameters (such as current and voltage) in the simulation aging test. Through precise control, it is ensured that the simulation load can accurately simulate the electrical characteristics of different LED products and meet diverse testing needs.

[0071] 4. Real-time Monitoring and Analysis: The MCU microcomputer control processor monitors parameters such as current, voltage, and temperature of the simulated load in real time through the monitoring unit. The sensor components include current sensors, voltage sensors, and temperature sensors, which can monitor key parameters such as current, voltage, and temperature of the simulated load in real time and transmit the monitored data to the MCU microcomputer control processor for analysis and processing. This real-time monitoring and feedback mechanism can promptly detect anomalies, ensuring the safety and stability of the testing process.

[0072] 5. Intelligent Control: The MCU microcomputer control processor is not only responsible for detecting and sampling the voltage and current of the load bus, but also for human-machine interaction, setting aging modes, and statistical analysis of test data. Through intelligent control and data statistics, users can obtain various data in real time during the test process, comprehensively understand the aging performance and quality status of LED driver products, and ultimately generate a detailed aging test report.

[0073] 6. Efficient screening of defective products: Aging tests using diode simulated loads can more accurately screen out defective LED driver products that fail early, reducing the outflow of unqualified products and significantly improving the overall quality and market competitiveness of the products.

[0074] The LED driver simulation aging device of this invention not only demonstrates significant advantages in testing accuracy, reliability, and intelligence, but also improves production efficiency and product quality, providing an efficient and reliable solution for quality control and aging testing of LED driver products.

[0075] It should be understood that, as used herein, the singular form "a" is intended to include the plural form as well, unless the context clearly supports an exception. It should also be understood that, as used herein, "and / or" refers to any and all possible combinations of one or more of the associatedly listed items. The embodiment numbers disclosed above are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0076] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of the present invention (including the claims) is limited to these examples. Within the framework of the present invention, technical features of the above embodiments or different embodiments can also be combined, and many other variations of different aspects of the present invention exist, which are not provided in the details for the sake of brevity. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. An LED driver aging simulation device using a diode-simulated load, characterized in that, The system includes an LED driver, a load bus, a programmable multiplexer, a simulated load module, sensor components, and an MCU (Microcontroller Unit) processor. The LED driver, serving as a power supply, has an output terminal connected to the load bus. The load bus is connected to the LED driver's output terminal and also to the simulated load module. The programmable multiplexer is mounted on the load bus and connected to the MCU processor via a communication bus. The simulated load module uses series-connected crystal diodes as the simulated load, forming a diode simulation aging load module, which is connected to the load bus. The sensor components, located within the simulated load module, include a current sensor, a voltage sensor, and a temperature sensor. These sensor components are connected to the MCU processor via a monitoring unit. The MCU processor is also connected to the LED driver and, via the communication bus, to the programmable multiplexer.

2. The LED driver simulation aging device using a diode-simulated load according to claim 1, characterized in that, The simulated load module is a series module of multiple crystal diodes, with each simulated load module consisting of multiple crystal diodes connected in series.

3. The LED driver simulation aging device using a diode simulation load according to claim 2, characterized in that, The simulated load module consists of six 3A diodes connected in series. The combined voltage of the simulated load module is 0.7V*6=4V, and the current is 2A.

4. The LED driver simulation aging device using a diode-simulated load according to claim 1, characterized in that, The programmable multiplexer is connected to the MCU microcomputer control processor via an RS232 or IEEE488GPIB communication bus.

5. The LED driver simulation aging device using a diode-simulated load according to claim 1, characterized in that, The simulated load module also includes a working mode switcher, which is connected to the MCU microcomputer control processor and is used to switch different working modes of the simulated load module during simulated aging tests. The working modes of the simulated load module include constant current mode, constant voltage mode and LED mode.

6. The LED driver simulation aging device using a diode simulation load according to claim 5, characterized in that, The simulation load module also includes: Parameter adjustment device: The parameter adjustment device is controlled by an MCU microcomputer processor and is used to adjust the key parameters of the simulated load module in the simulated aging test. The key parameters of the simulated load module include current and voltage.

7. The LED driver simulation aging device using a diode-simulated load according to claim 6, characterized in that, The simulated load module also includes a power interface, which is connected to the LED driver product.

8. The LED driver simulation aging device using a diode-simulated load according to claim 5, characterized in that, The MCU microcomputer control processor includes a mode switching controller, which is connected to a working mode switcher and is responsible for switching the working mode of the simulation load module.

9. The LED driver simulation aging device using a diode simulation load according to claim 8, characterized in that, The MCU microcomputer control processor includes a parameter regulator, which is connected to the parameter adjustment device of the simulation load module.

10. The LED driver simulation aging device using a diode-simulated load according to claim 9, characterized in that, The MCU microcomputer control processor also includes a timer, which is used to set and monitor the duration of the simulated aging test.

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