Vacuum adsorption test fixture
By designing a vacuum adsorption testing fixture, the circuit board is fixed using negative pressure equipment, which solves the problem of limited production capacity caused by the need for testing machines in existing fixtures, and realizes efficient circuit board testing without equipment testing.
Patent Information
- Application Number
- CN202423121728.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2026-02-13
- Estimated Expiration
- 2034-12-18
AI Technical Summary
Existing circuit board test fixtures require the use of test machines, resulting in a limited number of test equipment, restricted production capacity, and low testing efficiency.
A vacuum adsorption testing fixture is designed. By setting through holes and adsorption holes on the adsorption plate and connecting the air connector to the negative pressure device, the circuit board is adsorbed and fixed on the adsorption plate by the negative pressure, so that the probe can accurately contact the test point of the circuit board, and the test can be performed without testing equipment.
It improves the efficiency of circuit board testing, reduces reliance on testing equipment, and increases production capacity.
Smart Images
Figure CN223911009U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of circuit board test fixture, in particular to a vacuum adsorption test fixture. BACKGROUND
[0002] The test of circuit board is usually carried out by a special test fixture designed according to the model of circuit board for open, short circuit and resistance value test. A plurality of test probes are arranged on the test fixture. In the current test process, the circuit board is placed on the test fixture, and then the upper die of the test equipment is pressed on the test fixture to fix the circuit board, so as to ensure that the test probes are in good contact with the test points on the circuit board. This type of test fixture needs to be matched with a test machine. In actual production, the number of test equipment in the workshop is limited, which leads to low test efficiency and limits the production capacity. CONTENT OF THE UTILITY MODEL
[0003] In order to solve the above technical problems, the present application provides a vacuum adsorption test fixture, which comprises a base, a test fixture body arranged on the base, and a vertical plate fixed on the base and surrounding the test fixture body. An adsorption plate is arranged on the top of the vertical plate. A through hole is arranged on the surface of the adsorption plate for the probe of the test fixture body to pass through. An adsorption hole is arranged on the surface of the adsorption plate outside the periphery of the through hole. A gas joint is arranged on the side surface of the adsorption plate and connected to the adsorption hole.
[0004] Preferably, a longitudinal and transverse intersecting channel is arranged in the adsorption plate, and the adsorption hole is connected to the gas joint through the channel.
[0005] Preferably, the adsorption plate is detachably connected to the top of the vertical plate through a locking piece.
[0006] Preferably, a socket is embedded in the side surface of one of the vertical plates.
[0007] Preferably, the test fixture body comprises a bottom plate, a plurality of first guide plates stacked on the bottom plate, a support column arranged on the bottom plate and penetrating the first guide plates, and a plurality of second guide plates stacked on the top of the support column.
[0008] Preferably, a groove is arranged on the surface of at least one of the first guide plates, and a filling layer for the probe to pass through is arranged in the groove.
[0009] Preferably, the filling layer comprises a sponge layer and a lycra layer stacked.
[0010] Preferably, a plurality of positioning columns for positioning the circuit board are arranged on the adsorption plate.
[0011] Preferably, the bottom plate is detachably connected to the base through a fixing piece.
[0012] From the above, the application can obtain the following beneficial effects: by setting the test fixture body on the base, the vertical plate is fixedly arranged on the base, the vertical plate surrounds the test fixture body, the adsorption plate is covered on the top of the vertical plate, the through hole is arranged on the surface of the adsorption plate for the probe of the test fixture body to pass out, the adsorption hole is arranged on the surface of the adsorption plate outside the periphery of the through hole, and the air joint is arranged on the side surface of the adsorption plate and communicated with the adsorption hole. The air joint is communicated with the negative pressure equipment, and then the circuit board is placed on the adsorption plate, and then the circuit board is adsorbed and fixed through the adsorption hole, so that the circuit board is fixed on the adsorption plate, so that the probe of the test fixture body contacts the test point on the circuit board during the test, so that the test of the circuit board can be completed without being placed on the test equipment, and the test efficiency is improved. BRIEF DESCRIPTION OF DRAWINGS
[0013] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the description of the embodiments of the present application or the prior art. Obviously, the drawings in the following description are only part of the embodiments of the present application, and for those skilled in the art, other drawings can also be obtained without creative labor.
