Piezoelectric material center node testing device for high-voltage pulse transient response method
By designing a piezoelectric material testing device with a positioning platform and a slider linkage shaft, the frequency drift problem caused by the ejector pin deviating from the sample center was solved, ensuring accurate testing of piezoelectric materials under high voltage.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-15
- Publication Date
- 2026-03-27
AI Technical Summary
Existing piezoelectric material testing devices struggle to ensure that the coaxial upper and lower probes are centered on the sample under high voltage, leading to vibration frequency drift and making it impossible to obtain accurate test data.
The test device is designed with a positioning platform, a slider linkage shaft, a sample groove, a coaxial upper ejector pin, and a coaxial lower ejector pin. The slider linkage shaft ensures that the sample is centered in the length direction. The modular sample groove is adapted to samples of different widths, and the height-adjustable ejector pin is adapted to samples of different thicknesses, ensuring that the vibration node is centered on the sample.
The vibration frequency of piezoelectric materials was stabilized under high-voltage pulses, and accurate test data were obtained.
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Figure CN224052305U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model belongs to piezoelectric material testing device field relates to a kind of piezoelectric material central node testing device for high voltage pulse transient response method. BACKGROUND
[0002] The piezoelectric material in piezoelectric ultrasonic welding and other high-power piezoelectric devices is continuously driven under high voltage, and when selecting piezoelectric material and designing device, the material characteristics of piezoelectric material under high-power drive need to be accurately understood.
[0003] When driven under high voltage, the sample temperature rises due to heating caused by nonlinear effects and domain wall motion, and the resonance state is unstable, making it difficult to measure piezoelectric characteristics. Therefore, a high-voltage pulse transient response method for high-power characteristic evaluation has been developed and has become an international testing standard for evaluating the high-power characteristics of various piezoelectric materials.
[0004] Li Guorong's research group at Shanghai Institute of Silicate also conducted research on piezoelectric ceramic high-power characteristic testing and built a high-power testing device for piezoelectric ceramics. The waveform generator in the high-power testing device generates a waveform signal that can cause the piezoelectric ceramic to resonate, and the signal is amplified through a power amplifier to load voltage on the piezoelectric ceramic sample. The changes in voltage and current on the sample can be monitored through an oscilloscope. The piezoelectric ceramic undergoes radial vibration under the excitation of the voltage signal, and the vibration speed is measured by a Doppler laser vibration meter. The temperature rise of the sample can be measured by a temperature meter. By adjusting the voltage signal on the power amplifier, the vibration speed and temperature rise of the piezoelectric ceramic will change. However, when testing the piezoelectric material, the sample size is long and narrow, and if the coaxial upper and lower pins are not at the center point of the sample, the vibration frequency will drift, making it impossible to obtain accurate test data. 31 When vibrating, the sample size is long and narrow, and if the coaxial upper and lower pins are not at the center point of the sample, the vibration frequency will drift, making it impossible to obtain accurate test data. UTILITY MODEL CONTENTS
[0005] In order to overcome the shortcomings of the prior art, the utility model aims to provide a piezoelectric material center node testing device for high voltage pulse transient response method, to solve the technical problem that the existing coaxial upper and lower pins cannot be at the center point of the sample, and the vibration frequency drift cannot obtain accurate test data.
[0006] In order to achieve the above-mentioned purpose, the utility model adopts the following technical solutions:
[0007] The utility model provides a piezoelectric material center node testing device for high voltage pulse transient response method, which comprises a positioning platform, a sliding block linkage shaft, a sample groove, a coaxial upper pin, a coaxial lower pin and an L-shaped plate.
[0008] The slider linkage shaft is arranged at the top end of the positioning platform, the sample groove is arranged at the two sides of the top end of the positioning platform in parallel with the L-shaped plate, the L-shaped plate, the slider linkage shaft and the sample groove are arranged in sequence on the center line of the positioning platform, the coaxial upper ejector pin and the coaxial lower ejector pin are arranged on the L-shaped plate and the positioning platform respectively, the coaxial upper ejector pin and the coaxial lower ejector pin are arranged at the upper portion and the lower portion of the sample groove, and the coaxial upper ejector pin and the coaxial lower ejector pin are arranged coaxially to form a suspended clamping structure for clamping the sample and locking the sample in suspension.
