Device for testing reliability of heterojunction solar cell

Abstract

The utility model discloses a reliability testing device for a heterojunction solar cell. The reliability testing device comprises a light attenuation box, a transmission mechanism and a temperature adjusting mechanism, a blue light testing chamber, a red light testing chamber and an ultraviolet light testing chamber are sequentially arranged in the light attenuation box, the transmission mechanism is arranged in the axial direction of the light attenuation box and penetrates through the blue light testing chamber, the red light testing chamber and the ultraviolet light testing chamber, and the temperature adjusting mechanism is arranged at the bottom of the light attenuation box. The method is used for providing temperature required in a reliability test process. According to the reliability testing device, the reliability of the heterojunction solar cell can be tested quickly and efficiently.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of solar cells, in particular to a reliability testing device for heterojunction solar cells. BACKGROUND

[0002] Heterojunction cells are a kind of high-efficiency solar cells, which are made of N-type monocrystalline silicon wafers as substrates, and are composed of different thin films and transparent conductive oxide films (TCO) deposited on the front and back surfaces of the wafers, metal current collectors (silver paste printing, silver-coated copper printing and electroplated copper metallization), etc. Due to its high conversion efficiency, low energy consumption in low-temperature process, good stability, double-sided power generation and other advantages, it has a good development prospect in the component end. Reliability testing is an important indicator for evaluating the long-term performance and reliability of solar modules under light conditions. The traditional reliability testing method for solar cell modules generally places the solar cell modules to be tested in an outdoor environment and tests them under natural outdoor conditions. Although this method is closer to actual use, it has uncertainties and complexities, and the time period is relatively long, especially the LID test in autumn and winter season needs 2-3 months, which seriously delays the research and development progress.

[0003] Therefore, it is necessary to provide a heterojunction solar cell reliability testing device that can quickly and efficiently test the reliability of heterojunction solar cells. CONTENT OF THE INVENTION

[0004] The purpose of the present application is to solve the above problems and provide a heterojunction solar cell reliability testing device. The reliability testing device can quickly and efficiently test the reliability of heterojunction solar cells.

[0005] In order to solve the above technical problems, the technical solution adopted by the present application is as follows:

[0006] A reliability testing device for heterojunction solar cells, comprising a light decay box, a transmission mechanism and a temperature adjusting mechanism; the light decay box is provided with a blue light test chamber, a red light test chamber and an ultraviolet light test chamber arranged in sequence; the transmission mechanism is arranged along the axial direction of the light decay box and passes through the blue light test chamber, the red light test chamber and the ultraviolet light test chamber respectively; the temperature adjusting mechanism is arranged at the bottom of the light decay box and is used to provide the required temperature during the reliability testing process.

[0007] Optionally, the light attenuation box is provided with a test light source, the test light source is arranged on the top of the light attenuation box, and light emitted by the test light source is projected on the transmission mechanism; the test light source comprises a blue light source arranged in the blue light test chamber, a red light source arranged in the red light test chamber, and an ultraviolet light source arranged in the ultraviolet light test chamber; the irradiance of the blue light source is set to 60±2 kW·h / m2; the irradiance of the red light source is set to 40±2 kW·h / m2; and the irradiance of the ultraviolet light source is set to 70±2 kW·h / m2.

[0008] Optionally, the temperature adjusting mechanism is arranged below the transmission mechanism, and is used for adjusting the temperature in the blue light test chamber to 60-80℃, adjusting the temperature in the red light test chamber to 200-215℃, and adjusting the temperature in the ultraviolet light test chamber to 60-70℃; the temperature adjusting mechanism comprises heat exchange pipes arranged along the transmission direction of the transmission mechanism, and a first fan group, a second fan group and a third fan group arranged correspondingly with the blue light test chamber, the red light test chamber and the ultraviolet light test chamber.

[0009] Optionally, the first fan group comprises a first air inlet fan for conveying heated air into the blue light test chamber and a first air outlet fan for discharging the heated air in the blue light test chamber; the second fan group comprises a second air inlet fan for conveying heated air into the red light test chamber and a second air outlet fan for discharging the heated air in the red light test chamber; and the third fan group comprises a third air inlet fan for conveying heated air into the ultraviolet light test chamber and a third air outlet fan for discharging the heated air in the ultraviolet light test chamber.

