Pulse insulation and voltage resistance testing device based on pulse waveform width

Abstract

The utility model discloses a pulse insulation and voltage resistance testing device based on pulse waveform width. The pulse insulation and voltage resistance testing device comprises a pulse generator, a tested object, a voltage differential circuit, a high-speed AD conversion circuit and a pulse storage judgment circuit. A pulse signal output by the pulse generator is collected by the voltage differential circuit, is converted into a digital signal by the high-speed AD conversion circuit, and is transmitted to the pulse storage and judgment circuit for waveform analysis. And the microcontroller calculates the maximum value and the waveform width of the pulse waveform according to a preset algorithm, and compares the maximum value and the waveform width with a standard waveform so as to judge whether the detected product is broken down or not. Different from a traditional current-dependent judgment method, weak insulation breakdown can be accurately identified by measuring the width of the pulse waveform, and the influence of capacitive or inductive load on a judgment result is avoided. The device has the advantages of high precision, high efficiency and strong stability, can be widely applied to pulse insulation and voltage resistance tests of electrical equipment, and provides reliable electrical safety guarantee.

Description

Technical Field

[0001] This utility model belongs to the field of pulse insulation withstand voltage testing technology, specifically relating to a pulse insulation withstand voltage testing device based on pulse waveform width. Background Technology

[0002] In existing electromagnetic compatibility testing, many products need to be tested for pulse insulation withstand voltage. However, during testing, in addition to the obvious arcing and breakdown that can be seen with the naked eye, there are often many breakdown phenomena that cannot be seen with the naked eye. In this case, it is often determined whether there is a breakdown by collecting pulse current. The presence of pulse current indicates a breakdown, and the absence of pulse current indicates no breakdown. This method of judgment has great limitations and is prone to misjudgment. When the load has a certain degree of capacitive or inductive properties, it has a great impact on the judgment results of this method. Utility Model Content

[0003] The purpose of this invention is to overcome the defects of the prior art and provide a pulse insulation withstand voltage test device based on pulse waveform width.

[0004] The objective of this utility model can be achieved through the following technical solutions:

[0005] This invention provides a pulse insulation withstand voltage test device based on pulse waveform width, including a pulse generator, a test object, a voltage differential circuit, a high-speed AD conversion circuit, and a pulse storage and judgment circuit. The output terminal of the pulse generator is connected to the test object, the input terminals of the voltage differential circuit are connected to the positive and negative terminals of the output terminal of the pulse generator respectively, the output terminal of the voltage differential circuit is connected to the input terminal of the high-speed AD conversion circuit, the output terminal of the high-speed AD conversion circuit is connected to the input terminal of the pulse storage and judgment circuit, and the pulse storage and judgment circuit outputs the pulse insulation withstand voltage test judgment result.

[0006] Furthermore, the voltage differential circuit includes a first step-down circuit, a second step-down circuit, a first subtractor, a second subtractor, and a third subtractor. The positive and negative terminals of the pulse generator output are connected to the input terminals of the first step-down circuit and the second step-down circuit, respectively.

[0007] Furthermore, the output terminal of the first step-down circuit is connected to pin 5 of the first subtractor, pin 6 of the first subtractor is connected to pin 7 of the first subtractor through a sixth resistor, and pin 7 of the first subtractor is connected to pin 3 of the third subtractor through a seventh resistor.

[0008] The output of the second step-down circuit is connected to pin 3 of the second subtractor. Pin 2 of the second subtractor is connected to pin 1 of the second subtractor through the fifteenth resistor. Pin 1 of the second subtractor is connected to pin 2 of the third subtractor through the sixteenth resistor.

[0009] The third subtractor pin 3 is connected to the third subtractor pin 1 through the eighth resistor, and the third subtractor pin 2 is connected to the third subtractor pin 1 through the seventeenth resistor.

[0010] Furthermore, the first step-down circuit includes a first filter module, a second filter module, a third filter module and a fifth resistor connected in series, and also includes a fourth filter module. One end of the fourth filter module is connected to the third filter module and the fifth resistor respectively, and the other end of the fourth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The first filter module is connected to the positive terminal of the pulse generator output, and the fifth resistor is connected to pin 5 of the first subtractor.

