Chip test board based on integrated circuit chip test
By designing a chip testing stage with movable columns and spring structures, the problem of traditional chip testing stages being unable to adapt to different thicknesses was solved, achieving stable chip fixation and angle adjustment, and improving testing efficiency.
Patent Information
- Application Number
- CN202520463773.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-16
- Publication Date
- 2026-02-27
- Estimated Expiration
- 2035-03-16
AI Technical Summary
Traditional chip testing stations cannot accommodate integrated circuit chips of different thicknesses, resulting in cost losses during testing, and the chips are prone to shaking during the testing process.
A chip testing stage was designed, which uses a movable column and spring structure to achieve rapid chip clamping and angle adjustment to accommodate chips of different thicknesses. Friction is used to limit the rotation of the placement stage to ensure that the chip does not shake during testing.
It enables adaptive testing of chips of different thicknesses, avoids cost losses, and ensures that the chips are stably fixed during the testing process, thereby improving testing efficiency.
Smart Images
Figure CN223955655U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to chip test technical field more specifically, the utility model relates to chip test platform for integrated circuit chip test based on. BACKGROUND
[0002] Integrated chip integrates numerous electronic components, and can realize various complex circuit functions, such as microprocessor, memory, calculator, etc.The functions are the basis for modern electronic equipment to realize various intelligentization and automation operation, however, chip testing is an important link in the production process of integrated circuit, through testing, problems in the production process can be found in time, so as to optimize production process and improve production efficiency.
[0003] In the process of traditional integrated circuit chip testing, the chip needs to be fixed, so that the testing is more convenient, however, due to the different signals of integrated circuit chips, the thicknesses of integrated circuit chips are different, so when testing thicker chips, the general test table can only meet the testing of chips of specific thickness, however, when testing special chips, certain cost loss will be caused, so the goldfish integrated circuit chip test platform needs to be improved and optimized. UTILITY MODEL CONTENT
[0004] In order to overcome the defects of the prior art, the utility model provides a chip test platform for integrated circuit chip test based on, which has the advantages of rapid compression of chips, convenient testing of chips, no shaking of chips and adaptation to chip testing of different thicknesses.
[0005] In order to achieve the above object, the utility model provides the following technical scheme: a chip test platform for integrated circuit chip test based on, including test table, the upper part of test table is fixedly connected with support plate, the front part of support plate is fixedly connected with connecting plate, the inside of connecting plate is movably connected with movable column, the lower part of connecting plate is fixedly connected with spring, the upper part of movable column is hingedly connected with driving block, the lower part of movable column is fixedly connected with limit plate, the lower part of connecting plate is fixedly connected with telescopic link, the surface of telescopic link is movably connected with the inside of limit plate, the lower part of limit plate is provided with adjusting structure, the lower part of adjusting structure is provided with compression structure.
[0006] As a preferred technical scheme of the utility model: the upper part of test table is rotatably connected with rotating shaft, the upper part of rotating shaft is fixedly connected with placing table, the inside of test table is movably connected with first limit column, the upper part of first limit column is fixedly connected with extrusion disc, the lower part of extrusion disc and the upper part of test table are fixedly connected with first spring.
[0007] As a preferred technical scheme of the utility model: the adjusting structure includes the fixed connection in the fixed plate lower surface screw rod, the screw rod surface is connected with the internal thread knob, the internal thread knob surface rotation is connected with the connecting barrel.
[0008] As a preferred technical scheme of the utility model: the connecting barrel left and right parts all are fixedly connected with the fixed ear, the fixed ear upper portion and telescopic rod lower portion fixed connection.
[0009] As a preferred technical scheme of the utility model: the compression structure includes the fixed connection in the connecting barrel lower surface middle plate, the middle plate inside swing joint has the second limit column, the second limit column lower portion fixedly connected with the lower plate, the lower plate and middle plate between fixedly connected with the second spring.
[0010] As a preferred technical scheme of the utility model: the connecting plate left and right parts all are fixedly connected with the fixed strip, the fixed strip inside all are fixedly connected with the illuminating lamp.
