Testing device
By designing a testing device that includes a base, a support plate, and a pressure plate, and using limit columns and spring support columns to achieve rapid clamping, and combining a test controller and a simulated resistor, the problem of inconvenient operation and low efficiency in testing building automation controllers is solved, and an efficient and accurate testing process is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-09
- Publication Date
- 2026-03-13
AI Technical Summary
In existing technologies, testing building automation controllers requires wiring tests for different IO ports, which is inconvenient and inefficient.
A testing device was designed, including a base, a support plate, and a pressure plate. The device under test is quickly clamped by using limiting posts and spring support posts, and the test probes are connected to the ports under test one by one. The device is then used in conjunction with a test controller and an analog resistor for automated testing.
It improves the efficiency and accuracy of building automation controller testing, simplifies the operation process, is applicable to controllers of different lengths, and facilitates observation of test results.
Smart Images
Figure CN223993055U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of testing, and in particular to a testing device for use in building automation controllers. Background Technology
[0002] Building automation controllers are the core control devices of building automation control systems. They can be connected to sensors, alarms, actuators, lights and other devices through I / O ports to collect environmental information or control the devices.
[0003] Testing building automation controllers is an important step in ensuring their proper functioning. However, building automation controllers have numerous I / O ports, and these ports use various signal types.
[0004] In existing technologies, testing building automation controllers requires wiring tests for different IO ports, which is not only inconvenient to operate but also inefficient. Utility Model Content
[0005] The purpose of this invention is to provide a testing device that can improve the efficiency and accuracy of testing building automation controllers.
[0006] This utility model provides a testing device for testing building automation controllers. The testing device includes a base, a support plate, and a pressure plate arranged sequentially. The base is provided with a first limiting post, a second limiting post, and a third limiting post. The support plate is provided with a test position and a spring support post. The test position is used to place the device under test (DUT). The support plate is connected to the base via the spring support post, and the support plate can move axially towards the base along the spring support post and compress the spring in the spring support post. The pressure plate can be sleeved on the third limiting post and can move axially along the third limiting post. The pressure plate is provided with multiple test pins. When the pressure plate and the support plate clamp the DUT, the ends of the test pins are connected one-to-one to the test ports of the DUT. The first and second limiting posts limit the pressure plate to the DUT.
[0007] The testing device of this invention can quickly connect to the various ports under test of the building automation controller, thereby improving the efficiency and accuracy of the test.
[0008] In another illustrative embodiment of the testing device of this utility model, one end of the first limiting post is fixedly connected to the base, and the other end is provided with a first knob buckle; one end of the second limiting post is movably connected to the base, and the other end is provided with a second knob buckle; when the pressure plate and the support plate cooperate to clamp the device under test, the surface of the pressure plate facing away from the support plate abuts against the first knob buckle and the second knob buckle. The testing device of this utility model can be applied to building automation controllers of different lengths.
[0009] In another illustrative embodiment of the testing device of this utility model, a slider is provided at one end of the second limiting post; a sliding groove is provided on the base; wherein the slider is confined in the sliding groove and can slide in the sliding groove to approach or move away from the first limiting post. The testing device of this utility model has a simple structure and is easy to implement.
[0010] In another illustrative embodiment of the testing device of this utility model, the line connecting the first limiting post and the second limiting post is parallel to the extension direction of the sliding groove.
[0011] In another illustrative embodiment of the testing device of this utility model, a movable groove is provided on the support plate, and the projection of the movable groove on the base corresponds to the sliding groove; the second limiting post passes through the movable groove; when the pressure plate and the support plate cooperate to clamp the device under test, the device under test is located between the first limiting post and the second limiting post. The testing device of this utility model has a compact structure.
[0012] In another illustrative embodiment of the testing device of this utility model, the pressure plate is provided with an opening; when the pressure plate and the support plate cooperate to clamp the device under test, the opening allows the protrusion of the device under test to pass through, the surface of the pressure plate facing the support plate can abut against the main body of the device under test, and the test probe abuts against the connector in the test port of the device under test. The testing device of this utility model facilitates the positioning of the pressure plate on the device under test and improves the accuracy of the connection between the test probe and the test interface.
