Current detection probe
By employing a protective layer, an insulating layer, and a probe core to encase the inner conductor in the current detection probe, an electromagnetic shielding system is formed. This solves the problems of electromagnetic leakage and external interference caused by exposed wires in traditional current detection tools, achieving high-precision current detection and stable signal transmission while meeting electromagnetic compatibility requirements.
Patent Information
- Application Number
- CN202520135008.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-20
- Publication Date
- 2026-02-17
- Estimated Expiration
- 2035-01-20
AI Technical Summary
Traditional current testing tools suffer from electromagnetic leakage due to exposed wires, making them susceptible to external interference and unable to perform accurate testing. They also fail to meet electromagnetic compatibility requirements, especially in high-frequency testing scenarios where they struggle to accurately assess the instantaneous operating performance of electronic devices.
The structure is designed with a protective layer, an insulating layer, and a probe magnetic core to enclose the inner conductor, forming a complete electromagnetic shielding system. The inner conductor senses changes in the magnetic field through the probe magnetic core, and the connected coil transmits the signal to the current clamp. The integrated signal processing circuit uses an IPEX interface and a clamp adapter to achieve a stable connection.
It effectively isolates external electromagnetic interference, ensures a stable measurement environment, improves the accuracy of measurement results, meets electromagnetic compatibility requirements, enhances the precision and sensitivity of current detection, and extends the service life of the equipment.
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Figure CN223926516U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of electromagnetic compatibility measurement technology, and more specifically to a current detection probe. Background Technology
[0002] In the research, development, production, and testing of electronic devices, accurate measurement of current magnitude and waveform is crucial for evaluating device performance, power consumption characteristics, and stability. Currently, most mainstream current sensing tools are Hall effect-based clamp-type current clamps, which measure current by clamping the circuit under test. However, this traditional method has significant drawbacks.
[0003] In practice, common testing methods require disconnecting the circuit and using wires for measurement. However, stripping the outer sheath of the wires exposes electromagnetic leakage. On one hand, this makes the test signal highly susceptible to interference from external inductors and other sources, leading to measurement errors and failing to accurately reflect the actual current of the equipment. On the other hand, the signal can radiate to adjacent circuits, interfering with the normal operation of other components and failing to meet stringent electromagnetic compatibility (EMC) requirements. If the electromagnetic shielding layer is completely grounded, traditional current probes, due to electrostatic shielding, cannot sense the magnetic field in their induction coils, hindering current waveform detection and limiting their application in specific environments. In high-frequency testing scenarios, such as testing instantaneous power consumption under a command, where the magnitude of peak current is crucial, traditional current probes are prone to inaccurate results due to external interference, while ADC sampling modules, limited by their sampling rate, cannot accurately capture peak currents. This poses a significant challenge to accurately assessing the instantaneous performance of electronic equipment. Therefore, developing new current probes to address these issues is crucial for improving the testing accuracy and reliability of electronic equipment. Utility Model Content
[0004] The purpose of this invention is to overcome the defects of the prior art and provide a current detection probe. The purpose is to solve the technical problem that traditional current clamps cannot accurately complete the detection work due to electromagnetic leakage caused by exposed wires and susceptibility to external interference.
[0005] To achieve the above objectives, the present invention adopts the following technical solution:
[0006] A current detection probe includes a current clamp and a detection cable, wherein the detection cable is electrically connected to the current clamp; the detection cable includes a protective layer, an insulating layer, a probe core, and an inner conductor, wherein the inner conductor is embedded in the probe core, the insulating layer covers the probe core, and the protective layer covers the insulating layer and the current clamp.
[0007] In one embodiment, the probe core includes a core layer and a connecting coil. The core layer is embedded in the insulating layer. One end of the connecting coil is wound around the outer surface of the core layer, and the other end passes through the insulating layer and is connected to the current clamp.
[0008] In one embodiment, the outer surface of the magnetic core layer is provided with a connecting groove, and the connecting coil is wound in the connecting groove.
[0009] In one embodiment, the connecting slot is located in the middle section of the magnetic core layer, and the current clamp is vertically connected to the middle section of the magnetic core layer through the connecting coil.
[0010] In one embodiment, the current clamp is provided with a signal processing circuit, which is electrically connected to the magnetic core layer through the connecting coil.