[0011] As a preferred technical scheme of the utility model: the test platform upper surface fixed installation has the direct current power supply, the test platform lower surface fixedly connected with the support leg.
[0012] Compared with the prior art, the utility model has the advantages that:
[0013] 1, the utility model discloses a ninety degrees rotation drive block to drive movable column to be located in the inside lifting of connecting plate, however due to the spring of drive block in perpendicular state has the elastic potential energy of stretching, and limit plate can be adjusted in height, and due to the shape design of limit plate, make the compression structure has two kinds of state of compression and loosening, and drive compression structure to descend by rotating internal thread knob, the device can realize the quick compression of chip, when the chip is tested, the chip does not shake, and can adapt to the chip test of different thickness.
[0014] 2, the utility model discloses the rotation of the test platform upper portion by manual rotation placing table to drive shaft, however when loosening compression structure, integrated circuit chip can switch angle along with the rotation of placing table, when not exerting external force to placing table, due to the elastic potential energy of first spring, extruding disc is pushed up, so that the lower portion of placing table and the upper portion of extruding disc produce friction, however, the first limit column limits the extruding disc, the device uses friction to prevent the rotation of placing table, when exerting external force, due to the external force greater than friction, so that the chip test angle can be changed, to meet the demand of chip test. BRIEF DESCRIPTION OF DRAWINGS
[0015] Figure 1 For the utility model structure schematic diagram;
[0016] Figure 2 It is the schematic diagram of the extrusion disc structure of the utility model;
[0017] Figure 3 It is the schematic diagram of the section structure of the connecting plate of the utility model;
[0018] Figure 4 It is the schematic diagram of the compression structure of the utility model;
[0019] Figure 5 It is the section view of the adjusting structure of the utility model.
[0020] In the figure: 1, test bench; 2, support plate; 3, connecting plate; 4, movable column; 5, spring; 6, drive block; 7, limiting plate; 8, telescopic rod; 9, rotating shaft; 10, placing table; 11, first limiting column; 12, extrusion disc; 13, first spring; 14, threaded rod; 15, internal thread knob; 16, connecting barrel; 17, fixed lug; 18, middle plate; 19, second limiting column; 20, lower plate; 21, second spring; 22, fixed strip; 23, illuminating lamp; 24, DC power supply; 25, supporting leg. DETAILED DESCRIPTION
[0021] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.
[0022] As Figures 1 to 5 shown, the utility model provides a chip test bench based on integrated circuit chip test, including test bench 1, the upper portion fixed connection of test bench 1 has support plate 2, the front fixed connection of support plate 2 has connecting plate 3, the inside movable connection of connecting plate 3 has movable column 4, the lower portion fixed connection of connecting plate 3 has spring 5, the upper portion of movable column 4 is hinged and has drive block 6, the lower portion fixed connection of movable column 4 has limiting plate 7, the lower portion fixed connection of connecting plate 3 has telescopic rod 8, the surface of telescopic rod 8 is movably connected with the inside of limiting plate 7, the lower portion of limiting plate 7 is provided with adjusting structure, the lower portion of adjusting structure is provided with compression structure.
[0023] When the staff places the integrated circuit chip on the upper surface of the placement table 10, the driving block 6 is pried forward, and because the spring 5 is in the initial state of tension and because of the shape design of the driving block 6, the driving block 6 drives the movable column 4 to be at different heights on the upper part of the connecting plate 3 when it is in the vertical state and the horizontal state, thereby driving the height of the adjusting structure and the compression structure arranged below the limiting plate 7, and adjusting the adjusting structure to make the compression structure compress and fix the chip.
[0024] The upper part of the test table 1 is rotationally connected with a rotating shaft 9, the upper part of the rotating shaft 9 is fixedly connected with a placement table 10, the inside of the test table 1 is movably connected with a first limiting column 11, the upper part of the first limiting column 11 is fixedly connected with a pressing disc 12, and the lower part of the pressing disc 12 is fixedly connected with the upper part of the test table 1.
