Defective product screening device for chip resistors

Abstract

The utility model belongs to the technical field of chip resistor processing, and discloses a defective product screening device for chip resistors, which comprises a feeding assembly used for conveying the chip resistors in a reciprocating manner, and a detection assembly mounted in the middle of the feeding assembly and used for detecting the chip resistors and removing defective products, the end of the feeding assembly is provided with an overturning assembly used for guiding the chip resistor to turn over, the feeding assembly comprises a rack body, the rack body is provided with an upper conveying mechanism used for conveying the chip resistor in the forward direction, and a lower conveying mechanism used for conveying the chip resistor in the reverse direction is arranged below the upper conveying mechanism; the detection assembly comprises a fixing frame, a measuring mechanism is arranged in the middle of the fixing frame, and removing mechanisms are arranged on the two sides of the fixing frame. The overturning assembly comprises an upper guide plate, and the bottom end of the upper guide plate is provided with a swinging mechanism used for swinging and overturning the chip resistor. According to the defective product screening device for the chip resistors, due to the arrangement of the open type gliding device and the motor turning face, jamming and blocking are avoided, and the smoothness of the turning face of the chip resistors is improved.

Description

Technical Field

[0001] This utility model belongs to the field of chip resistor processing technology, and in particular relates to a defective chip resistor screening device. Background Technology

[0002] Sorting defective surface mount resistors is a crucial quality control step in electronic manufacturing. Due to their small size and high precision, surface mount resistors are prone to various defects during production and use. Therefore, scientific screening methods are necessary to ensure product reliability and stability. The screening process begins with visual inspection. Qualified surface mount resistors should have a complete shape, free from damage and cracks, and the electrode plating should be uniform and bright. Special attention should be paid to checking for obvious defects such as cracks or missing corners in the resistor body, as these will affect the resistor's performance. Simultaneously, the electrodes should not show signs of oxidation, contamination, or plating peeling.

[0003] Comparing with Chinese Patent CN221714984U, a defective product screening device for surface mount resistor production is disclosed. This device includes a conveyor table and a laser profile measuring instrument. The conveyor table comprises an upper conveyor table and a lower conveyor table, with the lower conveyor table located below the upper conveyor table. The front of the lower conveyor table and the rear of the upper conveyor table are staggered. A reversing channel is fixedly installed at the rear of the upper conveyor table, with its lower end positioned above the front of the lower conveyor table. Screening components are installed at the rear of both the upper and lower conveyor tables. Each screening component includes symmetrically arranged support plates, one of which has a mounting plate on its upper part. A needle-shaped cylinder is mounted on the mounting plate, and the telescopic end of the needle-shaped cylinder is fixedly connected to an actuating component. The conveyor table, laser profile measuring instrument, and screening components replace manual inspection and screening of defective surface mount resistors, greatly improving inspection and screening efficiency and reducing the risk of eye injury to inspection workers.

[0004] However, the aforementioned patented reversing channel is a closed structure. When the surface mount resistor slides down and flips inside, it is easy to get stuck and blocked. This not only increases the difficulty of maintenance but also reduces the smoothness of flipping the surface mount resistor. Therefore, a new device needs to be designed. Utility Model Content

[0005] The purpose of this invention is to provide a defective product screening device for chip resistors to solve the problems mentioned in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution:

[0007] A defective chip resistor screening device includes a feeding assembly for reciprocatingly conveying chip resistors, and a detection assembly installed in the middle of the feeding assembly for detecting chip resistors and rejecting defective products. A flipping assembly is provided at the end of the feeding assembly for guiding the chip resistors to flip over. The feeding assembly includes a frame body, on which an upper conveying mechanism for forward conveying of chip resistors is installed. A lower conveying mechanism for reverse conveying of chip resistors is provided below the upper conveying mechanism. The lower conveying mechanism is longer than the upper conveying mechanism. Limiting edges are symmetrically provided on the frame body at the tail end of the upper conveying mechanism. The detection assembly includes a fixed frame, with a measuring mechanism in the middle of the fixed frame and rejection mechanisms on both sides of the fixed frame. The flipping assembly includes an upper guide plate, with a swinging mechanism at the bottom end of the upper guide plate for swinging and flipping the chip resistors.

