Dielectric withstand voltage testing device for high-voltage multi-layer chip ceramic dielectric capacitor

Abstract

The utility model discloses a dielectric withstand voltage testing device for a high-voltage multi-layer chip ceramic dielectric capacitor. The high-voltage multi-layer chip ceramic dielectric capacitor comprises a ceramic dielectric, an inner electrode and a metal end. The screw thread pairs are respectively used for fixing the copper square strip, the conductive square strip and the fixing square strip; the elastic sleeve moves through a built-in spring, so that the test distance is adjusted, and the elastic sleeve is attached to and conducted with the tested capacitor; the magnet is embedded in the bottom of the test bottom plate and used for fixing the test bottom plate. When the dielectric withstand voltage testing device is used for carrying out withstand voltage testing on the high-voltage multi-layer chip ceramic dielectric capacitor, the testing distance can be conveniently adjusted, and dielectric withstand voltage testing of the high-voltage multi-layer chip ceramic dielectric capacitors with different sizes can be realized. By adopting the testing device provided by the utility model, the capacitor can be directly placed on the device for testing, the operation is simple and convenient, the testing and screening efficiency is high, and the result is accurate and reliable.

Description

TECHNICAL FIELD

[0001] The utility model belongs to high pressure multilayer ceramic capacitor screening process in the test technical field, specifically related to a kind of high pressure multilayer ceramic capacitor dielectric withstand voltage testing device. BACKGROUND

[0002] In addition to the common characteristics of capacitor "direct through alternating", multilayer ceramic capacitor also has small packaging volume, large specific capacity, long life, high reliability and surface mounting. With the rapid development of today's electronic information industry, as a basic component in electronic industry, multilayer ceramic capacitor also develops at an amazing speed, increasing by about 15% per year, and is one of the most used components in today's communication equipment, computer board and remote control of household appliances. With the rapid development of SMT technology, its consumption has increased significantly, and the consumption of each mobile phone has exceeded more than 100. Nowadays, the development direction of multilayer ceramic capacitor presents diversification. To meet the needs of portable communication tools, multilayer ceramic capacitor develops towards low voltage and large capacity, ultra-small and thin medium. To meet the development of some electronic whole machines and electronic equipment towards high power and high voltage (mostly military communication equipment), high voltage multilayer ceramic capacitor with high voltage, large current, high power, ultra-high Q value, low ESR value and high reliability has also become an important development direction.

[0003] High voltage multilayer ceramic capacitor is prone to surface sparking during testing due to its high voltage, and needs to be tested in insulating oil. At present, the test device has two simple copper sheets at both ends, and different size withstand voltage tests need to manually adjust the copper sheet with tools to clamp the product, which is low in efficiency and unstable in clamping. After several adjustments, the copper sheet is prone to breakage, which is difficult to meet the withstand voltage test requirements of multilayer ceramic capacitor with different sizes and small batch.

[0004] The utility model discloses a kind of fluorinated liquid test medium withstand voltage device of Chinese utility model patent with publication number CN218240285U, the end face of the fixture shell is provided with inwardly recessed test space, the device placing piece and the device limiting piece are located in the test space, the device placing piece and the device limiting piece are connected with the bottom of the test space, the device limiting piece is connected with power line, the test space is loaded with fluorinated liquid, when test device is placed on the device placing piece, the device limiting piece is contacted with the test device and the device limiting piece can limit the movement of the test device. But inwardly recessed test space is not suitable for the high voltage multilayer ceramic capacitor of the present scheme, and is not suitable for the test of the present product. UTILITY MODEL CONTENTS

[0005] In order to solve the above problems, the utility model aims at providing a high voltage multilayer chip type porcelain dielectric capacitor medium withstand voltage test device.