[0010] Optionally, the transmission mechanism comprises a conveying belt, a driving roller and a driven roller, the conveying belt is arranged through the blue light test chamber, the red light test chamber and the ultraviolet light test chamber, the conveying belt is arranged around the driving roller and the driven roller, and the driving roller is an electric roller.

[0011] Optionally, the transmission mechanism drives the battery piece to stay in the blue light test chamber, the red light test chamber and the ultraviolet light test chamber for 20-30 min, 110-120 s and 60±1 min respectively.

[0012] Optionally, the bottom of the light attenuation box is provided with a transmission opening through which the transmission mechanism passes, so that the transmission mechanism transmits the battery piece; and a light shielding plate is arranged on the transmission opening and connected to the transmission opening through a movable connecting piece.

[0013] Optionally, the movable connecting piece is a rotating connecting piece, and the light barrier is connected to the transmission port through the rotating connecting piece.

[0014] Optionally, the light attenuation box comprises a housing provided with a containing space, and two partitions are provided in parallel in the containing space, and the partitions divide the containing space into the blue light test chamber, the red light test chamber and the ultraviolet light test chamber; the transmission port is arranged on the partition and the side plate parallel to the partition of the housing.

[0015] Optionally, the inner walls of the blue light test chamber, the red light test chamber and the ultraviolet light test chamber are coated with a light-absorbing coating.

[0016] The application has at least the following beneficial effects:

[0017] The reliability test device of the heterojunction solar cell provided by the application simulates the influence of different light environments on the heterojunction solar cell through the three chambers, fully covers the outdoor use environment of the heterojunction solar cell, and can intensify the environment in each test chamber and accelerate the generation of structural defects of the heterojunction solar cell by adjusting the test conditions of each chamber during the test, thereby shortening the traditional reliability test time, reducing the research and development cost, evaluating the battery reliability decay characteristics in a short time, ensuring the consistency, reliability and stability of product quality, quickly feeding back information in research and development, assisting in screening excellent design schemes, accelerating the research and development process, providing a basis for optimizing the process and accelerating the technical research and development progress. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 Fig. 1 is a structural schematic diagram of the reliability test device of the heterojunction solar cell of the application.

[0019] Figure 2 Fig. 4 is a comparison curve diagram of the reliability test of the reliability test device of the application and the reliability test in the prior art.

[0020] Wherein, 1- light decay box, 11- blue light test chamber, 12- red light test chamber, 13- ultraviolet light test chamber, 14- transmission port, 15- light barrier, 16- movable connecting piece, 17- shell, 18- partition, 19- light absorption coating, 2- transmission mechanism, 21- conveyor belt, 22- driving roller, 23- driven roller, 3- temperature adjusting mechanism, 31- heat exchange pipe, 32- first fan group, 321- first air inlet fan, 322- first air outlet fan, 33- second fan group, 331- second air inlet fan, 332- second air outlet fan, 34- third fan group, 341- third air inlet fan, 342- third air outlet fan, 41- blue light source, 42- red light source, 43- ultraviolet light source. DETAILED DESCRIPTION

[0021] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the accompanying drawings. The preferred embodiments of the present application are shown in the drawings. However, the present application can be realized in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided so that the disclosure of the present application can be more thoroughly and completely understood.

[0022] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0023] In the present application, the description such as "first", "second" and the like is only for the purpose of description and should not be understood as indicating or implying the relative importance of the technical features indicated or implying the number of technical features indicated.

[0024] In the description of the present application, the indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, which is only for the purpose of describing the present application and simplifying the description, and is not intended to indicate or imply that the indicated device or element must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. It should be noted that in the present application, the direction top refers to the direction away from the mounting plane of the rapid evaluation device, and the direction bottom refers to the direction close to the mounting plane of the rapid evaluation device.

