Chip detection equipment with automatic conveying function

Abstract

The utility model discloses chip detection equipment with an automatic conveying function, which comprises a detection table, an outer ring plate fixedly connected to the middle of the side wall of the top of the detection table, a turntable rotatably connected in the outer ring plate, grooves uniformly formed in the side wall of the top of the turntable, and rollers rotatably connected in the grooves. The chip detection device has the following advantages that after detection is completed, the micro motor is started to drive the pin roller to rotate, chips placed on the pin roller can be driven to move along with rotation of the pin roller, and according to whether the chips are qualified or not, whether the chips are qualified or not is judged; the chips are conveyed to the second conveying belt or the third conveying belt, meanwhile, the chips to be detected are conveyed to the rotating disc through the first conveying belt to be detected, in this way, automatic conveying of the chips in the detection process can be achieved, the detection efficiency is effectively improved, and the problems caused by manual chip replacement are avoided.

Description

Technical Field

[0001] This utility model relates to the technical field of automatic conveying and testing equipment, specifically to a chip testing equipment with automatic conveying function. Background Technology

[0002] Chip inspection is a process of inspecting the quality and appearance of chips. With the development of technology, vision-based solutions can be used to inspect chips, which can accurately inspect the appearance and pins of chips, and is one of the main inspection methods nowadays.

[0003] Current testing methods still require manual placement and replacement of chips. This process may damage the chip pins and is inefficient. Furthermore, manual sorting of qualified and unqualified chips is prone to errors over long periods, resulting in a mix of qualified and unqualified chips. Therefore, a chip testing device with an automatic conveying function is proposed. Utility Model Content

[0004] The technical problem this invention aims to solve is that manually placing and swapping chips can damage chip pins and is inefficient. Furthermore, manual sorting of qualified and unqualified chips is prone to errors over long periods, leading to a mix of qualified and unqualified chips. This invention provides a chip inspection device with an automatic conveying function, which can efficiently transport and handle chips, improve processing efficiency, and reduce the probability of chip mixing.

[0005] The technical solution adopted by this utility model to solve the technical problem is: a chip testing device with automatic conveying function, including a testing platform, an outer ring plate fixedly connected to the middle of the top side wall of the testing platform, a turntable rotatably connected inside the outer ring plate, grooves evenly opened on the top side wall of the turntable, and rollers rotatably connected in each groove, a first conveyor belt, a second conveyor belt and a third conveyor belt respectively set on the top of the testing platform and on the three sides of the outer ring plate, the top side walls of the first conveyor belt, the second conveyor belt and the third conveyor belt are at the same level as the top of the rollers.

[0006] As a preferred technical solution of this utility model, a rotating groove is fixedly connected to the inner side wall of the outer ring plate near the top. The rotating groove has an annular structure. Support columns are evenly fixedly connected to the top side wall of the rotating groove. A ball is rotatably connected to the end of the support column away from the rotating groove, and the ball fits against the bottom side wall of the turntable. A rubber sleeve is fitted to the outer wall of the ball.

[0007] As a preferred technical solution of this utility model, a motor is detachably connected to the bottom side wall of the outer ring plate, the output end of the motor is detachably connected to the middle of the bottom side wall of the turntable, a fixing plate is fixedly connected to one side wall of the outer ring plate, and an infrared positioner is fixedly connected to the upper edge of the end of the fixing plate away from the outer ring plate.

[0008] As a preferred embodiment of this utility model, a micro motor is embedded in one end of the groove sidewall, and the output end of the micro motor is detachably connected to one end of the roller sidewall. The gap between the rollers is 0.3-0.5cm.

[0009] As a preferred technical solution of this utility model, a top plate is provided above the testing platform, and a concave column is fixedly connected to one end of the top plate. The No. 3 conveyor belt is located below the concave column, and a camera is detachably connected to the bottom side wall of the top plate opposite to the turntable.