[0006] In order to realize the above-mentioned purpose, the utility model adopts following technical scheme: a high voltage multilayer chip type porcelain dielectric capacitor medium withstand voltage test device, copper square bar, conductive square bar and fixed square bar are arranged on the test base plate, distance adjusting device is arranged on the conductive square bar and fixed square bar, the end of distance adjusting device is fixed with copper round sheet, and copper round sheet is contacted with copper square bar through distance adjusting device.

[0007] Preferably, the distance adjusting device comprises an elastic sleeve, an elastic ejector pin and a test ejector pin are sequentially connected to the elastic sleeve, and the test ejector pin is welded with the copper round sheet.

[0008] Preferably, the conductive square bar and the fixed square bar are respectively provided with through holes, and the elastic sleeve passes through the through holes and the through holes, and a limiting round sheet is arranged on the elastic sleeve to fix the elastic sleeve on the conductive square bar.

[0009] Preferably, the elastic sleeve is connected with the elastic ejector pin, the test ejector pin and the copper round sheet through the fixed square bar, and the copper round sheet is located in a test area formed by the copper square bar and the fixed square bar.

[0010] Preferably, the long side symmetry lines of the copper square bar, the conductive square bar and the fixed square bar are on the same straight line, and the copper square bar and the fixed square bar are both provided with a terminal post.

[0011] Preferably, the terminal post is a bolt, and the material is aluminum alloy.

[0012] Preferably, the test base plate is a cuboid, and the eight corners need to be rounded, the material is FR-4, the test base plate bottom is fixed by using a lodestone, and the material of the lodestone is ferric oxide.

[0013] Preferably, the test ejector pin, the elastic ejector pin and the elastic sleeve are cylindrical, and the materials of the three are all aluminum alloy, and the elastic sleeve is internally provided with a spring.

[0014] Preferably, the conductive square bar is a cuboid, and the material is copper alloy.

[0015] Compared with the prior art, the utility model has the following advantages: the copper square bar, the copper round sheet, the elastic ejector pin and the elastic sleeve are integrated on a test base plate, the test spacing is adjusted by the spring internally provided in the elastic sleeve, so that multiple size specifications of high voltage multilayer chip type porcelain dielectric capacitors can be directly placed on the device for withstand voltage test, the previous repeated adjustment of the copper sheet to break it is avoided, the time for manually adjusting the test fixture before each test is saved, and the test efficiency and the accuracy of test results are significantly improved. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical scheme in the specific embodiments of the utility model, the following will briefly introduce the drawings needed to be used in the embodiment description, obviously, the drawings described below are only some embodiments of the utility model, and for those skilled in the art, other drawings can also be obtained according to these drawings without creative labor.

[0017] Figure 1 is the three-dimensional view of the pressure test device of the utility model; Figure 1

[0018] Figure 2 is the side view of the pressure test device of the utility model; Figure 2

[0019] Figure 3 is the three-dimensional schematic view of the high-voltage multilayer chip ceramic capacitor; Figure 3

[0020] Figure 4 is the sectional view of Figure 3; Figure 4 Figure 3

[0021] In the figure, 1 is a test base plate, 2 is a wiring post, 3 is a copper square bar, 4 is a threaded pair, 5 is a copper round piece, 6 is a test thimble, 7 is a elastic thimble, 8 is a elastic sleeve, 9 is a limiting round piece, 10 is a round hole, 11 is a conductive square bar, 12 is a first through hole, 13 is a fixed square bar, 14 is a second through hole, 15 is a ceramic medium, 16 is an inner electrode, and 17 is a metal end. DETAILED DESCRIPTION

[0022] The utility model will be further described below in combination with the drawings and specific embodiments, but should not be understood as the scope of the subject matter described in the utility model is limited to the following embodiments, and any modification, replacement and change made according to the ordinary technical knowledge and conventional means in the art without departing from the above technical idea of the utility model are included in the scope of the utility model.

