Immersed liquid cooling capacitor testing device and testing equipment
By designing an immersion liquid-cooled capacitor testing device, the problem of lack of testing for capacitors in a liquid-cooled environment was solved, realizing a reliable performance evaluation and cost-effective testing method.
Patent Information
- Application Number
- CN202423323339.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2026-03-03
- Estimated Expiration
- 2034-12-31
AI Technical Summary
Existing technologies lack operational testing for capacitors in liquid-cooled environments. Traditional methods cannot simulate real-world application environments and are costly, making it impossible to effectively evaluate the performance of capacitors in liquid-cooled systems.
An immersion liquid-cooled capacitor testing device was designed, including a housing, a test board, a heater, and a controller. The controller communicates with the heater and the test board to achieve temperature regulation and performance testing of the capacitor in a liquid-cooled environment.
It provides reliable capacitor liquid-cooled environment testing, shortens testing time, reduces costs, and enables the evaluation of capacitor performance in simulated real-world application environments.
Smart Images
Figure CN223966647U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of equipment testing technology, and in particular to an immersion liquid-cooled capacitor testing device and testing equipment. Background Technology
[0002] Immersion liquid cooling technology is one of the main technical approaches to solving the high power density and low PUE requirements of data centers. In addition to liquid cooling equipment and liquid cooling servers, dedicated components for immersion liquid cooling are an important factor in ensuring the stable and reliable operation of the entire liquid cooling system.
[0003] Capacitors are a key component of servers, and current capacitors are developed for air-cooled environments, lacking application verification in liquid-cooled environments. Liquid-cooled equipment manufacturers primarily use two methods to verify capacitors: one is to immerse the capacitor directly in a container filled with refrigerant for testing; the other is to place a server containing the capacitor into the liquid-cooled system enclosure for operational testing. The first method cannot simulate the actual temperature and voltage environment of capacitor applications, only evaluating changes in capacitance and appearance before and after the test, providing an incomplete evaluation of the capacitor's performance and failing to assess its ability to function normally during its service life. The second method requires immersing the entire server in refrigerant, which is unsuitable for the early stages of liquid-cooled server development (i.e., during the component selection and verification phase, before any existing servers are available). Directly immersing air-cooled servers in refrigerant for testing is costly, could render the entire server unusable in case of failure, and prevents the application of accelerated aging methods, requiring a lengthy testing period. Utility Model Content
[0004] The main objective of this invention is to provide an immersion liquid-cooled capacitor testing device and equipment, aiming to solve the technical problem of the lack of a testing environment for capacitors operating in a liquid-cooled environment in the prior art.
[0005] To achieve the above objectives, this utility model provides an immersion liquid-cooled capacitor testing device, which includes: a housing, a test plate, a heater, and a controller;
[0006] The enclosure contains coolant.
[0007] The heater is located at the bottom of the chamber and is used to regulate the internal temperature of the chamber.
[0008] The test board is located inside the enclosure and is used to fix the capacitor to be tested inside the enclosure.
[0009] The controller is located on the side wall of the enclosure; and the controller is communicatively connected to the test board and the heater. The controller outputs a temperature adjustment signal to the heater to control the heater to adjust the temperature.
[0010] The controller is also used to output a test waveform signal to the test board when the temperature inside the box is adjusted to the target temperature, so as to test the performance parameters of the capacitor under test.
[0011] Optionally, the test board includes: a connector socket and at least one capacitance test channel;
[0012] Each of the capacitor test channels is provided with two sets of test bases of the same package type, and each of the test bases includes two capacitor bases of the same type.
[0013] The controller is electrically connected to the test board via a first cable, and the controller is electrically connected to the heater via a second cable;
[0014] The capacitor to be tested is fixed on the capacitor base by a capacitor clamp. The pin of the capacitor base is electrically connected to the connector socket through the test board. The connector socket is electrically connected to the controller.
[0015] Optionally, the controller includes: an MCU unit, a power supply test circuit, and a capacitor charge / discharge test circuit with the same number of capacitor test channels;
[0016] The first end of the MCU unit is connected to the power supply test circuit, and the power supply test circuit is connected to the capacitor under test on the test board through the first cable. The second end of the MCU unit is connected to each of the capacitor charge and discharge test circuits, and the capacitor charge and discharge test circuits are connected to the corresponding capacitor test channels on the test board through the first cable.