[0011] Furthermore, the second step-down circuit includes a fifth filter module, a sixth filter module, a seventh filter module and a fourteenth resistor connected in series, and also includes an eighth filter module. One end of the eighth filter module is connected to the seventh filter module and the fourteenth resistor respectively, and the other end of the eighth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The fifth filter module is connected to the negative terminal of the pulse generator output, and the fourteenth resistor is connected to pin 3 of the second subtractor.

[0012] Furthermore, the high-speed AD conversion circuit includes an AD conversion chip, a fourteenth capacitor, and a fifteenth capacitor.

[0013] Furthermore, pin 2 of the AD converter chip is connected to pin 1 of the third subtractor through the ninth resistor, pins 1, 3, and 12 of the AD converter chip are grounded, and pin 47 of the AD converter chip is connected to the enable signal.

[0014] Furthermore, the pulse storage determination circuit includes a microcontroller, a storage chip, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, and a twenty-first resistor.

[0015] Furthermore, pins 35 to 44 of the AD conversion chip are connected to pins 11 to 20 of the microcontroller, pin 22 of the microcontroller is grounded, pins 5, 6, and 8 of the microcontroller are connected to pins 7, 6, and 5 of the memory chip, respectively, pin 5 of the microcontroller is connected to the external power supply through the eighteenth and nineteenth resistors in parallel, pin 6 of the microcontroller is connected to the external power supply through the eighteenth resistor, and pin 8 of the microcontroller is connected to the external power supply through the nineteenth resistor.

[0016] Furthermore, pin 8 of the memory chip is connected to an external power supply, pin 4 of the memory chip is grounded, pin 2 of the memory chip is connected to an external power supply through a 21st resistor, and pin 1 of the memory chip is grounded through a 20th resistor.

[0017] Compared with the prior art, the present invention has the following advantages:

[0018] (1) This invention adopts a pulse waveform width-based determination method, replacing the traditional current determination method. By measuring the maximum value of the pulse waveform and the waveform width between the 10% rise phase and the 10% fall phase, the misjudgment caused by capacitive or inductive load interference in the traditional method can be effectively avoided. This technique ensures the accuracy of the test results, and in particular, it can identify weak breakdown phenomena that are not visible to the naked eye.

[0019] (2) The pulse storage and determination circuit of this utility model includes a microcontroller and a memory chip. Through the cooperation of the microcontroller and the memory chip, the waveform data collected during the test can be safely stored and processed in real time. The microcontroller analyzes the waveform data according to a preset algorithm and accurately determines whether a breakdown has occurred by comparing the width of the pulse waveform. This design improves the automation of the test process, reduces human error, and ensures the reliability and stability of the test results.

[0020] (3) The first and second step-down circuits in the voltage differential circuit, combined with the filter module, can effectively divide the pulse signal and filter out noise, ensuring that the acquired signal is accurate and stable. This design reduces the impact of external noise on the test results and significantly improves the accuracy and stability of signal acquisition.

[0021] (4) This invention employs a high-speed AD conversion circuit (sampling rate up to 100MHz), which can convert analog pulse signals into digital signals at an extremely high sampling frequency, ensuring accurate capture and conversion of high-speed pulse waveforms. This technical means improves the system's response capability in high-frequency pulse environments, making the testing process more accurate and efficient. Attached Figure Description

[0022] Figure 1 This is a pulse insulation withstand voltage test diagram for existing technologies;

[0023] Figure 2 This is a diagram of the pulse insulation withstand voltage structure of this utility model;

[0024] Figure 3 This is a voltage differential circuit diagram of the present invention;

[0025] Figure 4 This is a high-speed AD conversion circuit diagram of this utility model;

[0026] Figure 5 This is a circuit diagram of the pulse storage and determination circuit of this utility model;

[0027] The attached diagram is labeled as follows: U1B, first subtractor; U2A, second subtractor; U1A, third subtractor; U1, AD conversion chip; U2, memory chip; U3, microcontroller; R1, first resistor; R2, second resistor; R3, third resistor; R4, fourth resistor; R5, fifth resistor; R6, sixth resistor; R7, seventh resistor; R8, eighth resistor; R9, ninth resistor; R10, tenth resistor; R11, eleventh resistor; R12, twelfth resistor; R13, thirteenth resistor; R14, fourteenth resistor; R15, fifteenth resistor; R16, sixteenth resistor. Resistors: R17, R18, R19, R20, R21; C1, C2, C3, C4, C5, C6, C7, C8, C9, C10, C11, C12, C13, C14, C15, C16, C17, C17. Detailed Implementation

[0028] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of the present utility model. Based on the embodiments of the present utility model, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present utility model.

