Measuring head measuring seat for three-coordinate measuring instrument

Abstract

The utility model provides a measuring head measuring seat for a three-coordinate measuring instrument, and relates to the technical field of three-coordinate measuring instruments, the measuring head measuring seat comprises a measuring head seat, a plurality of fixing plates, a connecting column and a plurality of second measuring heads, the bottom of the measuring head seat is provided with a plurality of annular grooves which are not communicated, and the inner diameters of the plurality of annular grooves are gradually reduced; one end of each fixing plate is in sliding connection with the measuring head seat through one annular groove; a fixing hole is formed in the side wall surface of each fixing plate; the connecting column is arranged at the bottom of the measuring head seat, and the outer diameter of the connecting column is smaller than or equal to the annular groove with the smallest inner diameter; a first measuring head is arranged at the bottom of the connecting column; a plurality of connecting holes are formed in the side wall face of the connecting column in the circumferential direction. Each second measuring head is in threaded connection with the fixing plate through the fixing hole, and the connecting end of each second measuring head enters the connecting column; the connecting end of each second measuring head is electrically connected with the measuring head seat through a connecting column. The measuring head measuring seat can be provided with a plurality of measuring needles, is suitable for measurement of different workpieces, and improves the measurement efficiency of the workpieces.

Description

Technical Field

[0001] This utility model relates to the field of coordinate measuring machine technology, specifically to a probe and probe holder for a coordinate measuring machine. Background Technology

[0002] A coordinate measuring machine (CMM) is an instrument that can measure geometric shapes, lengths, and circumference divisions within a six-sided spatial area; it is also known as a coordinate measuring bed.

[0003] Currently, in the measurement process of coordinate measuring machines (CMMs), for some special workpieces, such as the scanning measurement of the curved surface of a multi-lobed Roots rotor, the single probe in the CMM is difficult to achieve efficient automatic scanning measurement of the curved surface of the multi-lobed Roots rotor in one go, which will lead to a longer measurement time and affect the measurement efficiency. Utility Model Content

[0004] This invention addresses the problem of low measurement efficiency when using a single probe in a coordinate measuring machine (CMM). It provides a probe holder for a CMM that can accommodate multiple probes, adapting to the measurement of different workpieces and improving workpiece measurement efficiency.

[0005] The technical solution adopted in this utility model is:

[0006] A probe holder for a coordinate measuring machine is provided, comprising:

[0007] The probe holder has multiple annular grooves on its bottom end face, with the inner diameter of each groove gradually decreasing along the central axis of the probe holder, and adjacent grooves are not connected. Multiple fixing plates are included, each with one end slidably connected to the probe holder via one of the annular grooves. Each fixing plate has a fixing hole on its side wall. A connecting post is located at the bottom of the probe holder, with its outer diameter less than or equal to the inner diameter of the smallest annular groove. A first probe is located at the bottom of the connecting post. Multiple connecting holes are circumferentially formed on the side wall of the connecting post, with the central axis of the connecting post as its rotation axis. Multiple second probes are included, each threadedly connected to a fixing plate via one of the fixing holes, and the connecting end of each second probe enters the interior of the connecting post through one of the connecting holes. The connecting end of each second probe is electrically connected to the probe holder via the connecting post.

[0008] Optionally, the connecting lines between the center points of the multiple connecting holes are in the shape of regular polygons.

[0009] Optionally, when the central axes of the fixing holes of multiple fixing plates are on the same straight line, there is a first gap between adjacent fixing plates.

[0010] Optionally, the central axis of each second probe is perpendicular to the central axis of the first probe at a 90° angle.

[0011] Optionally, each fixed plate has an actuating plate on its outer wall surface. Each actuating plate is L-shaped. When the central axes of the fixing holes of multiple fixed plates are on the same straight line, there is a second gap between adjacent actuating plates.

[0012] Optionally, the side wall of the connecting column is provided with multiple protective rings in the circumferential direction, and each protective ring is located inside each connecting hole.