[0025] Embodiment:

[0026] The present application provides a reliability test device for heterojunction solar cells, referring to Figure 1As shown, it comprises a light decay box 1, a transmission mechanism 2 and a temperature adjusting mechanism 3; the light decay box 1 is internally provided with a blue light test chamber 11, a red light test chamber 12 and an ultraviolet light test chamber 13 arranged in sequence, the transmission mechanism 2 is arranged along the axial direction of the light decay box 1 and respectively passes through the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13, so as to transmit the battery piece to the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13 respectively; the temperature adjusting mechanism 3 is arranged at the bottom of the light decay box 1 and is used to provide the temperature required in the reliability test process. As an option, the reliability test device in the present application can be applied to the incoming inspection of heterojunction solar cells and the rapid evaluation test of the reliability of the finished products of heterojunction solar cells.

[0027] The reliability test device of the heterojunction solar cell in the present application simulates the influence of different light environments on the heterojunction solar cell through the arrangement of three chambers, fully covers the outdoor use environment of the heterojunction solar cell, and can intensify the environment in each test chamber and accelerate the generation of structural defects of the heterojunction solar cell by adjusting the test conditions of each chamber during the test, thereby shortening the traditional reliability test time, reducing the research and development cost, evaluating the battery reliability attenuation characteristics in a short time, ensuring the consistency, reliability and stability of product quality, quickly feeding back information in research and development, helping to screen excellent design schemes, accelerating the research and development process and providing a basis for optimizing the process to speed up the technical research and development progress. The present application comprises a blue light test chamber 11, a red light test chamber 12 and a violet light test chamber arranged in sequence, three test chambers are arranged in sequence, which conforms to the natural light spectrum distribution law and has good spectral continuity, can be closer to the natural light condition, better simulate the actual use environment, provide a more realistic test environment, and can also observe the aging process of the material under different wavelengths of light step by step, which is helpful to find the attenuation characteristics of the heterojunction solar cell at different stages. The present application sets a transmission mechanism 2 corresponding to the light decay box 1, uses the transmission mechanism 2 to realize the automatic transmission of the heterojunction solar cell piece to be tested, avoids the pollution or damage of the battery piece caused by manual operation during the transmission process, and thus ensures the accuracy of the reliability test result and improves the test efficiency. The temperature adjusting mechanism 3 in the present application is arranged at the bottom of the light decay box 1, which can adjust the temperature in the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13 while avoiding the heat accumulation at the bottom of each test chamber.

[0028] The light attenuation box 1 is provided with a test light source for providing light required in the reliability test process; the test light source is arranged on the top of the light attenuation box 1, and the light emitted by the test light source is projected on the transmission mechanism 2; the test light source comprises a blue light source 41 arranged in the blue light test chamber 11, a red light source 42 arranged in the red light test chamber 12, and an ultraviolet light source 43 arranged in the ultraviolet light test chamber 13; the irradiance of the blue light source 41 is set to 60±2kW·h / m2; the irradiance of the red light source 42 is set to 40±2kW·h / m2; and the irradiance of the ultraviolet light source 43 is set to 70±2kW·h / m2. The blue light source 41, the red light source 42 and the ultraviolet light source 43 can adopt LED light sources.

[0029] The temperature adjusting mechanism 3 is arranged below the transmission mechanism 2, and is used for adjusting the temperature in the blue light test chamber to 60-80℃, adjusting the temperature in the red light test chamber to 200-215℃, and adjusting the temperature in the ultraviolet light test chamber 13 to 60-70℃; in some embodiments, the temperature adjusting mechanism 3 comprises heat exchange pipes 31 arranged along the transmission direction of the transmission mechanism 2, and first, second and third fan groups 32, 33 and 34 respectively corresponding to the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13.