[0029] like Figure 1 As shown, existing technologies determine whether a breakdown has occurred by collecting pulse current. The presence of pulse current indicates a breakdown, while the absence of pulse current indicates no breakdown. This method of determination has significant limitations and is prone to misjudgment. When the load has a certain degree of capacitive or inductive properties, it has a significant impact on the determination results.

[0030] This invention provides a pulse insulation withstand voltage testing device based on pulse waveform width, such as... Figure 2 As shown, the circuit includes a pulse generator, a test object, a voltage differential circuit, a high-speed AD conversion circuit, and a pulse storage and judgment circuit. The output terminal of the pulse generator is connected to the test object. The input terminals of the voltage differential circuit are connected to the positive and negative terminals of the output terminal of the pulse generator, respectively. The output terminal of the voltage differential circuit is connected to the input terminal of the high-speed AD conversion circuit. The output terminal of the high-speed AD conversion circuit is connected to the input terminal of the pulse storage and judgment circuit. The pulse storage and judgment circuit outputs the pulse insulation withstand voltage test judgment result.

[0031] like Figure 3As shown, the voltage differential circuit includes a first step-down circuit, a second step-down circuit, a first subtractor, a second subtractor, and a third subtractor. The positive and negative terminals of the pulse generator output are connected to the input terminals of the first step-down circuit and the second step-down circuit, respectively.

[0032] The output of the first step-down circuit is connected to pin 5 of the first subtractor. Pin 6 of the first subtractor is connected to pin 7 of the first subtractor through a sixth resistor. Pin 7 of the first subtractor is connected to pin 3 of the third subtractor through a seventh resistor.

[0033] The output of the second step-down circuit is connected to pin 3 of the second subtractor. Pin 2 of the second subtractor is connected to pin 1 of the second subtractor through the fifteenth resistor. Pin 1 of the second subtractor is connected to pin 2 of the third subtractor through the sixteenth resistor.

[0034] Pin 3 of the third subtractor is connected to pin 1 of the third subtractor through resistor 8, and pin 2 of the third subtractor is connected to pin 1 of the third subtractor through resistor 17.

[0035] The first step-down circuit includes a first filter module, a second filter module, a third filter module, and a fifth resistor connected in series, and also includes a fourth filter module. One end of the fourth filter module is connected to the third filter module and the fifth resistor, and the other end of the fourth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The first filter module is connected to the positive terminal of the pulse generator output, and the fifth resistor is connected to pin 5 of the first subtractor.

[0036] The second step-down circuit includes a fifth filter module, a sixth filter module, a seventh filter module, and a fourteenth resistor connected in series. It also includes an eighth filter module. One end of the eighth filter module is connected to the seventh filter module and the fourteenth resistor, and the other end of the eighth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The fifth filter module is connected to the negative terminal of the pulse generator output, and the fourteenth resistor is connected to pin 3 of the second subtractor.

[0037] The first filter module includes a first capacitor and a first resistor connected in parallel; the second filter module includes a second capacitor and a second resistor connected in parallel; the third filter module includes a third capacitor and a third resistor connected in parallel; the fourth filter module includes a fourth capacitor and a fourth resistor connected in parallel; the fifth filter module includes a sixth capacitor and a tenth resistor connected in parallel; the sixth filter module includes a seventh capacitor and an eleventh resistor connected in parallel; the seventh filter module includes an eighth capacitor and a thirteenth resistor connected in parallel; and the eighth filter module includes a fifth capacitor and a twelfth resistor connected in parallel.

[0038] like Figure 4 As shown, the high-speed AD conversion circuit includes an AD conversion chip, a fourteenth capacitor, and a fifteenth capacitor.