[0017] Optionally, the power supply test circuit includes: a DC-DC converter and a first load;
[0018] The input terminal of the DC-DC converter is connected to an external power supply. The input terminal of the DC-DC converter is also connected to the capacitor under test in each of the capacitor test channels at a first voltage amplitude. The output terminal of the DC-DC converter is connected to the first load. The output terminal of the DC-DC converter is also connected to the capacitor under test in each of the capacitor test channels at a second voltage amplitude.
[0019] The DC-DC converter is used to convert an input electrical signal with a first voltage amplitude from an external power supply into a second voltage amplitude.
[0020] Optionally, each of the capacitor charge / discharge test circuits includes: a digital-to-analog converter, a signal amplifier, and a second load;
[0021] The input terminal of the digital-to-analog converter is connected to the output terminal of the MCU unit, the output terminal of the digital-to-analog converter is connected to the input terminal of the signal amplifier, and the output terminal of the signal amplifier is connected to the second load and the corresponding capacitance test channel.
[0022] Optionally, the controller includes: a cable interface, a power switch, a power interface, a keyboard, and a display screen;
[0023] The first cable and the second cable are connected to the MCU unit through the cable interface. The controller is connected to an external power supply through the power interface. The power switch is used to connect the power supply circuit between the external power supply and the controller.
[0024] Both the keyboard and the display screen are electrically connected to the MCU unit.
[0025] Optionally, the immersion liquid-cooled capacitor testing device further includes: a sealed top cover;
[0026] The sealing cover is located on the top of the box body;
[0027] The connection between the sealing cover and the box body is provided with a sealing strip and a buckle;
[0028] Two gland head through holes are also provided on the side wall of the housing where the controller is installed;
[0029] The first cable and the second cable pass through the housing via the gland connector.
[0030] Optionally, the immersion liquid-cooled capacitor testing device further includes: a temperature sensor and a fan wall;
[0031] The temperature sensor is mounted on the test board and electrically connected to the controller;
[0032] The fan wall is installed on the side wall of the housing and is electrically connected to the controller;
[0033] The temperature sensor is used to collect real-time temperature information inside the box and transmit the real-time temperature information to the controller.
[0034] Optionally, the immersion liquid-cooled capacitor testing device further includes: a mounting frame;
[0035] The mounting bracket is located at the bottom of the housing, and the test plate is vertically inserted into the mounting bracket to be fixed inside the housing.
[0036] Furthermore, to achieve the above objectives, this utility model also provides a testing device, which includes: the immersion liquid-cooled capacitor testing device as described above. This utility model provides an immersion liquid-cooled capacitor testing device and testing equipment. The immersion liquid-cooled capacitor testing device includes: a housing, a test plate, a heater, and a controller; the housing contains coolant; the heater is located at the bottom of the housing for regulating the internal temperature of the housing; the test plate is located inside the housing for fixing the capacitor to be tested inside the housing; the controller is located on the side wall of the housing; and the controller is communicatively connected to the test plate and the heater, outputting a temperature regulation signal to the heater to control the heater to regulate the temperature; the controller is also used to output a test waveform signal to the test plate when the internal temperature of the housing is adjusted to the target temperature, so as to test the performance parameters of the capacitor to be tested. By building a dedicated testing device to conduct application tests on capacitors in a liquid-cooled environment, the test results are more reliable. Attached Figure Description
[0037] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.
[0038] Figure 1 This is a schematic diagram of the structure of the first embodiment of the immersion liquid-cooled capacitor testing device of this utility model;
[0039] Figure 2 This is a schematic diagram of the surge protection unit in the first embodiment of the immersion liquid-cooled capacitor testing device of this utility model;
[0040] Figure 3 This is a schematic diagram of the structure of an embodiment of the immersion liquid-cooled capacitor testing device of this utility model;
[0041] Figure 4 This is a schematic diagram of the controller structure in one embodiment of the immersion liquid-cooled capacitor testing device of this utility model;
[0042] Figure 5 This is a circuit connection diagram of the controller in one embodiment of the immersion liquid-cooled capacitor testing device of this utility model;
[0043] Figure 6 This is a circuit connection diagram of the power supply test circuit in one embodiment of the immersion liquid-cooled capacitor test device of this utility model;
[0044] Figure 7 This is a circuit connection diagram of the capacitor charge and discharge test circuit in one embodiment of the immersion liquid-cooled capacitor testing device of this utility model.