[0013] Optionally, each fixing plate has a protective sleeve on its outer wall surface located outside the corresponding fixing hole.

[0014] Optionally, each fixed plate has a baffle on its outer wall surface, and the top of the baffle slides in contact with the bottom end face of the probe seat.

[0015] The beneficial effects of this utility model are:

[0016] Adjust the position of each fixed plate according to the workpiece to be scanned and measured. After each fixed plate is in a suitable working position, move the second probe on each fixed plate through a threaded connection until the connecting end of each second probe is in the corresponding connecting hole on the side wall of the connecting column. Continue to rotate until the second probe can no longer move. At this time, the connecting end of the second probe can be electrically connected to the probe seat through the connecting column. Compared with a single first probe on the bottom of the connecting column, the use of multiple second probes can improve the measurement efficiency. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is a front view schematic diagram of a probe and probe holder for a coordinate measuring machine disclosed in this embodiment;

[0019] Figure 2 This is a schematic diagram of the probe's structure viewed from below.

[0020] Figure 3 This is a top view of the connecting column structure.

[0021] Figure label:

[0022] 1-Probe holder, 10-Annular groove;

[0023] 2-Connecting post, 20-Connecting hole;

[0024] 3-First probe;

[0025] 4-Second probe;

[0026] 5 - Fixing plate, 50 - Fixing hole;

[0027] 6-Toggle plate;

[0028] 7-Baffle;

[0029] 8-Protective ring;

[0030] 9-Protective cover. Detailed Implementation

[0031] In the description of this utility model, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this utility model and simplifying the description, and are not intended to indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model.

[0032] The following disclosure provides many different embodiments or examples for implementing various structures of this invention. To simplify the disclosure, specific examples of components and arrangements are described below. Of course, these are merely examples and are not intended to limit the scope of this invention.

[0033] The embodiments of the utility model will now be described in detail with reference to the accompanying drawings.

[0034] Example

[0035] Please see Figure 1-3As shown, this embodiment discloses a probe holder for a coordinate measuring machine, including a probe holder 1, which receives signals transmitted from the probes. A connecting post 2 is provided on the outer bottom of the probe holder 1, and a first probe 3 is provided on the outer bottom of the connecting post 2, so that the first probe 3 can transmit signals to the probe holder 1 through an electrical connection with the connecting post 2. It should be noted that the probe holder 1 internally contains a signal conditioning circuit and an encoder for high-precision signal transmission. The connecting post 2 internally contains electrical components. These electrical components are not only used for electrical connection with the first probe 3 and the second probe 4, but also undertake signal transmission functions to transmit the signals measured by the first probe 3 and the second probe 4 to the probe holder 1. For example, a multi-pin electrical interface is used to transmit trigger signals, probe attitude data, and power supply. That is, the connecting post 2 and the probe holder 1 are considered as one unit, and the connecting post 2 acts as an electrical interface. In this embodiment, the first probe 3 and the plurality of second probes 4 are connected to the electrical interface of the electrical components inside the connecting post 2 by means of elastic metal needles or conductive contacts. That is, when the first probe 3 or the plurality of second probes 4 are inserted into the connecting hole 20 of the connecting post 2, the contacts are automatically pressed together and connected. For example, the three pairs of series contacts inside the trigger probe. In addition, the corresponding models of the probe holder 1, the first probe 3 and the plurality of second probes 4 are not specified in this embodiment. Only the effect to be achieved by each component is described. That is, any model that can achieve the effect in this embodiment is acceptable.

