Battery and battery internal chip protection device

By designing a modularly packaged chip protection device inside the battery, including a current-limiting resistor and a transistor overvoltage protection circuit, the problem of damage to the internal chips of the battery during high-voltage testing is solved, thus achieving protection of the internal chips of the battery and simplified maintenance of the circuit.

CN224036419UActive Publication Date: 2026-03-24BEIJING INST OF TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-28
Publication Date
2026-03-24

AI Technical Summary

Technical Problem

Existing high-voltage testing methods may damage the chips or circuits inside the battery that are connected to the tabs, causing it to malfunction.

Method used

A modularly packaged battery internal chip protection device was designed, including a current-limiting resistor, a diode, and a transistor overvoltage protection circuit, which are connected in series between the battery top cover tab and the internal chip to cut off the current during high-voltage testing and protect the internal chip.

Benefits of technology

It protects the internal chips of the battery during high-voltage testing, prevents damage, ensures that the chips work normally under high voltage, and simplifies the manufacturing and maintenance of the battery's internal circuitry.

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Abstract

The utility model discloses a battery and a battery internal chip protection device, and relates to the field of battery testing, the battery comprises a battery top cover tab, a battery cell tab, a battery internal chip protection device and a battery internal chip; the battery top cover tabs comprise a battery top cover positive tab and a battery top cover negative tab; the battery cell tabs comprise a battery cell positive tab and a battery cell negative tab; the battery internal chip protection device adopts a modular packaging design and is packaged in a packaging module; and the packaging module is connected in series between the battery top cover tab and the battery internal chip, and is used for cutting off the current flowing from the battery cell tab to the battery internal chip in the high-voltage test process when the voltage exceeds a circuit overvoltage protection trigger threshold value, so that only the current flowing from the battery cell tab to the battery internal chip is cut off in the high-voltage test process, and the current flowing from the battery cell tab to the battery internal chip is cut off. And the current flowing through the positive and negative tabs of the battery cell is not cut off, so that the effect of protecting the chip in the battery is achieved.
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Description

TECHNICAL FIELD

[0001] The present application relates to the field of battery testing, in particular to a battery and a battery internal chip protection device. BACKGROUND

[0002] In the process of manufacturing batteries, in order to ensure product quality, the produced batteries need to be tested under high voltage. Since the battery is internally provided with a diaphragm, if the diaphragm has micro-holes or dust particles are mixed in the production process, it is easy to cause the battery to short circuit.

[0003] The existing high-voltage testing method usually applies a high voltage of 200V-300V to the tab of the battery through a probe to detect whether there is a short circuit risk under high voltage. During testing, the high voltage applied will cause the particles, burrs and other undesirable factors existing in the battery to pierce the diaphragm, and the short circuit detection device will identify the battery cells with short circuit risk and remove them to prevent them from flowing into the subsequent process. This testing method effectively screens out battery cells with short circuit risks by applying a pulse high voltage or detecting whether there are undesirable factors inside the battery cell under a certain voltage, thereby ensuring the safety and reliability of the battery. However, this high-voltage testing method may affect the battery internal chip or circuit connected to the tab inside the battery, causing it to be damaged by high voltage during testing and unable to work normally subsequently. Therefore, how to protect the battery internal chip when the external voltage exceeds the normal working voltage has become a problem to be solved. CONTENT OF THE UTILITY MODEL

[0004] The purpose of the present application is to provide a battery internal chip protection device to solve the problem that the battery internal chip or circuit connected to the tab inside the battery is damaged by high voltage during high-voltage testing and cannot work normally.

[0005] To achieve the above-mentioned purpose, the present application provides the following solutions:

[0006] In a first aspect, the present application provides a battery, which comprises a battery top cover tab, a battery cell tab, a battery internal chip protection device and a battery internal chip; the battery top cover tab comprises a battery top cover positive tab and a battery top cover negative tab; the battery cell tab comprises a battery cell positive tab and a battery cell negative tab;

[0007] The battery internal chip protection device is a modular packaging design and is packaged in a packaging module;

[0008] The packaging module is connected in series between the battery top cover tab and the battery internal chip, and is used to cut off the current flowing from the battery cell tab to the battery internal chip when the voltage exceeds the circuit overvoltage protection trigger threshold during high-voltage testing.

[0009] In a second aspect, the application provides a battery internal chip protection device, wherein the battery internal chip protection device is integrated with an overvoltage protection circuit.

[0010] The overvoltage protection circuit comprises a current-limiting resistor R1, a current-limiting resistor R2, a current-limiting resistor R3, a diode D1, a transistor Q1 and a transistor Q2.