[0008] Furthermore: the upper conveying mechanism includes two symmetrically arranged first conveying rollers, one of which is equipped with a first motor at one end, and a first conveyor belt is installed between the two first conveying rollers; the lower conveying mechanism includes two symmetrically arranged second conveying rollers, one of which is equipped with a second motor at one end, and a second conveyor belt is installed between the two second conveying rollers.

[0009] Furthermore, the limiting edge is inclined and integrally formed with the frame body.

[0010] Further: the measuring mechanism includes a first laser profile measuring instrument mounted on the top of the fixed frame and a second laser profile measuring instrument mounted in the middle of the fixed frame; the rejection mechanism includes a first cylinder and a second cylinder distributed vertically, the first cylinder having a first push plate mounted on its telescopic end and the second cylinder having a second push plate mounted on its telescopic end.

[0011] Furthermore: the first pusher plate is positioned on the side where the first laser profile measuring instrument completes the chip resistance detection, and the second pusher plate is positioned on the side where the second laser profile measuring instrument completes the chip resistance detection.

[0012] Furthermore: the swing mechanism includes a rotating shaft, one end of which is equipped with a third motor, and a lower guide plate is provided on the surface of the rotating shaft.

[0013] Furthermore, the top of the upper guide plate is provided with a chamfer to avoid obstacles.

[0014] Compared with existing technologies, the beneficial effects are:

[0015] 1. The open sliding and motor flipping design avoids jamming and improves the smoothness of flipping surface mount resistors;

[0016] 2. The flipping component is driven by a third motor to swing the lower guide plate, automatically completing the flipping operation of the chip resistor without manual intervention, realizing a closed-loop process of double-sided inspection with a single loading; the upper and lower conveyor belts (first and second conveyor belts) work together, conveying the upper surface for inspection in the forward direction and the lower surface for inspection in the reverse direction, forming an efficient and continuous inspection production line, which greatly reduces downtime.

[0017] 3. By combining the upper and lower distributed laser profile measuring instruments (first and second laser profile measuring instruments) with the forward and reverse conveying mechanism, the fully automatic detection of the upper and lower surfaces of the chip resistor is realized, avoiding the tedious operation of manual flipping or repeated feeding, and significantly improving the detection efficiency. When a defective product is detected, the cylinder-driven push plate (first and second push plate) immediately removes the defective product, ensuring that qualified products are separated from defective products and reducing interference in subsequent processes. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of a defective product screening device for chip resistors according to the present invention;

[0019] Figure 2 This is a schematic diagram of the feeding assembly of a defective product screening device for chip resistors according to the present invention;

[0020] Figure 3 This is a schematic diagram of the detection component of a defective product screening device for chip resistors according to the present invention;

[0021] Figure 4 This is a right view of the detection component of the defective product screening device for chip resistors described in this utility model;

[0022] Figure 5 This is a schematic diagram of the flip-up component of a defective product screening device for chip resistors according to the present invention;

[0023] Figure 6 This is a rear view of the flip-up assembly of a defective product screening device for chip resistors described in this utility model.

[0024] In the attached drawings, the following are the reference numerals: 101, frame body; 102, first conveyor roller; 103, first conveyor belt; 104, first motor; 105, second conveyor roller; 106, second conveyor belt; 107, second motor; 108, limiting edge; 201, fixed frame; 202, first laser profile measuring instrument; 203, second laser profile measuring instrument; 204, first cylinder; 205, first push plate; 206, second cylinder; 207, second push plate; 301, upper guide plate; 302, rotating shaft; 303, lower guide plate; 304, third motor; 305, chamfer. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] Please see Figures 1-6 A defective product screening device for chip resistors includes a feeding assembly for reciprocatingly conveying chip resistors, and a detection assembly installed in the middle of the feeding assembly for detecting chip resistors and rejecting defective products. A flipping assembly is provided at the end of the feeding assembly for guiding the chip resistors to flip over.