[0023] Referring to Figure 1, a kind of high-voltage multilayer chip ceramic capacitor pressure test device of simple operation, screening efficiency is high and accurate and reliable, including test base plate 1, wiring post 2, copper square bar 3, copper round piece 5, test thimble 6, elastic thimble 7, elastic sleeve 8, limiting round piece 9, conductive square bar 11 and fixed square bar 13, wiring post 2, copper square bar 3, copper round piece 5, test thimble 6, elastic thimble 7, elastic sleeve 8, limiting round piece 9, conductive square bar 11 and fixed square bar 13 are all installed on test base plate 1. Figures 1-2 Referring to Figure 2, high-voltage multilayer chip ceramic capacitor includes ceramic medium 15, inner electrode 16 and metal end 17. Figure 3 Figure 4

[0024] ​​​​​​​The copper square bar 3, the conductive square bar 11 and the fixed square bar 13 are fixed on the test base plate 1 by the threaded pair 4, the conductive square bar 11 and the fixed square bar 13 have the second through hole 14 and the first through hole 12 respectively, the elastic sleeve 8 passes through the first through hole 12 and the second through hole 14, the elastic sleeve 8 is limited by the limiting disc 9, the limiting disc 9 fixes the elastic sleeve 8 on the conductive square bar 11, the test needle 6 is fixedly connected with the elastic needle 7, the test needle 6 is welded with a copper disc 5, the copper square bar 3 and the copper disc 5 can be in close contact with the two metal end heads 17 of the high-voltage sheet ceramic capacitor; the copper disc 5 is adjusted by the elastic needle 7 and the elastic sleeve 8 to adjust the test distance.

[0025] The test base plate 1 is a cuboid, circular holes 10 are arranged on four corners of the cuboid, the eight corners of the cuboid are rounded, and the material is FR-4. The bottom of the test base plate 1 is adsorbed and fixed by a magnet 10, and the material is Fe3O4. The terminal post 2 is a bolt, and the material is aluminum alloy.

[0026] The test needle 6 and the elastic needle 7 are cylindrical, and the material is aluminum alloy. The elastic sleeve 8 is cylindrical, and the material is aluminum alloy, and a spring is arranged inside. The conductive square bar 11 is a cuboid, and the material is copper alloy.

[0027] Embodiment 1: as shown in the accompanying Figures 1-4 A high-voltage multilayer sheet ceramic capacitor dielectric withstand voltage testing device, including a test base plate 1, a terminal post 2, a copper square bar 3, a copper disc 5, a test needle 6, an elastic needle 7, an elastic sleeve 8, a limiting disc 9, a conductive square bar 11 and a fixed square bar 13, the terminal post 2, the copper square bar 3, the copper disc 5, the test needle 6, the elastic needle 7, the elastic sleeve 8, the limiting disc 9, the conductive square bar 11 and the fixed square bar 13 are all installed on the test base plate 1. As shown in the accompanying Figure 2 The high-voltage multilayer sheet ceramic capacitor includes a ceramic dielectric 15, an internal electrode 16 and a metal end head 17.

[0028] The copper square bar 3, the conductive square bar 11 and the fixed square bar 13 are fixed on the test base plate 1 by the threaded pair 4, the conductive square bar 11 and the fixed square bar 13 have the second through hole 14 and the first through hole 12 respectively, the elastic sleeve 8 passes through the first through hole 12 and the second through hole 14, the elastic sleeve 8 is limited by the limiting disc 9, the limiting disc 9 fixes the elastic sleeve 8 on the conductive square bar 11, the test needle 6 is fixedly connected with the elastic needle 7, the test needle 6 is welded with a copper disc 5, the copper square bar 3 and the copper disc 5 can be in close contact with the two metal end heads 17 of the high-voltage sheet ceramic capacitor; the copper disc 5 is adjusted by the elastic needle 7 and the elastic sleeve 8 to adjust the test distance.