[0039] Pin 2 of the AD converter chip is connected to pin 1 of the third subtractor through the ninth resistor. Pins 1, 3, and 12 of the AD converter chip are grounded, and pin 47 of the AD converter chip is connected to the enable signal.

[0040] like Figure 5 As shown, the pulse storage determination circuit includes a microcontroller, a storage chip, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, and a twenty-first resistor.

[0041] Pins 35 to 44 of the AD conversion chip are connected to pins 11 to 20 of the microcontroller, respectively. Pin 22 of the microcontroller is grounded. Pins 5, 6, and 8 of the microcontroller are connected to pins 7, 6, and 5 of the memory chip, respectively. Pin 5 of the microcontroller is connected to the external power supply through the eighteenth and nineteenth resistors in parallel. Pin 6 of the microcontroller is connected to the external power supply through the eighteenth resistor. Pin 8 of the microcontroller is connected to the external power supply through the nineteenth resistor.

[0042] Pin 8 of the memory chip is connected to the external power supply, pin 4 of the memory chip is grounded, pin 2 of the memory chip is connected to the external power supply through the twenty-first resistor, and pin 1 of the memory chip is grounded through the twentieth resistor.

[0043] This invention provides a pulse insulation withstand voltage test device based on pulse waveform width, mainly used for accurate testing of the insulation performance of electrical equipment or components. This device can determine whether the tested object has broken down by measuring the width of the pulse waveform and comparing it with a standard waveform, thereby improving the accuracy and reliability of pulse insulation withstand voltage testing and overcoming the limitations and misjudgments of traditional testing methods in the prior art.

[0044] like Figure 2 As shown, the testing device of this utility model includes the following main parts: a pulse generator, a test object (DApp), a voltage differential circuit, a high-speed AD conversion circuit, and a pulse storage and determination circuit. The pulse generator generates a pulse signal and applies it to the DApp. The voltage differential circuit is responsible for acquiring and processing the voltage signal on the DApp, converting it into a voltage waveform suitable for the input of the high-speed AD conversion circuit. The high-speed AD conversion circuit converts the analog signal into a digital signal and transmits it to the pulse storage and determination circuit. This determination circuit analyzes the acquired waveform data, calculates the pulse waveform width, compares it with a standard waveform, and finally obtains the test result of the pulse insulation withstand voltage.

[0045] The output of the pulse generator is connected to the test object (DAMPE) via a voltage differential circuit. The voltage differential circuit acquires and differentially processes the positive and negative voltage signals of the pulse waveform. It includes components such as a first step-down circuit, a second step-down circuit, and multiple subtractors, enabling precise voltage division and differential processing of the signal to ensure the accuracy of the acquired signal during testing. Specifically, the first step-down circuit includes multiple filter modules and resistors, effectively filtering out high-frequency noise and interference to ensure the stability and accuracy of the pulse waveform. The second step-down circuit also employs filter modules to ensure accurate processing of the negative signal. This design of the step-down circuits and filter modules significantly improves the accuracy of voltage sampling, thereby reducing errors caused by interference or noise and improving the reliability of the test results.

[0046] The signal output from the voltage differential circuit is sampled by a high-speed analog-to-digital (ADC) converter. This high-speed ADC converter includes an ADC chip capable of converting analog signals to digital signals at sampling rates up to 100MHz. The fast response characteristics of the ADC circuit enable it to capture the details of pulse waveforms, maintaining high resolution and sampling accuracy, especially with high-frequency pulse signals. The design of the ADC chip further enhances the device's accuracy requirements in high-frequency signal processing, ensuring that the pulse signal is not distorted during the conversion to digital data.

[0047] The acquired digital signal is then transmitted to the pulse storage and judgment circuit. This circuit includes a microcontroller, a memory chip, and multiple resistors for storing, processing, and judging the test results. The microcontroller is responsible for processing the digital signal from the AD conversion circuit and performing waveform analysis according to a preset algorithm. Specifically, the microcontroller first calculates the maximum value of the waveform, and then calculates the waveform width between 10% of the maximum value during the rising phase and 10% of the maximum value during the falling phase. This waveform width is a key parameter used to determine whether the tested object has experienced breakdown.