[0011] In one embodiment, a clamp adapter is provided at each end of the test cable. One end of the clamp adapter is clamped to the end of the test cable, and the other end is adapted to connect to the circuit under test.
[0012] In one embodiment, both ends of the inner conductor extend through the protective layer, the insulating layer, and the probe core, and pass through the clamp adapter, so that the inner conductor is electrically connected to the clamp adapter.
[0013] In one embodiment, the clamp adapter uses an IPEX interface.
[0014] In one embodiment, the protective layer, the insulating layer, and the probe core are extruded onto the surface of the inner conductor in a three-layer co-extrusion process.
[0015] In one embodiment, the protective layer is an integral structure.
[0016] The advantages of this invention compared to existing technologies are as follows: By employing a structure that integrates a protective layer, an insulating layer, and a probe magnetic core to enclose the inner conductor, with the protective layer being an integral structure that also encloses the insulating layer and current clamp, this design forms a complete electromagnetic shielding system. Unlike traditional current clamps that suffer from electromagnetic leakage due to exposed wires, this structure effectively isolates external electromagnetic interference, preventing test signals from being affected by external inductors and other interference sources, meeting electromagnetic compatibility (EMC) requirements, ensuring a stable measurement environment, and improving the accuracy of measurement results.
[0017] The above description is only an overview of the technical solution of this utility model. In order to better understand the technical means of this utility model, it can be implemented according to the contents of the specification. In order to make the above and other objects, features and advantages of this utility model more obvious and easy to understand, the following are preferred embodiments, which are described in detail below. Attached Figure Description
[0018] Figure 1This is a schematic diagram of the overall structure of a current detection probe provided by this utility model;
[0019] Figure 2 A cross-sectional schematic diagram of the detection cable of a current detection probe provided by this utility model;
[0020] Figure 3 A partial structural diagram of the detection cable of a current detection probe provided by this utility model, after removing the protective layer and the thickness of the shielding layer;
[0021] Figure 4 This is a schematic diagram of the clamp adapter for a current detection probe provided by this utility model.
[0022] Figure Labels
[0023] 1. Current clamp; 2. Detection cable; 21. Protective layer; 22. Insulation layer; 23. Probe core; 231. Core layer; 2311. Connecting slot; 232. Connecting coil; 24. Inner conductor; 3. Clamp adapter; 31. Connecting channel; 32. IPEX interface; 33. Mounting base; 4. Adapter cable. Detailed Implementation
[0024] To make the objectives, technical solutions, and advantages of this utility model clearer, the present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.
[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of the present utility model.
[0026] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.
[0027] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the scope of the invention. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.
[0028] It should also be further understood that the term "and / or" as used in this specification and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.
[0029] See Figures 1 to 4 As shown in the figure, this utility model embodiment discloses a current detection probe, including a current clamp 1 and a detection cable 2. The detection cable 2 is electrically connected to the current clamp 1. The detection cable 2 includes a protective layer 21, an insulating layer 22, a probe magnetic core 23 and an inner conductor 24. The inner conductor 24 is embedded in the probe magnetic core 23. The insulating layer 22 covers the probe magnetic core 23. The protective layer 21 covers the insulating layer 22 and the current clamp 1.
[0030] Specifically, the current clamp 1, as the core component for current detection, is electrically connected to the detection cable 2. The detection cable 2 transmits the signal, carrying the current signal detected by the current clamp 1 to subsequent analysis equipment. This allows the detected current data to be further processed and analyzed, thereby obtaining various information about the current. This connection method ensures the integrity and functionality of the entire detection system. The current clamp 1 is responsible for sensing the current, and the detection cable 2 is responsible for transmitting the signal. The two work together to achieve current detection, reducing interference and loss during signal transmission. This ensures that the detected current signal can be accurately and completely transmitted to the subsequent analysis equipment, which is helpful for accurate analysis of the current data.
