Integrated circuit test fixture module
By designing the clamping mechanism and lead wire mechanism of the integrated circuit test fixture module, the problems of interface damage and electrostatic damage during adjustment of traditional fixtures are solved, thus achieving stability and safety in integrated circuit testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-07
- Publication Date
- 2026-03-24
AI Technical Summary
Traditional integrated circuit test fixtures lack the function of synchronous adjustment of test leads during adjustment, which can lead to interface deformation and damage. Furthermore, they lack grounding and electrostatic protection during testing, which can easily damage integrated circuits.
An integrated circuit test fixture module was designed, comprising a clamping mechanism and a lead wire mechanism. The clamping mechanism achieves rotational adjustment through the cooperation of a fixed clamp and a movable clamp, while the lead wire mechanism achieves grounding protection through a grounding clamp and a grounding wire, ensuring that the test leads are adjusted synchronously with the integrated circuit and preventing static electricity.
It effectively avoids interface deformation and damage caused by pulling the test leads, improves the stability and safety of integrated circuit testing, prevents electrostatic damage, and ensures the safety and integrity of the fixture during the testing process.
Smart Images
Figure CN224035465U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of integrated circuit testing technology, specifically to an integrated circuit testing fixture module. Background Technology
[0002] An integrated circuit is a miniature electronic device or component. Using specific processes, the transistors, resistors, capacitors, inductors, and other components required for a circuit, along with their interconnections, are fabricated on one or several small pieces of semiconductor wafers or dielectric substrates. These are then packaged in a housing to form a miniature structure with the desired circuit function. After fabrication, integrated circuits need to be tested, and fixtures are required to hold them in place during the testing process.
[0003] The "Integrated Circuit Chip Test Fixture" disclosed in the announcement number "CN216956259U" has an adjustment mechanism inside the bottom cavity, movable plates installed on both sides above the bottom cavity, an mounting plate installed above the movable plates, a clamping plate installed inside the mounting cavity, and a buffer mechanism provided inside the clamping plate. The buffer mechanism includes a telescopic spring and a plastic pad. The telescopic spring is installed inside the clamping plate, and a plastic pad is installed at one end of the telescopic spring.
[0004] Traditional fixtures lack the function of synchronously adjusting the inserted connecting wires when adjusting integrated circuits. When the integrated circuit is rotated and adjusted on the fixture, the pulling of the external test wires can cause interface deformation and damage. At the same time, there is no grounding treatment during the testing of integrated circuits. When the integrated circuit is tested on the fixture, it can be directly or indirectly damaged by high voltage discharge of static electricity. To address these issues, we have designed an integrated circuit test fixture module. Utility Model Content
[0005] To address the shortcomings of existing technologies, this utility model provides an integrated circuit test fixture module, which solves the problems of not being able to synchronously adjust the test leads when adjusting integrated circuits, easily causing deformation and damage to the integrated circuit interface due to pulling of the test leads, and not having grounding and anti-static protection when clamping and testing integrated motors.
[0006] To achieve the above objectives, this utility model is implemented through the following technical solution: an integrated circuit test fixture module, including a clamping mechanism and a wire mechanism assembled on the back of the clamping mechanism;
[0007] The clamping mechanism includes a main frame. A retractable plate is slidably installed on one side of the main frame via two sets of telescopic rods. A return spring extending into the main frame is fixedly installed at the bottom of one side of the retractable plate. A movable clamping plate is rotatably installed on the top of one side of the retractable plate. A fixed clamping plate that cooperates with the movable clamping plate is rotatably installed on the top of one side of the main frame. A fixed seat is rotatably installed at the center of the bottom of the main frame via a rotating shaft. Fixed through holes are equidistantly opened on the outer side of the top of the fixed seat.
[0008] The conductor mechanism includes a right-angle plate that is slidably mounted on the back of a fixed clamping plate. A wire clamp is fixedly mounted on one end of the right-angle plate, and a grounding wire is fixedly mounted on the back of the right-angle plate. One end of the grounding wire passes through the right-angle plate and is fixedly mounted with a grounding clamp, and the other end of the grounding wire is fixedly mounted with a grounding connector.
