Sample table device for table type X-ray diffractometer
By using an adjustment mechanism that combines a steel column with a corrugated groove and an optical path calibration mechanism, the problems of complex adjustment mechanisms, unreliable fixing, and difficult calibration of the sample stage in a benchtop X-ray diffractometer have been solved, achieving high-precision adjustment and rapid calibration, thus improving detection efficiency and data accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- EDU NANOTECHNOLOGY (SHANGHAI) CO LTD
- Filing Date
- 2025-05-12
- Publication Date
- 2026-04-21
AI Technical Summary
Existing benchtop X-ray diffractometer sample stages suffer from problems such as complex and easily worn adjustment mechanisms, unreliable fixing, and difficult calibration, resulting in decreased accuracy, poor data accuracy, and low operating efficiency.
An adjustment mechanism using steel columns and corrugated grooves is employed, combined with a knob-driven slider to control the sample stage height. The lifting assembly performs fine adjustments, and the optical path calibration mechanism achieves rapid centering via bolts and an adjustment plane.
It achieves high-precision and stable adjustment and reliable fixation of the sample stage, ensuring the accuracy of diffraction data, improving the efficiency of optical path calibration, and meeting the requirements of high-precision and high-efficiency detection.
Smart Images

Figure CN224152383U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of sample stage device technology, and in particular to a sample stage device for use in a benchtop X-ray diffractometer. Background Technology
[0002] In fields such as materials science and geological exploration, benchtop X-ray diffractometers have become commonly used equipment for material structure analysis due to their portability and flexibility. The sample stage, as the core component of an X-ray diffractometer, directly affects the accuracy of diffraction data and testing efficiency.
[0003] Currently, existing benchtop X-ray diffractometer sample stages have several shortcomings. First, the adjustment mechanisms are complex. Traditional sample stages often use screw or gear transmissions for height adjustment. These structures are not only bulky, but also prone to wear and tear due to friction during long-term use. This leads to a significant decrease in the adjustment accuracy of the sample stage over time, making it difficult to meet the requirements of high-precision testing. Second, the fixation is unreliable. Some sample stages rely on friction locking mechanisms to fix the sample. Under the vibration generated by the equipment operation or during long-term testing, the sample stage is prone to displacement. Once the sample position changes, the collected diffraction data will be deviated, thus affecting the accuracy of the material structure analysis results. Third, calibration is difficult. During use, the sample stage needs to be precisely aligned with the X-ray beam path, but existing sample stages lack an effective rapid fine-tuning mechanism. Operators often need to make repeated adjustments, consuming a lot of time and effort, resulting in extremely low operating efficiency and failing to meet the actual needs of high-efficiency detection. In view of this, this utility model proposes a sample stage device for benchtop X-ray diffractometers. Utility Model Content
[0004] The purpose of this invention is to address the problems in the existing benchtop X-ray diffractometer sample stages, such as complex adjustment mechanisms that are prone to wear and tear leading to decreased accuracy, unreliable fixing affecting data accuracy, difficult calibration, and lack of a rapid fine-tuning mechanism resulting in low operating efficiency. The invention proposes a sample stage device for benchtop X-ray diffractometers.
[0005] The technical solution of this utility model is as follows: A sample stage device for a benchtop X-ray diffractometer includes a fixed base, in which a sample stage body is disposed; a connecting plate, a connecting rod, and an adjusting base are sequentially connected to one side of the fixed base; an adjusting mechanism installed below the sample stage body, the adjusting mechanism being used to drive the sample stage body to rise and fall; an adjusting ring disposed on the side of the adjusting base away from the connecting rod, the adjusting ring having a fixed ring installed therein; a lifting assembly mounted on the adjusting base, the lifting assembly being used to drive the adjusting base to rise and fall; and an optical path calibration mechanism disposed outside the fixed ring, the optical path calibration mechanism being used to precisely adjust the position of the adjusting ring to achieve optical path alignment.
[0006] Optionally, the adjustment mechanism includes two sets of symmetrically arranged side plates, which are fixedly connected to the fixed base. A lifting block that is slidably connected to the fixed base is provided between the two sets of side plates. The top of the lifting block is connected to the sample stage body. A sliding groove is provided in the lifting block. Four sets of arc-shaped grooves are provided inside the sliding groove. Steel columns are provided in the two sets of arc-shaped grooves on the same side. Corrugated grooves corresponding to the steel columns are provided on the opposite side of the two sets of side plates.
[0007] Optionally, a slider is slidably connected in the chute, and an operating rod is rotatably connected to the side of the slider away from the steel column. The operating rod is threadedly connected to the lifting block, and a knob is installed at the end of the operating rod away from the slider.