[0031] The inner conductor 24 is embedded within the probe core 23. The inner conductor 24 carries the current; when the current to be measured passes through it, a magnetic field is generated. The probe core 23 focuses and amplifies this magnetic field, making the changes more pronounced for easier detection. The design of the probe core 23 surrounding the inner conductor 24 allows for more efficient sensing of magnetic field changes generated by the current within the inner conductor 24, providing a foundation for accurate detection of the current magnitude and waveform. The insulating layer 22 covers the probe core 23, serving as isolation and insulation. It isolates the probe core 23 from the external environment, preventing external factors from interfering with its magnetic field sensing, and also prevents electrical faults such as short circuits between the probe core 23 and other components. The protective layer 21 covers the insulating layer 22 and the current clamp 1, providing physical protection and electromagnetic shielding. It not only protects the internal insulating layer 22, probe core 23, and current clamp 1 from external physical damage but also blocks external electromagnetic interference, ensuring that the internal current detection process is unaffected by external electromagnetic fields and guaranteeing detection accuracy.
[0032] By efficiently sensing the magnetic field of the current in the inner conductor 24 through the probe's magnetic core 23, and by blocking external electromagnetic interference through the protective layer 21, interference from external factors on current detection is greatly reduced. Compared to traditional current detection devices, this structure can more accurately detect the current in the inner conductor 24, obtaining a purer current signal, thereby improving the accuracy of current detection. Simultaneously, the dual protection of the insulating layer 22 and the protective layer 21 makes the internal structure of the current detection probe more stable. The insulating layer 22 prevents electrical faults, while the protective layer 21 protects internal components from physical damage, extending the device's lifespan and ensuring stable operation of the current detection probe in various environments.
[0033] In one embodiment, the probe core 23 includes a core layer 231 and a connecting coil 232. The core layer 231 is embedded in the insulating layer 22. One end of the connecting coil 232 is wound around the outer surface of the core layer 231, and the other end passes through the insulating layer 22 and is connected to the current clamp 1.
[0034] Specifically, the probe core 23 consists of two parts: a core layer 231 and a connecting coil 232. The core layer 231, as the main body of the probe core 23, is embedded within the insulating layer 22. It can be understood that the core layer 231 is made of a material with high magnetic permeability to concentrate and enhance the magnetic field generated by the current in the inner conductor 24. When current flows through the inner conductor 24, a magnetic field is generated around it. The core layer 231 can effectively concentrate these magnetic fields, making the magnetic field changes more significant, thus facilitating subsequent detection and processing of the current signal.
[0035] One end of the connecting coil 232 is wound around the outer surface of the magnetic core layer 231. This winding method allows the connecting coil 232 to interact closely with the magnetic core layer 231. Because the magnetic field, concentrated and enhanced by the magnetic core layer 231, intersects with the connecting coil 232, an induced electromotive force is generated in the connecting coil 232 according to the principle of electromagnetic induction. The other end of the connecting coil 232 is connected to the current clamp 1 through an insulating layer 22. This connection method enables the transmission of the current signal induced in the magnetic core layer 231 to the current clamp 1. The insulating layer 22 provides excellent insulation protection, preventing electrical faults such as short circuits between the connecting coil 232 and the outside world, and ensuring the stability and reliability of signal transmission.
[0036] This structural design enables the current signal to travel from the inner conductor 24, through the magnetic field conversion of the core layer 231, and then to the current clamp 1 via the connecting coil 232. The advantage of this design is its ability to effectively convert the current signal into an electrical signal form suitable for detection and processing by the current clamp 1. The cooperation between the core layer 231 and the connecting coil 232 enhances the signal induction intensity and improves the sensitivity of current detection. The connection between the connecting coil 232 and the current clamp 1 provides the prerequisite for subsequent amplification, analysis, and processing of the current signal, helping to obtain more accurate current measurement results. Compared to traditional current detection structures, this design offers higher efficiency and accuracy in signal sensing and transmission.
[0037] In one embodiment, the outer surface of the magnetic core layer 231 is provided with a connecting groove 2311, and the connecting coil 232 is wound in the connecting groove 2311.
