Secondary light path module device used in vertical X-ray diffractometer

Abstract

The utility model relates to the technical field of module devices, in particular to a secondary light path module device used in a vertical X-ray diffractometer. In order to solve the problems that a secondary optical path module of a current mainstream vertical X-ray diffractometer is insufficient in function mode switching flexibility, hardware needs to be integrally replaced for switching a one-dimensional detection mode and a two-dimensional detection mode due to the fixed structure design, the function expansion cost is high, the compatibility is poor, and diversified detection requirements are difficult to meet, the following technical scheme is provided: the secondary optical path module comprises a base, an optical module is mounted on one side of the base; the detector is arranged on one side of the base and is perpendicular to the optical module; the adjusting mechanism is installed on the side face of the base, the detector is connected to the adjusting mechanism in a sliding mode, and the adjusting mechanism is used for adjusting the position of the detector. According to the utility model, rapid switching of detection modes and stable adjustment of optical paths can be realized, the function expansion cost is reduced, the compatibility is improved, and diversified detection requirements are efficiently met.

Description

TECHNICAL FIELD

[0001] The utility model relates to module device technical field especially relates to a secondary light path module device for vertical X ray diffractometer. BACKGROUND

[0002] In the field of material science, physics and chemical analysis, the vertical X ray diffractometer is the core equipment for studying crystal structure and phase composition, and its performance directly affects the precision of diffraction data and the reliability of analysis results. As a key component of the diffractometer, the secondary light path module is responsible for regulating the transmission path of X rays, energy filtering and detection angle, and the rationality of its structure design plays a decisive role in the stability and functionality of the instrument.

[0003] The current mainstream secondary light path module of the vertical X ray diffractometer has insufficient flexibility in function mode switching in actual application. The existing module generally adopts fixed structure design, and the switching between one-dimensional detection (such as point detector) and two-dimensional detection (such as surface detector) mode needs to rely on overall hardware replacement, involving complex processes such as light path recalibration and mechanical interface adaptation, which is difficult to meet the diversified detection needs. The defect of lacking modular design leads to high cost of functional expansion, poor compatibility and limited applicability of the instrument in different application scenarios. In view of this, the utility model provides a secondary light path module device for vertical X ray diffractometer. UTILITY MODEL CONTENT

[0004] The utility model aims at the problem of insufficient flexibility in function mode switching of the current mainstream secondary light path module of the vertical X ray diffractometer in the background art, which leads to the need for overall hardware replacement for switching between one-dimensional and two-dimensional detection modes due to fixed structure design, high cost of functional expansion, poor compatibility and difficulty in meeting diversified detection needs, and provides a secondary light path module device for vertical X ray diffractometer.

[0005] The technical scheme of the utility model: a secondary light path module device for vertical X ray diffractometer, comprising a base, an optical module is installed on one side of the base; a detector is arranged on one side of the base, and the detector is vertically arranged with the optical module; an adjusting mechanism is installed on the side surface of the base, the detector is slidingly connected to the adjusting mechanism, and the adjusting mechanism is used for adjusting the position of the detector; a plurality of groups of mounting holes are formed in the two mutually perpendicular side surfaces of the base, and the mounting hole positions correspond to the adjusting mechanism.

[0006] Optionally, the adjusting mechanism comprises a connecting block installed on the side surface of the base through the mounting hole, a dovetail groove is formed in the connecting block, and the detector is slidingly connected to the dovetail groove at the end close to the base.

[0007] Optionally, one end of the dovetail groove is fixedly connected with a fixed plate, a threaded rod is rotatably connected in the fixed plate, and the threaded rod is threadedly connected with the detector.

[0008] Optionally, a nickel filter, an anti-scattering diaphragm and a soller slit are sequentially arranged in the optical module, and the soller slit is arranged on the side of the anti-scattering diaphragm close to the base.

[0009] Optionally, a notch is formed in the side of the nickel filter, the anti-scattering diaphragm and the soller slit, and a spring jack is arranged on the side of the optical module and corresponds to the notch.

[0010] In summary, the present application has at least one of the following beneficial technical effects:

[0011] The base side of the present application is matched with the adjusting mechanism through a plurality of mounting holes, and the detector can be rotated by 90° after being disassembled and then fixed again, so that one-dimensional line detection and two-dimensional surface detection functions can be quickly converted without replacing the whole hardware, the complex process of relying on hardware replacement and optical path recalibration in the traditional scheme is completely abandoned, the time consumption of single mode switching is shortened, the function switching efficiency is improved, single crystal high-precision scanning and multi-crystal high-throughput detection and other diversified needs are compatible, the equipment function expansion cost is significantly reduced, and the applicability of the instrument in material science, chemical analysis and other scenes is improved.