[0025] When the staff places the chip on the upper surface of the placement table 10, because the chip needs to be tested, different pins need to be tested, and therefore the placement table 10 needs to be rotated, but because the placement table 10 is not subjected to external force, the first spring 13 has elastic potential, so that the pressing disc 12 can produce friction with the lower part of the placement table 10, thereby limiting the rotation of the placement table 10, when the angle of the chip needs to be adjusted, the driving block 6 is pried upward, thereby rotating the placement table 10 to drive the rotating shaft 9 to rotate on the upper part of the test table 1, that is, the angle can be changed.
[0026] The adjusting structure comprises a threaded rod 14 fixedly connected to the lower surface of the limiting plate 7, an internally threaded knob 15 screw-connected to the surface of the threaded rod 14, and a connecting barrel 16 rotationally connected to the surface of the internally threaded knob 15.
[0027] By rotating the internally threaded knob 15, because the internally threaded knob 15 is screw-connected with the threaded rod 14, the internally threaded knob 15 is driven to ascend and descend along the surface of the threaded rod 14, thereby driving the connecting barrel 16 to ascend and descend.
[0028] The left and right parts of the connecting barrel 16 are fixedly connected with fixed ears 17, and the upper parts of the fixed ears 17 are fixedly connected with the lower part of the telescopic rod 8.
[0029] By the cooperation of the fixed ears 17 and the telescopic rod 8, when the connecting barrel 16 ascends and descends, because the connecting barrel 16 is rotationally connected to the surface of the internally threaded knob 15, the connecting barrel 16 cannot rotate, thereby satisfying that the compression structure can accurately compress the chip.
[0030] The compression structure comprises a middle plate 18 fixedly connected to the lower surface of the connecting barrel 16, a second limiting column 19 movably connected to the inside of the middle plate 18, a lower plate 20 fixedly connected to the lower part of the second limiting column 19, and a second spring 21 fixedly connected between the lower plate 20 and the middle plate 18.
[0031] Lift by the second limit post 19, when the lower surface of the lower plate 20 is in contact with the upper surface of the chip, and because the driving block 6 is still in the rotating state, at this time the second spring 21 is compressed, and the second limit post 19 limits the movement of the lower plate 20, and then the elastic potential energy of the second spring 21 is used to realize the compression of the integrated circuit chip.
[0032] Wherein, the left and right parts of the connecting plate 3 are fixedly connected with the fixed strips 22, and the inner sides of the fixed strips 22 are fixedly connected with the illuminating lamps 23.
[0033] The fixed strips 22 provide point positions for the installation of the illuminating lamps 23, and the illuminating lamps 23 are powered to illuminate the chip during testing.
[0034] Wherein, the upper surface of the test table 1 is fixedly installed with the direct current power supply 24, and the lower surface of the test table 1 is fixedly connected with the supporting legs 25.
[0035] The direct current power supply 24 provides electric energy for chip testing, and the supporting legs 25 provide supporting force for the test table 1.
[0036] The working principle and use process of the utility model are as follows:
[0037] When the staff places the integrated circuit chip on the upper surface of the placing table 10, the driving block 6 is moved forward, the initial state of the spring 5 is in the stretched state, and because of the shape design of the driving block 6, the driving block 6 drives the movable column 4 to be located at different heights on the upper part of the connecting plate 3 when being in the vertical state and the horizontal state, thereby driving the height of the adjusting structure and the compression structure arranged below the limiting plate 7, and the compression structure is adjusted to compress and fix the chip.
[0038] When the staff places the chip on the upper surface of the placing table 10, the chip needs to be tested, and different pins need to be tested, so the placing table 10 needs to be rotated, and when no external force is applied to the placing table 10, the first spring 13 has elastic potential energy, so that the pressing disc 12 can rub with the lower part of the placing table 10, thereby limiting the rotation of the placing table 10, when the angle of the chip needs to be adjusted, the driving block 6 is moved upward, thereby rotating the placing table 10 to drive the rotating shaft 9 to rotate on the upper part of the test table 1, so that the angle can be changed.