[0027] In this embodiment: the feeding assembly includes a frame body 101, on which an upper conveying mechanism for forward conveying of surface mount resistors is mounted, and below the upper conveying mechanism is a lower conveying mechanism for reverse conveying of surface mount resistors. The lower conveying mechanism is longer than the upper conveying mechanism, and limiting edges 108 are symmetrically arranged on the frame body 101 at the tail end of the upper conveying mechanism. The upper conveying mechanism includes two symmetrically arranged first conveying rollers 102, one of which has a first motor 104 at one end, and a first conveyor belt 103 is installed between the two first conveying rollers 102. The lower conveying mechanism... The system includes two symmetrically arranged second conveyor rollers 105, one of which is equipped with a second motor 107 at one end, and a second conveyor belt 106 is installed between the two second conveyor rollers 105. A limiting edge 108 is inclined and integrally formed with the frame body 101. The chip resistor is placed flat on the first conveyor belt 103. The frame body 101 supports the first motor 104 to drive the first conveyor roller 102 to rotate and push the first conveyor belt 103 to support the chip resistor. The second motor 107 drives the second conveyor roller 105 to rotate and push the second conveyor belt 106 to support the chip resistor to move in the opposite direction.

[0028] In this embodiment: the detection component includes a fixed frame 201, a measuring mechanism is disposed in the middle of the fixed frame 201, and rejection mechanisms are disposed on both sides of the fixed frame 201; the measuring mechanism includes a first laser profile measuring instrument 202 mounted on the top of the fixed frame 201 and a second laser profile measuring instrument 203 mounted in the middle of the fixed frame 201; the rejection mechanism includes a first cylinder 204 and a second cylinder 206 distributed vertically, a first push plate 205 is mounted on the telescopic end of the first cylinder 204, and a second push plate 207 is mounted on the telescopic end of the second cylinder 206; the first push plate 205 is disposed on the side where the first laser profile measuring instrument 202 has completed the detection of the chip resistor, and the second push plate 207 is disposed on the side where the second laser profile measuring instrument 203 has completed the detection of the chip resistor; when the chip resistor passes through the fixed frame 201... When the chip resistor is moving, the first laser profile measuring instrument 202 detects the upper surface of the chip resistor. If it is a qualified product, the first cylinder 204 does not move as the chip resistor continues to move. If it is a defective product, the first cylinder 204 extends and retracts to push the first push plate 205 as the chip resistor continues to move, pushing the defective product out of the first conveyor belt 103. When the chip resistor passes through the fixing frame 201 again, the second laser profile measuring instrument 203 detects the lower surface of the chip resistor. If it is a qualified product, the second cylinder 206 does not move as the chip resistor continues to move. If it is a defective product, the second cylinder 206 extends and retracts to push the second push plate 207 as the chip resistor continues to move, pushing the defective product out of the second conveyor belt 106.

[0029] In this embodiment: the flipping assembly includes an upper guide plate 301, and a swing mechanism for swinging and flipping the chip resistor is provided at the bottom of the upper guide plate 301; the swing mechanism includes a rotating shaft 302, a third motor 304 is provided at one end of the rotating shaft 302, and a lower guide plate 303 is provided on the surface of the rotating shaft 302; a chamfer 305 is provided at the top of the upper guide plate 301; after the first conveyor belt 103 carries the qualified chip resistor to the tail end, the chip resistor slides down along the upper guide plate 301, and under the limit of the limiting edge 108, slides along the lower guide plate 303 until the bottom surface contacts the second conveyor belt 106. At this time, the third motor 304 drives the rotating shaft 302 to flip the lower guide plate 303 upward, flipping the chip resistor.