[0014] Figure 1 is a front view of the vacuum adsorption test fixture of the embodiment of the present application;
[0015] Figure 2 is a top view of the vacuum adsorption test fixture of the embodiment of the present application;
[0016] Figure 3 is a structure diagram of the adsorption plate of the vacuum adsorption test fixture of the embodiment of the present application;
[0017] Figure 4 is a schematic diagram of the test fixture body of the embodiment of the present application. DETAILED DESCRIPTION
[0018] The technical solutions in the embodiments of the present application will be described clearly and completely in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.
[0019] EMBODIMENT
[0020] In order to solve the above technical problems, the present embodiment provides a vacuum adsorption test fixture, which comprises Figures 1-2As shown, including the base 10, set on the base 10 test fixture body 40, fixedly provided with the base 10 vertical plate 20, vertical plate 20 around the test fixture body 40, the top of the vertical plate 20 is covered with an adsorption plate 30, the surface of the adsorption plate 30 is provided with a through hole 33 for the probe of the test fixture body 40 to pass out, the surface of the adsorption plate 30 is provided with a suction hole 31 outside the periphery of the through hole 33, and the side of the adsorption plate 30 is provided with a gas joint 32 communicated with the suction hole 31. The gas joint 32 is communicated with the negative pressure equipment, and then the circuit board is placed on the adsorption plate 30, and then the circuit board is adsorbed and fixed through the suction hole 31, so that the circuit board is fixed on the adsorption plate 30, so that the probe of the test fixture body 40 contacts the test point on the circuit board during the test, so that the test of the circuit board can be completed without being placed on the test equipment, and the efficiency is improved.
[0021] Specifically, a plurality of positioning columns 36 for positioning the circuit board are arranged on the adsorption plate 30, and the circuit board is provided with corresponding positioning holes, so that when the circuit board is placed on the adsorption plate 30, the circuit board is positioned by the positioning column 36, so that the probe accurately contacts the test point on the circuit board, and then the circuit board is adsorbed and fixed through the suction hole 31, so that the circuit board does not shift during the test.
[0022] Further, as shown in Figure 3 The adsorption plate 30 is provided with longitudinal and transverse intersecting channels 35, and the suction hole 31 is communicated with the gas joint 32 through the channel 35. The gas joint 32 is communicated with the negative pressure equipment through the air pipe, so that the suction hole 31 can adsorb the circuit board, and then the circuit board is fixed on the adsorption plate 30. In some embodiments, the adsorption plate 30 is detachably connected with the top of the vertical plate 20 by a locking member. Exemplarily, the locking member can be a screw, which facilitates disassembly and maintenance.
[0023] Further, one of the vertical plates 20 is embedded with a socket 21, and the probe of the test fixture body 40 is connected with the socket 21 through a wire, so as to realize the connection with the plug of the test machine through the socket 21, thereby realizing the open circuit, short circuit and resistance test of the circuit board through the test machine.
[0024] Further, as shown in Figure 4As shown, the test fixture body 40 includes a base plate 41, a plurality of first guide plates 42 stacked on the base plate 41, a plurality of support columns 44 provided on the base plate 41 and passing through the first guide plates 42, and a plurality of second guide plates 43 stacked on the top of the support columns 44 and fixed to the support columns 44 by bolts. The base plate 41, the first guide plates 42, the second guide plates 43, and the adsorption plate 30 are all provided with hole positions for the probes to pass through, and are provided with grooves at the hole positions. The grooves reduce the contact area between the base plate 41, the first guide plates 42, the second guide plates 43, the adsorption plate 30, and the probes, thereby minimizing the wear of the probes and reducing the maintenance cost of the probes.