[0011] One end of the current-limiting resistor R1 is connected with a voltage signal positive input end, an emitter of the transistor Q1 and an emitter of the transistor Q2; the other end of the current-limiting resistor R1 is connected with a negative electrode of the diode D1 and one end of the current-limiting resistor R2.

[0012] The other end of the current-limiting resistor R2 is connected with a base of the transistor Q1.

[0013] A positive electrode of the diode D1 is connected with a voltage signal negative input end, one end of the current-limiting resistor R3 and a voltage signal negative output end.

[0014] The other end of the current-limiting resistor R3 is connected with a collector of the transistor Q1 and a base of the transistor Q2.

[0015] The collector of the transistor Q2 is connected with a voltage signal positive output end.

[0016] According to the specific embodiments provided by the application, the following technical effects are disclosed: in the high-voltage test process, the current flowing through the positive and negative pole tabs of the battery cell is used to detect the quality of the battery; the battery internal chip protection device is packaged in a packaging module and connected in series between the battery top cover pole tab and the battery internal chip; when the voltage exceeds the overvoltage protection trigger threshold of the circuit, only the current flowing from the battery cell pole tab to the battery internal chip is cut off, and the current flowing through the positive and negative pole tabs of the battery cell is not cut off, thereby playing a role in protecting the battery internal chip. BRIEF DESCRIPTION OF DRAWINGS

[0017] In order to more clearly illustrate the technical solutions in the embodiments of the application or the prior art, the following will briefly introduce the drawings needed in the embodiments. Obviously, the drawings in the following description only constitute some embodiments of the application, and for those skilled in the art, other drawings can also be obtained without creative labor.

[0018] Figure 1 A perspective view of a battery structure provided with a battery internal chip protection device in a lithium battery high-voltage test is provided for the application.

[0019] Figure 2 A perspective view of a battery structure provided with a battery internal chip protection device in a lithium battery high-voltage test is provided for the application.

[0020] Figure 3 The circuit diagram of the battery internal chip protection device provided in this application. Detailed Implementation

[0021] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0022] To make the above-mentioned objectives, features and advantages of this application more apparent and understandable, the application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0023] Taking high-voltage testing of lithium batteries as an example, such as Figures 1-2 As shown in the figure, this application provides a battery, which includes: a battery top cover tab, a battery cell tab, a battery internal chip protection device 14, and a battery internal chip 15; the battery top cover tab includes a battery top cover positive tab 11 and a battery top cover negative tab 16; the battery cell tab includes a battery cell positive tab 13 and a battery cell negative tab 18.

[0024] The internal chip protection device 14 of the battery is a modular packaging design, which is encapsulated in the packaging module.

[0025] The encapsulation module is connected in series between the battery top cover tab and the battery internal chip 15. During high-voltage testing, when the voltage exceeds the circuit overvoltage protection trigger threshold, it cuts off the current flowing from the battery cell tab to the battery internal chip 15.

[0026] In an exemplary embodiment, to achieve connection with the battery top cover tab, a connection terminal is further included; the connection terminal includes a positive connection terminal 12 and a negative connection terminal 17; the connection terminal serves as the input terminal of the internal circuit of the battery internal chip protection device 14, extending along both sides and disposed between the battery internal chip protection device 14 and the battery internal chip 15, and the battery top cover tab and the battery cell tab are connected; the output interface of the internal circuit is fixedly connected to the battery internal chip 15 to protect the battery internal circuit from damage during high-voltage testing.

[0027] In practical applications, the positive tab 11 and the negative tab 16 of the battery top cover are the positive and negative terminals of the battery top cover.

[0028] In an exemplary embodiment, the packaging module is made of flexible conductive material, integrating circuit elements in a separate functional unit, facilitating installation and maintenance.

[0029] The outer surface of the packaging module is wrapped with an isolation layer or insulating material.

[0030] In practical applications, the battery internal chip protection device 14 is installed inside the battery, and is electrically connected between the battery cover plate tab and the battery internal chip 15, forming a series structure on the circuit.

[0031] The packaging module is made of flexible conductive material.

[0032] The fixing method of the battery internal chip protection device 14 can be welding, buckling, gluing, etc., to fix the device at a specific position inside the battery, ensuring stable and reliable operation during high-voltage testing of the battery.

[0033] In order to prevent short circuit during high-voltage testing, the battery internal chip protection device 14 can be provided with an isolation layer or insulating material on the outside, preventing high-voltage current from contacting other components of the battery, improving safety through physical isolation, ensuring that the device is not damaged, and avoiding the risk of breakdown.