[0030] Working principle: The chip resistor is placed flat on the first conveyor belt 103. The frame 101 supports the first motor 104, which drives the first conveyor roller 102 to rotate and push the first conveyor belt 103 to support the chip resistor. When the chip resistor passes through the fixed frame 201, the first laser profile measuring instrument 202 detects the upper surface of the chip resistor. If it is a qualified product, the first cylinder 204 does not move as the chip resistor continues to move. If it is a defective product, the first cylinder 204 extends and retracts as the chip resistor continues to move to the first push plate 205, pushing the first push plate 205 to extend and retract, pushing the defective product out of the first conveyor belt 103. After the first conveyor belt 103 carries the qualified chip resistor to the end, the chip resistor slides down along the upper guide plate 301 and stops at the limiting edge. Under the limit of 108, it slides along the lower guide plate 303 until the bottom surface contacts the second conveyor belt 106. At this time, the third motor 304 drives the rotating shaft 302 to flip the lower guide plate 303 upward, flipping the chip resistor. Then, the second motor 107 drives the second conveyor roller 105 to rotate and push the second conveyor belt 106 to support the chip resistor and move in the opposite direction. When the chip resistor passes through the fixed frame 201 again, the second laser profile measuring instrument 203 detects the lower surface of the chip resistor. If it is a qualified product, the second cylinder 206 does not move when the chip resistor continues to move. If it is a defective product, when the chip resistor continues to move to the second push plate 207, the second cylinder 206 extends and retracts to push the second push plate 207 to extend and retract, pushing the defective product out of the second conveyor belt 106.

[0031] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A defective product screening device for chip resistors, comprising a feeding assembly for reciprocally feeding the chip resistors, characterized in that: The detection assembly is arranged in the middle of the feeding assembly and is used for detecting the chip resistor and removing defective products. The feeding assembly comprises a rack body (101), an upper conveying mechanism for conveying the chip resistor in a forward direction is arranged on the rack body (101), a lower conveying mechanism for conveying the chip resistor in a reverse direction is arranged below the upper conveying mechanism, the length of the lower conveying mechanism is greater than that of the upper conveying mechanism, and limit edges (108) are symmetrically arranged on the rack body (101) at the tail end of the upper conveying mechanism. The detection assembly comprises a fixing frame (201), a measuring mechanism is arranged in the middle of the fixing frame (201), and removing mechanisms are arranged on both sides of the fixing frame (201). The turnover assembly comprises an upper guide plate (301), and a swing mechanism for swinging and turning over the chip resistor is arranged at the bottom end of the upper guide plate (301).

2. The defective product screening device for a chip resistor according to claim 1, characterized by: The upper conveying mechanism comprises two first conveying rollers (102) which are symmetrically arranged, one end of one of the first conveying rollers (102) is provided with a first motor (104), and a first conveying belt (103) is arranged between the two first conveying rollers (102); the lower conveying mechanism comprises two second conveying rollers (105) which are symmetrically arranged, one end of one of the second conveying rollers (105) is provided with a second motor (107), and a second conveying belt (106) is arranged between the two second conveying rollers (105).

3. The defective product screening device for a chip resistor according to claim 2, characterized in that: The limit edges (108) are arranged in an inclined manner and are integrally formed with the rack body (101).

4. The apparatus for screening defective products for chip resistors according to claim 1, wherein: The measuring mechanism comprises a first laser profile measuring instrument (202) arranged on the top of the fixing frame (201) and a second laser profile measuring instrument (203) arranged in the middle of the fixing frame (201); the removing mechanisms comprise a first air cylinder (204) and a second air cylinder (206) which are arranged in an up-down distribution, a first push plate (205) is arranged at the telescopic end of the first air cylinder (204), and a second push plate (207) is arranged at the telescopic end of the second air cylinder (206).

5. The apparatus for screening defective products for chip resistors according to claim 4, wherein: The first push plate (205) is arranged on the side of the first laser profile measuring instrument (202) on which the detection of the chip resistor is completed, and the second push plate (207) is arranged on the side of the second laser profile measuring instrument (203) on which the detection of the chip resistor is completed.

6. The apparatus for screening defective products for chip resistors according to claim 1, wherein: The swing mechanism comprises a rotating shaft (302), one end of the rotating shaft (302) is provided with a third motor (304), and a lower guide plate (303) is arranged on the surface of the rotating shaft (302).

7. The apparatus for screening defective products for chip resistors according to claim 6, wherein: The top end of the upper guide plate (301) is provided with a relief chamfer (305).

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