[0038] Specifically, a connecting groove 2311 is provided on the outer surface of the magnetic core layer 231, providing a specific space for the winding of the connecting coil 232. This design allows the connecting coil 232 to be precisely positioned and tightly fitted within the connecting groove 2311 during winding. Compared to directly winding the coil onto the outer surface of the magnetic core layer 231 without the connecting groove 2311, the connecting groove 2311 effectively prevents displacement and loosening of the connecting coil 232 on the surface of the magnetic core layer 231. During the use of the current detection probe, even under certain vibration or external interference, the connecting coil 232 can still remain stably within the connecting groove 2311, ensuring the reliability of the connection and thus guaranteeing the stability of the current signal transmission. Furthermore, it is understood that the depth of the connecting groove 2311 is greater than or equal to the diameter of the connecting coil 232, so that when the connecting coil 232 is wound within the connecting groove 2311, it will not protrude from the surface of the magnetic core layer 231, resulting in a more regular layout of the connecting coil 232 and achieving a more rational structural arrangement within a limited space. Compared to a haphazardly wound connecting coil 232, the connecting coil 232 wound within the connecting slot 2311 occupies less space, making the entire probe core 23 structure more compact. This compact structure not only facilitates the miniaturization design of the current detection probe but also allows for easy integration with other components, providing convenience for the optimization and application expansion of the entire current detection probe. When the current in the inner conductor 24 generates a magnetic field, which is concentrated and enhanced by the core layer 231, the connecting coil 232 can more efficiently sense changes in the magnetic field of the core layer 231. Because the connecting coil 232 is tightly wound within the connecting slot 2311, the coupling effect with the magnetic field of the core layer 231 is better. According to the principle of electromagnetic induction, this helps to generate a more stable and obvious induced electromotive force in the connecting coil 232. Furthermore, the more stable induced electromotive force is transmitted to the current clamp 1 through the connecting coil 232, which helps to improve the accuracy and sensitivity of current detection and reduce signal loss and interference during transmission.
[0039] In one embodiment, the connecting groove 2311 is located in the middle section of the magnetic core layer 231, and the current clamp 1 is vertically connected to the middle section of the magnetic core layer 231 through the connecting coil 232.
[0040] Specifically, the connecting slot 2311 is located in the middle section of the magnetic core layer 231, allowing the connecting coil 232 to be wound in a region of the magnetic core layer 231 where the magnetic field is relatively uniform and strong. When a current flows through the inner conductor 24 and generates a magnetic field, the middle section of the magnetic core layer 231 can concentrate a relatively stable and concentrated magnetic field. With the connecting coil 232 wound here, it can more efficiently sense changes in the magnetic field of the magnetic core layer 231, and according to the principle of electromagnetic induction, the generated induced electromotive force is more stable and significant. The current clamp 1 is vertically connected to the middle section of the magnetic core layer 231 via the connecting coil 232. This vertical connection helps reduce interference in the signal transmission path, allowing the current signal sensed by the connecting coil 232 to be transmitted to the current clamp 1 more directly and efficiently, thereby improving the accuracy and sensitivity of current detection. Compared to connections at other locations in the magnetic core layer 231, a vertical connection in the middle section better utilizes the magnetic field characteristics of the magnetic core layer 231, optimizing the signal sensing and transmission process. Meanwhile, by placing the connecting slot 2311 in the middle section of the magnetic core layer 231 and vertically connecting the current clamp 1 there, the stability of the entire structure is optimized from a mechanical perspective. The vertical connection method makes the force distribution between the current clamp 1 and the magnetic core layer 231 more uniform. Compared to a non-vertical connection, this structure is more stable when the current detection probe is subjected to vibration or external force, reducing the risk of connection loosening or component displacement due to uneven force. This helps ensure that the connection between the current clamp 1 and the magnetic core layer 231 remains reliable under various complex operating environments, guaranteeing the normal operation of the current detection probe and extending the service life of the equipment.
[0041] In one embodiment, the current clamp 1 is provided with a signal processing circuit, which is electrically connected to the magnetic core layer 231 through the connecting coil 232.