[0013] In another illustrative embodiment of the testing device of this utility model, the tray is provided with multiple connecting pins, which can be connected to the power interface and communication interface of the device under test located at the test position. The testing device of this utility model is easy to operate and improves testing efficiency.
[0014] In another illustrative embodiment of the testing device of this utility model, an external module is provided on the base for connecting to a test controller to receive test commands from and send information to the test controller. The pins in the external module are connected one-to-one with the connecting pins. The testing device of this utility model is easy to operate and improves testing efficiency.
[0015] In another illustrative embodiment of the testing device of this utility model, the testing device further includes an indicator plate and multiple analog resistors. The indicator plate is provided with multiple LED indicators, each of which is connected to an output circuit of the device under test (DUT) via a test probe to indicate the test result of the corresponding circuit; each analog resistor is connected to an input circuit of the DUT via a test probe to simulate a test signal. The testing device of this utility model facilitates the simulation of test signals and the observation of test results.
[0016] In another illustrative embodiment of the testing device of this utility model, a limiting groove is provided on the tray, which is used to position the device under test on the tray. The testing device of this utility model facilitates the accurate positioning of the testing device at the testing position on the tray, so that the interface under test of the testing device is accurately aligned with the test probe. Attached Figure Description
[0017] The following figures are for illustrative purposes only and do not limit the scope of the present invention.
[0018] Figure 1 This is a schematic diagram illustrating the structure of the testing device of this utility model.
[0019] Figure 2 This is another structural schematic diagram illustrating the testing device of this utility model.
[0020] Figure 3 This is another structural schematic diagram illustrating the testing device of this utility model.
[0021] The reference numerals in the attached figures are as follows:
[0022] 100 test devices
[0023] 10 bases
[0024] 11 First Limiting Post
[0025] 111 First knob latch
[0026] 12 Second Limiting Post
[0027] 121 Second knob latch
[0028] 13 Third Limiting Post
[0029] 14 External Modules
[0030] 20 pallets
[0031] 21 moving slots
[0032] 22 Spring Support Columns
[0033] 23 Limiting slots
[0034] 24 connecting pins
[0035] 30 pressure plate
[0036] 31 openings
[0037] 32 test needles
[0038] 40 indicator panel
[0039] 200 devices under test
[0040] 300 Test Controller Detailed Implementation
[0041] To provide a clearer understanding of the technical features, objectives, and effects of this utility model, specific embodiments of this utility model are now described with reference to the accompanying drawings. In the drawings, the same reference numerals indicate components with the same or similar structures but the same function.
[0042] In this document, “illustrative” means “serving as an example, illustration or description”, and any illustration or implementation described herein as “illustrative” should not be construed as a more preferred or advantageous technical solution.
[0043] To keep the drawings concise, only the parts related to this utility model are shown schematically in each figure, and they do not represent the actual structure of the product. In addition, to make the drawings concise and easy to understand, in some figures, only one of the components with the same structure or function is shown schematically, or only one of them is labeled.
[0044] In this article, "one" can mean not only "only one" but also "more than one". In this article, "first", "second", etc., are used only to distinguish them from each other, not to indicate their importance or order.
[0045] Figure 1 This is a schematic diagram illustrating the structure of the testing device of this utility model, showing a schematic diagram of the testing device when no device to be tested is placed. Figure 2 This is another structural schematic diagram illustrating the testing device of this utility model, which shows... Figure 1 A schematic diagram of the testing apparatus with the device under test placed on it.
[0046] like Figure 1 As shown, the testing device 100 includes a base 10, a support plate 20, and a pressure plate 30. Furthermore, the base 10, the support plate 20, and the pressure plate 30 are arranged sequentially from bottom to top.
[0047] The base 10 can be a plate-shaped structure. The base 10 is provided with a first limiting post 11, a second limiting post 12 and a third limiting post 13. The ends of the first limiting post 11 and the third limiting post 13 are fixedly connected to the base 10, while the end of the second limiting post 12 can be fixedly connected to the base 10 or slidably connected to the base 10.