[0009] In an embodiment, the slider linkage shaft comprises a symmetric positive and negative threaded shaft, a first fixed block, a first slider, a second slider and a second fixed block arranged in sequence on the symmetric positive and negative threaded shaft; wherein the first fixed block and the second fixed block are symmetrically arranged, and the first slider and the second slider are symmetrically arranged.
[0010] In an embodiment, the symmetric positive and negative threaded shaft is rotated to drive the first slider and the second slider to move synchronously and reversely at equal distances, and the first slider and the second slider are used to clamp the sample and adjust the length direction of the sample to be in the center position.
[0011] In an embodiment, the sample groove and the L-shaped plate are respectively provided with a first center hole and a second center hole, and a positioning fixed hole is arranged on the positioning platform, the coaxial upper ejector pin passes through the second center hole, and the coaxial lower ejector pin passes through the positioning fixed hole and the first center hole in sequence.
[0012] In an embodiment, the coaxial upper ejector pin is threadedly connected with an upper ejector pin nut, and the coaxial lower ejector pin is threadedly connected with a lower ejector pin nut.
[0013] In an embodiment, the slot size of the sample groove is matched with the width size of the sample.
[0014] In an embodiment, the coaxial upper ejector pin is a spring ejector pin.
[0015] In an embodiment, the diameters of the coaxial upper ejector pin and the coaxial lower ejector pin are less than 1mm.
[0016] In an embodiment, two groups of magnetic suction bases are symmetrically arranged at the two sides of the lower end of the positioning platform.
[0017] In an embodiment, a magnetic suction switch is arranged on the magnetic suction base.
[0018] Compared with the prior art, the utility model has the following beneficial effects:
[0019] The utility model provides a kind of for high voltage pulse transient response method piezoelectric material center node testing device, the testing device is guaranteed sample length direction to be in central position by slider linkage shaft, it is suitable for different width sample to test by modular sample groove, and make the width direction of different width sample test be in central position, by height adjustable coaxial upper pin, coaxial lower pin, different thickness sample is tested, it is convenient for the vibration node of different size piezoelectric material when high-power pulse voltage drives to be in sample center position, to obtain accurate test data.L-shaped plate is used to set coaxial upper pin, coaxial upper pin and coaxial lower pin are in sample center point and lock after sample is clamped and makes sample hang, vibration frequency does not drift, test data is accurate.
[0020] Further, by the rotation symmetry positive and negative screw shaft in slider linkage shaft, left and right sliders move towards opposite direction and ensure that moving distance is same, ensure that sample center is in coaxial upper pin, coaxial lower pin center position. BRIEF DESCRIPTION OF DRAWINGS
[0021] Figure 1 It is the first visual angle structural diagram of the whole for the utility model a kind of for high voltage pulse transient response method piezoelectric material center node testing device;
[0022] Figure 2 It is the second visual angle structural diagram of the whole for the utility model a kind of for high voltage pulse transient response method piezoelectric material center node testing device;
[0023] Figure 3 It is the structural diagram of slider linkage shaft in the utility model a kind of for high voltage pulse transient response method piezoelectric material center node testing device;
[0024] Figure 4 It is the structural diagram of coaxial upper pin in the utility model a kind of for high voltage pulse transient response method piezoelectric material center node testing device;
[0025] In the drawing: 1-positioning platform;2-magnetic base;3-slider linkage shaft;4-sample groove;5-coaxial upper pin;6-coaxial lower pin;7-L-shaped plate;8-fixed block;9-slider;10-symmetry positive and negative screw shaft;11-upper pin nut;12-lower pin nut;13-spring. DETAILED DESCRIPTION
[0026] In order to make the person skilled in the art better understand the technical scheme of the present application, the technical scheme in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person skilled in the art without creative labor should belong to the scope of protection of the present application.