[0010] This invention has the following advantages: After the test is completed, the micro motor is started to drive the roller to rotate. As the roller rotates, it can drive the chip placed on it to move. Depending on whether it is qualified, the chip is sent to the second or third conveyor belt. At the same time, the chip to be tested is sent to the turntable for testing through the first conveyor belt. This can realize the automatic transport of the chip during the testing process, effectively improve the testing efficiency, and avoid the problems caused by manual chip replacement. The infrared positioner can determine the position of the chip on the turntable, ensuring that the chip is directly below the camera and avoiding the impact of incorrect position on the test results. Attached Figure Description

[0011] Figure 1 This is a top-view perspective three-dimensional structural diagram of the inspection equipment according to a preferred embodiment of the present invention;

[0012] Figure 2 This is an exploded view of the placement platform according to a preferred embodiment of the present invention;

[0013] Figure 3 This is a schematic diagram of a half-section of the turntable according to a preferred embodiment of the present invention.

[0014] Explanation of reference numerals in the attached diagram: 1. Inspection table; 2. Outer ring plate; 3. Turntable; 4. Conveyor belt No. 1; 5. Conveyor belt No. 2; 6. Top plate; 7. Camera; 8. Rotary trough; 9. Support column; 10. Motor; 11. Fixing plate; 12. Infrared locator; 13. Roller; 14. Groove; 15. Micro motor; 16. Conveyor belt No. 3. Detailed Implementation

[0015] The present invention will be further described below with reference to the accompanying drawings.

[0016] Please refer to the following: Figure 1-3This utility model discloses a chip testing device with automatic conveying function, including a testing platform 1. An outer ring plate 2 is fixedly connected to the middle of the top side wall of the testing platform 1. A turntable 3 is rotatably connected inside the outer ring plate 2. Grooves 14 are evenly opened on the top side wall of the turntable 3. Rollers 13 are rotatably connected in each groove 14. A first conveyor belt 4, a second conveyor belt 5, and a third conveyor belt 16 are respectively set on the top of the testing platform 1 and on the three sides of the outer ring plate 2. The top side walls of the first conveyor belt 4, the second conveyor belt 5, and the third conveyor belt 16 are at the same level as the top of the rollers 13.

[0017] A rotating groove 8 is fixedly connected to the inner side wall of the outer ring plate 2 near the top. The rotating groove 8 is a ring structure. Support columns 9 are evenly fixedly connected to the top side wall of the rotating groove 8. A ball bearing is rotatably connected to the end of the support column 9 away from the rotating groove 8, and the ball bearing is in contact with the bottom side wall of the turntable 3. A rubber sleeve is fitted to the outer wall of the roller 13. A motor 10 is detachably connected to the bottom side wall of the outer ring plate 2. The output end of the motor 10 is detachably connected to the middle of the bottom side wall of the turntable 3. A micro motor 15 is embedded in one side wall of the groove 14. The output end of the micro motor 15 is detachably connected to one side wall of the roller 13. The gap between the rollers 13 is 0.3-0.5cm. A top plate 6 is set above the detection table 1. A concave column is fixedly connected to one end of the top plate 6. The third conveyor belt 16 is located below the concave column. A camera 7 is detachably connected to the bottom side wall of the top plate 6 opposite to the turntable 3.

[0018] The technical effect of this solution is as follows: Since the rollers 13 are evenly distributed on the turntable 3, it is only necessary to start the micro motor 15 to drive the rollers 13 to rotate, which can move the chip placed on it. Depending on whether the chip is qualified, it is sent to the second conveyor belt 5 or the third conveyor belt 16. At the same time, the next chip to be tested will also be sent to the corresponding position to wait for the turntable 3 to receive it. This realizes the effect of automatic chip transportation during the testing process, improves the overall efficiency of the testing process, and avoids the problems caused by manual handling.

[0019] A fixing plate 11 is fixedly connected to one side wall of the outer ring plate 2, and an infrared locator 12 is fixedly connected to the upper edge of the end of the fixing plate 11 away from the outer ring plate 2.