[0045] Explanation of reference numerals in the attached diagram: 10, enclosure; 20, test board; 30, heater; 40, controller; 50, fan wall; 60, sealed top cover; 70, mounting bracket; 80, temperature sensor; 101, first cable; 102, second cable; 201, connector socket; 202, capacitance test channel; 401, MCU unit; 402, cable interface; 403, power switch; 404, power interface; 405, keyboard; 406, display screen; L1, first load; L2, second load; A1, signal amplifier.
[0046] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation
[0047] It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.
[0048] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0049] It should be noted that all directional indicators (such as up, down, left, right, front, back, etc.) in this utility model embodiment are only used to explain the relative positional relationship and movement of each component in a certain specific posture (as shown in the figure). If the specific posture changes, the directional indicator will also change accordingly.
[0050] Furthermore, the use of terms such as "first" and "second" in this utility model is for descriptive purposes only and should not be construed as indicating or implying their relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. Additionally, the technical solutions of the various embodiments can be combined with each other, but only on the basis of being achievable by those skilled in the art. When the combination of technical solutions is contradictory or impossible to implement, such a combination of technical solutions should be considered non-existent and not within the scope of protection claimed by this utility model.
[0051] Reference Figure 1 , Figure 1This is a schematic diagram of one embodiment of the immersion liquid-cooled capacitor testing device of this utility model. This utility model proposes a first embodiment of the immersion liquid-cooled capacitor testing device.
[0052] In this embodiment, the immersion liquid-cooled capacitor testing device includes: a housing 10, a test plate 20, a heater 30, and a controller 40. The heater 30 is disposed at the bottom of the housing, the controller 40 is disposed on the side wall of the housing, and the test plate 20 is disposed inside the housing. The controller 40 is electrically connected to the test plate 20 via a first cable 101, and the controller 40 is electrically connected to the heater 30 via a second cable 102.
[0053] It should be noted that the heater 30 can adjust the internal temperature of the enclosure, and the test board can fix the capacitor to be tested inside the enclosure. The controller 40 can output a temperature adjustment signal to the heater 30 to control the heater 30 to adjust the temperature; when the temperature inside the enclosure 10 is adjusted to the target temperature, a test waveform signal is output to the test board 20 to test the performance parameters of the capacitor to be tested. By building a dedicated test device to conduct application tests on the capacitor in a liquid-cooled environment, the test results are more reliable, and the test time can be accelerated by temperature control.
[0054] It should be understood that the housing 10 can be used to hold the target refrigerant, i.e., the working fluid used to transfer heat and produce a freezing effect. The test plate can be equipped with various capacitor clamps to fix the capacitors under test inside the housing. The capacitor clamps can be configured according to the type of capacitor, for example, they can be used for dual in-line package (DIP) electrolytic capacitors, 0402 surface mount capacitors, 0603 surface mount capacitors, 0805 surface mount capacitors, and 7343 surface mount capacitors. By setting up various different capacitor clamps, different types of capacitors can be matched, expanding the application scenarios of capacitor testing.
[0055] It should be understood that the controller 40 can be used to output a temperature adjustment signal to the heater 30, and the heater 30 can control the temperature of the target refrigerant according to the temperature adjustment signal, thereby adjusting the temperature inside the chamber. The controller 40 can also be used to output a test waveform signal to the test board 20 when the temperature inside the chamber is adjusted to the target temperature, so as to test the performance parameters of the capacitor under test.
[0056] It should be noted that the controller can be an electronic device with data storage and processing capabilities, capable of executing preset software functions and generating corresponding output electrical signals (including the aforementioned temperature regulation signal and test waveform signal) through pre-stored software. For example, a microcontroller unit (MCU) can be used.
[0057] It should be understood that testing the performance parameters of the capacitor under test may include capacitance, dissipation factor (DF), which is generally expressed as the loss tangent tanδ, equivalent series resistance (ESR), and physical dimensions. Aging tests for capacitors mainly include withstand voltage tests, high and low temperature tests, and isothermal tests, with isothermal tests including both room temperature and high temperature tests.