[0027] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above drawings are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device including a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to these processes, methods, products or devices.
[0028] The present application will be described in further detail below in conjunction with the drawings:
[0029] The present application provides a kind of for high voltage pulse transient response method piezoelectric material center node testing device, the testing device includes positioning platform 1, positioning platform 1 top is provided with slider linkage shaft 3;Positioning platform 1 top two sides are respectively provided with sample groove 4 and L-shaped plate 7, L-shaped plate 7, slider linkage shaft 3 and sample groove 4 are sequentially collinear and arranged on the center line of positioning platform 1;Positioning platform 1 and L-shaped plate 7 are respectively provided with coaxial lower pin 6 and coaxial upper pin 5;Coaxial upper pin 5 and coaxial lower pin 6 are coaxially arranged in the upper portion and lower portion of sample groove 4, coaxial upper pin 5 and coaxial lower pin 6 are coaxially arranged to form suspended clamping structure, for clamping sample and locking after making sample suspended.
[0030] Further, sample groove 4 and L-shaped plate 7 are respectively provided with first center hole and second center hole, positioning platform 1 is provided with positioning fixed hole, coaxial upper pin 5 passes through second center hole, coaxial lower pin 6 sequentially passes through positioning fixed hole and first center hole;Coaxial upper pin 5 and coaxial lower pin 6 are coaxially arranged.
[0031] Referring to Figure 4, coaxial upper pin 5 and upper pin nut 11 are threadedly connected, coaxial upper pin 5 has spring 13 inside, coaxial lower pin 6 and lower pin nut 12 are threadedly connected, further, coaxial upper pin 5 needle naturally contacts on the sample, and upper pin nut 11 is tightened, then coaxial lower pin 6 is moved upwards, spring 13 inside coaxial upper pin is compressed to adjust the height of the sample, so that the sample is suspended and the lower pin nut 12 is tightened. The gap reserved by the upper and lower pins is sufficient to ensure that the sample of different heights is adjusted to the height of the sample in the test.
[0032] Further, the slider linkage shaft 3 includes a symmetric positive and negative thread shaft 10, a left fixed block 8, a left slider 9, a right slider 9 and a right fixed block 8 arranged in sequence on the symmetric positive and negative thread shaft 10; wherein the left and right fixed blocks 8 are symmetrically arranged, the left and right sliders 9 are symmetrically arranged, and the left and right sliders 9 can clamp the sample to adjust the sample to be in the center position in the length direction. The symmetric positive and negative thread shaft 10 in the slider linkage shaft 3 rotates to drive the left and right sliders 9 to move synchronously and reversely at equal distances. The fixed block 8 is used to fix the slider linkage shaft 3 on the positioning platform 1.
[0033] Further, the slot size of the sample groove 4 matches the width size of the sample, which is suitable for testing different width samples, and makes the width direction of the different width samples in the center position during testing.
[0034] In a specific implementation, referring to Figure 1 、 Figure 2 The embodiment provides a high-voltage pulse transient response method piezoelectric material center node test device, which comprises a positioning platform 1, a magnetic suction base 2, a slider linkage shaft 3, a sample groove 4, an L-shaped plate 7 and coaxial upper pins 5 and coaxial lower pins 6.
[0035] The positioning platform 1 is provided with a positioning fixed hole, the magnetic suction base 2 is arranged on the lower end of the positioning platform 1 and symmetrically arranged on the left and right sides, the slider linkage shaft 3 is arranged on the upper end of the positioning platform 1 and symmetrically arranged on the center of the left and right sides, and the slider linkage shaft 3 is provided with a fixed block 8 and a slider 9, the sample groove 4 is arranged on the center line bottom end of the upper end of the positioning platform 1, the coaxial upper pins 5 are spring pins, the coaxial upper pins 5 and the coaxial lower pins 6 are arranged on the upper part and the lower part of the center of the sample groove 4 respectively, the coaxial upper pins 5 are installed on the L-shaped plate 7, and the coaxial lower pins 6 are installed on the positioning platform 1.