[0029] When the capacitor is tested for dielectric withstand voltage, the wire is connected to the terminal post 2, the tweezers place the capacitor between the copper square bar 3 and the copper round plate 5, the copper square bar 3, the copper round plate 5 and the capacitor end are adhered by the cooperation of the elastic ejector pin 7 and the elastic sleeve 8, and the capacitor withstand voltage test is completed by turning on the power supply, the operation is simple, the test and screening efficiency is high, and the result is accurate and reliable.

[0030] The high-voltage multi-layer chip ceramic capacitor dielectric withstand voltage testing device is described in detail, the structure and working principle of the utility model are described by applying specific examples, and the above embodiment is only used for helping to understand the method and core idea of the utility model. It should be pointed out that, for ordinary skilled persons in the art, without departing from the principle of the utility model, the utility model can be improved and modified in many ways, and these improvements and modifications also fall within the scope of protection of the utility model claims.

Claims

1. A high-voltage multilayer chip ceramic dielectric capacitor dielectric withstand voltage testing device, characterized by: The utility model relates to a test base plate (1) and copper square bar (3), conductive square bar (11) and fixed square bar (13) are arranged on the test base plate (1), distance adjusting device is arranged on conductive square bar (11) and fixed square bar (13), and the end of distance adjusting device is fixed with copper round piece (5), and copper round piece (5) is contacted with copper square bar (3) through distance adjusting device.

2. The high-voltage multilayer chip ceramic capacitor dielectric withstand voltage test device according to claim 1, characterized in that: The distance adjusting device comprises an elastic sleeve (8), an elastic ejector pin (7) and a test ejector pin (6) are sequentially connected to the elastic sleeve (8), and the test ejector pin (6) is welded with the copper round piece (5).

3. The high-voltage multilayer chip ceramic capacitor dielectric withstand voltage testing device according to claim 1 or 2, characterized in that: The conductive square bar (11) and the fixed square bar (13) are provided with a first through hole (12) and a second through hole (14) respectively, the elastic sleeve (8) passes through the second through hole (14) and the first through hole (12), and a limiting round piece (9) is arranged on the elastic sleeve (8) and the elastic sleeve (8) is fixed on the conductive square bar (11) by the limiting round piece (9).

4. The high-voltage multilayer chip ceramic capacitor dielectric withstand voltage testing device according to claim 2, characterized in that: The elastic sleeve (8) is connected with the elastic ejector pin (7), the test ejector pin (6) and the copper round piece (5) through the fixed square bar (13), and the copper round piece (5) is located in a test area formed by the copper square bar (3) and the fixed square bar (13).

5. The high voltage multilayer chip ceramic capacitor dielectric voltage withstanding test device according to claim 1, wherein: The long side symmetry lines of the copper square bar (3), the conductive square bar (11) and the fixed square bar (13) are on the same straight line, and the copper square bar (3) and the fixed square bar (13) are provided with a terminal post (2).

6. The high-voltage multilayer chip ceramic capacitor dielectric withstand voltage testing device according to claim 5, characterized in that: The terminal post (2) is a bolt, and the material is aluminum alloy.

7. The high voltage multilayer chip ceramic capacitor dielectric voltage withstanding test apparatus according to claim 1, wherein: The test base plate (1) is a cuboid, and the eight corners need to be rounded, the material is FR-4, the bottom of the test base plate (1) is adsorbed and fixed by a magnetite (10), and the material of the magnetite (10) is ferric oxide.

8. The high voltage multilayer chip ceramic capacitor dielectric voltage withstanding test apparatus according to claim 2, characterized in that: The test ejector pin (6), the elastic ejector pin (7) and the elastic sleeve (8) are cylindrical, and the materials of the three are aluminum alloy, and the elastic sleeve (8) is provided with a spring.

9. The high voltage multilayer chip ceramic capacitor dielectric voltage withstanding test apparatus according to claim 1, wherein: The conductive square bar (11) is a cuboid, and the material is copper alloy.

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