[0030] The first fan group 32 comprises a first air inlet fan 321 for conveying heated air into the blue light test chamber 11 and a first air outlet fan 322 for discharging the heated air in the blue light test chamber 11; the second fan group 33 comprises a second air inlet fan 331 for conveying heated air into the red light test chamber 12 and a second air outlet fan 332 for discharging the heated air in the red light test chamber 12; the third fan group 33 comprises a third air inlet fan 341 for conveying heated air into the ultraviolet light test chamber 13 and a third air outlet fan 342 for discharging the heated air in the ultraviolet light test chamber 13. The heat exchange pipe 31 is connected with a heat exchange medium circulating mechanism, the heat exchange pipe 31 comprises an inlet and an outlet, and the inlet and the outlet are respectively connected to the circulating mechanism. The heat exchange medium circulating in the heat exchange pipe 31 comprises water. In this application, the specific number of the first air inlet fan 321, the second air inlet fan 331, the third air inlet fan 341, the first air outlet fan 322, the second air outlet fan 332 and the third air outlet fan 342 is not limited, and the specific selection can be made according to the actual needs during use; as long as the temperature in the blue light test chamber can be adjusted to 60-80℃, the temperature in the red light test chamber can be adjusted to 200-215℃, and the temperature in the ultraviolet light test chamber 13 can be adjusted to 60-70℃. It can be understood that in other embodiments, the heat exchange pipe 31 adopts a split structure, and the heat exchange pipe 31 comprises a first heat exchange pipe, a second heat exchange pipe and a third heat exchange pipe which are respectively arranged corresponding to the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13. Through the respective arrangement of the first heat exchange pipe, the second heat exchange pipe and the third heat exchange pipe, the temperature in the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13 is respectively controlled, and the accuracy of temperature control and the flexibility of operation in each test chamber are improved.

[0031] The transmission mechanism 2 comprises a conveying belt 21, a driving roller 22 and a driven roller 23, the conveying belt 21 is arranged through the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13 respectively, the conveying belt 21 is wound around the driving roller 22 and the driven roller 23, and the driving roller 22 is an electric roller. During use, the driving roller 22 drives the conveying belt 21 and the driven roller 23 to rotate, thereby realizing the transmission of the battery piece. The transmission direction of the transmission mechanism 2 is from the blue light test chamber 11 to the ultraviolet light test chamber 13; the transmission mechanism 2 drives the battery piece to pass through the blue light test chamber 11, the red light test chamber 12 and the ultraviolet light test chamber 13 in turn for light decay test under different irradiation conditions.

[0032] The transmission mechanism 2 causes the battery cell to stay in the blue light test chamber 11, the red light test chamber 12, and the ultraviolet light test chamber 13 for 20-30 min, 110-120 s, and 60±1 min, respectively.

[0033] The bottom of the light decay chamber 1 has a transmission port 14 through which the transmission mechanism 2 passes, enabling the transmission mechanism 2 to transmit the battery cells. A light-blocking plate 15 is provided on the transmission port 14, and the light-blocking plate 15 is mounted on the transmission port 14 via a movable connector 16. The light-blocking plate 15 allows the transmission mechanism 2 to smoothly transmit the battery cells under test between the various test chambers while preventing light leakage between adjacent test chambers and thus avoiding mutual interference. This improves the sealing of the blue light test chamber 11, the red light test chamber 12, and the ultraviolet light test chamber 13, and enhances the utilization rate of the test light source.

[0034] Specifically, in some embodiments, the movable connector 16 is a rotating connector, and the light-blocking plate 15 is connected to the transmission port 14 through the rotating connector. The rotating connector is located at the top of the transmission port 14, and the light-blocking plate 15 rotates around the rotating connector during use. Alternatively, in some embodiments, the movable connector 16 is a lifting drive, and the light-blocking plate 15 is connected to the transmission port 14 through the lifting drive. The light-blocking plate 15 moves up and down in a direction perpendicular to the transmission direction of the transmission mechanism 2 under the drive of the lifting drive.

[0035] The light decay chamber 1 includes a housing 17 with an accommodating space, and two partitions 18 spaced apart and parallel to each other within the accommodating space. The partitions 18 divide the accommodating space into a blue light testing chamber 11, a red light testing chamber 12, and an ultraviolet light testing chamber 13. Transmission ports 14 are respectively located on the partitions 18 and on the side plates of the housing 17 parallel to the partitions 18. The blue light testing chamber 11, the red light testing chamber 12, and the ultraviolet light testing chamber 13 are sequentially connected, improving the transmission efficiency of the heterojunction solar cell and enhancing the overall integration of the device. It is understood that the transmission ports 14 on the partitions 18 and the side plates of the housing 17 are aligned with each other to allow the heterojunction solar cell to transmit light smoothly between the blue light testing chamber 11, the red light testing chamber 12, and the ultraviolet light testing chamber 13.