[0009] Preferably, flexible pads are fixedly installed on the inner sides of both the fixed clamping plate and the movable clamping plate.
[0010] Preferably, a rotating handwheel connected to a movable clamping plate is rotatably mounted on the top of one side of the shrink plate, and an angle locking shaft is rotatably mounted on the top of the shrink plate.
[0011] Preferably, positioning rings are fixedly installed at equal intervals on the top and bottom of the inner wall of the clamp, and the positioning rings are vertically aligned with each other.
[0012] Preferably, a directional locking shaft is threaded onto the top of the main frame, and a limiting groove is provided on the top of the fixing seat to cooperate with the directional locking shaft.
[0013] Preferably, an operating rod is fixedly installed on one side of the shrink plate, and a rubber sleeve is fixedly installed on the outer wall of the operating rod.
[0014] This invention provides an integrated circuit test fixture module. Compared with the prior art, it has the following advantages:
[0015] Beneficial effects:
[0016] (1) The integrated circuit test fixture module can rotate the integrated circuit for testing through the cooperation between the fixed clamp, the movable clamp and the wire clamp, thereby simulating the operation of the integrated circuit at different angles. The wire clamp can adjust the connected test wires synchronously when the integrated circuit is rotated and adjusted, ensuring the integrity of the integrated circuit and the test wires, and avoiding the situation where the interface is deformed and damaged due to the pulling of the test wires when adjusting the integrated circuit.
[0017] (2) By combining the grounding clamp and the grounding wire, grounding can be performed during the clamping test of integrated circuits. By grounding the integrated circuits, the situation of damage to integrated circuits caused by static electricity is avoided, and the safety of clamping and testing integrated circuits is ensured. Attached Figure Description
[0018] Figure 1 This is a schematic diagram of the overall structure of this utility model.
[0019] Figure 2 This is a front structural diagram of the present invention.
[0020] Figure 3 This is a cross-sectional structural diagram of the present invention.
[0021] Figure 4 This is a schematic diagram of the wire clamp structure of this utility model.
[0022] Figure 5 This is a schematic diagram of the back structure of this utility model.
[0023] In the diagram: 1. Clamping mechanism; 101. Main frame; 102. Retractable plate; 103. Telescopic rod; 104. Return spring; 105. Directional lock shaft; 106. Operating lever; 2. Wire guiding mechanism; 201. Right angle plate; 202. Wire clamp; 203. Positioning ring; 3. Fixed base; 301. Fixed through hole; 302. Limiting groove; 303. Rotating shaft; 4. Fixed clamping plate; 401. Moving clamping plate; 402. Flexible pad; 403. Rotating handwheel; 404. Angle lock shaft; 5. Grounding clamp; 501. Grounding wire; 502. Grounding connector. Detailed Implementation
[0024] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0025] Example 1
[0026] Please see Figure 2 , Figure 3 and Figure 5As shown, this embodiment proposes an integrated circuit test fixture module, including a clamping mechanism 1 and a wire mechanism 2 assembled on the back of the clamping mechanism 1. The clamping mechanism 1 includes a main frame 101. A shrink plate 102 is slidably installed on one side of the main frame 101 via two sets of telescopic rods 103. A return spring 104 extending into the main frame 101 is fixedly installed at the bottom of one side of the shrink plate 102. A movable clamping plate 401 is rotatably installed on the top of one side of the shrink plate 102. A fixed clamping plate 4 that cooperates with the movable clamping plate 401 is rotatably installed on the top of one side of the main frame 101. A fixed seat 3 is rotatably installed at the center of the bottom of the main frame 101 via a rotating shaft 303. Fixed through holes 301 are equidistantly opened on the outer side of the top of the fixed seat 3.