[0008] Optionally, slots are provided on both sides of the slider, and the side of the slot away from the operating lever is provided with an inclined groove on both sides of the slider.
[0009] Optionally, the lifting assembly includes a dovetail groove formed at the end of the adjusting seat away from the connecting rod, and the adjusting ring is slidably connected in the dovetail groove.
[0010] Optionally, a fixing block is fixedly connected in the dovetail groove, and a threaded rod is rotatably connected in the fixing block, with one end of the threaded rod threadedly connected to the adjusting ring.
[0011] Optionally, the optical path calibration mechanism includes four sets of adjustment planes located on the outside of the fixed ring. Each of the four sets of adjustment planes is provided with a bolt on the side away from the fixed ring, and all four sets of bolts pass through the adjustment ring and are threadedly connected to it.
[0012] In summary, this application includes at least one of the following beneficial technical effects:
[0013] This utility model uses a unique steel column and corrugated groove locking mechanism for adjustment, combined with a knob-driven slider to control the extension and retraction of the steel column, to achieve stable adjustment and reliable fixation of the sample stage body height, avoiding the wear problems of traditional screw and gear transmission, and maintaining high precision even after long-term use;
[0014] Furthermore, the height can be finely adjusted using the lifting component, improving the adjustment precision and ensuring the accuracy of the diffraction data;
[0015] Furthermore, the optical path calibration mechanism, through the cooperation of four sets of bolts with the adjustment plane, can quickly and accurately adjust the position of the adjustment ring, and achieve rapid alignment of the sample stage and the optical path. Compared with the traditional sample stage that requires repeated adjustments, it significantly improves the operating efficiency and saves calibration time.
[0016] In summary, this invention can significantly improve the accuracy and stability of sample stage adjustment, ensure the accuracy of diffraction data, and improve the efficiency of optical path calibration, thereby meeting the requirements for high-precision and high-efficiency detection. Attached Figure Description
[0017] Figure 1 This is a schematic diagram of a sample stage device used in a benchtop X-ray diffractometer.
[0018] Figure 2 This is a schematic diagram of the regulating mechanism;
[0019] Figure 3 yes Figure 1 A schematic diagram of the cross-sectional structure;
[0020] Figure 4 This is a schematic diagram of the fixed ring structure.
[0021] Figure label:
[0022] 1. Fixed base; 11. Connecting plate; 12. Connecting rod; 13. Adjusting base;
[0023] 2. Sample stage body;
[0024] 3. Adjustment mechanism; 31. Side plate; 32. Lifting block; 33. Slide groove; 34. Arc groove; 35. Steel column; 36. Corrugated groove; 37. Sliding block; 38. Operating lever; 39. Knob; 371. Slot; 372. Inclined groove;
[0025] 4. Adjusting ring; 5. Retaining ring;
[0026] 6. Lifting assembly; 61. Dovetail groove; 62. Fixing block; 63. Threaded rod;
[0027] 7. Optical path calibration mechanism; 71. Adjustment plane; 72. Bolt. Detailed Implementation
[0028] The technical solution of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are some embodiments of this utility model, but not all embodiments.
[0029] The components of the present invention embodiments described and shown in the accompanying drawings can typically be arranged and designed in a variety of different configurations. Therefore, the following detailed description of the embodiments of the present invention provided in the drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention.
[0030] Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this utility model.
[0031] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.
[0032] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.
[0033] Example
[0034] like Figure 1 As shown, the present invention proposes a sample stage device for a benchtop X-ray diffractometer, including a fixed base 1, a sample stage body 2 disposed in the fixed base 1, and a connecting plate 11, a connecting rod 12 and an adjusting base 13 connected in sequence on one side of the fixed base 1 to provide support for other structures.