[0036] The inner walls of the blue light testing chamber 11, the red light testing chamber 12, and the ultraviolet light testing chamber 13 are all coated with a light-absorbing coating 19. The light-absorbing coating 19 reduces the reflection and scattering of light within these chambers, ensuring that the light emitted by the test light source is projected onto the battery cell under test. This improves the accuracy of the test while avoiding interference from external light.

[0037] When performing reliability testing on a heterojunction solar cell using the reliability testing apparatus described in this application, the steps include:

[0038] S1. Select 100 mainstream battery cells for the test battery and test the initial IV.

[0039] S2. The battery cell that has completed the initial IV test is placed into the reliability testing device described in this application, and the battery cell is driven by the transmission mechanism 2 to pass through the blue light test chamber, the red light test chamber and the ultraviolet light test chamber in sequence.

[0040] Specifically, during the testing process: the temperature inside the blue light testing chamber is 60℃-80℃, the irradiance is set to 60kW·h / m2, and the tested solar cell stays in the blue light testing chamber for 20-30 minutes. This area is mainly for LID & LeTID reliability simulation. The principle is that the specific wavelength range of blue light can simulate the condition of the solar cell similar to that under actual sunlight. Here, LID is an abbreviation for Light Induced Degradation, and LeTID is an abbreviation for Light and Elevated Temperature Induced Degradation.

[0041] The temperature of the red light test chamber is 200-215℃, and the irradiance is set to 40kW·h / m2. Red light with a wavelength of 620nm-750nm is superimposed on the red light under high temperature conditions for 110-120s. In actual LID phenomena, defects inside the battery are gradually activated under illumination, becoming recombination centers for charge carriers, leading to a decrease in battery performance, similar to the effect of the red light region. Secondly, high-performance solar cells can repair the attenuation of LID caused by blue light region with specific wavelengths of red light. The principle is to use the specific wavelength and energy of red light to excite charge carriers in the battery, causing changes in the defect states inside the battery. The electron-hole pairs generated by red light excitation can fill defect states or change the energy level structure of defects, reducing charge carrier recombination centers, thereby restoring battery performance to a certain extent and improving its photoelectric conversion efficiency and reliability. However, it is worth noting that if there are defects inside the battery, these excited charge carriers are prone to recombine at the defect sites. As the illumination time increases, recombination at the defect sites continues to accumulate, leading to a shortened charge carrier lifetime, affecting the charge collection efficiency of the battery, and thus reducing the photoelectric conversion efficiency. The ultraviolet light test chamber is set at a temperature of 60℃-70℃, an irradiance of 70kW·h / m2, and an illumination time of 60min. This area is mainly used for simulating UVT ID reliability testing. UVT ID is mainly due to the sensitivity of semiconductor materials to ultraviolet light. After ultraviolet light is absorbed by the material, it excites electron-hole pairs, leading to the activation of silicon crystal defects, changes in the structure of amorphous silicon materials, and the generation of more interface states at the interface, affecting the carrier transport and recombination efficiency. UVT ID is an abbreviation for UV-induced surface passivation degradation.

[0042] S3. After the battery cell has been tested by the reliability testing device of this application, the initial IV test data and the retest IV test data are compared to obtain the efficiency degradation rate value of the battery cell, so as to determine the reliability of the battery cell.

[0043] The reliability of the reliability test data obtained using the heterojunction solar cell reliability testing device provided in this application is verified by comparing it with existing reliability data obtained from outdoor environment reliability tests. See also Figure 2 As shown, Figure 2 In the diagram, curve S1 is the test curve of the cell degradation rate measured using the testing device of this application, and curve S2 is the test curve of the cell degradation rate measured using a prior art testing method. The difference refers to the difference between curve S1 and curve S2. Figure 2It can be seen that the degradation rate curve of the solar cell obtained by the reliability testing device provided in this application shows a similar trend to the degradation rate curve of the solar cell obtained by the testing scheme of the prior art. This indicates that the reliability testing device of this application can quickly test the reliability of the solar cell and has reliability, and can be applied to the reliability testing of heterojunction solar cells.