[0012] Further, the positioning is realized through the elastic clamping of the notch in the side of the nickel filter, the anti-scattering diaphragm and the soller slit and the spring jack, vibration interference is offset through elastic buffering while ensuring installation precision, element displacement or falling caused by vibration of the traditional fixed structure is avoided, optical path stability is improved, and the reliability of diffraction data is ensured.

[0013] In summary, the present application can realize quick switching of detection modes and stable adjustment of optical paths, reduce function expansion cost, improve compatibility, and efficiently meet diversified detection needs. BRIEF DESCRIPTION OF DRAWINGS

[0014] Figure 1 A structure schematic view of a secondary optical path module device in a vertical X-ray diffractometer is given;

[0015] Figure 2 is a bottom view of Figure 1 ;

[0016] Figure 3 is a side view of Figure 1 ;

[0017] Figure 4 is a schematic view after the base is rotated.

[0018] REFERENCE SIGNS:

[0019] 1. Base; 11. Mounting hole;

[0020] 2. Optical module; 21. Nickel filter; 22. Anti-scatter baffle; 23. Soller slit; 24. Spring thimble;

[0021] 3. Detector;

[0022] 4. Adjusting mechanism; 41. Connecting block; 42. Dovetail groove; 43. Fixed plate; 44. Threaded rod. DETAILED DESCRIPTION

[0023] The technical solutions of the present application will be described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application.

[0024] The components of the embodiments of the present application generally described and shown in the accompanying drawings can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application.

[0025] Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without making creative efforts fall within the scope of protection of the present application.

[0026] In the description of the present application, it should be noted that the orientations or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and therefore cannot be understood as indicating or implying that the devices or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as limiting the present application. In addition, the terms "first", "second", "third" are only for descriptive purposes and cannot be understood as indicating or implying relative importance.

[0027] In the description of the present application, it should be noted that unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connection" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium; it can be the communication inside two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to the specific circumstances.

[0028] EMBODIMENT

[0029] As Figure 1 andFigure 3 The utility model provides a secondary light path module device for vertical X ray diffractometer, including base 1, optical module 2 is installed to one side of base 1, nickel filter 21, anti-scatter diaphragm 22 and solr slit 23 are installed in sequence in optical module 2, solr slit 23 is set to one side of anti-scatter diaphragm 22 close to base 1, and the multiple functions of X ray energy filtration, stray light shielding and beam collimation are realized through hierarchical optical element combination. Nickel filter 21, anti-scatter diaphragm 22 and solr slit 23 are all prior art, and here do not make too much elaboration. The side of nickel filter 21, anti-scatter diaphragm 22 and solr slit 23 is all provided with a notch, and the side of optical module 2 is provided with spring jacks 24 at the corresponding position of the notch, nickel filter 21, anti-scatter diaphragm 22 and solr slit 23 are positioned through the setting of solr slit 23, and the stability of light path is improved through the spring buffer mechanism to prevent the element from falling off in the vibration environment.

[0030] Further, the above module device further includes a detector 3 disposed on one side of the base 1, the detector 3 is disposed perpendicularly to the optical module 2, forming an orthogonal light path detection structure to adapt to the multi-angle diffraction signal acquisition requirement.

[0031] Further, please refer to Figure 1 , Figure 2 and Figure 4The module device further comprises an adjusting mechanism 4 installed on the side surface of the base 1. Two mutually perpendicular side surfaces of the base 1 are respectively provided with a plurality of groups of mounting holes 11. The mounting holes 11 are located in correspondence with the adjusting mechanism 4 and are re-fixed by being disassembled and rotated by 90°. The horizontal or vertical detection direction of the detector 3 is switched to realize the rapid tool-free conversion of one-dimensional line detection and two-dimensional surface detection functions and significantly improve the detection mode switching efficiency. The detector 3 is slidingly connected to the adjusting mechanism 4. The adjusting mechanism 4 is used for micron-level precision adjustment of the position of the detector 3. The adjusting mechanism 4 comprises a connecting block 41 installed on the side surface of the base 1 through the mounting holes 11. The connecting block 41 is provided with a dovetail groove 42. One end of the detector 3 close to the base 1 is slidingly connected to the dovetail groove 42. The precise guide structure of the dovetail groove 42 ensures the smooth and non-shaking sliding of the optical module 2 in the dovetail groove 42. One end of the dovetail groove 42 is fixedly connected with a fixed plate 43. The position of the fixed plate 43 is fixed to provide a stable adjustment reference. The fixed plate 43 is rotatably connected with a threaded rod 44. The threaded rod 44 remains in place and rotates. The threaded rod 44 is threadedly connected with the detector 3. When the threaded rod 44 rotates, the detector 3 moves along the length direction of the threaded rod 44. The high-precision threaded pair is used to realize the accurate transmission of displacement, thereby realizing the sub-millimeter-level fine adjustment of the position of the detector 3. The height of the detector 3 is accurately controlled through the cooperation of the threaded rod 44 and the dovetail groove 42. The gap error commonly seen in traditional screw adjustment is effectively eliminated to ensure the repeatability precision of the detection position.