[0058] This embodiment proposes an immersion liquid-cooled capacitor testing device, which includes: a housing, a test plate, a heater, and a controller. The housing holds the target refrigerant. The test plate is equipped with various capacitor clamps, and the capacitor to be tested is fixed inside the refrigerant housing by the corresponding capacitor clamp. The immersion liquid-cooled capacitor testing device further includes: a heater located at the bottom of the refrigerant housing, a fan wall located on the side wall of the refrigerant housing, and a controller located on the other side wall of the refrigerant housing. The controller is electrically connected to the test plate via a first cable and to the heater via a second cable. The controller outputs a temperature adjustment signal to the heater and the fan wall for temperature regulation. The controller also outputs a test waveform signal to the test plate to test the performance parameters of the capacitor to be tested. By building a dedicated testing device for application testing in a liquid-cooled capacitor environment, the test results are more reliable, and the testing time can be accelerated by temperature control.
[0059] Reference Figure 2 , Figure 2 This is a schematic diagram of the surge protection unit in one embodiment of the immersion liquid-cooled capacitor testing device of this utility model. Based on the first embodiment of the immersion liquid-cooled capacitor testing device described above, a second embodiment of the immersion liquid-cooled capacitor testing device of this utility model is proposed.
[0060] To enable rapid control of high and low temperatures during temperature cycling tests, i.e., heating via a heater, the immersion liquid-cooled capacitor testing device in this embodiment is further equipped with a fan wall 50 for rapid cooling. The fan wall 50 is disposed on the side wall of the housing 10 and electrically connected to the controller 40. The controller 40 can also output a temperature regulation signal to the fan wall 50 to drive the fan wall.50 The wind force is determined to rapidly cool the enclosure 10. Simultaneously, the immersion liquid-cooled capacitor testing device is also equipped with a temperature sensor 80, which is mounted on the test plate 20 and electrically connected to the controller 40. The temperature sensor 80 can collect real-time temperature information inside the enclosure 10 and transmit this information to the controller 40.
[0061] Furthermore, the immersion liquid-cooled capacitor testing device also includes: a sealing top cover 60; the sealing top cover 60 is disposed on the top of the enclosure 10; a sealing strip and a buckle are provided at the connection between the sealing top cover 60 and the enclosure 10 to ensure the airtightness of the enclosure. Two gland connectors are also provided on the side wall of the enclosure where the controller 40 is installed. The first cable 101 and the second cable 102 pass through the enclosure through the two gland connectors respectively, and the gland connectors ensure the airtightness of the enclosure after the cables pass through.
[0062] Furthermore, the immersion liquid-cooled capacitor testing device may also include: a fixing frame 70; the fixing frame 70 is disposed at the bottom of the housing 10, and the test plate 20 is vertically inserted into the fixing frame 70 and fixed inside the housing.
[0063] In this embodiment, a fan wall 50 is electrically connected to the controller 40 on the side wall of the enclosure 10, thereby rapidly cooling the enclosure 10. A sealed top cover is provided at the connection point with the enclosure, equipped with a sealing strip and clips to ensure the airtightness of the enclosure's interior. A mounting bracket at the bottom of the enclosure allows the test board to be vertically inserted and secured inside the enclosure. This reduces the cost of the testing equipment and makes the test results more reliable.
[0064] Reference Figure 3 , Figure 3 This is a schematic diagram of one embodiment of the immersion liquid-cooled capacitor testing device of this utility model. Based on the above-described embodiment of the immersion liquid-cooled capacitor testing device, a third embodiment of the immersion liquid-cooled capacitor testing device of this utility model is proposed.
[0065] In this embodiment, the test board includes a connector socket 201 and at least one capacitor test channel 202. Each capacitor test channel 202 is provided with two sets of test bases of the same package type (a set of capacitor aging bases A and a set of capacitor aging bases B), and each test base includes two capacitor bases of the same type. The capacitor to be tested is fixed on the capacitor base by the capacitor clamp. The pins of the capacitor base are electrically connected to the connector socket 201 through the internal wiring of the test board. The connector socket 201 is electrically connected to the controller through the first cable 101. Therefore, up to four capacitors of the same type can be tested simultaneously for comparison and verification. For example, five capacitor test channels can be provided, namely channels for DIP capacitors, 0402 surface mount capacitors, 0603 surface mount capacitors, 0805 surface mount capacitors, and 7343 surface mount capacitors.