[0048] The tray 20 is provided with a test position and a spring support column 22. The test position is used to place the device under test 200. The tray 20 is connected to the base 10 via the spring support column 22. The spring support column 22 includes a spring and a support column. The spring is sleeved on the support column, and its two ends are respectively supported by the base 10 and the tray 20. One end of the support column is fixedly connected to the tray 20, and the other end extends into the base 10. Therefore, when the tray 20 is subjected to a force in the direction of the base 10, the tray 20 can move along the axial direction of the spring support column 22 towards the base 10 and compress the spring in the spring support column 22.
[0049] The pressure plate 30 is provided with limiting holes. The pressure plate 30 is sleeved on the third limiting post 13 through the limiting holes. Under the action of the third limiting post 13, the pressure plate 30 can only move along the axial direction of the third limiting post 13. The pressure plate 30 is also provided with multiple test pins 32, which are used to connect to the test port of the device under test 200.
[0050] When testing a device under test (DUT) 200, first remove the pressure plate 30, then place the DUT 200 on the support plate 20, compressing the spring in the spring support column 22. Next, place the pressure plate 30 on the DUT 200 and press it down. Adjust the first limiting column 11 and the second limiting column 12 so that the first limiting column 11 and the second limiting column 12 limit the pressure plate 30 on the DUT 200. At this time, due to the upward restoring force of the spring in the spring support column 22, the support plate 20 can cooperate with the pressure plate 30 to clamp the DUT 200. At this time, the ends of the test probes 32 are connected to the test ports of the DUT 200 one by one.
[0051] This testing device can quickly connect to the various ports under test of the building automation controller, improving testing efficiency and accuracy.
[0052] As mentioned above, the end of the second limiting post 12 can be fixedly connected to the base 10 or slidably connected to the base 10. In order to make the testing device applicable to devices of different lengths, preferably, the second limiting post 12 is designed to be slidably connected to the base 10. Specifically, the testing device 100 can be designed as follows: one end of the first limiting post 11 is fixedly connected to the base 10, and the other end is provided with a first knob buckle 111; one end of the second limiting post 12 is movably connected to the base 10, and the other end is provided with a second knob buckle 121; when the pressure plate 30 and the support plate 20 cooperate to clamp the device under test 200, the surface of the pressure plate 30 facing away from the support plate 20 abuts against the first knob buckle 111 and the second knob buckle 121. During operation, the second limiting post 12 is moved to a position that matches the device under test 200. Then, the device under test 200 and the pressure plate 30 are placed in sequence. Finally, the first knob buckle 111 on the first limiting post 11 and the second knob buckle 121 on the second limiting post 12 are rotated so that the first knob buckle 111 and part of the second limiting post 12 are located above the pressure plate 30, thereby restricting the pressure plate 30 to the current position.
[0053] There are several different ways to implement the movable connection of the second limiting post 12. For example, several positioning holes can be provided on the base 10, and the second limiting post 12 can be set in different positioning holes depending on the device under test 200. Another example is that a slider is provided at one end of the second limiting post 12, and a sliding groove is provided on the base 10. The slider is placed in the sliding groove and can slide in the sliding groove to move closer to or away from the first limiting post 11. This slider and sliding groove configuration allows the testing device to be applicable to devices under test of more sizes and is easy to operate. For ease of use, a spring can also be provided in the sliding groove, with one end connected to the slider and the other end abutting against the end wall of the sliding groove. When the device under test 200 is removed, the second limiting post 12 can return to its initial position under the action of the spring's restoring force. The sliding groove can be set at different positions on the base 10. For example, the sliding groove can be set at the projection position of the tray 20 on the base 10, or it can be set at a position other than the projection position of the tray 20 on the base 10. Preferably, the extension direction of the sliding groove is designed to be parallel to the line connecting the first limiting post 11 and the second limiting post 12.
[0054] To make the testing device more compact, the sliding groove can be set within the area of the projection position of the support plate 20 on the base 10, and a movable groove 21 is provided on the support plate 20. The projection of the movable groove 21 on the base 10 corresponds to the sliding groove; for example, the projection of the movable groove 21 is located within the sliding groove, or the projection of the movable groove 21 coincides with the sliding groove. When the pressure plate 30 and the support plate 20 clamp the device under test 200, the device under test 200 is located between the first limiting post 11 and the second limiting post 12.
