Low-current test probe
By designing the outer probe to consist of a connecting bolt, a connector, and a first contact pin, and the inner probe to be integrally formed with the needle tail, and with a threaded hole at the bottom of the inner probe, the problem of inconvenient replacement after the outer probe is damaged is solved, achieving rapid disassembly and assembly and extended lifespan, thus improving testing efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-26
- Publication Date
- 2026-03-27
AI Technical Summary
The external probes of existing low-current test probes are easily damaged during testing, leading to inconvenience in replacement, increased costs, and reduced testing efficiency.
A small current test probe was designed, wherein the outer probe consists of a connector, a connector head and a first contact needle, and the inner probe is integrally formed with the needle tail and has a threaded hole at the bottom end. The outer probe and the inner probe can be quickly disassembled and assembled through the connector, which is convenient for replacement.
It enables rapid replacement of external probes, reduces contact resistance, extends service life, and improves testing efficiency.
Smart Images

Figure CN224052276U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to a small current test probe technical field especially relates to a small current test probe. BACKGROUND
[0002] Test probe is the senior precision electronic component for testing the connector on PCBA and FPC soft board, is mainly applied to electronic product such as mobile phone, plays the connecting role, in electronic testing, through test probe and test point contact, the performance parameter of PCBA can be tested, such as contact resistance, insulation resistance, voltage resistance performance etc.
[0003] Small current test probe is mainly composed of the following four parts: needle, needle tail, spring and outer tube, the surface of probe is usually gold-plated to enhance corrosion resistance, electrical performance, stability and durability 12, in addition, the manufacturing technology of probe is high, especially for semiconductor products, the size requirement reaches micron level to ensure high-precision test results, and the probe needle is composed of outer probe and inner probe, and the outer probe and the inner probe are an integral whole, and the inner probe is in contact with the spring, and the outer probe is in contact with the test equipment.
[0004] The needle of the outer probe of the small current probe needle is easy to be damaged by current erosion in the test process, if the needle of the outer probe is damaged, the whole outer probe needs to be replaced, the cost is increased, and the replacement is inconvenient and affects the test efficiency.
[0005] Therefore, it is necessary to provide a small current test probe to solve the above technical problems. UTILITY MODEL CONTENTS
[0006] The utility model provides a kind of small current test probe, solve the problem that the probe probe of an integral whole is damaged in the test process and needs to replace the whole probe needle and more cumbersome operation, which increases cost and also affects test efficiency.
[0007] To solve the above technical problems, the small current test probe provided by the utility model includes: a docking disc;
[0008] The outer tube is installed at the bottom end of the docking disc, a plurality of fixing buckles are installed on the outer surface of the outer tube at the top end position, a needle tail is installed at the bottom end of the docking disc, a spring is fixedly connected to the bottom end of the needle tail, an inner probe is fixedly connected to the bottom end of the spring, an outer thread ring is fixedly connected to the top end of the docking disc, an insulating ring is installed on the inner surface of the outer thread ring, a rotating ring is threadedly connected to the outer surface of the outer thread ring, and a docking head is fixedly connected to the top end of the needle tail.
[0009] Threaded hole, the threaded hole is opened in the bottom end of the inner probe, the bottom end of the inner probe is connected with the butt plug through the butt pad, the bottom end of the butt plug is fixedly connected with the connector, the bottom end of the connector is fixedly connected with the first contact pin, the bottom end of the other connector is fixedly connected with the second contact pin;
[0010] The fixed buckle can fix the outer tube at the bottom end of the butt plate, the needle tail penetrates from the bottom end to the top end of the butt plate, the bottom end of the inner probe can be installed with the first contact pin and the second contact pin of different models or shapes, and the first contact pin and the second contact pin are provided with the connector and the butt plug, and the outer probe with different contact pins can be selected according to requirements, and the installation mode is the same.
[0011] Preferably, the outer surface of the rotating ring is provided with anti-skid lines, and the top end of the rotating ring is fixedly connected with a limiting ring.
[0012] The matching outer thread ring can fix the needle tail on the butt plate.
[0013] Preferably, the bottom of the butt plate is fixedly connected with a mounting buckle near the outer surface, and the mounting buckle is provided with a fixed bolt on one side.
[0014] The fixed bolt can fix the clamping block clamped into the mounting buckle.
[0015] Preferably, the mounting buckle is provided with a clamping block inside, the clamping block is provided with a mounting hole on one side, and the bottom of the clamping block is fixedly connected with a butt piece.
[0016] The mounting hole and the fixed bolt are threadedly connected.
[0017] Preferably, the bottom of the butt piece is fixedly connected with a rotating buckle, and the bottom end of the rotating buckle is rotatably connected with an adjusting bolt.
[0018] The adjusting bolt and the rotating buckle can rotate, but the rotation has certain resistance.
[0019] Preferably, the bottom end of the adjusting bolt is fixedly connected with a fixed piece, and the bottom of the fixed piece is provided with a plurality of fixed holes.