[0020] The technical effect of this solution is that an infrared locator 12 is connected to the outer wall of the outer ring plate 2 by a fixing plate 11, which can locate the chip and ensure that the chip is directly below the camera 7, thus avoiding problems such as incorrect detection results due to chip displacement.

[0021] Specifically, in use, the chip to be tested is first delivered to the corresponding position via the first conveyor belt 4. Then, the roller 13 is started to receive the chip on the first conveyor belt 4. Simultaneously, the rotating roller 13, in conjunction with the infrared positioner 12, delivers the chip to the corresponding position. To facilitate feeding, the position of the first conveyor belt 4 can be slightly higher than the turntable 3. After testing, the chip is delivered to the second conveyor belt 5 or the third conveyor belt 16 according to the structure. Since the second conveyor belt 5 and the third conveyor belt 16 are at right angles, the motor 10 needs to be started to drive the turntable 3 to rotate, thereby adjusting the rotation direction of the roller 13 to correspond to the state of the second conveyor belt 5 or the third conveyor belt 16, ensuring smooth chip delivery. Similarly, for ease of delivery, the position of the second conveyor belt 5 and the third conveyor belt 16 can be slightly lower than the turntable 3 according to the actual situation. This achieves the effect of automatic chip delivery, improving efficiency while avoiding problems caused by manual operation.

[0022] The above are merely preferred embodiments of this utility model. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of this utility model, and these improvements and modifications should also be considered within the scope of protection of this utility model.

[0023] All other parts of this utility model that are not described in detail belong to the prior art, and therefore will not be described in detail here.

[0024] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and are not intended to limit it. Although the utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this utility model.

Claims

1. A chip inspection apparatus having an automatic conveying function, comprising an inspection table (1), characterized in that, The detection platform (1) top side wall middle fixed connection has outer ring plate (2), the outer ring plate (2) in rotationally connected has rotating disc (3), the rotating disc (3) top side wall evenly is set with recess (14), the recess (14) in rotationally connected has roller (13), the detection platform (1) top and located outer ring plate (2) three sides are respectively set up with No. conveyor belt (4), No. 2 conveyor belt (5) and No. 3 conveyor belt (16), No. 1 conveyor belt (4), No. 2 conveyor belt (5) and No. 3 conveyor belt (16) top side wall and roller (13) top are at the same level.

2. The chip testing apparatus having an automatic feeding function according to claim 1, wherein The outer ring plate (2) in and close to the top of the side wall fixedly connected with the rotating groove (8), the rotating groove (8) is annular structure, the rotating groove (8) top side wall is uniformly fixedly connected with support column (9), the support column (9) is away from the rotating groove (8) one end rotationally connected with the ball, and the ball and the bottom side wall of rotating disc (3) are combined, the roller (13) outer wall is sleeved with rubber sleeve.

3. The chip testing apparatus having an automatic feeding function according to claim 1, wherein The outer ring plate (2) inner bottom side wall is detachably connected with motor (10), the output end of motor (10) is detachably connected in the bottom side wall of rotating disc (3) middle, the outer ring plate (2) one side side wall is fixedly connected with fixed plate (11), the fixed plate (11) is away from the outer ring plate (2) one end upper edge fixedly connected with infrared positioner (12).

4. The chip testing apparatus having an automatic feeding function according to claim 1, wherein The recess (14) in one end side wall inlayed connection has micro motor (15), the output end of micro motor (15) and one end side wall of roller (13) are detachably connected, the gap between roller (13) is 0.3-0.5cm.

5. The chip testing apparatus having an automatic feeding function according to claim 1, wherein The detection platform (1) above is set up with top plate (6), one end of top plate (6) is fixedly connected with concave column, No. 3 conveyor belt (16) is below concave column, the bottom side wall of top plate (6) and rotating disc (3) opposite position is detachably connected with camera (7).

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