[0032] In the embodiment, the nickel filter 21, the anti-scattering diaphragm 22 and the Soller slit 23 are sequentially embedded in the corresponding clamping grooves of the optical module 2. The side surface cutouts of the three are aligned with the spring jacks 24 on the side surface of the optical module 2. Through the elastic compression force of the spring jacks 24 and the cutout clamping, a “positioning-buffering” double mechanism is formed. The optical elements are accurately positioned. The interference of equipment vibration on the light path is offset through elastic buffering to improve the structural stability of the optical module 2.

[0033] After the X-ray is incident to the optical module 2, it sequentially passes through the nickel filter 21 to filter stray energy, the anti-scattering diaphragm 22 to shield non-axial scattered light and the Soller slit 23 to collimate the light beam, thereby forming a pure X-ray beam with good monochromaticity and small divergence angle to provide a high-quality light source for subsequent detection. The hierarchical optical element combination realizes multiple preprocessing of energy filtering, stray light shielding and light beam collimation to significantly improve the signal-to-noise ratio of the diffraction signal. The detector 3 is vertically installed on one side of the base 1 so that its detection plane is perpendicular to the exit light path of the optical module 2 to form an orthogonal detection structure.

[0034] The connecting block 41 is fixed to the base 1 through the mounting holes 11 on the side surface of the base 1. The bottom end of the detector 3 is embedded in the dovetail groove 42 of the connecting block 41. The precise guide structure of the dovetail groove 42 limits the lateral shaking of the detector 3 to ensure its smooth axial sliding along the light path direction to provide a stable reference for subsequent fine adjustment.

[0035] Rotating the threaded rod 44 drives the probe 3 to move along the axis of the threaded rod 44 through the threaded pair between the threaded rod 44 and the probe 3. The dovetail groove 42 limits the radial displacement, and the threaded rod 44 provides the axial driving force. The combination of the two eliminates the "idling error" caused by the thread gap in the traditional screw adjustment, and ensures that the repeatability accuracy of the position of the probe 3 is ≤±50μm.

[0036] Loosening the fixing screws of the mounting holes 11, the connecting block 41 is disassembled from the side of the base 1 together with the probe 3, and after rotating 90°, it is re-fixed through another set of vertical mounting holes 11. The tool-free operation realizes the switching of the detection direction of the probe 3 from horizontal (one-dimensional line detection) to vertical (two-dimensional surface detection), and the time consumption of single switching is <5 minutes, which is more than 80% more efficient than the traditional hardware replacement method. The modular design realizes "one machine with two modes", which is compatible with the high precision of line detection and the high throughput characteristics of surface detection, and meets the diversified detection needs of polycrystalline powder diffraction and thin film structure analysis.

[0037] The above specific embodiments are only an optional embodiment of the present application. Based on the technical scheme of the present application and the related inspiration of the above embodiments, those skilled in the art can make various alternative improvements and combinations on the above specific embodiments.

Claims

1. A secondary optical path module device for use in a vertical X-ray diffractometer, characterized in that, include: A base (1) is provided, and an optical module (2) is mounted on one side of the base (1); A detector (3) is disposed on one side of the base (1), and the detector (3) is disposed perpendicular to the optical module (2); An adjustment mechanism (4) is installed on the side of the base (1), and the detector (3) is slidably connected to the adjustment mechanism (4). The adjustment mechanism (4) is used to adjust the position of the detector (3). The base (1) has multiple sets of mounting holes (11) on its two mutually perpendicular sides, and the mounting holes (11) are positioned corresponding to the adjustment mechanism (4).

2. The secondary optical path module device for a vertical X-ray diffractometer according to claim 1, characterized in that, The adjustment mechanism (4) includes a connecting block (41) installed on the side of the base (1) through a mounting hole (11). A dovetail groove (42) is provided on the connecting block (41). The detector (3) is slidably connected to the dovetail groove (42) at one end near the base (1).

3. A secondary optical path module device for a vertical X-ray diffractometer according to claim 2, characterized in that, One end of the dovetail groove (42) is fixedly connected to a fixing plate (43), and a threaded rod (44) is rotatably connected in the fixing plate (43), and the threaded rod (44) is threadedly connected to the detector (3).

4. A secondary optical path module device for a vertical X-ray diffractometer according to claim 3, characterized in that, The optical module (2) is sequentially equipped with a nickel filter (21), an anti-scattering aperture (22), and a Sola slit (23), with the Sola slit (23) located on the side of the anti-scattering aperture (22) near the base (1).

5. A secondary optical path module device for a vertical X-ray diffractometer according to claim 4, characterized in that, The nickel filter (21), the anti-scattering aperture (22), and the Sola slit (23) are all provided with cutouts on their sides, and spring set screws (24) are installed on the side of the optical module (2) at positions corresponding to the cutouts.

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