[0027] In use, one end of the integrated circuit is inserted into the fixed clamping plate 4, and after the operator pulls the shrink plate 102 outward, the other end of the integrated circuit is inserted into the movable clamping plate 401. The telescopic rod 103 can limit the path of the shrink plate 102 during movement, and the return spring 104 elastically resets the shrink plate 102, so that the movable clamping plate 401 can elastically clamp the other end of the integrated circuit. The clamping of both ends of the integrated circuit by the fixed clamping plate 4 and the movable clamping plate 401 facilitates the operator's testing work. The fixed clamping plate 4 and the movable clamping plate 401 can also be used to rotate and adjust the integrated circuit during clamping. The fixed seat 3 is installed at the bottom of the main frame 101 through the rotating shaft 303, so the direction of clamping the main frame 101 and the integrated circuit fixed inside it can be rotated and adjusted by the fixed seat 3 and the rotating shaft 303, so that the operator can simulate and adjust it according to the actual working conditions of the integrated circuit. The fixed seat 3 is fixed by the fixed through hole 301 and bolts, and the installation of the fixed seat 3 ensures the stability of the clamp during operation.
[0028] Example 2
[0029] Based on Example 1, such as Figure 2 , Figure 4 and Figure 5 As shown, the conductor mechanism 2 includes a right-angle plate 201 that is slidably mounted on the back of the fixed clamping plate 4. A wire clamp 202 is fixedly mounted on one end of the right-angle plate 201, and a grounding wire 501 is fixedly mounted on the back of the right-angle plate 201. One end of the grounding wire 501 passes through the right-angle plate 201 and is fixedly mounted with a grounding clamp 5, and the other end of the grounding wire 501 is fixedly mounted with a grounding connector 502.
[0030] In use, the right-angle plate 201 is slidably mounted on the back of the fixed clamp 4. The wire clamp 202 installed at one end of the right-angle plate 201 can clamp and fix the test wires connected to the integrated circuit. The cooperation of the right-angle plate 201 and the wire clamp 202 can make synchronous adjustment between the test wires and the integrated circuit, thereby avoiding the situation where the test wires are pulled and the interface is deformed and damaged when the integrated circuit is rotated and adjusted alone. This ensures the stability of the fixture when testing and adjusting the integrated circuit. The grounding clamp 5 can be clamped on the outside of the integrated circuit, and the grounding wire 501 and the grounding connector 502 are connected to the external grounding rod, so that the integrated circuit in the fixture can be grounded during testing. Grounding avoids the situation where static electricity damages the integrated circuit during the test operation, increasing the safety of the integrated circuit being tested on the fixture.
[0031] like Figure 2 , Figure 3 and Figure 5 As shown, flexible pads 402 are fixedly installed on the inner sides of both the fixed clamping plate 4 and the movable clamping plate 401.
[0032] In use, the flexible pad 402 can make flexible contact with both sides of the integrated circuit when the fixed clamping plate 4 and the movable clamping plate 401 clamp it, which avoids surface scratches or damage caused by the fixed clamping plate 4 and the movable clamping plate 401 when clamping the integrated circuit, and improves the safety of the fixture when clamping the integrated circuit.
[0033] like Figure 2 , Figure 3 and Figure 5 As shown, a rotating handwheel 403 connected to a movable clamping plate 401 is rotatably mounted on the top of one side of the shrink plate 102, and an angle locking shaft 404 is rotatably mounted on the top of the shrink plate 102.
[0034] In use, the rotating handwheel 403 is connected to the movable clamping plate 401 via a shaft. By operating the rotating handwheel 403, the operator can rotate and adjust the movable clamping plate 401 and the integrated circuit, which improves the convenience of the operator when rotating and adjusting the integrated circuit. The bottom of the angle locking shaft 404 abuts against the top surface of the shaft of the rotating handwheel 403, so rotating the angle locking shaft 404 can lock the shaft, thereby fixing the integrated circuit within an angle for testing.
[0035] like Figure 4 As shown, positioning rings 203 are fixedly installed at equal distances on the top and bottom of the inner wall of the wire clamp 202, and the positioning rings 203 correspond to each other vertically.