[0055] To ensure accurate connection of the test probe 32 to the test port of the device under test (DUT) when the pressure plate 30 and the support plate 20 clamp the DUT 200, an opening 31 can be provided on the pressure plate 30. The shape of the opening 31 matches the shape of the protrusion of the DUT 200. When the pressure plate 30 and the support plate 20 clamp the DUT 200, the opening 31 allows the protrusion of the DUT 200 to pass through, and the surface of the pressure plate 30 facing the support plate 20 can abut against the main body of the DUT 200. At this time, the test probe 32 presses against the connector in the test port of the DUT 200. To increase the reliability of the connection between the test probe 32 and the port under test and to avoid damage to the device under test 200, the test probe 32 may have some elasticity. When the device under test 200 is clamped between the pressure plate 30 and the support plate 20, the test probe 32 presses against the connector in the port under test of the device under test 200 and is slightly bent, thereby increasing the clamping force of the test probe 32 on the port under test and avoiding damage to the port under test of the device under test 200 by the test probe 32.
[0056] Since the device under test (DUT) 200 has a power interface and a communication interface at its bottom, multiple connecting pins 24 can be provided at corresponding positions on the tray 20. These connecting pins 24 can connect to the power interface and communication interface of the DUT 200 located at the test position. To facilitate positioning the power interface and communication interface of the DUT 200 at the connecting pin 24 positions, a limiting groove 23 can be provided on the tray 20. The limiting groove 23 is used to position the DUT 200 on the tray 20. Specifically, the width of the limiting groove 23 can be set to be the same as the width of the DUT 200. In use, the end of the DUT 200 is placed close to the end of the limiting groove 23, so that the connecting pins 24 are aligned with the power interface and communication interface; or, the shape of the end of the limiting groove 23 can be set to be the same as the shape of the end of the DUT 200 to achieve rapid positioning. There can be four connecting pins 24, corresponding to the GND ground terminal, A+ positive terminal of the communication terminal, B- negative terminal of the communication terminal, and 24V power supply terminal of the device under test 200, respectively. The test pins 32 and connecting pins 24 involved in this utility model can be made of plum blossom needles, or they can be made of spiked needles or circular needles to match the shape of the controller terminals.
[0057] Figure 3 This is another structural schematic diagram illustrating the testing device of this utility model, showing... Figure 2 A schematic diagram of the testing device during testing.
[0058] like Figure 3 As shown, the test device 100 is connected to a test controller 300 and is used to receive test commands from the test controller 300 and send information about the device under test 200 to the test controller 300.
[0059] The test controller 300 contains a main test program to provide a unified testing environment for different devices under test (DUTs) 200. The test controller 300 can send test commands to the DUTs 200, collect the resistance values acquired by the DUTs 200, and provide relay 0 / 1 signals to the DUTs 200 to control their actions. Through the test controller 300, the accuracy of the port calibration data of the DUTs 200 can be verified; the functionality of the output ports of the DUTs 200 can be verified, checking whether they output normally; and the functionality of the EXT extension bus communication port at the bottom of the DUTs 200 can be verified. Specifically, an external module 14 can be set on the base 10, with pins in the external module 14 connected one-to-one to pins 24. This allows for easy connection of the DUTs 200 to the test controller 300. The test controller 300 should preferably be a controller with a display screen to facilitate checking test results, such as acquiring temperature information received by the DUTs 200 and displaying whether the test passed.
[0060] To simulate the required test conditions during testing, multiple analog resistors can be set in the test apparatus. Each analog resistor is connected to an input circuit of the device under test 200 via a test pin 32 to simulate test signals. For example, a 1.5kΩ embedded resistor wire can be used to simulate a temperature sensor; a 7kΩ embedded resistor wire can also be used to simulate another type of temperature sensor; a 0Ω wire can be used to simulate DI-type inputs, such as simulating the status of a manual alarm, an external light, or an external actuator, etc., and a 0Ω wire can be used to simulate a closed state (e.g., a manual alarm being pressed, an external light being turned on, an actuator being activated, etc.).
[0061] To facilitate observation of test results, an indicator plate 40 can be installed on the test device 100. The indicator plate 40 has multiple LED indicators, each connected to an output circuit of the device under test 200 via a test probe 32, to indicate the test result of the corresponding circuit. For example, one end of each LED indicator is connected to the output terminal of the device under test 200 via the test probe 32, and the other end is connected to the negative terminal of a 24V auxiliary power supply.