[0036] Multiple annular grooves 10 are formed on the bottom end face of the aforementioned probe holder 1. The inner and outer diameters of each annular groove 10 are different. Specifically, the outermost annular groove 10 located on the top end face of the probe holder 1 gradually decreases in both inner and outer diameters along the central axis of the probe holder 1, and adjacent annular grooves 10 are not connected. Multiple fixing plates 5 are slidably connected to the top of the probe holder 1. The number of fixing plates 5 is the same as the number of annular grooves 10. Each fixing plate 5 is slidably connected to the bottom of the probe holder 1 through a corresponding annular groove 10. Fixing holes 50 are formed on the side wall of each fixing plate 5. When the central axes of the fixing holes 50 of each fixing plate 5 are on the same straight line, there is a first gap between adjacent fixing plates 5. This first gap prevents adjacent fixing plates 5 from colliding with each other during sliding. Each fixing plate 5 is threadedly connected to a second probe 4 through a corresponding fixing hole 50. One end of the second probe 4 is the measuring end, facing the workpiece being measured; the other end is the connecting end, facing the central axis of the connecting post 2. Multiple connecting holes 20 are circumferentially formed on the side wall of the connecting column 2 with the central axis of the connecting column 2 as the rotation axis. The number of connecting holes 20 is greater than the number of fixing plates 5. When one of the fixing plates 5 rotates until the central axis of the fixing hole 50 is aligned with the central axis of the connecting hole 20, the second probe 4 located in the fixing hole 50 of the fixing plate 5 rotates, so that the connecting end of the second probe 4 is spirally fed towards the inside of the corresponding connecting hole 20 until the connecting end of the second probe 4 is completely inserted into the connecting hole 20. Then, the connecting end of the second probe 4 is electrically connected to the connecting column 2, so that the second probe 4 can transmit the measured data signal to the probe holder 1 for processing through the connecting column 2 during measurement. That is, the number of second probes 4 can be selected according to the actual measurement situation of the workpiece being measured, and the included angle between adjacent second probes 4 on the plane with the rotation direction as the plane can also be selected, which is highly adaptable.

[0037] The connecting lines between the center points of the multiple connecting holes 20 opened on the side wall of the connecting column 2 are in the shape of regular polygons, so as to better adjust the position of the second probe 4, and after the position of the second probe 4 is properly adjusted, it can be more accurately connected to the connecting column 2 through the connecting holes 20.

[0038] The central axis of each of the second probes 4 is set at a 90° angle to the central axis of the first probe 3, which improves the compatibility of the orthogonal coordinate system formed by the multiple second probes 4 and the first probe 3, and reduces the calibration complexity. In addition, the arrangement of multiple second probes 4 in conjunction with the first probe 3 can cover complex geometric features, thereby reducing measurement errors.

[0039] A toggle plate 6 is provided on the outer wall of each of the aforementioned fixed plates 5. The toggle plate 6 is L-shaped in general. One end of the toggle plate 6 is connected to the outer wall of the fixed plate 5, and the other end extends to be close to the outer wall of the probe seat 1. When the central axis of the fixing hole 50 of each fixed plate 5 is on the same straight line, there is a second gap between adjacent fixed plates 5. This second gap can prevent collisions between adjacent fixed plates 5. When it is necessary to adjust the position of the fixed plate 5 at the bottom of the probe seat 1, the fixed plate 5 is moved by the corresponding toggle plate 6. This improves the convenience of operation and also avoids damage to the second probe 4 caused by manually moving the fixed plate 5 by toggle the second probe 4.

[0040] Multiple protective rings 8 are circumferentially arranged on the side wall of the connecting post 2. Each protective ring 8 is located inside each connecting hole 20. When the fixing plate 5 moves to the corresponding position, the second probe 4 inside the fixing hole 50 is rotated. The second probe 4 will then move towards the inside of the connecting hole 20 of the connecting post 2. During the movement of the second probe 4, if the central axis of the fixing hole 50 of the fixing plate 5 does not correspond to the central axis of the connecting hole 20, the connecting end of the second probe 4 will come into contact with the side wall of the connecting post 2. As a result, the connecting end of the second probe 4 will be pressed against the outer wall of the connecting post 2. During the continuous movement of the second probe 4, the connecting end of the second probe 4 will be squeezed and damaged. The protective ring 8 protects the connecting end of the second probe 4 and can also drive the fixing plate 5 to move to the connecting post 2 without affecting the entry of the second probe 4.