[0042] Specifically, a signal processing circuit is integrated within the current clamp 1, achieving integrated signal processing functionality. Traditional current detection systems may require additional independent equipment to process the acquired current signal, while this design integrates the signal processing circuit into the current clamp 1, reducing external connection components and lowering the risk of signal interference during transmission. Simultaneously, the integrated design makes the entire current detection probe structure more compact, easier to carry and use, and improves the device's practicality and application flexibility. The signal processing circuit is electrically connected to the magnetic core layer 231 via the connecting coil 232, constructing a direct and continuous signal transmission and processing path. When the current in the inner conductor 24 generates a magnetic field, the magnetic core layer 231 senses it and converts it into an electrical signal, which is then directly transmitted by the connecting coil 232 to the signal processing circuit within the current clamp 1. This tight connection avoids problems such as attenuation and distortion that may occur during long-distance transmission or when passing through multiple connection points. The signal processing circuit can amplify, filter, and shape the signal transmitted from the magnetic core layer 231 in a timely and accurate manner, ensuring higher signal quality after processing and providing a reliable data foundation for subsequent data analysis and applications.
[0043] In one embodiment, a clamp adapter 3 is provided at each end of the test cable 2. One end of the clamp adapter 3 is clamped to the end of the test cable 2, and the other end is adapted to the circuit under test.
[0044] Specifically, one end of the clamp adapter 3 is fixed to the end of the test cable 2 using a snap-fit method. Snap-fit is a mechanical connection method that uses specific slots, grooves, or clips to tightly connect the clamp adapter 3 to the test cable 2. The advantage of this connection method is its ease of operation; it allows for quick connection and separation without the need for complex tools or cumbersome installation procedures, improving the efficiency of equipment assembly and disassembly. At the same time, the snap-fit structure ensures a secure connection, preventing easy detachment or loosening during normal use, thus ensuring a stable connection between the test cable 2 and the clamp adapter 3.
[0045] The other end of the clamp adapter 3 is designed to connect to the circuit under test (DUT). This means that the interface shape, size, and electrical characteristics of the clamp adapter 3 are specifically designed for different types of DUTs to ensure seamless connection with various DUTs. This adaptability design takes into account the diversity of DUTs in practical applications. Whether it is electronic equipment of different brands and models, or circuits with different interface standards, a suitable clamp adapter 3 can be selected to connect to the test cable 2, thereby applying the current sensing probe to a wide range of testing scenarios.
[0046] In one embodiment, the two ends of the inner conductor 24 extend through the protective layer 21, the insulating layer 22, and the probe core 23 and pass through the clamp adapter 3, so that the inner conductor 24 is electrically connected to the clamp adapter 3.
[0047] Specifically, the inner conductor 24 passes through the multi-layered structure of the protective layer 21, the insulating layer 22, and the probe core 23. The main function of the protective layer 21 is to protect the internal structure from external physical damage and electromagnetic interference. The insulating layer 22 is used to isolate the inner conductor 24 from other components to prevent short circuits. The probe core 23 is used to sense the magnetic field generated by the current in the inner conductor 24 to achieve current detection. The two ends of the inner conductor 24 emerge from these layers of encasing structures and finally pass through the clamp adapter 3. This design ensures a direct electrical connection between the inner conductor 24 and the clamp adapter 3. Through this connection, when the current in the circuit under test flows into the inner conductor 24, it can be smoothly transmitted through the clamp adapter 3 to the detection cable 2 and then to the current clamp 1, realizing a complete path for the current from the circuit under test to the detection device.
[0048] The inner conductor 24 passes directly through and is electrically connected to the clamp adapter 3, providing a stable and continuous path for current transmission. It is understood that the clamp adapter 3 has a connection channel 31 for the inner conductor 24 to pass through and be fixed, as well as a fixing seat 33 for fixing the outer surface of the detection cable 2. Compared to other methods that may involve indirect or unstable connections, this direct connection greatly reduces contact resistance. A stable electrical connection ensures the integrity of the current signal during transmission, reduces the risk of signal distortion and attenuation, and ensures that the current detection probe can accurately sense the magnitude and changes of the current in the circuit under test, thereby improving measurement accuracy. Simultaneously, the protective layer 21 wraps around the portion of the inner conductor 24 that protrudes and the entire connection structure, better providing electromagnetic shielding. The inner conductor 24 generates a certain electromagnetic field when transmitting current, and external electromagnetic fields may also interfere with the current signal in the inner conductor 24. The presence of the protective layer 21 can block the leakage of the electromagnetic field of the inner conductor 24, and at the same time prevent the interference of the external electromagnetic field on the current signal of the inner conductor 24, ensuring that the current detection process is not affected by the external electromagnetic environment, thereby obtaining a purer and more accurate current detection result and meeting the electromagnetic compatibility (EMC) requirements.