[0035] For further details, please refer to Figure 2 and Figure 3The aforementioned sample stage device includes an adjustment mechanism 3 installed below the sample stage body 2. The adjustment mechanism 3 is used to drive the sample stage body 2 to rise and fall. The adjustment mechanism 3 includes two sets of symmetrically arranged side plates 31, which are fixedly connected to the fixed base 1 and have fixed positions. A lifting block 32, which is slidably connected to the fixed base 1, is provided between the two sets of side plates 31. The top of the lifting block 32 is connected to the sample stage body 2, and the lifting block 32 drives the sample stage body 2 to move synchronously when it moves. A sliding groove 33 is provided in the lifting block 32, and four sets of arc-shaped grooves 34 are provided inside the sliding groove 33. A steel column 35 is provided in two sets of arc-shaped grooves 34 on the same side. The steel column 35 is always limited to the position of the arc-shaped groove 34, and the steel column 35 can slide in the arc-shaped groove 34. Corrugated grooves 36 corresponding to the steel columns 35 are provided on the opposite side of the two sets of side plates 31. The position of the lifting block 32 is locked by the cooperation of the steel column 35 and the corrugated groove 36. A slider 37 is slidably connected in the slide groove 33. Slots 371 are provided on both sides of the slider 37. An inclined groove 372 is provided on the side of the slot 371 away from the operating rod 38 on both sides of the slider 37. After the slider 37 moves, when the inclined groove 372 moves to the position of the arc-shaped groove 34, the lifting block 32 can be moved. The steel column 35 slides and retracts into the arc-shaped groove 34 after contacting the corrugated groove 36. After moving to the designated position, the slider 37 moves and presses the steel column 35 through the inclined groove 372, causing the steel column 35 to slide and protrude in the arc-shaped groove 34, locking the steel column 35 in the slot 371. The steel column 35 is also locked in the corrugated groove 36, limiting the movement of the lifting block 32. An operating rod 38 is rotatably connected to the side of the slider 37 away from the steel column 35. When the operating rod 38 moves, it drives the slider 37 to slide in the slide groove 33. The operating lever 38 is threadedly connected to the lifting block 32. When the operating lever 38 rotates, it moves along its own length and simultaneously moves the slider 37. A knob 39 is installed at the end of the operating lever 38 away from the slider 37, and the design of the knob 39 facilitates the rotation of the operating lever 38.
[0036] Specifically, such as Figure 4 As shown, the above-mentioned sample stage device includes an adjustment ring 4 disposed on the side of the adjustment seat 13 away from the connecting rod 12, and a fixing ring 5 is installed in the adjustment ring 4.
[0037] For further details, please refer to Figure 1 and Figure 4The aforementioned sample stage device also includes a lifting assembly 6 mounted on the adjusting seat 13. The lifting assembly 6 is used to drive the adjusting seat 13 to rise and fall, thereby fine-tuning the height of the sample stage body 2. The lifting assembly 6 includes a dovetail groove 61 formed at the end of the adjusting seat 13 away from the connecting rod 12. The adjusting ring 4 is slidably connected in the dovetail groove 61, making the movement of the adjusting seat 13 smooth. A fixing block 62 is fixedly connected in the dovetail groove 61, and the position of the fixing block 62 is fixed. A threaded rod 63 is rotatably connected in the fixing block 62, and the threaded rod 63 rotates while remaining in its original position. One end of the threaded rod 63 is threadedly connected to the adjusting ring 4. When the threaded rod 63 rotates, it drives the fixing block 62 to move along the length direction of the threaded rod 63, thereby driving the adjusting seat 13 to rise and fall when the adjusting ring 4 is fixed.
[0038] Furthermore, the aforementioned sample stage device includes an optical path calibration mechanism 7 disposed outside the fixed ring 5. The optical path calibration mechanism 7 is used to precisely adjust the position of the adjusting ring 4 to achieve optical path alignment. The optical path calibration mechanism 7 includes four sets of adjustment planes 71 disposed outside the fixed ring 5, two sets of adjustment planes 71 being located in the vertical direction and two sets of adjustment planes 71 being located in the horizontal direction. Bolts 72 are respectively disposed on the side of the four sets of adjustment planes 71 away from the fixed ring 5. All four sets of bolts 72 penetrate the adjusting ring 4 and are threadedly connected to it. When the bolts 72 are rotated, the reaction force precisely adjusts the horizontal and vertical positions of the adjusting ring 4, facilitating rapid alignment of the optical path.
[0039] In this embodiment, when the height of the sample stage body 2 needs to be adjusted, the knob 39 is rotated, which drives the operating rod 38 to rotate. Since the operating rod 38 is threadedly connected to the lifting block 32, the operating rod 38 moves along its own length direction when it rotates, thereby driving the slider 37 to slide in the groove 33. When the slider 37 moves to align the inclined groove 372 with the arc groove 34, the steel column 35 can slide in the arc groove 34 and disengage from the corrugated groove 36. At this time, the lifting block 32 is unlocked and can move freely between the two sets of side plates 31, driving the sample stage body 2 to move synchronously. After reaching the required height, the knob 39 is rotated in the opposite direction, the slider 37 moves in the opposite direction, the inclined groove 372 squeezes the steel column 35, causing the steel column 35 to protrude and be stuck in the slot 371, and at the same time, it is stuck into the corrugated groove 36, thereby locking the position of the lifting block 32, ensuring that the sample stage body 2 is fixed reliably, and avoiding displacement during vibration or long-term testing.