[0036] The magnetic suction base 2 is provided with a magnetic suction switch, which facilitates installation and disassembly of the test device.
[0037] Referring to Figure 3The sliders 9 on the left and right sides of the slider linkage shaft 3 are symmetrical. The linkage shaft passing through the fixed block 8, i.e. the symmetrical positive and negative thread shaft 10, is symmetrical on the left and right sides. By rotating the linkage shaft, the left and right sliders 9 move in opposite directions to clamp the two ends of the sample in the length direction, ensuring that the center of the sample is at the center position of the upper and lower ejector pins.
[0038] The sample well 4 is modularly designed and can be replaced according to different sample sizes, ensuring that the sample center is at the center of the upper and lower ejector pins. The width of the sample well 4 is adapted to the sample width, and a first central hole is opened on the sample well 4, through which the coaxial lower ejector pin 6 passes.
[0039] The diameters of the coaxial upper ejector pin 5 and coaxial lower ejector pin 6 are less than 1mm. At the same time, there is a nut on the ejector pin. When the nut is loosened, the ejector pin can move up and down to adjust the height of the ejector pin, so as to ensure that it can be used for different sample thicknesses.
[0040] The coaxial upper ejector pin 5 is a spring ejector pin, which ensures stable clamping of the sample when it vibrates, and ensures that the coaxial lower ejector pin 6 moves upward to compress the spring 13 set inside the upper ejector pin 5, so that the sample is suspended in the air.
[0041] The sample slot 4 and the L-shaped plate 7 are respectively provided with a first center hole and a second center hole. The positioning platform 1 is provided with a positioning and fixing hole. The coaxial upper ejector pin 5 passes through the second center hole on the L-shaped plate 7, and the coaxial lower ejector pin 6 passes through the positioning and fixing hole and the first center hole of the sample slot 4, while ensuring that the coaxial upper ejector pin 5 and the coaxial lower ejector pin 6 are coaxial.
[0042] To facilitate high-power pulse piezoelectric testing of elongated samples under transverse length-extension mode, based on the sample dimensions (typically 30*5*1mm), refer to... Figure 1 , Figure 2 and Figure 3 As shown, the sample slot 4 should be a module with a width of 5mm. The sample is placed in the sample slot 4. The slider linkage shaft 3 moves the slider 9 towards the center and clamps both ends of the sample through the symmetrical positive and negative thread shaft 10. The coaxial upper ejector pin 5 gradually lowers so that the ejector pin presses against the upper surface of the sample, and the coaxial lower ejector pin 6 gradually rises so that the ejector pin presses against the lower surface of the sample. After the coaxial upper ejector pin 5 and coaxial lower ejector pin 6 clamp the sample, they are adjusted up and down to make the sample suspended and then locked. Through the above operation, it can be ensured that the vibration node of the piezoelectric material is at the center position of the sample when driven by high-power pulse voltage, so as to obtain accurate test data.
[0043] Specifically, the installation and use process is as follows: the sample is placed in the sample groove 4, the sample in the sample groove 4 is clamped by the left and right sliders 9, the center position is adjusted, then the left and right sliders 9 are moved away, the upper coaxial ejector pin 5 is loosened from the upper ejector pin nut 11, naturally contacts the upper surface center of the sample, and the upper ejector pin nut 11 is tightened; then the lower coaxial ejector pin 6 contacts the lower surface center of the sample and moves upward, the upper coaxial ejector pin 5 has a spring 13, so that the sample can be suspended, and finally the lower ejector pin nut 12 is tightened.