[0036] During use, the positioning ring 203 can clamp and fix the top and bottom of the test line, ensuring the stability of the test line within the clamp 202 and preventing slippage.
[0037] like Figure 3 As shown, a directional locking shaft 105 is threadedly installed on the top of the main frame 101, and a limiting groove 302 that cooperates with the directional locking shaft 105 is provided on the top of the fixed seat 3.
[0038] In use, the bottom of the directional locking shaft 105 extends into the limiting groove 302. By adjusting the height of the directional locking shaft 105, the fixture can be locked when rotating, ensuring the stability of the fixture for testing integrated circuits in one direction.
[0039] like Figure 3 and Figure 5 As shown, an operating rod 106 is fixedly installed on one side of the shrink plate 102, and a rubber sleeve is fixedly installed on the outer wall of the operating rod 106.
[0040] When in use, the operating lever 106 is easy for staff to hold, which makes it convenient for staff to pull and expand the shrink plate 102 outward through the operating lever 106, thus improving the convenience of staff to move and expand the shrink plate 102 outward.
[0041] Working principle: The fixed clamp 4 and the movable clamp 401 can clamp and fix both ends of the integrated circuit and adjust the angle of the integrated circuit during testing. The rotating shaft 303 can rotate and adjust the direction of the integrated circuit during testing. The wire clamp 202 can fix the test wires, so that the test wires can be adjusted synchronously when adjusting the integrated circuit, avoiding the deformation and damage of the integrated circuit interface caused by the pulling of the test wires during adjustment. The grounding clamp 5 and the grounding wire 501 can ground the integrated circuit in the fixture during testing, avoiding damage to the integrated circuit caused by static electricity during testing.
[0042] Although embodiments of the present invention have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the claims and their equivalents.
Claims
1. An integrated circuit test fixture module, characterized by: The utility model provides a kind of wire fixing device, including clamping mechanism and wire mechanism assembled in the back of clamping mechanism; The clamping mechanism includes a main frame, a retractable plate is slidably installed on one side of the main frame by two sets of telescopic rods, a return spring is fixedly installed at the bottom of one side of the retractable plate and extends into the main frame, a moving clamp plate is rotatably installed at the top of one side of the retractable plate, a fixed clamp plate is rotatably installed at the top of one side of the main frame and cooperates with the moving clamp plate, a fixed seat is rotatably installed at the central position of the bottom of the main frame by a rotating shaft, and a fixed through hole is equidistantly arranged on the outside of the top of the fixed seat. The wire mechanism includes a right-angle plate slidably installed on the back of the fixed clamp plate, a wire clamp is fixedly installed at one end of the right-angle plate, a grounding wire is fixedly installed on the back of the right-angle plate, a grounding clamp is fixedly installed at one end of the grounding wire penetrating through the right-angle plate, and a grounding connector is fixedly installed at the other end of the grounding wire.
2. An integrated circuit test fixture module according to claim 1, wherein: Flexible pads are fixedly installed on the inner sides of the fixed clamp plate and the moving clamp plate.
3. An integrated circuit test fixture module according to claim 1, wherein: A rotating hand wheel connected to the moving clamp plate is rotatably installed at the top of one side of the retractable plate, and an angle lock shaft is rotatably installed at the top of the retractable plate.
4. An integrated circuit test fixture module according to claim 1, wherein: Positioning rings are equidistantly fixedly installed on the top and bottom inner walls of the wire clamp, and the positioning rings are in upper and lower correspondence.
5. An integrated circuit test fixture module according to claim 1, wherein: A direction lock shaft is threadedly installed at the top of the main frame, and a limiting groove cooperatively used with the direction lock shaft is arranged at the top of the fixed seat.
6. An integrated circuit test fixture module according to claim 1, wherein: An operating rod is fixedly installed on one side of the retractable plate, and a rubber sleeve is fixedly installed on the outer wall of the operating rod.