[0066] Furthermore, referring to Figure 4 and Figure 5 , Figure 4 This is a schematic diagram of the controller structure in the third embodiment of the immersion liquid-cooled capacitor testing device of this utility model; Figure 5 This is a circuit connection diagram of the controller in the third embodiment of the immersion liquid-cooled capacitor testing device of this utility model. The controller 40 may include: an MCU unit 401, a power supply test circuit C1, and a capacitor charge / discharge test circuit C2 with the same number of capacitor test channels. The first terminal of the MCU unit 401 is connected to the power supply test circuit, which is connected to the capacitor under test on the test board via a first cable. The second terminal of the MCU unit is connected to each of the capacitor charge / discharge test circuits, which are connected to the corresponding capacitor test channels on the test board via the first cables. For example, when there are 5 capacitor test channels, the controller will have 5 corresponding capacitor charge / discharge test circuits.
[0067] It should be understood that the controller 40 includes: a cable interface 402, a power switch 403, a power interface 404, a keyboard 405, and a display screen 406; the first cable and the second cable are connected to the MCU unit through the cable interface, and the controller is connected to an external power supply through the power interface. The power switch is used to connect the power supply circuit between the external power supply and the controller when turned on; the keyboard and the display screen are both electrically connected to the MCU unit. The keyboard can be linked with the display screen to set the test voltage, test waveform, and temperature for the aging test. The display screen also displays the real-time temperature. The MCU unit can obtain the real-time temperature information from the temperature sensor in the test chamber and send it to the display screen for display. Simultaneously, the controller can set the temperature based on the real-time temperature information from the temperature sensor and control the heater to ensure that the temperature of the refrigerant in the chamber reaches the set temperature, with a fluctuation range not exceeding ±2℃.
[0068] Furthermore, referring to Figure 6 , Figure 6 This is a circuit diagram of the power supply test circuit in the third embodiment of the immersion liquid-cooled capacitor testing device of this utility model. The power supply test circuit includes: a DC-DC converter (DCDC) and a first load L1; the input terminal of the DC-DC converter is connected to an external power supply, and the input terminal of the DC-DC converter is also connected to the capacitor under test in each of the capacitor test channels at a first voltage amplitude; the output terminal of the DC-DC converter is connected to the first load, and the output terminal of the DC-DC converter is also connected to the capacitor under test in each of the capacitor test channels at a second voltage amplitude; the DC-DC converter is used to convert the input electrical signal of the first voltage amplitude from the external power supply into a second voltage amplitude. For example, assuming that the first channel CH1 and the second channel CH2 in the five capacitor test channels have the same first voltage amplitude, and the third to fifth channels (CH3 to CH5) have the same second voltage amplitude, the capacitors of the first and second channels can be connected in parallel to the input terminal of the DC-DC converter (i.e., the input capacitor shown in the figure), and the capacitors of the third to fifth channels can be connected in parallel to the output terminal of the DC-DC converter (i.e., the output capacitor shown in the figure). During testing, the power supply test circuit only requires an external power supply to operate, and the power supply circuit test can be controlled to be turned on and off via a power switch.
[0069] Furthermore, referring to Figure 7 , Figure 7This is a circuit connection diagram of the capacitor charge / discharge test circuit in one embodiment of the immersion liquid-cooled capacitor testing device of this utility model. Each capacitor charge / discharge test circuit includes: a digital-to-analog converter (DAC), a signal amplifier A1, and a second load L2; the input terminal of the DAC is connected to the output terminal of the MCU unit, the output terminal of the DAC is connected to the input terminal of the signal amplifier, and the output terminal of the signal amplifier is simultaneously connected to the second load and the corresponding capacitor test channel. Figure 7 As shown, the digital-to-analog converter (DAC), signal amplifier A1, and second load L2 share a common potential at one end, while the potential at the other end changes accordingly, which is considered as signal input and output transmission.