[0044] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0045] The above embodiments merely illustrate preferred implementations of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the scope of protection of this patent application should be determined by the appended claims.

Claims

1. A reliability test apparatus for a heterojunction solar cell, characterized by: It includes a light attenuation box, a transmission mechanism and a temperature adjusting mechanism; the light attenuation box is internally provided with a blue light test chamber, a red light test chamber and an ultraviolet light test chamber arranged in sequence, the transmission mechanism is arranged along the axial direction of the light attenuation box and respectively passes through the blue light test chamber, the red light test chamber and the ultraviolet light test chamber, and the temperature adjusting mechanism is arranged at the bottom of the light attenuation box and used for providing the temperature required in the reliability test process.

2. The reliability test device of claim 1, wherein: The light attenuation box is internally provided with a test light source, the test light source is arranged at the top of the light attenuation box, and light emitted by the test light source is projected on the transmission mechanism; the test light source comprises a blue light source arranged in the blue light test chamber, a red light source arranged in the red light test chamber and an ultraviolet light source arranged in the ultraviolet light test chamber; the irradiance of the blue light source is set to 60±2 kW·h / m 2 ; the irradiance of the red light source is set to 40±2 kW·h / m 2 ; and the irradiance of the ultraviolet light source is set to 70±2 kW·h / m 2 .

3. The reliability test apparatus of claim 1, wherein: The temperature adjusting mechanism is arranged below the transmission mechanism, and is used for adjusting the temperature in the blue light test chamber to 60-80 DEG C, adjusting the temperature in the red light test chamber to 200-215 DEG C and adjusting the temperature in the ultraviolet light test chamber to 60-70 DEG C; the temperature adjusting mechanism comprises heat exchange pipes arranged along the transmission direction of the transmission mechanism, and a first fan group, a second fan group and a third fan group arranged correspondingly with the blue light test chamber, the red light test chamber and the ultraviolet light test chamber.

4. The reliability test device of claim 3, wherein: The first fan group comprises a first air inlet fan used for conveying heated air into the blue light test chamber and a first air outlet fan used for discharging the heated air in the blue light test chamber; the second fan group comprises a second air inlet fan used for conveying heated air into the red light test chamber and a second air outlet fan used for discharging the heated air in the red light test chamber; and the third fan group comprises a third air inlet fan used for conveying heated air into the ultraviolet light test chamber and a third air outlet fan used for discharging the heated air in the ultraviolet light test chamber.

5. The reliability test apparatus of claim 1, wherein: The transmission mechanism comprises a conveying belt, a driving roller and a driven roller, the conveying belt is arranged through the blue light test chamber, the red light test chamber and the ultraviolet light test chamber, the conveying belt is arranged around the driving roller and the driven roller, and the driving roller is an electric roller.

6. The reliability test apparatus of claim 1, wherein: The transmission mechanism drives the battery piece to stay in the blue light test chamber, the red light test chamber and the ultraviolet light test chamber for 20-30 min, 110-120 s and 60+ / -1 min respectively.

7. The reliability test apparatus of claim 1, wherein: The bottom of the light attenuation box is provided with a transmission opening through which the transmission mechanism passes, so that the transmission mechanism can convey the battery piece; and a light shielding plate is arranged on the transmission opening and connected to the transmission opening through a movable connecting piece.

8. The reliability test device of claim 7, wherein: The movable connecting piece is a rotary connecting piece, the light shielding plate is connected to the transmission opening through the rotary connecting piece, the rotary connecting piece is arranged at the top of the transmission opening, and the light shielding plate rotates around the rotary connecting piece during use.

9. The reliability test apparatus of claim 7, wherein: The light attenuation box comprises a shell provided with a containing space and two partitions arranged in the containing space in parallel, the partitions divide the containing space into the blue light test chamber, the red light test chamber and the ultraviolet light test chamber; and the transmission opening is arranged on the partition and a side plate parallel to the partition of the shell.

10. The reliability test device of claim 1, wherein: The inner walls of the blue light test chamber, the red light test chamber and the ultraviolet light test chamber are all coated with a light absorbing coating.

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