[0049] In one embodiment, the clamp adapter 3 adopts an IPEX interface 32.
[0050] Specifically, in this embodiment, the clamp adapter 3 preferably adopts an IPEX interface 32. The IPEX interface 32 has extremely low insertion loss, minimizing signal attenuation during the transmission of the current signal from the circuit under test (DUT) to the current clamp 1 via the detection cable 2. Compared to other common interfaces, the IPEX interface 32 ensures a more complete and accurate transmission of the current signal to the current clamp 1, thereby improving the accuracy of current detection. Furthermore, its excellent anti-interference performance effectively resists the influence of external electromagnetic interference on the current signal. In complex electromagnetic environments, common interfaces may introduce noise into the current signal, leading to deviations in the detection results. The IPEX interface 32, with its excellent anti-interference capability, ensures signal purity, providing strong support for accurate detection of current magnitude and waveform. Simultaneously, the IPEX interface 32's small footprint allows for more flexible placement of the current detection probe on the board when connected to the DUT. In modern electronic devices, circuit board space is increasingly compact, placing stringent requirements on the space occupied by test equipment interfaces. The clamp adapter 3, which uses the IPEX interface 32, does not take up too much space on the board, making it easy to install and connect in small circuit board areas, thus improving the applicability of the current detection probe in various devices.
[0051] Understandably, the circuit under test is equipped with an adapter socket that mates with the clamp adapter 3, ensuring precise connection between the two. The compatible interface shape, size, and electrical characteristics allow the clamp adapter 3 to be securely inserted into the adapter socket. This tight and precise connection reduces contact problems caused by mismatch. During current detection, a stable connection ensures reliable transmission of the current signal from the circuit under test to the current detection probe, providing a foundation for obtaining accurate current measurement results. Compared to mismatched connections, this adapter design significantly improves connection reliability and reduces the risk of signal transmission interruption.
[0052] Furthermore, under normal operating conditions without current testing, an adapter cable 4 of suitable length can be electrically connected to the adapter socket to ensure normal circuit continuity. One end of the adapter cable 4 is connected to the current clamp 1, and the other end is connected to the adapter socket, thus filling the circuit gap when the current detection probe is not connected, allowing the current to flow in the circuit along its original path. This avoids circuit interruption caused by removing the current detection probe, which could affect the normal operation of the equipment. Maintaining circuit continuity is crucial for both continuous operation of equipment on a production line and for electronic systems requiring stable power supply, ensuring the stability and reliability of the entire system. Simultaneously, the circuit remains intact and operational when the current detection probe is not in use, enhancing the flexibility of the equipment. Users can install or remove the current detection probe for testing at any time according to actual needs without permanent circuit modifications. For equipment that needs to be used in different scenarios, the current detection probe can be connected to obtain relevant data when current testing is required, while the circuit can be maintained during daily operation via the adapter cable 4, meeting diverse usage needs and expanding the applicability of the equipment.
[0053] In one embodiment, the protective layer 21, the insulating layer 22, and the probe core 23 are extruded onto the surface of the inner conductor 24 in a three-layer co-extrusion manner.
[0054] Specifically, the three-layer co-extrusion process enables the simultaneous extrusion and coating of the protective layer 21, the insulating layer 22, and the probe core 23 onto the surface of the inner conductor 24, integrating the multi-layer structure manufacturing process, which might otherwise require multiple production steps, into a single continuous process. Compared to the traditional method of layered manufacturing followed by assembly, this significantly shortens the production cycle and improves production efficiency. It reduces manual intervention and assembly steps in the production process, minimizing product quality variations caused by human factors and facilitating large-scale, standardized production. Simultaneously, the tight bond between the insulating layer 22 and the protective layer 21 provides more reliable insulation and electromagnetic shielding performance. The insulating layer 22 effectively isolates the inner conductor 24 from the outside environment, preventing leakage and short circuits and ensuring safe operation. The protective layer 21 blocks external electromagnetic interference and prevents the electromagnetic field generated by the inner conductor 24 from leaking out, ensuring that the current detection probe can accurately detect current signals in complex electromagnetic environments, thus improving the accuracy and reliability of the detection results. The close fit and precise positional relationship between the probe core 23 and the inner conductor 24 facilitates better sensing of the magnetic field generated by the current in the inner conductor 24 by the probe core 23, improving the sensitivity and stability of magnetic field sensing. This allows the current detection probe to more accurately detect the magnitude and waveform of the current, meeting the requirements of high-precision current detection.