[0048] By comparing the width of the test waveform with that of the calibration waveform, the microcontroller can determine whether the insulation of the test object is good. If the comparison result is within a preset error range, it is determined that there is no breakdown; if it exceeds the error range, it is determined that a breakdown has occurred. The memory chip is used to store the data of the standard waveform and the test waveform, ensuring that data comparison and storage can be performed in real time, avoiding data loss or errors during the testing process.

[0049] This invention, by employing a pulse waveform width-based measurement method, effectively avoids the misjudgment problems caused by current determination in traditional methods when testing the insulation performance of electrical equipment or components. Traditional pulse insulation withstand voltage testing methods rely on the acquisition of pulse current, which may be affected by the capacitive or inductive load of the tested object, leading to misjudgments. In contrast, this invention, by accurately measuring the pulse waveform width, can not only detect obvious breakdown phenomena but also discover weak breakdown phenomena invisible to the naked eye, greatly improving the accuracy and reliability of the test.

[0050] Furthermore, the voltage reduction and filtering design in the voltage differential circuit, combined with the high sampling rate of the high-speed AD conversion circuit and the precise processing of the microcontroller, gives the testing device of this invention significant advantages in terms of high precision and high efficiency. Overall, the testing device can operate stably in different testing environments, especially in high-voltage pulse environments, where it can accurately determine insulation breakdown and provide reliable protection for the safety of electrical equipment.

[0051] The working principle of this utility model is as follows:

[0052] Before formal testing, a standard pulse waveform needs to be calibrated and recorded once. The test sample is removed, and the empty carrier waveform of the test pulse generator is tested. The voltage differential circuit acquires the output pulse voltage waveform. The high-voltage input HV+ and high-voltage input HV- are sampled separately by the first and second step-down circuits, respectively. Figure 3 As shown, VS1 and VS2 are obtained, VS1 = R4 / (R1+R2+R3+R4), VS2 = R12 / (R10+R11+R12+R13).

[0053] VS1 and VS2 are input to pin 5 of the first subtractor U1B and pin 3 of the second subtractor U2A, respectively, for processing. The processed data then enters pins 3 and 2 of the third subtractor U1A, ultimately outputting Vout, where Vout = (VS1 - VS2). This voltage Vout is input to pin 2 of the AD conversion chip U1 (AD9288) in the high-speed AD conversion circuit. The AD conversion chip U1 has a sampling rate of 100MHz. After Vout is converted into 8 bits of data, it is transmitted in parallel to the microcontroller U3 (CPUM) of the pulse storage and determination circuit. After receiving data (PC89E515), the microcontroller U3 first stores it serially into the memory chip U2 (TLC512). After the memory chip U2 has finished saving the data, the microcontroller U3 processes the waveform data according to the prescribed algorithm. The first step is to calculate the maximum value U of the waveform. The second step is to calculate the waveform width T from 10%*U during the rising phase to 10%*U during the falling phase. This T is saved by the memory chip U2. Of course, it is also necessary to set the error range between the judgment and the waveform time width T. For example, we can set it to be less than 0.7*T as the test sample being broken down. After the test sample is added, the pulse generator generates a voltage pulse applied to the sample. The voltage differential circuit acquires the voltage waveform on the test sample and sends it to the high-speed AD conversion circuit. After conversion, the waveform is output to the microcontroller U3. The microcontroller U3 processes the waveform data and calculates the maximum voltage U, the rise time 10% * U, and the waveform width T2 of the fall phase 10% * U. At this time, T2 is compared with the waveform width T saved in the first calibration. The comparison error is preset. If it is within the error range, there is no breakdown; if it is outside the error range, it is judged as a breakdown. The judgment result is output through the P-A10 pin of the microcontroller U3. When it is judged as a breakdown, the P-A10 pin outputs a high level; when it is judged as no breakdown, the P-A10 pin outputs a low level.

[0054] The above description is merely a specific embodiment of this utility model, but the protection scope of this utility model is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in this utility model, and these modifications or substitutions should all be covered within the protection scope of this utility model. Therefore, the protection scope of this utility model should be determined by the scope of the claims.