[0040] If fine-tuning of the height of the sample stage body 2 is required, it can be achieved through the lifting assembly 6. Rotating the threaded rod 63, since the threaded rod 63 is threadedly connected to the adjusting ring 4 and the adjusting ring 4 is relatively fixed, the rotation of the threaded rod 63 will drive the adjusting seat 13 to rise and fall along the length direction of the threaded rod 63. The adjusting seat 13 is connected to the fixed seat 1 through the connecting rod 12 and the connecting plate 11, thereby driving the entire sample stage device to perform fine-tuning of the height, compensating for the lack of precision of the adjustment mechanism 3.
[0041] During optical path alignment, the optical path calibration mechanism 7 is used. Rotating the bolt 72 located outside the four sets of adjustment planes 71 causes the adjustment ring 4 to move horizontally or vertically due to the threaded connection between the bolt 72 and the adjustment ring 4. This, in turn, drives the sample stage body 2 to precisely adjust its position, achieving rapid optical path alignment. This avoids the tedious operation of repeated adjustments required by traditional sample stages, significantly improving operational efficiency.
[0042] The above specific embodiments are merely optional embodiments of this utility model. Based on the technical solution of this utility model and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above specific embodiments.
Claims
1. A sample stage device for use in a benchtop X-ray diffractometer, characterized by, include: A fixed base (1) is provided in which a sample stage body (2) is provided. A connecting plate (11), a connecting rod (12) and an adjusting seat (13) are connected in sequence on one side of the fixed base (1). An adjustment mechanism (3) is installed below the sample stage body (2), and the adjustment mechanism (3) is used to drive the sample stage body (2) to rise and fall; An adjusting ring (4) is provided on the side of the adjusting seat (13) away from the connecting rod (12), and a fixing ring (5) is installed in the adjusting ring (4); The lifting assembly (6) is installed on the adjusting seat (13) and is used to drive the adjusting seat (13) to rise and fall. The optical path calibration mechanism (7) is located outside the fixed ring (5). The optical path calibration mechanism (7) is used to precisely adjust the position of the adjustment ring (4) to achieve optical path alignment.
2. A sample stage apparatus for use in a desktop X-ray diffractometer according to claim 1, wherein, The adjustment mechanism (3) includes two sets of symmetrically arranged side plates (31). The side plates (31) are fixedly connected to the fixed base (1). A lifting block (32) that is slidably connected to the fixed base (1) is provided between the two sets of side plates (31). The top of the lifting block (32) is connected to the sample stage body (2). A sliding groove (33) is provided in the lifting block (32). Four sets of arc grooves (34) are provided inside the sliding groove (33). A steel column (35) is provided in the two sets of arc grooves (34) on the same side. Corrugated grooves (36) corresponding to the steel column (35) are provided on the opposite side of the two sets of side plates (31).
3. A sample stage apparatus for use in a desktop X-ray diffractometer according to claim 2, wherein, A slider (37) is slidably connected in the chute (33). An operating rod (38) is rotatably connected to the side of the slider (37) away from the steel column (35). The operating rod (38) is threadedly connected to the lifting block (32). A knob (39) is installed at the end of the operating rod (38) away from the slider (37).
4. A sample stage apparatus for use in a desktop X-ray diffractometer according to claim 3, wherein, The slider (37) has slots (371) on both sides, and the side of the slot (371) away from the operating lever (38) has inclined grooves (372) on both sides of the slider (37).
5. A sample stage apparatus for use in a desktop X-ray diffractometer according to claim 4, wherein, The lifting assembly (6) includes a dovetail groove (61) opened at the end of the adjusting seat (13) away from the connecting rod (12), and the adjusting ring (4) is slidably connected in the dovetail groove (61).
6. A sample stage apparatus for use in a desktop X-ray diffractometer according to claim 5, wherein, A fixing block (62) is fixedly connected in the dovetail groove (61), and a threaded rod (63) is rotatably connected in the fixing block (62). One end of the threaded rod (63) is threadedly connected to the adjusting ring (4).
7. A sample stage device for a benchtop X-ray diffractometer according to claim 6, characterized in that, The optical path calibration mechanism (7) includes four sets of adjustment planes (71) located outside the fixed ring (5). Each of the four sets of adjustment planes (71) is provided with a bolt (72) on the side away from the fixed ring (5). All four sets of bolts (72) pass through the adjustment ring (4) and are threadedly connected to it.