[0070] It should be noted that the digital-to-analog converter can be used to convert the digital signal output by the MCU unit into an analog signal, transmit the analog signal to the signal amplifier for waveform amplification, and then transmit the processed signal to the corresponding capacitor test channel. The capacitor charge / discharge test circuit starts working when the MCU is powered on, charging the connected capacitor. When the power is turned off, the connected capacitor discharges through the load. The charging and discharging of the capacitor can be achieved by controlling the waveform of the power supply.
[0071] It should be understood that the capacitor aging test process may include:
[0072] Step S1: First, perform a high-temperature constant-temperature test. Record the capacitor's CAP, DF, ESR, and external dimensions. Then, begin the test by controlling the heater to raise the temperature. Set the high-temperature constant-temperature test temperature to the capacitor's rated maximum temperature, which is 105℃. Turn on the power switch, and the capacitor connected to the power supply test circuit will begin operating. Pre-set the power signal from the MCU unit to the capacitor charge / discharge test circuit, setting the waveform and frequency. The capacitor charge / discharge test circuit will then begin operating. The continuous high-temperature aging test lasts for 1000 hours. After the test, remove the capacitor test board and record the tested capacitor's CAP, DF, ESR, and external dimensions.
[0073] Step S2: Then perform the temperature cycling test. Record the capacitor's CAP, DF, ESR, and external dimensions before starting the test. The high temperature of the temperature cycling test is controlled at a maximum of 105℃, and the low temperature is controlled at room temperature, i.e., 25℃. Temperature control is achieved by the MCU unit controlling the heater; heating is achieved by controlling the heater, and cooling is achieved by controlling the fan wall.
[0074] It should be noted that the temperature will fluctuate between high and low temperatures during the temperature cycling test. For example, the temperature will be high for 1 hour, then low for another hour, and then high again. This cycle lasts for 2 hours. The continuous temperature cycling aging test lasts for 1000 hours. After the test, the capacitor test board will be removed, and the capacitor's CAP, DF, ESR, and external dimensions will be recorded.
[0075] Step S3: Capacitor aging performance evaluation consists of two parts: pre-aging test and post-aging test. The main tests include the capacitor's CAP, DF, ESR, and external dimensions. Multiple capacitors of the same model participate in each aging test. After the test, the test parameters are compared, including before-and-after comparisons and comparisons of test results for capacitors of the same model. The criteria for determining whether a capacitor is qualified after the aging test are as follows: CAP change ≤ ±20% of the initial value after testing; DF ≤ 1.5 times the specified value after testing; ESR ≤ 2 times the specified value after testing; no appearance defects; additionally, the difference in test results for capacitors of the same model should be ≤ ±3%. If these conditions are met, the capacitor is deemed to meet the requirements for immersion liquid cooling.
[0076] In this embodiment, the test board includes: a connector socket and at least one capacitor test channel; each capacitor test channel is provided with two sets of test bases of the same package type, and each test base includes two capacitor bases of the same type; the controller includes: an MCU unit, a power supply test circuit, and a capacitor charge / discharge test circuit with the same number as the capacitor test channels; the first end of the MCU unit is connected to the power supply test circuit, the power supply test circuit is connected to the capacitor to be tested on the test board through the first cable, the second end of the MCU unit is connected to each of the capacitor charge / discharge test circuits, and the capacitor charge / discharge test circuits are connected to the corresponding capacitor test channels on the test board through the first cable, thereby realizing high-temperature accelerated aging test with less testing time and lower testing cost.
[0077] Furthermore, this embodiment of the invention also proposes a testing device. The testing device includes the immersion liquid-cooled capacitor testing apparatus as described above.
[0078] Since the testing equipment adopts all the technical solutions of all the above embodiments, it has at least all the beneficial effects brought about by the technical solutions of the above embodiments, which will not be repeated here.
[0079] The above description is only a preferred embodiment of the present utility model and does not limit the patent scope of the present utility model. All equivalent structural transformations made under the inventive concept of the present utility model using the contents of the present utility model specification and drawings, or direct / indirect applications in other related technical fields, are included within the patent protection scope of the present utility model.