[0025] Further, a recess is formed in the surface of at least one of the first guide plates 42, and a filling layer 45 for the probes to pass through is arranged in the recess. For example, four first guide plates 42 are provided, and a recess is formed in the bottom surface of the middle first guide plate 42, and a filling layer 45 is arranged in the recess. The filling layer 45 includes a sponge layer and a lycra cloth layer stacked together. For example, the thickness of the filling layer 45 is 1mm, and the thickness of each of the sponge layer and the lycra cloth layer is 0.5mm. The filling layer 45 can prevent the probes from falling off, and the filling layer 45 is composed of the sponge layer and the lycra cloth layer, which can clamp the probes without causing wear to the probes. Thus, the problem of the probes falling off from the through holes of the fixture after long-term use is solved, and the stability of the fixture during use is improved.
[0026] Further, the base plate 41 is detachably connected to the base 10 by a fixing member, for example, a screw. An empty slot is formed in the base 10 below the base plate 41. The bottom end of the probe passes through the base plate 41 and is connected to the socket 21 by a connecting line, and then is connected to the plug of the test machine through the socket 21, thereby completing the test of the circuit board.
[0027] In summary, the test fixture body is arranged on the base, the vertical plate is fixedly arranged on the base and surrounds the test fixture body, the adsorption plate is arranged on the top of the vertical plate, the through hole is formed in the surface of the adsorption plate for the probes of the test fixture body to pass through, the adsorption hole is formed in the surface of the adsorption plate around the through hole, and the air joint is arranged on the side surface of the adsorption plate and communicates with the adsorption hole. The air joint communicates with the negative pressure equipment, and then the circuit board is placed on the adsorption plate and is adsorbed and fixed through the adsorption hole, so that the circuit board is fixed on the adsorption plate. Thus, the probes of the test fixture body can contact the test points on the circuit board during the test, so that the test of the circuit board can be completed without placing the circuit board on the test equipment, and the test efficiency is improved.
[0028] The above-described embodiments do not constitute a limitation on the protection scope of the technical solutions. Any modification, equivalent replacement and improvement made within the spirit and principle of the above-described embodiments should be included in the protection scope of the technical solutions.
Claims
1. A vacuum chuck test fixture, comprising: The utility model provides a test fixture, which comprises a base (10), a test fixture body (40) arranged on the base (10), and a vertical plate (20) fixed on the base (10) and surrounding the test fixture body (40), wherein a suction plate (30) is arranged on the top of the vertical plate (20), the surface of the suction plate (30) is provided with a through hole (33) for the probe of the test fixture body (40) to pass through, the surface of the suction plate (30) is provided with a suction hole (31) around the through hole (33), and a gas joint (32) is arranged on the side surface of the suction plate (30) and is communicated with the suction hole (31).
2. The vacuum suction test fixture of claim 1, wherein: The suction plate (30) is provided with longitudinal and transverse intersecting channels (35), and the suction hole (31) is communicated with the gas joint (32) through the channels (35).
3. The vacuum suction test fixture of claim 2, wherein: The suction plate (30) is detachably connected with the top of the vertical plate (20) through locking members.
4. The vacuum suction test fixture of claim 3, wherein: A socket (21) is embedded in the side surface of one of the vertical plates (20).
5. The vacuum suction test fixture of claim 1, wherein: The test fixture body (40) comprises a bottom plate (41) and a plurality of first guide plates (42) stacked on the bottom plate (41), the bottom plate (41) is provided with a support column (44) arranged in the first guide plates (42), and a plurality of second guide plates (43) are stacked on the top of the support column (44).
6. The vacuum suction test fixture of claim 5, wherein: A recess is formed in the surface of at least one of the first guide plates (42), and the recess is provided with a filling layer (45) for the probe to pass through.
7. The vacuum suction test fixture of claim 6, wherein: The filling layer (45) comprises a sponge layer and a lycra cloth layer which are stacked.
8. The vacuum suction test fixture of claim 1, wherein: A plurality of positioning columns (36) for positioning circuit boards are arranged on the suction plate (30).
9. The vacuum suction test fixture of claim 5, wherein: The bottom plate (41) is detachably connected to the base (10) through fixing members.