[0020] The fixed piece is fixed in the corresponding position by penetrating the fixed holes through the bolts.
[0021] Compared with the related art, the small current test probe has the following beneficial effects:
[0022] The utility model provides a kind of small current test probe, to facilitate probe outer probe replacement after damage, first integrally form spring, inner probe and needle tail, reduce self contact impedance, and a threaded hole is set in the bottom end of inner probe, and cooperation butt joint bolt can realize outer probe and inner probe quick disassembly, and outer probe is by butt joint bolt, connecting head and first contact needle, by the design of integrally formed spring, inner probe and needle tail, while reducing impedance, it is beneficial to prolong service life, simultaneously by the inner probe and outer probe that can be separated, it is convenient to replace when probe is damaged, it is beneficial to improve test efficiency. BRIEF DESCRIPTION OF DRAWINGS
[0023] Figure 1 For the structure schematic view of a preferred embodiment of the small current test probe provided by the utility model;
[0024] Figure 2 For the structure schematic view of outer pipe provided by the utility model;
[0025] Figure 3 For the structure schematic view of butt joint pad provided by the utility model;
[0026] Figure 4 For the structure schematic view of limit ring provided by the utility model;
[0027] Figure 5 For the structure schematic view of a preferred embodiment of the small current test probe provided by the utility model; Figure 3 The enlarged view of the A shown in the figure.
[0028] Marked number in figure: 1, butt joint disc, 2, fixed buckle, 3, outer pipe, 4, inner probe, 5, connecting head, 6, first contact needle, 7, butt joint bolt, 8, rotating ring, 9, second contact needle, 10, anti-skid line, 11, limit ring, 12, butt joint, 13, needle tail, 14, installation buckle, 15, insulating ring, 16, outer thread ring, 17, spring, 18, threaded hole, 19, butt joint pad, 20, fixed bolt, 21, mounting hole, 22, clamping block, 23, butt joint piece, 24, fixed hole, 25, fixed piece, 26, adjusting bolt, 27, rotating buckle. DETAILED DESCRIPTION
[0029] The utility model is further described below in connection with drawing and embodiment.
[0030] Please combine with Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 And Figure 5 Among them, Figure 1 For the structure schematic view of a preferred embodiment of the small current test probe provided by the utility model; Figure 2 For the structure schematic view of outer pipe provided by the utility model; Figure 3The utility model provides a structure schematic drawing of anti -skid pad; Figure 4 The utility model provides a structure schematic drawing of limiting ring; Figure 5 The utility model provides Figure 3 The small current test probe includes: the butt joint disc 1 of the enlarged view of A shown.
[0031] The outer tube 3 is installed at the bottom end of butt joint disc 1, the outer surface of outer tube 3 is equipped with a plurality of fixed buckles 2 at the position of top end, the bottom end of butt joint disc 1 is equipped with needle tail 13, the bottom end of needle tail 13 is fixedly connected with spring 17, the bottom end of spring 17 is fixedly connected with inner probe 4, the top end of butt joint disc 1 is fixedly connected with outer thread ring 16, the inner surface of outer thread ring 16 is equipped with insulating ring 15, the outer surface of outer thread ring 16 is threadedly connected with rotating ring 8, the top end of needle tail 13 is fixedly connected with butt joint 12.
[0032] The threaded hole 18 is opened at the bottom end of inner probe 4, the bottom end of inner probe 4 is threadedly connected with butt joint bolt 7 through butt joint pad 19, the bottom end of butt joint bolt 7 is fixedly connected with connecting head 5, the bottom end of connecting head 5 is fixedly connected with first contact pin 6, the bottom end of another connecting head 5 is fixedly connected with second contact pin 9.
[0033] Fixed buckle 2 can fix outer tube 3 at the bottom end of butt joint disc 1, needle tail 13 penetrates from the bottom end to the top end of butt joint disc 1, the bottom end of inner probe 4 can install different models or shapes of first contact pin 6 and second contact pin 9, and first contact pin 6 and second contact pin 9 are all equipped with connecting head 5 and butt joint bolt 7, according to the requirement, the outer probe of different contact pins can be selected, and the installation mode is same, insulating ring 15 is located between outer thread ring 16 and needle tail 13, butt joint 12 is convenient and corresponding line connection.
[0034] The outer surface of rotating ring 8 is equipped with anti -skid line 10, the top end of rotating ring 8 is fixedly connected with limiting ring 11.
[0035] Limiting ring 11 is sleeved on the outer surface of needle tail 13, and needle tail 13 can be fixed on butt joint disc 1 in cooperation with outer thread ring 16.
[0036] The bottom close to the position of outer surface of butt joint disc 1 is fixedly connected with mounting buckle 14, one side of mounting buckle 14 is equipped with fixed bolt 20.
[0037] Fixed bolt 20 can fix the clamping block 22 clamped into the mounting buckle 14, and the mounting buckle 14 is open at the bottom.