Claims

1. A pulse insulation withstand voltage testing device based on pulse waveform width, characterized in that, It includes a pulse generator, a test object, a voltage differential circuit, a high-speed AD conversion circuit, and a pulse storage and judgment circuit. The output of the pulse generator is connected to the test object. The inputs of the voltage differential circuit are connected to the positive and negative terminals of the pulse generator output, respectively. The output of the voltage differential circuit is connected to the input of the high-speed AD conversion circuit. The output of the high-speed AD conversion circuit is connected to the input of the pulse storage and judgment circuit. The pulse storage and judgment circuit outputs the pulse insulation withstand voltage test result.

2. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 1, characterized in that, The voltage differential circuit includes a first step-down circuit, a second step-down circuit, a first subtractor, a second subtractor, and a third subtractor. The positive and negative terminals of the pulse generator output are connected to the input terminals of the first step-down circuit and the second step-down circuit, respectively.

3. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 2, characterized in that, The output of the first step-down circuit is connected to pin 5 of the first subtractor. Pin 6 of the first subtractor is connected to pin 7 of the first subtractor via a sixth resistor. Pin 7 of the first subtractor is connected to pin 3 of the third subtractor via a seventh resistor. The output of the second step-down circuit is connected to pin 3 of the second subtractor. Pin 2 of the second subtractor is connected to pin 1 of the second subtractor through the fifteenth resistor. Pin 1 of the second subtractor is connected to pin 2 of the third subtractor through the sixteenth resistor. The third subtractor pin 3 is connected to the third subtractor pin 1 through the eighth resistor, and the third subtractor pin 2 is connected to the third subtractor pin 1 through the seventeenth resistor.

4. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 2, characterized in that, The first step-down circuit includes a first filter module, a second filter module, a third filter module and a fifth resistor connected in series, and also includes a fourth filter module. One end of the fourth filter module is connected to the third filter module and the fifth resistor respectively, and the other end of the fourth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The first filter module is connected to the positive terminal of the pulse generator output, and the fifth resistor is connected to pin 5 of the first subtractor.

5. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 2, characterized in that, The second step-down circuit includes a fifth filter module, a sixth filter module, a seventh filter module and a fourteenth resistor connected in series, and also includes an eighth filter module. One end of the eighth filter module is connected to the seventh filter module and the fourteenth resistor respectively, and the other end of the eighth filter module is grounded. The filter module includes a capacitor and a resistor connected in parallel. The fifth filter module is connected to the negative terminal of the pulse generator output, and the fourteenth resistor is connected to pin 3 of the second subtractor.

6. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 1, characterized in that, The high-speed AD conversion circuit includes an AD conversion chip, a fourteenth capacitor, and a fifteenth capacitor.

7. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 6, characterized in that, The 2nd pin of the AD converter chip is connected to the 1st pin of the third subtractor through the ninth resistor. The 1st, 3rd, and 12th pins of the AD converter chip are grounded, and the 47th pin of the AD converter chip is connected to the enable signal.

8. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 1, characterized in that, The pulse storage determination circuit includes a microcontroller, a storage chip, an eighteenth resistor, a nineteenth resistor, a twentieth resistor, and a twenty-first resistor.

9. The pulse insulation withstand voltage test device based on pulse waveform width according to claim 7, characterized in that, Pins 35 to 44 of the AD conversion chip are connected to pins 11 to 20 of the microcontroller, pin 22 of the microcontroller is grounded, pins 5, 6, and 8 of the microcontroller are connected to pins 7, 6, and 5 of the memory chip, respectively, pin 5 of the microcontroller is connected to the external power supply through the eighteenth and nineteenth resistors in parallel, pin 6 of the microcontroller is connected to the external power supply through the eighteenth resistor, and pin 8 of the microcontroller is connected to the external power supply through the nineteenth resistor.

10. A pulse insulation withstand voltage testing device based on pulse waveform width according to claim 9, characterized in that, Pin 8 of the memory chip is connected to an external power supply, pin 4 of the memory chip is grounded, pin 2 of the memory chip is connected to an external power supply through a 21st resistor, and pin 1 of the memory chip is grounded through a 20th resistor.

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