[0034] As shown in Figure 3 The application also provides a battery internal chip protection device 14 applied to the above-mentioned battery, which is integrated with an overvoltage protection circuit; the overvoltage protection circuit includes current limiting resistors R1, R2, R3, a diode D1, a transistor Q1, and a transistor Q2; one end of the current limiting resistor R1 is connected with a voltage signal positive input terminal Vin+, an emitter of the transistor Q1, and an emitter of the transistor Q2; the other end of the current limiting resistor R1 is connected with a negative electrode of the diode D1 and one end of the current limiting resistor R2; the other end of the current limiting resistor R2 is connected with a base of the transistor Q1; a positive electrode of the diode D1 is connected with a voltage signal negative input terminal Vin-, one end of a current limiting resistor R3, and a voltage signal negative output terminal Vout-; the other end of the current limiting resistor R3 is connected with a collector of the transistor Q1 and a base of the transistor Q2; a collector of the transistor Q2 is connected with a voltage signal positive output terminal Vout+.

[0035] In an exemplary embodiment, the overvoltage protection circuit realizes overvoltage protection in the following manner:

[0036] When the voltage is below the preset level, the base of the transistor Q1 is high level, in the off state, the base of the transistor Q2 is low level, allowing current to flow, the voltage signal input terminal Vin voltage normal output to the load end;

[0037] When the voltage exceeds the circuit overvoltage protection trigger threshold, the transistor Q1 starts to conduct, when the transistor Q1 conducts, the base of the transistor Q2 becomes high level and the transistor Q2 is off, acting as an open circuit switch, the transistor Q2 does not allow current to flow, thereby protecting the load from high voltage.

[0038] In an exemplary embodiment, the circuit overvoltage protection trigger threshold of the overvoltage protection circuit is selected according to the maximum voltage that the battery internal chip 15 or circuit can withstand, which is determined by the diode D1 and the transistor Q1.

[0039] In an exemplary embodiment, the circuit overvoltage protection trigger threshold is: O V DZ +V be ; wherein V O is the circuit overvoltage protection trigger threshold; V DZ is the nominal steady voltage of the diode D1, V be is the voltage between the base and the emitter of the transistor Q1 when it is on.

[0040] In an exemplary embodiment, when the voltage is below the circuit overvoltage protection trigger threshold, the voltage signal is normally input to the battery internal chip; the voltage signal input terminal Vin is connected to the battery cell tab through the connection terminal, and the voltage signal output terminal Vout is connected to the battery internal chip through the conductive material; the voltage signal input terminal Vin includes a voltage signal positive input terminal Vin+ and a voltage signal negative input terminal Vin-; the connection terminal includes a positive connection terminal 12 and a negative connection terminal 17; the battery cell tab includes a battery cell positive tab 13 and a battery cell negative tab 18.

[0041] In an exemplary embodiment, the transistor Q1 and the transistor Q2 are NPN transistors.

[0042] The NPN transistor has a collector-emitter breakdown voltage of not less than 30V under high voltage test conditions; the high voltage test conditions are 200V-300V.

[0043] In an exemplary embodiment, the diode D1 is a voltage stabilizing diode.

[0044] This application can be applied to high-voltage testing scenarios. The device can effectively protect the internal chip 15 or circuit of the battery from damage during high-voltage testing, and promptly cut off the current when the circuit overvoltage protection trigger threshold, thus protecting the downstream circuit.

[0045] This application employs a modular packaging design, integrating circuit components into a single, independent packaging module. This design not only facilitates equipment manufacturing and assembly but also simplifies the maintenance and updates of the battery's internal circuitry. The modular packaging structure makes the installation of the battery's internal circuitry protection devices easier and reduces production complexity. This advantage stems from the use of flexible conductive materials in the packaging module, which allows the device to be securely fixed to specific locations inside the battery through welding, snap-fitting, or adhesive bonding, ensuring stable and reliable operation during high-voltage testing.

[0046] This application features high voltage withstand capability and low power consumption. Based on Figure 3 The circuit design and selection of high-voltage NPN transistors are crucial. The NPN transistors should have a collector-emitter breakdown voltage no lower than the high-voltage test conditions (200V-300V), meaning the collector-emitter breakdown voltage Vce of the NPN transistor should be greater than the high-voltage test voltage. Surge protection components, due to their characteristics, can only be used for instantaneous protection. Compared to surge protection components, this application can withstand high-voltage surges during high-voltage testing for extended periods. By increasing the value of the current-limiting resistor, the power consumption of the circuit during normal operation is reduced, resulting in minimal impact on the efficiency of downstream power circuits during normal operation.

[0047] This application can protect other chips or circuits connected to the battery cell tabs when the battery is subjected to a short circuit test with an external high voltage, thus achieving high voltage protection.