[0038] The inside of mounting buckle 14 is equipped with clamping block 22, one side of clamping block 22 is equipped with mounting hole 21, and the bottom of clamping block 22 is fixedly connected with butt joint sheet 23.
[0039] The mounting hole 21 and the fixing bolt 20 are threadedly connected, so that the clamping block 22 can be fixed.
[0040] The bottom of the butt joint piece 23 is fixedly connected with a rotating buckle 27, and the bottom end of the rotating buckle 27 is rotatably connected with an adjusting bolt 26.
[0041] The adjusting bolt 26 and the rotating buckle 27 can rotate, but the rotation has certain resistance, so that the butt joint disc 1 can be stably adjusted to the corresponding position.
[0042] The bottom end of the adjusting bolt 26 is fixedly connected with a fixing piece 25, and the bottom of the fixing piece 25 is provided with a plurality of fixing holes 24.
[0043] The fixing piece 25 is fixed in the corresponding position through the fixing holes 24 and the bolts, so that the butt joint disc 1 can be fixed, and the angle of the butt joint disc 1 can be adjusted according to requirements.
[0044] The working principle of the small current test probe is as follows:
[0045] The spring 17, the inner probe 4 and the needle tail 13 are integrally formed, the self contact impedance is reduced, a threaded hole 18 is formed in the bottom end of the inner probe 4, the outer probe and the inner probe 4 can be quickly disassembled through cooperation of the butt joint bolt 7, the outer probe is composed of the butt joint bolt 7, the connecting head 5 and the first contact needle 6, when the outer probe needs to be used, the outer tube 3 is installed at the bottom end of the butt joint disc 1 through the fixing buckle 2, the spring 17, the needle tail 13 and the inner probe 4 are covered, then the outer probe with the corresponding shape is installed at the bottom end of the inner probe 4 through the butt joint bolt 7, and the small current test can be performed, when the damaged outer probe or other type of outer probe needs to be replaced, the outer probe can be taken down for replacement by rotating the butt joint bolt 7 and taking out the threaded end of the butt joint bolt 7 from the threaded hole 18.
[0046] Compared with the related art, the small current test probe has the following beneficial effects:
[0047] In order to facilitate replacement of the probe outer probe after damage, the spring 17, the inner probe 4 and the needle tail 13 are integrally formed, the self contact impedance is reduced, a threaded hole 18 is formed in the bottom end of the inner probe 4, the outer probe and the inner probe 4 can be quickly disassembled through cooperation of the butt joint bolt 7, the outer probe is composed of the butt joint bolt 7, the connecting head 5 and the first contact needle 6, through the design, the integrally formed spring 17, the inner probe 4 and the needle tail 13 are used, the impedance is reduced, the service life is prolonged, the inner probe 4 and the outer probe can be separated, the probe can be replaced when damaged, and the test efficiency is improved.
[0048] The above merely illustrates the embodiments of the present application, and does not limit the patent scope of the present application, and any equivalent structure or equivalent process transformation, or direct or indirect application in other related technical fields, which are made according to the content of the present application specification and drawings, are also included in the patent protection scope of the present application.
Claims
1. A low-current test probe, characterized in that, include: docking plate; An outer tube is installed at the bottom of the docking plate. Multiple fixing buckles are installed on the outer surface of the outer tube at the top. A needle tail is installed at the bottom of the docking plate. A spring is fixedly connected to the bottom of the needle tail. An inner probe is fixedly connected to the bottom of the spring. An external threaded ring is fixedly connected to the top of the docking plate. An insulating ring is installed on the inner surface of the external threaded ring. A rotating ring is threadedly connected to the outer surface of the external threaded ring. A connector is fixedly connected to the top of the needle tail. A threaded hole is formed at the bottom end of the inner probe. The bottom end of the inner probe is threadedly connected to a mating pin via a mating washer. A connector is fixedly connected to the bottom end of the mating pin. A first contact pin is fixedly connected to the bottom end of the connector, and a second contact pin is fixedly connected to the bottom end of the other connector.
2. The low-current test probe according to claim 1, characterized in that, The outer surface of the rotating ring is provided with anti-slip texture, and a limit ring is fixedly connected to the top of the rotating ring.
3. The low-current test probe according to claim 1, characterized in that, A mounting buckle is fixedly connected to the bottom of the docking plate near the outer surface, and a fixing bolt is installed on one side of the mounting buckle.
4. The low-current test probe according to claim 3, characterized in that, The mounting buckle has a locking block installed inside, and a mounting hole is opened on one side of the locking block. A mating piece is fixedly connected to the bottom of the locking block.
5. The low-current test probe according to claim 4, characterized in that, The bottom of the mating piece is fixedly connected to a rotating buckle, and the bottom end of the rotating buckle is rotatably connected to an adjusting bolt.
6. The low-current test probe according to claim 5, characterized in that, The bottom end of the adjusting bolt is fixedly connected to a fixing plate, and the bottom of the fixing plate has multiple fixing holes.