[0044] In order to make the left and right ends of the slider 9 move in opposite directions by the same distance, referring to Figure 1 and Figure 3 As shown, the fixed block 8 is symmetrically arranged at the left and right ends of the positioning platform 1 to fix the slider linkage shaft 3 on the positioning platform 1, and the threads at the left and right ends of the symmetric positive and negative threaded shaft 10 are respectively left and right rotating. The left and right sliders 9 are symmetric about the center of the symmetric positive and negative threaded shaft 10. Through the design, it can be ensured that when the symmetric positive and negative threaded shaft 10 is rotated, the left and right ends of the slider 9 move in opposite directions and the moving distance is the same, which also ensures that the vibration node of the piezoelectric material under the driving of high-power pulse voltage is at the center position of the sample.
[0045] Further, the magnetic base 2 can conveniently fix the whole device. Only by slightly twisting the magnetic switch, the device can be firmly fixed on the optical platform. The center hole of the sample groove 4 and the L-shaped plate 7 is accurate, so that the coaxial upper ejector pin 5 and the coaxial lower ejector pin 6 can be coaxial, which is also the key to obtain accurate test data.
[0046] The above content only illustrates the technical idea of the present application, and cannot limit the protection scope of the present application. Any modification made on the basis of the technical scheme according to the technical idea of the present application falls within the protection scope of the claims of the present application.
Claims
1. A high voltage pulse transient response method piezoelectric material center node testing device, characterized in that, The device comprises a positioning platform (1), a slider linkage shaft (3), a sample groove (4), a coaxial upper ejector pin (5), a coaxial lower ejector pin (6), and an L-shaped plate (7). The slider linkage shaft (3) is arranged at the top end of the positioning platform (1), the sample groove (4) and the L-shaped plate (7) are arranged on the two sides of the top end of the positioning platform (1), the L-shaped plate (7), the slider linkage shaft (3), and the sample groove (4) are arranged in line on the center line of the positioning platform (1) in sequence, the coaxial upper ejector pin (5) and the coaxial lower ejector pin (6) are respectively arranged on the L-shaped plate (7) and the positioning platform (1), the coaxial upper ejector pin (5) and the coaxial lower ejector pin (6) are coaxially arranged at the upper and lower parts of the sample groove (4), and the coaxial upper ejector pin (5) and the coaxial lower ejector pin (6) are coaxially arranged to form a suspended clamping structure for clamping the sample and locking the sample in suspension.
2. The device for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The slider linkage shaft (3) comprises a symmetrically reverse threaded shaft (10), a first fixed block, a first slider, a second slider, and a second fixed block arranged on the symmetrically reverse threaded shaft (10) in sequence, wherein the first fixed block and the second fixed block are symmetrically arranged, and the first slider and the second slider are symmetrically arranged.
3. The high voltage pulsed transient response method piezoelectric material center node test apparatus of claim 2, wherein, The symmetrically reverse threaded shaft (10) is rotated to drive the first slider and the second slider to move synchronously and reversely at equal distances, and the first slider and the second slider are used to clamp the sample at both ends to adjust the length of the sample in the central position.
4. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The sample groove (4) and the L-shaped plate (7) are respectively provided with a first center hole and a second center hole, the positioning platform (1) is provided with a positioning fixed hole, the coaxial upper ejector pin (5) passes through the second center hole, and the coaxial lower ejector pin (6) sequentially passes through the positioning fixed hole and the first center hole.
5. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The coaxial upper ejector pin (5) is threadedly connected with an upper ejector pin nut (11), and the coaxial lower ejector pin is threadedly connected with a lower ejector pin nut (12).
6. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The size of the groove of the sample groove (4) matches the width of the sample.
7. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The coaxial upper ejector pin (5) is a spring ejector pin.
8. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, The diameters of the coaxial upper ejector pin (5) and the coaxial lower ejector pin (6) are less than 1 mm.
9. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 1, wherein, Two groups of magnetic suction bases (2) are symmetrically arranged on the two sides of the lower end of the positioning platform (1).
10. The apparatus for high voltage pulse transient response method piezoelectric material center node testing of claim 9, wherein, A magnetic suction switch is arranged on the magnetic suction base (2).