[0055] In one embodiment, the protective layer 21 is an integral structure.
[0056] Specifically, the integrated protective layer 21 has no seams, making it physically more robust. When the current detection probe is subjected to external physical impacts, vibrations, or tension, the integrated structure can evenly distribute stress, effectively preventing cracking and damage caused by stress concentration at seams. Compared to a spliced protective layer 21, the integrated structure significantly improves the protective layer 21's resistance to external forces, ensuring reliable protection for internal components such as the insulation layer 22, probe core 23, and inner conductor 24, maintaining the integrity of the current detection probe structure and extending the equipment's service life. When used in humid, dusty, or corrosive environments, moisture, dust, and corrosive substances are less likely to penetrate into the protective layer 21, preventing corrosion of internal sensitive components. This not only ensures that the electrical performance of the current detection probe is unaffected but also reduces equipment failures caused by environmental factors, enabling the current detection probe to adapt to a wider range of application scenarios and enhancing its applicability in harsh environments. Simultaneously, the complete integrated protective layer 21 can form a continuous, enclosed electromagnetic shielding space. When external electromagnetic interference is present, the integrated protective layer 21 can more effectively block the interfering magnetic field from entering the interior, while preventing the magnetic field generated by the current in the inner conductor 24 from leaking out. This excellent electromagnetic shielding performance ensures that the current detection probe can work normally in complex electromagnetic environments, reduces the impact of external electromagnetic interference on the detection results, improves the accuracy and stability of the detection data, and ensures that the current signal acquired by the current detection probe is true and reliable, meeting electromagnetic compatibility (EMC) requirements.
[0057] The above examples are merely illustrative of the technical content of this utility model to facilitate reader understanding, but do not imply that the implementation of this utility model is limited to these embodiments. Any technical extensions or re-creations made based on this utility model are protected by this utility model. The scope of protection of this utility model is defined by the claims.
Claims
1. A current detection probe, characterized in that, The device includes a current clamp and a detection cable, wherein the detection cable is electrically connected to the current clamp; the detection cable includes a protective layer, an insulating layer, a probe core, and an inner conductor, wherein the inner conductor is embedded in the probe core, the insulating layer covers the probe core, and the protective layer covers the insulating layer and the current clamp.
2. A current detection probe according to claim 1, characterized in that, The probe core includes a core layer and a connecting coil. The core layer is embedded in the insulating layer. One end of the connecting coil is wound around the outer surface of the core layer, and the other end passes through the insulating layer and is connected to the current clamp.
3. A current detection probe according to claim 2, characterized in that, The outer surface of the magnetic core layer is provided with a connecting groove, and the connecting coil is wound in the connecting groove.
4. A current detection probe according to claim 3, characterized in that, The connecting slot is located in the middle section of the magnetic core layer, and the current clamp is vertically connected to the middle section of the magnetic core layer through the connecting coil.
5. A current detection probe according to claim 2, characterized in that, The current clamp contains a signal processing circuit, which is electrically connected to the magnetic core layer through the connecting coil.
6. A current detection probe according to claim 1, characterized in that, The test cable has a clamp adapter at each end. One end of the clamp adapter is clamped to the end of the test cable, and the other end is adapted to the circuit under test.
7. A current detection probe according to claim 6, characterized in that, The two ends of the inner conductor extend through the protective layer, the insulating layer, and the probe core, and pass through the clamp adapter so that the inner conductor is electrically connected to the clamp adapter.
8. A current detection probe according to claim 7, characterized in that, The clamp adapter uses an IPEX interface.
9. A current detection probe according to claim 1, characterized in that, The protective layer, the insulating layer, and the probe core are extruded onto the surface of the inner conductor in a three-layer co-extrusion process.
10. A current detection probe according to claim 1, characterized in that, The protective layer is a single, integral structure.