[0048] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0049] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. Furthermore, those skilled in the art will recognize that, based on the ideas of this application, there will be changes in the specific implementation methods and application scope. Therefore, the content of this specification should not be construed as a limitation of this application.

Claims

1. A battery, characterized in that, The battery includes: battery top cover tabs, battery cell tabs, battery internal chip protection device, and battery internal chip; the battery top cover tabs include a positive tab and a negative tab; the battery cell tabs include a positive tab and a negative tab. The internal chip protection device of the battery is a modular packaging design, encapsulated within a packaging module; The encapsulation module is connected in series between the battery top cover tab and the internal battery chip. During high-voltage testing, when the voltage exceeds the overvoltage protection trigger threshold of the circuit, it cuts off the current flowing from the battery cell tab to the internal battery chip.

2. The battery according to claim 1, characterized in that, Also includes: Connecting terminals; The connection terminal includes a positive connection terminal and a negative connection terminal; The connection terminals, serving as the input terminals of the internal circuit of the battery internal chip protection device, extend along both sides and are located between the battery internal chip protection device and the battery internal chip, and are connected to the battery top cover tab and the battery cell tab. The output interface of the internal circuit is fixedly connected to the internal chip of the battery.

3. The battery according to claim 1, characterized in that, The encapsulation module is made of a flexible conductive material; The outer surface of the encapsulation module is covered with an isolation layer or insulating material.

4. A battery internal chip protection device, characterized in that, The battery internal chip protection device is applied to the battery according to any one of claims 1-3, and the battery internal chip protection device integrates an overvoltage protection circuit. The overvoltage protection circuit includes current-limiting resistors R1, R2, and R3, diode D1, transistor Q1, and transistor Q2. One end of the current-limiting resistor R1 is connected to the positive input terminal of the voltage signal, the emitter of the transistor Q1, and the emitter of the transistor Q2; the other end of the current-limiting resistor R1 is connected to the negative terminal of the diode D1 and one end of the current-limiting resistor R2. The other end of the current-limiting resistor R2 is connected to the base of the transistor Q1; The positive terminal of the diode D1 is connected to the negative input terminal of the voltage signal, one end of the current limiting resistor R3, and the negative output terminal of the voltage signal. The other end of the current-limiting resistor R3 is connected to the collector of transistor Q1 and the base of transistor Q2. The collector of the transistor Q2 is connected to the positive output terminal of the voltage signal.

5. The battery internal chip protection device according to claim 4, characterized in that, The overvoltage protection circuit implements overvoltage protection in the following way: When the voltage is lower than the preset level, the base of transistor Q1 is at a high level and is in the off state, while the base of transistor Q2 is at a low level, allowing current to flow, and the voltage at the voltage signal input terminal is normally output to the load terminal. When the voltage exceeds the overvoltage protection trigger threshold of the circuit, transistor Q1 starts to conduct. When transistor Q1 is conducting, the base of transistor Q2 becomes high and transistor Q2 is turned off, acting as an open circuit switch. Transistor Q2 does not allow current to flow through it.

6. The battery internal chip protection device according to claim 4, characterized in that, The overvoltage protection trigger threshold of the overvoltage protection circuit is selected according to the maximum voltage that the internal chip or circuit of the battery can withstand, and is determined by the diode D1 and the transistor Q1.

7. The battery internal chip protection device according to claim 6, characterized in that, The overvoltage protection trigger threshold of the circuit is: V O =V DZ +V be ; Among them, V O This is the overvoltage protection trigger threshold for the circuit; V DZ V is the nominal stable voltage of diode D1. be This is the voltage between the base and emitter of transistor Q1 when it is turned on.

8. The battery internal chip protection device according to claim 7, characterized in that, When the voltage is below the overvoltage protection trigger threshold of the circuit, the voltage signal is normally input to the internal chip of the battery; the voltage signal input terminal is connected to the battery cell tab through the connection terminal, and the voltage signal output terminal is connected to the internal chip of the battery through the conductive material; the voltage signal input terminal includes a positive voltage signal input terminal and a negative voltage signal input terminal; the connection terminal includes a positive connection terminal and a negative connection terminal; the battery cell tab includes a positive battery cell tab and a negative battery cell tab.

9. The battery internal chip protection device according to claim 4, characterized in that, Transistors Q1 and Q2 are NPN transistors; The NPN transistor has a collector-emitter breakdown voltage that is not lower than the high-voltage test conditions; the high-voltage test conditions are 200V-300V.

10. The battery internal chip protection device according to claim 4, characterized in that, The diode D1 is a Zener diode.