[0062] It should be understood that although this specification describes various embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can be appropriately combined to form other implementations that can be understood by those skilled in the art. The nouns and pronouns referring to people in this patent application are not limited to specific genders.
[0063] The detailed descriptions listed above are merely specific descriptions of feasible embodiments of the present utility model, and are not intended to limit the scope of protection of the present utility model. All equivalent implementation schemes or modifications made without departing from the spirit of the present utility model, such as combinations, divisions or repetitions of features, should be included within the scope of protection of the present utility model.
Claims
1. A test device for testing a building automation controller, characterized by The test device (100) comprises, in sequence: a base (10) provided with a first limiting column (11), a second limiting column (12) and a third limiting column (13); a supporting plate (20) provided with a test site for placing a device to be tested (200) and a spring supporting column (22), the supporting plate (20) being connected to the base (10) through the spring supporting column (22), the supporting plate (20) being capable of moving towards the base (10) along the axial direction of the spring supporting column (22) and compressing the spring in the spring supporting column (22); and a pressing plate (30) capable of being sleeved on the third limiting column (13) and moving along the axial direction of the third limiting column (13), the pressing plate (30) being provided with a plurality of test needles (32); wherein, when the pressing plate (30) and the supporting plate (20) clamp the device to be tested (200) together, the ends of the test needles (32) are connected to the test ports of the device to be tested (200) one by one, and the first limiting column (11) and the second limiting column (12) limit the pressing plate (30) on the device to be tested (200).
2. The test device according to claim 1, wherein: one end of the first limiting column (11) is fixedly connected to the base (10), and the other end is provided with a first knob buckle (111); one end of the second limiting column (12) is movably connected to the base (10), and the other end is provided with a second knob buckle (121); when the pressing plate (30) and the supporting plate (20) clamp the device to be tested (200) together, the surface of the pressing plate (30) away from the supporting plate (20) abuts against the first knob buckle (111) and the second knob buckle (121).
3. The test device according to claim 2, wherein: one end of the second limiting column (12) is provided with a sliding block; the base (10) is provided with a sliding groove; wherein, the sliding block is limited in the sliding groove and can slide in the sliding groove to approach or move away from the first limiting column (11).
4. The test device according to claim 3, wherein: the direction of the line connecting the first limiting column (11) and the second limiting column (12) is parallel to the extension direction of the sliding groove.
5. The test device according to claim 3, wherein: the supporting plate (20) is provided with a moving groove (21), the projection of the moving groove (21) on the base (10) corresponds to the sliding groove; the second limiting column (12) passes through the moving groove (21); when the pressing plate (30) and the supporting plate (20) clamp the device to be tested (200) together, the device to be tested (200) is located between the first limiting column (11) and the second limiting column (12).
6. The test device according to claim 1, wherein: the pressing plate (30) is provided with an opening (31). When the pressing plate (30) and the supporting plate (20) clamp the device under test (200), the opening (31) allows the convex part of the device under test (200) to pass through, the surface of the pressing plate (30) can abut against the main body of the device under test (200), and the test needle (32) abuts against the connector in the test port of the device under test (200).
7. The test device according to claim 1, wherein: The supporting plate (20) is provided with a plurality of connecting needles (24), and the connecting needles (24) are connected to the power interface and the communication interface of the device under test (200) in the test position.
8. The test device of claim 7, wherein, The base (10) is provided with: An external module (14) for connecting with a test controller (300) to receive test commands from the test controller (300) and send information to the test controller (300), and the needles in the external module (14) are connected to the connecting needles (24) one by one.
9. The test device of claim 1, wherein, The test device (100) further comprises: An indication plate (40) provided with a plurality of LED indication lamps, each of which is connected to an output loop of the device under test (200) through the test needle (32) to indicate the test result of the corresponding loop; A plurality of analog resistors, each of which is connected to an input loop of the device under test (200) through the test needle (32) to simulate a test signal.
10. The test device of claim 1, wherein: The supporting plate (20) is provided with a limiting groove (23) for positioning the device under test (200) on the supporting plate (20).