[0041] A protective sleeve 9 is provided on the outer wall of each of the aforementioned fixing plates 5. The protective sleeve 9 is located on the outer periphery of the fixing hole 50. When the second probe 4 enters the connecting hole 20 of the connecting post 2 through the fixing hole 50, the protective sleeve 9 can protect the threaded connection gap between the second probe 4 and the fixing plate 5, preventing dust and other contaminants from entering this gap and affecting the disassembly and assembly of the second probe 4. In addition, a baffle 7 is provided on the outer wall of each fixing plate 5. The top of the other end of the baffle 7 slides in contact with the bottom end face of the probe seat 1. That is, during the process of the second probe 4 being fed through the threaded connection of the fixing hole 50, after the second probe 4 is electrically connected to the connecting post 2 through the connecting hole 20, the continued feeding of the second probe 4 will cause the fixing plate 5 to shift away from the central axis of the connecting post 2. The baffle 7 can prevent the fixing plate 5 from shifting in this direction, thus avoiding affecting the subsequent use of the fixing plate 5.

[0042] Finally, it should be noted that the above are merely preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, the present invention can have various modifications and variations. Without conflict, the embodiments and features described in the embodiments of this application can be arbitrarily combined with each other. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A probe head measuring stand for a three-coordinate measuring machine, characterized in that, include: The probe holder has multiple annular grooves on its bottom end face, and the inner diameter of the multiple annular grooves gradually decreases along the central axis of the probe holder, with adjacent annular grooves not connected to each other; multiple fixing plates, one end of each fixing plate is slidably connected to the probe holder through one of the annular grooves; each fixing plate has a fixing hole on its side wall; a connecting post is located at the bottom of the probe holder, and the outer diameter of the connecting post is less than or equal to the inner diameter of the smallest annular groove; a first probe is located at the bottom of the connecting post; multiple connecting holes are circumferentially formed on the side wall of the connecting post with the central axis of the connecting post as the axis of rotation; multiple second probes, each second probe is threadedly connected to a fixing plate through one of the fixing holes of the fixing plate, and the connecting end of each second probe enters the interior of the connecting post through one of the connecting holes; wherein, the connecting end of each second probe is electrically connected to the probe holder through the connecting post.

2. A probe head chuck for a coordinate measuring machine according to claim 1, wherein, The connecting lines between the center points of the plurality of connecting holes are in the shape of regular polygons.

3. A probe head measuring stand for a three-coordinate measuring machine according to claim 2, characterized in that When the central axes of the fixing holes of the multiple fixing plates are on the same straight line, there is a first gap between adjacent fixing plates.

4. A probe head measuring stand for a three-coordinate measuring machine according to claim 3, characterised in that, The central axis of each second probe is perpendicular to the central axis of the first probe at a 90° angle.

5. A probe head measuring stand for a three-coordinate measuring machine according to claim 4, characterized in that Each of the fixed plates has an actuating plate on its outer wall surface. Each actuating plate is L-shaped. When the central axes of the fixing holes of the multiple fixed plates are on the same straight line, there is a second gap between adjacent actuating plates.

6. A probe head measuring stand for a three-coordinate measuring machine according to claim 5, characterized in that, The side wall of the connecting column is provided with a plurality of protective rings in the circumferential direction, and each of the protective rings is located inside each of the connecting holes.

7. A probe head measuring stand for a three-coordinate measuring machine according to claim 6, characterized in that Each of the fixing plates has a protective sleeve on its outer wall surface located outside the corresponding fixing hole.

8. The probe holder for a coordinate measuring machine according to claim 7, characterized in that, Each of the fixed plates has a baffle on its outer wall surface, and the top of the baffle slides in contact with the bottom end face of the probe seat.

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