[0039] By rotating the inner threaded knob 15, the inner threaded knob 15 is driven to ascend and descend along the surface of the threaded rod 14 due to the threaded connection between the inner threaded knob 15 and the threaded rod 14, thereby driving the connecting barrel 16 to ascend and descend.
[0040] Through the cooperation of the fixed ear 17 and the telescopic rod 8, when the connecting barrel 16 is lifted, the connecting barrel 16 is not rotated due to the rotation of the surface of the inner threaded knob 15, so that the pressing structure can accurately press the chip.
[0041] Through the lifting of the second limiting column 19, when the lower surface of the lower plate 20 is in contact with the upper surface of the chip, and since the driving block 6 is still in a rotating state, the second spring 21 is compressed at this time, and the second limiting column 19 limits the movement of the lower plate 20, thereby realizing the compression of the integrated circuit chip by using the elastic potential energy of the second spring 21.
[0042] The fixed strip 22 provides a point for the installation of the illuminating lamp 23, and the illumination of the chip during testing is realized due to the power supply of the illuminating lamp 23.
[0043] The direct current power supply 24 provides power for chip testing, for example, a multimeter, and the supporting leg 25 provides support for the test table 1.
[0044] It should be noted that in this document, the relationship terms such as first and second are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Moreover, the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or equipment including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or equipment.
[0045] Although the embodiments of the present application have been shown and described, it can be understood by those skilled in the art that various changes, modifications, replacements and variations can be made to the embodiments without departing from the principles and spirits of the present application, and the scope of the present application is defined by the appended claims and their equivalents.
Claims
1. A chip test stand for integrated circuit chip testing, comprising a test stand (1), characterized in that: The upper part of the test platform (1) is fixedly connected to a support plate (2), the front part of the support plate (2) is fixedly connected to a connecting plate (3), the interior of the connecting plate (3) is movably connected to a movable column (4), the lower part of the connecting plate (3) is fixedly connected to a spring (5), the upper part of the movable column (4) is hinged to a drive block (6), the lower part of the movable column (4) is fixedly connected to a limit plate (7), the lower part of the connecting plate (3) is fixedly connected to a telescopic rod (8), the surface of the telescopic rod (8) is movably connected to the interior of the limit plate (7), the lower part of the limit plate (7) is provided with an adjustment structure, and the lower part of the adjustment structure is provided with a pressing structure.
2. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: The upper part of the test platform (1) is rotatably connected to a rotating shaft (9), and the upper part of the rotating shaft (9) is fixedly connected to a placement platform (10). The interior of the test platform (1) is movably connected to a first limiting post (11), and the upper part of the first limiting post (11) is fixedly connected to a pressing plate (12). The lower part of the pressing plate (12) and the upper part of the test platform (1) are fixedly connected to a first spring (13).
3. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: The adjustment structure includes a threaded rod (14) fixedly connected to the lower surface of the limiting plate (7), and an internal threaded knob (15) is threadedly connected to the surface of the threaded rod (14), and a connecting cylinder (16) is rotatably connected to the surface of the internal threaded knob (15).
4. The chip test bench for integrated circuit chip testing according to claim 3, characterized in that: The left and right sides of the connecting tube (16) are fixedly connected with fixing ears (17), and the upper part of the fixing ears (17) is fixedly connected to the lower part of the telescopic rod (8).
5. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: The clamping structure includes a middle plate (18) fixedly connected to the lower surface of the connecting cylinder (16), a second limiting post (19) is movably connected inside the middle plate (18), a lower plate (20) is fixedly connected to the lower part of the second limiting post (19), and a second spring (21) is fixedly connected between the lower plate (20) and the middle plate (18).
6. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: The left and right sides of the connecting plate (3) are fixedly connected with fixing strips (22), and the inner side of the fixing strips (22) is fixedly connected with lighting lamps (23).
7. The chip test bench for integrated circuit chip testing according to claim 1, characterized in that: A DC power supply (24) is fixedly installed on the upper surface of the test platform (1), and a support leg (25) is fixedly connected to the lower surface of the test platform (1).