Claims
1. An immersed liquid-cooled electric double-layer capacitor test device, characterized by, The immersion liquid cooling capacitor testing device comprises a box body, a testing plate, a heater and a controller; The box body is internally provided with cooling liquid; The heater is arranged at the bottom of the box body and used for adjusting the temperature inside the box body; The testing plate is arranged inside the box body and used for fixing the capacitor to be tested inside the box body; The controller is arranged on the side wall of the box body and in communication connection with the testing plate and the heater, and outputs a temperature adjusting signal to the heater to control the heater to adjust the temperature; The controller is further used for outputting a testing waveform signal to the testing plate to test the performance parameters of the capacitor to be tested when the temperature inside the box body is adjusted to a target temperature.
2. The submerged liquid-cooled electric capacity test device of claim 1, wherein, The testing plate comprises a connector socket and at least one capacitor testing channel; Each capacitor testing channel is provided with two groups of testing bases of the same packaging type, and each testing base comprises two capacitor bases of the same type; The controller is electrically connected with the testing plate through a first cable and electrically connected with the heater through a second cable; The capacitor to be tested is fixed on the capacitor base through a capacitor clamp, the PIN pins of the capacitor base are electrically connected with the connector socket through the testing plate, and the connector socket is electrically connected with the controller.
3. The submerged liquid-cooled electrical capacitance test device of claim 2, wherein, The controller comprises an MCU unit, a power supply testing circuit and capacitor charge-discharge testing circuits same in number with the capacitor testing channels; A first end of the MCU unit is connected with the power supply testing circuit, the power supply testing circuit is connected with the capacitor to be tested on the testing plate through the first cable, a second end of the MCU unit is connected with each capacitor charge-discharge testing circuit, and the capacitor charge-discharge testing circuit is connected with the corresponding capacitor testing channel on the testing plate through the first cable.
4. The submerged liquid-cooled electrical capacitance test device of claim 3, wherein, The power supply testing circuit comprises a direct current converter and a first load; An input end of the direct current converter is connected with an external power supply, the input end of the direct current converter is also connected with the capacitor to be tested at a first voltage amplitude in each capacitor testing channel, an output end of the direct current converter is connected with the first load, and the output end of the direct current converter is also connected with the capacitor to be tested at a second voltage amplitude in each capacitor testing channel; The direct current converter is used for converting an input electrical signal of the first voltage amplitude of the external power supply into the second voltage amplitude.
5. The submerged liquid-cooled electrical capacitance test device of claim 3, wherein, Each capacitor charge-discharge testing circuit comprises a digital-to-analog converter, a signal amplifier and a second load; An input end of the digital-to-analog converter is connected with an output end of the MCU unit, an output end of the digital-to-analog converter is connected with an input end of the signal amplifier, and an output end of the signal amplifier is connected with the second load and the corresponding capacitor testing channel.
6. The submerged liquid-cooled electrical capacitance test device of claim 3, wherein, The controller comprises a cable interface, a power supply switch, a power supply interface, a keyboard and a display screen; The first cable and the second cable are connected to the MCU unit through the cable interface, the controller is connected with an external power supply through the power interface, and the power switch is used to connect the external power supply with a power supply circuit of the controller; The keyboard and the display screen are electrically connected with the MCU unit.
7. The submerged liquid-cooled electrical capacitance test device of claim 2, wherein, The immersion liquid cooling capacitor testing device further comprises a sealing upper cover. The sealing upper cover is arranged on the top of the box body. A sealing strip and a buckle are arranged at the connection between the sealing upper cover and the box body. Two Luer holes are further arranged on the side wall of the box body where the controller is arranged. The first cable and the second cable pass through the box body through the Luer holes.
8. The submerged liquid-cooled electrical capacitance test device of claim 1, wherein, The immersion liquid cooling capacitor testing device further comprises a temperature sensor and a fan wall. The temperature sensor is arranged on the testing board and electrically connected with the controller. The fan wall is arranged on the side wall of the box body and electrically connected with the controller. The temperature sensor is used to collect real-time temperature information of the inside of the box body and transmit the real-time temperature information to the controller.
9. The submerged liquid-cooled electrical capacitance test device of claim 1, wherein, The immersion liquid cooling capacitor testing device further comprises a fixing frame. The fixing frame is arranged on the bottom of the box body, and the testing board is vertically inserted into the fixing frame to be fixed in the inside of the box body.
10. A test apparatus, characterized by, The testing equipment comprises the immersion liquid cooling capacitor testing device according to any one of claims 1-9.